CN110473790B - Integrated circuit packaging method and semiconductor device - Google Patents

Integrated circuit packaging method and semiconductor device Download PDF

Info

Publication number
CN110473790B
CN110473790B CN201910701507.2A CN201910701507A CN110473790B CN 110473790 B CN110473790 B CN 110473790B CN 201910701507 A CN201910701507 A CN 201910701507A CN 110473790 B CN110473790 B CN 110473790B
Authority
CN
China
Prior art keywords
integrated circuit
bare
bottom plate
photo
bare chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201910701507.2A
Other languages
Chinese (zh)
Other versions
CN110473790A (en
Inventor
赖振楠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hosin Global Electronics Co Ltd
Original Assignee
Hosin Global Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hosin Global Electronics Co Ltd filed Critical Hosin Global Electronics Co Ltd
Priority to CN201910701507.2A priority Critical patent/CN110473790B/en
Priority to CN202110288385.6A priority patent/CN113140467A/en
Publication of CN110473790A publication Critical patent/CN110473790A/en
Application granted granted Critical
Publication of CN110473790B publication Critical patent/CN110473790B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4871Bases, plates or heatsinks
    • H01L21/4875Connection or disconnection of other leads to or from bases or plates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4871Bases, plates or heatsinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
    • H01L2224/8592Applying permanent coating, e.g. protective coating

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

The invention provides an integrated circuit packaging method and a semiconductor device, wherein the method comprises the following steps: (a) identifying a bottom plate with an attached bare chip of an integrated circuit, and generating a plastic package model according to identification information of the bottom plate with the attached bare chip of the integrated circuit, wherein contact electrodes of the bare chip of the integrated circuit are correspondingly connected with pins on the bottom plate through bonding wires one by one; (b) and according to the plastic package model, sequentially forming a plurality of overlapped and insulated light-cured adhesive layers on one side of the bottom plate, which is attached with the integrated circuit bare chip, and wrapping the integrated circuit bare chip and the bonding wire in the plurality of light-cured adhesive layers. According to the invention, the plurality of overlapped and insulated photocuring adhesive layers are sequentially formed on the side, where the integrated circuit bare chip is attached, of the lead frame, so that the warping of the lead frame and the snapping of the bonding wire in the plastic packaging process are avoided, and the packaging yield of the integrated circuit is improved.

