CN110388993A - A kind of Low ESR temperature sensor and its thermometry - Google Patents
A kind of Low ESR temperature sensor and its thermometry Download PDFInfo
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- CN110388993A CN110388993A CN201910590087.5A CN201910590087A CN110388993A CN 110388993 A CN110388993 A CN 110388993A CN 201910590087 A CN201910590087 A CN 201910590087A CN 110388993 A CN110388993 A CN 110388993A
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- 238000004861 thermometry Methods 0.000 title claims abstract description 7
- 238000005070 sampling Methods 0.000 claims description 18
- 230000005611 electricity Effects 0.000 claims description 5
- 239000000956 alloy Substances 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000004364 calculation method Methods 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 9
- 238000007796 conventional method Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
- G01K7/25—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2219/00—Thermometers with dedicated analog to digital converters
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The invention discloses a kind of Low ESR temperature sensor and its thermometries, including sample circuit, power supply module, and wherein sample circuit includes ADC chip, thermistor, reference resistance;Wherein thermistor and reference resistance are to be connected in series;Wherein INP, INN pin of chip are connect respectively at the both ends of reference resistance, for measuring the both end voltage of reference resistance;Wherein the REF (+) of chip, REF (-) pin connect the reference voltage that the both end voltage at the both ends of thermistor, for measuring in thermistor is sampled as chip respectively;The present invention may make the output impedance of two input resistances smaller, and the input impedance of ADC chip requires also to decrease.
Description
Technical field
The present invention relates to fields of measurement, more particularly, to a kind of Low ESR temperature sensor and its temperature measurement side
Method.
Background technique
Low-impedance temperature sensor is to refer to experience temperature and be converted to the sensor of usable output signal, wherein adopting
Use vary with temperature and thermistor that resistance value also changes as measuring cell be a kind of common way.In order to collect temperature-sensitive electricity
The resistance value data of resistance are simultaneously converted into associated temperature value, and the general carry out data using the ADC chip with analog-digital conversion function are adopted
Sample.Wherein sampling is an important step in analog-digital conversion process, and chip needs to use reference voltage conduct in sampling process
To the amplitude reference of measured signal, usually require that reference voltage is greater than the voltage value of measured signal.ADC chip in current this field
The sampling conventional techniques to thermistor be following two mode:
1.ADC chip using the resistance Rref both end voltage value of fixed resistance value as sampling reference data voltage Uref,
By formula after being sampled to tested thermistor Rx:It can be calculated the resistance value of Rx, but due to
It requires reference voltage Uref to be greater than measured thermistor Rx both end voltage Ux in the sampling of ADC chip, is series connection in Rx, Rref
On the basis of, then sampling request Rref > Rx;The shortcomings that this mode be will lead to Rx and Rref output impedance it is larger and with
Temperature change is also big, has higher requirement to the input impedance of ADC chip;
2.ADC chip is using internal reference voltage as the reference data voltage of sampling, to tested thermistor Rx and reference
Resistance Rref sample respectively after by two formula: 1. 2. simultaneous calculates
The resistance value of Rx can be obtained (AD1, AD2 are that ADC chip carries out the digital signal after analog-to-digital conversion);Mode two is although overcome mode one
The larger problem of impedance, but mode two is measured twice due to needing to switch input terminal, causes to introduce new problem, same
Under equal ranges and precision, output speed is at least upper one times slow compared with mode one after ADC carries out analog-to-digital conversion.
Summary of the invention
Based on this technical background, technical problems to be solved are as follows: how the output speed for not influencing ADC chip feelings
The requirement of the input impedance to ADC chip is reduced under condition.
In order to solve the above technical problem, the present invention provides a kind of low-impedance temperature sensor and its application methods, originally
Invention uses following technical scheme:
A kind of low-impedance temperature sensor, including sample circuit, power supply module, wherein sample circuit includes chip, heat
Quick resistance, reference resistance, power supply module;Wherein thermistor and reference resistance are to be connected in series;Wherein INP, INN of chip draw
Foot is connect respectively at the both ends of reference resistance, and for measuring the both end voltage of reference resistance, wherein the REF (+) of chip, REF (-) draw
Foot connects the reference voltage that the both end voltage at the both ends of thermistor, for measuring in thermistor is sampled as chip respectively,
Wherein power supply module and sample circuit are connected in series.
Further, thermistor includes semiconductor thermistor, metal thermo-sensitive resistance, alloy thermal responsive electricity.
Further, thermistor includes posive temperature coefficient thermistor and negative tempperature coefficient thermistor.
Further, chip is the ADC chip with analog-digital conversion function.
