CN110456202A - A kind of tamper machine testing control circuit and electronic equipment - Google Patents
A kind of tamper machine testing control circuit and electronic equipment Download PDFInfo
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- CN110456202A CN110456202A CN201910786360.1A CN201910786360A CN110456202A CN 110456202 A CN110456202 A CN 110456202A CN 201910786360 A CN201910786360 A CN 201910786360A CN 110456202 A CN110456202 A CN 110456202A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a kind of tamper machine testing control circuit and electronic equipment, design tears machine testing switch K2 open, whether is illegally torn open machine for detection device, if so, machine signal is illegally torn in output open；Tear machine state detection circuit open, machine testing switch K2 is torn in connection open, when illegally tearing machine signal open for detecting, is changed circuit state and is exported the data torn open under machine state；Machine state detection circuit is torn in main control circuit, connection open, for according to the data torn open under machine state, control equipment operation.By implementing the present invention, can effectively and be timely detected illegally tear open machine operation, when detecting that illegally tearing machine open operates, the warning that capable of emitting electronic equipment is removed or electronic equipment starts extremely, also settable electronic equipment can not enable illegal user that can not carry out illegal operation to electronic equipment by unauthorized users to access.
Description
Technical field
The present invention relates to tamper technical field more particularly to a kind of tamper machine testing control circuit and electronic equipments.
Background technique
The electronic equipments such as existing attendance access control equipment will appear illegal user and dismantle the case where equipment carries out illegal operation,
Producer generally can all judges by the way that tamper paster is arranged on the screw hole of electronic equipment either with or without illegally tearing machine open, but it is this
Tamper paster is arranged on screw hole to inform that consumer electronic devices are illegally torn open machine when user reaches scene, often can not
Detection tears machine operation or illegal user open and can carry out illegally tearing machine open in the case where the tamper paster not destroyed on screw hole, this
Sample user just can not know that equipment is illegally torn open machine, therefore the prior art can not effectively be examined to machine operation is illegally torn open
It surveys and limits.
Summary of the invention
The technical problem to be solved in the present invention is that for that can not be carried out effectively to machine operation is illegally torn open in the prior art
Detection and limitation defect, a kind of tamper machine testing control circuit and electronic equipment are provided.
The technical solution adopted by the present invention to solve the technical problems is: constructing a kind of tamper machine testing control circuit, wraps
It includes:
It tears machine testing switch K2 open, whether is illegally torn open machine for detection device, if then machine signal is illegally torn in output open；
Tear machine state detection circuit open, tear machine testing switch K2 described in connection open, for detect it is described illegally tear machine signal open when,
Change circuit state and exports the data torn open under machine state；
Main control circuit tears machine state detection circuit open described in connection, for tearing the data under machine state open according to, controls
Equipment operation.
Preferably, in tamper machine testing control circuit of the present invention, the machine state detection circuit of tearing open includes: to connect
The state reset input terminal CJ_RES for connecing the main control circuit is connected by first diode D1 and the 4th resistance R4 first via
It is grounded to the 6th resistance R6, the second tunnel by the second capacitor C2 and third road is connected to the 7th resistance R7, the 6th resistance
R6 is connected to by the 5th diode D5 tears machine signal detection end CJ_SW open, and the machine signal detection end CJ_SW that tears open is connected to illegally
Can trigger when tearing machine open it is described tear machine testing switch K2 open, the 7th resistance R7 first via by the 9th resistance R9 ground connection and
Second tunnel is connected to the base stage of the second triode Q2, the emitter ground connection of the second triode Q2；
First power supply VCC is connected to the cathode of third diode D3 by the second diode D2 first via, the second tunnel passes through
First capacitor C1 ground connection and third road are connected to the collector of the second triode Q2 by second resistance R2；Second source
BAT_OUT is connected to the emitter of the first triode Q1 by the third diode D3 first via, the second tunnel passes through third electricity
Resistance R3 and the 5th resistance R5 is connected to the collector of the second triode Q2 and third road is connected by the 3rd resistor R3
It is connected to the base stage of the first triode Q1；
The first via of the collector of the first triode Q1 passes through the four or two by the tenth resistance R10 ground connection, the second tunnel
Pole pipe D4 is connected to the cathode of the first diode D1 and third road by the 8th resistance R8 is connected to third transistor Q3
Base stage；
The emitter of the third transistor Q3 is grounded, and the first via of collector passes through first resistor R1 connection described first
Machine signal output end CJ_DET is torn in power supply VCC and the connection of the second tunnel open, it is described tear open machine signal output end CJ_DET be connected to it is described
Main control circuit.
