CN110187200A - Mechatronic Systems test device - Google Patents
Mechatronic Systems test device Download PDFInfo
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- CN110187200A CN110187200A CN201910307327.6A CN201910307327A CN110187200A CN 110187200 A CN110187200 A CN 110187200A CN 201910307327 A CN201910307327 A CN 201910307327A CN 110187200 A CN110187200 A CN 110187200A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The present embodiments relate to production management technical fields, disclose a kind of Mechatronic Systems test device, it include: multiple drivers for test data to be connect and obtained with Devices to test, it is connect with multiple drivers via reflective memory network, the real-time target machine for obtaining the test data from the driver, and the production management machine with real-time target machine communication connection, the production management machine are used to obtain the test data from the real-time target machine and obtain experimental result according to the test data.Mechatronic Systems test device provided by embodiment of the present invention has the advantages that promote the testing efficiency of Mechatronic Systems by the integration testing to each single machine of Mechatronic Systems.
Description
Technical field
The present embodiments relate to production management technical field, in particular to a kind of Mechatronic Systems test device.
Background technique
As science and technology constantly develops, the especially progress of industrial automation technique and universal, production efficiency is more
It is promoted.So-called industrial automation refers in the industrial production using automatic control, automatic regulating apparatus, to replace artificial behaviour
A kind of technique that vertical machine and machine architecture are processed.Under the conditions of industrial production automation, people only indirectly according to
Pipe and supervision machine are produced.During automated production, a machine is usually formed by the simple single machine of multiple functions
Electric system, to complete relatively complicated automatic production process.Since the Mechatronic Systems of an automated production is usual
Including multiple single machines, industrial automation, which gradually develops, is related to more technologies such as machinery, microelectronics, computer, machine vision for one
The integrated technology in field.Automatic technology also promotes the progress of industry simultaneously, and nowadays automatic technology is extensive
Applied to fields such as machine-building, electric power, building, communications and transportation, information technologies, become the primary hand raised labour productivity
Section.In the prior art in order to guarantee the reliability of automated production process, Mechatronic Systems is before admission production, it usually needs into
Row state verification guarantees that all parts in Mechatronic Systems work normally.
It was found by the inventors of the present invention that Mechatronic Systems in the prior art is when testing, artificial side is generallyd use
Formula is tested, and multiple workers detect the different single machines of Mechatronic Systems respectively, still, since the single machine of Mechatronic Systems is more and
Connection relationship between each single machine is complex, causes the testing efficiency of manual testing low.
Summary of the invention
Embodiment of the present invention is designed to provide a kind of Mechatronic Systems test device, by each single machine of Mechatronic Systems
Integration testing, promote the testing efficiency of Mechatronic Systems.
In order to solve the above technical problems, embodiments of the present invention provide a kind of Mechatronic Systems test device, comprising: use
In multiple drivers that test data is connect and obtained with Devices to test, with multiple drivers via reflective memory network
Connection, the real-time target machine for obtaining the test data from the driver, and with the real-time target machine communication link
The production management machine connect, the production management machine are used to obtain the test data from the real-time target machine and according to described
Test data obtains experimental result.
In terms of existing technologies, multiple drivers and each single machine of Mechatronic Systems are distinguished for embodiment of the present invention
It is connected, acquires the test data of each single machine respectively by multiple drivers, and the test data of each single machine is transmitted to reality
When target machine test data is transmitted to production management machine after real-time target machine gets test data from each driver, it is raw
It produces supervisor and obtains final test result according to test data, the acquisition and test data of test data are realized using system
Test result is analyzed and obtained, to realize the integration testing of Mechatronic Systems, promotes the testing efficiency of Mechatronic Systems;In addition, this
Real-time target machine and each driver are connected by reflective memory network in the embodiment of invention, due to reflective memory network
The fast speed of signal transmission, so that the real-time for better meeting the data interaction between multiple drivers is synchronous with clock.
In addition, Mechatronic Systems test device according to claim 1, the driver include and the real-time target
The driver host computer of machine communication connection and the driver slave computer communicated to connect with the driver host computer, the excitation
Device host computer is used to receive the ICD file comprising reflective memory communications protocol and is sent to the reflective memory communications protocol
The driver slave computer, the driver slave computer is for receiving the reflective memory communications protocol.
In addition, the driver includes the slot for installing reflective memory card.Slot is set on each driver,
While being easily installed reflective memory card, so that reflective memory card is arranged more firm, the reliable of system is improved on the whole
Property.