Further, invention additionally discloses application methods, and step 1, thermistor feature is calculated in basis after sampling
Value, step 2 will calculate resulting thermistor characteristic value and be converted into temperature, which is characterized in that calculate in step 1 resulting
Thermistor characteristic value expression way includes 1/Rx or Rx.
Further, thermistor includes semiconductor thermistor or metal thermo-sensitive resistance or alloy thermal responsive resistance.
Further, thermistor includes posive temperature coefficient thermistor or negative tempperature coefficient thermistor.
Further, the calculation method of step 1 is, when thermistor is negative tempperature coefficient thermistor, at this time according to public affairs
Formula:The characteristic value for calculating thermistor Rx is that resistance value is reciprocal, when thermistor is positive temperature
Coefficient resistance, at this time according to formulaThe characteristic value for calculating thermistor Rx is resistance value;Wherein
ADx is resulting value after ADC sampling, and K is the maximum value that ADC is obtained according to ADC digit, and Rref is reference resistance.
ADC chip is all that (such as the internal reference voltage of ADC0809 is by internal reference voltage in existing public technology
Voltage 4.75-5.25V) or using reference resistance both ends is measured as the reference data voltage of sampling, both modes have been made
The ADC product manual or databook of mainstream on the market are written for the application method of standard.And compared with existing public technology
For, it is all from the convention of input end measuring measured signal, by tested thermistor Rx that the present invention, which has overturned traditional adc application,
The reference voltage that both end voltage Ux is sampled as ADC chip, and using the Rref of fixed resistance value as its voltage of input end measuring
Value, obtains temperature value corresponding to thermistor Rx further according to the characteristic of thermistor.So it can avoid mentioning in background technique
To two kinds of current conventional techniques bring the problem of.
In conclusion compared with prior art, the invention has the following beneficial effects:
1. may make input resistance (the sum of Rref and Rx resistance value) the case where realizing same range according to this technical solution
Under it is smaller compared to existing technologies, and then the output impedance between two resistance also can be smaller, and to the defeated of ADC chip
Entering resistance requirements can also decrease;
2. when thermistor is negative tempperature coefficient thermistor, according to formula:It calculates
The resistance value of thermistor Rx is reciprocal, and the beneficial effect calculated in this way is that artificially setting resistance value inverse and temperature are in positive
It closes, sensor linearity index can be improved, be conducive to the reduction of error and improve measurement accuracy.
Detailed description of the invention
It, below will be to embodiment or description of the prior art in order to illustrate more clearly of the application or scheme in the prior art
Needed in attached drawing make one and simple introduce, it should be apparent that, the accompanying drawings in the following description is some realities of the application
Example is applied, it for those of ordinary skill in the art, without creative efforts, can also be according to these attached drawings
Obtain other attached drawings.
Fig. 1 is existing disclosed conventional techniques circuit diagram one;
Fig. 2 is existing disclosed conventional techniques circuit diagram two;
Fig. 3 is one circuit diagram of embodiment of the low-impedance temperature sensor of the present invention;
Fig. 4 is two circuit diagram of embodiment of the low-impedance temperature sensor of the present invention.
Specific embodiment
In order to enable those skilled in the art to better understand the solution of the present invention, below in conjunction with existing public technology and its
There are the problem of be illustrated, so as to technical solution in the embodiment of the present invention carry out it is apparent, be fully described by.It is aobvious
So, embodiments described below only a part of the embodiments of the present invention, instead of all the embodiments.Based on the present invention
In embodiment, every other implementation obtained by those of ordinary skill in the art without making creative efforts
Example, should fall within the scope of the present invention.
It is sayed based on background technique, the sampling conventional techniques to thermistor of ADC chip are following in current this field
Two ways:
1. ADC chip is using the resistance Rref both end voltage value of fixed resistance value as the reference data voltage of sampling such as Fig. 1
Uref, by formula after being sampled to tested thermistor Rx:It can be calculated the resistance value of Rx, still
Due to requiring reference voltage Uref to be greater than measured thermistor Rx both end voltage Ux in the sampling of ADC chip, it is in Rx, Rref
On the basis of concatenated, then Rref > Rx, disadvantage are required are as follows: will lead to the output impedance of Rx and Rref greatly and vary with temperature
Increase, has higher requirement to the input impedance of ADC chip.
2. ADC chip is using internal reference voltage as the reference data voltage of sampling, to tested thermistor Rx such as Fig. 2
By two formula after being sampled respectively with reference resistance Rref: (AD1、
AD2 is that ADC chip carries out the digital signal after analog-to-digital conversion), 1. 2. simultaneous can be calculated the resistance value of Rx;The circuit overcomes
The shortcomings that mode one, but measured twice due to needing to switch input terminal, and cause new problem: in same range and essence
Under degree, output speed is at least upper one times slow compared with mode one after ADC carries out analog-to-digital conversion.
