CN110208304A - A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance - Google Patents

A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance Download PDF

Info

Publication number
CN110208304A
CN110208304A CN201910520669.6A CN201910520669A CN110208304A CN 110208304 A CN110208304 A CN 110208304A CN 201910520669 A CN201910520669 A CN 201910520669A CN 110208304 A CN110208304 A CN 110208304A
Authority
CN
China
Prior art keywords
aluminium foil
oxide film
porous oxide
microscopic appearance
analysis method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910520669.6A
Other languages
Chinese (zh)
Other versions
CN110208304B (en
Inventor
林颖
王兰东
黄予涵
李宏亮
游彭飞
张学宽
李帅帅
杨文峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Urumqi Zhongrong Electronic Material Technology Co ltd
Original Assignee
Xinjiang Joinworld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xinjiang Joinworld Co Ltd filed Critical Xinjiang Joinworld Co Ltd
Priority to CN201910520669.6A priority Critical patent/CN110208304B/en
Publication of CN110208304A publication Critical patent/CN110208304A/en
Application granted granted Critical
Publication of CN110208304B publication Critical patent/CN110208304B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/2005Preparation of powder samples therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2202Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]

Abstract

The present invention is a kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance.A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance, the following steps are included: chemical conversion pre-treatment aluminium foil print is carried out high-temperature digestion processing, chemical conversion pre-treatment aluminium foil print described in treatment process forms an angle with heating container bottom shape, under the effect of gravity, molten aluminum flows to the lower part, after cooling, aluminium is separated with aluminium oxide, obtains porous oxide film;The porous oxide film is placed in scanning electron microscope or electron lens is analyzed, obtains microscopic appearance parameter.A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance of the present invention, high-temperature digestion is passed through with not acid and alkali-resistance type aluminum oxide film aluminium foil to surface, pellumina is removed, further analysis obtains microscopic appearance parameter, provides data for research chemical conversion mechanism and supports.And stripping process is simple, and it is easily controllable, suitable for the analysis of surface layer porous oxide film microscopic appearance, carry out basic research.

