CN110149084B - Two-phase direct current motor driving system structure and open-circuit fault tolerance method - Google Patents
Two-phase direct current motor driving system structure and open-circuit fault tolerance method Download PDFInfo
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
- G01R31/343—Testing dynamo-electric machines in operation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02P—CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
- H02P29/00—Arrangements for regulating or controlling electric motors, appropriate for both AC and DC motors
- H02P29/02—Providing protection against overload without automatic interruption of supply
- H02P29/024—Detecting a fault condition, e.g. short circuit, locked rotor, open circuit or loss of load
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02P—CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
- H02P29/00—Arrangements for regulating or controlling electric motors, appropriate for both AC and DC motors
- H02P29/02—Providing protection against overload without automatic interruption of supply
- H02P29/024—Detecting a fault condition, e.g. short circuit, locked rotor, open circuit or loss of load
- H02P29/028—Detecting a fault condition, e.g. short circuit, locked rotor, open circuit or loss of load the motor continuing operation despite the fault condition, e.g. eliminating, compensating for or remedying the fault
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Abstract
The invention relates to a two-phase direct current motor driving system structure and an open-circuit fault tolerance method, which comprises a direct current stabilized voltage power supply, an integrated microprocessor and two H bridges, wherein each H bridge is provided with four power field effect transistors and a winding coil; each H bridge is connected with a redundant arm, each redundant arm is provided with two power field effect transistors, the joint of the two power field effect transistors of each redundant arm is connected with two bidirectional thyristors, and the other end of each bidirectional thyristor is connected with one end of a coil winding; the structure comprises six arms, one end of each arm is connected with a direct-current stabilized voltage supply, the other end of each arm is connected with a sampling resistor, the sampling resistors are grounded simultaneously, and a pin of the integrated microprocessor is connected to the joint of each sampling resistor and the adjacent power field effect transistor. The method can automatically find open-circuit faults, determine the positions of open-circuit fault elements, automatically carry out fault tolerance and ensure the normal operation of the system.
Description
Technical Field
The invention relates to a novel two-phase direct current motor driving system structure and an open-circuit fault tolerance method.
Background
The two-phase direct current motor is used as a common electrical element and is more and more widely applied to the fields of ships, aerospace, automobiles, robots and the like. The two-phase direct current motor is equivalent to two winding coils, the driving circuit is two H-bridge circuits, each H-bridge circuit corresponds to one winding coil, and the structure of the two-phase direct current motor is shown in figure 1, and the two-phase direct current motor comprises power field effect transistors Q1, Q2, Q3 and Q4, a direct current stabilized voltage power supply 1, the winding coils 2 and a microprocessor 3.
The direct current stabilized power supply 1 provides driving voltage and power, when Q1 and Q2 are turned on (namely, corresponding pins of two power field effect transistors are given high level through pins of a microprocessor 3), and Q3 and Q4 are turned off (namely, corresponding pins of two power field effect transistors are given low level through pins of the microprocessor 3), namely, current in a certain direction is supplied to the winding coil 2, and the current firstly flows through Q1, then flows through the winding coil 2 and finally flows into the ground through Q2; when Q3 and Q4 are turned on and Q1 and Q2 are turned off, current in the other direction is supplied to the winding, and the current flows through Q4 firstly, then flows through the coil winding 2 and finally flows into the ground through Q2; the current passing through the winding coil 2 twice is opposite in direction, and the control of the motor is realized. In the industry, Q1 and Q3 form an "arm", Q2 and Q4 form an "arm", and form an H-bridge-like drive circuit with the central coil winding 2. In actual work, Q1, winding coil 2 and Q2 form a loop; q4 and the winding coils 2 and Q3 form another loop.
A conventional two-phase dc motor driving system is shown in fig. 2, which includes: the device comprises a direct current stabilized power supply 4, power field effect transistors Q5, Q6, Q7, Q8, Q9, Q10, Q11 and Q12, a winding coil 5, a winding coil 6 and an integrated microprocessor 7. The direct-current stabilized power supply 4 provides required voltage and power for the system, and Q5, Q6, Q9, Q10 and the winding coil 5 form an H bridge; q7, Q8, Q11, Q12 and the winding coil 6 form another H-bridge.
Therefore, the power field effect transistor in the driving system of the motor has a core function, and according to past experience, an open-circuit fault of the power field effect transistor (namely, the power field effect transistor is completely disconnected) can be caused in the using process, so that the motor works abnormally; therefore, the reliability of the motor drive system is also gaining more and more attention. The development of a drive system that automatically discovers open circuit faults, locates failed components, and is fault tolerant quickly is critical to the problem.
