CN110470909A - The test method and device of dielectric constant - Google Patents
The test method and device of dielectric constant Download PDFInfo
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- CN110470909A CN110470909A CN201910759990.XA CN201910759990A CN110470909A CN 110470909 A CN110470909 A CN 110470909A CN 201910759990 A CN201910759990 A CN 201910759990A CN 110470909 A CN110470909 A CN 110470909A
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- 238000013507 mapping Methods 0.000 claims abstract description 56
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- 230000004044 response Effects 0.000 claims description 12
- 238000000034 method Methods 0.000 abstract description 29
- 238000004519 manufacturing process Methods 0.000 abstract description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
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Abstract
This application provides a kind of test method of dielectric constant and devices.Wherein, this method is tested the circuit board to be tested of finished product.Testing procedure includes: the cross sectional dimensions for obtaining the scattering parameter of each link to be tested, the cross sectional dimensions of link to be tested and circuit board to be tested in circuit board to be tested；According to the cross sectional dimensions of the scattering parameter of above-mentioned link to be tested, the cross sectional dimensions of link to be tested and circuit board to be tested, the mapping relations of dielectric constant and frequency point are obtained；According to the mapping relations, bandwidth range is determined；According to bandwidth range and the mapping relations of dielectric constant and frequency point, the corresponding dielectric constant of any frequency point is determined.The dielectric constant tested in this way is tested the circuit board to be tested of finished product, and the dielectric constant error generated caused by testing in circuit manufacturing process to be tested by high temperature is avoided.
Description
Technical field
This application involves technical field of circuit design, more particularly to the test method and device of a kind of dielectric constant.
Background technique
In the design field of printed circuit board, the link impedance value in printed circuit board designs particularly important, the link
Impedance value can influence the output of signal in printed circuit board, as in circuit board certain link impedance value and other link impedances
When being worth inconsistent, the signal that will lead to printed circuit board output is fluctuated.
In the design process of link impedance value, influencing link impedance value has the width of link, the thickness of link, printing electricity
Thickness and the dielectric constant of printed circuit board of road plate etc. can calculate outgoing link impedance value by above-mentioned parameter.Wherein chain
The thickness of the width on road, the thickness of link and printed circuit board is all pre-designed, and the dielectric of printed circuit board is normal
Number is to be tested by test method, such as surveyed by Resonant-cavity Method, capacity plate antenna method, two fluid channel process and X-band method
Method for testing measures the dielectric constant of the printed circuit board of individual core plate.
But above-mentioned test method is just in the printed circuit board of individual core plate.Except the printed circuit board of individual core plate
Except, there are also the printed circuit boards of multi-layer coreboard, and wherein the printed circuit board of multi-layer coreboard is high again by several individual core plates
It is composed under temperature, and the dielectric constant of the printed circuit board of multi-layer coreboard is by the dielectric constant knot of individual each core plate
What conjunction obtained.The dielectric constant of the printed circuit board of the multi-layer coreboard generated at high operating temperatures can change with temperature,
There are errors with actual value for the dielectric constant of the printed circuit board for the multi-layer coreboard for causing the above method to measure.
Summary of the invention
In view of this, the embodiment of the present application provides a kind of test method of dielectric constant, to realize to dielectric constant
Accurate test.In addition, present invention also provides a kind of test device of dielectric constant, to realize the above method answering in practice
With with realization.
To achieve the above object, the embodiment of the present application provides the following technical solutions: in a first aspect, this application provides one kind
Dielectric constant test method, comprising:
Obtain the corresponding scattering parameter of link to be tested in circuit board to be tested；
Obtain the cross sectional dimensions of the link to be tested and the cross sectional dimensions of the circuit board to be tested；
According to the transversal of the scattering parameter, the cross sectional dimensions of the link to be tested and the circuit board to be tested
Face size obtains the mapping relations of dielectric constant and frequency point；
According to the mapping relations of the dielectric constant and frequency point, bandwidth range is determined；
According to the mapping relations and the bandwidth range of the dielectric constant and frequency point, obtain appointing within the scope of the bandwidth
The corresponding dielectric constant of one frequency point.
