CN110308337A - A kind of the non-contact optical measuring device and method of ferroelectric crystal coercive field - Google Patents

A kind of the non-contact optical measuring device and method of ferroelectric crystal coercive field Download PDF

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Publication number
CN110308337A
CN110308337A CN201910636469.7A CN201910636469A CN110308337A CN 110308337 A CN110308337 A CN 110308337A CN 201910636469 A CN201910636469 A CN 201910636469A CN 110308337 A CN110308337 A CN 110308337A
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ferroelectric crystal
coercive field
output
contact optical
laser
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Inventor
孙恩伟
郑华山
李凯
杨逸逍
李嘉明
杨彬
张锐
曹文武
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Harbin Institute of Technology
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Harbin Institute of Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878Sensors; antennas; probes; detectors
    • G01R29/0885Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

A kind of the non-contact optical measuring device and method of ferroelectric crystal coercive field, are related to the technical field of optical detection of material properties, in order to solve the problems, such as that existing ferroelectric crystal electric measurement method is influenced vulnerable to contact condition, space charge or defect charge.Temperature-controlled box is equipped with 2 light holes, ferroelectric crystal is located in temperature-controlled box, the continuous laser of laser output is incident to ferroelectric crystal by a light hole, the light of ferroelectric crystal transmission is incident to the photosurface of photodetector by another light hole, the input terminal of the output end connection digital oscilloscope of photodetector, the transmitted intensity input terminal of the transmitted intensity output end connection computer of digital oscilloscope;Alternating-current voltage source is used to apply alternating voltage for ferroelectric crystal;Computer is used to control the frequency and amplitude of alternating-current voltage source output voltage, is also used to calculate the electric field of application, and stores the electric field of application and the transmitted intensity of digital oscilloscope output.The present invention is suitable for measuring the coercive field of ferroelectric crystal.

