CN110175096A - A kind of GPU applied voltage test method, system, terminal and storage medium - Google Patents
A kind of GPU applied voltage test method, system, terminal and storage medium Download PDFInfo
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- CN110175096A CN110175096A CN201910425730.9A CN201910425730A CN110175096A CN 110175096 A CN110175096 A CN 110175096A CN 201910425730 A CN201910425730 A CN 201910425730A CN 110175096 A CN110175096 A CN 110175096A
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- gpu
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- applied voltage
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Abstract
The present invention provides a kind of GPU applied voltage test method, system, terminal and storage medium, comprising: the setting nbody order refresh cycle；It acquires GPU card quantity and generates the nbody order of respective numbers according to the GPU card quantity；Obtain the duration of the nbody order；The nbody order is refreshed according to the duration and refresh cycle.The present invention, which can be automatically generated, pressurizes simultaneously to multiple GPU cards with the one-to-one nbody order of multiple GPU cards, and can automatically update nbody order, avoids pressurization from interrupting, while also saving human resources and testing time.
Description
Technical field
The invention belongs to server the field of test technology, and in particular to a kind of GPU applied voltage test method, system, terminal and
Storage medium.
Background technique
With the development of artificial intelligence, GPU server is becoming increasingly popular, in order to test the stability of GPU card and reliable
Property, need to carry out GPU card (general > for 24 hours), heavy load applied voltage test for a long time, cuda included nbody tool can be given
GPU card provides heavy load pressurization, but the nbody general applied voltage test time only has about 30-40mins.An other nbody
Order can only test 1 GPU card.This results in needing the artificial pressurized operation constantly executed to GPU when testing GPU.It is holding
The degree of automation is lower when row GPU is tested, and expends time and human resources.
Summary of the invention
For the above-mentioned deficiency of the prior art, the present invention provides a kind of GPU applied voltage test method, system, terminal and storage
Medium, to solve the above technical problems.
In a first aspect, the present invention provides a kind of GPU applied voltage test method, comprising:
The nbody order refresh cycle is set, sets 30min for the nbody order refresh cycle；
It acquires GPU card quantity and generates the nbody order of respective numbers according to the GPU card quantity, comprising: acquisition is all
GPU card identification code；It is generated and the one-to-one nbody order of the GPU card according to the identification code；
Obtain the duration of the nbody order；
The nbody order is refreshed according to the duration and refresh cycle, comprising: judge nbody order
Duration whether reach the refresh cycle: be then to be given birth to again according to the identification code of GPU card belonging to the nbody order
At nbody order corresponding with the identification code；It is no, then it recycles the acquisition to the nbody order duration and monitors.
The method also includes: starting GPU state monitoring programme monitors error information；By monitored results with test log
Form output.
Second aspect, the present invention provide a kind of GPU applied voltage test system, comprising:
Period setting unit is configured to the setting nbody order refresh cycle；
Order generation unit is configured to acquisition GPU card quantity and generates respective numbers according to the GPU card quantity
Nbody order, comprising: information acquisition module is configured to acquire all GPU card identification codes；Order generation module, is configured to
It is generated and the one-to-one nbody order of the GPU card according to the identification code；
Time acquisition unit is configured to obtain the duration of the nbody order；
Order refresh unit is configured to brush the nbody order according to the duration and refresh cycle
Newly, comprising: time judgment module is configured to judge whether the duration of nbody order reaches the refresh cycle；Again
Generation module is configured to be regenerated according to the identification code of GPU card belonging to the nbody order corresponding with the identification code
Nbody order；Circle collection module is configured to recycle the monitoring of the acquisition to the nbody order duration.
The third aspect provides a kind of terminal, comprising:
Processor, memory, wherein
The memory is used to store computer program,
The processor from memory for calling and running the computer program, so that terminal executes above-mentioned terminal
Method.
Fourth aspect provides a kind of computer storage medium, instruction is stored in the computer readable storage medium,
When run on a computer, so that computer executes method described in above-mentioned various aspects.