In order to overcome the problems, such as that technology disclosed above exists, and those skilled in the art is made to more fully understand the application side
Case, below in conjunction with attached drawing, the technical scheme in the embodiment of the application is clearly and completely described.
Embodiment 1: a kind of low-impedance temperature sensor, including sample circuit, as shown in figure 3, wherein sample circuit packet
Include chip, thermistor, reference resistance, power supply module;One end of reference resistance is connect with power supply module, the other end and temperature-sensitive electricity
One end of resistance connects;The wherein other end ground connection of thermistor, thermistor and reference resistance are to be connected in series;Wherein chip
INP, INN pin are connect respectively at the both ends of reference resistance, for measuring the both end voltage of reference resistance;The wherein REF of chip
(+), REF (-) pin are connect respectively at the both ends of thermistor, for measuring the both end voltage in thermistor as chip sampling
Reference voltage;Wherein chip is 16 ADC chips with analog-digital conversion function.Wherein thermistor is negative temperature coefficient heat
Quick resistance takes reference resistance Rref=10K, 16 ADC correspond to K=65536, according to formula by taking thermistor 503ET as an example:The resistance value for calculating thermistor Rx is reciprocal, can obtain temperature corresponding A D value such as following table one, pass through
Read AD value can obtain measured temperature value at this time.
Temperature (DEG C) | 1/Rx(Ω) | AD value |
0 | 1/161.9 | 4048 |
10 | 1/99.13 | 6611 |
20 | 1/62.38 | 10506 |
30 | 1/40.24 | 16286 |
40 | 1/26.58 | 24656 |
50 | 1/17.93 | 36551 |
The temperature table of comparisons of one 503ET thermistor of table
Embodiment 2: a kind of low-impedance temperature sensor, including sample circuit, as shown in figure 4, wherein sample circuit packet
Include chip, thermistor, reference resistance, power supply module;One end of thermistor is connect with power supply module, the other end and reference electricity
One end of resistance connects;The wherein other end ground connection of reference resistance, thermistor and reference resistance are to be connected in series;Wherein chip
INP, INN pin are connect respectively at the both ends of reference resistance, for measuring the both end voltage of reference resistance;The wherein REF of chip
(+), REF (-) pin are connect respectively at the both ends of thermistor, for measuring the both end voltage in thermistor as chip sampling
Reference voltage;Wherein chip is 16 ADC chips with analog-digital conversion function.Wherein thermistor is positive temperature coefficient heat
Quick resistance takes reference resistance Rref=510K, 16 ADC correspond to K=65536, according to formula by taking platinum resistance PT1000 as an example:The resistance value of thermistor Rx is calculated, temperature corresponding A D value such as following table two can be obtained, pass through read AD value
Measured temperature value at this time can be obtained.
Temperature (DEG C) | Resistance (Ω) | AD value |
0 | 1000 | 33423 |
10 | 1039.25 | 32161 |
20 | 1077.935 | 31007 |
30 | 1116.729 | 29930 |
40 | 1155.408 | 28928 |
50 | 1193.971 | 27993 |
The temperature table of comparisons of two platinum resistance PT1000 thermistor of table.
Claims (8)
1. a kind of low-impedance temperature sensor, including sample circuit, power supply module, which is characterized in that the sample circuit packet
Chip is included, thermistor, reference resistance, the thermistor and reference resistance are to be connected in series;INP, INN of the chip draw
Foot is connect respectively at the both ends of reference resistance, for measuring the both end voltage of reference resistance;REF (+), the REF (-) of the chip draw
Foot connects the reference voltage that the both end voltage at the both ends of thermistor, for measuring in thermistor is sampled as chip respectively,
The power supply module and sample circuit are connected in series.
2. a kind of low-impedance temperature sensor as described in claim 1, which is characterized in that the thermistor is semiconductor
Thermistor or metal thermo-sensitive resistance or alloy thermal responsive resistance.
3. a kind of low-impedance temperature sensor as described in claim 1, which is characterized in that the thermistor is positive temperature
Coefficient resistance or negative tempperature coefficient thermistor.
4. a kind of low-impedance temperature sensor as described in claim 1, which is characterized in that the chip is turned with modulus
Change the ADC chip of function.
5. a kind of thermometry of low-impedance temperature sensor as described in claim 1, step 1, basis after sampling
Thermistor characteristic value is calculated, step 2 will calculate resulting thermistor characteristic value and be converted into temperature, and feature exists
In calculating resulting thermistor characteristic value expression way in step 1 is 1/Rx or Rx.
6. a kind of thermometry of low-impedance temperature sensor as claimed in claim 5, which is characterized in that the heat
Quick resistance is semiconductor thermistor or metal thermo-sensitive resistance or alloy thermal responsive resistance.