The known fault detection methods of the H-bridge motor driving system include the following methods: current-based detection methods, voltage-based detection methods, knowledge-based (expert base) methods. The fault-tolerant method mainly refers to a redundancy method, namely, another set of identical systems is prepared, and when the system in use fails, the other set of systems is used for replacing the existing system.
The disadvantages of this process are quite evident:
firstly, the detection of current and voltage requires many sensors matched with the outside, which makes the system structure complex, and in addition, requires very complex algorithm for cooperation, so a high-performance microprocessor is required for operation, and real-time processing is difficult to achieve.
Secondly, a fault-tolerant redundancy method also needs a set of completely consistent driving systems to be matched with the current system, and the whole system is very bloated.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a novel two-phase direct current motor driving system structure and an open-circuit fault tolerance method.
The method can automatically find open-circuit faults, determine the positions of open-circuit fault elements, automatically carry out fault tolerance and ensure the normal operation of the system.
The technical solution of the present invention for solving the above technical problems is,
a two-phase direct current motor driving system structure comprises a direct current stabilized voltage power supply, an integrated microprocessor and two H bridges, wherein each H bridge is provided with four power field effect transistors and a winding coil; the integrated circuit is characterized in that each H bridge is connected with a redundant arm, each redundant arm is provided with two power field effect transistors, the joint of the two power field effect transistors of each redundant arm is connected with two bidirectional thyristors, the other end of each bidirectional thyristor is connected with one end of a coil winding, and all the power field effect transistors and the bidirectional thyristors are respectively connected with one pin of the integrated microprocessor; the structure comprises six arms, wherein one end of each arm is connected with a direct-current stabilized voltage supply, the other end of each arm is connected with a sampling resistor, the sampling resistors are grounded at the same time, and a pin of the integrated microprocessor is connected with the connection position of the sampling resistor and an adjacent power field effect transistor; the integrated microprocessor is provided with an AD module and used for converting the analog signals into digital signals, and a program for determining open-circuit faults is loaded inside the integrated microprocessor.
The power field effect transistor, the bidirectional thyristor, the sampling resistor and the integrated microprocessor are all positioned on a circuit board, and the winding coil is positioned inside the two-phase direct current motor.
The program flow of the program for determining the open-circuit fault is as follows: firstly, two redundant arms do not work, a corresponding loop is conducted, then an internal AD module of the integrated microprocessor collects the voltage value of a sampling resistor on the corresponding loop, the collected value is compared with a circuit noise threshold, and if the collected value is larger than the circuit noise threshold, the loop is considered to work normally; if the collected value is less than the circuit noise threshold, one or both of the two power fets on the "loop" are considered to have an open circuit fault.
The method uses the driving system structure, and the working process of the method is as follows:
1) When the driving circuit is normal, current flows through a corresponding loop, and the voltage on a sampling resistor in the loop is not zero; the voltage on the sampling resistor in the conducting loop is collected through an AD module in the integrated microprocessor 7, the collected voltage is compared with a circuit noise threshold, if the collected voltage is larger than the circuit noise threshold, the loop is considered to work normally, namely, two power field effect transistors on the loop work normally; if the noise threshold value of the circuit is less than the noise threshold value of the circuit, the bridge circuit is considered to be abnormal in operation, namely one or two power field effect transistors on the loop circuit are subjected to open circuit fault;
2) Then, a power field effect transistor on one redundant arm is connected into the fault loop, the power field effect transistor on the redundant arm is considered to be capable of working normally and replaces one power field effect transistor in the fault loop, if the system can work normally after replacement, the replaced power field effect transistor is considered to have an open circuit fault, and if the system can not work normally after replacement; and then, selecting to form a loop by the corresponding power field effect transistor on the other redundant arm and the replaced power field effect transistor, wherein if the system normally works, the replaced power field effect transistor does not have the open circuit fault, and if the system cannot normally work, the replaced power field effect transistor has the open circuit fault, namely, fault tolerance is realized.
Compared with the prior art, the invention has the beneficial effects that:
the invention only adds a few original elements on the basis of the original drive circuit, and has one less drive circuit compared with the traditional redundant system. Meanwhile, the circuit can judge the occurrence of the circuit voltage automatic sensing fault by the integrated microprocessor constantly, automatically determine the position of the fault by controlling the access conditions of field effect transistors with different power on two redundant arms, automatically carry out fault tolerance of the fault, complete the fault tolerance process in a short time and ensure the normal work of the motor.
