CN110320318A

CN110320318A - Sample analysis apparatus, method and storage medium

Info

Publication number: CN110320318A
Application number: CN201810276341.XA
Authority: CN
Inventors: 邓美清; 甘云; 张之勇
Original assignee: Shenzhen Mindray Bio Medical Electronics Co Ltd
Current assignee: Shenzhen Mindray Bio Medical Electronics Co Ltd
Priority date: 2018-03-30
Filing date: 2018-03-30
Publication date: 2019-10-11
Anticipated expiration: 2038-03-30
Also published as: CN110320318B

Abstract

This application involves a kind of sample analysis apparatus, method and storage mediums.The equipment includes: measuring means, and for testing sample, the sample includes quality-control product and/or calibration object；Memory saves the information of the sample bit in sample support mechanism, and save the incidence relation of sample and sample bit for saving the information of sample；Processor, position setting instruction is received for working as, interactive interface is arranged in calling station, by the position, the information that interactive interface is retrieved as the specified sample bit of sample is set, the position setting interactive interface is configured as that at least two samples is allowed to be designated the same sample bit, and the incidence relation of sample and specified sample bit is saved in the memory；It is also used to control the measuring means when receiving test application instruction to test the sample placed on the sample bit of the test application instruction instruction.It can be improved the operating efficiency of user using this equipment.

Description

Sample analysis apparatus, method and storage medium

Technical field

This application involves field of computer technology, more particularly to a kind of sample analysis apparatus, method and storage medium.

Background technique

Sample analysis apparatus (also known as sample analyser) is widely used in for being tested using reagent sample, being analyzed Medical industry.Sample to be tested is needed uniformly to be placed in the different sample bits of sample support mechanism, when test, sample support machine Structure (such as sample rack, sample disk) is placed on the designated position of sample analysis apparatus.For the precision and accuracy for guaranteeing test, need Quality Control test is carried out using quality-control product, carries out calibration test using calibration object.

When needing to carry out Quality Control test or calibration test, the processor of sample analysis apparatus calls human-computer interaction interface, supplies User is the sample bit that sample support mechanism is arranged in quality-control product to be measured or calibration object.

Sample support mechanism limited amount, and sample bit quantity is fixed, when actual test, when needing sample size to be tested More than the quantity for the sample bit that sample load carrier provides, the case where there are the sample bit lazy weights of sample support mechanism, only Sample bit is arranged in the sample that test first can be participated in for a batch, waits this batch to test into rear, then participate in the sample of test for next group This setting sample bit carries out next group test, needs that sample bit repeatedly is arranged, and the efficiency for causing sample position to be arranged is lower, behaviour It is inconvenient to make.

Summary of the invention

Based on this, it is necessary to which in view of the above technical problems, providing one kind can mention in the case where sample bit lazy weight Sample analysis apparatus, method and the storage medium of high sample position setting efficiency.

A kind of sample analysis apparatus, the equipment include:

Measuring means, for testing sample, the sample includes quality-control product and/or calibration object；

Memory saves the information of the sample bit in sample support mechanism, and save sample for saving the information of sample With the incidence relation of sample bit；

Processor, for when receiving position setting instruction, calling station to be arranged interactive interface, is arranged by the position Interactive interface is retrieved as the information of the specified sample bit of sample, and the position setting interactive interface is configured as permission at least two Sample is designated the same sample bit, and the incidence relation of sample and specified sample bit is saved in the memory；Also use It is placed on the sample bit of the measuring means to the test application instruction instruction in controlling when receiving test application instruction Sample is tested.

The information of the sample bit includes the physical message of sample bit in one of the embodiments,.

The information of the sample includes the mark of sample in one of the embodiments, and execution is arranged by the position When interactive interface is retrieved as the step of the information of the specified sample bit of sample, the processor is used for:

By the position, the mark physical message corresponding with the mark of the sample that interactive interface shows sample is set Input control；The physical message of the specified sample bit of sample is retrieved as by the physical message input control.

The memory is also used in one of the embodiments: saving the information of the corresponding test item of sample；

The processor is also used to: obtaining the information of target detection project, selection and the target from the memory Sample bit of the associated sample bit of the corresponding sample of test item as the test application instruction instruction.

When executing the step for obtaining the information of target detection project in one of the embodiments, the processor is used for: Test application interactive interface is called, applies for that interactive interface shows the information of selectable test item by the test, and lead to Cross the information that the test application interactive interface obtains the target detection project of selection.

The information of the sample bit includes the virtual information of sample bit in one of the embodiments, the sample bit Virtual information includes the mark of the corresponding Virtual Space of sample support mechanism and sample bit belonging to sample bit in virtual sample sky Between in corresponding virtual location mark.

By the position, the mark virtual information corresponding with the mark of the sample that interactive interface shows sample is set Input control；The virtual information of the specified sample bit of the sample is retrieved as by the virtual information input control.

The processor is also used in one of the embodiments: the mark in destination virtual space is obtained, from the storage Select in the destination virtual space each sample bit corresponding with the associated virtual location mark of sample as the test in device The sample bit of application instruction instruction.

When executing the step for obtaining the mark in destination virtual space in one of the embodiments, the processor is used for: Test application interactive interface is called, applies for that interactive interface shows the mark of selectable Virtual Space by the test, and lead to Cross the mark that the test application interactive interface obtains the destination virtual space of selection.

The processor is also used in one of the embodiments: being obtained the virtual information of target sample position, is deposited from described Select the target sample position as the sample bit of the test application instruction instruction in reservoir.

When executing the step for obtaining the virtual information of target sample position in one of the embodiments, the processor is used In: test application interactive interface is called, the selectable virtual information of interface display is applied for by test, and pass through the test Shen Please interface obtain selection target sample position virtual information.

The memory is also used in one of the embodiments: saving the use state of sample bit, the use of sample bit State includes that sample bit is occupied and sample bit is unoccupied；

The processor is used for: the sample bit of the test application instruction instruction is obtained from the memory uses shape State；If it is described test application instruction instruction sample bit use state be it is unoccupied, by the test application instruction indicate Sample bit use state be revised as it is occupied, and control the measuring means to it is described test application instruction instruction sample Sample on position is measured, and is revised as the use state of the sample bit of the test application instruction instruction not after the completion of measurement It is occupied.