Description

Integrated circuit packaging method and semiconductor device
Technical Field
The present invention relates to the field of integrated circuit packaging, and more particularly, to an integrated circuit packaging method and a semiconductor device.
Background
Modern products are thin, light, small, and small, so many discrete circuits are integrated into an integrated circuit. Currently, integrated circuits have been widely used in personal computers, mobile phones, digital cameras, and other electronic devices. In order to provide a stable and reliable working environment for the integrated circuit and perform mechanical or environmental protection on the integrated circuit, so that the integrated circuit can perform normal functions and has high stability and reliability, the integrated circuit needs to be packaged.
For the existing general integrated circuit, most of the integrated circuits adopt a plastic packaging form, and the main packaging forms include: PDIP (plastic dual in-line package), PLCC (plastic leaded chip carrier), QFP (quad flat package), QFN (no lead quad flat package), SOP (small outline package), Thin Small Outline Package (TSOP), scaled-down SOP (ssop), and thin scaled-down SOP (tssop), and the like.
The existing plastic package mainly comprises the processing steps of grinding (Back grinding), stretching film (Wafer Mounting), scribing (Wafer winding/Dicing Saw), Bonding (Die Attach/Die Bonding), Bonding (Wire Bonding), Molding (Molding), Curing (Curing), electroplating (Plating), Trimming Forming (Trimming Forming), Testing/sorting (Testing/Bonding), printing (Marking), packaging (packaging) and the like.
In the packaging process, the plastic package adhesive needs to be heated to 180 ℃ and then injected to the surfaces of the lead frame and the bare integrated circuit (Die), and due to the fact that the thermal coefficients of the bare integrated circuit and the plastic package material are different, when the plastic package adhesive is cooled, the lead frame can be warped, and the bonding wires can be pulled apart.
Disclosure of Invention
The invention aims to solve the technical problem that the integrated circuit is easy to warp a lead frame and stretch a bonding wire due to different thermal coefficients of a bare chip of the integrated circuit and a plastic packaging material in the plastic packaging process, and provides an integrated circuit packaging method and a semiconductor device.
The technical solution of the present invention for solving the above technical problems is to provide an integrated circuit packaging method, which includes the following steps:
(a) identifying a bottom plate with an attached bare chip of an integrated circuit, and generating a plastic package model according to identification information of the bottom plate with the attached bare chip of the integrated circuit, wherein contact electrodes of the bare chip of the integrated circuit are correspondingly connected with pins on the bottom plate through bonding wires one by one;
(b) and according to the plastic package model, sequentially forming a plurality of overlapped and insulated light-cured adhesive layers on one side of the bottom plate, which is attached with the integrated circuit bare chip, and wrapping the integrated circuit bare chip and the bonding wire in the plurality of light-cured adhesive layers.
Preferably, the plastic package model comprises a sintered pattern of each photo-curing glue layer; the step (b) comprises the steps of:
(b1) dipping the bottom plate with the bare crystal of the integrated circuit in a photocuring glue solution;
(b2) and lifting the bottom plate with the bare chips of the integrated circuit or immersing the bottom plate downwards, and performing layer-by-layer illumination sintering on the part of the bottom plate with the bare chips of the integrated circuit, which is exposed out of the liquid level of the photocuring glue solution, according to the sintering pattern of each photocuring glue layer.
Preferably, the base plate is a substrate or a lead frame, and in the step (b2), a portion of the base plate to which the bare chips of the integrated circuit are attached, which is away from the liquid surface of the photo-curing glue solution, is sintered using a surface light source, which includes a plurality of light emitting points controlled independently, and emits light to cover the surface of the base plate to which the bare chips of the integrated circuit are attached.
Preferably, in the step (b1), the substrate with the bare chip mounted thereon is immersed in a photo-curing glue solution upside down, and the surface light source is positioned below the photo-curing glue solution;
or, in the step (b1), the substrate with the bare integrated circuit mounted thereon is immersed in the photo-curing glue solution in a manner that the side of the bare integrated circuit is upward, and the surface light source is located above the substrate with the bare integrated circuit mounted thereon.
Preferably, the plastic package model comprises a moving path of the spray head and the light source on each light-cured adhesive layer; the step (b) comprises the steps of:
(b 1') according to the moving path of the spray head and the light source on each photo-curing glue layer, controlling the spray head to spray the photo-curing glue solution on the side of the bottom plate where the integrated circuit bare chips are attached, and sintering and curing the photo-curing glue solution attached to the side of the bottom plate where the integrated circuit bare chips are attached through the light source.
Preferably, in the step (b 1'), the light-curing glue solution is sprayed on the side of the base plate where the bare integrated circuit die is attached through a plurality of spray heads arranged in a row, and the spray range of the plurality of spray heads is equal to the length of one side of the base plate; the moving path includes a path perpendicular to an arrangement direction of the plurality of heads.
Preferably, each spray head is integrated with a light source, and the irradiation area of the light source is consistent with the spraying area of the spray head.
Preferably, the bottom plate is a lead frame, the plastic package mold includes a sintered pattern of each photo-curing adhesive layer on a side of the lead frame facing away from the integrated circuit die, and the method further includes the following steps:
(b 2') dipping the lead frame into the photo-curing glue solution at the side opposite to the side where the integrated circuit bare chip is attached;
(b 3') lifting the lead frame upwards, and performing light sintering on the part of the lead frame exposed out of the liquid level of the light curing glue solution layer by layer according to the sintering pattern of each light curing glue layer.
Preferably, the base plate is a lead frame, and the step (a) is preceded by:
(a01) sequentially forming a plurality of overlapped and insulated light-cured adhesive layers on one side of the lead frame;
(a02) and fixing the bare chip of the integrated circuit on the other side of the lead frame, and connecting the contact electrodes of the bare chip of the integrated circuit with the pins on the bottom plate in a one-to-one correspondence manner through bonding wires.
The present invention also provides a semiconductor device packaged by the integrated circuit packaging method as described in any one of the above.
According to the integrated circuit packaging method and the semiconductor device, the plurality of overlapped and insulated photocuring glue layers are sequentially formed on the side, where the bare chip of the integrated circuit is attached, of the lead frame, so that the warping of the lead frame and the stretch breaking of the bonding wire in the plastic packaging process are avoided, and the qualification rate of integrated circuit packaging is improved.
