CN110375705A - Antenna reflector and its type face deformation measurement method and measurement of comparison method - Google Patents

Antenna reflector and its type face deformation measurement method and measurement of comparison method Download PDF

Info

Publication number
CN110375705A
CN110375705A CN201910770647.5A CN201910770647A CN110375705A CN 110375705 A CN110375705 A CN 110375705A CN 201910770647 A CN201910770647 A CN 201910770647A CN 110375705 A CN110375705 A CN 110375705A
Authority
CN
China
Prior art keywords
target spot
reflector
measurement
fitting
deformation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910770647.5A
Other languages
Chinese (zh)
Other versions
CN110375705B (en
Inventor
谭述君
聂天智
宋祥帅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dalian University of Technology
Original Assignee
Dalian University of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dalian University of Technology filed Critical Dalian University of Technology
Priority to CN201910770647.5A priority Critical patent/CN110375705B/en
Publication of CN110375705A publication Critical patent/CN110375705A/en
Application granted granted Critical
Publication of CN110375705B publication Critical patent/CN110375705B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/32Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

Antenna reflector and its type face deformation measurement method and measurement of comparison method, belong to overall deformation fields of measurement, it is larger currently for the presence of grid reflector type face deformation measurement or deviation in order to solve, or cumbersome and time-consuming and laborious problem, main points are to arrange multiple target spots in reflector type face, the three-dimensional coordinate for measuring target spot, carries out single measurement with deformation displacement of the sensor for the target spot in reflector type face;Reflector type face is divided into multiple fitted areas;The deformation displacement that the coordinate information of target spot in different fitted areas is corresponded to target spot using fitting of a polynomial respectively, the solution of multinomial coefficient is carried out using least square method, obtains fitting function corresponding to every fitted area;The fitting function that the coordinate information of target spot in different zones is substituted into corresponding region, updates and obtains the deformation displacement of corresponding target spot, and effect is to improve its overall deformation measurement accuracy using spatial continuity feature, and can be easy to operate, time saving and energy saving.