If the use state of the sample bit of the test application instruction instruction is occupied in one of the embodiments, The processor is used for:

Output conflict prompt information；And/or

Whether the use state for monitoring the sample bit of the test application instruction instruction at predetermined intervals is changed It is unoccupied；If change, output sample bit can refer to test application with prompt information and/or the control measuring means The sample on the sample bit of instruction is enabled to be measured.

Sample support mechanism is sample rack or sample disk in one of the embodiments,.

A kind of method of sample analysis, comprising:

When receiving position setting instruction, interactive interface is arranged in calling station, and interactive interface is arranged by the position and obtains It is taken as the information of the specified sample bit of sample, the position setting interactive interface is configured as that at least two samples is allowed to be designated The incidence relation of sample and specified sample bit is saved in memory by the same sample bit；

When receiving test application instruction, the measuring means is controlled on the sample bit of the test application instruction instruction The sample of placement is tested.

The information of the corresponding test item of sample, the method are saved in the memory in one of the embodiments, Further include:

The information for obtaining target detection project selects sample association corresponding with the target detection project from memory Sample bit as it is described test application instruction instruction sample bit.

In one of the embodiments, the method also includes:

The mark for obtaining destination virtual space, from selecting to be associated in the destination virtual space with sample in the memory Virtual location identify corresponding each sample bit as it is described test application instruction instruction sample bit；

Alternatively,

The virtual information for obtaining target sample position, selects the target sample position as the test from the memory The sample bit of application instruction instruction.

Memory also saves the use state of sample bit in one of the embodiments, and the use state of sample bit includes Sample bit is occupied and sample bit is unoccupied, the method also includes:

The use state of the sample bit of the test application instruction instruction is obtained from the memory；If the test Shen Please instruct the sample bit of instruction use state be it is unoccupied, by it is described test application instruction instruction sample bit use shape State be revised as it is occupied, after the completion of measurement by it is described test application instruction instruction sample bit use state be revised as it is not occupied With.

A kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program It is performed the steps of when being executed by processor

The information of the corresponding test item of sample, the calculating are saved in the memory in one of the embodiments, Machine program also realizes following steps when being executed by processor:

Following steps are also realized when the computer program is executed by processor in one of the embodiments:

Alternatively,

Memory also saves the use state of sample bit in one of the embodiments, and the use state of sample bit includes Sample bit is occupied and sample bit is unoccupied, and the computer program also realizes following steps when being executed by processor:

Above-mentioned sample analysis apparatus, method and storage medium, when receiving position setting instruction, calling station setting is interacted Interface, and the information that interactive interface is retrieved as the sample bit that quality-control product and/or calibration object are specified is arranged by the position.Wherein, Position setting interactive interface is configured as that at least two quality-control products and/or calibration object is allowed to be designated the same sample bit, therefore, When sample bit deficiency, call a position setting interactive interface that can be more than quality-control product and/or the school of sample bit to quantity Sample position is arranged in quasi- product, does not need multiple calling station setting interactive interface and carries out position setting, improves sample bit and install The efficiency set, convenient for operation.

Detailed description of the invention

Fig. 1 is sample analysis apparatus external structure in one embodiment；

Fig. 2 is sample analysis apparatus internal structure chart in one embodiment；

Fig. 3 is the structural schematic diagram of sample rack in one embodiment；

Fig. 4 is the structural schematic diagram of sample disk in one embodiment；

Fig. 5 is that interactive interface schematic diagram is arranged in quality-control product position in one embodiment；

Fig. 6 is that one embodiment alignment grade installs interactive interface schematic diagram；

Fig. 7 is that interactive interface schematic diagram is arranged in position in another embodiment；

Fig. 8 is test application interactive interface schematic diagram in one embodiment；

Fig. 9 is test application interactive interface schematic diagram in another embodiment；

Figure 10 is test application interactive interface schematic diagram in another embodiment；

Figure 11 is a schematic diagram of sample rack scheduling process in one embodiment；

Figure 12 is another schematic diagram of sample rack scheduling process in one embodiment；

Figure 13 is data input interactive interface schematic diagram in one embodiment；

Figure 14 is the flow diagram of method of sample analysis in one embodiment.

Specific embodiment

It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, not For limiting the application.

Sample analysis apparatus provided by the present application can with but be not limited only to be immunity analysis instrument, Biochemical Analyzer, blood point Analyzer etc..

The external structure of sample analysis apparatus provided by the present application may refer to Fig. 1, and internal structure is as shown in Fig. 2, packet Include measuring means 201, memory 202 and processor 206.

Measuring means 201 carries out Quality Control test for testing sample, such as to quality-control product, carries out school to calibration object Quasi- test etc..

Memory 202 is used to save the information of sample, saves the information of the sample bit in sample support mechanism, and saves sample The incidence relation of this and sample bit.

Processor 206 is used for when receiving position setting instruction, and calling station is arranged interactive interface, is arranged by the position Interactive interface is retrieved as the information of the specified sample bit of sample, and position setting interactive interface is configured as allowing at least two samples Originally it is designated the same sample bit, the incidence relation of sample and specified sample bit is saved in memory 202；It is also used to work as Test application instruction is received, the sample placed on the sample bit of 201 pairs of measuring means test application instruction instructions is controlled and carries out Test.

When receiving position setting instruction, interactive interface is arranged in processor calling station, and passes through position setting interaction Interface is retrieved as the information for the sample bit that quality-control product and/or calibration object are specified.Wherein, setting interactive interface in position is configured as permitting Perhaps at least two quality-control products and/or calibration object are designated the same sample bit, therefore, when sample bit deficiency, call primary position Sample position can be arranged more than the quality-control product and/or calibration object of sample bit to quantity by installing interactive interface, not needed more Secondary calling station setting interactive interface carries out position setting, improves the efficiency of sample position setting.

As shown in Fig. 2, sample analysis apparatus provided by the embodiments of the present application can also include display 203, input mechanism 204 and the specimen transporter 205 for sample rack to be transported to designated position.Measuring means 201, memory 202, display 203, input mechanism 204 and sample transport mechanism 205 are connect by system bus 207 with processor 206.Display 203 can To be liquid crystal display or electric ink display screen, input mechanism 204 can be the touch layer covered on display, can also be with It is the key being arranged on sample analysis apparatus shell, trace ball or Trackpad, can also be external keyboard, Trackpad or mouse Deng.Sample measures mechanism may include the separate injection needle for suction sample and the photometric measurer for test.

