CN110361775A - A kind of efficient scintillation crystal device for measuring properties and method - Google Patents
A kind of efficient scintillation crystal device for measuring properties and method Download PDFInfo
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- CN110361775A CN110361775A CN201910777802.6A CN201910777802A CN110361775A CN 110361775 A CN110361775 A CN 110361775A CN 201910777802 A CN201910777802 A CN 201910777802A CN 110361775 A CN110361775 A CN 110361775A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
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- G—PHYSICS
- G01—MEASURING; TESTING
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Abstract
The present invention relates to a kind of efficient scintillation crystal device for measuring properties and methods, it carries out waveform parameter measurement by the waveform signal to scintillation crystal, to reach the performance measurement purpose of scintillation crystal, in waveform parameter measurement process, waveform digitization is carried out using ADC converting unit, under the conditions of the dual threashold of measure-controlling unit is screened, after caching and baseline is eliminated, it is measured using waveform parameter measuring unit, and during the measurement of waveform parameter measuring unit, by setting waveform parameter LUT control unit to the control mode of parameter measurement unit, generate three kinds of different operating modes, the data that ram memory cell stores under three kinds of operating modes are respectively as follows: the waveform parameter data of acquired original waveform, waveform parameter data after screening, and the waveform parameter data after statistics and grouping, the present invention Acquired original waveform is remained, while multi-parameter multiregion examination can be carried out, improves the flexibility and real-time of measurement.
Description
Technical field
The present invention relates to crystal measurement technical fields, and in particular to a kind of efficient scintillation crystal device for measuring properties and side
Method.
Background technique
Scintillation crystal is a kind of radiation detecting device, is widely used in high-energy physics experiment, safety check, medicine PET imaging, ring
Border detection etc..Especially PET imaging field uses a large amount of scintillation crystal, such as BGO scintillation crystal, LYSO scintillation crystal
Deng the performances such as photoyield performance, uniformity and linearity of these scintillation crystals affect the quality of imaging.
Currently, in different application the performance measurement of scintillation crystal mainly use oscilloscope measurement, by capture card+PC from
The method of line processing.Wherein, oscilloscope measurement is to grab waveform in real time by the way that suitable activation threshold value oscillograph is arranged, and is suitble to observation
Signal waveform and simple analysis, but it is not easy to alarm analysis result and designated analysis algorithm.And pass through capture card+PC processed offline
Method various algorithm process can be carried out to the data of acquisition in PC machine, but it is limited to signal screening ability, obtain the phase
It hopes the efficiency of waveform lower, reduces real-time treatability.
In view of this, the present inventor gos deep into structure for problems and defect existing for above-mentioned scintillation crystal performance measurement
Think, and then develops the present invention.
Summary of the invention
In view of the above-mentioned problems, leading to the purpose of the present invention is to provide a kind of efficient scintillation crystal performance measurement method
Excessive kind of parameter combination and height dual threashold mode screen signal waveform, greatly improve measurement efficiency.
To realize above scheme, the technical solution adopted by the present invention is that:
A kind of efficient scintillation crystal device for measuring properties comprising ADC converting unit, measure-controlling unit, caching and pre- place
Manage unit, waveform parameter measuring unit, waveform parameter LUT control unit, FIFO storage unit and ram memory cell；
The ADC converting unit carries out climate digital for receiving the analog signal for representing scintillation crystal performance information, and to it
Change, and the digital signal after conversion is sent to caching and pretreatment unit；
The caching and pretreatment unit receive the output of ADC converting unit under the control of the baseline threshold of measure-controlling unit
Digital signal, and carry out polarity of wave judgement and transformation, generate the positive polarity waveform signal for eliminating baseline all the way；
The measure-controlling unit, between the time of measuring for controlling caching and pretreatment unit and waveform parameter measuring unit
Every and setting digitized wave forms screening threshold value, the screening threshold value includes baseline threshold, high threshold and Low threshold；
The waveform parameter measuring unit, in the high-low threshold value control of measure-controlling unit and waveform parameter LUT control unit
Waveform parameter control under, the two-way waveform signal of screening caching and pretreatment unit output and measures the waveform signal
Waveform parameter data, the waveform parameter data include leading edge time length, after along time span, waveform widths, peak height,
Half-breadth height and waveform area；
The waveform parameter LUT control unit is joined for the time parameter threshold value of waveform signal to be arranged, and to time threshold is met
Several waveform parameters carries out statistical packet and carries out feedback control；
The FIFO storage unit, for receiving the supplemental characteristic and corresponding data packet mark of the output of waveform parameter measuring unit
Know, and supplemental characteristic and corresponding package identification are sent to waveform parameter LUT control unit or ram memory cell；
The ram memory cell, for receiving the waveform parameter data or waveform parameter LUT control unit of FIFO storage unit
Waveform parameter data, and waveform parameter data are exported under read output signal control.
