CN110346696B - Three-dimensional map expression method for wide-area dielectric loss current difference - Google Patents
Three-dimensional map expression method for wide-area dielectric loss current difference Download PDFInfo
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- CN110346696B CN110346696B CN201910604432.6A CN201910604432A CN110346696B CN 110346696 B CN110346696 B CN 110346696B CN 201910604432 A CN201910604432 A CN 201910604432A CN 110346696 B CN110346696 B CN 110346696B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
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- G—PHYSICS
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Abstract
The invention discloses a three-dimensional map expression method of wide-area dielectric loss current difference. The invention is realized as follows: selecting a plurality of monitoring points to install a sensor, and synchronously acquiring and recording the current value of each monitoring point at each moment in a wide area; taking the current values measured by all monitoring points for the first time as reference points, and carrying out normalization processing on the difference between the current values measured at subsequent time points and the current values of the reference points to obtain corresponding current differences; mapping the acquired current difference data to a corresponding three-dimensional map to obtain a three-dimensional map of the wide-area dielectric loss current difference; and judging the insulation condition of the electrical equipment according to whether the current difference fluctuates in a normal range. The invention innovatively applies a pattern expression mode and can carry out pattern expression and analysis on real-time monitoring data in a wide area. The image interface is clear, the dielectric loss condition can be judged visually through the fluctuation change of the current difference, and the judgment process is simple and easy to operate.
Description
Technical Field
The invention belongs to the field of map expression analysis, and particularly relates to a three-dimensional map expression method of wide-area dielectric loss current difference.
Background
Dielectric loss (hereinafter referred to as dielectric loss) is one of the main parameters reflecting the insulation state of electrical equipment, and a dielectric loss value is usually calculated from a tangent value of a phase difference of a contrast current, and the damage degree of an insulation layer is judged according to a fluctuation state of the dielectric loss value.
With the rapid development of information technology, the rapid processing and analysis of data become key technologies for solving problems of enterprises. At present, no map expression method exists for analyzing the dielectric loss current difference, so that the current difference change and the insulation condition of electrical equipment cannot be visually monitored, and great inconvenience is brought to safe production.
Disclosure of Invention
The invention provides a three-dimensional map expression method of wide-area dielectric loss current difference based on the defects of the prior art. The specific idea is as follows:
and selecting a plurality of monitoring points to install the sensors, and synchronously acquiring and recording the current value of each monitoring point at each moment in a wide area. And taking the current values measured by all the monitoring points for the first time as reference points, and normalizing the difference between the current values measured at the subsequent time points and the current values of the reference points to obtain corresponding current differences. And mapping the obtained current difference data to a corresponding three-dimensional map to obtain a current difference change fluctuation map. And judging the insulation condition of the electrical equipment according to whether the current difference fluctuates in a normal range.
The technical scheme adopted by the invention for solving the technical problem comprises the following steps:
step (1): and selecting a plurality of monitoring points D to install the sensor, and synchronously acquiring and recording the current value I of each monitoring point at each moment in a wide area. And taking the current values measured by all the monitoring points for the first time as reference points, and normalizing the difference between the current values measured at the subsequent time points and the current values of the reference points to obtain corresponding current difference delta I. The current difference normalization process is as follows:
ΔI＝(I(D,t)-I(D,1))/I(D,1) (1)
and calculating the difference delta I between the current value measured for the first time and the current value measured for the monitoring point D at the time t. Wherein, I(D,t)Refers to the current value, I, of the monitoring point D at the time t(D,1)Refers to the first current value of the monitoring point D.
Step (2): drawing a basic three-dimensional chart, wherein the basic three-dimensional chart has the following establishment criteria:
and selecting the X axis as a time axis (t) and recording time of data acquisition at the same time for all monitoring points. The resolution of the time scale can be selected according to the requirement, and the corresponding selection range comprises: second, minute, hour, day, month and year.
The Y axis is selected as a test point axis (D) which represents the position of each monitoring point. Wherein, the monitoring points needing to be statistically displayed can be selected autonomously according to the requirements.
The Z axis is selected as a current difference axis (delta I), and the normal range is set to be (-1) in the interval for the current difference between the current value measured at different moments of each monitoring point and the current value measured for the first time (normalization processing).
And (3): and mapping the obtained data such as the time scale, the test point, the current difference and the like to a three-dimensional curve map, thereby drawing a three-dimensional map of the wide-area dielectric loss current difference.
And (4): and observing a three-dimensional map of the wide-area dielectric loss current difference and analyzing the fluctuation state of the current difference. Normally, the Δ I fluctuates within a set interval range, and if the Δ I continuously increases, the change of the insulation state of the equipment is indicated.
The invention has the following beneficial effects:
the invention innovatively applies a pattern expression mode and can carry out pattern expression and analysis on real-time monitoring data in a wide area.