Second aspect, this application provides a kind of dielectric constant test devices, comprising:
Parameter acquisition module, for obtaining the corresponding scattering parameter of link to be tested in circuit board to be tested；
Dimension acquisition module, for obtaining the cross sectional dimensions and the circuit board to be tested of the link to be tested
Cross sectional dimensions；
Mapping relations obtain module, for according to the cross sectional dimensions of the scattering parameter, the link to be tested and
The cross sectional dimensions of the circuit board to be tested, obtains the mapping relations of dielectric constant and frequency point；
Bandwidth determining module determines bandwidth range for the mapping relations according to the dielectric constant and frequency point；
Dielectric constant determining module, for according to the dielectric constant and frequency point mapping relations and the bandwidth model
It encloses, obtains the corresponding dielectric constant of any frequency point within the scope of the bandwidth.
As shown from the above technical solution, this application provides a kind of test method of dielectric constant, this method is to finished product
Circuit board to be tested tested.Testing procedure includes: the scattering for obtaining each link to be tested in circuit board to be tested
The cross sectional dimensions of parameter, the cross sectional dimensions of link to be tested and circuit board to be tested；According to above-mentioned link to be tested
Scattering parameter, the cross sectional dimensions of link to be tested and the cross sectional dimensions of circuit board to be tested, obtain dielectric constant with
The mapping relations of frequency point；According to the mapping relations, bandwidth range is determined；According to bandwidth range and dielectric constant and frequency point
Mapping relations determine the corresponding dielectric constant of any frequency point.The dielectric constant tested in this way be to finished product to
Test circuit board is tested, and the dielectric generated caused by testing in circuit manufacturing process to be tested by high temperature is avoided
Constant error.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of application for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 shows the flow chart of the test method of dielectric constant provided by the present application；
Fig. 2 shows the schematic diagrames that curve in EDA curve-fitting tool provided by the present application generates interface；
Fig. 3 shows the structural block diagram of the test device of dielectric constant provided by the present application.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present application, technical solutions in the embodiments of the present application carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of embodiments of the present application, instead of all the embodiments.It is based on
Embodiment in the application, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall in the protection scope of this application.
In this application, the terms "include", "comprise" or any other variant thereof is intended to cover non-exclusive inclusion,
So that the process, method, article or equipment for including a series of elements not only includes those elements, but also including not having
The other element being expressly recited, or further include for elements inherent to such a process, method, article, or device.Do not having
There is the element limited in the case where more limiting by sentence "including a ...", it is not excluded that in the mistake including the element
There is also other identical elements in journey, method, article or equipment.
Printed circuit board have many advantages, such as it is at low cost, optimization it is functional, be the more common circuit board of insider it
One.In order to guarantee that the output signal of printed circuit board is not disturbed, need to guarantee each link impedance value one in printed circuit board
It causes.
And link impedance value is by the width of link, the thickness of link, the thickness of printed circuit board and printed circuit board
Dielectric constant determines.Wherein, the thickness of the width of link, the thickness of link and printed circuit board is all pre-designed
Fixed value, therefore need to only measure the dielectric constant of the printed circuit board.
Printed circuit board is divided into individual core plate and multi-layer coreboard.It is currently, there are a variety of individual core plate dielectric constant of test
Method, such as Resonant-cavity Method, capacity plate antenna method, two fluid channel process and X-band method.And multi-layer coreboard be by it is multiple individual
Core plate high temperature is bonded.The method for testing multi-layer coreboard dielectric constant is individual the multiple core plate dielectric for measuring the above method
The combination of constant, then using the dielectric constant after combination as the dielectric constant of multi-layer coreboard.It but at high operating temperatures, will be more
During individual a core plate is bonded, the dielectric constant of individual multiple core plate can be changed with temperature, and lead to dielectric constant
Test value there are errors with actual value.