The ADC converting unit is high speed, high resolution ADC and works in real-time acquisition mode.
The caching and pretreatment unit are made of flip-flop array, and depth is greater than the half length of waveform.
The measure-controlling unit includes configuration register, timer and package identification generator, and the configuration is posted
Storage is used to be arranged the screening threshold value of digitized wave forms；The timer is for being arranged time of measuring length；Package identification hair
Raw device is then used to generate a package identification when waveform parameter measuring unit starts and measures, for distinguishing adjacent times of collection
Under measurement data.
The configuration register is made of threshold register one, threshold register two and threshold register three, wherein threshold value
Register one is used to screen the baseline in waveform signal, and threshold register two and threshold register three are respectively used to screen waveform letter
High-low threshold value in number.
The waveform parameter measuring unit includes register, comparator, counter, difference engine and integrator, the deposit
Device is by parameter register and caching register group at cache register is for storing adjacent multiple spot Wave data；
The points of waveform are counted as unit of the clock cycle by counter；By being obtained in comparator comparand register
Peak point and the corresponding points of peak point, and be recorded in parameter register, wherein peak point is peak height, peak value
The corresponding points of point are leading edge time length；Continue to count until waveform terminates after peak point, stopping counts to get waveform
Width is recorded in parameter register；Using the half of peak amplitude as reference point, by comparator by the reference point and caching and
The waveform of afterbody is compared in pretreatment unit, is obtained waveform halfwidth degree and is recorded in parameter register.
The waveform parameter LUT control unit includes that time parameter configures subelement and waveform parameter LUT subelement,
The time parameter configures subelement, and the supplemental characteristic for obtaining to waveform parameter measuring unit measurement is screened,
The scope of statistics and grouping of notice control waveform parameter LUT subelement；
The waveform parameter LUT subelement, for the frequency of the wave recording parameter measurement unit measurement result in scope of statistics,
And waveform parameter measuring unit is controlled according to frequency and carries out waveform examination, and carries out feedback control according to scope of statistics peak ranges
System.
A kind of efficient scintillation crystal performance measurement method uses a kind of efficient scintillation crystal performance as described above
Measuring device is realized, specific as follows:
Step 1, acquisition represent the analog signal of scintillation crystal performance information, and are input to ADC converting unit and carry out modulus
Conversion, obtains the digitized wave forms signal of scintillation crystal, and the waveform signal is sent to caching and pretreatment unit；
To caching and pretreatment unit output baseline threshold and time interval, caching and pretreatment are single for step 2, measure-controlling unit
Member carries out the polarity judgement of waveform signal under the control of the baseline threshold and time interval and transformation, output are eliminating baseline just
Polar signal is to waveform parameter control unit；
Step 3, measure-controlling unit export high threshold, Low threshold and time interval information to waveform parameter measuring unit；When
When waveform parameter LUT control unit does not export time threshold parameter to waveform parameter measuring unit, waveform parameter measuring unit
Under the control of high-low threshold value and time interval, examination measurement is carried out to the positive signal for eliminating baseline, obtains waveform ginseng
The waveform parameter is delivered to ram memory cell via FIFO storage unit by number, waveform measurement parameters unit；
When waveform parameter LUT control unit exports time threshold parameter to waveform parameter measuring unit, waveform parameter measurement is single
Member screens the positive signal for eliminating baseline under the control of high-low threshold value, time interval and time threshold parameter
Measurement, obtains waveform parameter, and waveform parameter is delivered to RAM storage list via FIFO storage unit by waveform parameter measuring unit
Member；
When waveform parameter LUT control unit exports time threshold parameter and waveform peak range to waveform parameter measuring unit
When, waveform parameter measuring unit under the control of high-low threshold value, time interval, time threshold parameter and waveform peak range,
Examination measurement carried out to the positive signal for eliminating baseline, obtains waveform parameter, waveform parameter measuring unit is by the waveform parameter
It is sent to FIFO storage unit to be cached, waveform parameter is sent to waveform parameter LUT control unit by FIFO storage unit
It is counted and is grouped in waveform parameter LUT subelement, waveform parameter LUT control unit joins the waveform after statistics and grouping
Number is sent in ram memory cell.