The beneficial effects of the present invention are,
GPU applied voltage test method, system, terminal and storage medium provided by the invention are refreshed by setting nbody order
Period, and corresponding nbody order is generated according to GPU card quantity, then obtain the duration of nbody order in real time, in time will
The nbody order that duration reaches the refresh cycle is updated, and is avoided the occurrence of pressurization and is interrupted the problem of influencing test result.This
Invention, which can be automatically generated, pressurizes simultaneously to multiple GPU cards with the one-to-one nbody order of multiple GPU cards, and can be certainly
It is dynamic to update nbody order, avoid pressurization from interrupting, while also saving human resources and testing time.
In addition, design principle of the present invention is reliable, structure is simple, has very extensive application prospect.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without creative efforts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the schematic flow chart of the method for one embodiment of the invention.
Fig. 2 is the schematic block diagram of the system of one embodiment of the invention.
Fig. 3 is a kind of structural schematic diagram of terminal provided in an embodiment of the present invention.
Specific embodiment
Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.
The Key Term occurred in the present invention is explained below.
GPU, graphics processor (English: Graphics Processing Unit, abbreviation: GPU), also known as show core,
Vision processor, display chip are a kind of specially in PC, work station, game machine and some mobile devices (such as plate electricity
Brain, smart phone etc.) on image operation work microprocessor.
Fig. 1 is the schematic flow chart of the method for one embodiment of the invention.Wherein, Fig. 1 executing subject can be one kind
GPU applied voltage test system.
As shown in Figure 1, this method 100 includes:
Step 110, the nbody order refresh cycle is set；
Step 120, it acquires GPU card quantity and generates the nbody order of respective numbers according to the GPU card quantity；
Step 130, the duration of the nbody order is obtained；
Step 140, the nbody order is refreshed according to the duration and refresh cycle.
Optionally, as one embodiment of the invention, the setting nbody order refresh cycle, comprising:
30min is set by the nbody order refresh cycle.
Optionally, it is generated as one embodiment of the invention, the acquisition GPU card quantity and according to the GPU card quantity
The nbody order of respective numbers, comprising:
Acquire all GPU card identification codes；
It is generated and the one-to-one nbody order of the GPU card according to the identification code.
Optionally, as one embodiment of the invention, it is described according to the duration and refresh cycle to the nbody
Order is refreshed, comprising:
Judge whether the duration of nbody order reaches the refresh cycle:
It is then to be regenerated according to the identification code of GPU card belonging to the nbody order corresponding with the identification code
Nbody order；
It is no, then it recycles the acquisition to the nbody order duration and monitors.
Optionally, as one embodiment of the invention, it is described according to the duration and refresh cycle to the nbody
After order is refreshed, the method also includes:
Start GPU state monitoring programme, monitors error information；
Monitored results are exported in the form of test log.
In order to facilitate the understanding of the present invention, below with the principle of GPU applied voltage test method of the present invention, in conjunction with the embodiments in
To the process that GPU pressurizes, GPU applied voltage test method provided by the invention is further described.
Specifically, the GPU applied voltage test method includes:
S1, due to the nbody order general applied voltage test time only have about 30-40mins, in order to avoid that may go out
Existing pressurization is interrupted, and the nbody order refresh cycle is arranged as 30min in the present embodiment.
S2, by the identification code of GPU card quantity and each GPU card in script read test server, according to GPU card
Identification code, which is established, to be controlled with the one-to-one nbody order of all GPU cards, the production of nbody order by automatic test script
Nbody is generated.
The duration of each nbody order of S3, circle collection records nbody life when each nbody order generates
The generation moment of order according to current time and generates the calculating nbody order duration at moment.A nbody is updated every 2s
Order the duration.
Whether the nbody order duration of S4, judgment step S3 acquisition reaches refresh cycle (30min), if all
The duration of nbody order is identical, and has reached the refresh cycle, then updates whole nbody orders, that is, re-establish
Nbody order.If the duration of nbody order be it is nonsynchronous, the duration for monitoring some nbody order reaches brush
After the new period, nbody order is re-established for GPU card identification code belonging to the nbody order, realizes that orientation refreshes nbody life
It enables.
S5, in each GPU card pressure process to testing service device, start monitoring programme, monitoring is raw in pressure process
At journal file in whether there is error message, if there are error messages, and the error message to be output to destination file immediately
In, facilitate the subsequent carry out error analysis of tester.