In addition, further including the reflective memory network switch being connect respectively with the reflective memory cartoon letters.By in reflection
It deposits network switch and connects multiple reflective memory cards, realize the high-speed transfer of the middle signal of entire reflecting system net.
In addition, further including being debugged respectively with the Test Sample Design machine of real-time target machine communication connection, test case
Machine and test case execute machine.Using Test Sample Design machine Automated Design test case, and test case is transmitted to test
Use-case debugging machine debugged after, using test case execute machine execute debugging after test case, thus to Mechatronic Systems into
The test of row automation, the further efficiency for improving test.
In addition, further including the database server with real-time target machine communication connection.It is deposited by database server
The data generated in storage test process, convenient for the subsequent inquiry to test data.
In addition, the real-time target machine, the production management machine, the Test Sample Design machine, the test case tune
Test-run a machine, the test case execute machine and the database server and are connected by ethernet communication.
In addition, further including the distribution plant being connect with the driver, the distribution plant is for connecting the driver
It is connected to the Devices to test.Driver and Devices to test are connected using distribution plant, driver can be easily facilitated and set with to be measured
Standby connection.
In addition, the distribution plant includes the conditioning case connecting with the driver and for the driver to be connected to
The Devices to test distributing cabinet.
In addition, the real-time target machine is industrial personal computer.
Detailed description of the invention
One or more embodiments are illustrated by the picture in corresponding attached drawing, these exemplary theorys
The bright restriction not constituted to embodiment, the element in attached drawing with same reference numbers label are expressed as similar element, remove
Non- to have special statement, composition does not limit the figure in attached drawing.
Fig. 1 is a kind of structural schematic diagram for Mechatronic Systems test device that first embodiment of the invention provides;
Fig. 2 is a kind of structural schematic diagram for Mechatronic Systems test device that second embodiment of the invention provides;
Fig. 3 is a kind of structural schematic diagram for Mechatronic Systems test device that third embodiment of the invention provides;
Fig. 4 is a kind of structural schematic diagram for Mechatronic Systems test device that four embodiment of the invention provides;
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with attached drawing to the present invention
Each embodiment be explained in detail.However, it will be understood by those skilled in the art that in each embodiment party of the present invention
In formula, in order to make the reader understand this application better, many technical details are proposed.But even if without these technical details
And various changes and modifications based on the following respective embodiments, the application technical solution claimed also may be implemented.
The first embodiment of the present invention is related to a kind of Mechatronic Systems test devices, as shown in Figure 1, comprising: multiple excitations
Device 10, the real-time target machine 20 being connect with multiple drivers 10 and the production management machine communicated to connect with real-time target machine 20
30.Wherein, driver 10 for connecting with Devices to test A and obtaining test data from Devices to test A, use by real-time target machine 20
It is transmitted to production management machine 30, production management later in obtaining test data from each driver 10 and integrating test data
After machine 30 receives test data, test data is analyzed and obtains experimental result.
It should be noted that in the present embodiment, Devices to test A is Mechatronic Systems, and it includes multiple interconnected
Single machine, multiple drivers 10 are connected respectively at multiple single machines of Mechatronic Systems.
Compared with prior art, multiple drivers 10 and each single machine of Mechatronic Systems are respectively connected with, are swashed by multiple
The test data that device 10 acquires each single machine respectively is encouraged, and the test data of each single machine is transmitted to real-time target machine 20, it is real
When target machine 20 get test data from each driver 10 after, test data is transmitted to production management machine 30, production pipe
Reason machine 30 analyzes test data, and final test result is obtained according to test data, realizes test number using system
According to acquisition and test data analysis and obtain test result, to realize the integration testing of Mechatronic Systems, promote electromechanical system
The testing efficiency of system.
Specifically, in the present embodiment, multiple drivers 10 are communicated with real-time target machine 20 via reflective memory network
Connection.In the Mechatronic Systems test device provided by embodiment, multiple driver cooperatings are set, it is common to realize electromechanics
The integration testing of system, due to the fast speed that the signal of reflective memory network transmits, to better meet multiple drivers
Between data interaction real-time it is synchronous with clock.