Description

Antenna reflector and its type face deformation measurement method and measurement of comparison method
Technical field
The invention belongs to overall deformation fields of measurement, are related to a kind of measurement method of antenna-reflected type face deformation.
Background technique
High-precision solid surface antenna reflector, such as grid reflector, be widely used in satellite communication, earth observation and The fields such as deep space exploration.It needs to keep higher type face precision in the operating condition, is just able to satisfy the requirement of its working frequency, However influenced by factors such as space thermal force, structural relaxation and material creeps, it will lead to reflector type face and deform, make it Type face accuracy decline needs to measure the deformation of its type face and is adjusted.
It is right at present often using the method for using photogrammetric equal sensors single measurement or more measurements to take mean value The deformation of reflector type face is determined, however is limited to the measurement accuracy of sensor, and the value of single measurement always has certain deviation , and use and the method that is averaged of measurement is repeated several times is able to ascend measurement accuracy, but this method concrete operations it is cumbersome and It is time-consuming and laborious, especially for reflector type face dynamic deformation in the case where, do not have repeatedly measurement and take the condition of mean value.
Summary of the invention
It is larger or cumbersome and time-consuming currently for the presence of antenna-reflected type face deformation measurement or deviation in order to solve Laborious problem, the present invention propose a kind of antenna-reflected type face deformation measurement method, and this method step in measurement is simple, energy It is enough time saving and energy saving, and measurement accuracy is high, and further solves the problem of reflector type face dynamic deformation measures.
In order to achieve the above object, the following technical solutions are proposed: a kind of antenna-reflected type face deformation measurement side by the present invention Method includes the following steps:
S1. multiple target spots are arranged in reflector type face, measures the three-dimensional coordinate of target spot, coordinate origin is placed in reflector Type face center, Z axis parallel reflectors out-of-plane deformation direction, X/Y plane is perpendicular to Z axis, with sensor for the target in reflector type face The Z-direction deformation displacement dz of point carries out single measurement;
S2. according to the surface-type feature of reflector and due to fitting demand target spot quantity, reflector type face is divided into more A fitted area;
S3., the X of target spot, Y axis coordinate information in different fitted areas are corresponded to the Z axis of target spot using fitting of a polynomial respectively Direction distortion is displaced dz, and the solution of multinomial coefficient is carried out using least square method, obtains intending corresponding to every fitted area Close function;
S4., the fitting function that the coordinate information of the X of target spot in different zones, Y-axis are substituted into corresponding region, updates and obtains The Z-direction deformation displacement dz of corresponding target spot.
Further, by taking grid reflector as an example, grid reflector is regular hexagon, and multiple groove installations are arranged in back PZT piezoelectric actuator, since grid reflector rear channel affects the continuity in its monolithic devices face, so according to point of groove Grid reflector is divided into several small delta-shaped regions by cloth, and adjacent several small triangles are integrated into a triangle fitting Region, so that six triangle fitted areas that the grid reflector of regular hexagon has shape essentially identical, and each fitting Region has the vertex of intersection, and fitted area is distributed with this vertex in inverted triangle, and target spot quantity is more than 10 in each fitted area It is a.
Further, by taking grid reflector as an example, the area in grid reflector type face is 0.311 square metre, 30 PZT pressures Motor-driven cylinder is mounted in the U-type groove at reflector back, and grid reflector front is disposed with the target that 178 diameters are 1.6 centimetres Point measures target coordinate using DIC, grid reflector is divided into 24 small delta-shaped regions according to the distribution of groove, by four A adjacent small triangle is integrated into 1 fitted area, so that the grid reflector of regular hexagon has essentially identical six of shape A triangle fitted area, and each fitted area has the vertex of intersection, fitted area is distributed with this vertex in inverted triangle, often Target spot quantity is 28~32 in a fitted area.
Further, the fitting using quadratic polynomial be fitted, if in a certain fitted area any target spot Z axis side To deformation displacement dzi=f (xi,yi) write as:
When having n target spot in a certain region, n equation is arranged:
A in above formula20、a02、a11、a10、a01、a00For fitting coefficient to be solved, (xi,yi) it is target spot in X/Y plane Two-dimensional coordinate, dziIt is target spot along the deformation displacement of Z-direction, RiFor residual error, fitting coefficient a appropriate is chosenijMake the flat of residual error Fang HeReach minimum value, obtains polynomial fit function and then by the (x of n target spoti,yi) coordinate substitution fitting letter Number, updates the Z-direction deformation displacement dz for corresponding to target spot outi
Further, described to choose fitting coefficient a appropriateijMake the quadratic sum of residual errorReach minimum value, specific side Formula is to ask respectivelyTo the partial derivative of all fitting coefficients, can solve when to enable all partial derivatives be 0 to fitting coefficient.
The invention further relates to a kind of grid reflectors, are regular hexagon grid reflectors, and projection bore is 0.6 meter, face Product is 0.311 square metre, and 30 PZT piezoelectric actuators are mounted in the U-type groove at reflector back, grid reflector front arrangement Having 178 diameters is 1.6 centimetres of target spot, measures target coordinate using DIC, is divided grid reflector according to the distribution of groove For 24 small delta-shaped regions, four adjacent small triangles are integrated into 1 fitted area, so that the grid of regular hexagon reflects Six triangle fitted areas that device has shape essentially identical, and each fitted area has the vertex of intersection, fitted area It being distributed with this vertex in inverted triangle, target spot quantity is 30 in each fitted area, and with one or two fitted area Target spot lazy weight 30.