Preferably, in tamper machine testing control circuit of the present invention, the first triode Q1 is three pole of positive-negative-positive
Pipe, the second triode Q2 and the third transistor Q3 are NPN type triode.
Preferably, in tamper machine testing control circuit of the present invention, the first power supply VCC is the confession of+3.3V
Power supply, the second source BAT_OUT are RTC power supply.
Preferably, in tamper machine testing control circuit of the present invention, the machine testing switch K2 that tears open is not triggered
When, it is described tear machine signal detection end CJ_SW open and be not detected illegally tear machine signal open, the state reset input terminal CJ_RES is high electricity
Flat, the first triode Q1, the second triode Q2 and the third transistor Q3 are both turned on, described to tear the output of machine signal open
End CJ_DET is low level.
Preferably, in tamper machine testing control circuit of the present invention, it is described tear open machine testing switch K2 triggering when, institute
It states to tear machine signal detection end CJ_SW open and detect and illegally tears machine signal open, the machine signal detection end CJ_SW that tears open is low level, described
State reset input terminal CJ_RES is high level, the first triode Q1, the second triode Q2 and the three or three pole
Pipe Q3 is turned off, and the machine signal output end CJ_DET that tears open is high level.
Preferably, in tamper machine testing control circuit of the present invention, the machine testing switch K2 that tears open is that hilted broadsword is double
Throw switch, moved end contact are the first contact, and motionless terminal contacts include the second contact and third contact；
Machine signal detection end CJ_SW is torn open described in the first contact connection for tearing machine testing switch K2 open, it is described to tear machine testing open
The second contact ground of switch K2, the third contact for tearing machine testing switch K2 open are hanging.
Preferably, in tamper machine testing control circuit of the present invention, the machine testing switch K2 that tears open is not triggered
When, first contact connects the third contact；It is described when tearing machine testing switch K2 triggering open, described in the connection of first contact
Second contact, the machine signal detection end CJ_SW that tears open is low level.
Preferably, in tamper machine testing control circuit of the present invention, the main control circuit includes: master controller
Power pins and first power electric connection on U1, the master controller U1, state reset pin and the state reset
Input terminal CJ_RES electrical connection is torn machine signal output detection pin open and is electrically connected with the machine signal output end CJ_DET that tears open.
A kind of electronic equipment, including main body has also been constructed in the present invention, further includes tamper machine testing described in any of the above embodiments
Control circuit.
By implement the invention has the following advantages:
The present invention is devised with the tamper machine testing control circuit for tearing machine testing switch open, can be triggered when illegal user tears machine open
This tears machine testing switch open, and output illegally tears machine signal open, and the machine state detection circuit of tearing open detects described after illegally tearing machine signal open, can change
Power transformation line state simultaneously exports and tears data under machine state open, informs that main control circuit equipment is illegally torn open machine, main control circuit according to
Tear the data under machine state open, control equipment operation, thus effectively and be timely detected and illegally tear machine operation open, it is illegal when detecting
When tearing machine operation open, the warning that capable of emitting electronic equipment is removed or electronic equipment starts extremely, also settable electronic equipment can not
By unauthorized users to access, enable illegal user that can not carry out illegal operation to electronic equipment.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples, in attached drawing:
Fig. 1 is the module map of tamper machine testing control circuit of the present invention；
Fig. 2 is the circuit diagram of tamper machine testing control circuit of the present invention；
Fig. 3 is the circuit diagram of the first power supply of the invention；
Fig. 4 is the circuit diagram of second source of the present invention；
Fig. 5 is the circuit diagram of main control circuit of the present invention.
Specific embodiment
For a clearer understanding of the technical characteristics, objects and effects of the present invention, now control attached drawing is described in detail
A specific embodiment of the invention.