For this purpose, the embodiment of the present application provides a kind of test method of dielectric constant.Referring to Fig. 1, the method comprising the steps of
S101-S105.Wherein:
S101: the corresponding scattering parameter of link to be tested in circuit board to be tested is obtained.
It should be noted that the assessment that scattering parameter is the performance for reflecting signal and transmission signal in circuit board to be tested refers to
Mark, can reflect the transmission characteristic of link to be tested.
Specifically, scattering parameter is also referred to as S parameter, may exist a variety of implementations for the acquisition methods of S parameter.Example
Such as, measured by VNA (Vector Network Analyzer, vector network analyzer) in circuit board to be tested it is each to
Test the S parameter of link.If circuit board to be tested is multi-layer coreboard, by the connection equipment of VNA testing tool and electricity to be tested
Test interface connection in the plate of road, the response signal that link to be tested is fed back in each layer through circuit board to be tested, obtains
The S parameter of each link to be tested in each layer.
S102: the cross sectional dimensions of link to be tested and the cross sectional dimensions of circuit board to be tested are obtained.
It should be noted that corresponding to the cross sectional dimensions of the cross sectional dimensions of link to be tested and circuit board to be tested
Dimensional units it is smaller, needed thus by special measuring tool, each cross section ruler such as measured by optical microscopy
It is very little.The cross sectional dimensions of link to be tested includes: the thickness of the width of link to be tested, link to be tested；Circuit board to be tested
Cross sectional dimensions include: circuit board to be tested thickness.
Specifically, by measuring tool measure in circuit board to be tested the cross sectional dimensions of all links to be tested and to
Test the cross sectional dimensions of circuit board.Wherein, the test information obtained through measuring tool is to obtain in circuit board to be tested
Link information to be tested, such as link cabling to be tested whether consistent, the to be tested link cabling of line width thickness it is whether consistent
And the thickness of circuit board to be tested.Above-mentioned several information can influence the impedance value of link, in order to calculate accurate dielectric
Constant, it is thus necessary to determine that go out the value of above-mentioned several information.
S103: according to the cross sectional dimensions of scattering parameter, the cross sectional dimensions of link to be tested and circuit board to be tested,
Obtain the mapping relations of dielectric constant and frequency point.
It should be noted that scattering parameter is from dielectric constant derivation.Accurate dielectric constant in order to obtain, need by
The S parameter of the circuit board to be tested of finished product is counter to release dielectric constant.Wherein, the mode of dielectric constant is derived by by scattering parameter
It can be a variety of, no longer illustrate herein.And the mapping relations of dielectric constant and frequency point are obtained by fitting tool.
Specifically, by the above-mentioned several information (cross sectional dimensions and circuit to be tested of such as scattering parameter, link to be tested
The cross sectional dimensions of plate) it is input to fitting tool, after executing correlation step through fitting tool, obtain dielectric constant and frequency point
Mapping relations.The mapping relations can be the associated expression of dielectric constant and frequency, be also possible to dielectric constant and frequency
Relation curve does not illustrate herein.
S104: according to the mapping relations of dielectric constant and frequency point, bandwidth range is determined.
It should be noted that bandwidth range refers to the frequency range for meeting the mapping relations of dielectric constant and frequency point.
Specifically, there are diversified forms, such as mapping relations, and maximum is not present for the mapping relations of dielectric constant and frequency point
Point and there are minimum points, then the frequency range is to close right open interval from minimum point to an infinitely great left side；If the mapping is closed
System is there is no minimum point and there are maximum points, then the frequency range is to open right closed zone from an infinitely small left side to maximum point
Between；If the mapping relations, there are minimum point and there are maximum point, which is a from minimum to maximum
Fully closed section；If the mapping relations there is no minimum point and be not present maximum point, the frequency range be from it is infinitely small to
Infinitely great standard-sized sheet section.The frequency range that the above process determines is bandwidth range.