The present invention also relates to a kind of antenna-reflected type face deformation contrast measurement method, using regular hexagon grid reflector, It is 0.6 meter that it, which projects bore, 30 PZT piezoelectric actuators is mounted in the U-type groove at reflector back, cloth on grid reflector It is equipped with the target spot that 178 diameters are 1.6 centimetres, using DIC systematic survey target coordinate, DIC the measuring precision is 20um+ Grid reflector is divided into 24 small delta-shaped regions according to the distribution of groove by 10um/m, and four adjacent small triangles are whole It is combined into 1 fitted area, so that six triangle fitted areas that the grid reflector of regular hexagon has shape essentially identical, And each fitted area has the vertex of intersection, fitted area is distributed with this vertex in inverted triangle, target spot in each fitted area Quantity is 30, and target spot lazy weight 30 with one or two fitted area, arranges multiple targets in reflector type face Point, measures the three-dimensional coordinate of target spot, and coordinate origin is placed in the type face center of reflector, Z axis parallel reflectors out-of-plane deformation side To X/Y plane is perpendicular to Z axis;
By DIC system duplicate measurements 50 times under original state, target spot data are recorded, coordinate origin o is located in reflector The heart, Z axis along deformation direction outside slotted-type reflector surface perpendicular to reflector level, and to the number of PZT piezoelectric actuator;
2 target spots are randomly selected from 178 target spots, in its initial state 50 Z axis coordinates of duplicate measurements, after observation The Z axis coordinate and measure the difference between obtained obtained Z axis coordinate for the first time that 49 measurements obtain;Take the Z of 50 measurements The average value of axial coordinate is as the measured value under current state;
Two kinds of operating conditions are set,
Operating condition 1: choosing two actuator and apply 150 volts of voltages respectively, and repeats current state measurement 50 times and take mean value;
Operating condition 2: choosing four actuator and apply 150 volts of voltages respectively, and repeats current state measurement 50 times and take mean value;
Subtract each other to obtain the mark of the type face under two kinds of operating condition current states with the average value of the lower 50 measurements Z axis coordinate of original state Quasi- deformation data draws cloud atlas;
Certain Z axis coordinates measurements is randomly choosed from operating condition 1, operating condition 2 subtracts original state Z axis of lower first time coordinate Measured value obtains the type face deformation data of grid reflector single measurement, draws cloud atlas;
The lower reflector type face phenotypic criteria cloud atlas of operating condition 1, operating condition 2 and single measurement reflector type face Aberration nephogram are compared, The difference of the reflector type face deformation of record single measurement and the reflector type face deformation for taking mean value repeatedly measured;
Reflector type face is divided into multiple quasi- by the target spot quantity of demand according to the surface-type feature of reflector and due to fitting Region is closed, the X of target spot, Y axis coordinate information in different fitted areas are corresponded to the Z-direction of target spot using fitting of a polynomial respectively Deformation displacement dz is carried out the solution of multinomial coefficient using least square method, obtains fitting letter corresponding to every fitted area Number;
By operating condition 1, the data of 2 single measurement of operating condition, the target coordinate in every piece of region is respectively adopted secondary multinomial Formula carry out surface fitting, if in a certain fitted area any target spot Z-direction deformation displacement dzi=f (xi,yi) write as:
When having n target spot in a certain region, n equation is arranged:
A in above formula20、a02、a11、a10、a01、a00For fitting coefficient to be solved, (xi,yi) it is target spot in X/Y plane Two-dimensional coordinate, dziIt is target spot along the deformation displacement of Z-direction, RiFor residual error, fitting coefficient a appropriate is chosenijMake the flat of residual error Fang HeReach minimum value, obtains polynomial fit function and then by the (x of n target spoti,yi) coordinate substitution fitting letter Number, updates the Z-direction deformation displacement dz for corresponding to target spot outi
Drawing indicates the Z-direction deformation displacement of fitting correspondence target spot and repeatedly measures the Z-direction being averaged The error amount of deformation displacement;
It calculates all target spot Z-direction deformation displacements of single measurement in operating condition 1 and repeatedly measures Z-direction deformation displacement All target spot Z-direction deformation displacements after taking the mean error and single measurement fitting in the case of mean value and repeatedly measurement Z axis Direction distortion displacement takes the mean error in the case of mean value;
It calculates all target spot Z-direction deformation displacements of single measurement in operating condition 2 and repeatedly measures Z-direction deformation displacement All target spot Z-direction deformation displacements after taking mean error and the single measurement fitting in the case of mean value and repeatedly measuring take Mean error in the case of mean value;
Data after fitting are drawn into reflector type face Aberration nephogram;
Reflector type face Aberration nephogram after operating condition 1,2 single measurement of operating condition fitting, compared to the reflection after single measurement Type face Aberration nephogram is closer to operating condition 1, operating condition more than 2 times and measures the standard transformations cloud atlas for taking mean value;
Operating condition 1,2 single measurement reflector type face Aberration nephograms and single measurement fitting back reflection type face are deformed into cloud Figure takes the standard transformations cloud atlas of mean value to subtract each other to obtain type face distortion inaccuracy cloud atlas and compare with multiple measurement respectively;Compare operating condition 1, the reflector type surface error after the reflector type surface error of 2 single measurement of operating condition and single measurement are fitted.
The utility model has the advantages that the present invention is first according to the surface-type feature of reflector and using fitting of a polynomial for target spot quantity Type face is divided into the region of suitable size by demand, and the coordinate information of target spot in different zones is then used multinomial respectively It is fitted the deformation displacement of corresponding target spot, obtains corresponding fitting function, then again by the coordinate substitution pair of target spot in different zones The fitting function answered updates the deformation displacement of corresponding target spot, can either effectively reduce sensing by way of to data processing The deviation of device single measurement is improved reflector type face overall deformation measurement accuracy, i.e., is mentioned using the spatial continuity feature of deformation Its high overall deformation measurement accuracy, and can be easy to operate, it is time saving and energy saving.It solves and measures caused operation due to being repeated several times The not high problem of cumbersome and time-consuming and laborious problem and single measurement precision, the present disclosure additionally applies for reflector dynamic deformation process In the precision measure of type face can not carry out multiplicating degree measurement in such cases and take mean value, can only single measurement, the present invention The deviation of single measurement can be further suppressed, the measurement accuracy in structure monolithic devices face is improved, it can for dynamic deformation measurement It carries out applicable, and guarantees measurement accuracy.The present invention can also be applied to the profile measurement of the surface deformation of general structure.