Fig. 1 is the module map of tamper machine testing control circuit of the present invention, as shown in Figure 1, in the first embodiment, the present invention
Construct a kind of tamper machine testing control circuit, comprising: it tears machine testing switch K2 open, whether is illegally torn open machine for detection device,
If so, machine signal is illegally torn in output open；It tears machine state detection circuit open, machine testing switch K2 is torn described in connection open, for detecting
It states illegally when tearing machine signal open, changes circuit state and simultaneously export the data torn open under machine state；Main control circuit tears machine shape open described in connection
State detection circuit, for tearing the data under machine state, control equipment operation open according to.
Specifically, Fig. 2 is the circuit diagram of tamper machine testing control circuit of the present invention, as shown in Fig. 2, in the present embodiment,
The machine state detection circuit of tearing open include: tear open machine testing switch K2, state reset input terminal CJ_RES, tear open machine signal detection end CJ_SW,
Tear machine signal output end CJ_DET, first diode D1, the second diode D2, third diode D3, the 4th diode D4, the 5th open
Diode D5, first resistor R1, second resistance R2,3rd resistor R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6,
Seven resistance R7, the 8th resistance R8, the 9th resistance R9, the tenth resistance R10, first capacitor C1, the second capacitor C2, the first triode
Q1, the second triode Q2 and third transistor Q3；
The state reset input terminal CJ_RES for connecting main control circuit passes through first diode D1 and the 4th resistance R4 first
Road is connected to the 6th resistance R6, the second tunnel is grounded by the second capacitor C2 and third road is connected to the 7th resistance R7, the 6th electricity
Resistance R6 is connected to by the 5th diode D5 and tears machine signal detection end CJ_SW open, is torn machine signal detection end CJ_SW open and is connected to and illegally tears open
What be can trigger when machine tears machine testing switch K2 open, and the 7th resistance R7 first via is grounded by the 9th resistance R9 and the connection of the second tunnel
Emitter to the base stage of the second triode Q2, the second triode Q2 is grounded；
First power supply VCC is connected to the cathode of third diode D3 by the second diode D2 first via, the second tunnel passes through
First capacitor C1 ground connection and third road are connected to the collector of the second triode Q2 by second resistance R2；Second source
BAT_OUT is connected to the emitter of the first triode Q1 by the third diode D3 first via, the second tunnel passes through 3rd resistor R3
The collector of the second triode Q2 is connected to the 5th resistance R5 and third road by 3rd resistor R3 is connected to the one or three pole
The base stage of pipe Q1；
The first via of the collector of first triode Q1 passes through the 4th diode by the tenth resistance R10 ground connection, the second tunnel
D4 is connected to the cathode of first diode D1 and third road is connected to the base stage of third transistor Q3 by the 8th resistance R8；
The emitter of third transistor Q3 is grounded, the first via of collector by the first power supply of first resistor R1 connection VCC,
And second tunnel connection tear machine signal output end CJ_DET open, tear machine signal output end CJ_DET open and be connected to main control circuit.
In the present embodiment, the first triode Q1 is PNP type triode, and the second triode Q2 and third transistor Q3 are
NPN type triode.
First power supply VCC is to be powered conversion+3.3V power supply when device power, and second source BAT_OUT is to tear open
Machine state detection circuit is the RTC power supply operated normally the retention time.As shown in figure 3, Fig. 3 is the circuit of the first power supply of the invention
Figure, comprising: third capacitor C3, the 4th capacitor C4, the 5th capacitor C5, the 6th capacitor C6, the 7th capacitor C7, the 8th capacitor C8, the
Nine capacitor C9, the tenth capacitor C10, the 11st capacitor C11, the 12nd capacitor C12, the 13rd capacitor C13, eleventh resistor R11,
Twelfth resistor R12, thirteenth resistor R13, third inductance coil L3 and decompression chip U2；Wherein, the decompression chip U2
Model MP1580.