The waveform parameter measuring unit is specific as follows to the measurement for the waveform signal that scintillation crystal generates:
Waveform measurement unit measures the height H of the peak point of waveform signal using counter counter1, and by peak point
Corresponding waveform point-number sequence Tm1, and be stored in parameter register, wherein by the corresponding waveform point-number sequence number of peak point
Tm1 is the leading edge time length of waveform signal；
Then, to reach peak value point moment as starting point, by another counter counter2 timing, by difference engine to incoming wave
Shape carry out calculus of differences, after reaching waveform along when, record the sequence length Tm2 at the moment, and be stored in parameter register,
Tm2 is the rear along time span of waveform signal.
It when waveform signal reaches peak point, is counted by counter counter1, until waveform terminates
Waveform widths Tm3 is obtained, which is stored in register.While counter counter1 is counted, utilize
Accumulator adds up, and obtains waveform area, which is stored in register.
Using the half of peak height H as reference value, by the reference value and caching and pre-processed with comparator by comparator
The waveform of afterbody is compared in unit, obtains the halfwidth length Tm4 of Wave data, which is stored in and is counted
In number device.
After adopting the above scheme, the present invention carries out waveform parameter measurement by the waveform signal to scintillation crystal, to reach
The performance measurement purpose of scintillation crystal, and in waveform parameter measurement process, waveform digitization is carried out using ADC converting unit,
Under the conditions of the dual threashold of measure-controlling unit is screened, after caching and baseline is eliminated, carried out using waveform parameter measuring unit
Measurement.And during the measurement of waveform parameter measuring unit, by setting waveform parameter LUT control unit to parameter measurement list
The control mode of member, so that there are three types of operating modes for entire measuring device tool, correspondingly, RAM storage is single under three kinds of operating modes
The data of member storage are respectively as follows: the waveform parameter data of acquired original waveform, the waveform parameter data after screening and statistics
With the waveform parameter data after grouping.Compared with general capture card, it remains acquired original waveform, while can carry out join more
Number multiregion is screened, and is improved the flexibility and real-time of measurement, is greatly improved measurement efficiency.
Detailed description of the invention
Fig. 1 is a kind of structural block diagram of efficient scintillation crystal device for measuring properties disclosed by the embodiments of the present invention；
Fig. 2 is the signal schematic representation of caching and pretreatment unit disclosed by the embodiments of the present invention；
Fig. 3 is waveform parameter measuring unit disclosed by the embodiments of the present invention parameter schematic diagram to be measured.
Specific embodiment
As shown in Figure 1 to Figure 3, present invention discloses a kind of efficient scintillation crystal device for measuring properties comprising ADC turns
Change unit 1, measure-controlling unit 4, caching and pretreatment unit 2, waveform parameter measuring unit 3, waveform parameter LUT control unit
5, FIFO storage unit 6 and ram memory cell 7.
ADC converting unit 1 carries out climate digital to it for receiving the analog signal for representing scintillation crystal performance information
Change, and the digital signal after conversion is sent to caching and pretreatment unit 2.The ADC converting unit 1 is high speed, high resolution
ADC and work in real-time acquisition mode.