S105: according to the mapping relations and bandwidth range of dielectric constant and frequency point, any frequency point within the scope of bandwidth is obtained
Corresponding dielectric constant.
Specifically, it according to the bandwidth range and dielectric constant of above-mentioned determination and the mapping relations of frequency point, determines in frequency
In wide scope, the value range of dielectric constant, what which indicated is corresponding to any frequency point within the scope of bandwidth
The set of dielectric constant value.
As shown from the above technical solution, this application provides a kind of test method of dielectric constant, this method is to passing through
It is to test the circuit board to be tested of finished product.Testing procedure includes: to obtain each chain to be tested in circuit board to be tested
The cross sectional dimensions of the scattering parameter on road, the cross sectional dimensions of link to be tested and circuit board to be tested；According to it is above-mentioned to
Scattering parameter, the cross sectional dimensions of link to be tested and the cross sectional dimensions of circuit board to be tested for testing link, are situated between
The mapping relations of electric constant and frequency point；According to the mapping relations, bandwidth range is determined；According to bandwidth range and dielectric constant
With the mapping relations of frequency point, the corresponding dielectric constant of any frequency point is determined.The dielectric constant tested in this way is pair
What the circuit board to be tested of finished product was tested, it avoids caused by being tested in circuit manufacturing process to be tested because high temperature produces
Raw dielectric constant error.
In one example, step S103: according to scattering parameter, the cross sectional dimensions and electricity to be tested of link to be tested
The cross sectional dimensions of road plate obtains the mapping relations of dielectric constant and frequency point, specifically comprises the following steps:
Call pre-programmed curve fitting tool；By scattering parameter, the cross sectional dimensions and circuit to be tested of link to be tested
Input of the cross sectional dimensions of plate as pre-programmed curve fitting tool, obtain pre-programmed curve fitting tool output dielectric constant with
The relation curve of the relation curve of frequency point, dielectric constant and frequency point is used to indicate the mapping relations of dielectric constant and frequency point.
It should be noted that pre-programmed curve fitting tool is EDA curve-fitting tool.
Specifically, by the cross sectional dimensions of scattering parameter, the cross sectional dimensions of link to be tested and circuit board to be tested
It is input in EDA curve-fitting tool, after handling through EDA curve-fitting tool above-mentioned several item datas, obtains dielectric
The relation curve of constant and frequency point determines the mapping relations of dielectric constant and frequency point according to the relation curve.
Wherein, the relation curve of dielectric constant and frequency point is as shown in Figure 2.Shown in Fig. 2 is in EDA curve-fitting tool
Curve shows interface, and the bandwidth range shown is 20Ghz.Wherein, ordinate is dielectric constant, and abscissa is frequency, the seat
Curve in parameter is the relation curve of dielectric constant and frequency point.
It should be noted that determine that the process of dielectric constant and frequency point mapping relations can also be other implementations, this
Place no longer illustrates.
In one example, step S101: the corresponding scattering parameter of link to be tested in circuit board to be tested is obtained, specifically
Include the following steps:
Test signal is input to circuit board to be tested；Test signal is obtained by the chain to be tested in circuit board to be tested
The response signal exported behind road；The ratio for calculating test signal and response signal, using ratio as scattering parameter.
It should be noted that testing tool for generate test signal, receive response signal and according to test signal and
Response signal generates scattering parameter.Wherein, after testing tool generates test signal, the connection equipment of tool will be tested after tested
Signal is input in circuit board to be detected.Testing tool can be VNA or other testing tools, no longer illustrate herein.
Specifically, the test signal that tool generates after tested is input in each link to be tested of circuit board to be tested,
Test signal can send loss when passing through link to be tested, and with the loss, to determine scattering parameter in link to be tested, (S joins
Number).The mode for determining the configured transmission is to determine the response of test signal and test signal through generating after link to be tested
The ratio of signal.