One tunnel external input power+12V is connect by connecting the 4th capacitor C4 all the way by connection third capacitor C3 ground connection
Ground is connected to the pin PVin of decompression chip U2 all the way, is connected to decompression core all the way all the way by connection the 5th capacitor C5 ground connection
The pin SVin of piece U2 is connected to the pin EN of decompression chip U2 by eleventh resistor R11 all the way, passes through the 11st electricity all the way
R11 and the 6th capacitor C6 ground connection is hindered, the pin SS for being depressured chip U2 is grounded by the 7th capacitor C7, is depressured the pin of chip U2
GND ground connection, the pin VCC for being depressured chip U2 are grounded by the 8th capacitor C8, and one tunnel out-put supply+3.3V passes through the 13rd capacitor
C13 ground connection, is grounded by the 12nd capacitor C12 all the way, is grounded all the way by the 11st capacitor C11, passes through the tenth capacitor all the way
C10 connection is depressured the pin FB of chip U2, is depressured the pin FB of chip U2, a-road-through by twelfth resistor R12 connection all the way
The pin LX for crossing third inductance coil L3 connection decompression chip U2, passes through third inductance coil L3 and the 9th capacitor C9 connection all the way
It is depressured the pin BS of chip U2, mono- tunnel pin FB of decompression chip U2 is grounded by thirteenth resistor R13.
As shown in figure 4, Fig. 4 is the circuit diagram of second source of the present invention, comprising: the 14th resistance R14, the 15th resistance
R15, the 16th resistance R16, the 17th resistance R17, the 18th resistance R18, the 14th capacitor C14, the 15th capacitor C15, electricity
Pond BAT1 and power conversion chip U3.Wherein, the model SD3078 of power conversion chip U3.
+ 3.3V power supply is passed through by pin SCL ,+the 3.3V power supply that the 14th resistance R14 is connected to power conversion chip U3
Pin SDA ,+the 3.3V power supply that 15th resistance R15 is connected to power conversion chip U3 pass through the 16th resistance R16 connection all the way
To the pin F32K of power conversion chip U3, it is grounded by the 14th capacitor C14, is connect all the way by the 15th capacitor C15 all the way
Ground, pin VDD ,+the 3.3V power supply for being connected to power conversion chip U3 all the way are connected to power supply conversion by the 17th resistance R17
The pin VBAT of the pin of chip U3, the pin GND ground connection of power conversion chip U3, power conversion chip U3 passes through the 18th electricity
Resistance R18, which is connected to, tears machine state detection circuit open, and the anode of battery BAT1, which is connected to, tears machine state detection circuit open, cathode ground connection.
In the present embodiment, when electronic equipment is not powered, the battery BAT1 in second source circuit is to tear machine state open
Detection circuit continued power, retention time operate normally.When electronic equipment is powered, the first power circuit connects external input electricity
Source+12V for main control circuit, second source circuit and tears the confession of machine state detection circuit open by the power supply of reduced output voltage+3.3V
Electricity, at this point, it is to tear the power supply of machine state detection circuit open that second source circuit, which is switched to+3.3V power supply,.
State reset input terminal CJ_RES connection main control circuit, is controlled by main control circuit, and input state resets
Signal, in order to enable electronic equipment not alarm, can input shape by master control circuit controls when electronic equipment needs repairing
For state reset signal to tearing machine state detection circuit open, machine state detection circuit output low level is torn in order open, and such main control circuit is just not
It can determine whether that machine was split.And tear machine signal output end CJ_DET open and also connect main control circuit, machine letter is torn in main control circuit detection open
The level of number output end CJ_DET.
Fig. 5 is the circuit diagram of main control circuit of the present invention, as shown in figure 5, main control circuit includes: master controller U1, it is main
Power pins and the first power electric connection on controller U1, state reset pin are electrically connected with state reset input terminal CJ_RES
It connects, tears machine signal output detection pin open and be electrically connected with torn open machine signal output end CJ_DET.Specifically, the model of master controller U1
For AK3750, power pins are pin Vdd, and state reset pin is pin PD2, and tearing machine signal output detection pin open is pin
PD1。
In the present embodiment, tearing machine testing switch K2 open is single-pole double-throw switch (SPDT), and moved end contact is the first contact, non-moving end touching
Point includes the second contact and third contact, and the first contact connection for tearing machine testing switch K2 open tears machine signal detection end CJ_SW open, tears machine open
The second contact ground of detection switch K2, the third contact for tearing machine testing switch K2 open are hanging.