Description

A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance
Technical field
Present invention relates particularly to a kind of analysis methods of aluminium foil surface layer porous oxide film microscopic appearance.
Background technique
(boiling water boiling or anodic oxidation) is handled before aluminium foil is melted into industry, generating aperture is 5-200nm, 30-800nm thick Porous oxide film, after being melted into, this layer of porous oxide film is partially converted into dense oxidation film, makees electrolytic capacitor dielectric film. This layer of porous oxide film and Waste Acid From Hua Cheng Foil quality index are maintained close ties with.
In the prior art, it takes alkaline etching method to remove aluminium foil surface oxidation film, then is analyzed with scanning electron microscope or electron lens, It can get oxidation film microscopic appearance parameter.But there is problems in that since amorphous alumina, crystalline aluminum oxide are dissolved in In lye, crystal type aluminum oxyhydroxide is alkaline-resisting acidproof, therefore alkaline etching method is only effective to the film comprising crystal type aluminum oxyhydroxide, i.e., Alkaline etching method can not remove the film of amorphous alumina, crystalline aluminum oxide.Therefore, (crystallization can only be mainly contained to aluminium foil after chemical conversion Type aluminum oxyhydroxide) take alkaline etching method removing chemical conversion aluminium foil surface oxidation film;It is analyzed, is obtained with scanning electron microscope or electron lens again Microscopic appearance parameter.Chemical conversion pre-treatment aluminium foil surface porous aluminas film component is amorphous alumina, and wherein micropore size is 5-200nm, thickness are about 30-2000nm;Ineffective acid solution or lye dissolve aluminium, can dissolve oxidation film simultaneously, stripping is not achieved Effect from oxidation film.
In view of this, the invention reside in provide a kind of analysis method of new aluminium foil surface layer porous oxide film microscopic appearance.
Summary of the invention
The purpose of the present invention is to provide a kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance, it is suitable for changing At preceding aluminium foil, solve the problems, such as porous aluminas not acid and alkali-resistance, be not easily stripped, Morphology analysis accuracy is improved, for research It is melted into mechanism and data support is provided.
To achieve the goals above, used technical solution:
A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance, comprising the following steps:
Chemical conversion pre-treatment aluminium foil print is subjected to high-temperature digestion processing, chemical conversion pre-treatment aluminium foil sample described in treatment process Piece forms an angle with heating container bottom shape, and under the effect of gravity, molten aluminum flows to the lower part, after cooling, aluminium and aluminium oxide point From obtaining porous oxide film;
The porous oxide film is placed in scanning electron microscope or electron lens is analyzed, obtains microscopic appearance parameter.
Further, the wide 0.5-1.5cm of chemical conversion pre-treatment aluminium foil print, long 2.5-5.0cm.
Further, the long side of the chemical conversion pre-treatment aluminium foil print is vertical with heating container bottom.
Further, in the high-temperature digestion treatment process: using the fixed chemical conversion pre-treatment aluminium of potsherd Foil sample keeps chemical conversion pre-treatment aluminium foil print vertical with heating container bottom.
Further, the temperature of high-temperature digestion processing is 700-1000 DEG C, time 10-60min.
Further, in the analytic process, porous oxide film micropore size is greater than 50nm and uses scanning electron microscope analysis; It is analyzed as porous oxide film micropore size is less than 50nm using electron lens.
Compared with prior art, the invention has the beneficial effects that:
1, the present invention uses high-temperature digestion aluminium, and print is disposed vertically, and under the effect of gravity, molten aluminum flows to lower end, from And achievees the purpose that aluminium and separated with aluminium oxide;The pellumina isolated is placed under Electronic Speculum and is analyzed, can be obtained microscopic appearance Parameter.
2, high temperature of the invention removing oxidation membrane process is simple, easy to operate.Its material therefor, market are commercially available; Scanning electron microscope or electron lens analysis are identical as generic way.
3, the present invention can analyze not acid and alkali-resistance pellumina pattern, to research aluminium foil chemical conversion mechanism, promote Waste Acid From Hua Cheng Foil product Quality is significant.
Detailed description of the invention
Fig. 1 is that the SEM of 1 aluminium foil surface layer porous oxide film of embodiment schemes;
Fig. 2 is that the SEM of 1 aluminium foil surface layer porous oxide film of embodiment schemes;
Fig. 3 is that the SEM of 2 aluminium foil surface layer porous oxide film of embodiment schemes;
Fig. 4 is that the SEM of 2 aluminium foil surface layer porous oxide film of embodiment schemes.
Specific embodiment
In order to which the present invention is further explained, a kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance, reaches expected Goal of the invention, in conjunction with the preferred embodiment, to a kind of aluminium foil surface layer porous oxide film microscopic appearance proposed according to the present invention Analysis method, specific embodiment, structure, feature and its effect, detailed description is as follows.In the following description, different What " embodiment " or " embodiment " referred to is not necessarily the same embodiment.In addition, special characteristic, knot in one or more embodiments Structure or feature can be combined by any suitable form.
A kind of aluminium foil surface layer porous oxide film microscopic appearance of the present invention is divided below in conjunction with specific embodiment and Fig. 1-4 Analysis method is further described in detail:
The technical solution of the present invention is as follows:
Chemical conversion pre-treatment aluminium foil print is subjected to high-temperature digestion processing, chemical conversion pre-treatment aluminium foil sample described in treatment process Piece forms an angle with heating container bottom shape, and under the effect of gravity, molten aluminum flows to the lower part, after cooling, aluminium and aluminium oxide point From obtaining porous oxide film.(reaching removing porous oxide film purpose)