In one example, the cross sectional dimensions of link to be tested and the cross of circuit board to be tested step S103: are obtained
Sectional dimension specifically comprises the following steps:
Circuit board to be tested is subjected to slicing treatment, to obtain the cross section of circuit board to be tested；It is surveyed by measuring tool
The cross sectional dimensions of the cross section of the cross sectional dimensions and circuit board to be tested of link to be tested in cross section.
It should be noted that measuring tool can be optical microscopy either other measuring tools, which can
With the more indistinguishable linear module of measurement naked eyes.
Specifically, the cross section of circuit board to be tested is sliced, using the cross section that is cut out as measurement sample
Product.The test sample is measured into the thickness of circuit board to be tested, the width of link to be tested and to be tested by measuring tool
The thickness of link.And using the data of measurement as the cross sectional dimensions of link to be tested and the cross section ruler of circuit board to be tested
It is very little.
In addition, this application provides a kind of dielectric constant test devices.Referring to Fig. 3, which is specifically included: parameter obtains
Module 301, dimension acquisition module 302, mapping relations obtain module 303, bandwidth determining module and dielectric constant determining module.
Wherein:
Parameter acquisition module 301, for obtaining the corresponding scattering parameter of link to be tested in circuit board to be tested.
Dimension acquisition module 302, for obtain link to be tested cross sectional dimensions and circuit board to be tested it is transversal
Face size.
Mapping relations obtain module 303, for according to the cross sectional dimensions of scattering parameter, link to be tested and to be tested
The cross sectional dimensions of circuit board obtains the mapping relations of dielectric constant and frequency point.
Bandwidth determining module 304 determines bandwidth range for the mapping relations according to dielectric constant and frequency point.
Dielectric constant determining module 305 is obtained for the mapping relations and bandwidth range according to dielectric constant and frequency point
The corresponding dielectric constant of any frequency point within the scope of bandwidth.
As shown from the above technical solution, this application provides a kind of test device of dielectric constant, which is to finished product
Circuit board to be tested tested.Testing procedure includes: the scattering for obtaining each link to be tested in circuit board to be tested
The cross sectional dimensions of parameter, the cross sectional dimensions of link to be tested and circuit board to be tested；According to above-mentioned link to be tested
Scattering parameter, the cross sectional dimensions of link to be tested and the cross sectional dimensions of circuit board to be tested, obtain dielectric constant with
The mapping relations of frequency point；According to the mapping relations, bandwidth range is determined；According to bandwidth range and dielectric constant and frequency point
Mapping relations determine the corresponding dielectric constant of any frequency point.With dielectric constant that the device to test obtains be to finished product to
Test circuit board is tested, and the dielectric generated caused by testing in circuit manufacturing process to be tested by high temperature is avoided
Constant error.
In one example, mapping relations obtain module according to the cross sectional dimensions of scattering parameter, link to be tested with
And the cross sectional dimensions of circuit board to be tested is specifically used for when obtaining the mapping relations of dielectric constant and frequency point:
Call pre-programmed curve fitting tool；By scattering parameter, the cross sectional dimensions and circuit to be tested of link to be tested
Input of the cross sectional dimensions of plate as pre-programmed curve fitting tool, obtain pre-programmed curve fitting tool output dielectric constant with
The relation curve of the relation curve of frequency point, dielectric constant and frequency point is used to indicate the mapping relations of dielectric constant and frequency point.
In one example, the corresponding scattering parameter of parameter acquisition module link to be tested in obtaining circuit board to be tested
When, it is specifically used for:
Test signal is input to circuit board to be tested；Test signal is obtained by the chain to be tested in circuit board to be tested
The response signal exported behind road；The ratio for calculating test signal and response signal, using ratio as scattering parameter.