When tearing machine testing switch K2 open and not being triggered, the first contact connects third contact, tears machine signal detection end CJ_SW open not
It detects and illegally tears machine signal open, state reset input terminal CJ_RES is high level, the first triode Q1, the second triode Q2 and the
Three triode Q3 are both turned on, and tearing machine signal output end CJ_DET open is low level.
When tearing machine testing switch K2 open and being triggered, the first contact connects the second contact, tears machine signal detection end CJ_SW detection open
To illegally machine signal is torn open, tear open machine signal detection end CJ_SW be low level, state reset input terminal CJ_RES be high level, first
Triode Q1, the second triode Q2 and third transistor Q3 are turned off, and tearing machine signal output end CJ_DET open is high level.
In addition, it is necessary to explanation, the electric current of the present invention the first power supply VCC in order to prevent hangs upside down second source BAT_
OUT, therefore joined the second diode D2 at the end second source BAT_OUT.
Completely, the anode of the state reset input terminal CJ_RES connection first diode D1 of main control circuit is connected, the
The cathode of one diode D1 is connected to the first end of the 4th resistance R4, and the second end of the 4th resistance R4 is connected to the 6th resistance R6's
The first end of first end, the first end of the second capacitor C2 and the 7th resistance R7, the second end ground connection of the second capacitor, the 6th resistance R6
Second end be connected to the anode of the 5th diode D5, the cathode connection of the 5th diode D5 tears machine signal detection end CJ_SW's open
First end tears the first contact that machine testing switch K2 is torn in CJ_SW second end connection in machine signal detection end open open, tears machine testing switch K2's open
Second contact ground, the third contact for tearing machine testing switch K2 open are hanging；The second end of 7th resistance R7 is connected to the 9th resistance R9
First end and the second triode Q2 base stage, the 9th resistance R9 second end ground connection, the second triode Q2 emitter ground connection；
The anode of first power supply VCC the second diode of connection D2, the cathode of the second diode D2 are connected to first capacitor C1
First end and second resistance R2 first end, second source BAT_OUT is connected to the anode of third diode D3, the three or two pole
The cathode of pipe D3 is connected to the emitter of the cathode of the second diode D2, the first end of 3rd resistor R3 and the first triode Q1,
The second end of first capacitor C1 is grounded, and the second end of second resistance R2 is connected to the collector of the second triode Q2,3rd resistor
The second end of R3 and the base stage of the first triode Q1 are connected to the first end of the 5th resistance R5, the second end connection of the 5th resistance R5
To the collector of the second triode Q2；
The collector of first triode Q1 is connected to the first end of the tenth resistance R10, the anode of the 4th diode D4 and
The first end of eight resistance R8, the second end ground connection of the tenth resistance R10, the cathode of the 4th diode D4 are connected to first diode D1
Cathode, the second end of the 8th resistance R8 is connected to the base stage of third transistor Q3, the emitter ground connection of third transistor Q3, the
The collector of three triode Q3 is connected to the first end of first resistor R1 and tears the first end of machine signal output end CJ_DET open, tears machine open
The second end of signal output end CJ_DET connects main control circuit, and the second end of first resistor R1 connects the first power supply VCC.
In a second embodiment, a kind of electronic equipment, including main body has also been constructed in the present invention, further includes described above anti-
Tear machine testing control circuit open.
Completely, before electronic equipment factory, the state reset input terminal CJ_RES of main control circuit connection is high level, the
The base stage of two triode Q2 is high level, and the second triode Q2 conducting, the base stage of the first triode Q1 is low level, the one or three pole
Pipe Q1 conducting, the both ends of the 8th resistance R8 are high level, and third transistor Q3 conducting, tearing machine signal output end CJ_DET open is low electricity
It is flat.
After electronic equipment factory power-off, since second source BAT_OUT remains that the machine state detection circuit of tearing open has electricity, tear open
Machine state detection circuit belongs to self-locking state, and tearing machine signal output end CJ_DET open is low level.
When the main control circuit of electronic equipment is not powered, if carrying out illegally tearing machine open, tears machine testing switch K2 open and is pressed,
Tearing machine signal detection end CJ_SW open is low level, and the 4th diode D4 and the 5th diode D5 have a pressure difference, the 4th diode D4 and the
Five diode D5 conducting, second source BAT_OUT are pulled low cut-off by the base stage of the second triode Q2, the first triode Q1's
Base stage is high level, and the first triode Q1 cut-off, the base stage of third transistor Q3 is low level, and third transistor Q3 cut-off is torn open
Machine state detection circuit unlocks state.