Description

A kind of the non-contact optical measuring device and method of ferroelectric crystal coercive field
Technical field
The present invention relates to the technical field of optical detection of material properties, and in particular to ferroelectric crystal coercive field it is contactless Optical measuring technique.
Background technique
Ferroelectric crystal is a kind of multifunctional material, has excellent dielectric, piezoelectricity, electric light, Preset grating and acoustic properties, The fields such as ferroelectric memory, large value capacitor, piezoelectric transducer, electrooptic modulator and ultrasonic transducer have important application. The excellent macroscopic property of ferroelectric crystal and its microcosmic domain structure are closely related.Ferroelectric domain is that spontaneous polarization is identical inside ferroelectric crystal Region, the microstructure that domain structure is made of the electricdomain of different orientation, so, understand ferroelectric domain characteristic be explore ferroelectricity Crystal macroscopic property source and later period are modified the important prerequisite of design.The characteristic of ferroelectric domain, can be from static and dynamic two Aspect measures.The measurement method of the static characteristic on farmland is more at present, for example, petrographic microscope, scanning electron microscope, thoroughly Penetrate electron microscope and piezoelectricity force microscope etc., wherein petrographic microscope have micrometer resolution, scanning electron microscope and Piezoelectricity force microscope etc. has hundred nano-scale resolution ratio, and transmission electron microscope has nanometer resolution.These belong to iron The static measurement means of electricdomain.
About the dynamic measurement method of ferroelectric domain, currently used is that the ferroelectric hysteresis loop based on Sawyer-Tower circuit is surveyed Examination method, to determine the coercive field of electricdomain overturning inside ferroelectric crystal.This method is convenient with sample preparation, it is simple etc. excellent to test Point, but exist simultaneously several disadvantages.Disadvantage first is that Sawyer-Tower circuit test method is a kind of contact electrical measurement side Method, the contact condition between test fixture and sample electrode have certain influence to the test result of coercive field;Disadvantage second is that this It is a kind of charge acquisition formula test method, the space charge unrelated with ferroelectricity periodical poling or defect charge also can be to the surveys of coercive field Test result has an impact, especially the more sample of internal flaw, there is a large amount of non-bound charge in sample, can to measure As a result insincere, generate so-called " electric leakage " the phenomenon that occur;Disadvantage third is that when high temperature or low-frequency test, due to high temperature or low frequency The migration of lower defect charge aggravates, and can measuring result error is further amplified.
Summary of the invention
The purpose of the present invention is to solve existing ferroelectric crystal electric measurement method vulnerable to contact condition, space charge or The problem of defect charge influences, to provide the non-contact optical measuring device and method of a kind of ferroelectric crystal coercive field.
A kind of non-contact optical measuring device of ferroelectric crystal coercive field of the present invention, including alternating-current voltage source 1, Temperature-controlled box 2, laser 3, photodetector 4, digital oscilloscope 5 and computer 6;
Temperature-controlled box 2 is equipped with 2 light hole 2-1, and ferroelectric crystal 7 is located in temperature-controlled box 2, the continuous laser that laser 3 exports It is incident to ferroelectric crystal 7 by a light hole 2-1, the light that ferroelectric crystal 7 transmits is incident to light by another light hole 2-1 The photosurface of electric explorer 4, photodetector 4 output end connection digital oscilloscope 5 input terminal, digital oscilloscope 5 it is saturating Penetrate the transmitted intensity input terminal of luminous intensity output end connection computer 6;
Alternating-current voltage source 1 is used to apply alternating voltage for ferroelectric crystal 7;
Computer 6 is used to control the frequency and amplitude of 1 output voltage of alternating-current voltage source, is also used to calculate the electric field of application, And store the electric field of application and the transmitted intensity of the output of digital oscilloscope 5.
Preferably, the size of ferroelectric crystal 7 is greater than 2mm × 2mm × 0.5mm.
It preferably, further include reflecting mirror 8;
The continuous laser that laser 3 exports reflexes to ferroelectric crystal 7 through reflecting mirror 8.
It preferably, further include attenuator 9;
The continuous laser that laser 3 exports is incident to ferroelectric crystal 7 after 9 power attenuation of attenuator.
It preferably, further include the first convex lens 10;
First convex lens 10 focuses on continuous laser inside ferroelectric crystal 7.
It preferably, further include the second convex lens 11;
The light that ferroelectric crystal 7 transmits is focused on the photosurface of photodetector 4 by the second convex lens 11.
A kind of non-contact optical measurement method of ferroelectric crystal coercive field of the present invention, this method comprises:
Step 1: alternating-current voltage source 1 is that ferroelectric crystal 7 applies alternating voltage, the continuous laser that laser 3 exports is incident to Ferroelectric crystal 7, computer 6 store the transmitted intensity that the electric field applied and digital oscilloscope 5 export;
Step 2: being ordinate by abscissa, normalized transmitted intensity of the electric field of application, by ordinate data pair Transverse and longitudinal coordinate data seek first derivative and take absolute value, and maximum absolute value is worth the coercive field that corresponding electric field is ferroelectric crystal 7;
This method is realized based on a kind of non-contact optical measuring device of ferroelectric crystal coercive field.
Preferably, this method further include: crystallography orientation is carried out to ferroelectric crystal to be measured before step 1, is then pressed Crystallographic direction is cut, then successively carries out the ferroelectric crystal 7 met the requirements by electrode and polishing treatment.
Compared to electrical detection method, optical detecting method has the advantages that non-contacting.Since optical wavelength only has hundred nanometers Scale, when light wave is by ferroelectric crystal with domain structure, it may occur that the scattering phenomenon of light causes to be emitted from ferroelectric crystal Luminous intensity is different from incident luminous intensity.Based on light scattering principle, when ferroelectric crystal is placed in the electric field of variation, electric field can draw The state for playing farmland changes, so as to change scattering process of the electricdomain to light, when electric field reaches the coercive field of ferroelectric crystal When, a large amount of farmland is begun turning, and at this moment light scattering effect is most obvious, can lead to the luminous intensity being emitted from ferroelectric crystal and occurs significantly Change, the electric field at catastrophe point is exactly the coercive field of ferroelectric crystal.The great advantage of this non-contact method is can to eliminate Influence of the movement of space charge inside ferroelectric crystal to measurement result, to obtain the coercive of true reflection ferroelectric domain overturning ?.
Light caused by the present invention is overturn with different application electric field stage farmlands, which scatters different methods, realizes ferroelectric crystal The contactless accurate detection of coercive field.The detection method can also obtain the coercive field of the ferroelectric crystal under different temperatures, with Just research coercive field variation with temperature rule.The present invention is suitable for measuring the coercive field of all transparent ferroelectric crystals.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the external electric field excitation system in specific embodiment;