The image interface is clear, the dielectric loss condition can be judged visually through the fluctuation change of the current difference, and the judgment process is simple and easy to operate.
Drawings
FIG. 1 is an illustration of an example of a map display according to the present invention.
Detailed Description
The invention is further illustrated by the following general examples:
step (1): and selecting a plurality of monitoring points D to install the sensors, and synchronously acquiring and recording the current value I of each monitoring point at each moment in a wide area. As shown in FIG. 1, the monitoring points are marked A0-A8. And selecting the current values measured by all the monitoring points for the first time as reference points, and normalizing the difference between the current values measured at the subsequent time points and the current values of the reference points to obtain corresponding current difference delta I. The current difference normalization process is as follows:
ΔI＝(I(D,t)-I(D,1))/I(D,1) (1)
and calculating the difference delta I between the current value measured for the first time and the current value measured for the monitoring point D at the time t. Wherein, I(D,t)Refers to the current value, I, of the monitoring point D at the time t(D,1)Refers to the first current value of the monitoring point D.
Step (2): drawing a basic three-dimensional chart, wherein the basic chart has the following establishment criteria:
and selecting the X axis as a time axis (t) and recording time of data acquisition at the same time for all monitoring points. The resolution of the time scale can be selected according to the requirement, and the corresponding selection range comprises: second, minute, hour, day, month and year. As shown in fig. 1, when the current time scale resolution is "time", the displayed time points are respectively: 0. 2, 4, 6, 8, 10, 12.
The Y axis is selected as a test point axis (D) which represents the position of each monitoring point. Wherein, the monitoring points needing to be statistically displayed can be selected autonomously according to the requirements. As shown in FIG. 1, the currently selected statistics show monitoring points A0-A8, respectively.
And selecting the Z axis as a current difference axis (delta I) and setting the interval within the range of (-1) for the current difference between different moments and the first time of each monitoring point (normalization processing).
And (3): and mapping the obtained data such as the time scale, each monitoring point, the current difference and the like to a three-dimensional curve map, thereby drawing a wide-area dielectric loss current difference three-dimensional map (as shown in figure 1).
And (4): and observing a three-dimensional map of the wide-area dielectric loss current difference and analyzing the fluctuation state of the current difference. Normally, the Δ I fluctuates within a set interval range, and if the Δ I continuously increases, the change of the insulation state of the equipment is indicated. As shown in fig. 1, the current difference change at the monitoring point a5 is obviously not within the fluctuation range of the set interval, which indicates that the insulation state of the device at the monitoring point is changed.
Claims (1)
1. A three-dimensional map expression method of wide-area dielectric loss current difference is characterized by comprising the following steps:
selecting a plurality of monitoring points to install a sensor, and synchronously acquiring and recording the current value of each monitoring point at each moment in a wide area; taking the current values measured by all monitoring points for the first time as reference points, and carrying out normalization processing on the difference between the current values measured at subsequent time points and the current values of the reference points to obtain corresponding current differences; mapping the obtained current difference data to a corresponding three-dimensional map to obtain a current difference change fluctuation map; judging the insulation condition of the electrical equipment according to whether the current difference fluctuates within a normal range;
the method comprises the following steps:
step (1): selecting a plurality of monitoring points D to install a sensor, and synchronously acquiring and recording the current value I of each monitoring point at each moment in a wide area; taking the current values measured by all monitoring points for the first time as reference points, and carrying out normalization processing on the difference between the current values measured at subsequent time points and the current values of the reference points to obtain corresponding current difference delta I; the current difference normalization process is as follows:
ΔI=（I(D,t)-I(D,1)）/I(D,1) （1）
calculating the difference delta I between the current value of the monitoring point D at the time t and the current value measured for the first time; wherein I (D, t) refers to the current value of the monitoring point D at the time t, and I (D,1) refers to the first current value of the monitoring point D;
step (2): drawing a basic three-dimensional chart, wherein the basic three-dimensional chart has the following establishment criteria:
selecting an X axis as a time axis (t) and recording time of data acquisition of all monitoring points at the same time;
selecting a Y axis as a test point axis (D) to represent the position of each monitoring point; monitoring points needing to be statistically displayed can be selected autonomously according to requirements;
selecting a Z axis as a current difference axis (delta I), and setting a normal range of (-1) for a current difference between a current value measured at different moments of each monitoring point and a current value measured for the first time;
and (3): mapping the obtained time scale, test point and current difference data to a three-dimensional curve map, thereby drawing a three-dimensional wide area dielectric loss current difference change fluctuation map;
and (4): observing a three-dimensional map of the wide-area dielectric loss current difference and analyzing the fluctuation state of the current difference; normally, the Δ I fluctuates within a set interval range, and if the Δ I continuously increases, the change of the insulation state of the equipment is indicated.
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