When electric on an electronic device, the first power supply VCC is to tear machine state detection circuit and main control circuit power supply open, tears machine letter open
Number output end CJ_DET is high level, and main control circuit detects that tearing machine signal output end CJ_DET open is high level, it is determined that electricity
Sub- equipment was split, and main control circuit issues the warning that electronic equipment is removed or electronic equipment starts extremely, or setting electricity
Sub- equipment can not be accessed, and enable illegal user that can not carry out illegal operation to electronic equipment, and the illegal operation includes: modification electricity
The control command and parameter of sub- equipment.
When electronic equipment is always maintained at energization, the first power supply VCC is tamper machine testing control circuit and main control circuit
Power supply tears machine testing switch K2 open and is pressed if carrying out illegally tearing machine open, and tearing machine signal detection end CJ_SW open is low level, the four or two pole
Pipe D4 and the 5th diode D5 has a pressure difference, the 4th diode D4 and the 5th diode D5 conducting, and second source BAT_OUT passes through the
The base stage of two triode Q2 is pulled low cut-off, and the base stage of the first triode Q1 is high level, and the first triode Q1 ends, and the three or three
The base stage of pole pipe Q3 is low level, third transistor Q3 cut-off, and the machine state detection circuit of tearing open unlocks state, and it is defeated to tear machine signal open
Outlet CJ_DET is high level, and main control circuit detects that tearing machine signal output end CJ_DET open is high level, it is determined that electronics is set
Standby to be split, main control circuit issues the warning that electronic equipment is removed or electronic equipment starts extremely, and also settable electronics is set
It is standby to be accessed, enable illegal user that can not carry out illegal operation to electronic equipment, the illegal operation includes: that modification electronics is set
Standby control command and parameter.
By implement the invention has the following advantages:
The present invention is devised with the tamper machine testing control circuit for tearing machine testing switch open, can be triggered when illegal user tears machine open
This tears machine testing switch open, and output illegally tears machine signal open, and the machine state detection circuit of tearing open detects described after illegally tearing machine signal open, can change
Power transformation line state simultaneously exports the data torn open under machine state, and main control circuit controls equipment operation according to the data torn open under machine state,
To effectively and be timely detected and illegally tear machine operation open, when detecting that capable of emitting electronic equipment is split when illegally tearing machine operation open
It removes or warning that electronic equipment starts extremely, also settable electronic equipment can not enable illegal user can not by unauthorized users to access
Illegal operation is carried out to electronic equipment.
The present invention be illustrated by specific embodiment, it will be appreciated by those skilled in the art that, do not departing from this hair
In the case where bright range, various transformation and equivalent substitute can also be carried out to the present invention.In addition, being directed to particular condition or specific feelings
Condition can do various modifications to the present invention, without departing from the scope of the present invention.Therefore, the present invention is not limited to disclosed tool
Body embodiment, and should include the whole embodiments fallen within the scope of the appended claims.
Claims (10)
1. a kind of tamper machine testing control circuit characterized by comprising
It tears machine testing switch K2 open, whether is illegally torn open machine for detection device, if so, machine signal is illegally torn in output open；
Tear machine state detection circuit open, tear machine testing switch K2 described in connection open, for detect it is described illegally tear machine signal open when, change
Circuit state simultaneously exports the data torn open under machine state；
Main control circuit tears machine state detection circuit open described in connection, for tearing the data under machine state open according to, controls equipment
Operation.