Fig. 2 is the structural schematic diagram of the Systems for optical inspection in specific embodiment;
Fig. 3 is a kind of structural schematic diagram of the non-contact optical measuring device of ferroelectric crystal coercive field of the invention;
Fig. 4 is that the PMN-0.33PT relaxor ferroelectric crystal of embodiment [001] orientation is saturating in the case where applying dispatch from foreign news agency field excitation Penetrate the normalized value of luminous intensity;
Fig. 5 is PMN-0.33PT relaxor ferroelectric crystal the returning in the case where applying dispatch from foreign news agency field excitation of embodiment [001] orientation One transmitted intensity changed is to the absolute value for applying external electric field first derivative.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, those of ordinary skill in the art without creative labor it is obtained it is all its His embodiment, shall fall within the protection scope of the present invention.
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase Mutually combination.
The present invention will be further explained below with reference to the attached drawings and specific examples, but not as the limitation of the invention.
A kind of non-contact optical measuring device of ferroelectric crystal coercive field of present embodiment, including dispatch from foreign news agency field excitation system System and Systems for optical inspection;
External electric field excitation system: program control high voltage power supply (1 volt of precision), high-tension bus-bar, gpib bus, (the band light passing of temperature-controlled box 2 Hole), ferroelectric crystal 7 and computer 6.Alternating-current voltage source 1 is realized using program control high voltage power supply.Wherein, program control high voltage power supply passes through Gpib bus is connect with computer 6, and the output control for realizing the alternating voltage of different frequency and amplitude is programmed by Labview System.Ferroelectric crystal 7 is fixed in the temperature-controlled box 2 with light hole, germ nucleus is aligned with light hole center, and specific device is as schemed Shown in 1.
Systems for optical inspection:
Including He-Ne laser, attenuator 9, reflecting mirror 8, the first convex lens 10, the second convex lens 11, photodetector 4, Digital oscilloscope 5 and computer 6.First with the continuous laser that He-Ne laser output power is 50mW, wavelength is 633nm.When Laser output power is higher, and the luminous intensity being incident on crystal is reduced using attenuator 9.In the lesser sample of test size When, the method for the spot diameter for taking reduction to be irradiated in wafer surface issues laser using the first convex lens 10 Directional light is focused, so that the light beam through the first convex lens 10 is focused in crystals.From the light of another surface transmission of crystal Enter photodetector after the convergence of the second convex lens 11, photodetector is connected with digital oscilloscope to detect and to acquire Signal completes being automatically stored for data by computer 6, and Systems for optical inspection builds completion, and specific index path is as shown in Figure 2.
A kind of non-contact optical measurement method of ferroelectric crystal coercive field described in present embodiment, this method comprises:
Step 1: using X-ray diffractometer to ferroelectric crystal to be measured carry out crystallography orientation, then by crystallographic direction into Row cutting, obtains crystal to be measured, it is desirable that crystalline size is greater than 2mm × 2mm × 0.5mm, and wherein 2mm thickness direction is ferroelectric crystal Apply the direction of alternating electric field, 0.5mm thickness direction is the direction that laser passes through.Crystal distinguished by after Electrode treatment Wafer surface is processed by shot blasting using 9 μm, 3 μm of grounds travel and 0.5 μm of diamond polishing liquid, keeps plane of crystal complete Meet the needs of Experiments of Optics, obtains ferroelectric crystal 7.The too small electrode area that will lead to of crystalline size is small, not easy to handle therefore right Crystal minimum dimension requires;The direction that the direction for using crystal most thin passes through for laser is conducive to improve light transmittance.
Step 2: alternating-current voltage source 1 is that ferroelectric crystal 7 applies alternating voltage, the continuous laser that laser 3 exports is incident to Ferroelectric crystal 7, computer 6 store the electric field applied, at the same time, acquire the electric signal shown on digital oscilloscope 5 and record The size of electric signal;
Step 3: being ordinate by abscissa, normalized transmitted intensity of the electric field of application, as shown in Figure 4.It will indulge Coordinate data seeks first derivative to transverse and longitudinal coordinate data and takes absolute value, as shown in figure 5, becoming in the highest point corresponding diagram 4 in Fig. 5 Change violent position, electric field herein is the coercive field of ferroelectric crystal 7;
This method is realized based on a kind of non-contact optical measuring device of ferroelectric crystal coercive field.
Embodiment:
A kind of non-contact optical measurement method of ferroelectric crystal coercive field, this method comprises:
Step 1: using X-ray diffractometer to 0.67Pb (Mg1/3Nb2/3)O3-0.33PbTiO3(referred to as PMN- 0.33PT) ferroelectric crystal carries out crystallography orientation, is then cut by crystallographic direction, and the crystal of [001] orientation is obtained, brilliant Body is having a size of 2mm × 3mm × 1mm, and wherein 2mm thickness direction is the direction that ferroelectric crystal applies alternating electric field, 1mm thickness direction The direction passed through for laser.Crystal is carried out by after Electrode treatment, respectively using 9 μm, 3 μm of grounds travel and 0.5 μm of Buddha's warrior attendant Stone polishing fluid is processed by shot blasting wafer surface, so that wafer surface is fully met the demand of Experiments of Optics, obtains ferroelectric crystal 7。
Step 2: computer control alternating voltage output frequency is 0.005Hz, alternating-current voltage source 1 is the application of ferroelectric crystal 7 Alternating voltage, the continuous laser that laser 3 exports are incident to ferroelectric crystal 7, and computer 6 stores the electric field applied, at the same time, Acquire the electric signal shown on digital oscilloscope 5 and the size for recording electric signal;
Step 3: being ordinate by abscissa, normalized transmitted intensity of the electric field of application, Fig. 4 is [001] orientation Transmitted intensity of the PMN-0.33PT relaxor ferroelectric crystal in the case where applying dispatch from foreign news agency field excitation normalized value, be oriented to the right side in figure Arrow correspond to the curve that electric field gradually rises, be oriented to left arrow and correspond to the curve that electric field gradually decreases.Electric field is increased Ordinate data in the process seek first derivative to abscissa data and take absolute value, and Fig. 5 is the PMN-0.33PT of [001] orientation Normalized transmitted intensity of the relaxor ferroelectric crystal in the case where applying dispatch from foreign news agency field excitation is absolute to application external electric field first derivative Value.The corresponding electric field in highest point in Fig. 5 is 180V/mm, changes most violent position in corresponding diagram 4, this electric field is PMN- The coercive field E of 0.33PT ferroelectricity chipc
This method is realized based on a kind of non-contact optical measuring device of ferroelectric crystal coercive field.