Drawings
Fig. 1 is an H-bridge drive circuit for a winding coil.
Fig. 2 is a schematic diagram of a conventional H-bridge driving circuit of a two-phase dc motor.
Fig. 3 is a schematic diagram of an H-bridge driving circuit of a two-phase dc motor based on fault-tolerant technology.
In fig. 1, 1 is a direct current stabilized voltage power supply, 2 is a winding coil, 3 is a microprocessor, and power field effect transistors Q1, Q2, Q3 and Q4;
in fig. 2, 4, a direct current stabilized voltage power supply, 5, a winding coil, 6, a winding coil and 7, an integrated microprocessor and power field effect transistors Q5, Q6, Q7, Q8, Q9, Q10, Q11 and Q12
In fig. 3, 4, a dc voltage-stabilized power supply, 5, a winding coil, 6, a winding coil, 7, an integrated microprocessor, and power field effect transistors Q5, Q6, Q7, Q8, Q9, Q10, Q11, Q12; power field effect transistors Q13, Q14, Q15, Q16; bidirectional thyristors D1, D2, D3, D4; sampling resistors R1, R2, R3, R4, R5, R6.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely below, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
The invention relates to a direct current motor driving system structure, comprising:
a DC stabilized power supply 4; power field effect transistors Q5, Q6, Q7, Q8, Q9, Q10, Q11, Q12, Q13, Q14, Q15, Q16; sampling resistors R1, R2, R3, R4, R5 and R6; winding coil 5 and winding coil 6; bidirectional thyristors D1, D2, D3, D4; integrated with the microprocessor 7.
The bidirectional thyristors are D1, D2, D3 and D4; sampling resistors R1, R2, R3, R4, R5 and R6; and power field effect transistors Q13, Q14, Q15 and Q16 are a small number of newly added elements. The power field effect transistors Q13 and Q14 form a No. 1 redundant arm, and the power field effect transistors Q15 and Q16 form a No. 2 redundant arm.
The power field effect transistor, the bidirectional thyristor, the sampling resistor and the integrated microprocessor are all positioned on a circuit board, and the winding coil is positioned inside the two-phase direct current motor.
The drain electrode of the power field effect transistor Q5 is connected with one end of the direct-current stabilized power supply 4, the grid electrode of the power field effect transistor Q5 is connected with one pin of the microprocessor 7, the source electrode of the power field effect transistor Q5 is connected with the drain electrode of the power field effect transistor Q6, the connection end of the source electrode and the drain electrode of the power field effect transistor Q6 is connected with one end of one winding coil 5, the source electrode of the power field effect transistor Q6 is connected with one end of the sampling resistor R1, the grid electrode of the power field effect transistor Q6 is connected with one pin of the microprocessor 7, the other end of the sampling resistor R1 is connected with the ground, and the connection end of the sampling resistor R1 and the power field effect transistor Q6 is connected with one pin of the microprocessor 7;
the drain electrode of the power field effect transistor Q13 is connected with one end of the direct-current stabilized power supply 4, the grid electrode of the power field effect transistor Q13 is connected with one pin of the microprocessor 7, the source electrode of the power field effect transistor Q13 is connected with the drain electrode of the power field effect transistor Q14, the connecting ends of the power field effect transistor Q13 and the power field effect transistor Q14 are connected with one ends of the bidirectional thyristors D1 and D3, the source electrode of the power field effect transistor Q14 is connected with one end of the sampling resistor R5, the grid electrode of the power field effect transistor Q14 is connected with one pin of the microprocessor 7, the other end of the sampling resistor R5 is connected with the ground, and the connecting end of the sampling resistor R5 and the power field effect transistor Q14 is connected with one pin of the microprocessor 7;
the drain electrode of the power field effect transistor Q9 is connected with one end of the direct-current stabilized power supply 4, the grid electrode of the power field effect transistor Q9 is connected with one pin of the microprocessor 7, the source electrode of the power field effect transistor Q9 is connected with the drain electrode of the power field effect transistor Q10, the connection end of the source electrode and the drain electrode of the power field effect transistor Q10 is connected with one end of the winding coil 5, the source electrode of the power field effect transistor Q10 is connected with one end of the sampling resistor R3, the grid electrode of the power field effect transistor Q10 is connected with one pin of the microprocessor 7, the other end of the sampling resistor R3 is connected with the ground, and the connection end of the sampling resistor R3 and the power field effect transistor Q10 is connected with one pin of the microprocessor 7;
the Q5, Q6, Q9, Q10 and the winding coil 5 form an H bridge;