2. tamper machine testing control circuit according to claim 1, which is characterized in that described to tear machine state detection circuit packet open
Include: the state reset input terminal CJ_RES for connecting the main control circuit passes through first diode D1 and the 4th resistance R4 first via
Be connected to the 6th resistance R6, the second tunnel is grounded by the second capacitor C2 and third road is connected to the 7th resistance R7, the described 6th
Resistance R6 is connected to by the 5th diode D5 tears machine signal detection end CJ_SW open, and the machine signal detection end CJ_SW that tears open is connected to
Illegally can trigger when tearing machine open it is described tear machine testing switch K2 open, the 7th resistance R7 first via is grounded by the 9th resistance R9,
And second tunnel be connected to the base stage of the second triode Q2, the emitter ground connection of the second triode Q2；
First power supply VCC is connected to the cathode of third diode D3, the second tunnel by first by the second diode D2 first via
Capacitor C1 ground connection and third road are connected to the collector of the second triode Q2 by second resistance R2；Second source BAT_OUT
The emitter of the first triode Q1 is connected to by the third diode D3 first via, the second tunnel passes through 3rd resistor R3 and the
Five resistance R5 are connected to the collector of the second triode Q2 and third road be connected to by the 3rd resistor R3 it is described
The base stage of first triode Q1；
The first via of the collector of the first triode Q1 passes through the 4th diode by the tenth resistance R10 ground connection, the second tunnel
D4 is connected to the cathode of the first diode D1 and third road is connected to the base of third transistor Q3 by the 8th resistance R8
Pole；
The emitter of the third transistor Q3 is grounded, and the first via of collector passes through first resistor R1 connection first power supply
Machine signal output end CJ_DET is torn in VCC and the connection of the second tunnel open, and the machine signal output end CJ_DET that tears open is connected to the master control
Circuit processed.
3. tamper machine testing control circuit according to claim 2, which is characterized in that the first triode Q1 is PNP
Type triode, the second triode Q2 and the third transistor Q3 are NPN type triode.
4. tamper machine testing control circuit according to claim 2, which is characterized in that the first power supply VCC is+3.3V
Power supply, the second source BAT_OUT be RTC power supply.
5. tamper machine testing control circuit according to claim 2, which is characterized in that it is described tear open machine testing switch K2 not by
When triggering, it is described tear machine signal detection end CJ_SW open and be not detected illegally tear machine signal open, the state reset input terminal CJ_RES is
High level, the first triode Q1, the second triode Q2 and the third transistor Q3 are both turned on, described to tear machine signal open
Output end CJ_DET is low level.
6. tamper machine testing control circuit according to claim 2, which is characterized in that described to tear machine testing switch K2 triggering open
When, it is described tear machine signal detection end CJ_SW open and detect illegally tear machine signal open, the machine signal detection end CJ_SW that tears open is low level,
The state reset input terminal CJ_RES is high level, the first triode Q1, the second triode Q2 and the third
Triode Q3 is turned off, and the machine signal output end CJ_DET that tears open is high level.
7. tamper machine testing control circuit according to claim 2, which is characterized in that the machine testing switch K2 that tears open is single
Double-pole double throw switch, moved end contact are the first contact, and motionless terminal contacts include the second contact and third contact；
Machine signal detection end CJ_SW is torn open described in the first contact connection for tearing machine testing switch K2 open, it is described to tear machine testing switch open
The second contact ground of K2, the third contact for tearing machine testing switch K2 open are hanging.
8. tamper machine testing control circuit according to claim 7, which is characterized in that it is described tear open machine testing switch K2 not by
When triggering, first contact connects the third contact；It is described when tearing machine testing switch K2 triggering open, first contact connection
Second contact, the machine signal detection end CJ_SW that tears open is low level.
9. tamper machine testing control circuit according to claim 2, which is characterized in that the main control circuit includes: master
Power pins and first power electric connection on controller U1, the master controller U1, state reset pin and the shape
State the RESET input CJ_RES electrical connection tears machine signal output detection pin open and is electrically connected with the machine signal output end CJ_DET that tears open
It connects.
10. a kind of electronic equipment, including main body, which is characterized in that further include the described in any item tamper machine examinations of claim 1-9
Survey control circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910786360.1A CN110456202A (en) | 2019-08-23 | 2019-08-23 | A kind of tamper machine testing control circuit and electronic equipment |
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| CN201910786360.1A CN110456202A (en) | 2019-08-23 | 2019-08-23 | A kind of tamper machine testing control circuit and electronic equipment |
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| CN201910786360.1A Pending CN110456202A (en) | 2019-08-23 | 2019-08-23 | A kind of tamper machine testing control circuit and electronic equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023077920A1 (en) * | 2021-11-08 | 2023-05-11 | 北京卫星制造厂有限公司 | Aerospace low-voltage buck anti-interference and delay starting circuit |
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