Drawings
FIG. 1 is a flow chart of an integrated circuit packaging method according to an embodiment of the invention;
FIG. 2 is a schematic flow chart illustrating the formation of a photo-curing adhesive layer in the integrated circuit packaging method according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating a photo-curing adhesive layer formed in a method for packaging an integrated circuit according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of another photo-curing adhesive layer formation in the integrated circuit packaging method according to the embodiment of the invention;
FIG. 5 is a schematic diagram illustrating a photo-curing adhesive layer formed in the integrated circuit packaging method according to an embodiment of the present invention;
fig. 6 is a schematic view illustrating a photo-curing adhesive layer formed in the integrated circuit packaging method according to the embodiment of the invention.
Detailed Description
The following disclosure provides many different embodiments, or examples, for implementing different features of the provided subject matter. Specific examples of components, values, operations, materials, arrangements, etc., are set forth below to simplify the present embodiments. Of course, these are merely examples and are not intended to be limiting. Other components, values, operations, materials, arrangements, etc. are contemplated. For example, forming a first feature "over" or "on" a second feature in the description that follows may include embodiments in which the first and second features are formed in direct contact, and may also include embodiments in which additional features may be formed between the first and second features, such that the first and second features may not be in direct contact. In addition, embodiments of the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.
Furthermore, for ease of description, spatially relative terms such as "under", "below", "lower", "above", "upper", and the like may be used herein to describe one element or feature's relationship to another (other) element or feature as illustrated in the figures. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. The device may have other orientations (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly as well.
Additionally, for ease of description, terms such as "first," "second," and the like may be used herein to describe similar or different elements or features shown in the figures, and these terms may be used interchangeably depending on the order of presentation or context of description.
As shown in fig. 1, the flowchart of the method for packaging an integrated circuit according to the embodiment of the present invention is used for performing glue sealing on a bare chip (die) of an integrated circuit and a bottom board to protect the die of the integrated circuit mechanically or environmentally, so that the integrated circuit can perform normal functions. The integrated circuit die may have a passivation layer thereon, the passivation layer covering an active surface of the die, the passivation layer including one or more conductive pillars electrically connected to one or more metal pads (pads) on the active surface of the die, respectively, and the conductive pillars forming a die pad. Of course, in practical applications, the active surface of the ic die may not have a passivation layer, i.e., the chip pad may be directly formed by a metal pad on the ic die. The integrated circuit packaging method of the embodiment comprises the following steps:
step S1: and identifying the bottom plate with the bare chips of the integrated circuit, and generating a plastic package model according to the identification information of the bottom plate with the bare chips of the integrated circuit.
The base plate is used for providing circuit connection and fixing the bare chip of the integrated circuit, and the bare chip of the integrated circuit is bonded to the base plate through silver paste and the like after being subjected to grinding, grinding and scribing. On the bottom plate with the bare chips of the integrated circuit, the contact electrodes of the bare chips of the integrated circuit are correspondingly connected with the pins on the bottom plate one by one through bonding wires. The base plate may be a substrate or a lead frame.
In this step, the base plate on which the bare chip of the integrated circuit is mounted may be identified by means of camera scanning, laser scanning, ultrasonic scanning, or the like, so as to obtain information (i.e., identification information) such as the shape of the base plate on the side on which the bare chip of the integrated circuit is mounted, the size and position of the bare chip of the integrated circuit, and the height of the bare chip protruding from the base plate. Correspondingly, the plastic package model generated according to the identification information comprises patterns at each height of the bottom plate at the side where the integrated circuit bare chip is attached, for example, when the patterns are lower than the height of the integrated circuit bare chip protruding out of the surface of the bottom plate, the patterns of the plastic package model are in a shape of a Chinese character hui (the outer frame is matched with the outer contour of the bottom plate, and the inner frame is matched with the outer contour of the bare chip); when the height of the bare chip of the integrated circuit is higher than the height of the bare chip protruding out of the surface of the bottom plate, the pattern of the plastic package model is a rectangle or other shapes matched with the bottom plate.
Step S2: according to the plastic package model, a plurality of light-cured adhesive layers which are sequentially overlapped and insulated are formed on one side of the bottom plate, wherein the integrated circuit bare chips are attached to the side, and the integrated circuit bare chips and the bonding wires are wrapped in the plurality of light-cured adhesive layers. The filling layer is formed by a plurality of light-cured glue layers, the filling layer formed by the existing glue pouring and injection molding is replaced to wrap the bare chip and the bonding wire of the integrated circuit, and the bare chip of the integrated circuit is mechanically or environmentally protected.
The photo-curing adhesive layer can be formed by curing a photo-curing adhesive solution after being irradiated by light with a specific wavelength, for example, the photo-curing adhesive solution can be an ultraviolet curing adhesive solution and can be cured under the irradiation of an ultraviolet light source.
Because the light-cured adhesive layer is not required to be heated, melted and cooled (the highest temperature in the whole plastic packaging process does not exceed 60 ℃) in the forming process of the light-cured adhesive layer, the warping of the base plate and the stretching and breaking of bonding wires caused by the difference of the heat conductivity coefficients of the base plate and the packaging adhesive in the plastic packaging process can be avoided, and compared with the existing injection molding scheme with the highest temperature reaching 180 ℃, the yield of the integrated circuit bare chip packaging can be greatly improved.
In the integrated circuit packaging method, the plastic package model generated according to the identification information comprises a sintered pattern of each photocuring glue layer; as shown in fig. 2, the step S2 may specifically include:
step S21: referring to fig. 3, the bottom plate 31 is inversely immersed in the photo-curing adhesive solution 34, that is, the side of the bottom plate 31 where the bare chips of the integrated circuit are attached is immersed in the photo-curing adhesive solution 34, the bare chips 32 of the integrated circuit are attached to the bottom plate 31, and the bare chips 32 of the integrated circuit are connected with the pins of the bottom plate 31 through the bonding wires 33 in a one-to-one correspondence manner.
Step S22: and lifting the bottom plate 31 with the bare integrated circuit 32, and performing layer-by-layer illumination sintering on the part, exposed out of the liquid level of the photocuring glue solution 34, of the bottom plate 31 with the bare integrated circuit 32 according to the sintering pattern of each photocuring glue layer in the plastic package model to form a plurality of overlapped photocuring glue layers 35.
Specifically, when the photo-curing glue solution 34 is photo-sintered, a surface light source 36 (e.g., ultraviolet light) may be used to sinter a portion of the bottom plate 31 attached with the bare integrated circuit 32, which is away from the liquid surface of the photo-curing glue solution 34, wherein the surface light source 36 includes a plurality of light emitting points which are independently controlled, and the light emitted by the plurality of light emitting points covers the surface of the bottom plate 31 attached with the bare integrated circuit 32, i.e., the photo-curing glue layer 35 is formed at the same time in a whole layer. In this step, the light source 36 of the control surface is illuminated and sintered according to the corresponding sintering pattern in the plastic mold according to the height of the lifting of the bottom plate 31 with the bare integrated circuit 32 mounted thereon, thereby forming the light-cured adhesive layer.
In particular, the surface light source 36 may be located below the light-curing glue solution 34. That is, light emitted from the surface light source 36 (or light reflected by the mirror or the triangular mirror) passes through the photo-curing glue solution 34 to be sintered.
Of course, in practical application, the bottom plate 31 may be dipped into the photo-curing glue solution 34 on the side opposite to the side on which the bare chips of the integrated circuit are mounted, as shown in fig. 4, and then the bottom plate 31 is slowly dipped downward, and the surface light source 36 may be positioned above the photo-curing glue solution 34, and the part of the bottom plate 31 exposed out of the liquid surface of the photo-curing glue solution 34 is photo-sintered.
In addition, the speed of lifting the base plate 31 can be reduced in consideration of the curing time of the photo-curing glue solution 34, so that the lifting operation of the base plate 31 is a continuous process, thereby ensuring the curing effect of the photo-curing glue solution 34.
Besides the light-cured glue layer formed by adopting the immersion sintering, the light-cured glue layer can also be formed by a 3D printing mode. In another embodiment of the integrated circuit package method of the present invention, the plastic package model generated according to the identification information includes a moving path of the nozzle and the light source on each photo-curing adhesive layer; with reference to fig. 5, the step S2 may specifically include:
step S21': according to the moving path of the spray head and the light source in each light-cured adhesive layer in the plastic package model, the spray head 47 is controlled to spray the light-cured adhesive solution 44 on the side of the bottom plate 41 where the integrated circuit bare dies 42 are attached (on the side, the integrated circuit bare dies 42 are correspondingly connected with the pins on the bottom plate 41 one by one through the bonding wires 43), and the light-cured adhesive solution 44 attached on the side of the bottom plate 41 where the integrated circuit bare dies 42 are attached is sintered and cured through the light source 46 to form a plurality of stacked light-cured adhesive layers 45.
Specifically, in this step, a plurality of heads 47 may be arranged in a row, and the ejection range of the plurality of heads 47 is equal to the length of one side of the base plate 41. Accordingly, the moving path in the plastic mold includes a path perpendicular to the arrangement direction of the plurality of nozzles 47. Therefore, when the light-cured adhesive layer 45 is formed, the plurality of nozzles 47 can be controlled to move according to the moving path, that is, each light-cured adhesive layer 45 is formed by linearly splicing a plurality of light-cured adhesives.
Specifically, each of the nozzles 47 is integrated with a light source 46, the light source 46 may specifically include a light emitting body 461 and a light guiding body 462, and an irradiation area of the light source 46 is consistent with (e.g., slightly behind) a spraying area of the corresponding nozzle 47. Thus, the photo-curing glue solution 44 attached to the side of the base plate 41 where the bare integrated circuit 42 is mounted is sintered and cured while the photo-curing glue solution 44 is sprayed, and the control is simplified. The precision of the spray head 47 can reach 2880DPI (Dots Per Inch), and of course, different precisions can be selected according to requirements.
In one embodiment of the present invention, when the bottom plate is a lead frame, the light-curing glue layer may be formed on both sides of the lead frame. As shown in fig. 6, the light-curing adhesive layer 65 on the lead frame 61 (i.e., on the side where the bare integrated circuit 62 is mounted) can be formed by spraying a light-curing adhesive solution 63 and a light source 66 (the light source 66 includes a light emitter 661 and a light guide 662) through a nozzle 67 and curing by light irradiation; and the photo-curing glue layer 69 on the side and below the lead frame 61 can be formed by immersing the photo-curing glue solution 64 and then sintering the photo-curing glue solution. Also, the photo-curing adhesive layers 65 and 69 of the upper and lower sides of the lead frame 61 may be simultaneously formed, thereby improving the process efficiency.
Specifically, when the photo-curing adhesive layers 69 on the side and below the side of the lead frame 61 are formed, the side of the lead frame 61 opposite to the side on which the bare integrated circuit 62 is mounted is dipped in the photo-curing adhesive solution 64, and then the lead frame 61 is lifted upwards, and the part of the lead frame 61 exposed out of the liquid surface of the photo-curing adhesive solution is subjected to light sintering layer by the surface light source 68 below the photo-curing adhesive solution 64 according to the sintering pattern of each photo-curing adhesive layer.
In addition, when the bottom plate is a lead frame, a mold structure may be formed on one side of the lead frame in advance, that is, before step S1, the method may include: sequentially forming a plurality of overlapped and insulated light-cured adhesive layers on one side of the lead frame (for example, in a manner shown in fig. 3 or fig. 4); the integrated circuit die is then attached to the other side of the leadframe (e.g., in the manner shown in fig. 3 or 4), and the contact electrodes of the integrated circuit die are connected to the leads on the backplane in a one-to-one correspondence via bond wires.
In practical applications, the side of the lead frame facing away from the die for bonding the integrated circuit may also be formed into a plastic-molded structure by other methods, such as a glue injection molding method.
The invention also provides a semiconductor device, and the semiconductor device is packaged by the integrated circuit packaging method.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (5)