the drain electrode of the power field effect transistor Q7 is connected with one end of the direct-current stabilized power supply 4, the grid electrode of the power field effect transistor Q7 is connected with one pin of the microprocessor 7, the source electrode of the power field effect transistor Q7 is connected with the drain electrode of the power field effect transistor Q8, the connection end of the source electrode and the drain electrode of the power field effect transistor Q7 is connected with one end of a winding coil 6, the source electrode of the power field effect transistor Q8 is connected with one end of the sampling resistor R2, the grid electrode of the power field effect transistor Q8 is connected with one pin of the microprocessor 7, the other end of the sampling resistor R2 is connected with the ground, and the connection end of the sampling resistor R2 and the power field effect transistor Q8 is connected with one pin of the microprocessor 7;
the drain electrode of the power field effect tube Q15 is connected with one end of the direct-current stabilized power supply 4, the grid electrode of the power field effect tube Q15 is connected with one pin of the microprocessor 7, the source electrode of the power field effect tube Q15 is connected with the drain electrode of the power field effect tube Q16, the connecting ends of the Q15 and the Q16 are connected with one ends of the bidirectional thyristors D2 and D4, the source electrode of the power field effect tube Q16 is connected with one end of the sampling resistor R6, the grid electrode of the power field effect tube Q16 is connected with one pin of the microprocessor 7, the other end of the sampling resistor R6 is connected with the ground, and the connecting end of the sampling resistor R6 and the power field effect tube Q16 is connected with one pin of the microprocessor 7;
the drain electrode of the power field effect transistor Q11 is connected with one end of the direct-current stabilized power supply 4, the grid electrode of the power field effect transistor Q11 is connected with one pin of the microprocessor 7, the source electrode of the power field effect transistor Q11 is connected with the drain electrode of the power field effect transistor Q12, the connecting end of the two is connected with one end of a winding coil 6, the source electrode of the power field effect transistor Q12 is connected with one end of the sampling resistor R4, the grid electrode of the power field effect transistor Q12 is connected with one pin of the microprocessor 7, the other end of the sampling resistor R4 is connected with the ground, and the connecting end of the sampling resistor R4 and the power field effect transistor Q12 is connected with one pin of the microprocessor 7;
one end of the bidirectional thyristor D1 is connected with the connection point of the Q13 and the Q14, the other end of the bidirectional thyristor D1 is connected with one end of the winding coil 5, and the third end of the bidirectional thyristor D1 is connected with one pin of the integrated microprocessor.
One end of the bidirectional thyristor D2 is connected with the connection point of the Q15 and the Q16, the other end of the bidirectional thyristor is connected with the other end of the winding coil 5 and is also connected with the connection point of the Q9 and the Q10, and the third end of the bidirectional thyristor is connected with one end of the integrated microprocessor.
One end of the bidirectional thyristor D3 is connected with the connection point of the Q13 and the Q14, the other end of the bidirectional thyristor is connected with one end of the winding coil 6 and is also connected with the connection point of the Q7 and the Q8, and the third end of the bidirectional thyristor is connected with one end of the integrated microprocessor.
One end of the bidirectional thyristor D4 is connected with the connection point of the Q15 and the Q16, the other end of the bidirectional thyristor D4 is connected with one end of the winding coil 6 and is also connected with the connection point of the Q11 and the Q12, and the third end of the bidirectional thyristor D4 is connected with one end of the integrated microprocessor.
The workflow of the open circuit fault determining program is as follows: firstly, two redundant arms do not work, a corresponding loop is conducted, then an internal AD module of the integrated microprocessor collects the voltage value of a sampling resistor on the corresponding loop (namely which loop is conducted, namely the voltage collection is conducted on the sampling resistor in the loop), the collected value is compared with a circuit noise threshold, the circuit noise threshold can be set to be 150 millivolts (the circuit noise threshold needs actual measurement on site, the resistance values of all the sampling resistors in the example are 0.06 ohm, the flowing current is 4 amperes, the voltage is 240mv, the actual measurement noise voltage is about 50mv, the setting of the circuit noise threshold is smaller than the voltage on the sampling resistor and larger than the actual measurement noise voltage, the noise voltage test is conducted on the circuit noise threshold before the use for different two-phase direct current motors), and if the noise threshold is larger than the circuit noise threshold, the loop is considered to be normal; if the collected voltage is less than the circuit noise threshold, one or both of the two power fets on the "loop" are deemed to have an open circuit fault.