In a concrete implementation structure, sample analysis apparatus includes two processors, i.e. primary processor and from processing Device.Wherein, primary processor is used to send control instruction to from processor, is used to control sample point according to control instruction from processor Each mechanism (such as sample transport mechanism, measuring means) of desorption device works.Correspondingly, the function of the processor 206 in Fig. 2 by Primary processor and from processor cooperate realize.For example, primary processor is after receiving sample position setting instruction, invocation bit is installed Set interactive interface complete sample position setting, the incidence relation of sample and sample bit is saved in memory, and notify to from Processor；Primary processor receives test application instruction, sends control instruction to from processor, is measured by controlling from processor Mechanism is tested.It should be pointed out that sample analysis apparatus can also only include a processor；Sample analysis apparatus may be used also To include primary processor, and be each controlled mechanism (such as measuring means, sample transport mechanism) it is corresponding from processor, Primary processor is by respectively controlling corresponding mechanism work from processor, to complete to test.

It will be understood by those skilled in the art that structure shown in Figure 2, only part relevant to application scheme is tied The block diagram of structure, does not constitute the restriction to the application sample analysis apparatus structure, and specific sample analysis apparatus may include ratio More or fewer components as shown in the figure perhaps combine certain components or with different component layouts.

Sample analysis apparatus is divided by input mode, can be divided into rail mounted sample introduction and disc type sample introduction.The embodiment of the present application mentions The technical solution of confession is not only suitable for rail mounted sampling structure, is also applied for disc type sampling structure.

In the sample analysis apparatus of rail mounted sampling structure, sample support mechanism is sample rack 300 as shown in Figure 3, sample There are multiple sample bits 301 on this 300, for placing sample.In general, sample rack be divided into Quality Control sample rack, calibration sample frame and Conventional sample rack etc..Each sample rack corresponds to sample rack type and sample rack number, each sample bit difference on sample rack A corresponding number.The label for indicating above-mentioned number is provided on sample rack.

In the sample analysis apparatus of disc type sampling structure, sample support mechanism is sample disk 400 as shown in Figure 4, sample There are multiple sample bits 401 on disk 400, the part sample bit on sample disk 400 keeps for calibration object and quality-control product.On sample disk Each sample bit is corresponding with number, and the label for indicating above-mentioned coding is provided on sample disk.

In one embodiment provided by the present application, the information of above-mentioned sample bit includes the physical message of sample bit.Wherein, The physical message of sample bit is for indicating position of the sample bit in sample support mechanism.By taking sample rack as an example, if only one Sample rack, then the physical message of sample bit includes the number of above-mentioned sample bit；If there is multiple sample racks, the physics of sample bit is believed Breath includes the number of information (type of such as sample rack and the number of sample rack) and sample bit of sample rack belonging to sample bit.With For sample disk, then the physical message of sample bit includes the number of sample bit.

Correspondingly, processor is specifically to establish incidence relation to the information of sample and the physical message of sample bit.

The embodiment of the present application is not defined the specific implementation that incidence relation is saved in memory.If memory with The form storing data of data form, can be with sample bit shown in sample information list shown in Maintenance Table 1 and table 2 in memory Information form.The information that sample is recorded in the sample information list, for example, sample names, specimen lot, sample type, correspondence The information of test item etc., wherein sample names field is as critical field；Sample bit is recorded in sample bit information form Physical message, wherein sample bit number field and sample rack number field are as united keyword section.By to critical field Attribute configured, establish the incidence relation of critical field in the two lists, sample and sample bit established to realize Incidence relation.

Memory can be with sample shown in Maintenance Table 3 and physical message incidence relation list, in the incidence relation list Sample names field be associated with the sample names field in sample information list, the sample bit number in the incidence relation list Field and sample rack number field in sample bit information form sample bit number field and sample rack number field be associated with.

Specifically, the corresponding quality-control product information form of quality-control product and the corresponding calibration object information of calibration object can be safeguarded respectively List can also save the information of quality-control product and the information of calibration object in the same sample information list.

The corresponding Quality Control sample bit information form of Quality Control sample rack and the corresponding calibration of calibration sample frame can be safeguarded respectively Sample bit information form can also save information and the calibration sample position of Quality Control sample bit in the same sample bit information form Information.

Quality-control product and physical message incidence relation list, calibration object and physical message incidence relation table can be safeguarded respectively It is single, it can also being associated in the same sample and preservation quality-control product in physical message incidence relation list and sample bit physical message The incidence relation of relationship and calibration object and sample bit physical message.

Sample names

Specimen lot

Sample type

Validity period

Project name

Mean value

Standard deviation

Unit

QCCC2

102

Serum

2019/03/20

CA125

1

U/ml

QCCC1

101

Serum

2019/03/20

CA125

1

U/ml

……

1 sample information list of table

2 sample bit information form of table

Sample names	Sample rack number	Sample bit number
			CAT3	C0001	01
QCCC3	C0001	02
			QCCC2	C0001	02
QCCC1	C0002	01
			QCC1	C0002	01
AFP	S0001	01
			BNP	S0001	01

3 sample of table and physical message incidence relation list

In the embodiment of the present application, when configuring sample position, interactive interface is arranged by position and is retrieved as what sample was specified The physical message of sample bit, and allowing user to be installed in interactive interface in place is that different samples specifies the same sample bit, It can thus be avoided repeatedly calling station setting interactive interface configures sample position, the processing effect of sample position setting is improved Rate.

Correspondingly, when executing the step for the information for being retrieved as the specified sample bit of sample by position setting interactive interface, Processing implement body can be used for: the corresponding physics letter of mark that interactive interface shows the mark and sample of sample is arranged by position Cease input control；The physical message of the specified sample bit of sample is retrieved as by physical message input control.

It wherein, include the mark of sample in the information of sample, sample identification is for distinguishing different samples.For example, sample Mark can be the title of sample, the mark of sample is also possible to the title of sample and the lot number of sample.Physical message input Control can be input frame, can be drop-down menu, can be one group of optional button, and the application is not construed as limiting this.

In the embodiment of the present application, the implementation for the mark that interactive interface display sample is arranged by position in processor has more Kind.