The automatic test script particular content used in the present embodiment is following (to there is 8 GPU cards to be in testing service device
Example):
If Fig. 2 shows, which includes:
Period setting unit 210, the period setting unit 210 is for being arranged the nbody order refresh cycle；
Order generation unit 220, the order generation unit 220 is for acquiring GPU card quantity and according to the GPU card number
Amount generates the nbody order of respective numbers；
Time acquisition unit 230, the time acquisition unit 230 are used to obtain the duration of the nbody order；
Order refresh unit 240, the order refresh unit 240 are used for according to the duration and refresh cycle to institute
Nbody order is stated to be refreshed.
Optionally, as one embodiment of the invention, the order generation unit includes:
Information acquisition module is configured to acquire all GPU card identification codes；
Order generation module is configured to be generated according to the identification code and order with the one-to-one nbody of the GPU card
It enables.
Optionally, as one embodiment of the invention, the order refresh unit includes:
Time judgment module, is configured to judge whether the duration of nbody order reaches the refresh cycle；
Regenerate module, be configured to be regenerated according to the identification code of GPU card belonging to the nbody order with it is described
The corresponding nbody order of identification code；
Circle collection module is configured to recycle the monitoring of the acquisition to the nbody order duration.
Fig. 3 is a kind of structural schematic diagram of terminal system 300 provided in an embodiment of the present invention, which can be with
For executing GPU applied voltage test method provided in an embodiment of the present invention.
Wherein, which may include: processor 310, memory 320 and communication unit 330.These components
It is communicated by one or more bus, it will be understood by those skilled in the art that the structure of server shown in figure is not
Limitation of the invention is constituted, it is also possible to hub-and-spoke configuration either busbar network, can also include more than illustrating
Or less component, perhaps combine certain components or different component layouts.
Wherein, which can be used for executing instruction for storage processor 310, and memory 320 can be by any class
The volatibility or non-volatile memories terminal or their combination of type are realized, such as static random access memory (SRAM), electricity
Erasable Programmable Read Only Memory EPROM (EEPROM), Erasable Programmable Read Only Memory EPROM (EPROM), programmable read only memory
(PROM), read-only memory (ROM), magnetic memory, flash memory, disk or CD.When executing instruction in memory 320
When being executed by processor 310, so that terminal 300 some or all of is able to carry out in following above method embodiment step.
Processor 310 is the control centre for storing terminal, utilizes each of various interfaces and the entire electric terminal of connection
A part by running or execute the software program and/or module that are stored in memory 320, and calls and is stored in storage
Data in device, to execute the various functions and/or processing data of electric terminal.The processor can be by integrated circuit
(Integrated Circuit, abbreviation IC) composition, such as the IC that can be encapsulated by single are formed, can also be by more of connection
The encapsulation IC of identical function or different function and form.For example, processor 310 can only include central processing unit
(Central Processing Unit, abbreviation CPU).In embodiments of the present invention, CPU can be single operation core, can also
To include multioperation core.
Communication unit 330, for establishing communication channel, so that the storage terminal be allow to be led to other terminals
Letter.It receives the user data of other terminals transmission or sends user data to other terminals.
The present invention also provides a kind of computer storage mediums, wherein the computer storage medium can be stored with program, the journey
Sequence may include step some or all of in each embodiment provided by the invention when executing.The storage medium can for magnetic disk,
CD, read-only memory (English: read-only memory, referred to as: ROM) or random access memory (English:
Random access memory, referred to as: RAM) etc..
Therefore, the present invention is by the setting nbody order refresh cycle, and generates corresponding nbody according to GPU card quantity and order
It enables, then obtains the duration of nbody order in real time, in time carry out the nbody order that the duration reaches the refresh cycle more
Newly, it avoids the occurrence of pressurization and interrupts the problem of influencing test result.The present invention can automatically generate one-to-one with multiple GPU cards
Nbody order is carried out while being pressurizeed to multiple GPU cards, and can automatically update nbody order, and pressurization is avoided to interrupt, while
Save human resources and testing time, the attainable technical effect of the present embodiment institute may refer to it is described above, herein
It repeats no more.