Caching and pretreatment unit 2, be made of flip-flop array, width is by ADC(analog-digital converter) resolution ratio determine
Fixed, depth is more than the half length of longest example waveform.The control of the caching and pretreatment unit 2 in measure-controlling unit 4
Under, the digital signal that ADC converting unit 1 exports is received, for obtaining the baseline of waveform, progress polarity of wave judgement and transformation,
Generate the positive polarity waveform signal for eliminating baseline all the way.
Measure-controlling unit 4, when for controlling the measurement of caching and pretreatment unit 2 and waveform parameter measuring unit 3
Between be spaced and setting digitized wave forms screening threshold value.The measure-controlling unit 4 includes being set by spi bus or UART bus
Configuration register, timer 41 and the package identification generator 45 set, wherein configuration register is for being arranged digitized wave
The screening threshold value of shape, the screening threshold value include baseline threshold, high threshold and Low threshold；Timer 41 is long for time of measuring to be arranged
Degree is to realize that counting rate measures；Package identification generator 45 when waveform parameter measuring unit 3 starts and measures then for generating
One package identification, for distinguishing the measurement data under adjacent times of collection.Above-mentioned configuration register is by threshold register one
42, threshold register 2 43 and threshold register 3 44 form, wherein threshold register 1 is for screening in waveform signal
Baseline, threshold register 2 43 and threshold register 3 44 are respectively used to screen the high-low threshold value in waveform signal.
Waveform parameter measuring unit 3, it is single in the high-low threshold value control and waveform parameter LUT control of measure-controlling unit 4
Under the waveform parameter control of member 5, the two-way waveform signal that screening caching and pretreatment unit 2 export, and measure waveform letter
Number waveform parameter data, which includes leading edge time length T1, after along time span T2, waveform widths Twd、
The high T of peak height H, half-breadthhwdAnd waveform area, realize the identification of different wave.
The waveform parameter measuring unit 3 includes register, comparator, counter, difference engine and integrator, wherein deposit
Device is by parameter register and caching register group at cache register is for storing adjacent multiple spot Wave data.Pass through counter
The points of waveform are counted as unit of the clock cycle；Pass through peak point (peak value obtained in comparator comparand register
Highly) and the corresponding points (leading edge time length) of peak point, it and is recorded in parameter register.Continue after peak point
It counts until waveform terminates, stopping counts to get waveform widths, is recorded in parameter register；Then with the half of peak amplitude
For reference point, the reference point is compared with the waveform of afterbody in caching and pretreatment unit 2 by comparator, is obtained
Waveform halfwidth degree is simultaneously recorded in parameter register.
Waveform parameter LUT control unit 5, for the time parameter threshold value of waveform signal to be arranged, as leading edge time, pulsewidth,
Afterwards along time etc., and look-up table is counted and constituted to the waveform parameter for meeting time threshold parameter and carries out feedback control.
Waveform parameter LUT control unit 5 includes that time parameter configures subelement 51 and waveform parameter LUT subelement 52, wherein the time
Parameter configuration subelement 51 is screened for measuring obtained supplemental characteristic to waveform parameter measuring unit 3, notice control wave
The scope of statistics and grouping of shape parameter LUT subelement 52；
And waveform parameter LUT subelement 52, the frequency for 3 measurement result of wave recording parameter measurement unit in scope of statistics
Number, and waveform parameter measuring unit 3 is controlled according to frequency and carries out waveform examination, and is fed back according to scope of statistics peak ranges
Control.
FIFO storage unit 6, for receiving the supplemental characteristic and corresponding data packet mark of the output of waveform parameter measuring unit 3
Know, and supplemental characteristic and corresponding package identification are sent to waveform parameter LUT control unit 5 or ram memory cell 7.
Ram memory cell 7, the waveform parameter data or waveform parameter LUT control for receiving FIFO storage unit 6 are single
The waveform parameter data of member 5, and export waveform parameter data to the end PC under read output signal control.
Above-mentioned scintillation crystal device for measuring properties carries out the analog signal that scintillation crystal generates by ADC converting unit 1
Digitlization obtain digital signal, then by caching and pretreatment unit 2 to obtained digital signal carry out baseline eliminate and
Reversal is eliminated the positive signal of baseline, and measure-controlling unit 4 and waveform parameter LUT control unit 5 is utilized to be arranged
The examination parameter of waveform, waveform parameter measuring unit 3 can measure and obtain the supplemental characteristic of waveform, and obtained measurement data is deposited
Enter in FIFO storage unit 6 and ram memory cell 7, is finally read by PC.