In one embodiment, processor is searched according to the information saved in memory and is not associated with pass with sample bit foundation The sample of system shows the mark of these samples on position setting interactive interface.In view of user has location revision to be arranged The mark of all samples saved in memory is shown to be arranged in position and be handed over by demand, in another embodiment, processor On mutual interface, user, which can be not only that sample specifies sample bit for the first time by the interface, to be sample weight by the interface Newly specified sample bit.Correspondingly, the position setting interactive interface of quality-control product can with but be not limited only to as shown in figure 5, in Fig. 5, boundary The title and lot number (if not saving the lot number of quality-control product, not showing) of multiple quality-control products are shown on face, each quality-control product is corresponding One sample rack numbers the drop-down menu of (i.e. frame number) and the drop-down menu of a sample bit number (i.e. position)；The position of calibration object Installing interactive interface can be as shown in fig. 6, shows the title and lot number of multiple calibration objects, each calibration object in Fig. 6, on interface Corresponding sample support class of establishment (i.e. module) drop-down menu, a sample rack drop-down menu, a multiple sample bit numbers are (i.e. C0 frame number, C1 frame number, C1 frame number) drop-down menu.In order to guarantee calibration accuracy, it usually needs calibration object is repeatedly tested, Therefore the sample bit (i.e. setting C0 frame number, C1 frame number, C2 frame number) of each calibration test can be set for calibration object.

In another embodiment, processor is shown by the sample identification input control that position is arranged on interactive interface The mark of sample, sample identification input control can be input frame, drop-down menu, one group of optional button etc..With quality-control product position Be arranged interactive interface for, as shown in fig. 7, user by quality-control product position be arranged interactive interface sample names drop-down menu and Specimen lot drop-down menu selects sample names and specimen lot, the selection of processor response user, by corresponding sample names It is shown on position setting interactive interface with specimen lot.

In the embodiment of the present application, when receiving test application instruction, processor carries out the implementation of test application processing There are many.

In a kind of test application processing mode, processor handles the test application of each sample in test item one by one.Tool Body, processor can call test application interactive interface, and sample to be tested is determined by the information that the interface obtains, is passed through The information that the interface obtains determines sample bit (i.e. the sample bit of test application instruction instruction).

By taking quality-control product as an example, test application interactive interface can be as shown in Figure 8.In fig. 8, user pulls down dish by module Single choice selects the sample analysis apparatus that test uses, and user selects quality-control product, processor detection by quality-control product/lot number drop-down menu To the sample so that it is determined that be tested that selects of user, user selects test by clicking the button (such as CA125) of test item Project, processor detects the test item of user's selection so that it is determined that test item, user pass through module drop-down menu and position The physical message of drop-down menu selection sample bit is set, processor detects the selection of user so that it is determined that sample bit.

By taking user has selected quality-control product QC2/102 as an example, processor is searched and the associated sample of the quality-control product from memory The physical message at one's own department or unit, and shown in corresponding drop-down menu, for selection by the user.

In another kind test application processing mode, the test application of each sample in processor batch processing test item.

Under one scene, if calibration object (or quality-control product) needed for calibration (or Quality Control) test can be placed on one In sample rack or sample disk, when applying for test, it can once complete to be directed to the test item by selection target test item The test application of all calibration objects or quality-control product.In a preferred implementation, it is corresponding that sample is also saved in memory The information of test item.Still by taking the data storage method of data form as an example, the information of the test item can be used as sample A part of information is stored in sample information list, can also separately maintain test item list.Correspondingly, receiving test After application instruction, processor is also used to obtain the information of target detection project, selection and target detection project pair from memory The associated sample bit of the sample answered applies for the sample bit of instruction instruction as test.

In this way, user can choose target detection project, without being successively directed to each calibration object or matter Control product application test, can simplify test application process, improve the efficiency of test application.

Specifically, processor can call test application interactive interface as shown in Figure 9, pass through test application interaction circle Face shows the information of selectable test item, and applies for that interactive interface obtains the letter of the target detection project of selection by test Breath.Certainly, processor can also obtain the information of target detection project by other means, such as be obtained by way of barcode scanning , it is obtained by being communicated with other equipment (such as mobile phone) from other equipment.

The icon of multiple test items is shown in Fig. 9, on interface, user can select test item by clicking icon.

Under another scene, if calibration object (or quality-control product) quantity needed for calibration (or Quality Control) test is more, nothing Method is completed by a test process, then can configure multiple Virtual Spaces for test item.When applying for test, can pass through Selection target test item or the corresponding Virtual Space of test item complete to be directed to all calibration objects of the test item or quality-control product Test application.In a preferred implementation, the information of the corresponding test item of sample is also saved in memory, and protect Deposit the incidence relation of test item and Virtual Space.Correspondingly, processor is also used to be each after receiving test application instruction Test item is associated at least one Virtual Space, and by the sample pair of virtual location and associated test item in Virtual Space It answers.After receiving test application instruction, processor obtains the mark of the Virtual Space of selection, and then corresponding sample bit is selected to make Apply for the sample bit of instruction instruction for test；Alternatively, processor obtains the target detection of selection after receiving test application instruction The information of project, determines each Virtual Space of the target detection item association, and then selects corresponding sample bit as test The sample bit of application instruction instruction.

By taking quality-control product as an example, processor determines the corresponding matter of each test item according to the data in quality-control product information form Control product quantity, if the corresponding quality-control product quantity N of a test item is handled less than the quantity M of the sample bit of a sample rack Device is that the test item is associated with a Virtual Space, which includes N number of virtual location, and processor is established in Virtual Space The incidence relation or each virtual location of each virtual location and sample and the physical message incidence relation of sample bit；If one The corresponding quality-control product quantity N of test item is greater than the sample bit quantity of a sample rack, then processor is test item association It is not less thanA Virtual Space, these Virtual Spaces share N number of virtual location, and the virtual location of each Virtual Space is not more than M, processor are established every in the incidence relation one by one or each Virtual Space of each virtual location and sample in these Virtual Spaces The incidence relation of the physical message of a virtual location and sample bit.

Correspondingly, if completing the survey for all calibration objects of the test item or quality-control product by selection target test item Examination application, after receiving test application instruction, processor calls test application interactive interface, which shows Alternative test item, for user by the interface selection target test item, processor detects the target of user's selection Test item determines the Virtual Space of target detection item association；If the virtual location of Virtual Space and target detection project Quality-control product association then searches the associated sample bit of these quality-control products as test by the incidence relation of quality-control product and physical message The sample bit of application instruction instruction；If the virtual location of Virtual Space is associated with the physical message of sample bit, according to the association Relationship searches the sample bit that the associated sample bit of virtual location applies for instruction instruction as test.