It is required that those skilled in the art can be understood that the technology in the embodiment of the present invention can add by software
The mode of general hardware platform realize.Based on this understanding, the technical solution in the embodiment of the present invention substantially or
Say that the part that contributes to existing technology can be embodied in the form of software products, which is stored in
Such as USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory in one storage medium
The various media that can store program code such as (RAM, Random Access Memory), magnetic or disk, including it is several
Instruction is used so that a terminal (can be personal computer, server or second terminal, the network terminal etc.) is held
Row all or part of the steps of the method according to each embodiment of the present invention.
Same and similar part may refer to each other between each embodiment in this specification.Implement especially for terminal
For example, since it is substantially similar to the method embodiment, so being described relatively simple, related place is referring in embodiment of the method
Explanation.
In several embodiments provided by the present invention, it should be understood that disclosed system, system and method, it can be with
It realizes by another way.For example, system embodiment described above is only schematical, for example, the unit
It divides, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or components
It can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, it is shown or
The mutual coupling, direct-coupling or communication connection discussed can be through some interfaces, the indirect coupling of system or unit
It closes or communicates to connect, can be electrical property, mechanical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
In network unit.It can select some or all of unit therein according to the actual needs to realize the mesh of this embodiment scheme
's.
It, can also be in addition, the functional units in various embodiments of the present invention may be integrated into one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.
Although by reference to attached drawing and combining the mode of preferred embodiment to the present invention have been described in detail, the present invention
It is not limited to this.Without departing from the spirit and substance of the premise in the present invention, those of ordinary skill in the art can be to the present invention
Embodiment carry out various equivalent modifications or substitutions, and these modifications or substitutions all should in covering scope of the invention/appoint
What those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, answer
It is included within the scope of the present invention.Therefore, protection scope of the present invention is answered described is with scope of protection of the claims
It is quasi-.
Claims (10)
1. a kind of GPU applied voltage test method characterized by comprising
The nbody order refresh cycle is set；
It acquires GPU card quantity and generates the nbody order of respective numbers according to the GPU card quantity；
Obtain the duration of the nbody order；
The nbody order is refreshed according to the duration and refresh cycle.
2. GPU applied voltage test method according to claim 1, which is characterized in that the setting nbody order refreshes week
Phase, comprising:
30min is set by the nbody order refresh cycle.
3. GPU applied voltage test method according to claim 1, which is characterized in that the acquisition GPU card quantity and according to institute
State the nbody order that GPU card quantity generates respective numbers, comprising:
Acquire all GPU card identification codes；
It is generated and the one-to-one nbody order of the GPU card according to the identification code.
4. GPU applied voltage test method according to claim 1, which is characterized in that described according to the duration and brush
The new period refreshes the nbody order, comprising:
Judge whether the duration of nbody order reaches the refresh cycle:
It is that nbody corresponding with the identification code is then regenerated according to the identification code of GPU card belonging to the nbody order and is ordered
It enables；
It is no, then it recycles the acquisition to the nbody order duration and monitors.
5. GPU applied voltage test method according to claim 1, which is characterized in that described according to the duration and brush
After the new period refreshes the nbody order, the method also includes:
Start GPU state monitoring programme, monitors error information；
Monitored results are exported in the form of test log.
6. GPU applied voltage test system according to claim 1 characterized by comprising
Period setting unit is configured to the setting nbody order refresh cycle；
Order generation unit is configured to acquisition GPU card quantity and generates the nbody of respective numbers according to the GPU card quantity
Order；
Time acquisition unit is configured to obtain the duration of the nbody order；
Order refresh unit is configured to refresh the nbody order according to the duration and refresh cycle.
7. GPU applied voltage test system according to claim 6, which is characterized in that the order generation unit includes:
Information acquisition module is configured to acquire all GPU card identification codes；
Order generation module is configured to be generated and the one-to-one nbody order of the GPU card according to the identification code.
8. GPU applied voltage test system according to claim 6, which is characterized in that the order refresh unit includes:
Time judgment module, is configured to judge whether the duration of nbody order reaches the refresh cycle；
Module is regenerated, is configured to be regenerated and the identification according to the identification code of GPU card belonging to the nbody order
The corresponding nbody order of code；
Circle collection module is configured to recycle the monitoring of the acquisition to the nbody order duration.
9. a kind of terminal characterized by comprising
Processor；
The memory executed instruction for storage processor；
Wherein, the processor is configured to perform claim requires the described in any item methods of 1-5.