Based on above-mentioned scintillation crystal device for measuring properties, present invention further teaches a kind of scintillation crystal performance measurement method,
Its is specific as follows:
Step 1, acquisition represent the analog signal of scintillation crystal performance information, and are input to ADC converting unit 1 and carry out modulus
Conversion, obtains the digitized wave forms signal of scintillation crystal, and the waveform signal is sent to caching and pretreatment unit 2.
Step 2, measure-controlling unit 4 export baseline threshold and time interval to caching and pretreatment unit 2, cache and pre-
Processing unit 2 carries out the polarity judgement of waveform signal under the control of the baseline threshold and time interval and transformation, output are eliminated
The positive signal of baseline is to waveform parameter control unit.
Step 3, measure-controlling unit 4 export high threshold, Low threshold and time interval letter to waveform parameter measuring unit 3
Breath；When waveform parameter LUT control unit 5 does not export time threshold parameter to waveform parameter measuring unit 3, waveform parameter is surveyed
Unit 3 is measured under the control of high-low threshold value and time interval, examination measurement is carried out to the positive signal for eliminating baseline, is obtained
Waveform parameter, the waveform parameter include leading edge time length T1, after along time span T2, waveform widths Twd, peak height H, half
The high T of widthhwdAnd waveform area.The waveform parameter is delivered to RAM storage via FIFO storage unit 6 by waveform measurement parameters unit
Unit 7, FIFO storage unit 6, can be to avoid waveform parameter loss of data as caching.At this point, being stored in ram memory cell 7
Be the obtained original waveform supplemental characteristic of measurement, the data integrity degree is relatively high.
When waveform parameter LUT control unit 5 exports time threshold parameter to waveform parameter measuring unit 3, waveform parameter
Measuring unit 3 under the control of high-low threshold value, time interval and time threshold parameter, to eliminate baseline positive signal into
Row screen measurement, obtain waveform parameter, the waveform parameter include leading edge time length, after along time span, waveform widths, peak value
Highly, half-breadth height and waveform area.Waveform parameter is delivered to RAM via FIFO storage unit 6 and deposited by waveform parameter measuring unit 3
Storage unit 7.At this point, what is stored in ram memory cell 7 is waveform parameter of the original waveform supplemental characteristic after screening is screened,
The data volume is smaller, can mitigate the operand at the end PC.
When waveform parameter LUT control unit 5 exports time threshold parameter and waveform peak to waveform parameter measuring unit 3
When range, control of the waveform parameter measuring unit 3 in high-low threshold value, time interval, time threshold parameter and waveform peak range
Under system, examination measurement is carried out to the positive signal for eliminating baseline, obtains waveform parameter, which includes that leading edge time is long
Spend T1, after along time span T2, waveform widths Twd, peak height H, the high T of half-breadthhwdAnd waveform area.Waveform parameter measuring unit
The waveform parameter is sent to FIFO storage unit 6 by 3 to be cached, and then waveform parameter is sent to wave by FIFO storage unit 6
It is counted and is grouped in the waveform parameter LUT subelement 52 of shape parameter LUT control unit 5, waveform parameter LUT control unit 5
Waveform parameter after statistics and grouping is sent in ram memory cell 7.At this point, what is stored in ram memory cell 7 is former
Waveform parameter of the beginning waveform parameter data after screening, statistics and grouping, the data volume is small, and can be to avoid the statistical packet of PC
Work, alleviates the calculation process resource at the end PC.
The measurement for the waveform signal (positive signal for eliminating baseline) that waveform parameter measuring unit 3 generates scintillation crystal
It is specific as follows:
Waveform measurement unit measures the height H of the peak point of waveform signal using a counter counter1, and by peak value
The corresponding waveform point-number sequence T of pointm1, and be stored in parameter register, wherein by the corresponding waveform point-number sequence number of peak point
Tm1The as leading edge time length T of waveform signal1。
Then, to reach peak value point moment as starting point, by another counter counter2 timing, by difference engine to defeated
Enter waveform carry out calculus of differences, after reaching waveform along when, record the sequence length T at the momentm2, and it is stored in parameter register
In, and Tm2As waveform signal is rear along time span T2。
It when waveform signal reaches peak point, is counted by counter counter1, until waveform terminates
Obtain the depth value T of wave sequencem3, by the depth value T of wave sequencem3As waveform widths TwdIt is stored in register.It is counting
It while device counter1 is counted, is added up using accumulator, obtains waveform area, which is stored in and is deposited
In device.
Using the half of peak height H as reference value, by the reference value and caching and pre-processed with comparator by comparator
The waveform of afterbody is compared in unit 2, obtains the halfwidth length T of Wave datam4, which is stored in and is counted
In number device.
The leading edge time length of the waveform signal of scintillation crystal, after along time span, waveform widths, peak height, half-breadth
High and waveform area can judge the performance of scintillation crystal, so passing through waveform parameter measuring unit 3 for the wave of scintillation crystal
The above-mentioned parameter of shape signal is measured, and the performance measurement of scintillation crystal has both been realized.
It is of the invention it is critical that the present invention carries out waveform parameter measurement by the waveform signal to scintillation crystal, to reach
To the performance measurement purpose of scintillation crystal, and in waveform parameter measurement process, climate digital is carried out using ADC converting unit 1
Change, under the conditions of the dual threashold of measure-controlling unit 4 is screened, after caching and baseline is eliminated, utilizes waveform parameter measuring unit 3
It measures.And during waveform parameter measuring unit 3 measures, by setting waveform parameter LUT control unit 5 to parameter
The control mode of measuring unit, so that there are three types of operating modes for entire measuring device tool, correspondingly, RAM under three kinds of operating modes
Storage unit 7 store data be respectively as follows: the waveform parameter data of acquired original waveform, the waveform parameter data after screening,
And the waveform parameter data after statistics and grouping.Compared with general capture card, it remains acquired original waveform, while can be with
The examination of multi-parameter multiregion is carried out, the flexibility and real-time of measurement is improved, greatly improves measurement efficiency.
The above is only the embodiment of the present invention, is not intended to limit the scope of the present invention, therefore all
Any subtle modifications, equivalent variations and modifications to the above embodiments according to the technical essence of the invention still fall within this
In the range of inventive technique scheme.
Claims (9)
1. a kind of efficient scintillation crystal device for measuring properties, it is characterised in that: including ADC converting unit, measure-controlling unit,
Caching and pretreatment unit, waveform parameter measuring unit, waveform parameter LUT control unit, FIFO storage unit and RAM storage are single
Member；
The ADC converting unit carries out climate digital for receiving the analog signal for representing scintillation crystal performance information, and to it
Change, and the digital signal after conversion is sent to caching and pretreatment unit；
The caching and pretreatment unit receive the output of ADC converting unit under the control of the baseline threshold of measure-controlling unit
Digital signal, and carry out polarity of wave judgement and transformation, generate the positive polarity waveform signal for eliminating baseline all the way；
The measure-controlling unit, between the time of measuring for controlling caching and pretreatment unit and waveform parameter measuring unit
Every and setting digitized wave forms screening threshold value, the screening threshold value includes baseline threshold, high threshold and Low threshold；
The waveform parameter measuring unit, in the high-low threshold value control of measure-controlling unit and waveform parameter LUT control unit
Waveform parameter control under, the two-way waveform signal of screening caching and pretreatment unit output and measures the waveform signal
Waveform parameter data, the waveform parameter data include leading edge time length, after along time span, waveform widths, peak height,
Half-breadth height and waveform area；
The waveform parameter LUT control unit is joined for the time parameter threshold value of waveform signal to be arranged, and to time threshold is met
Several waveform parameters carries out statistical packet and carries out feedback control；
The FIFO storage unit, for receiving the supplemental characteristic and corresponding data packet mark of the output of waveform parameter measuring unit
Know, and supplemental characteristic and corresponding package identification are sent to waveform parameter LUT control unit or ram memory cell；
The ram memory cell, for receiving the waveform parameter data or waveform parameter LUT control unit of FIFO storage unit
Waveform parameter data, and waveform parameter data are exported under read output signal control.
2. a kind of efficient scintillation crystal device for measuring properties according to claim 1, it is characterised in that: described
ADC converting unit is high speed, high resolution ADC and works in real-time acquisition mode.
3. a kind of efficient scintillation crystal device for measuring properties according to claim 2, it is characterised in that: it is described caching and
Pretreatment unit is made of flip-flop array, and depth is greater than the half length of waveform.
4. a kind of efficient scintillation crystal device for measuring properties according to claim 1, it is characterised in that: the measurement control
Unit processed includes configuration register, timer and package identification generator, and the configuration register is for being arranged digitlization
The screening threshold value of waveform；The timer is for being arranged time of measuring length；Package identification generator is then used to join in waveform
A package identification is generated when number measuring unit starting measurement, for distinguishing the measurement data under adjacent times of collection.
5. a kind of efficient scintillation crystal device for measuring properties according to claim 4, it is characterised in that: the configuration is posted
Storage is made of threshold register one, threshold register two and threshold register three, wherein threshold register one is for screening wave
Baseline in shape signal, threshold register two and threshold register three are respectively used to screen the high-low threshold value in waveform signal.
6. a kind of efficient scintillation crystal device for measuring properties according to claim 1, it is characterised in that: the waveform ginseng
Number measuring unit includes register, comparator, counter, difference engine and integrator, and the register is eased up by parameter register
Register group is deposited at cache register is for storing adjacent multiple spot Wave data；
The points of waveform are counted as unit of the clock cycle by counter；By being obtained in comparator comparand register
Peak point and the corresponding points of peak point, and be recorded in parameter register, wherein peak point is peak height, peak value
The corresponding points of point are leading edge time length；Continue to count until waveform terminates after peak point, stopping counts to get waveform
Width is recorded in parameter register；Using the half of peak amplitude as reference point, by comparator by the reference point and caching and
The waveform of afterbody is compared in pretreatment unit, is obtained waveform halfwidth degree and is recorded in parameter register.
7. a kind of efficient scintillation crystal performance measurement method according to claim 1, it is characterised in that: the waveform ginseng
Number LUT control unit includes that time parameter configures subelement and waveform parameter LUT subelement,
The time parameter configures subelement, and the supplemental characteristic for obtaining to waveform parameter measuring unit measurement is screened,
The scope of statistics and grouping of notice control waveform parameter LUT subelement；
The waveform parameter LUT subelement, for the frequency of the wave recording parameter measurement unit measurement result in scope of statistics,
And waveform parameter measuring unit is controlled according to frequency and carries out waveform examination, and carries out feedback control according to scope of statistics peak ranges
System.
8. a kind of efficient scintillation crystal performance measurement method, it is characterised in that: the method is using as described in claim 1
A kind of efficient scintillation crystal device for measuring properties realization, specific as follows:
Step 1, acquisition represent the analog signal of scintillation crystal performance information, and are input to ADC converting unit and carry out modulus
Conversion, obtains the digitized wave forms signal of scintillation crystal, and the waveform signal is sent to caching and pretreatment unit；
To caching and pretreatment unit output baseline threshold and time interval, caching and pretreatment are single for step 2, measure-controlling unit
Member carries out the polarity judgement of waveform signal under the control of the baseline threshold and time interval and transformation, output are eliminating baseline just
Polar signal is to waveform parameter control unit；
Step 3, measure-controlling unit export high threshold, Low threshold and time interval information to waveform parameter measuring unit；When
When waveform parameter LUT control unit does not export time threshold parameter to waveform parameter measuring unit, waveform parameter measuring unit
Under the control of high-low threshold value and time interval, examination measurement is carried out to the positive signal for eliminating baseline, obtains waveform ginseng
The waveform parameter is delivered to ram memory cell via FIFO storage unit by number, waveform measurement parameters unit；
When waveform parameter LUT control unit exports time threshold parameter to waveform parameter measuring unit, waveform parameter measurement is single
Member screens the positive signal for eliminating baseline under the control of high-low threshold value, time interval and time threshold parameter
Measurement, obtains waveform parameter, and waveform parameter is delivered to RAM storage list via FIFO storage unit by waveform parameter measuring unit
Member；
When waveform parameter LUT control unit exports time threshold parameter and waveform peak range to waveform parameter measuring unit
When, waveform parameter measuring unit under the control of high-low threshold value, time interval, time threshold parameter and waveform peak range,
Examination measurement carried out to the positive signal for eliminating baseline, obtains waveform parameter, waveform parameter measuring unit is by the waveform parameter
It is sent to FIFO storage unit to be cached, waveform parameter is sent to waveform parameter LUT control unit by FIFO storage unit
It is counted and is grouped in waveform parameter LUT subelement, waveform parameter LUT control unit joins the waveform after statistics and grouping
Number is sent in ram memory cell.
