CN110333966A - 一种固态硬盘设备 - Google Patents
一种固态硬盘设备 Download PDFInfo
- Publication number
- CN110333966A CN110333966A CN201910461788.9A CN201910461788A CN110333966A CN 110333966 A CN110333966 A CN 110333966A CN 201910461788 A CN201910461788 A CN 201910461788A CN 110333966 A CN110333966 A CN 110333966A
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- Prior art keywords
- flash
- array
- microprocessor
- data
- flash array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000015654 memory Effects 0.000 claims description 54
- 238000013507 mapping Methods 0.000 claims description 50
- 230000007246 mechanism Effects 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 8
- 238000004891 communication Methods 0.000 claims description 6
- 238000012795 verification Methods 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 3
- 210000003205 muscle Anatomy 0.000 claims 1
- 239000007787 solid Substances 0.000 abstract description 20
- 230000001737 promoting effect Effects 0.000 abstract 1
- 239000002245 particle Substances 0.000 description 6
- 238000003491 array Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7201—Logical to physical mapping or translation of blocks or pages
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201910461788.9A CN110333966B (zh) | 2019-05-30 | 2019-05-30 | 一种固态硬盘设备 |
Applications Claiming Priority (1)
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CN201910461788.9A CN110333966B (zh) | 2019-05-30 | 2019-05-30 | 一种固态硬盘设备 |
Publications (2)
Publication Number | Publication Date |
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CN110333966A true CN110333966A (zh) | 2019-10-15 |
CN110333966B CN110333966B (zh) | 2022-12-13 |
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CN201910461788.9A Active CN110333966B (zh) | 2019-05-30 | 2019-05-30 | 一种固态硬盘设备 |
Country Status (1)
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CN (1) | CN110333966B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110956995A (zh) * | 2019-11-29 | 2020-04-03 | 浙江工商大学 | 一种stt-ram缓存的动态数据擦洗方法 |
CN111176562A (zh) * | 2019-12-24 | 2020-05-19 | 河南文正电子数据处理有限公司 | 一种存储系统 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102122531A (zh) * | 2011-01-27 | 2011-07-13 | 浪潮电子信息产业股份有限公司 | 一种提高大容量固态硬盘使用稳定性的方法 |
CN103019882A (zh) * | 2012-11-12 | 2013-04-03 | 记忆科技(深圳)有限公司 | 固态硬盘的raid4系统 |
CN103176745A (zh) * | 2011-12-26 | 2013-06-26 | 英业达股份有限公司 | 具有双控制器的储存系统的硬盘阵列接管方法 |
CN105278875A (zh) * | 2015-09-16 | 2016-01-27 | 上海新储集成电路有限公司 | 一种混合异构nand固态硬盘 |
US20170017571A1 (en) * | 2015-07-17 | 2017-01-19 | Samsung Electronics Co., Ltd. | Method and apparatus fori n-line deduplication in storage devices |
US20170177225A1 (en) * | 2015-12-21 | 2017-06-22 | Nimble Storage, Inc. | Mid-level controllers for performing flash management on solid state drives |
US20190121551A1 (en) * | 2017-10-24 | 2019-04-25 | Apacer Technology Inc. | Method of extending lifetime of solid state disk |
-
2019
- 2019-05-30 CN CN201910461788.9A patent/CN110333966B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102122531A (zh) * | 2011-01-27 | 2011-07-13 | 浪潮电子信息产业股份有限公司 | 一种提高大容量固态硬盘使用稳定性的方法 |
CN103176745A (zh) * | 2011-12-26 | 2013-06-26 | 英业达股份有限公司 | 具有双控制器的储存系统的硬盘阵列接管方法 |
CN103019882A (zh) * | 2012-11-12 | 2013-04-03 | 记忆科技(深圳)有限公司 | 固态硬盘的raid4系统 |
US20170017571A1 (en) * | 2015-07-17 | 2017-01-19 | Samsung Electronics Co., Ltd. | Method and apparatus fori n-line deduplication in storage devices |
CN105278875A (zh) * | 2015-09-16 | 2016-01-27 | 上海新储集成电路有限公司 | 一种混合异构nand固态硬盘 |
US20170177225A1 (en) * | 2015-12-21 | 2017-06-22 | Nimble Storage, Inc. | Mid-level controllers for performing flash management on solid state drives |
US20190121551A1 (en) * | 2017-10-24 | 2019-04-25 | Apacer Technology Inc. | Method of extending lifetime of solid state disk |
Non-Patent Citations (2)
Title |
---|
LINGYAN FAN等: "《Lifespan Analysis for Redundant Array of Independent Module Based Solid State Drives》", 《IEEE TRANSACTIONS ON CONSUMER ELECTRONICS》 * |
杨松芳: "延长固态硬盘使用寿命的算法综述", 《中国集成电路》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110956995A (zh) * | 2019-11-29 | 2020-04-03 | 浙江工商大学 | 一种stt-ram缓存的动态数据擦洗方法 |
CN111176562A (zh) * | 2019-12-24 | 2020-05-19 | 河南文正电子数据处理有限公司 | 一种存储系统 |
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Publication number | Publication date |
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CN110333966B (zh) | 2022-12-13 |
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Effective date of registration: 20230616 Address after: 518000 shangxue community residents group, Bantian street, Longgang District, Shenzhen City, Guangdong Province Patentee after: LARIX (SHENZHEN) TECHNOLOGY CO.,LTD. Address before: 453000 C1-082, Chuangye Building, No.1 Park, Chuangye Road, Xinxiang City, Henan Province Patentee before: Henan Wenzheng Electronic Data Processing Co.,Ltd. |
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Effective date of registration: 20240301 Address after: Room 201, Building 25, No. 179, Fenggang Section, Dongshen Road, Fenggang Town, Dongguan City, Guangdong Province, 523000 Patentee after: Dongguan Lijing Technology Co.,Ltd. Country or region after: China Address before: 518000 shangxue community residents group, Bantian street, Longgang District, Shenzhen City, Guangdong Province Patentee before: LARIX (SHENZHEN) TECHNOLOGY CO.,LTD. Country or region before: China |
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