If completing to be directed to all calibration objects of the test item or quality-control product by the corresponding Virtual Space of selection test item Test application, receive test application instruction after, processor call test application interactive interface, the test application interactive interface Show the mark of alternative Virtual Space, user detects user by the interface selection target Virtual Space, processor The destination virtual space of selection；If the virtual location in destination virtual space is associated with the quality-control product of test item, pass through Quality Control Product and the incidence relation of physical message search the sample bit that the associated sample bit of these quality-control products applies for instruction instruction as test； If the virtual location in destination virtual space is associated with the physical message of sample bit, virtual location is searched according to the incidence relation and is closed The sample bit of connection applies for the sample bit of instruction instruction as test.

In this way, user can choose target detection project or Virtual Space, without successively for each Calibration object or quality-control product application test, can simplify test application process, improve the efficiency of test application.

In general, a test process can only test the quality-control product on a Virtual Space, if target detection item association is more A Virtual Space or user have selected multiple destination virtual spaces, and test item requires the testing sequence of quality-control product, It then needs to indicate testing sequence for multiple Virtual Spaces., can be by user nominative testing sequence in the embodiment of the present application, it can also be with By processor according to the specified sequence of preconfigured rule, the application is not construed as limiting this.

Sample analysis apparatus provided by the embodiments of the present application allows to specify the same sample bit for different samples.If user When sample position is arranged, identical sample bit is specified for the sample of different test items, was carried out in a test item Cheng Zhong, user are that the sample application of another test item is tested, then there is the conflict of sample bit.If not to the conflict of sample bit Situation is detected, then may cause test process confusion, such as leads to ongoing test process because sample bit rushes It dashes forward and abnormal interrupt, etc..Therefore, in processing test application, the embodiment of the present application can also carry out the conflict inspection of sample bit It surveys.

Correspondingly, also saving the use state of sample bit in memory.The use state of sample bit includes that sample bit is occupied With unoccupied with sample bit.

Still by taking the data storage method of data form as an example, the use state of sample bit can pass through sample bit information form In use state field maintenance, can be safeguarded by the use state field in the incidence relation list of sample and sample bit, It can also be safeguarded by individual sample bit use state list.

Processor obtains the use state of the sample bit of test application instruction instruction from memory；If the sample bit makes Be with state it is unoccupied, the use state of the sample bit is revised as occupied, and controls measuring means on the sample bit Sample be measured, the use state of the sample bit is revised as after the completion of measurement unoccupied.If the sample bit is occupied, Preferably, any one of following operation is at least carried out:

Operation one, output conflict prompt information；

It is unoccupied whether operation two, the use state for monitoring the sample bit at predetermined intervals are changed to；If Change, output sample bit can be measured the sample on the sample bit with prompt information and/or control measuring means.

Wherein, the prompt information that conflicts and sample bit can be used there are many way of outputs of prompt information, such as over the display It has been shown that, is sent to the mobile phone connecting with sample analysis apparatus, shown in a manner of voice broadcast, etc..

Wherein, it if detecting the change of sample bit use state, and then controls measuring means and is measured, also repair accordingly Change the use state of sample bit.

Wherein, it in addition to the use state of monitor sample position at predetermined intervals, can also be sent out using other modes The change of existing use state, the application are not construed as limiting this.

In the embodiment of the present application, if detecting sample bit swiping, output conflict prompt information, so that user knows test Shen The reason of please failing, carries out the reference information that subsequent processing provides for user.

In the embodiment of the present application, if detecting sample bit swiping, processor monitors the use shape of the sample bit of conflict automatically Whether state changes, if change, user can be reminded to continue test application by way of output prompt, can also be with Automatically continue with test.The efficiency that user applies for test can be improved in this processing mode.For example, user can be disposable complete The test application of pairs of predetermined amount of time (such as one day) all test items, the test without often paying close attention to sample analyser State applies for next test item again after the completion of each test item.

It can be that sample to be tested occupies the sample after detecting that sample bit is unoccupied in the embodiment of the present application Position (i.e. the use state of modification sample bit is occupied).

It, can also be by the use state of sample bit and association in time in the embodiment of the present application.To safeguard individual sample bit For use state table, according to sample bit use state table one shown in table 4, list include sample names, sample rack number, Sample bit number and occupancy period indicate that corresponding sample bit is in occupied in certain period as long as occurring in the list State；According to sample bit use state table two shown in table 5, list includes sample rack number, sample bit number, using shape State and multiple occupancy periods.Correspondingly, processor when the use state of sample bit is revised as occupied, also determines when occupying Section.There are many modes for determining the occupancy period, for example, processor is the sample that application is tested after receiving test application instruction This determination test the time started and test the end time, will test the time started to test the end time as the sample to the sample The occupancy period at one's own department or unit.Test the time started can be by test application interactive interface (such as test shown in Fig. 10 apply Interactive interface) obtain, it is also possible to be calculated according to existing test case；Testing the end time is by calculating or looking into Preconfigured length of testing speech is looked for determine.

Sample names	Sample rack number	Sample bit number	Occupy the period
				CAT3	C0001	01	08:00-09:00
QCCC3	C0001	02	08:00-09:00
				QCCC2	C0001	02	10:00-11:00

4 sample bit use state table one of table

Sample rack number	Sample bit number	Use state	Occupy the period 1	Occupy the period 2
					C0001	01	It is occupied	08:00-09:00
C0001	02	It is occupied	08:00-09:00	10:00-11:00
					C0001	02	It is unoccupied

5 sample bit use state table two of table

Correspondingly, processor obtains the use state and occupancy of the sample bit of test application instruction instruction from table 4 or table 5 Period adds data item in table 4, is testing if the sample bit is unoccupied in the occupancy period needed for this test After the completion, the data item is deleted perhaps to be revised as unoccupied by the use state in the data item or in table 5 modify sample The use state at one's own department or unit and/or occupancy period.

It is disposably multiple samples if should be pointed out that through selection target test item or destination virtual space The case where application is tested, and is also likely to be present sample bit swiping between these samples.Correspondingly, can be surveyed in the target for obtaining selection After examination project or destination virtual space, in a predetermined sequence one by one for each sample carry out collision detection, collision detection it is specific Implementation is referred to the description of above-described embodiment.