Detailed description of the invention
Fig. 1 grid reflector back schematic diagram
Fig. 2 grid reflector type face zoning plan
Fig. 3 coordinate system schematic diagram
Fig. 4 PZT piezoelectric actuator distribution map
More than 1 measurement differential chart of Fig. 5 random point
More than 2 measurement differential charts of Fig. 6 random point
1 reflector type face standard transformations figure of Fig. 7 operating condition
2 reflector type face standard transformations figure of Fig. 8 operating condition
1 single measurement reflector type face deformation pattern of Fig. 9 operating condition
2 single measurement reflector type face deformation pattern of Figure 10 operating condition
1 preceding 89 target spot fitting front and back of Figure 11 operating condition takes the Error Graph of mean value with repeatedly measurement
89 target spot fitting front and backs take the Error Graph of mean value with repeatedly measurement after Figure 12 operating condition 1
2 preceding 89 target spot fitting front and backs of Figure 13 operating condition take the Error Graph of mean value with repeatedly measurement
89 target spot fitting front and backs take the Error Graph of mean value with repeatedly measurement after Figure 14 operating condition 2
1 single measurement of Figure 15 operating condition is fitted back reflection type face deformation pattern
2 single measurement of Figure 16 operating condition is fitted back reflection type face deformation pattern
1 single measurement reflector type surface error figure of Figure 17 operating condition
1 single measurement of Figure 18 operating condition is fitted rear reflector surface contour error figure
2 single measurement reflector type surface error of Figure 19 operating condition
2 single measurement of Figure 20 operating condition is fitted rear reflector surface contour error.
Specific embodiment
Embodiment 1: the present embodiment record it is a kind of based on grid reflector type face deformation measurement method, can be realized for Spatial continuity feature improves overall deformation measurement accuracy, comprising the following steps:
S1: multiple target spots, as far as possible target spot density in promotion unit area are arranged in reflector type face, utilize sensor The three-dimensional coordinate of target spot is measured, coordinate origin is placed in structural type face center, and Z axis is parallel to type face large deformation direction, the big change Shape direction has uniqueness, and for X/Y plane perpendicular to Z axis, the small deformation occurred in X/Y plane influences grid reflector performance It is faint, therefore the present embodiment does not give consideration.
S2: according to the surface-type feature of structure and using fitting of a polynomial for the demand of target spot quantity, type face is divided For the fitted area of six triangles.Grid reflector is regular hexagon, and area is 0.311 square metre, and front is pasted with 178 Target spot, back is arranged 30 grooves and installs PZT piezoelectric actuator, since grid reflector rear channel affects its monolithic devices face Continuity, so grid reflector is divided into 24 small delta-shaped regions according to the distribution of groove, but consider small triangle 10 data requirementss for being difficult to meet fitting of a polynomial of target spot lazy weight in shape region, so four small triangles are integrated into 1 fitted area, target spot quantity is about 30 or so in each fitted area, it is specific as shown in Figure 1, 2.
S3: the X of target spot, Y axis coordinate information in different zones are corresponded to the Z-direction of target spot using fitting of a polynomial respectively Deformation displacement dz is carried out the solution of multinomial coefficient based on least square method, obtains fitting function corresponding to every panel region.
S4: the X of target spot in different zones, Y axis coordinate in S2 are substituted into corresponding fitting function, update the Z axis of target spot out Direction distortion is displaced dz.
Further, single measurement is carried out for target spot on reflector type face with sensor first, then according to type face spy Sign, and type face is divided into for the demand of target spot quantity using fitting of a polynomial by sufficiently small region, it respectively will not same district The X of target spot, Y axis coordinate information correspond to the Z-direction deformation displacement dz of target spot using fitting of a polynomial in domain.
By using quadratic polynomial fitting for, if in a certain region any target spot Z-direction deformation displacement dzi=f (xi,yi) can be write as:
When having n target spot in a certain region, n equation can be arranged:
A in above formula20、a02、a11、a10、a01、a00For fitting coefficient to be solved, (xi,yi) it is target spot in X/Y plane Two-dimensional coordinate, dziIt is target spot along the deformation displacement of Z-direction, RiFor residual error, fitting coefficient a appropriate is chosenijMake the flat of residual error Fang HeReach minimum value, concrete mode is to ask respectivelyTo the partial derivative of all fitting coefficients, all partial derivatives are enabled to be It can solve when 0 to fitting coefficient.Obtain polynomial fit function and then by the (x of n target spoti,yi) coordinate substitution fitting Function updates the Z-direction deformation displacement dz for corresponding to target spot outi
The measurement method of the present embodiment has the effect that (1) prior art using sensor on reflector type face Target spot be under same state carry out be repeated several times measurement when, the measured value of same target spot will be fluctuated in a certain value environs, Depending on the value is the average value that measurement is repeated several times, and specific deviation situation wants view sensor measurement accuracy.It is repeated several times and surveys The method for measuring average value is undoubtedly the most accurately, and the very complicated but concrete operations are got up is time-consuming and laborious, and for structure For the case where type face is deformed, structure can not be under same state and carry out multiplicating measurement.The present embodiment will be pre- The data of first single measurement are handled, and target spot on type face is carried out region division, is carried out to the target spot data on each region Fitting of a polynomial updates data new out, can effectively reduce the deviation of single measurement, improves reflector type face overall deformation Measurement accuracy.Thoroughly solve under the situation static for reflector, it is cumbersome and time-consuming take since measurement is repeated several times Power problem and single measurement are again since the limitation of sensor accuracy class has the problem of certain deviation.(2) the present embodiment is especially Type face precision measure problem suitable for reflector dynamic deformation process can not carry out the survey of multiplicating degree in such cases Measure mean value, can only single measurement, the deviation of single measurement can further be inhibited using the present invention, improve structure monolithic devices The measurement accuracy in face.
