CN110246096A - A kind of X-ray scattered rays fitting correction method and device - Google Patents
A kind of X-ray scattered rays fitting correction method and device Download PDFInfo
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Abstract
The invention discloses a kind of X-ray scattered rays fitting correction method and devices, this method comprises: the original image of acquisition X-ray, the low-resolution image of n-th layer is extracted based on Pyramid technology model from original image；The total luminance value that initial scatter line chart is calculated according to the brightness value of point light source each in low-resolution image carries out brightness adjustment to the total luminance value of all pixels point of initial scatter line chart, obtains the first scattering line chart；Nonlinear Processing is carried out to the first scattering line chart, to obtain the second scattering line chart after optimization；Interpolation processing is carried out to the second scattering line chart, obtains scattering line chart with the third that original image has equal resolution, each pixel of original image and third scattering line chart is subjected to difference operation, the image after being corrected.The application is calculated by mathematical operation mode, can obtain scattering line chart, and eliminates influence of the scattered rays to image, obtains clearly image, this method is relatively simple relative to other image processing methods, should be readily appreciated that.
Description
Technical field
The present invention relates to X-ray scattered rays field more particularly to a kind of X-ray scattered rays fitting correction method and devices.
Background technique
X-ray is widely used in existing medicine technology field, and x-ray is by human body in detector image-forming.X-ray is penetrated
Line can generate scattering when irradiating human body.Thicker place is more easy to produce scattering.For example, the shooting of lumbar vertebrae, abdomen, just than four
Limb shooting is more prone to produce scattering.Scatter the drawback effect come to picture strip are as follows: scattered rays causes captured image dizzy, shadow
The contrast and details final to image are rung, so that image is similar to be had haze, can not accurately identify the information in image.
In the prior art, it generallys use physics and eliminates scattering line method, X-ray is dissipated by increasing grid in instrument
Ray is filtered；And scattering line method is eliminated using software, by image processing method, eliminates scattered rays and image is done
It disturbs, finds out influence of the scattered rays to image, the influence area of scattered rays in image is removed, to obtain original true picture, than
Such as, it using nuclear physics principle, simulates x-ray and is mapped to object, generate collision with the courtyard of object, obtain the distributed mode of scattered rays
Type, to estimate scatter diagram out；" nuclear physics principle " method in the prior art be based on true physical model, it is understood that and
Complicated for operation, the broad range of techniques personnel for being unfavorable for the field understand and application, it is difficult to obtain scattering line chart, and be difficult to eliminate X-ray
Influence of the scattered rays to image.
Therefore, how simple understandable method, which obtains X-ray, scatters line chart, and eliminates X-ray scattered rays to image
Influence the research direction for the field.
Summary of the invention
This application provides a kind of X-ray scattered rays fitting correction method and devices, and can solve can not lead in the prior art
Simple image Processing Algorithm is crossed to obtain scattering line chart and eliminate the technical issues of X-ray scattered rays is to image contributions.
First aspect present invention provides a kind of X-ray scattered rays fitting correction method, the bearing calibration the following steps are included:
The original image for acquiring X-ray, the low resolution of n-th layer is extracted based on Pyramid technology model from the original image
Rate image；
The corresponding irradiation of each point light source is determined according to the brightness value of point light source each in the low-resolution image
Range obtains the exposure intensity of the corresponding point light source using the range of exposures, according to exposure intensity determination
Each point light source irradiates the total luminance value of each pixel in corresponding range of exposures, and the total luminance value of each pixel is made
For the total luminance value of initial scatter line chart, brightness is carried out to the total luminance value of all pixels point of the initial scatter line chart
Adjustment obtains the first scattering line chart of the pixel of the range of exposures comprising all point light sources；
Nonlinear Processing is carried out to the first scattering line chart, to obtain the second scattering line chart after optimization；
Interpolation processing is carried out to the second scattering line chart, obtains the third that there is equal resolution with the original image
Line chart is scattered, each pixel of the original image and third scattering line chart is subjected to difference operation, after obtaining correction
Image.
Optionally, the brightness value according to point light source each in the low-resolution image determines each point light source
The step of corresponding range of exposures includes:
The maximum illumination of each point light source is determined according to the brightness value of point light source each in the low-resolution image
Radius and minimum irradiation radius；
Using described in the calculating of the brightness value of each point light source, the maximum illumination radius and the minimum irradiation radius
Total irradiation radius of each point light source, to obtain the range of exposures；
Wherein, the calculation formula of total irradiation radius is as follows:
R=R_min+ (R_max-R_min)/I_Detect_D6 (i, j)
As R_min=0, R=R_max/I_Detect_D6 (i, j)
Wherein, R indicates that total irradiation radius, R_min indicate that the minimum irradiation radius, R_max indicate the maximum
Radius is irradiated, (i, j) indicates that the coordinate position of the point light source, I_Detect_D6 (i, j) indicate the brightness of the point light source
Value.
Optionally, described the step of obtaining the exposure intensity of the corresponding point light source using the range of exposures, includes:
Scale parameter is obtained using total irradiation radius of the range of exposures of point light source, the scale parameter is as follows:
Wherein, σ indicates that the scale parameter, R indicate that total irradiation radius, n indicate preset constant；
The exposure intensity of the point light source is obtained using the scale parameter, formula is as follows:
Wherein, f (x) indicates the exposure intensity of the point light source, and μ indicates the position of the point light source, the point light source
Coordinate is (i, j), and x indicates the position of any pixel point in the range of exposures, the coordinate (x, y) of any pixel point.
It is optionally, described that according to the exposure intensity to determine that each point light source irradiates each in corresponding range of exposures
The total luminance value of pixel is wrapped the total luminance value of each pixel as the step of total luminance value of initial scatter line chart
It includes:
The bright of the pixel that the corresponding point light source irradiates in corresponding range of exposures is determined according to the exposure intensity
Brightness value of the different point light sources to same pixel is superimposed by angle value, is dissipated using the total luminance value of each pixel as initial
The total luminance value of ray diagram.
Optionally, the total luminance value of all pixels point to the initial scatter line chart carries out brightness adjustment,
Obtain include the pixel of the range of exposures of all point light sources first scattering line chart the step of include:
After carrying out smothing filtering to the initial scatter base figure, value threshold normalized is carried out, the initial scatter is counted
The histogram of the brightness value of the histogram of the brightness value of line chart and the default light source, and brightness system is obtained according to the histogram
Number carries out brightness adjustment according to the total luminance value of the luminance factor to all pixels point of the initial scatter line chart,
Obtain the first scattering line chart of the pixel of the range of exposures comprising all point light sources.
Optionally, described that Nonlinear Processing is carried out to the first scattering line chart, the second scattering line chart after being optimized
The step of include:
Nonlinear Processing is carried out to the first scattering line chart, obtains the second scattering line chart；Formula is as follows:
I_scatter_2=a+blogc(I_scatter_D6)
I_scatter_2 expression the second scattering line chart, I_scatter_D6 expression the first scattering line chart, a, b,
C indicates parameter preset；
Candidate true picture is obtained using the low-resolution image and the second scattering line chart, according to described candidate true
The contrast of real image carries out row's choosing, to obtain the second scattering line chart after optimization.
Optionally, the low-resolution image and the second scattering line chart obtain candidate true picture, according to the time
It selects the contrast of true picture to carry out row's choosing, includes: the step of the second scattering line chart after optimization to obtain
Candidate true picture is obtained using the low-resolution image and the second scattering line chart, formula is as follows:
I_D6=I_Detect_D6-I_scatter_2
Wherein, I_D6 indicates that the candidate true picture, I_Detect_D6 indicate the low-resolution image, I_
Scatter_2 indicates the second scattering line chart；
The predeterminable area for choosing the candidate true picture carries out automatic histogram stretching, calculates the candidate true picture
Variance, to obtain the contrast of the candidate true picture,
The variance of the candidate true picture is calculated, formula is as follows:
Wherein, D indicates the variance of the candidate true picture, I_D6 (x1,y1) and I_D6 (xn,yn) indicate the candidate
The brightness value of pixel in true picture, I_D6averageIndicate the average bright of all pixels point of the candidate true picture
Angle value；
Row's choosing is carried out to the contrast of the candidate true picture, chooses the corresponding candidate of the maximum contrast
True picture, to obtain the second scattering line chart after optimization.
Optionally, described that interpolation calculation is carried out to the second scattering line chart, it obtains having with the original image identical
The third of resolution ratio scatters the step of line chart and includes:
By using bilinear interpolation method to after the optimization second scattering line chart carry out interpolation calculation, obtain with it is original
There is image the third of equal resolution to scatter line chart, and formula is as follows:
F (d+u, d+u)=(1-d)2×f(d,d)+(1-d)×u×f(d,d+1)+u×(1-u)×f(d+1,d)+u×u
Wherein, f (d+u, d+u) indicates that the third scatter diagram, (d+u, d+u) indicate resolution ratio to × f (d+1, d+1), the after optimization
The resolution ratio of two scattering line charts is (d, d), second scattering line chart f (d, d)=I_scatter_1 after optimization.
Optionally, each pixel by the original image and third scattering line chart carries out difference operation,
The step of image after being corrected includes:
Image after calculating the correction, formula are as follows:
I=I_Detect-I_scatter
Wherein, I indicates the image after the correction, and I_Detect indicates the original image, described in I_scatter expression
Third scatters line chart.
The another aspect of the application provides a kind of X-ray scattered rays fitting correction device, comprising:
Data processing module, for acquiring the original image of X-ray, based on Pyramid technology model from the original image
Extract the low resolution figure of n-th layer；
Brightness processed module, it is described each for being determined according to the brightness value of point light source each in the low-resolution image
The corresponding range of exposures of point light source obtains the exposure intensity of the corresponding point light source using the range of exposures, according to described
Exposure intensity determines the total luminance value for each pixel that each point light source irradiates in corresponding range of exposures, by each picture
Total luminance value of the total luminance value of vegetarian refreshments as initial scatter line chart；
Image collection module, the total luminance value for all pixels point to the initial scatter line chart carry out brightness
Adjustment obtains the first scattering line chart of the pixel of the range of exposures comprising all point light sources；
Image comparison module, for carrying out Nonlinear Processing to the first scattering line chart, second after being optimized dissipates
Ray diagram；
Image computing module obtains having with the original image for carrying out interpolation processing to the second scattering line chart
There is the third scattering line chart of equal resolution；
Image-restoration module, for each pixel of the original image and third scattering line chart to be carried out difference
Operation, the image after being corrected.
A kind of X-ray scattered rays fitting correction method and device provided by the invention, this method are original by irradiating X-ray
Image is based on light model, obtains the lesser wherein tomographic image of resolution ratio as target image, passes through the target image
Brightness value seeks each calculating parameter, successively obtains the first scattering line chart, the second scattering line chart and third scattering line chart, and pass through institute
The difference operation of original image and third scattering line chart is stated, the image after being corrected is eliminated in original image to realize
Scattered rays influence, this method calculated by mathematical operation mode, can be obtained and be scattered line chart, and elimination scattered rays is to image
It influences, obtains clearly image, this method is relatively simple relative to other image processing methods, should be readily appreciated that.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those skilled in the art without creative efforts, can also basis
These attached drawings obtain other attached drawings.
Fig. 1 is that acquisition image has the image that scattered rays influences in the embodiment of the present application；
Fig. 2 is the positive phasor and reverse phase figure that the X-ray of the application shoots the acquisition image of human body；
Fig. 3 is acquisition schematic diagram of the image based on light model of the X-ray of the embodiment of the present application；
Fig. 4 is the true picture eliminated after scattered rays influence in the embodiment of the present application；
The step of Fig. 5 is a kind of X-ray scattered radiation correction method of the application is schemed；
Fig. 6 is a kind of architecture diagram of X-ray scattered radiation correction apparatus of the application.
Specific embodiment
In order to make the invention's purpose, features and advantages of the invention more obvious and easy to understand, below in conjunction with the present invention
Attached drawing in embodiment, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described reality
Applying example is only a part of the embodiment of the present invention, and not all embodiments.Based on the embodiments of the present invention, those skilled in the art
Member's every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
Since scattering line chart can not be obtained by simple image Processing Algorithm in the prior art and eliminates X-ray scattered rays
The technical issues of to image contributions.
Referring to FIG. 1, having the image that scattered rays influences for acquisition image in the embodiment of the present application；In the embodiment of the present application
In, x-ray is by human body in detector image-forming, and when x-ray irradiates organization of human body, thicker place is more easy to produce scattered
It penetrates.It is easier to generate scattering when such as shooting the intracorporal lumbar vertebrae of people, abdomen using X-ray, scattered rays can be to shooting result
Image impacts, so that the brightness on image is not balanced enough, the local luminance in image is excessively high, causes to occupy dynamic range,
So that the contrast of image is lower, shooting result can not be easily observed.
In order to solve the above-mentioned technical problem, the present invention proposes a kind of X-ray scattered rays fitting correction method and device.
Referring to FIG. 2, shooting the positive phasor and reverse phase figure for acquiring image of human body for the X-ray of the application；In the present embodiment
In, when X-ray irradiates human body, it is lower that the positive figure of captured image shows as the local brightness that body is thick, density is big；Reverse phase figure
Show as at body thickness, local brightness that density is big it is higher, such as bone be it is white, air section is black.
Referring to FIG. 3, acquisition schematic diagram of the image based on light model of the X-ray for the embodiment of the present application；In the application
Embodiment in, acquire the reverse phase figure of image are as follows: body is thick or high density at show that brightness is higher, scattering strength is larger and influences
Range is wider, and air section is then shown that brightness is lower, scattering strength is lower；Therefore, using the reverse phase figure of acquisition image as
Original image is abstracted as light model by original image, and each pixel in original image is interpreted as a lamp.In this light
In model, it is assumed that the brightness of lamp is exactly pixel brightness value, then lamplight brightness is stronger, light must be brighter by circumfusion, irradiation
Range it is also wider；Further, the light model in the present embodiment is using Pyramid technology model, light model
The resolution ratio of original image is divided into multilayer, wherein the image resolution ratio of first layer is 3072*3072, the image resolution of the second layer
Rate is 1560*1560, and the image resolution ratio of third layer is that the image resolution ratio of 768*768...... layer 6 is 48*48；At this
It in embodiment, is calculated using the Gauss map of pyramidal layer 6, and is labeled as I_Detect_D6.And line chart is scattered, it marks
It is denoted as I_scatter_D6, is that each pixel in the Gauss map of the layer 6 of original image (can be regarded as " each lamp ", " every
One point light source ") superposition of surrounding having an impact is showed.
Referring to FIG. 4, to eliminate the true picture after scattered rays influence in embodiments herein；In the implementation of the application
In example, in order to obtain the true picture eliminating scattered rays and influencing, need first to obtain the image that X-ray is irradiated human body or things, it should
Image is acquisition image, secondly, by the brightness of acquisition image by a series of algorithm calculating associated luminance parameter, and according to
Luminance parameter calculates scattering line image, by acquisition image and scatters the difference operation acquisition true picture between line image, should
True picture is the image for having eliminated scattered rays influence, and the brightness in the image is more balanced, contrast is high, high-visible, figure
As can also be achieved stretching.
Referring to Fig. 5, the step of being a kind of X-ray scattered radiation correction method of the application, schemes；
First aspect present invention provides a kind of X-ray scattered rays fitting correction method, the bearing calibration the following steps are included:
S101: acquiring the original image of X-ray, low point for extracting n-th layer from original image based on Pyramid technology model
Resolution image；
S102: the corresponding irradiation model of each point light source is determined according to the brightness value of point light source each in low-resolution image
It encloses, obtains the exposure intensity of corresponding point light source using range of exposures, determine that each point light source irradiation corresponds to according to exposure intensity
Range of exposures in each pixel total luminance value, using the total luminance value of each pixel as the total brightness of initial scatter line chart
Value carries out brightness adjustment to the total luminance value of all pixels point of initial scatter line chart, obtains the irradiation comprising all point light sources
First scattering line chart of the pixel of range；
S103: carrying out Nonlinear Processing to the first scattering line chart, to obtain the second scattering line chart after optimization；
S104: interpolation processing is carried out to the second scattering line chart, obtains dissipating with the third that original image has equal resolution
Each pixel of original image and third scattering line chart is carried out difference operation, the image after being corrected by ray diagram.
In embodiments herein, the brightness values of low-resolution image I_Detect_D6 are normalized
Operation, the value range of the brightness values are [0,1.0], and determine that the brightness value of most intense light source is 1.0, the irradiation of most intense light source
Radius is R_max, and the brightness value of most weak light source is 0, and the irradiation radius of most weak light source is R_min；Further, R_max be can
Adjust parameter, it is preferred that R_max=9, R_min=0, in the present embodiment, the irradiation radius of light source and the brightness value of light source are in line
The irradiation radius of sexual intercourse, light source increases with the increase of the brightness value of light source.
Further, the corresponding irradiation of each point light source is determined according to the brightness value of point light source each in low-resolution image
The step of range includes:
The maximum illumination radius and most of each point light source is determined according to the brightness value of point light source each in low-resolution image
Small irradiation radius；
Total photograph of each point light source is calculated using the brightness value of each point light source, maximum illumination radius and minimum irradiation radius
Radius is penetrated, to obtain range of exposures；
Wherein, always the calculation formula of irradiation radius is as follows:
R=R_min+ (R_max-R_min)/I_Detect_D6 (i, j)
As R_min=0, R=R_max/I_Detect_D6 (i, j)
Wherein, R indicates that total irradiation radius, R_min indicate that minimum irradiation radius, R_max indicate maximum illumination radius, (i,
J) indicate that the coordinate position of point light source, I_Detect_D6 (i, j) indicate the brightness value of point light source；
Range of exposures is calculated, formula is as follows:
S=π R2
Wherein, S indicates the range of exposures of point light source, and R indicates total irradiation radius.
Further, the step of obtaining the exposure intensity of corresponding point light source using range of exposures include:
Scale parameter is set using total irradiation radius of the range of exposures of point light source, the setting of scale parameter is as follows:
Wherein, σ indicates that scale parameter, R indicate that total irradiation radius, n indicate preset constant, in this embodiment, it is preferred that n
=3；
The exposure intensity of point light source is obtained using scale parameter, formula is as follows:
Wherein, f (x) indicates the exposure intensity of point light source, and μ indicates the position of point light source, and the coordinate of point light source is (i, j), x
Indicate the position of any pixel point in range of exposures, the coordinate (x, y) of any pixel point；In the present embodiment, each difference
The point light source of brightness is all irradiated the range of total irradiation radius R, exposure intensity Normal Distribution.
Further, the total of each pixel that each point light source irradiates in corresponding range of exposures is determined according to exposure intensity
Brightness value includes: using the total luminance value of each pixel as the step of total luminance value of initial scatter line chart
The brightness value for the pixel that corresponding point light source irradiates in corresponding range of exposures is determined according to exposure intensity, it will not
It is superimposed with brightness value of the point light source to same pixel, using the total luminance value of each pixel as the total brightness of initial scatter line chart
Value；
The brightness value that point light source irradiates the pixel in corresponding range of exposures is calculated, formula is as follows:
I_add_(x)n=I_Detect_D6 (in,jn)·f(x)n
Wherein, I_add_ (x)nIndicate that point light source irradiates the brightness value of the pixel in corresponding range of exposures, (in,jn)
Indicate the coordinate position of point light source, I_Detect_D6 (in,jn) indicate that point light source irradiates the corresponding preset brightness for illuminating range
Value, n indicate preset constant, f (x)nIndicate the exposure intensity of any point light source；In the present embodiment, I_Detect_D6 (i, j)
The point light source (i, j) for indicating certain brightness value in low-resolution image, to the pixel (i, j) in scatter diagram I_scatter_D6
Centered on, the range that total irradiation radius is R contributes to brightness；
The total luminance value of respective pixel point is calculated, formula is as follows:
Wherein, I_scatter_D6 (x, y) Δ indicates that different light sources irradiate the total luminance value that same pixel generates, I_
add(x)nIndicate that point light source irradiates the brightness value of the pixel in corresponding range of exposures；
The total luminance value of initial scatter line chart is calculated, formula is as follows:
I_scatter_D6 Δ=I_scatter_D6 (x1,y1)Δ+I_scatter_D6(x2,y2)Δ+...+I_
scatter_D6(xn,yn)Δ
Wherein, I_scatter_D6ΔIt indicates the total luminance value of initial scatter line chart and all point light sources is corresponding illuminates model
The brightness value of whole pixels in enclosing, (xn,yn) indicate to illuminate any pixel point in range.
Further, brightness adjustment is carried out to the total luminance value of all pixels point of initial scatter line chart, obtained comprising institute
Have the pixel of the range of exposures of point light source first scattering line chart the step of include:
After carrying out smothing filtering to initial scatter base figure, value threshold normalized is carried out, counts the bright of initial scatter line chart
The histogram of the brightness value of the histogram of angle value and default light source, and luminance factor is obtained according to histogram, according to luminance factor
Brightness adjustment is carried out to the total luminance value of all pixels point of initial scatter line chart, obtains the irradiation comprising all point light sources
First scattering line chart of the pixel of range；
Luminance factor is calculated, formula is as follows:
Factor=Index_middle_Detect/ (n*Index_middle_Scatter)；
Wherein, Index_middle_Scatter indicates the value of the histogram median of the brightness value of initial scatter line chart,
Index_middle_Detect indicates the value of the histogram median of the brightness value of default light source, and n is constant；
Brightness adjustment is carried out according to total luminance value of the luminance factor to all initial scatter line charts, formula is as follows:
I_scatter_D6=I_scatter_D6 Δ Factor
Wherein, I_scatter_D6ΔIndicate that initial scatter line chart, I_scatter_D6 indicate the first scattering line chart；
In the present embodiment, since the brightness of the first scattering line chart is low more than the brightness of original image, by initial scatter line
Scheme I_scatter_D6ΔOverall brightness be adjusted to the 1/n of low-resolution image I_Detect_D6 brightness value, n indicates constant,
Preferably, usual n=4 is so that the brightness value of the first scattering line chart I_scatter_D6 is best in the present embodiment.
In application the present embodiment, above-mentioned first scattering line chart is scattered rays base figure.
Further, the step of line chart being scattered to the first scattering line chart progress Nonlinear Processing, second after being optimized
Include:
Nonlinear Processing is carried out to the first scattering line chart, obtains the second scattering line chart；Formula is as follows:
I_scatter_2=a+blogc (I_scatter_D6)
I_scatter_2 indicates that the second scattering line chart, I_scatter_D6 indicate that the first scattering line chart, a, b, c indicate pre-
Setting parameter；Further, tri- parameters of a, b, c form a three-dimensional parameter space, find the parameter value of optimization in space；
Candidate true picture is obtained using low-resolution image and the second scattering line chart, according to the comparison of candidate true picture
Degree carries out row's choosing, to obtain the second scattering line chart after optimization；In the present embodiment, used optimization method is traversal optimizing
Method, wherein the value range of a is [- 1.0,1.0], and the value range of b is [0.1,0], the value range of c be [0.0001,
0.01], further, value range of a etc. is drawn 100 calculating value parameters of range, the value range etc. of b is drawn range
Value range of c etc. is drawn 100 calculating value parameters of range, passes through a variety of default a, b, c parameters by 50 calculating value parameters
Value result calculates the second scattering line chart, obtains candidate true picture, and calculate contrast, then, in experience most 500000
After the second secondary scattering line chart calculates, row's choosing is carried out according to the contrast of candidate true picture, it is corresponding to choose maximum contrast
The candidate true picture, with a, b, c parameter that determination is optimal；In the present embodiment, it may also be combined with ant group algorithm, flock of birds is calculated
The optimization optimization method of the classics such as method improves the speed and levels of precision of search.
Further, candidate true picture is obtained using low-resolution image and the second scattering line chart, according to candidate true
The contrast of image carries out row's choosing, includes: the step of the second scattering line chart after optimization to obtain
Candidate true picture is obtained using low-resolution image and the second scattering line chart, formula is as follows:
I_D6=I_Detect_D6-I_scatter_2
Wherein, I_D6 indicates that candidate true picture, I_Detect_D6 indicate that low-resolution image, I_scatter_2 indicate
Second scattering line chart；
The predeterminable area for choosing candidate true picture carries out automatic histogram stretching, calculates the variance of candidate true picture,
To obtain the contrast of candidate true picture,
Wherein, the variance of candidate true picture, formula are as follows:
Wherein, D indicates the variance of candidate true picture, I_D6 (x1,y1) and I_D6 (xn,yn) indicate described candidate true
The brightness value of pixel in image, I_D6averageIndicate the average brightness value of all pixels point of the candidate true picture；
Further, the variance of candidate true picture is bigger, then it represents that the contrast of candidate true picture is bigger；
Row's choosing is carried out to the contrast of candidate true picture, chooses the corresponding candidate true picture of maximum contrast, with
The second scattering line chart after obtaining optimization.
In the present embodiment, ROI (region of interest, area-of-interest) region is passed through to candidate true picture
Histogram Automatic-drawing, contrast as a result is bigger, then image goes dispersion effect better, it was demonstrated that calculating second scattering line chart
Closer to true scattering line chart；
Further, histogram Automatic-drawing method include: firstly, choose effective range, obtain histogram maximum and
Minimum codomain, each that cutoff threshold is held to take 0.01, i.e. the codomain of effective range is [0.01,0.99]；Secondly, by the picture of effective range
Plain value is mapped to total head domain range.
In the embodiment of the present application, above-mentioned second scattering line chart is scattered rays fitted figure, is indicated in the embodiment of the present application
Eliminate the image that scattered rays influences.
Further, interpolation calculation is carried out to the second scattering line chart, obtains there is equal resolution with original image the
Three include: the step of scattering line chart
Interpolation calculation is carried out to the second scattering line chart after optimization by using bilinear interpolation method, is obtained and original image
Third with equal resolution scatters line chart, and formula is as follows:
F (d+u, d+u)=(1-d)2×f(d,d)+(1-d)×u×f(d,d+1)+u×(1-u)×f(d+1,d)+u×u
Wherein, f (d+u, d+u) indicates that original image, (d+u, d+u) indicate resolution ratio to × f (d+1, d+1), the second scattering after optimization
The resolution ratio of line chart is (d, d), second scattering line chart f (d, d)=I_scatter_1 after optimization.
Further, each pixel of original image and third scattering line chart is subjected to difference operation, after obtaining correction
Image the step of include:
Image after calculating correction, formula are as follows:
I=I_Detect-I_scatter
Wherein, I indicates that the image after correction, I_Detect indicate that original image, I_scatter indicate third scattered rays
Figure.
Referring to FIG. 6, a kind of architecture diagram of X-ray scattered radiation correction apparatus for the application；
The another aspect of the application provides a kind of X-ray scattered rays fitting correction device, and means for correcting 200 includes:
Data processing module 201, for acquiring the original image of X-ray, based on Pyramid technology model from original image
Extract the low resolution figure of n-th layer；
Brightness processed module 202, for determining each light according to the brightness value of point light source each in low-resolution image
The corresponding range of exposures in source obtains the exposure intensity of corresponding point light source using range of exposures, is determined according to exposure intensity each
Point light source irradiates the total luminance value of each pixel in corresponding range of exposures, using the total luminance value of each pixel as just
The total luminance value of beginning scattering line chart；
Image collection module 203, the total luminance value for all pixels point to the initial scatter line chart carry out
Brightness adjustment obtains the first scattering line chart of the pixel of the range of exposures comprising all point light sources；
Image comparison module 204, for carrying out Nonlinear Processing to the first scattering line chart, by common optimization method,
Optimal nonlinear transformation parameter a, b, c are obtained, the second scattering line chart after being optimized；
Image computing module 205 obtains having with original image identical for carrying out interpolation processing to the second scattering line chart
The third of resolution ratio scatters line chart；
Image-restoration module 206, for each pixel of original image and third scattering line chart to be carried out difference operation,
Image after being corrected.
A kind of X-ray scattered rays fitting correction method and device provided by the invention, this method are original by irradiating X-ray
Image is based on light model, obtains the lesser wherein tomographic image of resolution ratio as target image, passes through the brightness of target image
Value seeks each calculating parameter, successively obtains the first scattering line chart, the second scattering line chart and third scattering line chart, and pass through original graph
Difference operation as scattering line chart with third, the image after being corrected, to realize that the scattered rays eliminated in original image influences,
This method is calculated by mathematical operation mode, can obtain scattering line chart, and eliminates influence of the scattered rays to image, and it is clear to obtain
Image, this method is relatively simple relative to other image processing methods, should be readily appreciated that.
In several embodiments provided herein, it should be understood that disclosed device and method can pass through it
Its mode is realized.For example, the apparatus embodiments described above are merely exemplary, for example, the division of the module, only
Only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple module or components can be tied
Another system is closed or is desirably integrated into, or some features can be ignored or not executed.Another point, it is shown or discussed
Mutual coupling, direct-coupling or communication connection can be through some interfaces, the INDIRECT COUPLING or logical of device or module
Letter connection can be electrical property, mechanical or other forms.
The module as illustrated by the separation member may or may not be physically separated, aobvious as module
The component shown may or may not be physical module, it can and it is in one place, or may be distributed over multiple
On network module.Some or all of the modules therein can be selected to realize the mesh of this embodiment scheme according to the actual needs
's.
It, can also be in addition, each functional module in each embodiment of the present invention can integrate in a processing module
It is that modules physically exist alone, can also be integrated in two or more modules in a module.Above-mentioned integrated mould
Block both can take the form of hardware realization, can also be realized in the form of software function module.
If the integrated module is realized in the form of software function module and sells or use as independent product
When, it can store in a computer readable storage medium.Based on this understanding, technical solution of the present invention is substantially
The all or part of the part that contributes to existing technology or the technical solution can be in the form of software products in other words
It embodies, which is stored in a storage medium, including some instructions are used so that a computer
Equipment (can be personal computer, server or the network equipment etc.) executes the complete of each embodiment the method for the present invention
Portion or part steps.And storage medium above-mentioned includes: USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only
Memory), random access memory (RAM, Random Access Memory), magnetic or disk etc. are various can store journey
The medium of sequence code.
It should be noted that for the various method embodiments described above, describing for simplicity, therefore, it is stated as a series of
Combination of actions, but those skilled in the art should understand that, the present invention is not limited by the sequence of acts described because
According to the present invention, certain steps can use other sequences or carry out simultaneously.Secondly, those skilled in the art should also know
It knows, the embodiments described in the specification are all preferred embodiments, and related actions and modules might not all be this hair
Necessary to bright.
In the above-described embodiments, it all emphasizes particularly on different fields to the description of each embodiment, there is no the portion being described in detail in some embodiment
Point, it may refer to the associated description of other embodiments.
The above are to a kind of description of X-ray scattered rays fitting correction method and device provided by the present invention, for ability
The technical staff in domain, thought according to an embodiment of the present invention, there will be changes in the specific implementation manner and application range,
To sum up, the contents of this specification are not to be construed as limiting the invention.
Claims (10)
1. a kind of X-ray scattered rays fitting correction method, which is characterized in that the bearing calibration the following steps are included:
The original image for acquiring X-ray, the low resolution figure of n-th layer is extracted based on Pyramid technology model from the original image
Picture；
The corresponding range of exposures of each point light source is determined according to the brightness value of point light source each in the low-resolution image,
The exposure intensity of the corresponding point light source is obtained using the range of exposures, each point is determined according to the exposure intensity
Light source irradiates the total luminance value of each pixel in corresponding range of exposures, using the total luminance value of each pixel as initial
The total luminance value for scattering line chart carries out brightness adjustment to the total luminance value of all pixels point of the initial scatter line chart,
Obtain the first scattering line chart of the pixel of the range of exposures comprising all point light sources；
Nonlinear Processing is carried out to the first scattering line chart, to obtain the second scattering line chart after optimization；
Interpolation processing is carried out to the second scattering line chart, obtains scattering with the third that the original image has equal resolution
Each pixel of the original image and third scattering line chart is carried out difference operation, the figure after being corrected by line chart
Picture.
2. a kind of X-ray scattered rays fitting correction method as described in claim 1, which is characterized in that described according to the low resolution
The brightness value of each point light source determines that the step of each point light source corresponding range of exposures includes: in rate image
The maximum illumination radius of each point light source is determined according to the brightness value of point light source each in the low-resolution image
With minimum irradiation radius；
It is calculated using the brightness value of each point light source, the maximum illumination radius and the minimum irradiation radius described each
Total irradiation radius of point light source, to obtain the range of exposures；
Wherein, the calculation formula of total irradiation radius is as follows:
R=R_min+ (R_max-R_min)/I_Detect_D6 (i, j)
As R_min=0, R=R_max/I_Detect_D6 (i, j)
Wherein, R indicates that total irradiation radius, R_min indicate that the minimum irradiation radius, R_max indicate the maximum illumination
Radius, (i, j) indicate that the coordinate position of the point light source, I_Detect_D6 (i, j) indicate the brightness value of the point light source.
3. a kind of X-ray scattered rays fitting correction method as described in claim 1, which is characterized in that described to utilize the irradiation model
Enclosing the step of obtaining the exposure intensity of the corresponding point light source includes:
Scale parameter is obtained using total irradiation radius of the range of exposures of point light source, the scale parameter is as follows:
Wherein, σ indicates that the scale parameter, R indicate that total irradiation radius, n indicate preset constant；
The exposure intensity of the point light source is obtained using the scale parameter, formula is as follows:
Wherein, f (x) indicates the exposure intensity of the point light source, and μ indicates the position of the point light source, the coordinate of the point light source
The position of any pixel point in the range of exposures is indicated for (i, j), x, the coordinate of any pixel point is (x, y).
4. a kind of X-ray scattered rays fitting correction method as described in claim 1, which is characterized in that described strong according to the irradiation
Degree determines that each point light source irradiates the total luminance value of each pixel in corresponding range of exposures, by each pixel
The step of total luminance value of the total luminance value as initial scatter line chart includes:
The brightness for each pixel that the corresponding point light source irradiates in corresponding range of exposures is determined according to the exposure intensity
Brightness value of the different point light sources to same pixel is superimposed by value, irradiates corresponding irradiation model to obtain each point light source
The total luminance value of each pixel in enclosing, using the total luminance value of each pixel as the total luminance value of initial scatter line chart.
5. a kind of X-ray scattered rays fitting correction method as claimed in claim 4, which is characterized in that described to the initial scatter
The total luminance value of all pixels point of line chart carries out brightness adjustment, obtains the pixel of the range of exposures comprising all point light sources
Point first scattering line chart the step of include:
After carrying out smothing filtering to the initial scatter base figure, value threshold normalized is carried out, the initial scatter line chart is counted
Brightness value histogram and the default light source brightness value histogram, and luminance factor is obtained according to the histogram,
Brightness adjustment is carried out according to the total luminance value of the luminance factor to all pixels point of the initial scatter line chart, is obtained
First scattering line chart of the pixel of the range of exposures comprising all point light sources.
6. a kind of X-ray scattered rays fitting correction method as described in claim 1, which is characterized in that described to first scattering
Line chart carries out Nonlinear Processing, includes: the step of the second scattering line chart after optimization to obtain
Nonlinear Processing is carried out to the first scattering line chart, obtains the second scattering line chart；Formula is as follows:
I_scatter_2=a+blogc(I_scatter_D6)
I_scatter_2 indicates that the second scattering line chart, I_scatter_D6 indicate the first scattering line chart, a, b, c table
Show parameter preset；
Candidate true picture is obtained using the low-resolution image and the second scattering line chart, according to the candidate true figure
The contrast of picture carries out row's choosing, the second scattering line chart after being optimized.
7. a kind of X-ray scattered rays fitting correction method as claimed in claim 6, which is characterized in that described to utilize the low resolution
Rate image and the second scattering line chart obtain candidate true picture, are arranged according to the contrast of the candidate true picture
Choosing, second after being optimized with acquisition includes: the step of scattering line chart
Candidate true picture is obtained using the low-resolution image and the second scattering line chart, formula is as follows:
I_D6=I_Detect_D6-I_scatter_2
Wherein, I_D6 indicates that the candidate true picture, I_Detect_D6 indicate the low-resolution image, I_scatter_2
Indicate the second scattering line chart；
The predeterminable area for choosing the candidate true picture carries out automatic histogram stretching, calculates the side of the candidate true picture
Difference, to obtain the contrast of the candidate true picture,
Wherein, the variance of the candidate true picture, formula are as follows:
Wherein, D indicates the variance of the candidate true picture, I_D6 (x1,y1) and I_D6 (xn,yn) indicate the candidate true figure
The brightness value of pixel as in, I_D6averageIndicate the average brightness value of all pixels point of the candidate true picture；
Row's choosing is carried out using the contrast of the candidate true picture, it is corresponding described candidate true to choose the maximum contrast
Real image, to obtain the second scattering line chart after optimization.
8. a kind of X-ray scattered rays fitting correction method as described in claim 1, which is characterized in that described to second scattering
Line chart carries out interpolation calculation, obtains the step of third for having equal resolution with the original image scatters line chart and includes:
Interpolation calculation is carried out to the second scattering line chart after the optimization by using bilinear interpolation method, is obtained and original image
Third with equal resolution scatters line chart, and formula is as follows:
F (d+u, d+u)=(1-d)2×f(d,d)+(1-d)×u×f(d,d+1)+u×(1-u)×f(d+1,d)+u×u×f(d
+1,d+1)
Wherein, f (d+u, d+u) indicates that the third scatter diagram, (d+u, d+u) indicate resolution ratio, the second scattered rays after optimization
The resolution ratio of figure is (d, d), second scattering line chart f (d, d)=I_scatter_1 after optimization.
9. a kind of X-ray scattered rays fitting correction method as described in claim 1, which is characterized in that described by the original image
Difference operation is carried out with each pixel of third scattering line chart, and the step of image after being corrected includes:
Image after calculating the correction, formula are as follows:
I=I_Detect-I_scatter
Wherein, I indicates that the image after the correction, I_Detect indicate that the original image, I_scatter indicate the third
Scatter line chart.
10. a kind of X-ray scattered rays fitting correction device characterized by comprising
Data processing module is extracted from the original image for acquiring the original image of X-ray based on Pyramid technology model
The low resolution figure of n-th layer；
Brightness processed module, for determining each light according to the brightness value of point light source each in the low-resolution image
The corresponding range of exposures in source obtains the exposure intensity of the corresponding point light source using the range of exposures, according to the irradiation
Intensity determines the total luminance value for each pixel that each point light source irradiates in corresponding range of exposures, by each pixel
Total luminance value of the total luminance value as initial scatter line chart；
Image collection module, the total luminance value for all pixels point to the initial scatter line chart carry out brightness tune
It is whole, obtain the first scattering line chart of the pixel of the range of exposures comprising all point light sources；
Image comparison module, for carrying out Nonlinear Processing to the first scattering line chart, the second scattered rays after being optimized
Figure；
Image computing module obtains having phase with the original image for carrying out interpolation processing to the second scattering line chart
Third with resolution ratio scatters line chart；
Image-restoration module, for each pixel of the original image and third scattering line chart to be carried out difference fortune
It calculates, the image after being corrected.
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