Below by taking sample analysis apparatus shown in Fig. 2 applies the application scenarios shown in Figure 11, Figure 12 as an example, to the application A kind of implementation that embodiment provides is described in detail.

In the present embodiment, quality-control product information form, calibration object information form, Quality Control sample bit information table are saved in memory List, calibration sample position information form, quality-control product and physical message incidence relation list, calibration object and physical message incidence relation table Single and sample bit use state list.

It is instructed when processor receives quality-control product data input, shows data input friendship as shown in fig. 13 that over the display Mutual interface, user input the information of quality-control product on the surface, and processor is by these information preservations into quality-control product information form.

When processor receives the instruction of calibration object data input, the data input mode of calibration object is referred to above-mentioned Quality Control The data input mode of product, details are not described herein again.

It is instructed when the position that processor receives quality-control product is arranged, shows quality-control product as shown in Figure 5 over the display Interactive interface is arranged in position；User is from multiple sample racks that the corresponding sample rack drop-down menu of each quality-control product is shown number Each quality-control product selects sample rack, and is each quality-control product selection sample from multiple sample bit numbers that sample bit drop-down menu is shown Position, to realize the specified of sample bit, processor detects the number of the sample rack of user's selection and the number of sample bit, in matter Corresponding incidence relation information is added in control product and the incidence relation list of physical message.

It is instructed when the position that processor receives calibration object is arranged, shows the position of calibration object shown in fig. 6 over the display Install interactive interface；The module class that user shows from the corresponding module of each calibration object (i.e. sample support mechanism) drop-down menu Sample rack (Rack) or sample disk are selected in type, if having selected sample rack, the sample that is further shown from sample rack drop-down menu The number of sample rack is selected in frame number, is selected frame position in the number of shelf-position that drop-down menu is shown from each frame position, is completed sample bit It is specified；Processor detects sample support class of establishment, the number of sample rack and the number of frame position of user's selection, in calibration object With corresponding incidence relation information is added in the incidence relation list of physical message.

In the embodiment of the present application, processor can obtain position setting instruction in several ways.It is shown for example, user clicks Show the position setting icon of the quality-control product, calibration object that show on device, which is position setting instruction.In another example using Family sends position setting instruction by the APP of mobile phone.

It is instructed when processor receives Quality Control test application, shows that interaction circle is applied in test shown in Fig. 10 over the display Face, user passes through selection target test item in the icon for multiple test items that test application interactive interface is shown, and passes through The input test time started in the testing time input frame that test application interactive interface is shown, when processor detects that test starts Between after, the test application corresponding occupancy period is determined, after processor detects the target detection project of user's selection, from Quality Control The corresponding quality-control product of target detection project is searched in product information form, and from quality-control product and physical message incidence relation list The associated sample bit of these quality-control products is searched, from sample bit use state table two shown in table 5 in a predetermined sequence successively It is whether occupied in the test application corresponding occupancy period to search these sample bits；If unoccupied, modification is corresponding in table 5 Information control sample transport mechanism and by the sample rack for being put into area is placed in be transported to suction and when testing the time started and arriving Sample position, the separate injection needle for controlling measuring means draws the sample placed on sample rack in sample position, and the sample of absorption is turned It moves on in reaction vessel, separate injection needle controls the photometric measurer of measuring means for reaction also by agent transfer into the reaction vessel The sample that reagent is mixed into container carries out the test that shines.

If above-mentioned sample bit applies for that the corresponding occupancy period is occupied in test, processor shows conflict over the display Prompt information, and the use state of these sample bits in table 5 is monitored at predetermined intervals, when use state is revised as not Occupied, processor shows that sample bit can use prompt information over the display.

After the completion of processor detects test, use state corresponding in table 5 and/or occupancy period are modified.

When processor receives calibration test application instruction, processing mode is referred to above-mentioned calibration test, herein not It repeats again.

It should be pointed out that completing the letter of quality-control product and/or calibration object by different interactive interfaces in above-described embodiment Typing is ceased, the sample position of quality-control product and/or calibration object is arranged.The application can also be completed at the same time by an interactive interface The setting of the data input and sample position of quality-control product and/or calibration object.

In one embodiment, the information of above-mentioned sample bit includes the virtual information of sample bit, the virtual information of sample bit It is corresponding in virtual sample space including the mark of the corresponding Virtual Space of sample support mechanism belonging to sample bit and sample bit Virtual location mark.

By taking sample rack as an example, each sample rack corresponds to the mark of at least one Virtual Space.In a kind of implementation, sample Each sample bit of support mechanism corresponding virtual location mark in each Virtual Space.In another implementation, The quantity of virtual location mark in Virtual Space is determined by user when carrying out position setting.

Correspondingly, processor is specifically to establish incidence relation to the information of sample and the virtual information of sample bit.

The embodiment of the present application is not defined the specific implementation that incidence relation is saved in memory.With data form For, including level information list can be safeguarded in memory, and safeguard sample and virtual location incidence relation list.It is specific Implementation is referred to the description of above-described embodiment, and details are not described herein again.

In the embodiment of the present application, sample bit can be coped with extending sample bit by way of increasing the mark of Virtual Space Insufficient situation.When configuring sample position, interactive interface is arranged by position and is retrieved as the virtual of the specified sample bit of sample Information, different virtual informations can correspond to the same physical message, i.e., permission user is installed in interactive interface in place as not Same sample specifies the same sample bit, it can thus be avoided repeatedly calling station setting interactive interface configures sample position, mentions High treatment effeciency.

The step of interactive interface is retrieved as the information of the specified sample bit of sample is arranged by the position correspondingly, executing When, the processing implement body can be used for: interactive interface is arranged by the position and shows identifying and the sample for sample Identify corresponding virtual information input control；The specified sample bit of the sample is retrieved as by the virtual information input control Virtual information.

Its specific implementation is referred to the description of above-described embodiment, and details are not described herein again.

In the embodiment of the present application, if the corresponding test item of the mark of a Virtual Space, tests Shen when receiving It please instruct, the mark in the available destination virtual space of processor, from being selected in the memory in the destination virtual space Sample bit of the corresponding each sample bit as the test application instruction instruction is identified with the associated virtual location of sample.