Embodiment 2: the present embodiment is by measuring sensor single measurement and repeatedly the method being averaged as a comparison Example, compares with measurement method of the invention, by experimental result, shows that method of the invention can either effectively reduce biography The deviation of sensor single measurement improves reflector type face overall deformation measurement accuracy, i.e., improves it using spatial continuity feature Overall deformation measurement accuracy, and can be easy to operate, it is time saving and energy saving.
By taking regular hexagon grid reflector as an example, projection bore is 0.6 meter, and 30 PZT piezoelectric actuators are mounted on In the U-type groove at reflector back, the target spot that 178 diameters are 1.6 centimetres is disposed on grid reflector.Using DIC (three-dimensional light Learn speckle system) measurement target coordinate, which is 20um+10um/m.Such as Fig. 1, according to the distribution of groove by lattice Grid reflector is divided into 24 small delta-shaped regions, and four adjacent small triangles are integrated into 1 fitted area by such as Fig. 2, so that Six triangle fitted areas that the grid reflector of regular hexagon has shape essentially identical, and each fitted area has phase The vertex of friendship, fitted area are distributed with this vertex in inverted triangle, and target spot quantity is 30 in each fitted area, select one to intend It closes region and distributes 28 target spots.
Multiple target spots are arranged in reflector type face, are measured the three-dimensional coordinate of target spot, are repeated to survey by DIC system under original state Amount 50 times records target spot data, and establishment of coordinate system is illustrated in fig. 3 shown below, and coordinate origin o is located at reflector center, and Z axis is along anti- Emitter out-of-plane deformation direction provides the number distribution of PZT piezoelectric actuator, such as Fig. 4 perpendicular to reflector level.
From being randomly selected in 178 target spots in terms of 2 target spots under its original state at duplicate measurements 50 times, measure for latter 49 times The difference with first time measurement of the Z axis coordinate arrived, as shown below.
Measured value, which is repeated several times, it can be seen that being limited to sensor accuracy class from Fig. 5,6, under same state also has Certain deviation, taking the average value of 50 measurements at this time as the measured value under current state is optimal selection.
Two kinds of operating conditions are set, operating condition 1: applying 150 volts of voltages respectively to A2, B2 actuator, and repeat current state 50 times Take mean value;Operating condition 2: apply 150 voltages respectively to A2, B2, A9, B9 actuator, and repeat to take mean value current state 50 times.With it is first Average value is repeatedly measured under beginning state and subtracts each other to obtain type face standard transformations data under two kinds of operating condition current states, such as Fig. 7,8 institutes Show.
Randomly choosed from operating condition 1,2 certain measured value subtract original state measured value of lower first time obtain grid reflection The type face deformation data of device single measurement, as shown in Figures 9 and 10.
By comparing the lower reflector type face phenotypic criteria cloud atlas of operating condition 1,2 and single measurement reflector type face Aberration nephogram, This it appears that the reflector type face deformation of single measurement takes the reflector type face of mean value to deform with repeatedly measurement larger difference It is different.
Target spot is divided into six pieces of regions according to reflector type region feature by the target spot on reflector type face, in every piece of region Target spot number average value 30 or so.Data based on operating condition 1,2 single measurements, the target coordinate in every piece of region is respectively adopted Quadratic polynomial carries out surface fitting.If the Z-direction deformation displacement dz of any target spot in a certain regioni=f (xi,yi) can be with It is write as:
When having n target spot in a certain region, n equation can be arranged:
Claim RiFor residual error, fitting coefficient a appropriate is chosenijMake the quadratic sum of residual errorReach minimum value.It obtains multinomial Formula fitting function and then by the (x of n target spoti,yi) coordinate substitution fitting function, update the Z-direction change for corresponding to target spot out Morpheme moves dzi
Figure 11,12, which show the Z-direction deformation displacement of the fitting correspondence target spot of operating condition 1 and repeatedly measure, to be averaged Z-direction deformation displacement error amount.
1 operating condition of table, 1 target spot fitting front and back distortion inaccuracy
All target spot Z-direction deformation displacements of single measurement averagely miss in the case of taking mean value with multiple measurement in operating condition 1 Difference is 11.762 microns, and all target spot Z-direction deformation displacements and multiple measurement after single measurement fitting take mean value situation Lower mean error is 7.112 microns.
2 operating condition of table, 2 target spot fitting front and back distortion inaccuracy
Figure 13,14, which show the Z-direction deformation displacement of the fitting correspondence target spot of operating condition 1 and repeatedly measure, to be averaged Z-direction deformation displacement error amount.
All target spot Z axis numerical value of single measurement and multiple measurement take the mean error in the case of mean value to be in operating condition 2 11.426 microns, and all target spot Z axis numerical value after single measurement fitting and repeatedly measure and take the mean error in the case of mean value to be 6.861 micron.
Data after fitting are drawn into Aberration nephogram, as shown in Figure 15,16.
According to the reflector type face Aberration nephogram after operating condition 1,2 single measurements fitting, it can be seen that compared to single measurement Reflector type face Aberration nephogram afterwards is closer to operating condition 1, measures the standard transformations cloud atlas for taking mean value more than 2 times.By operating condition 1, 2 single measurement reflector type face Aberration nephograms and single measurement are fitted back reflection type face Aberration nephogram, measure respectively with multiple The standard transformations cloud atlas of mean value is taken to subtract each other to obtain type face distortion inaccuracy cloud atlas and compare, as shown in figures 17 to 20.By comparing operating condition 1, the reflector type surface error after the reflector type surface error of 2 single measurements and single measurement are fitted, it can be clearly seen that use The method invented herein can effectively reduce deviation caused by single measurement, effective to improve structure overall deformation measurement essence Degree.
The preferable specific embodiment of the above, only the invention, but the protection scope of the invention is not It is confined to this, anyone skilled in the art is in the technical scope that the invention discloses, according to the present invention The technical solution of creation and its inventive concept are subject to equivalent substitution or change, should all cover the invention protection scope it It is interior.