1. An integrated circuit packaging method, comprising the steps of:
(a) identifying a bottom plate with an attached bare chip of an integrated circuit, and generating a plastic package model according to identification information of the bottom plate with the attached bare chip of the integrated circuit, wherein contact electrodes of the bare chip of the integrated circuit are correspondingly connected with pins on the bottom plate through bonding wires one by one;
(b) according to the plastic package model, a plurality of overlapped and insulated light-cured adhesive layers are sequentially formed on one side, where the integrated circuit bare chips are attached, of the bottom plate, and the integrated circuit bare chips and the bonding wires are wrapped in the plurality of light-cured adhesive layers;
the plastic package model comprises a sintered pattern of each photocuring glue layer; the step (b) comprises the steps of:
(b1) dipping the bottom plate with the bare crystal of the integrated circuit in a photocuring glue solution;
(b2) and lifting the bottom plate with the bare chips of the integrated circuit or immersing the bottom plate downwards, and performing layer-by-layer illumination sintering on the part of the bottom plate with the bare chips of the integrated circuit, which is exposed out of the liquid level of the photocuring glue solution, according to the sintering pattern of each photocuring glue layer.
2. The method of claim 1, wherein the substrate is a substrate or a lead frame, and in the step (b2), the portion of the substrate with the bare integrated circuit mounted thereon, which is away from the liquid surface of the photo-curing glue solution, is sintered by a surface light source, wherein the surface light source comprises a plurality of independently controlled light emitting points, and the light emitted from the light emitting points covers the surface of the substrate with the bare integrated circuit mounted thereon.
3. The method of claim 2, wherein in step (b1), the substrate with the bare integrated circuit mounted thereon is immersed in a photo-curing glue solution upside down, and the surface light source is located below the photo-curing glue solution;
or, in the step (b1), the substrate with the bare integrated circuit mounted thereon is immersed in the photo-curing glue solution in a manner that the side of the bare integrated circuit is upward, and the surface light source is located above the substrate with the bare integrated circuit mounted thereon.
4. The integrated circuit packaging method of claim 1, wherein the base plate is a lead frame, and step (a) is preceded by:
(a01) sequentially forming a plurality of overlapped and insulated light-cured adhesive layers on one side of the lead frame;
(a02) and fixing the bare chip of the integrated circuit on the other side of the lead frame, and connecting the contact electrodes of the bare chip of the integrated circuit with the pins on the bottom plate in a one-to-one correspondence manner through bonding wires.
5. A semiconductor device packaged by the integrated circuit packaging method according to any one of claims 1 to 4.
CN201910701507.2A 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device Active CN110473790B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201910701507.2A CN110473790B (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device
CN202110288385.6A CN113140467A (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910701507.2A CN110473790B (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN202110288385.6A Division CN113140467A (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device