Claims (8)

1. a kind of non-contact optical measuring device of ferroelectric crystal coercive field, which is characterized in that including alternating-current voltage source (1), Temperature-controlled box (2), laser (3), photodetector (4), digital oscilloscope (5) and computer (6);
Temperature-controlled box (2) is equipped with 2 light holes (2-1), and ferroelectric crystal (7) is located in temperature-controlled box (2), the company of laser (3) output Continuous laser is incident to ferroelectric crystal (7) by a light hole (2-1), and the light of ferroelectric crystal (7) transmission passes through another light passing Hole (2-1) is incident to the photosurface of photodetector (4), and the output end of photodetector (4) connects the defeated of digital oscilloscope (5) Enter end, the transmitted intensity input terminal of transmitted intensity output end connection computer (6) of digital oscilloscope (5);
Alternating-current voltage source (1) is used to apply alternating voltage for ferroelectric crystal (7);
Computer (6) is used to control the frequency and amplitude of alternating-current voltage source (1) output voltage, is also used to calculate the electric field of application, And store the electric field of application and the transmitted intensity of digital oscilloscope (5) output.
2. a kind of non-contact optical measuring device of ferroelectric crystal coercive field according to claim 1, which is characterized in that The size of the ferroelectric crystal (7) is greater than 2mm × 2mm × 0.5mm.
3. a kind of non-contact optical measuring device of ferroelectric crystal coercive field according to claim 1, which is characterized in that It further include reflecting mirror (8);
The continuous laser of laser (3) output reflexes to ferroelectric crystal (7) through reflecting mirror (8).
4. a kind of non-contact optical measuring device of ferroelectric crystal coercive field according to claim 1, which is characterized in that It further include attenuator (9);
The continuous laser of laser (3) output is incident to ferroelectric crystal (7) after attenuator (9) power attenuation.
5. a kind of non-contact optical measuring device of ferroelectric crystal coercive field according to claim 1, which is characterized in that It further include the first convex lens (10);
It is internal that first convex lens (10) makes continuous laser focus on ferroelectric crystal (7).
6. a kind of non-contact optical measuring device of ferroelectric crystal coercive field according to claim 1, which is characterized in that It further include the second convex lens (11);
The light that ferroelectric crystal (7) transmits is focused on the photosurface of photodetector (4) by the second convex lens (11).
7. a kind of non-contact optical measurement method of ferroelectric crystal coercive field, which is characterized in that this method comprises:
Step 1: alternating-current voltage source (1) is that ferroelectric crystal (7) apply alternating voltage, the continuous laser of laser (3) output is incident To ferroelectric crystal (7), the transmitted intensity of electric field and digital oscilloscope (5) output that computer (6) storage applies;
Step 2: being ordinate by abscissa, normalized transmitted intensity of the electric field of application, by ordinate data to transverse and longitudinal Coordinate data seeks first derivative and takes absolute value, and the corresponding electric field of maximum absolute value value is the coercive field of ferroelectric crystal (7);
This method is measured based on a kind of non-contact optical of ferroelectric crystal coercive field described in above-mentioned any one claim Device is realized.
8. a kind of non-contact optical measurement method of ferroelectric crystal coercive field according to claim 7, which is characterized in that This method further include: crystallography orientation is carried out to ferroelectric crystal to be measured before step 1, is then cut by crystallographic direction It cuts, then successively carries out the ferroelectric crystal (7) met the requirements by electrode and polishing treatment.
CN201910636469.7A 2019-07-15 2019-07-15 A kind of the non-contact optical measuring device and method of ferroelectric crystal coercive field Pending CN110308337A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113092824A (en) * 2020-05-05 2021-07-09 台湾积体电路制造股份有限公司 Method for detecting ferroelectric signals and piezoelectric force microscope device
CN113176455A (en) * 2021-04-23 2021-07-27 西安交通大学 Device and method for measuring piezoelectric performance parameters of ferroelectric crystal under strong electric field