In one example, dimension acquisition module is in the cross sectional dimensions and circuit board to be tested for obtaining link to be tested
Cross sectional dimensions when, be specifically used for:
Circuit board to be tested is subjected to slicing treatment, to obtain the cross section of circuit board to be tested；It is surveyed by measuring tool
The cross sectional dimensions of the cross section of the cross sectional dimensions and circuit board to be tested of link to be tested in cross section.
In one example, pre-programmed curve fitting tool is EDA curve-fitting tool.
All the embodiments in this specification are described in a progressive manner, same and similar portion between each embodiment
Dividing may refer to each other, and each embodiment focuses on the differences from other embodiments.Especially for system or
For system embodiment, since it is substantially similar to the method embodiment, so describing fairly simple, related place is referring to method
The part of embodiment illustrates.System and system embodiment described above is only schematical, wherein the conduct
The unit of separate part description may or may not be physically separated, component shown as a unit can be or
Person may not be physical unit, it can and it is in one place, or may be distributed over multiple network units.It can root
According to actual need that some or all of the modules therein is selected to achieve the purpose of the solution of this embodiment.Ordinary skill
Personnel can understand and implement without creative efforts.
Professional further appreciates that, unit described in conjunction with the examples disclosed in the embodiments of the present disclosure
And algorithm steps, can be realized with electronic hardware, computer software, or a combination of the two, in order to clearly demonstrate hardware and
The interchangeability of software generally describes each exemplary composition and step according to function in the above description.These
Function is implemented in hardware or software actually, the specific application and design constraint depending on technical solution.Profession
Technical staff can use different methods to achieve the described function each specific application, but this realization is not answered
Think beyond scope of the present application.
The foregoing description of the disclosed embodiments makes professional and technical personnel in the field can be realized or use the application.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the application.Therefore, the application
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (10)
1. a kind of test method of dielectric constant characterized by comprising
Obtain the corresponding scattering parameter of link to be tested in circuit board to be tested；
Obtain the cross sectional dimensions of the link to be tested and the cross sectional dimensions of the circuit board to be tested；
According to the cross section ruler of the scattering parameter, the cross sectional dimensions of the link to be tested and the circuit board to be tested
It is very little, obtain the mapping relations of dielectric constant and frequency point；
According to the mapping relations of the dielectric constant and frequency point, bandwidth range is determined；
According to the mapping relations and the bandwidth range of the dielectric constant and frequency point, any frequency within the scope of the bandwidth is obtained
The corresponding dielectric constant of point.
2. the test method of dielectric constant according to claim 1, which is characterized in that it is described according to the scattering parameter,
The cross sectional dimensions of the cross sectional dimensions of the link to be tested and the circuit board to be tested, obtains dielectric constant and frequency point
Mapping relations, comprising:
Call pre-programmed curve fitting tool；
By the cross sectional dimensions of the scattering parameter, the cross sectional dimensions of the link to be tested and the circuit board to be tested
As the input of the pre-programmed curve fitting tool, the dielectric constant and frequency point of the pre-programmed curve fitting tool output are obtained
The relation curve of relation curve, the dielectric constant and frequency point is used to indicate the mapping relations of the dielectric constant and frequency point.
3. the test method of dielectric constant according to claim 1, which is characterized in that described to obtain in circuit board to be tested
The corresponding scattering parameter of link to be tested, comprising:
Test signal is input to the circuit board to be tested；
Obtain the response signal that the test signal exports after the link to be tested in the circuit board to be tested；
The ratio for calculating the test signal and the response signal, using the ratio as the scattering parameter.
4. the test method of dielectric constant according to claim 1, which is characterized in that described to obtain the link to be tested
Cross sectional dimensions and the circuit board to be tested cross sectional dimensions, comprising:
The circuit board to be tested is subjected to slicing treatment, to obtain the cross section of the circuit board to be tested；
The cross sectional dimensions of link to be tested in the cross section and the circuit board to be tested are measured by measuring tool
The cross sectional dimensions of cross section.
5. the test method of dielectric constant according to claim 2, which is characterized in that the pre-programmed curve fitting tool is
EDA curve-fitting tool.