The porous oxide film is placed in scanning electron microscope or electron lens is analyzed, obtains microscopic appearance parameter.
Preferably, the wide 0.5-1.5cm of chemical conversion pre-treatment aluminium foil print, the long 2.5-5.0cm.
Preferably, the long side of the chemical conversion pre-treatment aluminium foil print is vertical with heating container bottom.It is flowed conducive to molten aluminum, Enhancing and aluminium oxide separating effect
It is further preferred that in the high-temperature digestion treatment process: using the fixed chemical conversion pre-treatment of potsherd Aluminium foil sample keeps chemical conversion pre-treatment aluminium foil print vertical with heating container bottom.
Preferably, the temperature of high-temperature digestion processing is 700-100 DEG C, time 10-60min, can rapidly sufficiently Melt chemical conversion pre-treatment foil samples.
Preferably, in the analytic process, porous oxide film micropore size is greater than 50nm and uses scanning electron microscope analysis;Such as Porous oxide film micropore size is less than 50nm and is analyzed using electron lens.
Heretofore described chemical conversion pre-treatment aluminium foil refers to carrying out the aluminium foil before chemical conversion treatment.
Embodiment 1.
Specific steps are as follows:
Take sulphuric acid anodizing processing aluminium foil raw material as chemical conversion pre-treatment aluminium foil, surface layer porous aluminas micropore size For 5-20nm, thickness is about 600-700nm.
(1) chemical conversion pre-treatment aluminium foil is cut into the chemical conversion pre-treatment aluminium foil print of wide 1.5cm, long 5.0cm, abbreviation sample Piece.
(2) print is placed in clean crucible, fixes print with two panels potsherd, print is kept vertically to stand in crucible, The long side for being wherein melted into pre-treatment aluminium foil print is vertical with heating container bottom.
(3) it will be placed in Muffle furnace equipped with print crucible, 700-1000 DEG C of processing 30min.
(4) oxidation film is taken out after cooling, it is spare.
(5) isolated porous oxide film is placed in electron lens to analyze, can get microscopic appearance SEM photograph, Fig. 1- 2.By Fig. 1-2 it is found that microscopic appearance accuracy is high.
A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance of the present invention, is melted into using high-temperature digestion Aluminium in pre-treatment aluminium foil, under the effect of gravity, molten aluminum flows to the lower part, and after cooling, aluminium is separated with aluminium oxide, separates porous oxygen Change film.By passing through high-temperature digestion with not acid and alkali-resistance type aluminum oxide film aluminium foil to surface, pellumina is removed, further Analysis obtains microscopic appearance parameter, solve the problems, such as porous aluminas not acid and alkali-resistance, be not easily stripped, it is quasi- to improve Morphology analysis True property.
Embodiment 2.
Specific steps are as follows:
Phosphoric acid anodizing is taken to handle aluminium foil raw material, surface layer porous aluminas micropore size is 70-80nm, and thickness is about 1500-2000nm。
(1) aluminium foil is cut into width 0.5cm, length 2.5cm print.
(2) print is fixed print with two panels potsherd, print is kept vertically to stand in crucible as in clean crucible, The long side for being wherein melted into pre-treatment aluminium foil print is vertical with heating container bottom.
(3) it will be placed in Muffle furnace equipped with print crucible, and handle 60min at 830-840 DEG C.
(4) oxidation film is taken out after cooling, it is spare.
(5) isolated porous oxide film is placed in scanning electron microscope to analyze, can get microscopic appearance SEM photograph, Fig. 3- 4.By Fig. 3-4 it is found that microscopic appearance accuracy is high.
A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance of the present invention, is melted into using high-temperature digestion Aluminium in pre-treatment aluminium foil, under the effect of gravity, molten aluminum flows to the lower part, and after cooling, aluminium is separated with aluminium oxide, separates porous oxygen Change film.By passing through high-temperature digestion with not acid and alkali-resistance type aluminum oxide film aluminium foil to surface, pellumina is removed, further Analysis obtains microscopic appearance parameter, solve the problems, such as porous aluminas not acid and alkali-resistance, be not easily stripped, it is quasi- to improve Morphology analysis True property.
Embodiment 3.
Specific steps are as follows:
Phosphoric acid anodizing is taken to handle aluminium foil raw material, surface layer porous aluminas micropore size is 70-80nm, and thickness is about 1500-2000nm。
(1) aluminium foil is cut into width 1.0cm, length 4.0cm print.
(2) print is fixed print with two panels potsherd, print is kept vertically to stand in crucible as in clean crucible, The long side for being wherein melted into pre-treatment aluminium foil print is vertical with heating container bottom.
(3) it will be placed in Muffle furnace equipped with print crucible and handle 10min at 1000 DEG C.
(4) oxidation film is taken out after cooling, it is spare.
(5) isolated porous oxide film is placed in scanning electron microscope to analyze, microscopic appearance is good, and accuracy is high.
A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance of the present invention, is melted into using high-temperature digestion Aluminium in pre-treatment aluminium foil, under the effect of gravity, molten aluminum flows to the lower part, and after cooling, aluminium is separated with aluminium oxide, separates porous oxygen Change film.By passing through high-temperature digestion with not acid and alkali-resistance type aluminum oxide film aluminium foil to surface, pellumina is removed, further Analysis obtains microscopic appearance parameter, solve the problems, such as porous aluminas not acid and alkali-resistance, be not easily stripped, it is quasi- to improve Morphology analysis True property.
The above is only the preferred embodiment of the embodiment of the present invention, not makees any shape to the embodiment of the present invention Limitation in formula, any simple modification to the above embodiments of technical spirit according to an embodiment of the present invention, equivalent variations With modification, in the range of still falling within technical solution of the embodiment of the present invention.