It further, in the present embodiment, further include reflective memory card 40, each driver 10 includes slot 11, instead
RAM card 40 is penetrated to be arranged in slot 11.It should be noted that
It further, in the present embodiment, further include reflective memory interchanger 50, reflective memory interchanger 50 and more
A reflective memory card 40 communicates to connect.It should be noted that in the present embodiment, reflective memory interchanger 50 and multiple reflections
The connection of the formation stelliform connection topology configuration of RAM card 40.For example, in the present embodiment, Reflective memory network is reflected using 4GHz multimode
RAM card, maximum can support 256 nodes, and the transmission delay between each test node is no more than 500ns.It is understood that
It is a kind of specific applicating example that above are only reflective memory card 40 in present embodiment, does not constitute and limit, in the present invention
Other embodiments in, reflective memory card 40 is also possible to other models, can specifically carry out according to actual needs flexible
It selects.
In addition, in the present embodiment, driver 10 includes the driver host computer communicated to connect with real-time target machine 20
12 and with driver host computer 12 communicate to connect driver slave computer 13, driver host computer 12 for receive comprising reflection in
Deposit ICD (interface control document, the Interface Controller) file of communications protocol and by reflective memory communications protocol
It is sent to driver slave computer 13, driver slave computer 13 is for receiving reflective memory communications protocol.It should be noted that at this
In embodiment, the interface between software and hardware standard and communications protocol of reflective memory network have been pre-defined, has formed the XML of ICD file
Formatted file is sent to each driver host computer 12.Driver host computer 12 is according to the reflective memory recorded in XML file
Communications protocol is transferred to driver slave computer 13, to realize the interaction of data information in reflective memory network.
It should be noted that in the present embodiment, real-time target machine 20 is industrial personal computer.It is understood that real-time mesh
Mark machine 20 is that industrial personal computer is only the specific applicating example of one of present embodiment, does not constitute and limits, in its of the invention
In his embodiment, real-time target machine 20 is also possible to other kinds of computer, can specifically carry out spirit according to actual needs
Selection living.
In the following, real-time target machine 20 is illustrated.It is understood that following is only real-time in present embodiment
The specific citing of one kind of target machine 20, does not constitute and limits, in other embodiments of the invention, real-time target machine 20
It can be other models and structure, specifically can flexibly be chosen according to actual needs.In the present embodiment, real-time mesh
Mark machine selects NI PXI industrial personal computer, and cabinet selects NI PXI-1044, and controller selects NI PXI-8840, and operation Linux is real-time
Operating system is parsed and is run to the instruction of master control system, and is carried out and each driver 10 based on Reflective memory network
Real-time Data Transmission.1 block of reflective memory board (PXI4G reflective memory card), 1 block of ARINC429 plate are configured in PXI machine
Block (CAV-A429-PXI), 1 piece of AFDX board (PXI-C664 AFDX), it can be achieved that in test process data excitation, acquisition and
The synchronous function of clock.
Second embodiment of the present invention is related to a kind of Mechatronic Systems test device.Present embodiment is in the first embodiment party
Be further improved on the basis of formula, specifically the improvement is that: in embodiments of the present invention, further include respectively with it is described
Test Sample Design machine 60, test case debugging machine 70 and the test case that real-time target machine 20 communicates to connect execute machine 80.
In the present embodiment, Test Sample Design machine 60 is used to generate the test case of device under test;Test case
The test case that debugging machine 70 is used to generate Test Sample Design machine 60 is debugged;Test case executes machine 80 and is used for basis
Test case device under test after debugging is tested.
Compared with prior art, second embodiment of the invention is retaining the same of whole technical effects of first embodiment
When, it increases Test Sample Design machine 60, test case debugging machine 70 and test case newly and executes machine 80, pass through Test Sample Design machine
60 generate test case;Test case debugging machine 70 debugs test case;After test case executes machine 80 according to debugging
Test case device under test tested.Test to be automated to Mechatronic Systems, it is further to promote test
Efficiency.
Third embodiment of the present invention is related to a kind of Mechatronic Systems test device.Present embodiment is in the second embodiment party
It is further improved on the basis of formula, specifically thes improvement is that: in embodiments of the present invention, further including and real-time target
The database server 90 that machine 20 communicates to connect.
In the present embodiment, database server 90 is used to store generated number in the test process of Mechatronic Systems
According to.
Further, in the present embodiment, real-time target machine 20, production management machine 30, Test Sample Design machine 60, survey
Example debugging machine 70, test case execution machine 80 and database server 90 on probation pass through ethernet communication and connect.