Claims (7)

1. a kind of antenna-reflected type face deformation measurement method, which comprises the steps of:
S1. multiple target spots are arranged in reflector type face, measures the three-dimensional coordinate of target spot, coordinate origin is placed in the type face of reflector Center, Z axis parallel reflectors out-of-plane deformation direction, X/Y plane is perpendicular to Z axis, with sensor for the target spot in reflector type face Z-direction deformation displacement dz carries out single measurement;
S2. according to the surface-type feature of reflector and due to fitting demand target spot quantity, reflector type face is divided into multiple quasi- Close region;
S3., the X of target spot, Y axis coordinate information in different fitted areas are corresponded to the Z-direction of target spot using fitting of a polynomial respectively Deformation displacement dz is carried out the solution of multinomial coefficient using least square method, obtains fitting letter corresponding to every fitted area Number;
S4., the fitting function that the coordinate information of the X of target spot in different zones, Y-axis are substituted into corresponding region, updates and is corresponded to The Z-direction deformation displacement dz of target spot.
2. antenna-reflected type as described in claim 1 face deformation measurement method, which is characterized in that grid reflector is positive six Side shape, back is arranged multiple grooves and installs PZT piezoelectric actuator, since grid reflector rear channel affects its monolithic devices face Continuity will be adjacent several small so grid reflector is divided into several small delta-shaped regions according to the distribution of groove Triangle is integrated into a triangle fitted area, so that the grid reflector of regular hexagon has essentially identical six of shape Triangle fitted area, and each fitted area has the vertex of intersection, fitted area is distributed with this vertex in inverted triangle, each Target spot quantity is more than 10 in fitted area.
3. antenna-reflected type as claimed in claim 2 face deformation contrast measurement method, which is characterized in that grid reflector type The area in face is 0.311 square metre, and 30 PZT piezoelectric actuators are mounted in the U-type groove at reflector back, and grid reflector is just Face is disposed with the target spot that 178 diameters are 1.6 centimetres, measures target coordinate using DIC, is reflected grid according to the distribution of groove Device is divided into 24 small delta-shaped regions, four adjacent small triangles is integrated into 1 fitted area, so that the lattice of regular hexagon Six triangle fitted areas that grid reflector has shape essentially identical, and each fitted area has the vertex of intersection, intends It closes region to be distributed with this vertex in inverted triangle, target spot quantity is 28~32 in each fitted area.
4. antenna-reflected type as described in claim 1 face deformation contrast measurement method, which is characterized in that the fitting is adopted Be fitted with quadratic polynomial, if in a certain fitted area any target spot Z-direction deformation displacement dzi=f (xi,yi) write as:
dzi=f (xi,yi)=a20xi 2+a02yi 2+a11xiyi+a10xi+a01yi+a00
When having n target spot in a certain region, n equation is arranged:
A in above formula20、a02、a11、a10、a01、a00For fitting coefficient to be solved, (xi,yi) it is two dimension of the target spot in X/Y plane Coordinate, dziIt is target spot along the deformation displacement of Z-direction, RiFor residual error, fitting coefficient a appropriate is chosenijMake the quadratic sum of residual errorReach minimum value, obtains polynomial fit function and then by the (x of n target spoti,yi) coordinate substitution fitting function, more It is new to go out to correspond to the Z-direction deformation displacement dz of target spoti
5. antenna-reflected type as claimed in claim 3 face deformation measurement method, which is characterized in that described to choose appropriate intend Collaboration number aijMake the quadratic sum of residual errorReach minimum value, concrete mode is to ask respectivelyTo the inclined of all fitting coefficients Derivative, enable all partial derivatives be 0 when can solve to fitting coefficient.
6. a kind of antenna reflector, which is characterized in that be regular hexagon grid reflector, projection bore is 0.6 meter, and area is 0.311 square metre, 30 PZT piezoelectric actuators are mounted in the U-type groove at reflector back, and grid reflector front is disposed with The target spot that 178 diameters are 1.6 centimetres measures target coordinate using DIC, is divided into grid reflector according to the distribution of groove Four adjacent small triangles are integrated into 1 fitted area, so that the grid reflector of regular hexagon by 24 small delta-shaped regions With six essentially identical triangle fitted areas of shape, and each fitted area has a vertex of intersection, fitted area with This vertex is distributed in inverted triangle, and target spot quantity is 30 in each fitted area, and the target with one or two fitted area Point lazy weight 30.
7. a kind of antenna-reflected type face deformation contrast measurement method, which is characterized in that
Using regular hexagon grid reflector, projecting bore is 0.6 meter, and 30 PZT piezoelectric actuators are mounted on reflector In the U-type groove at back, the target spot that 178 diameters are 1.6 centimetres is disposed on grid reflector, using DIC systematic survey target spot Coordinate, DIC the measuring precision are 20um+10um/m, and grid reflector is divided into 24 small triangles according to the distribution of groove Four adjacent small triangles are integrated into 1 fitted area by shape region, so that the grid reflector of regular hexagon has shape base This identical six triangle fitted area, and each fitted area has the vertex of intersection, fitted area is with this vertex in Angular distribution, target spot quantity is 30 in each fitted area, and the target spot lazy weight with one or two fitted area 30, multiple target spots are arranged in reflector type face, measure the three-dimensional coordinate of target spot, coordinate origin is placed in the type face of reflector The heart, Z axis parallel reflectors out-of-plane deformation direction, X/Y plane is perpendicular to Z axis;