Publications (2)

Publication Number Publication Date
CN110473790A CN110473790A (en) 2019-11-19
CN110473790B true CN110473790B (en) 2021-04-13

Family

ID=68508438

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201910701507.2A Active CN110473790B (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device
CN202110288385.6A Pending CN113140467A (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN202110288385.6A Pending CN113140467A (en) 2019-07-31 2019-07-31 Integrated circuit packaging method and semiconductor device

Country Status (1)

Country Link
CN (2) CN110473790B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116936594B (en) * 2023-09-08 2023-11-21 积高电子(无锡)有限公司 Image sensor packaging method and packaging structure

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6309943B1 (en) * 2000-04-25 2001-10-30 Amkor Technology, Inc. Precision marking and singulation method
DE10038998A1 (en) * 2000-08-10 2002-02-21 Bosch Gmbh Robert Semiconductor component and method for identifying a semiconductor component
JP2003124241A (en) * 2001-10-18 2003-04-25 Shinko Electric Ind Co Ltd Semiconductor device and method of manufacturing the same
US20040038442A1 (en) * 2002-08-26 2004-02-26 Kinsman Larry D. Optically interactive device packages and methods of assembly
CN1755908A (en) * 2004-09-29 2006-04-05 上海贝岭股份有限公司 Method for improving qualification rate of plastic encapsulated integrated circuit
SG155779A1 (en) * 2008-03-10 2009-10-29 Micron Technology Inc Apparatus and methods of forming wire bonds
US9403296B2 (en) * 2012-04-12 2016-08-02 Telsa Motors, Inc. Embedded optics in modular assemblies
KR101542622B1 (en) * 2013-01-02 2015-08-06 제일모직주식회사 Composition for encapsulation, barrier layer comprising the same and encapsulated apparatus comprising the same
CN103280516B (en) * 2013-05-15 2015-07-01 陕西煤业化工技术研究院有限责任公司 Light-emitting diode packaging material and packaging forming method
JP2015026655A (en) * 2013-07-25 2015-02-05 住友重機械工業株式会社 Method and apparatus for forming thin film
CN109243982B (en) * 2018-08-31 2020-02-14 华中科技大学 Electrofluid spray printing etching method for manufacturing curved integrated circuit