Claims (6)

1. a kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance, which comprises the following steps:
Will chemical conversion pre-treatment aluminium foil print carry out high-temperature digestion processing, chemical conversion pre-treatment aluminium foil print described in treatment process with Heating container bottom shape forms an angle, and under the effect of gravity, molten aluminum flows to the lower part, and after cooling, aluminium is separated with aluminium oxide, is obtained To porous oxide film;
The porous oxide film is analyzed using scanning electron microscope or electron lens, obtains microscopic appearance.
2. analysis method according to claim 1, which is characterized in that
The wide 0.5-1.5cm of chemical conversion pre-treatment aluminium foil print, the long 2.5-5.0cm.
3. analysis method according to claim 1, which is characterized in that
The long side of the chemical conversion pre-treatment aluminium foil print is vertical with heating container bottom.
4. analysis method according to claim 3, which is characterized in that
In the high-temperature digestion treatment process: using the fixed chemical conversion pre-treatment aluminium foil sample of potsherd, before keeping chemical conversion It is vertical with heating container bottom to handle aluminium foil print.
5. analysis method according to claim 1, which is characterized in that
The temperature of the high-temperature digestion processing is 700-1000 DEG C, time 10-60min.
6. analysis method according to claim 1, which is characterized in that
In the analytic process, porous oxide film micropore size is greater than 50nm and uses scanning electron microscope analysis;Porous oxide film is micro- Hole aperture is less than 50nm and is analyzed using electron lens.
CN201910520669.6A 2019-06-17 2019-06-17 Method for analyzing microscopic morphology of porous oxide film on surface layer of aluminum foil Active CN110208304B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910520669.6A CN110208304B (en) 2019-06-17 2019-06-17 Method for analyzing microscopic morphology of porous oxide film on surface layer of aluminum foil

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910520669.6A CN110208304B (en) 2019-06-17 2019-06-17 Method for analyzing microscopic morphology of porous oxide film on surface layer of aluminum foil

Publications (2)

Publication Number Publication Date
CN110208304A true CN110208304A (en) 2019-09-06
CN110208304B CN110208304B (en) 2020-10-09

Family

ID=67792929

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910520669.6A Active CN110208304B (en) 2019-06-17 2019-06-17 Method for analyzing microscopic morphology of porous oxide film on surface layer of aluminum foil

Country Status (1)

Country Link
CN (1) CN110208304B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110877916A (en) * 2019-11-27 2020-03-13 新疆众和股份有限公司 Method for producing tubular titanium dioxide