By DIC system duplicate measurements 50 times under original state, target spot data are recorded, coordinate origin o is located at reflector center, Z Axis along deformation direction outside slotted-type reflector surface perpendicular to reflector level, and to the number of PZT piezoelectric actuator;
2 target spots are randomly selected from 178 target spots, in its initial state 50 Z axis coordinates of duplicate measurements, 49 times after observation It measures obtained Z axis coordinate and measures the difference between obtained obtained Z axis coordinate for the first time;The Z axis of 50 measurements is taken to sit Target average value is as the measured value under current state;
Two kinds of operating conditions are set,
Operating condition 1: choosing two actuator and apply 150 volts of voltages respectively, and repeats current state measurement 50 times and take mean value;
Operating condition 2: choosing four actuator and apply 150 voltages respectively, and repeats current state measurement 50 times and take mean value;
Subtract each other to obtain the type face standard under two kinds of operating condition current states with the average value of the lower 50 measurements Z axis coordinate of original state to become Cloud atlas is made in graphic data;
Certain Z axis coordinates measurements is randomly choosed from operating condition 1, operating condition 2 subtracts original state Z axis of lower first time measurement of coordinates Value obtains the type face deformation data of grid reflector single measurement, and cloud atlas is made;
Compare the lower reflector type face phenotypic criteria cloud atlas of operating condition 1, operating condition 2 and single measurement reflector type face Aberration nephogram, record The difference of the reflector type face deformation of single measurement and the reflector type face deformation for taking mean value repeatedly measured;
The target spot quantity of demand, is divided into multiple fitting areas for reflector type face according to the surface-type feature of reflector and due to fitting Domain is respectively deformed the X of target spot, Y axis coordinate information in different fitted areas using the Z-direction that fitting of a polynomial corresponds to target spot It is displaced dz, the solution of multinomial coefficient is carried out using least square method, obtains fitting function corresponding to every fitted area;
By operating condition 1, the data of 2 single measurement of operating condition, by the target coordinate in every piece of region be respectively adopted quadratic polynomial into Row surface fitting, if in a certain fitted area any target spot Z-direction deformation displacement dzi=f (xi,yi) write as:
dzi=f (xi,yi)=a20xi 2+a02yi 2+a11xiyi+a10xi+a01yi+a00
When having n target spot in a certain region, n equation is arranged:
A in above formula20、a02、a11、a10、a01、a00For fitting coefficient to be solved, (xi,yi) it is two dimension of the target spot in X/Y plane Coordinate, dziIt is target spot along the deformation displacement of Z-direction, RiFor residual error, fitting coefficient a appropriate is chosenijMake the quadratic sum of residual errorReach minimum value, obtains polynomial fit function and then by the (x of n target spoti,yi) coordinate substitution fitting function, more It is new to go out to correspond to the Z-direction deformation displacement dz of target spoti
Drawing indicates that the Z-direction deformation displacement of fitting correspondence target spot is deformed with the Z-direction being averaged repeatedly is measured The error amount of displacement;
It calculates all target spot Z-direction deformation displacements of single measurement in operating condition 1 and repeatedly measurement Z-direction deforming position pipettes All target spot Z-direction deformation displacements and repeatedly measurement Z-direction after mean error and single measurement fitting in the case of value Deforming position pipettes the mean error in the case of mean value;
It calculates all target spot Z-direction deformation displacements of single measurement in operating condition 2 and repeatedly measurement Z-direction deforming position pipettes All target spot Z-direction deformation displacements after mean error and single measurement fitting in the case of value take mean value with repeatedly measurement In the case of mean error;
Data after fitting are drawn into reflector type face Aberration nephogram;
Reflector type face Aberration nephogram after operating condition 1,2 single measurement of operating condition fitting, compared to the reflector type after single measurement Face Aberration nephogram is closer to operating condition 1, operating condition more than 2 times and measures the standard transformations cloud atlas for taking mean value;
Operating condition 1,2 single measurement reflector type face Aberration nephograms and single measurement are fitted back reflection type face Aberration nephogram, point The standard transformations cloud atlas of mean value is not taken to subtract each other to obtain type face distortion inaccuracy cloud atlas and compare with multiple measurement;Compare operating condition 1, operating condition Reflector type surface error after the reflector type surface error of 2 single measurements and single measurement fitting.
CN201910770647.5A 2019-08-20 2019-08-20 Antenna reflector and profile deformation measuring method and contrast measuring method thereof Active CN110375705B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910770647.5A CN110375705B (en) 2019-08-20 2019-08-20 Antenna reflector and profile deformation measuring method and contrast measuring method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910770647.5A CN110375705B (en) 2019-08-20 2019-08-20 Antenna reflector and profile deformation measuring method and contrast measuring method thereof