Processor obtains there are many implementations of the mark in destination virtual space, for example, processor calls test application Interactive interface applies for that interactive interface shows the mark of selectable Virtual Space by the test, and passes through the test Shen Please interactive interface obtain selection destination virtual space mark.

In the embodiment of the present application, if the mark of a Virtual Space corresponds to multiple test items, processor also obtains target The virtual information of sample bit selects the target sample position as the sample of the test application instruction instruction from memory Position.

There are many implementations for obtaining the virtual information of target sample position, for example, the processor calls test application Interactive interface applies for the selectable virtual information of interface display by test, and applies for that interface obtains selection by the test Target sample position virtual information.

Sample analysis apparatus provided by the embodiments of the present application allows to specify the same sample bit for different samples.If user It participates in applying being tested using the sample rack in test process in sample rack, then there is conflict.The embodiment of the present application is to improve The stability of test process and/or conflict prompt is carried out to user, collision detection can also be carried out.

The implementation of collision detection is referred to the description of above-described embodiment, and details are not described herein again.

Below by taking sample analysis apparatus shown in Fig. 2 applies the application scenarios shown in Figure 11, Figure 12 as an example, to the application Another implementation that embodiment provides is described in detail.

In the present embodiment, quality-control product information form, calibration object information form, Quality Control sample bit information table are saved in memory List, calibration sample position information form, Quality Control virtual information list, calibration virtual information list, quality-control product are associated with virtual information Relationship list, calibration object and virtual information incidence relation list, physical message make with virtual information incidence relation table and sample bit With state list.

It is instructed when the position that processor receives quality-control product is arranged, shows the position setting circle of quality-control product over the display Face；User is each quality-control product choosing in identifying from multiple Virtual Spaces that the corresponding Virtual Space drop-down menu of each quality-control product is shown Virtual Space mark is selected, and is that each quality-control product selection is virtual from multiple virtual locations mark that virtual location drop-down menu is shown Position, to realize the specified of sample bit, processor detects the Virtual Space mark and virtual location mark of user's selection, Corresponding incidence relation information is added in quality-control product and the incidence relation list of virtual location.

It instructs when the position that processor receives calibration object is arranged, is handled referring to above-mentioned treatment process.

It is instructed when processor receives Quality Control test application, shows test application interactive interface, Yong Hutong over the display The mark for the drop-down menu selection target Virtual Space that test application interactive interface is shown is crossed, and passes through test application interactive interface The input test time started in the testing time input frame of display determines the test after processor detects the test time started Apply the corresponding occupancy period, after processor detects the destination virtual space of user's selection, is closed from quality-control product and virtual location Join the sample for searching destination virtual space correlation in relation table, searches target from physical message and virtual information incidence relation table The associated sample rack in Virtual Space and sample bit, and these are successively searched in a predetermined sequence from sample bit use state table Sample bit applies for whether the corresponding occupancy period is occupied in test；If unoccupied, modified in sample bit use state table Corresponding information, and when testing time started arrival, control sample transport mechanism will be placed in the sample rack for being put into area and transport To sample position, the separate injection needle for controlling measuring means draws the sample placed on sample rack in sample position, and by the sample of absorption Originally be transferred in reaction vessel, separate injection needle also by agent transfer into the reaction vessel, control the photometric measurer of measuring means for The sample that reagent is mixed into reaction vessel carries out the test that shines.

The embodiment of the present application also provides a kind of method of sample analysis, when receiving position setting instruction, executes shown in Figure 14 The step of:

Interactive interface is arranged in step 1401, calling station；

The information that interactive interface is retrieved as the specified sample bit of sample, institute's rheme is arranged by the position in step 1402 Interactive interface is installed to be configured as that at least two samples is allowed to be designated the same sample bit；

The incidence relation of sample and specified sample bit is saved in memory by step 1303.

When receiving test application instruction, the measuring means is controlled on the sample bit of the test application information instruction The sample of placement is tested.

In one embodiment, the information of the sample bit includes the physical message of sample bit.

In one embodiment, the information of the corresponding test item of sample is saved in the memory, the method is also wrapped It includes:

In one embodiment, the information of the sample bit includes the virtual information of sample bit, the sample bit it is virtual Information includes the mark of the corresponding Virtual Space of sample support mechanism and sample bit belonging to sample bit in virtual sample space Corresponding virtual location mark.

In one embodiment, the method also includes:

Alternatively,

In one embodiment, memory also saves the use state of sample bit, and the use state of sample bit includes sample Position is occupied and sample bit is unoccupied, the method also includes:

The specific implementation of the application embodiment of the method is referred to the description of above-mentioned sample analysis apparatus embodiment, this Place repeats no more.

Although should be understood that flow chart provided by the embodiments of the present application in each step according to arrow instruction according to Secondary display, but these steps are not that the inevitable sequence according to arrow instruction successively executes.Unless having herein explicitly Bright, there is no stringent sequences to limit for the execution of these steps, these steps can execute in other order.Moreover, this reality At least part step applied in the flow chart of example offer may include multiple sub-steps or multiple stages, these sub-steps or Person's stage is not necessarily to execute completion in synchronization, but can execute at different times, these sub-steps or rank The execution sequence of section, which is also not necessarily, successively to be carried out, but can be with the sub-step or stage of other steps or other steps At least part execute in turn or alternately.

In one embodiment, a kind of computer readable storage medium is provided, computer program is stored thereon with, is calculated Machine program performs the steps of when being executed by processor

It is each that above-mentioned sample analysis apparatus may be implemented in the computer program of the application computer-readable recording medium storage The function of processor in embodiment.

Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with Relevant hardware is instructed to complete by computer program, the computer program can be stored in a non-volatile computer In read/write memory medium, the computer program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein, To any reference of memory, storage, database or other media used in each embodiment provided herein, Including non-volatile and/or volatile memory.Nonvolatile memory may include read-only memory (ROM), programming ROM (PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include Random access memory (RAM) or external cache.By way of illustration and not limitation, RAM is available in many forms, Such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhancing Type SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM) etc..

Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance Shield all should be considered as described in this specification.

The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art It says, without departing from the concept of this application, various modifications and improvements can be made, these belong to the protection of the application Range.Therefore, the scope of protection shall be subject to the appended claims for the application patent.