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11108976A (en) * 1997-10-08 1999-04-23 Nikon Corp Permittivity measuring apparatus
US20030102441A1 (en) * 2001-11-30 2003-06-05 Gil Rosenman Tailoring domain engineered structures in ferroelectric materials
CN1629645A (en) * 2003-12-19 2005-06-22 中国科学院声学研究所 Method and system for measuring coercive field strength of ferroelectrics
CN101158712A (en) * 2007-09-17 2008-04-09 西安交通大学 Measurement mechanism and measurement method of ferroelectric materials electric hysteresis loop wire
CN105137125A (en) * 2015-08-31 2015-12-09 电子科技大学 Double-frequency multichannel synchronization detection method for electric domain imaging
CN105353088A (en) * 2015-11-12 2016-02-24 湖北大学 Electrically controlled light scattering material and device time-domain response characteristic testing method
CN108593563A (en) * 2018-05-15 2018-09-28 中国科学院福建物质结构研究所 Optical material test method and optic analytical instrument used
CN108982412A (en) * 2018-08-08 2018-12-11 中国科学院福建物质结构研究所 A kind of instrument for domain structure real-time detection during Crystal polarization
CN208384030U (en) * 2018-07-30 2019-01-15 厦门大学 A kind of voltage-drop loading and ferroelectric properties test macro suitable for in-situ test

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11108976A (en) * 1997-10-08 1999-04-23 Nikon Corp Permittivity measuring apparatus
US20030102441A1 (en) * 2001-11-30 2003-06-05 Gil Rosenman Tailoring domain engineered structures in ferroelectric materials
CN1629645A (en) * 2003-12-19 2005-06-22 中国科学院声学研究所 Method and system for measuring coercive field strength of ferroelectrics
CN101158712A (en) * 2007-09-17 2008-04-09 西安交通大学 Measurement mechanism and measurement method of ferroelectric materials electric hysteresis loop wire
CN105137125A (en) * 2015-08-31 2015-12-09 电子科技大学 Double-frequency multichannel synchronization detection method for electric domain imaging
CN105353088A (en) * 2015-11-12 2016-02-24 湖北大学 Electrically controlled light scattering material and device time-domain response characteristic testing method
CN108593563A (en) * 2018-05-15 2018-09-28 中国科学院福建物质结构研究所 Optical material test method and optic analytical instrument used
CN208384030U (en) * 2018-07-30 2019-01-15 厦门大学 A kind of voltage-drop loading and ferroelectric properties test macro suitable for in-situ test
CN108982412A (en) * 2018-08-08 2018-12-11 中国科学院福建物质结构研究所 A kind of instrument for domain structure real-time detection during Crystal polarization

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113092824A (en) * 2020-05-05 2021-07-09 台湾积体电路制造股份有限公司 Method for detecting ferroelectric signals and piezoelectric force microscope device
CN113176455A (en) * 2021-04-23 2021-07-27 西安交通大学 Device and method for measuring piezoelectric performance parameters of ferroelectric crystal under strong electric field

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