7. a kind of thermometry of low-impedance temperature sensor as claimed in claim 5, which is characterized in that the heat
Quick resistance is posive temperature coefficient thermistor or negative tempperature coefficient thermistor;When thermistor is posive temperature coefficient thermistor
When, the thermistor characteristic value expression way is Rx;When thermistor is negative tempperature coefficient thermistor, the temperature-sensitive electricity
Resistance characteristic value expression way is 1/Rx.
8. a kind of thermometry of low-impedance temperature sensor as claimed in claim 5, which is characterized in that the step
Rapid one calculation method is, when thermistor is negative tempperature coefficient thermistor, at this time according to formula: The characteristic value for calculating thermistor Rx is that resistance value is reciprocal, when thermistor is posive temperature coefficient thermistor, at this time
According to formulaThe characteristic value for calculating thermistor Rx is resistance value;Wherein Rx is thermistor resistance value,
ADx is resulting value after ADC sampling, and K is the maximum value that ADC is obtained according to ADC digit, and Rref is reference resistance.
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110632959A (en) * | 2019-10-18 | 2019-12-31 | 湖南晨威高科有限公司 | Charging pile internal temperature control method |
CN112798129A (en) * | 2020-12-30 | 2021-05-14 | 浙江启尔机电技术有限公司 | Temperature measuring device |
CN112953541A (en) * | 2021-02-05 | 2021-06-11 | 江苏省如高高压电器有限公司 | Analog-to-digital conversion chip and peripheral circuit |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0526741A (en) * | 1991-07-20 | 1993-02-02 | Pfu Ltd | Thermistor temperature detection device using a/d converter |
JPH06137963A (en) * | 1992-10-23 | 1994-05-20 | Fuji Electric Co Ltd | Temperature detecting circuit employing thermister |
JP2008309762A (en) * | 2007-06-18 | 2008-12-25 | Mitsubishi Materials Corp | Detector of liquid level and temperature around thermistor periphery |
CN102798483A (en) * | 2011-05-25 | 2012-11-28 | 三美电机株式会社 | Temperature measuring system |
KR20120132323A (en) * | 2011-05-25 | 2012-12-05 | 미쓰미덴기가부시기가이샤 | Temperature measuring system |
KR20140012865A (en) * | 2012-07-23 | 2014-02-04 | 주식회사 바이오메드랩 | Apparatus for measuring temperature using thermistor |
US20140347198A1 (en) * | 2013-05-24 | 2014-11-27 | National Taiwan University | Analog-to-digital converting circuit with temperature sensing and electronic device thereof |
CN208953155U (en) * | 2018-09-19 | 2019-06-07 | 湖南福德电气有限公司 | A kind of multi-channel temperature measurement circuit |
CN211576401U (en) * | 2019-07-02 | 2020-09-25 | 杨晨 | Low-impedance temperature sensor |
-
2019
- 2019-07-02 CN CN201910590087.5A patent/CN110388993B/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0526741A (en) * | 1991-07-20 | 1993-02-02 | Pfu Ltd | Thermistor temperature detection device using a/d converter |
JPH06137963A (en) * | 1992-10-23 | 1994-05-20 | Fuji Electric Co Ltd | Temperature detecting circuit employing thermister |
JP2008309762A (en) * | 2007-06-18 | 2008-12-25 | Mitsubishi Materials Corp | Detector of liquid level and temperature around thermistor periphery |
CN102798483A (en) * | 2011-05-25 | 2012-11-28 | 三美电机株式会社 | Temperature measuring system |
KR20120132323A (en) * | 2011-05-25 | 2012-12-05 | 미쓰미덴기가부시기가이샤 | Temperature measuring system |
KR20140012865A (en) * | 2012-07-23 | 2014-02-04 | 주식회사 바이오메드랩 | Apparatus for measuring temperature using thermistor |
US20140347198A1 (en) * | 2013-05-24 | 2014-11-27 | National Taiwan University | Analog-to-digital converting circuit with temperature sensing and electronic device thereof |
CN208953155U (en) * | 2018-09-19 | 2019-06-07 | 湖南福德电气有限公司 | A kind of multi-channel temperature measurement circuit |
CN211576401U (en) * | 2019-07-02 | 2020-09-25 | 杨晨 | Low-impedance temperature sensor |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110632959A (en) * | 2019-10-18 | 2019-12-31 | 湖南晨威高科有限公司 | Charging pile internal temperature control method |
CN112798129A (en) * | 2020-12-30 | 2021-05-14 | 浙江启尔机电技术有限公司 | Temperature measuring device |
CN112953541A (en) * | 2021-02-05 | 2021-06-11 | 江苏省如高高压电器有限公司 | Analog-to-digital conversion chip and peripheral circuit |
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