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1676676A (en) * 2005-01-28 2005-10-05 厦门大学 Porous aluminium oxide template preparing method and its apparatus
CN101211697A (en) * 2006-12-30 2008-07-02 新疆众和股份有限公司 Electrolytic capacitor aluminum foil oxidation film stripping liquid and microscopic appearance measurement method
CN101210337A (en) * 2006-12-29 2008-07-02 新疆众和股份有限公司 Method for stripping oxide film of nano aluminum anode
CN101603193A (en) * 2009-07-10 2009-12-16 中国科学院电工研究所 A kind of method of peeling anodic aluminum oxide film
CN102891012A (en) * 2012-09-14 2013-01-23 朱健雄 Method for manufacturing amorphous oxidation film aluminum foil
CN104404597A (en) * 2014-11-10 2015-03-11 常毅 Preparation method of porous alpha-alumina membrane
CN108070883A (en) * 2017-12-07 2018-05-25 天津大学 A kind of method that pure nanometer cobalt array is prepared based on anodic oxidation aluminium formwork method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1676676A (en) * 2005-01-28 2005-10-05 厦门大学 Porous aluminium oxide template preparing method and its apparatus
CN101210337A (en) * 2006-12-29 2008-07-02 新疆众和股份有限公司 Method for stripping oxide film of nano aluminum anode
CN101211697A (en) * 2006-12-30 2008-07-02 新疆众和股份有限公司 Electrolytic capacitor aluminum foil oxidation film stripping liquid and microscopic appearance measurement method
CN101603193A (en) * 2009-07-10 2009-12-16 中国科学院电工研究所 A kind of method of peeling anodic aluminum oxide film
CN102891012A (en) * 2012-09-14 2013-01-23 朱健雄 Method for manufacturing amorphous oxidation film aluminum foil
CN104404597A (en) * 2014-11-10 2015-03-11 常毅 Preparation method of porous alpha-alumina membrane
CN108070883A (en) * 2017-12-07 2018-05-25 天津大学 A kind of method that pure nanometer cobalt array is prepared based on anodic oxidation aluminium formwork method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
张晓艳等: "转移反应热和去除铝基底实验研究", 《材料与冶金学报》 *
沈行素 等: "微孔铝阳极氧化膜应用新进展及分离膜的技术", 《现代化工》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110877916A (en) * 2019-11-27 2020-03-13 新疆众和股份有限公司 Method for producing tubular titanium dioxide

Also Published As

Publication number Publication date
CN110208304B (en) 2020-10-09

Similar Documents

Publication Publication Date Title
CN109722538B (en) Method for recycling cobalt and lithium in waste lithium cobalt oxide battery through molten salt electrolysis
La et al. Template synthesis of CeO2 ordered nanowire arrays
CN102943187B (en) Preparation method of nano porous copper
CN110208304A (en) A kind of analysis method of aluminium foil surface layer porous oxide film microscopic appearance
US20180155206A1 (en) Method of producing high-purity nano alumina
CN102538703A (en) Method for extracting and observing three-dimensional appearance of non-metallic inclusion in steel in full-scale mode
CN107607567B (en) Quantitative characterization method for nonmetallic inclusions in nickel-based superalloy powder
CN103833057A (en) Production method for high-purity aluminum oxide
SK156696A3 (en) Method for the production of silicium metal, silumin and aluminium metal
CN106086462B (en) A kind of melt combined purifying method for being applicable in up-drawing method and preparing oxygen-free copper bar
CN110304634A (en) A kind of method of energy-efficient purifying industrial silicon
EP0005679A1 (en) Continuous process for obtaining pure aluminium oxide from an acid liquor originating from the chloro-sulfuric leaching of an aluminous mineral, and the purification of the liquor separated from the aluminium oxide
CN109321948A (en) A kind of method that quick Green Electrochemical prepares Silver nanorod
CN103820818B (en) Aluminum electrolysis plastidome for aluminum oxide electrolysis of one-step acid solution method production and application of aluminum electrolysis plastidome
CN107287462A (en) A kind of alloy refining alterant and its preparation method and application
CN111302361A (en) Method for recovering alkali from waste liquid of aluminum profile die
CN105731508A (en) Method for preparing high-activity aluminum oxide powder using aluminum ash
CN106367609B (en) A kind of thick golden vacuum refining method of purification
CN113447509B (en) Sample preparation method of scanning electron microscope sample for inclusions in rare earth weathering steel
CN102418120B (en) Method for recovering waste tin from electroplated steel belt
CN105154919B (en) It is a kind of that copper, the technique of nickel are reclaimed from corronil
CN113060943A (en) Ultra-thin glass strengthening method, ultra-thin glass, flexible screen and equipment
CN105883836A (en) Co-production method of sodium metasilicate and sodium fluoride
Han et al. A novel one-step solution approach to synthesize tubular ZnO nanostructures
CN1598012A (en) Process for cleaning decopper nickel electrolytic solution

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20230510

Address after: No. 1006, Borun Road, ganquanpu economic and Technological Development Zone, Urumqi City, Xinjiang Uygur Autonomous Region, 831499

Patentee after: Urumqi Zhongrong Electronic Material Technology Co.,Ltd.

Address before: 830000 science and Technology Management Office of Zhonghe company, No.18, Kashi East Road, high tech Zone, Urumqi, Xinjiang Uygur Autonomous Region

Patentee before: XINJIANG JOINWORLD Co.,Ltd.

TR01 Transfer of patent right