Also Published As

Publication number Publication date
CN113140467A (en) 2021-07-20
CN110473790A (en) 2019-11-19

Similar Documents

Publication Publication Date Title
TW511260B (en) Semiconductor device and its manufacture method
JP5689514B2 (en) Manufacturing method of semiconductor device
US20190391264A1 (en) Molded proximity sensor
JP3605009B2 (en) Method for manufacturing semiconductor device
JP5562273B2 (en) Optoelectronic component manufacturing method and manufacturing apparatus
JP6204577B2 (en) Optoelectronic component and manufacturing method thereof
US20100102436A1 (en) Shrink package on board
KR100702560B1 (en) Method of manufacturing circuit device
CN113346350A (en) Packaging structure
JP5070896B2 (en) Electronic component resin sealing method, resin sealing mold, and semiconductor device manufacturing method
CN110473790B (en) Integrated circuit packaging method and semiconductor device
JP2013258348A (en) Semiconductor device manufacturing method
CN110610876B (en) Integrated circuit packaging equipment
CN110544639B (en) Integrated circuit crystal grain mounting method and semiconductor device
US20070166884A1 (en) Circuit board and package structure thereof
JP2000012575A (en) Method for molding semiconductor chip and molding device used therefor
JP2015510277A (en) Semiconductor laser chip package having encapsulated indentations molded on a substrate and method for forming the same
JP6078846B2 (en) LED mounted product manufacturing method, LED mounted product resin molding method, and LED manufacturing apparatus
JP2003007759A (en) Method of manufacturing recognition equipment, bonding equipment, and circuit device
US20150041182A1 (en) Package substrate and chip package using the same
KR101140081B1 (en) LED Package and Manufacturing Method thereof
JP2015070126A (en) Optical semiconductor device
JP2015038917A (en) Lead frame, lead frame with resin, multifaceted body of lead frame, multifaceted body of lead frame with resin, optical semiconductor device, multifaceted body of optical semiconductor device
US20230197886A1 (en) Semiconductor apparatus
JP5121807B2 (en) Manufacturing method of semiconductor device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
PE01 Entry into force of the registration of the contract for pledge of patent right

Denomination of invention: Integrated circuit packaging method and semiconductor device

Effective date of registration: 20210629

Granted publication date: 20210413

Pledgee: Shenzhen small and medium sized small loan Co.,Ltd.

Pledgor: Shenzhen hongxinyu Electronic Co.,Ltd.

Registration number: Y2021440020043

PE01 Entry into force of the registration of the contract for pledge of patent right
PC01 Cancellation of the registration of the contract for pledge of patent right
PC01 Cancellation of the registration of the contract for pledge of patent right

Date of cancellation: 20220728

Granted publication date: 20210413

Pledgee: Shenzhen small and medium sized small loan Co.,Ltd.

Pledgor: Shenzhen hongxinyu Electronic Co.,Ltd.

Registration number: Y2021440020043

PE01 Entry into force of the registration of the contract for pledge of patent right
PE01 Entry into force of the registration of the contract for pledge of patent right

Denomination of invention: Integrated circuit packaging method and semiconductor device

Effective date of registration: 20220729

Granted publication date: 20210413

Pledgee: Shenzhen small and medium sized small loan Co.,Ltd.

Pledgor: Shenzhen hongxinyu Electronic Co.,Ltd.

Registration number: Y2022440020149

PC01 Cancellation of the registration of the contract for pledge of patent right
PC01 Cancellation of the registration of the contract for pledge of patent right

Date of cancellation: 20231026

Granted publication date: 20210413

Pledgee: Shenzhen small and medium sized small loan Co.,Ltd.

Pledgor: Shenzhen hongxinyu Electronic Co.,Ltd.

Registration number: Y2022440020149