Publications (2)

Publication Number Publication Date
CN110375705A true CN110375705A (en) 2019-10-25
CN110375705B CN110375705B (en) 2020-07-21

Family

ID=68260084

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910770647.5A Active CN110375705B (en) 2019-08-20 2019-08-20 Antenna reflector and profile deformation measuring method and contrast measuring method thereof

Country Status (1)

Country Link
CN (1) CN110375705B (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4845510A (en) * 1987-08-10 1989-07-04 Hughes Aircraft Company Reflector surface adjustment structure
CN1764013A (en) * 2005-10-21 2006-04-26 西安电子科技大学 Large-scale high precision spherical antenna panel measuring and assemblage adjusting method
CN101267062A (en) * 2008-04-30 2008-09-17 西安电子科技大学 Method for predicting antenna electric performance based on simulated distortion reflective side
CN101566465A (en) * 2009-05-18 2009-10-28 西安交通大学 Method for measuring object deformation in real time
CN101694373A (en) * 2009-10-23 2010-04-14 北京航空航天大学 Antenna deformation measuring method
CN102589425A (en) * 2012-01-12 2012-07-18 中国科学院国家天文台 Measuring method for unit panel of reflecting surface of spherical radio telescope
CN105718697A (en) * 2016-02-02 2016-06-29 西安电子科技大学 Antenna pointing oriented large deformed parabolic antenna panel movement fitting adjustment method
CN107016161A (en) * 2017-03-02 2017-08-04 西安电子科技大学 Shaped-beam reflector antenna type face based on Zernike multinomials and trigonometric function describes method
WO2017198157A1 (en) * 2016-05-18 2017-11-23 上海跃盛信息技术有限公司 Solid-surface reflector for microwave reflection
CN108879106A (en) * 2018-06-15 2018-11-23 西安电子科技大学 Dual reflector antenna shape face method of real-time adjustment based on best fit

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4845510A (en) * 1987-08-10 1989-07-04 Hughes Aircraft Company Reflector surface adjustment structure
CN1764013A (en) * 2005-10-21 2006-04-26 西安电子科技大学 Large-scale high precision spherical antenna panel measuring and assemblage adjusting method
CN101267062A (en) * 2008-04-30 2008-09-17 西安电子科技大学 Method for predicting antenna electric performance based on simulated distortion reflective side
CN101566465A (en) * 2009-05-18 2009-10-28 西安交通大学 Method for measuring object deformation in real time
CN101694373A (en) * 2009-10-23 2010-04-14 北京航空航天大学 Antenna deformation measuring method
CN102589425A (en) * 2012-01-12 2012-07-18 中国科学院国家天文台 Measuring method for unit panel of reflecting surface of spherical radio telescope
CN105718697A (en) * 2016-02-02 2016-06-29 西安电子科技大学 Antenna pointing oriented large deformed parabolic antenna panel movement fitting adjustment method
WO2017198157A1 (en) * 2016-05-18 2017-11-23 上海跃盛信息技术有限公司 Solid-surface reflector for microwave reflection
CN107016161A (en) * 2017-03-02 2017-08-04 西安电子科技大学 Shaped-beam reflector antenna type face based on Zernike multinomials and trigonometric function describes method
CN108879106A (en) * 2018-06-15 2018-11-23 西安电子科技大学 Dual reflector antenna shape face method of real-time adjustment based on best fit

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
TUANJIE LI ET AL.: "Influence of surface error on electromagnetic performance of reflectors based on Zernike polynomials", 《ACTA ASTRONAUTICA》 *
宋祥帅 等: "格栅反射器型面的主动控制", 《航空学报》 *

Also Published As

Publication number Publication date
CN110375705B (en) 2020-07-21

Similar Documents

Publication Publication Date Title
Dhir et al. An improved method for obtaining the general-displacement field from a holographic interferogram: A simple and reliable technique is proposed for predicting the three cartesian components of displacement from the usual double-exposure holographic fringes
ES2399883T3 (en) Procedure and system for displaying surface errors
JP4660779B2 (en) Method for evaluating position error of moving device and method for improving moving accuracy based on the evaluation result
Li et al. An analogue contact probe using a compact 3D optical sensor for micro/nano coordinate measuring machines
Iuliano et al. Proposal of an innovative benchmark for comparison of the performance of contactless digitizers
Miao et al. Surface profile and stress field evaluation using digital gradient sensing method
Wang et al. Configuration optimization of laser tracker stations for position measurement in error identification of heavy-duty machine tools
Vanrusselt et al. International comparison of noise in areal surface topography measurements
Lu et al. Two-degree-of-freedom displacement measurement system based on double diffraction gratings
CN109101761A (en) It is a kind of that method is determined based on the spatial attitude for assembling contact for surveying surface topography
CN104465619B (en) A kind of picture structure and its alignment precision measurement method of alignment precision measurement
Cheng et al. Uncertainty evaluation for dynamic identification of a micro contact probe based on the signal transmission chain analysis method
CN110375705A (en) Antenna reflector and its type face deformation measurement method and measurement of comparison method
Petz et al. Reflection grating method for 3D measurement of reflecting surfaces
CN112050799A (en) Distance measurement positioning method based on magnetic gradient tensor shrinkage ratio
Küng et al. Application of a virtual coordinate measuring machine for measurement uncertainty estimation of aspherical lens parameters
Duchamp et al. Spline smoothing on surfaces
CN101013022B (en) Method for random error elimination in optical element interference sampling data
Fang et al. Measurement and uncertainty evaluation of the microsphere used for micro-CMM probe
Sanjid et al. A novel method of diameter measurement of pistons used in pressure standards using scanning principle and fusion technique
Zhao et al. High-precision radius and sphericity measurement for microspheres of micro-CMM probe tip
Yujiu et al. A non-contact calibration system for step gauges using automatic collimation techniques
Masuda et al. Novel design of ball-lens-based laser tracker using pulsed interferometer
CN110196026A (en) A kind of method of quick measuring and calculating surface roughness and measurement scale relationship
Zheng et al. A new large-scale posture measurement system based on a six-laser tracer multilateral method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant