CN110361417A - A kind of test macro and test method of pump laser chip heat transfer response characteristic - Google Patents
A kind of test macro and test method of pump laser chip heat transfer response characteristic Download PDFInfo
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- CN110361417A CN110361417A CN201910775651.0A CN201910775651A CN110361417A CN 110361417 A CN110361417 A CN 110361417A CN 201910775651 A CN201910775651 A CN 201910775651A CN 110361417 A CN110361417 A CN 110361417A
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- pump laser
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
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Abstract
The present invention relates to pump laser fields, more particularly to a kind of test macro of pump laser chip heat transfer response characteristic, include: the refrigerator that the heat transfer test device includes carrying or the pump laser chip to be measured one end that reclines, and the pump laser chip other end to be measured or heat transfer position are set for the temperature sensor of farthest；Driving unit, output controllable current control refrigerator work；The sampling unit obtains the status information of refrigerator and the induction information of temperature sensor respectively；The heat transfer response characteristic of processing unit test pump laser chip.Further relate to a kind of test method based on test macro.The present invention passes through the test macro of pump laser chip heat transfer response characteristic, the heat-conductive characteristic of pump laser chip is obtained, to test the heat transfer response characteristic of pump laser chip；And the placement position for passing through refrigerator and temperature sensor, accurately obtains its heat transfer response characteristic, is convenient for subsequent manufacture.
Description
Technical field
The present invention relates to pump laser fields, and in particular to a kind of survey of pump laser chip heat transfer response characteristic
Test system and test method.
Background technique
Pump laser is widely used in image intensifer and optical fiber laser field, and chip is a kind of semiconductor element,
With temperature sensitive properties, while the production assembling process (Die of its core component CoS (Chip on Submount)
Bounding it) influences product heat transfer response performance and then pump laser performance is had an impact.
Specifically, the control of Die Bounding link and CoS heat pass in pump laser key component CoS manufacturing process
Lead effect correlation.Meanwhile it being limited to Die Bounding process and being difficult to detect product defect by common detecting methods.
Wherein, heat transfer (thermal conduction) be in medium without macroscopic motion when phenomenon of Heat, solid
Can occur in body, liquids and gases, but it is stringent for, pure heat transfer is only only in solids, even and if fluid is located
In stationary state, wherein also due to density contrast caused by temperature gradient and generate free convection, it is therefore, hot right in a fluid
Stream occurs simultaneously with heat transfer.
Summary of the invention
The technical problem to be solved in the present invention is that in view of the above drawbacks of the prior art, providing a kind of pump laser
The test macro and test method of chip heat transfer response characteristic solve the core component due to that can not obtain pump laser
The thermal conduction effect of CoS, the problem of being easy to appear flaw in the production process.
The technical solution adopted by the present invention to solve the technical problems is: providing a kind of pump laser chip heat transfer sound
Answer the test macro of characteristic, comprising: heat transfer test device, the heat transfer test device include carrying or the pumping to be measured that reclines
The refrigerator of chip of laser one end, and setting are farthest in the pump laser chip other end to be measured or heat transfer position
Temperature sensor；Driving unit, the driving unit are connect with refrigerator, and export controllable current control refrigerator work；
Sampling unit, the sampling unit are connect with refrigerator and temperature sensor respectively, respectively obtain refrigerator status information and
The induction information of temperature sensor；Processing unit, according to sampling unit using acquisition of information pump laser chip heat to be measured
The response of conduction tests the heat transfer response characteristic of pump laser chip.
Wherein, preferred version is: the refrigerator is horizontal positioned, and the pump laser chip to be measured is placed on refrigerator
On, the upper surface of pump laser chip to be measured is arranged in the temperature sensor.
Wherein, preferred version is: the refrigerator is semiconductor cooler.
Wherein, preferred version is: the temperature sensor is thermistor.
Wherein, preferred version is: the processing unit includes control module and the end PC, the control module, driving unit
A test board is constituted with sampling unit, the control module control test board is collected to be used information and be sent to the end PC, institute
The end PC is stated according to the response using acquisition of information pump laser chip heat transfer to be measured of sampling unit, tests pumping laser
The heat transfer response characteristic of device chip.
Wherein, preferred version is: the test board further includes filter unit, to be filtered to using information.
Wherein, preferred version is: the end PC includes a memory module, to store the algorithm for the response for calculating heat transfer
Process.
Wherein, preferred version is: further including the control unit connecting with pump laser chip to be measured, described control unit
Pump laser chip to be measured is controlled to work during the test.
Wherein, preferred version is: further including the display list for connecting and showing software Graphics user interface with processing unit
Member.
Wherein, preferred version is: the pump laser chip to be measured is 980nm pump laser chip.
The technical solution adopted by the present invention to solve the technical problems is to provide a kind of test side based on test macro
Method, applied in the test macro, comprising steps of driving refrigerator work；Acquire the status information and temperature of refrigerator
The induction information of sensor；According to the algorithm flow of default heat transfer response, bonding state information and induction information, obtain to
The response of pump laser chip heat transfer is surveyed, the heat transfer response characteristic of pump laser chip is tested.
Wherein, preferred version is: the temperature sensor is thermistor, and the step of test method includes: to be based on
Same frequency acquires refrigerator in multiple voltage values of power up, and multiple voltage values of acquisition thermistor；Obtain number
Group maximum voltage value and the formed average voltage level of minimum amount of voltage that；And when a voltage value V1 of refrigerator meets n-th electricity
Pressure value V2 and its difference are greater than average voltage level, and the time powers on moment T1 for refrigerator where confirmation voltage value V2；And
When thermistor is since a voltage value V3, M voltage value of continued presence is ascendant trend, and m-th voltage value V4 meets
Voltage value V3 and its difference are greater than preset voltage value, and the time where confirmation voltage value V4 is separation T2；Respectively to take index
It for the period of T1 to T2 and T2 to X-T2, carries out curve fitting, calculates the crosspoint of two matched curves, and as heat
The inflection point Ct of quick resistance, and Ct-T1 is thermal response data.
The beneficial effects of the present invention are compared with prior art, the present invention is rung by pump laser chip heat transfer
The test macro of characteristic is answered, the heat-conductive characteristic of pump laser chip is obtained, so that the heat for testing pump laser chip passes
Lead response characteristic；And the placement position for passing through refrigerator and temperature sensor, accurately obtains its heat transfer response characteristic, is convenient for
Subsequent manufacture.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples, in attached drawing:
Fig. 1 is the structural schematic diagram of the test macro of pump laser chip heat transfer response characteristic of the present invention；
Fig. 2 is the flow diagram of the test method the present invention is based on test macro；
Fig. 3 is the structural schematic diagram of control unit of the present invention；
Fig. 4 is the structural schematic diagram the invention shows unit.
Specific embodiment
Now in conjunction with attached drawing, elaborate to presently preferred embodiments of the present invention.
As depicted in figs. 1 and 2, the present invention provides a kind of test macro of pump laser chip heat transfer response characteristic
Preferred embodiment.
A kind of test macro of pump laser chip heat transfer response characteristic, including heat transfer test device, driving list
Member 200, sampling unit 300 and processing unit 400, wherein the heat transfer test device includes carrying or the pumping to be measured that reclines
The refrigerator 110 of 10 one end of chip of laser, and be arranged in 10 other end of pump laser chip to be measured or heat transfer position
For the temperature sensor 120 of farthest；The driving unit 200 is connect with refrigerator 110, and exports controllable current control refrigeration
Device 110 works；The sampling unit 300 is connect with refrigerator 110 and temperature sensor 120 respectively, obtains refrigerator 110 respectively
Status information and temperature sensor 120 induction information；Processing unit 400 uses acquisition of information according to sampling unit 300
The response of 10 heat transfer of pump laser chip to be measured tests the heat transfer response characteristic of pump laser chip.
Preferably, the processing unit 400 includes control module 410 and the end PC 420, and the control module 410, driving are single
Member 200 and sampling unit 300 constitute a test board 20, and it is collected using information that the control module 410 controls test board 20
And it is sent to the end PC 420, the end PC 420 uses acquisition of information pump laser chip 10 to be measured according to sampling unit 300
The response of heat transfer tests the heat transfer response characteristic of pump laser chip.Wherein, sampling unit 300 can pass through control
Module 410 sends data to the end PC 420, and the end PC 420 can also be directly transferred data under the control of control module 410.
Further, and Fig. 2 is referred to, a kind of test method based on test macro is provided, applied to the test system
In system, comprising steps of
Step S10, driving refrigerator 110 works；
Step S20, the status information of refrigerator 110 and the induction information of temperature sensor 120 are acquired；
Step S30, according to the algorithm flow for presetting heat transfer response, bonding state information and induction information, obtain to
The response of 10 heat transfer of pump laser chip is surveyed, the heat transfer response characteristic of pump laser chip is tested.
In the present embodiment, the heat transfer about heat transfer test device, as offer pump laser chip 10 to be measured
The induction core that heat source and heat transfer are rung.There are following several heat transfer side's schemes:
Scheme one, refrigerator 110 are used as a carrying platform, and pump laser to be measured are placed on the carrying platform
Place, and be bonded with refrigerator 110, the refrigeration of refrigerator 110 or fever maintain a preset temperature, and the one of pump laser to be measured
It conducts to the other end at end.Refrigerator 110 can be horizontal bearing (i.e. horizontal positioned, it is believed that be that loading end is horizontally disposed), can also
Think non-horizontal carrying, is bonded of course for guarantee pump laser to be measured with refrigerator 110, especially in non-horizontal carrying feelings
Under condition, need that a fixed structure is fixed or position limiting structure is limited.Scheme two, refrigerator 110 are as a fitting knot
Structure forms a probe, can be placed in the different location of pump laser to be measured, maintains a preset temperature.
Wherein, temperature sensor 120 is also disposed on pump laser to be measured, fitting setting, and is preferably provided with and is
The opposite other end of refrigerator 110, if the setting of refrigerator 110 is in bottom surface, temperature sensor 120 is arranged in top surface；Certainly, may be used
It is calculated or is summarized the experience by algorithm, obtain the position of a currently opposite refrigerator 110, heat transfer position is the one of farthest
Position, as 120 set-point of temperature sensor, the heat transfer response that further can sufficiently obtain pump laser to be measured is special
Property.Certainly, in order to more accurately obtain the heat transfer response characteristic of pump laser to be measured, settable multiple temperature sensors 120,
And the mean value or variance yields of the temperature information of different location are taken, it is responded with the whole heat transfer of determination pump laser to be measured special
Property.
Further, the refrigerator 110 is preferably semiconductor cooler 110.Wherein, conductor refrigerator 110
(Thermoelectric cooler) refers to the device that cooling capacity is produced using the thermo-electrically effect of semiconductor, also known as thermoelectric cooler
110.Two blocks of different metals are connected with conductor, connect direct current, then a junction temperature reduces, another junction temperature
It increases.Certainly, refrigerator 110 can also be other refrigeration equipments.
Further, the temperature sensor 120 is preferably thermistor.Wherein, thermal resistor is sensing element
One kind is divided into positive temperature coefficient thermistor (PTC) and negative temperature coefficient thermistor according to temperature coefficient difference
(NTC).The typical feature of thermal resistor be it is temperature sensitive, different resistance values is shown at a temperature of different.By obtaining
The resistance value of thermistor resistance is taken to can determine whether its temperature information.Certainly, temperature sensor 120 is excellent can also be that other temperature pass
Feel module.
In the present embodiment, sampling unit 300 respectively obtains the status information and temperature sensor 120 of refrigerator 110
Induction information, wherein the status information for obtaining refrigerator 110 refers to the working condition for obtaining current refrigeration device 110, such as opens
It opens or closes, alternatively, referring to the refrigeration for obtaining refrigerator 110 or heating information and its own temperature；And obtain temperature sensing
The induction information of device 120 is sent in control module 410 such as the resistance value of thermistor；And above- mentioned information further include institute
The time detected.
Alternatively, sampling 110 both ends real-time voltage of refrigerator, using the Acquisition Circuit constituted with a sampling resistor,
Change to obtain the variation of the practical driving voltage of refrigerator 110 by resistance both end voltage, to obtain the work shape of refrigerator 110
State.
And the end PC 420 changes feelings according to the induction information of working condition and temperature sensor 120 from refrigerator 110
Condition calculates the response of 10 heat transfer of pump laser chip to be measured, using as the pump laser chip 10 to be measured
Heat transfer response characteristic.Certainly, control module 410 can be with dedicated control circuit, including a processing chip and corresponding periphery electricity
Road.Further, the end PC 420 includes a memory module, to store the algorithm flow for the response for calculating heat transfer.
In the present embodiment, test macro further includes the filter unit being arranged on test board 20, and filter unit is settable
Between sampling unit 300 and control module 410, or it is arranged between sampling unit 300 and the end PC 420.It is single by filtering
The information that member singly acquires acquisition is filtered, and improves the levels of precision of information, removes noise.
In the present embodiment, the pump laser chip 10 to be measured is 980nm pump laser chip, naturally it is also possible to
It is other wavelength, such as 1480nmm pump laser chip.Why the wavelength of the pump light source of pump laser chip 10 to be measured
It is selected in 980nm or 1480nm, the wavelength of pump light source can be 520nm, 650nm, 980nm and 1480nm in fact, but practice card
The pump light source lasing efficiency highest of bright wavelength 1480nm, taking second place is the pump light source of wavelength 980nm, and, the pumping of 980nm
Source noise coefficient is lower.
As shown in figure 3, the present invention provides the preferred embodiment of control unit.
Test macro further includes the control unit 500 connecting with pump laser chip 10 to be measured, described control unit 500
Pump laser chip 10 to be measured is controlled to work during the test.Certainly, control unit 500 can also be integrally disposed in test board
On 20, even, control unit 500 and control module 410 can be same circuit chip, realize highly integrated.
It is surveyed in the practical work process of pump laser chip with imitating, its heat transfer response characteristic of test macro is
The important link of test macro.
As shown in figure 4, the present invention provides the preferred embodiment of display unit.
A kind of algorithmic formula, and Fig. 4 is referred to, comprising steps of
S31, refrigerator is acquired in multiple voltage values of power up, and multiple voltage values of acquisition thermistor；
S321, array maximum voltage value and the formed average voltage level of minimum amount of voltage that are obtained；
S322 and, when a voltage value V1 of refrigerator meet n-th voltage value V2 and its difference be greater than average voltage
Value, the time powers on moment T1 for refrigerator where confirmation voltage value V2；
S33 and, when thermistor is since a voltage value V3, M voltage value of continued presence is ascendant trend, and
M-th voltage value V4 meets voltage value V3 and its difference is greater than preset voltage value, and the time where confirmation voltage value V4 is boundary
Point T2；
S34, it is respectively the period of T1 to T2 and T2 to X-T2 to index is taken, carries out curve fitting, it is quasi- to calculate two
The crosspoint of curve, and the inflection point Ct as thermistor are closed, and Ct-T1 is thermal response data.
Preferably, frequency acquisition is N 4, M 5, X 1500, preset voltage value 0.1V.
Wherein, curve matching (curve fitting) refers to selection curve type appropriate to be fitted observation data, is used in combination
The curvilinear equation of fitting analyzes the relationship between two variables.The present embodiment observes the pass of refrigerator and thermistor by curve matching
System, to obtain crosspoint as thermal response data.
Wherein, refrigerator is acquired in multiple voltage values of power up based on same frequency, and acquires thermistor
Multiple voltage values, preferably 1K samples per second are acquired by identical frequency or higher frequency certainly, are improved
Or adapt to measuring accuracy.
In the present embodiment, test macro further includes that software Graphics user interface is connect and shown with processing unit 400
610 display unit 600.Wherein, display unit 600 is preferably the display screen at the end PC 420, can show software Graphics user circle
Face 610, to realize human-computer interaction.
It is particularly shown curve corresponding to the voltage value that content includes: refrigerator；Corresponding to the voltage value of thermistor
Curve；And refrigerator powers on moment T1；The separation T2 of thermistor；The matched curve of T1 to T2；T2's to X-T2 is quasi-
Close curve；Inflection point Ct.
By the display content of software Graphics user interface 610, inflection point Ct is clearly obtained, to obtain thermal response data,
To realize the test of pump laser chip heat transfer response characteristic.
As described above, only preferred embodiment is not intended to limit the scope of the present invention, Fan Yibenfa
Equivalent change or modification made by bright claim is all that the present invention is covered.
Claims (12)
1. a kind of test macro of pump laser chip heat transfer response characteristic characterized by comprising
Heat transfer test device, the heat transfer test device include the system of carrying or the pump laser chip to be measured one end that reclines
Cooler, and the pump laser chip other end to be measured or heat transfer position are set for the temperature sensor of farthest；
Driving unit, the driving unit are connect with refrigerator, and export controllable current control refrigerator work；
Sampling unit, the sampling unit are connect with refrigerator and temperature sensor respectively, obtain the state letter of refrigerator respectively
The induction information of breath and temperature sensor；
Processing unit, according to the response using acquisition of information pump laser chip heat transfer to be measured of sampling unit, test
The heat transfer response characteristic of pump laser chip.
2. test macro according to claim 1, it is characterised in that: the refrigerator is horizontal positioned, the pumping to be measured
Chip of laser is placed on refrigerator, and the upper surface of pump laser chip to be measured is arranged in the temperature sensor.
3. test macro according to claim 1 or 2, it is characterised in that: the refrigerator is semiconductor cooler.
4. test macro according to claim 1 or 2, it is characterised in that: the temperature sensor is thermistor.
5. test macro according to claim 1, it is characterised in that: the processing unit includes control module and the end PC,
The control module, driving unit and sampling unit constitute a test board, and test board is collected adopts for the control module control
With information and it is sent to the end PC, the end PC uses acquisition of information pump laser chip heat transfer to be measured according to sampling unit
Response, test pump laser chip heat transfer response characteristic.
6. test macro according to claim 5, it is characterised in that: the test board further includes filter unit, with to adopting
It is filtered with information.
7. test macro according to claim 5, it is characterised in that: the end PC includes a memory module, in terms of storage
Calculate the algorithm flow of the response of heat transfer.
8. test macro according to claim 1 or 5, it is characterised in that: further include connecting with pump laser chip to be measured
The control unit connect, described control unit control pump laser chip to be measured and work during the test.
9. test macro according to claim 1 or 5, it is characterised in that: further include connect and show with processing unit it is soft
The display unit of part graphic user interface.
10. test macro according to claim 1, it is characterised in that: the pump laser chip to be measured is 980nm pump
Pu chip of laser.
11. a kind of test method based on test macro, which is characterized in that applied to the survey as described in claim 1-10 is any
In test system, comprising steps of
Drive refrigerator work；
Acquire the status information of refrigerator and the induction information of temperature sensor；
According to the algorithm flow of default heat transfer response, bonding state information and induction information obtain pump laser to be measured
The response of chip heat transfer tests the heat transfer response characteristic of pump laser chip.
12. test method according to claim 1, it is characterised in that: the temperature sensor is thermistor, the survey
The step of method for testing includes:
Refrigerator is acquired in multiple voltage values of power up, and multiple voltage values of acquisition thermistor；
Obtain array maximum voltage value and the formed average voltage level of minimum amount of voltage that；
And when a voltage value V1 of refrigerator meets n-th voltage value V2 and its difference greater than average voltage level, confirmation electricity
The time powers on moment T1 for refrigerator where pressure value V2；
And when thermistor is since a voltage value V3, M voltage value of continued presence is ascendant trend, and m-th voltage
Value V4 meets voltage value V3 and its difference is greater than preset voltage value, and the time where confirmation voltage value V4 is separation T2；
It is respectively the period of T1 to T2 and T2 to X-T2 to index is taken, carries out curve fitting, calculate two matched curves
Crosspoint, and the inflection point Ct as thermistor, and Ct-T1 is thermal response data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910775651.0A CN110361417A (en) | 2019-08-21 | 2019-08-21 | A kind of test macro and test method of pump laser chip heat transfer response characteristic |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910775651.0A CN110361417A (en) | 2019-08-21 | 2019-08-21 | A kind of test macro and test method of pump laser chip heat transfer response characteristic |
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| CN110361417A true CN110361417A (en) | 2019-10-22 |
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| CN201910775651.0A Pending CN110361417A (en) | 2019-08-21 | 2019-08-21 | A kind of test macro and test method of pump laser chip heat transfer response characteristic |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111175026A (en) * | 2020-02-18 | 2020-05-19 | 昂纳信息技术（深圳）有限公司 | Testing device and testing method for pump laser |
-
2019
- 2019-08-21 CN CN201910775651.0A patent/CN110361417A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111175026A (en) * | 2020-02-18 | 2020-05-19 | 昂纳信息技术（深圳）有限公司 | Testing device and testing method for pump laser |
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Address after: No.35 Cuijing Road, Pingshan District, Shenzhen City, Guangdong Province Applicant after: Ona Technology (Shenzhen) Group Co.,Ltd. Address before: No.35 Cuijing Road, Pingshan District, Shenzhen City, Guangdong Province Applicant before: O-NET COMMUNICATIONS (SHENZHEN) Ltd. |