9. a kind of efficient scintillation crystal performance measurement method according to claim 8, it is characterised in that: the waveform ginseng
Number measuring unit is specific as follows to the measurement for the waveform signal that scintillation crystal generates:
Waveform measurement unit measures the height H of the peak point of waveform signal using counter counter1, and by peak point
Corresponding waveform point-number sequence Tm1, and be stored in parameter register, wherein by the corresponding waveform point-number sequence number of peak point
Tm1 is the leading edge time length of waveform signal；
Then, to reach peak value point moment as starting point, by another counter counter2 timing, by difference engine to incoming wave
Shape carry out calculus of differences, after reaching waveform along when, record the sequence length Tm2 at the moment, and be stored in parameter register,
Tm2 is the rear along time span of waveform signal；
It when waveform signal reaches peak point, is counted by counter counter1, until waveform terminates, can be obtained
The waveform widths are stored in register by waveform widths Tm3, while counter counter1 is counted, using cumulative
Device adds up, and obtains waveform area, which is stored in register；
Using the half of peak height H as reference value, pass through comparator for the reference value and caching and pretreatment unit with comparator
The waveform of middle afterbody is compared, and obtains the halfwidth length Tm4 of Wave data, which is stored in counter
In.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910154676.9A CN109696703A (en) | 2019-03-01 | 2019-03-01 | A kind of efficient scintillation crystal performance measurement method |
| CN2019101546769 | 2019-03-01 |
Publications (2)
| Publication Number | Publication Date |
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| CN110361775A true CN110361775A (en) | 2019-10-22 |
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| JPH02236485A (en) * | 1989-03-10 | 1990-09-19 | Jeol Ltd | Crest detecting circuit for radiation detector |
| JP2007206037A (en) * | 2006-02-06 | 2007-08-16 | Nippon Telegr & Teleph Corp <Ntt> | Signal measuring/analyzing apparatus |
| CN104155674A (en) * | 2014-08-14 | 2014-11-19 | 西北核技术研究所 | Method for discriminating alpha/gamma mixed radiation field particles in real time based on digital waveform |
| CN108169789A (en) * | 2018-03-22 | 2018-06-15 | 苏州瑞迈斯医疗科技有限公司 | A kind of method, apparatus for obtaining power spectrum and the device that energy window is set |
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- 2019-08-22 CN CN201910777802.6A patent/CN110361775B/en active Active
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| JPH02236485A (en) * | 1989-03-10 | 1990-09-19 | Jeol Ltd | Crest detecting circuit for radiation detector |
| JP2007206037A (en) * | 2006-02-06 | 2007-08-16 | Nippon Telegr & Teleph Corp <Ntt> | Signal measuring/analyzing apparatus |
| CN104155674A (en) * | 2014-08-14 | 2014-11-19 | 西北核技术研究所 | Method for discriminating alpha/gamma mixed radiation field particles in real time based on digital waveform |
| CN108169789A (en) * | 2018-03-22 | 2018-06-15 | 苏州瑞迈斯医疗科技有限公司 | A kind of method, apparatus for obtaining power spectrum and the device that energy window is set |
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| 赵健等: "BaF_2闪烁体探测器信号数字化方法研究", 《原子能科学技术》 * |
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