Compared with prior art, third embodiment of the invention is retaining the complete of first embodiment and second embodiment
While portion's technical effect, newly-increased database server 90 stores the data generated in test process, convenient for subsequent right
The inquiry of test process.
4th embodiment of the invention is related to a kind of Mechatronic Systems test device.Present embodiment is in third embodiment party
It is further improved on the basis of formula, specifically thes improvement is that: in embodiments of the present invention, further including and driver 10
The distribution plant 10A of connection.
In the present embodiment, distribution plant 10A is used to driver 10 being connected to Devices to test.Utilize distribution plant
10A connection driver 10 and Devices to test, can easily facilitate the connection of driver 10 Yu Devices to test.
Specifically, in the present embodiment, distribution plant 10A includes the conditioning case 10A1 connecting with driver 10 and is used for
Driver 10 is connected to Devices to test distributing cabinet 10A2.
Compared with prior art, four embodiment of the invention is retaining the same of whole technical effects of aforementioned embodiments
When, increase distribution plant 10A newly, distribution plant 10A may be implemented Mechatronic Systems real machine information carrying number and emulate the switching function of signal
Energy.The signal that production management machine 30 can control distribution plant switches and obtains current signals switch states.
It, can be in the following, the use of Mechatronic Systems test device provided by embodiment of the present invention is illustrated
Understand, following is only a kind of citing of embodiment of the present invention, does not constitute and limits.
Mechatronic Systems test device can carry out System Integration Test (automatic test) to tested Mechatronic Systems.For certainly
Dynamicization test for, Test Sample Design machine 60 need to create an automatic test item and by test case debugging machine 70 into
Row debugging selects the corresponding test case for having designed completion in test case load, and is loaded;Later, system
Test environment configurations can be carried out according to the description in test case file automatically, ICD configuration can carry out the configuration of ICD automatically, so
System is automatically according to the automatic automatic execution and judgement for executing code and carrying out testing process of the test in test case afterwards.It tests
Test result is obtained by production management machine 30 after and automatically generates test report, 30 one side of production management machine is by test report
It stores in database server 90, checks and statistically analyze use for subsequent;On the other hand test report is uploaded
To the server for being located at cloud.
It will be understood by those skilled in the art that the respective embodiments described above are to realize specific embodiments of the present invention,
And in practical applications, can to it, various changes can be made in the form and details, without departing from the spirit and scope of the present invention.
Claims (10)
1. a kind of Mechatronic Systems test device characterized by comprising for being connect with Devices to test and obtaining test data
Multiple drivers, connect with multiple drivers via reflective memory network, for obtaining the survey from the driver
The real-time target machine of data is tried, and the production management machine with real-time target machine communication connection, the production management machine are used
In from the real-time target machine acquisition test data and according to test data acquisition experimental result.
2. Mechatronic Systems test device according to claim 1, which is characterized in that the driver include with it is described in real time
The driver host computer of target machine communication connection and the driver slave computer communicated to connect with the driver host computer, it is described
Driver host computer is used to receive the ICD file comprising reflective memory communications protocol and sends out the reflective memory communications protocol
It send to the driver slave computer, the driver slave computer is for receiving the reflective memory communications protocol.
3. Mechatronic Systems test device according to claim 1, which is characterized in that the driver includes anti-for installing
Penetrate the slot of RAM card.
4. Mechatronic Systems test device according to claim 3, which is characterized in that further include respectively with the reflective memory
The reflective memory network switch of cartoon letters connection.
5. Mechatronic Systems test device according to claim 1, which is characterized in that further include respectively with the real-time target
Test Sample Design machine, test case debugging machine and the test case of machine communication connection execute machine.
6. Mechatronic Systems test device according to claim 5, which is characterized in that further include logical with the real-time target machine
Believe the database server of connection.
7. Mechatronic Systems test device according to claim 6, which is characterized in that the real-time target machine, the production
Supervisor, the Test Sample Design machine, test case debugging machine, the test case execute machine and the database
Server via Ethernet communication connection.
8. Mechatronic Systems test device according to claim 1, which is characterized in that further include being connect with the driver
Distribution plant, the distribution plant are used to the driver being connected to the Devices to test.
9. Mechatronic Systems test device according to claim 8, which is characterized in that the distribution plant includes swashing with described
Encourage the conditioning case of device connection and for the driver to be connected to the Devices to test distributing cabinet.
10. Mechatronic Systems test device according to claim 1, which is characterized in that the real-time target machine is industrial personal computer.
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Cited By (1)
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