CN110288933B - Method and device for detecting electroluminescent array substrate - Google Patents
Method and device for detecting electroluminescent array substrate Download PDFInfo
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- CN110288933B CN110288933B CN201910553348.6A CN201910553348A CN110288933B CN 110288933 B CN110288933 B CN 110288933B CN 201910553348 A CN201910553348 A CN 201910553348A CN 110288933 B CN110288933 B CN 110288933B
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Abstract
The invention discloses a method and a device for detecting an electroluminescent array substrate, wherein the driving transistor of a pixel driving circuit in each sub-pixel is controlled to work in a linear region, namely the driving transistor forms a lead wire to directly conduct an anode and a first power supply signal end, so that the voltage on the anode can be stabilized to be the voltage of the first power supply signal end, and the interference of the drift of the threshold voltage Vth of the driving transistor on the voltage on the anode can be avoided. And, through illuminating the electroluminescent array substrate, can obtain the first detection numerical value that each sub-pixel corresponds. Because the light intensity that passes electroluminescence array substrate is different when there is impurity such as greasy dirt, granule on the positive pole with when there is not impurity such as greasy dirt, granule on the positive pole, makes first detection numerical value also can be different like this, consequently at least according to the first detection numerical value that each subpixel corresponds, can determine whether electroluminescence array substrate exists badly to detect out badly.
Description
Technical Field
The invention relates to the technical field of display, in particular to a method and a device for detecting an electroluminescent array substrate.
Background
Electroluminescent Diodes such as Organic Light Emitting Diodes (OLEDs) and Quantum Dot Light Emitting Diodes (QLEDs) have the advantages of self-luminescence and low energy consumption, and are widely used in the display field.
As shown in fig. 1, the electroluminescent display panel may include an electroluminescent array substrate. The electroluminescent array substrate may include: a substrate 100 and a plurality of sub-pixels 110 on the substrate 100. The sub-pixel 110 includes an electroluminescent diode 111 and a pixel driving circuit 112 for driving the electroluminescent diode to emit light. Here, the electroluminescent diode 111 includes an anode 01, a light-emitting layer 02, and a cathode 03, which are stacked. In the process of manufacturing the electroluminescent array substrate, the electroluminescent diode 111 is generally formed by forming the pixel driving circuit 112 on the substrate 100, then forming the insulating layer 120 on the pixel driving circuit 112, and then sequentially forming the anode 01, the light-emitting layer 02, and the cathode 03 on the insulating layer 120.
However, due to the limitation of the process conditions, when impurities such as oil stains and particles are generated on the anode 01 at different positions during the preparation of the anode 01, the electroluminescence array substrate may have an optical defect of non-uniform display during the lighting test of the electroluminescence array substrate. Therefore, how to detect the optical defect problem of the electroluminescent array substrate is a technical problem to be solved urgently by those skilled in the art.
Disclosure of Invention
The embodiment of the invention provides a method and a device for detecting an electroluminescent array substrate, which are used for detecting the problem of poor optics of the electroluminescent array substrate.
The embodiment of the invention provides a detection method of an electroluminescent array substrate, wherein the electroluminescent array substrate comprises the following steps: a substrate base plate, a plurality of sub-pixels located on the substrate base plate, each of the sub-pixels including: the pixel driving circuit comprises an insulating layer and an anode, wherein the insulating layer is positioned on one side, away from the substrate, of the pixel driving circuit;
the detection method comprises the following steps:
controlling a driving transistor of a pixel driving circuit in each sub-pixel to work in a linear region;
controlling a light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into first detection values corresponding to the sub-pixels;
and determining whether the electroluminescent array substrate is poor or not at least according to the first detection value corresponding to each sub-pixel.
Optionally, in an embodiment of the present invention, the determining whether the electroluminescent array substrate is defective according to at least the first detection value corresponding to each of the sub-pixels includes:
determining a first difference value between a first detection value corresponding to each sub-pixel and a preset detection value;
and when at least one first difference value does not meet a first difference value threshold value, determining that the electroluminescent array substrate has optical defects.
Optionally, in an embodiment of the present invention, the controlling the driving transistor of the pixel driving circuit in each sub-pixel to operate in a linear region includes:
sequentially driving each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a first voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
Alternatively, in the embodiment of the present invention, the driving transistor of the pixel driving circuit in each of the sub-pixels is controlled to operate in a linear region; controlling a light source to illuminate the electroluminescent array substrate, collecting light transmitted through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal to a first detection value corresponding to each sub-pixel, and before or after the first detection value, further comprising:
controlling the driving transistor in each sub-pixel to work in a saturation area;
illuminating the electroluminescent array substrate by using the light source, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a second detection value corresponding to each sub-pixel;
determining whether the electroluminescent array substrate is defective or not at least according to the first detection value corresponding to each sub-pixel, including:
and determining whether the electroluminescent array substrate has electrical defects according to the first detection value and the second detection value corresponding to each sub-pixel.
Optionally, in an embodiment of the present invention, the determining whether the electroluminescent array substrate has an electrical defect according to the first detection value and the second detection value corresponding to each sub-pixel includes:
determining a second difference value between a first detection value and a second detection value corresponding to the same sub-pixel for each sub-pixel;
and when at least one second difference value does not meet a second difference value threshold value, determining that the electroluminescent array substrate has electrical defects.
Optionally, in an embodiment of the present invention, the controlling the driving transistor of the pixel driving circuit in each sub-pixel to operate in a saturation region includes:
sequentially driving each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a second voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
The embodiment of the invention also provides a detection device of the electroluminescent array substrate, wherein the electroluminescent array substrate comprises: a substrate base plate, a plurality of sub-pixels located on the substrate base plate, each of the sub-pixels including: the pixel driving circuit comprises an insulating layer and an anode, wherein the insulating layer is positioned on one side, away from the substrate, of the pixel driving circuit;
the detection device includes:
a light source;
the driving unit is used for controlling the driving transistor of the pixel driving circuit in each sub-pixel to work in a linear region;
the collecting unit is used for controlling a light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into first detection values corresponding to the sub-pixels;
and the determining unit is used for determining whether the electroluminescent array substrate has defects or not at least according to the first detection value corresponding to each sub-pixel.
Optionally, in an embodiment of the present invention, the first determining unit is configured to determine a first difference between a first detection value corresponding to each sub-pixel and a preset detection value; and when at least one first difference value does not meet a first difference value threshold value, determining that the electroluminescent array substrate has optical defects.
Optionally, in an embodiment of the present invention, the driving unit is configured to sequentially drive each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a first voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
Optionally, in an embodiment of the present invention, the driving unit is further configured to control the driving transistor in each sub-pixel to operate in a saturation region;
the collecting unit is further used for illuminating the electroluminescent array substrate by adopting the light source, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into second detection values corresponding to the sub-pixels;
the determining unit is used for determining whether the electroluminescent array substrate has electrical defects according to the first detection value and the second detection value corresponding to each sub-pixel.
Optionally, in an embodiment of the present invention, the determining unit is configured to determine, for each sub-pixel, a second difference between a first detection value and a second detection value corresponding to the same sub-pixel; and when at least one second difference value does not meet a second difference value threshold value, determining that the electroluminescent array substrate has poor electricity.
Optionally, in an embodiment of the present invention, the driving unit is configured to sequentially drive each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a second voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
The invention has the following beneficial effects:
according to the detection method and device of the electroluminescent array substrate provided by the embodiment of the invention, the drive transistor of the pixel drive circuit in each sub-pixel is controlled to work in a linear region, namely the drive transistor forms a lead so as to directly conduct the anode and the first power supply signal end, so that the voltage on the anode can be stabilized to be the voltage of the first power supply signal end, and the interference of the drift of the threshold voltage Vth of the drive transistor on the voltage on the anode can be further avoided. And, through illuminating the electroluminescent array substrate, can obtain the first detection numerical value that each sub-pixel corresponds. Because the light intensity that passes electroluminescence array substrate is different when there is impurity such as greasy dirt, granule on the positive pole and when there is not impurity such as greasy dirt, granule on the positive pole, makes first detection numerical value also can be different like this, consequently at least according to the first detection numerical value that each sub-pixel corresponds, can confirm whether electroluminescence array substrate exists badly to detect out badly.
Drawings
FIG. 1 is a schematic diagram of an electroluminescent array substrate according to the related art;
fig. 2 is a schematic structural diagram of a pixel driving circuit according to an embodiment of the invention;
fig. 3 is a schematic structural diagram of an electroluminescent array substrate according to an embodiment of the present invention;
FIG. 4 is a flow chart of a detection method in an embodiment of the invention;
FIG. 5 is a timing diagram of a circuit according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a detection apparatus according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the drawings of the embodiments of the present invention. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments. And the embodiments and features of the embodiments may be combined with each other without conflict. All other embodiments, which can be derived by a person skilled in the art from the described embodiments of the invention without inventive step, are within the scope of protection of the invention.
Unless defined otherwise, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this invention belongs. The use of "first," "second," and similar terms in the present application do not denote any order, quantity, or importance, but rather the terms are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect.
It should be noted that the sizes and shapes of the figures in the drawings are not to be considered true scale, but are merely intended to schematically illustrate the present invention. And the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout.
As shown in fig. 2, the general pixel driving circuit 112 may include: a driving transistor T1, a switching transistor T2, a storage capacitor Cst, and a detection transistor T3. When the electroluminescent diode L is driven to emit light, the second scanning signal terminal S2 controls the detection transistor T3 to be turned off, the first scanning signal terminal S1 controls the switching transistor T2 to be turned on to write the Data signal of the Data signal terminal Data into the gate of the driving transistor T1, and controls the driving transistor T1 to be in a saturation region, so that the driving transistor T1 generates a working current from the first power signal terminal VDD to the anode of the electroluminescent diode L, and the working current flows into the anode of the electroluminescent diode L to drive the electroluminescent diode L to emit light. However, due to process limitations, the threshold voltage Vth of the driving transistor T1 at different positions may shift, so that the operating current generated when the driving transistor at different positions operates in the saturation region is not uniform, and the display luminance difference may be caused.
In order to ensure the display quality, when the electroluminescent array substrate is applied to a display panel, the threshold voltage Vth of the driving transistor may be compensated by external compensation. For example, when a row of sub-pixels in the display panel is compensated, the pixel circuit in each sub-pixel in the row is controlled to charge the detection terminal SL, and then the voltage of each detection terminal is detected, and compensation calculation is performed according to the detected voltage, so as to obtain the numerical voltage for display corresponding to each sub-pixel in the row.
It should be noted that, when the driving transistor is operated in the saturation region, the driving transistor can generate an operating current for driving the electroluminescent diode, and it is not equivalent to a conductive wire directly connecting the anode to the first power signal terminal VDD. When the driving transistor operates in the linear region, it can be equivalent to form a conductive line to directly connect the anode with the first power signal terminal VDD.
The electroluminescent array substrate provided by the embodiment of the invention is a structure which is formed after a pixel driving circuit, an insulating layer and an anode are sequentially prepared on a substrate and before a light-emitting layer is prepared. As shown in fig. 3, the electroluminescent array substrate may include: a substrate 100, a plurality of sub-pixels 110 located on the substrate 100, each sub-pixel 110 may include: a pixel driving circuit 112, an insulating layer 120 on a side of the pixel driving circuit 112 facing away from the substrate 100, and an anode 01 on a side of the insulating layer 120 facing away from the substrate 100.
As shown in fig. 4, the method for detecting an electroluminescent array substrate according to an embodiment of the present invention may include the following steps:
s10, controlling a driving transistor of a pixel driving circuit in each sub-pixel to work in a linear region;
s20, controlling a light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into first detection values corresponding to the sub-pixels;
and S20, determining whether the electroluminescent array substrate is poor or not at least according to the first detection value corresponding to each sub-pixel.
In the detection method of the electroluminescent array substrate provided by the embodiment of the invention, the drive transistor of the pixel drive circuit in each sub-pixel is controlled to work in a linear region, which is equivalent to that the drive transistor forms a wire to directly conduct the anode and the first power supply signal end, so that the voltage on the anode can be stabilized as the voltage of the first power supply signal end, and the interference of the drift of the threshold voltage Vth of the drive transistor on the voltage on the anode can be further avoided. And, through illuminating the electroluminescent array substrate, can obtain the first detection numerical value that each sub-pixel corresponds. Because the light intensity that passes electroluminescence array substrate is different when there is impurity such as greasy dirt, granule on the positive pole and when there is not impurity such as greasy dirt, granule on the positive pole, makes first detection numerical value also can be different like this, consequently at least according to the first detection numerical value that each sub-pixel corresponds, can confirm whether electroluminescence array substrate exists badly to detect out badly.
In a specific implementation, in an embodiment of the present invention, determining whether the electroluminescent array substrate is defective at least according to the first detection value corresponding to each sub-pixel may include:
determining a first difference value between a first detection value corresponding to each sub-pixel and a preset detection value;
and when the at least one first difference value does not meet the first difference value threshold value, determining that the electroluminescence array substrate has optical defects.
In specific implementation, when no impurities such as oil stains and particles exist on the anode, and the electroluminescent array substrate is irradiated by the light source, the light penetrating through the electroluminescent array substrate is collected, the collected light signal is converted into a corresponding preset value, and the preset value can be used as a preset detection value. Of course, the converted preset value may be combined with the error allowable range, so as to use the combined value as the preset detection value. And, the preset value may be obtained after a plurality of tests. Of course, in practical applications, the preset value may be determined according to the design of the actually produced electroluminescent array substrate, and is not limited herein.
In particular implementation, the first difference threshold may be 0 ± Δ Y1. Where Δ Y1 is the maximum value of the error allowable range. Thus, when at least one first difference value does not meet the first difference value threshold value, the electroluminescent array substrate can be determined to have optical defects. And when all the first difference values meet the first difference value threshold value, determining that the electroluminescent array substrate has no optical defects.
In the process preparation, the threshold voltage Vth of the driving transistor at different positions may be different, thereby causing the electroluminescent array substrate to have poor electrical property. In order to detect whether the electroluminescent array substrate has electrical defects, in the embodiment of the invention, the driving transistor of the pixel driving circuit in each sub-pixel is controlled to work in a linear region; before controlling the light source to illuminate the electroluminescent array substrate, collecting light passing through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a first detection value corresponding to each sub-pixel, the method may further include:
controlling the driving transistor in each sub-pixel to work in a saturation region;
and controlling the light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a second detection numerical value corresponding to each sub-pixel.
Or, the driving transistor of the pixel driving circuit in each sub-pixel is controlled to work in a linear region; after controlling the light source to illuminate the electroluminescent array substrate, collecting light transmitted through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a first detection value corresponding to each sub-pixel, the method may further include:
controlling the driving transistor in each sub-pixel to work in a saturation region;
and controlling the light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a second detection numerical value corresponding to each sub-pixel.
In an embodiment of the present invention, determining whether there is a defect in the electroluminescent array substrate according to at least the first detection value corresponding to each sub-pixel may include:
and determining whether the electroluminescent array substrate has electrical defects according to the first detection value and the second detection value corresponding to each sub-pixel.
In particular, since the driving transistor operates in the saturation region, a voltage charged by the operating current generated by the driving transistor, which is related to Vth, exists at the anode. For a certain sub-pixel, if there is an impurity such as oil stain or particles on the anode in the sub-pixel, the second detection value corresponding to the sub-pixel is related to both Vth and the impurity such as oil stain or particles. If there is no oil stain, particle, or other impurity on the anode in the sub-pixel, the second detected value corresponding to the sub-pixel is correlated to Vth. Therefore, whether the electroluminescent array substrate has electrical defects or not can be determined through the first detection value and the second detection value corresponding to each sub-pixel.
In a specific implementation, in the embodiment of the present invention, determining whether there is an electrical defect in the electroluminescent array substrate according to the first detection value and the second detection value corresponding to each sub-pixel may include:
determining a second difference value between the first detection value and the second detection value corresponding to the same sub-pixel aiming at each sub-pixel;
and when the at least one second difference value does not meet the second difference value threshold value, determining that the electroluminescent array substrate has poor electricity.
In a specific implementation, the second difference threshold may be set to 0 ± Δ Y2. Where Δ Y2 is the maximum value of the error allowable range. Thus, when the at least one second difference does not satisfy the second difference threshold, it can be determined that the electroluminescent array substrate is electrically defective. And when all the second difference values meet the second difference value threshold value, determining that no electrical defect exists in the electroluminescent array substrate.
For a sub-pixel, if the sub-pixel has both optical defect and electrical defect, the first detection value corresponding to the sub-pixel is related to the optical defect, and the second detection value is related to both the optical defect and the electrical defect, so that the second difference is related to the electrical defect. If the sub-pixel has only optical defect, the first detection value corresponding to the sub-pixel is related to the optical defect, and the second detection value is related to the optical defect but not to the electrical defect, so that the second difference is not related to the electrical defect. If the sub-pixel only has electrical defect, the first detection value corresponding to the sub-pixel is not related to optical defect and electrical defect, and the second detection value is related to electrical defect, so that the second difference value is related to electrical defect. If the sub-pixel has neither optical nor electrical defects, the first detection value corresponding to the sub-pixel is not related to the optical defects, and the second detection value is not related to the optical defects and the electrical defects, so that the second difference value is not related to the optical defects and the electrical defects. Therefore, whether the electroluminescent array substrate has electrical defects or not can be determined through the first detection value and the second detection value corresponding to each sub-pixel.
In practical implementation, in the embodiment of the present invention, controlling the driving transistor of the pixel driving circuit in each sub-pixel to operate in the linear region may include:
sequentially driving each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a first voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
In practical implementation, in the embodiment of the present invention, controlling the driving transistor of the pixel driving circuit in each sub-pixel to operate in the saturation region may include:
sequentially driving each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a second voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit in the row.
The following describes a detection method according to an embodiment of the present invention with reference to a circuit timing diagram shown in fig. 5 by taking the configurations shown in fig. 2 and 3 as examples.
The detection method provided by the embodiment of the invention can comprise the following steps:
(1) And sequentially driving each row of sub-pixels to control the driving transistor in each sub-pixel to work in a saturation region. Specifically, as shown in fig. 5, when driving a row of sub-pixels, the Data signal Data having the second voltage (e.g., 1 to 2V) is applied to the Data signal terminal Data of each pixel driving circuit in the row, the first scanning signal G1 is applied to the first scanning signal terminal G1 of each pixel driving circuit in the row, the off signal G2 is applied to the second scanning signal terminal G2 of each pixel driving circuit in the row, and the first power supply voltage signal VDD having the predetermined voltage (e.g., 4 to 5V) is applied to the first power supply signal terminal VDD of the pixel driving circuit. Taking one pixel driving circuit in the row as an example, the off signal g2 controls the detection transistor T3 to be turned off. When the first scan signal g1 is at a high level, the switching transistor T2 is controlled to supply the data signal data having the second voltage (e.g., 1 to 2V) to the gate of the driving transistor T1 such that the voltage of the gate of the driving transistor T1 is the first voltage, thereby controlling the driving transistor T1 to be in a saturation region. Then, when the first scan signal g1 is at a low level, the switching transistor T2 is controlled to be turned off, and the storage capacitor Cst maintains the gate voltage of the driving transistor T1, so that the driving transistor T1 is continuously in a saturation region, thereby generating an operating current flowing to the anode and charging the anode.
(2) And at time t0, controlling the light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a second detection value corresponding to each sub-pixel.
(3) And sequentially driving each row of sub-pixels to control the driving transistors in the sub-pixels to work in a linear region. Specifically, as shown in fig. 5, when driving a row of sub-pixels, a Data signal Data having a first voltage (e.g., 8 to 10V) is applied to the Data signal terminal Data of each pixel driving circuit in the row, a first scan signal G1 is applied to the first scan signal terminal G1 of each pixel driving circuit in the row, an off signal G2 is applied to the second scan signal terminal G2 of each pixel driving circuit in the row, and a first power supply voltage signal VDD having a predetermined voltage (e.g., 4 to 5V) is applied to the first power supply signal terminal VDD of the pixel driving circuit. Taking one pixel driving circuit in the row as an example, the off signal g2 controls the detection transistor T3 to be turned off. When the first scan signal g1 is at a high level, the switching transistor T2 is controlled to supply the data signal data having a first voltage (e.g., 8 to 10V) to the gate electrode of the driving transistor T1 so that the voltage of the gate electrode of the driving transistor T1 is a second voltage, so that the driving transistor T1 can be controlled to be in a linear region. Then, when the first scan signal g1 is at a low level, the switching transistor T2 is controlled to be turned off, and the storage capacitor Cst maintains the gate voltage of the driving transistor T1, so that the driving transistor T1 is continuously in the linear region, thereby turning on the first power signal terminal VDD and the anode, and making the voltage of the anode be the voltage of the first power signal.
(4) At time t0, the same light source is adopted to illuminate the electroluminescent array substrate, light penetrating through each sub-pixel of the electroluminescent array substrate is collected, and collected light signals are converted into first detection values corresponding to each sub-pixel; wherein, the illumination intensity in the step (2) is the same as that in the step (4).
(5) And determining a first difference value between the first detection value corresponding to each sub-pixel and a preset detection value.
(6) And when the at least one first difference value does not meet the first difference value threshold value, determining that the electroluminescence array substrate has optical defects.
(7) And determining a second difference value between the first detection value and the second detection value corresponding to the same sub-pixel aiming at each sub-pixel.
(8) And when the at least one second difference value does not meet the second difference value threshold value, determining that the electroluminescent array substrate has poor electricity.
It should be noted that the sequence of step (5) -step (6) and the sequence of step (7) -step (8) may be interchanged, which needs to be designed and determined according to the actual application environment, and is not limited herein.
It should be noted that the value of the first voltage applied to the data signal terminal may be a value that enables the driving transistor to operate in a linear region, and the specific value may be determined according to a practical application environment, and is not limited herein.
It should be noted that the value of the second voltage applied to the data signal terminal may be a value that enables the driving transistor to operate in a saturation region, and the specific value may be determined according to a practical application environment, and is not limited herein.
Based on the same inventive concept, an embodiment of the present invention further provides a device for detecting an electroluminescent array substrate, as shown in fig. 6, including:
a light source 610;
a driving unit 620 for controlling the driving transistor of the pixel driving circuit in each sub-pixel to operate in a linear region;
the collecting unit 630 is used for controlling the light source 610 to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into first detection values corresponding to each sub-pixel;
the determining unit 640 is configured to determine whether the electroluminescent array substrate is defective or not at least according to the first detection value corresponding to each sub-pixel.
In a specific implementation, in the embodiment of the present invention, the first determining unit is configured to determine a first difference between a first detection value corresponding to each sub-pixel and a preset detection value; and when the at least one first difference value does not meet the first difference value threshold value, determining that the electroluminescence array substrate has optical defects.
In practical implementation, in the embodiment of the present invention, the driving unit is configured to sequentially drive each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a first voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
In practical implementation, in the embodiment of the present invention, the driving unit is further configured to control the driving transistor in each sub-pixel to operate in a saturation region;
the collecting unit is also used for illuminating the electroluminescent array substrate by adopting a light source, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a second detection value corresponding to each sub-pixel;
and the determining unit is used for determining whether the electroluminescent array substrate has electrical defects according to the first detection value and the second detection value corresponding to each sub-pixel.
In specific implementation, in the embodiment of the present invention, the determining unit is configured to determine, for each sub-pixel, a second difference between a first detected value and a second detected value corresponding to the same sub-pixel; and when the at least one second difference value does not meet the second difference value threshold value, determining that the electroluminescent array substrate has electrical defects.
In practical implementation, in the embodiment of the present invention, the driving unit is configured to sequentially drive each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a second voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit in the row.
In particular implementations, in embodiments of the invention, the above units may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Of course, in practical applications, the embodiments of the units described above may be designed according to practical application environments, and are not limited herein.
Moreover, the working principle and the specific implementation of the detection device are the same as those of the detection method in the above embodiment, and therefore, the working principle of the detection device can be implemented by referring to the specific implementation of the detection method in the above embodiment, and is not described again here.
According to the detection method and device of the electroluminescent array substrate provided by the embodiment of the invention, the drive transistor of the pixel drive circuit in each sub-pixel is controlled to work in a linear region, namely the drive transistor forms a lead so as to directly conduct the anode and the first power supply signal end, so that the voltage on the anode can be stabilized to be the voltage of the first power supply signal end, and the interference of the drift of the threshold voltage Vth of the drive transistor on the voltage on the anode can be further avoided. And, through illuminating the electroluminescent array substrate, can obtain the first detection numerical value that each sub-pixel corresponds. Because the light intensity that passes electroluminescence array substrate is different when there is impurity such as greasy dirt, granule on the positive pole and when there is not impurity such as greasy dirt, granule on the positive pole, makes first detection numerical value also can be different like this, consequently at least according to the first detection numerical value that each sub-pixel corresponds, can confirm whether electroluminescence array substrate exists badly to detect out badly.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (12)
1. An inspection method for an electroluminescent array substrate, the electroluminescent array substrate comprising: a substrate base plate, a plurality of sub-pixels located on the substrate base plate, each of the sub-pixels including: the pixel driving circuit comprises an insulating layer and an anode, wherein the insulating layer is positioned on one side, away from the substrate, of the pixel driving circuit;
the detection method comprises the following steps:
controlling a driving transistor of a pixel driving circuit in each sub-pixel to work in a linear region;
controlling a light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into first detection values corresponding to the sub-pixels;
and determining whether the electroluminescent array substrate is poor or not at least according to the first detection value corresponding to each sub-pixel.
2. The method of claim 1, wherein said determining whether the electroluminescent array substrate is defective based on at least the first detection value corresponding to each of the sub-pixels comprises:
determining a first difference value between a first detection value corresponding to each sub-pixel and a preset detection value;
and when at least one first difference value does not meet a first difference value threshold value, determining that the electroluminescent array substrate has optical defects.
3. The detection method according to claim 1, wherein the controlling of the driving transistor of the pixel driving circuit in each sub-pixel to operate in a linear region comprises:
sequentially driving each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a first voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of the pixel driving circuit.
4. A detection method according to any one of claims 1 to 3, wherein the drive transistor of the pixel drive circuit in each of the control sub-pixels operates in a linear region; controlling a light source to illuminate the electroluminescent array substrate, collecting light transmitted through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal to a first detection value corresponding to each sub-pixel, and before or after the first detection value, further comprising:
controlling the driving transistor in each sub-pixel to work in a saturation region;
illuminating the electroluminescent array substrate by using the light source, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting the collected light signal into a second detection value corresponding to each sub-pixel;
determining whether the electroluminescent array substrate is defective or not at least according to the first detection value corresponding to each sub-pixel, including:
and determining whether the electroluminescent array substrate has electrical defects according to the first detection value and the second detection value corresponding to each sub-pixel.
5. The method as claimed in claim 4, wherein said determining whether the electroluminescent array substrate has an electrical defect according to the first detection value and the second detection value corresponding to each of the sub-pixels comprises:
determining a second difference value between a first detection value and a second detection value corresponding to the same sub-pixel for each sub-pixel;
and when at least one second difference value does not meet a second difference value threshold value, determining that the electroluminescent array substrate has poor electricity.
6. The detection method according to claim 4, wherein the controlling the driving transistor of the pixel driving circuit in each sub-pixel to operate in a saturation region comprises:
sequentially driving each row of sub-pixels; when a row of sub-pixels is driven, a data signal with a second voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
7. An apparatus for inspecting an electroluminescent array substrate, the electroluminescent array substrate comprising: a substrate base plate, a plurality of sub-pixels located on the substrate base plate, each of the sub-pixels including: the pixel driving circuit comprises an insulating layer and an anode, wherein the insulating layer is positioned on one side, away from the substrate, of the pixel driving circuit;
the detection device includes:
a light source;
the driving unit is used for controlling the driving transistor of the pixel driving circuit in each sub-pixel to work in a linear region;
the collecting unit is used for controlling a light source to illuminate the electroluminescent array substrate, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into first detection values corresponding to the sub-pixels;
and the determining unit is used for determining whether the electroluminescent array substrate has defects or not at least according to the first detection value corresponding to each sub-pixel.
8. The detecting device according to claim 7, wherein the first determining unit is configured to determine a first difference between a first detected value and a preset detected value corresponding to each of the sub-pixels; and when at least one first difference value does not meet a first difference value threshold value, determining that the electroluminescent array substrate has optical defects.
9. The detecting device according to claim 7, wherein the driving unit is configured to drive each row of sub-pixels in turn; when a row of sub-pixels is driven, a data signal with a first voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
10. The detecting device according to any one of claims 7 to 9, wherein the driving unit is further configured to control the driving transistor in each sub-pixel to operate in a saturation region;
the collecting unit is further used for illuminating the electroluminescent array substrate by adopting the light source, collecting light penetrating through each sub-pixel of the electroluminescent array substrate, and converting collected light signals into second detection values corresponding to the sub-pixels;
the determining unit is used for determining whether the electroluminescent array substrate has electrical defects according to the first detection value and the second detection value corresponding to each sub-pixel.
11. The detecting apparatus according to claim 10, wherein the determining unit is configured to determine, for each of the sub-pixels, a second difference between the first detected value and the second detected value corresponding to the same sub-pixel; and when at least one second difference value does not meet a second difference value threshold value, determining that the electroluminescent array substrate has poor electricity.
12. The detecting device according to claim 10, wherein the driving unit is configured to drive each row of sub-pixels in turn; when a row of sub-pixels is driven, a data signal with a second voltage is loaded to a data signal end of each pixel driving circuit in the row, a first scanning signal is loaded to a first scanning signal end of each pixel driving circuit in the row, a cut-off signal is loaded to a second scanning signal end of each pixel driving circuit in the row, and a first power supply voltage signal is loaded to a first power supply signal end of each pixel driving circuit.
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