6. a kind of test device of dielectric constant characterized by comprising
Parameter acquisition module, for obtaining the corresponding scattering parameter of link to be tested in circuit board to be tested；
Dimension acquisition module, for obtain the link to be tested cross sectional dimensions and the circuit board to be tested it is transversal
Face size；
Mapping relations obtain module, for according to the cross sectional dimensions of the scattering parameter, the link to be tested and described
The cross sectional dimensions of circuit board to be tested obtains the mapping relations of dielectric constant and frequency point；
Bandwidth determining module determines bandwidth range for the mapping relations according to the dielectric constant and frequency point；
Dielectric constant determining module is obtained for the mapping relations and the bandwidth range according to the dielectric constant and frequency point
The corresponding dielectric constant of any frequency point within the scope of to the bandwidth.
7. the test device of dielectric constant according to claim 6, which is characterized in that the mapping relations obtain module and exist
According to the cross sectional dimensions of the scattering parameter, the cross sectional dimensions of the link to be tested and the circuit board to be tested,
When obtaining the mapping relations of dielectric constant and frequency point, it is specifically used for:
Call pre-programmed curve fitting tool；By the scattering parameter, the link to be tested cross sectional dimensions and it is described to
Input of the cross sectional dimensions of circuit board as the pre-programmed curve fitting tool is tested, the pre-programmed curve fitting tool is obtained
It is normal that the relation curve of the dielectric constant of output and the relation curve of frequency point, the dielectric constant and frequency point is used to indicate the dielectric
Several mapping relations with frequency point.
8. the test device of dielectric constant according to claim 6, which is characterized in that the parameter acquisition module is obtaining
In circuit board to be tested when the corresponding scattering parameter of link to be tested, it is specifically used for:
Test signal is input to the circuit board to be tested；The test signal is obtained by the circuit board to be tested
The response signal exported after link to be tested；The ratio for calculating the test signal and the response signal, the ratio is made
For the scattering parameter.
9. the test device of dielectric constant according to claim 6, which is characterized in that the dimension acquisition module is obtaining
When the cross sectional dimensions of the cross sectional dimensions of the link to be tested and the circuit board to be tested, it is specifically used for:
The circuit board to be tested is subjected to slicing treatment, to obtain the cross section of the circuit board to be tested；By measuring work
Tool measures the cross section of the cross section of the cross sectional dimensions and circuit board to be tested of link to be tested in the cross section
Size.
10. the test device of dielectric constant according to claim 6, which is characterized in that the pre-programmed curve fitting tool
For EDA curve-fitting tool.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910759990.XA CN110470909B (en) | 2019-08-16 | 2019-08-16 | Method and device for testing dielectric constant |
| PCT/CN2019/114534 WO2021031347A1 (en) | 2019-08-16 | 2019-10-31 | Method and apparatus for testing dielectric constant |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910759990.XA CN110470909B (en) | 2019-08-16 | 2019-08-16 | Method and device for testing dielectric constant |
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| CN110470909A true CN110470909A (en) | 2019-11-19 |
| CN110470909B CN110470909B (en) | 2020-11-10 |
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| CN201910759990.XA Active CN110470909B (en) | 2019-08-16 | 2019-08-16 | Method and device for testing dielectric constant |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116430124A (en) * | 2023-06-14 | 2023-07-14 | 赛恩领动(上海)智能科技有限公司 | Method, device, equipment and medium for testing complex dielectric constant of bumper material |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JPH05157784A (en) * | 1991-12-10 | 1993-06-25 | Fuji Elelctrochem Co Ltd | Method for measuring dielectric constant |
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| CN116430124B (en) * | 2023-06-14 | 2023-09-22 | 赛恩领动(上海)智能科技有限公司 | Method, device, equipment and medium for testing complex dielectric constant of bumper material |
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| WO2021031347A1 (en) | 2021-02-25 |
| CN110470909B (en) | 2020-11-10 |
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