Claims

1. a kind of sample analysis apparatus, the equipment include:

Memory saves the information of the sample bit in sample support mechanism, and save sample and sample for saving the information of sample The incidence relation at one's own department or unit；

Processor, for when receiving position setting instruction, calling station to be arranged interactive interface, is arranged by the position and interacted Interface is retrieved as the information of the specified sample bit of sample, and the position setting interactive interface is configured as allowing at least two samples It is designated the same sample bit, the incidence relation of sample and specified sample bit is saved in the memory；It is also used to work as Test application instruction is received, controls the measuring means to the sample placed on the sample bit of the test application instruction instruction It is tested.

2. equipment according to claim 1, which is characterized in that the information of the sample bit includes the physics letter of sample bit Breath.

3. equipment according to claim 2, which is characterized in that the information of the sample includes the mark of sample, is executed logical When crossing the step for the information that the position setting interactive interface is retrieved as the specified sample bit of sample, the processor is used for:

By the position, the mark physical message input corresponding with the mark of the sample that interactive interface shows sample is set Control；The physical message of the specified sample bit of sample is retrieved as by the physical message input control.

4. equipment according to claim 2, it is characterised in that:

The memory is also used to: saving the information of the corresponding test item of sample；

The processor is also used to: obtaining the information of target detection project, selection and the target detection from the memory Sample bit of the associated sample bit of the corresponding sample of project as the test application instruction instruction.

5. equipment according to claim 4, which is characterized in that when executing the step for obtaining the information of target detection project, The processor is used for: being called test application interactive interface, is applied for that interactive interface shows selectable test by the test The information of project, and apply for that interactive interface obtains the information of the target detection project of selection by the test.

6. equipment according to claim 1, which is characterized in that the information of the sample bit includes the virtual letter of sample bit Breath, the virtual information of the sample bit includes the mark and sample of the corresponding Virtual Space of sample support mechanism belonging to sample bit Position corresponding virtual location mark in virtual sample space.

7. equipment according to claim 6, which is characterized in that the information of the sample includes the mark of sample, is executed logical When crossing the step for the information that the position setting interactive interface is retrieved as the specified sample bit of sample, the processor is used for:

By the position, the mark virtual information input corresponding with the mark of the sample that interactive interface shows sample is set Control；The virtual information of the specified sample bit of the sample is retrieved as by the virtual information input control.

8. equipment according to claim 6, which is characterized in that the processor is also used to: obtaining destination virtual space Mark, from selecting each sample corresponding with the associated virtual location mark of sample in the destination virtual space in the memory Sample bit of the position as the test application instruction instruction.

9. equipment according to claim 8, which is characterized in that when executing the step for obtaining the mark in destination virtual space, The processor is used for: calling test application interactive interface, it is selectable virtual to apply for that interactive interface is shown by the test The mark in space, and apply for that interactive interface obtains the mark in the destination virtual space of selection by the test.

10. equipment according to claim 6, which is characterized in that the processor is also used to: obtaining the void of target sample position Quasi- information selects the target sample position as the sample bit of the test application instruction instruction from the memory.

11. equipment according to claim 10, which is characterized in that the step of executing the virtual information for obtaining target sample position When, the processor is used for: test application interactive interface called, the selectable virtual information of interface display is applied for by test, And the virtual information of the target sample position of selection is obtained by test application interface.

12. described in any item equipment according to claim 1~11, which is characterized in that the memory is also used to: saving sample The use state of position, the use state of sample bit include that sample bit is occupied and sample bit is unoccupied；

The processor is used for: the use state of the sample bit of the test application instruction instruction is obtained from the memory； If the use state for the sample bit that the test application instruction indicates is sample unoccupied, that the test application instruction is indicated The use state at one's own department or unit be revised as it is occupied, and control the measuring means to it is described test application instruction instruction sample bit on Sample be measured, after the completion of measurement by it is described test application instruction instruction sample bit use state be revised as it is not occupied With.

13. equipment according to claim 12, which is characterized in that if the sample bit of the test application instruction instruction makes With state be it is occupied, the processor is used for:

Output conflict prompt information；And/or

Whether the use state for monitoring the sample bit of the test application instruction instruction at predetermined intervals is changed to not It is occupied；If change, output sample bit can refer to test application with prompt information and/or the control measuring means The sample on sample bit shown is measured.

14. described in any item equipment according to claim 1~11, which is characterized in that sample support mechanism is sample rack Or sample disk.

15. a kind of method of sample analysis characterized by comprising

When receiving position setting instruction, interactive interface is arranged in calling station, and interactive interface is arranged by the position and is retrieved as The information of the specified sample bit of sample, the position setting interactive interface are configured as at least two samples is allowed to be designated same The incidence relation of sample and specified sample bit is saved in memory by a sample bit；

When receiving test application instruction, controls and placed on the sample bit that the measuring means indicates the test application information Sample tested.

16. according to the method for claim 15, which is characterized in that the information of the sample bit includes the physics letter of sample bit Breath.

17. according to the method for claim 16, which is characterized in that save the corresponding test item of sample in the memory Information, the method also includes:

The information for obtaining target detection project selects the associated sample of sample corresponding with the target detection project from memory Sample bit of the one's own department or unit as the test application instruction instruction.

18. according to the method for claim 15, which is characterized in that the information of the sample bit includes the virtual letter of sample bit Breath, the virtual information of the sample bit includes the mark and sample of the corresponding Virtual Space of sample support mechanism belonging to sample bit Position corresponding virtual location mark in virtual sample space.

19. according to the method for claim 18, which is characterized in that the method also includes:

Obtain destination virtual space mark, from selected in the memory in the destination virtual space with the associated void of sample Sample bit of the quasi- corresponding each sample bit of station location marker as the test application instruction instruction；

Alternatively,

The virtual information for obtaining target sample position, selects the target sample position to apply as the test from the memory Instruct the sample bit of instruction.

20. 5~19 described in any item methods according to claim 1, which is characterized in that memory also saves the use of sample bit State, the use state of sample bit include that sample bit is occupied and sample bit is unoccupied, the method also includes:

The use state of the sample bit of the test application instruction instruction is obtained from the memory；If the test application refers to Enable the sample bit of instruction use state be it is unoccupied, the use state of sample bit of the test application instruction instruction is repaired Be changed to it is occupied, after the completion of measurement by it is described test application instruction instruction sample bit use state be revised as it is unoccupied.

21. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program The step of method described in any one of claim 15~20 is realized when being executed by processor.