10. a kind of computer readable storage medium for being stored with computer program, which is characterized in that the program is executed by processor
Shi Shixian method according to any one of claims 1 to 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201910425730.9A CN110175096B (en) | 2019-05-21 | 2019-05-21 | GPU (graphics processing Unit) pressurization test method, system, terminal and storage medium |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111338862A (en) * | 2020-02-16 | 2020-06-26 | 苏州浪潮智能科技有限公司 | GPU mode switching stability test method, system, terminal and storage medium |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102063354A (en) * | 2009-11-18 | 2011-05-18 | 英业达股份有限公司 | Pressure test method of server |
| CN102279782A (en) * | 2011-04-01 | 2011-12-14 | 奇智软件（北京）有限公司 | Pressure and device for testing hardware pressure |
| CN103984612A (en) * | 2014-05-28 | 2014-08-13 | 浪潮电子信息产业股份有限公司 | Unattended stress testing method based on HPL tool |
| CN104375914A (en) * | 2014-11-24 | 2015-02-25 | 浪潮电子信息产业股份有限公司 | Automatic testing method for internal pressure changes of server |
| CN104615523A (en) * | 2015-03-05 | 2015-05-13 | 浪潮电子信息产业股份有限公司 | Fatigue testing method of BMC management module based on IPMI protocol |
| US20150149832A1 (en) * | 2013-11-26 | 2015-05-28 | Inventec Corporation | Bus pressure testing system and method thereof |
| US20160132425A1 (en) * | 2009-09-11 | 2016-05-12 | International Business Machines Corporation | System and method for efficient creation and reconciliation of macro and micro level test plans |
| CN107423183A (en) * | 2017-04-25 | 2017-12-01 | 郑州云海信息技术有限公司 | A kind of GTX series video card calculates the applied voltage test method of performance |
| CN109086184A (en) * | 2018-07-18 | 2018-12-25 | 郑州云海信息技术有限公司 | The monitoring method of GPU pressure test under a kind of server Linux system |
| CN109522173A (en) * | 2018-11-02 | 2019-03-26 | 郑州云海信息技术有限公司 | A kind of OPA network card testing method, device, terminal and storage medium |
-
2019
- 2019-05-21 CN CN201910425730.9A patent/CN110175096B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160132425A1 (en) * | 2009-09-11 | 2016-05-12 | International Business Machines Corporation | System and method for efficient creation and reconciliation of macro and micro level test plans |
| CN102063354A (en) * | 2009-11-18 | 2011-05-18 | 英业达股份有限公司 | Pressure test method of server |
| CN102279782A (en) * | 2011-04-01 | 2011-12-14 | 奇智软件（北京）有限公司 | Pressure and device for testing hardware pressure |
| US20150149832A1 (en) * | 2013-11-26 | 2015-05-28 | Inventec Corporation | Bus pressure testing system and method thereof |
| CN103984612A (en) * | 2014-05-28 | 2014-08-13 | 浪潮电子信息产业股份有限公司 | Unattended stress testing method based on HPL tool |
| CN104375914A (en) * | 2014-11-24 | 2015-02-25 | 浪潮电子信息产业股份有限公司 | Automatic testing method for internal pressure changes of server |
| CN104615523A (en) * | 2015-03-05 | 2015-05-13 | 浪潮电子信息产业股份有限公司 | Fatigue testing method of BMC management module based on IPMI protocol |
| CN107423183A (en) * | 2017-04-25 | 2017-12-01 | 郑州云海信息技术有限公司 | A kind of GTX series video card calculates the applied voltage test method of performance |
| CN109086184A (en) * | 2018-07-18 | 2018-12-25 | 郑州云海信息技术有限公司 | The monitoring method of GPU pressure test under a kind of server Linux system |
| CN109522173A (en) * | 2018-11-02 | 2019-03-26 | 郑州云海信息技术有限公司 | A kind of OPA network card testing method, device, terminal and storage medium |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111338862A (en) * | 2020-02-16 | 2020-06-26 | 苏州浪潮智能科技有限公司 | GPU mode switching stability test method, system, terminal and storage medium |
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| CN110175096B (en) | 2020-02-07 |
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