Taking a loop formed by the power field effect transistor Q5, the winding coil 5, the power field effect transistor Q10 and the sampling resistor R3 as an example, the following steps are performed to determine which power field effect transistor has an open-circuit fault or both power field effect transistors have open-circuit faults: firstly, the power field effect transistor Q5 and the power field effect transistor Q10 are conducted, then the voltage on the sampling resistor R3 is collected by an internal AD module of the integrated microprocessor 7, and if the voltage is smaller than a circuit noise threshold value, the power field effect transistor Q5 and the power field effect transistor Q10 are inevitably provided with an open circuit or two open circuits at the same time. To do exactly which power fet has an open circuit fault? Or did both fail open circuit? The specific method is as follows,
in the first step, all driving signals are stopped, namely all pins of the integrated microprocessor output low level. The direct current motor does not work at this moment, a power field effect transistor with a fault is found in a short time, fault tolerance is realized, so that the minimum influence is guaranteed, the bidirectional thyristor D1 is switched on (a pin of the integrated microprocessor connected with the D1 is set to be at a high level), the power field effect transistor Q13, the bidirectional thyristor D1, the winding coil 5, the power field effect transistor Q10 and the sampling resistor R3 in the figure 3 form a new 'loop', the Q13 and the Q10 are switched on (the corresponding pin of the integrated microprocessor is set to be at the high level), then the voltage on the R3 is collected through internal AD conversion of the integrated microprocessor 7, if the voltage is smaller than a circuit noise threshold value, the loop is disconnected, and therefore, the Q10 is in an open circuit fault (the newly connected power field effect transistor Q13 is considered to be intact); if the collected voltage is greater than the circuit noise threshold, then Q10 is considered normal and Q5 fails open circuit.
And secondly, stopping all driving signals (namely all pins of the integrated microprocessor output low levels), then switching on the bidirectional thyristor D2 (the pin connected with the integrated microprocessor and the D2 is set to be high level), so that the power field effect tube Q5, the winding coil 5, the bidirectional thyristor D2, the power field effect tube Q16 and the sampling resistor R6 in the figure 3 form a new loop (the newly-connected power field effect tube Q16 is intact), switching on the Q5 and the Q16 (the corresponding pin of the integrated microprocessor is set to be high level), then collecting the voltage on the R6 through the internal AD conversion of the integrated microprocessor 7, and if the voltage is smaller than a circuit noise threshold, considering that the loop is disconnected and the Q5 is in open circuit fault (because the newly-connected power field effect tube Q16 is intact). If the voltage is greater than the circuit noise threshold, the loop is on, Q5 has no problem, and Q10 fails open.
After determining the open-circuit failed element, the following operations are performed:
when Q10 has an open-circuit fault (Q5 is normal), the bidirectional thyristor D2 is conducted, and Q16 is switched into a loop to replace the Q10 with the open-circuit fault.
When Q5 has open-circuit fault (Q10 is normal), the bidirectional thyristor D1 is conducted, and Q13 is connected into a loop to replace the Q5 with open-circuit fault.
When Q5 and Q10 both have open circuit faults, the bidirectional thyristors D1 and D2 are both conducted, and Q13 and Q16 are both connected into a loop to replace the Q5 and Q10 which have open circuit faults.
The resistance values of the sampling resistors are all 0.06 ohm, the models of the power field effect transistors are all IRF540, the integrated microprocessor 7 is a TMS320F28335DSP controller, the integrated microprocessor is provided with an AD module, the AD module is used for converting analog signals into digital signals, the number of universal input and output pins of the selected integrated microprocessor is required to be not less than 21, and the model of the bidirectional thyristor is KS200A. When two-phase direct current motors with different specifications are used, the voltage on the sampling resistor during connection and the noise voltage during disconnection need to be measured, so that the noise threshold of the circuit is determined. The types and specifications of the sampling resistor, the power field effect transistor and the bidirectional thyristor are the same.
The working principle of the structure and the method of the invention is as follows: when the corresponding loop is conducted, current flows through the corresponding sampling resistor, so that voltage exists on the sampling resistor; when the power field effect transistor has open circuit fault, no current flows on the corresponding loop, and no voltage exists on the corresponding sampling resistor. Collecting the voltage on the sampling resistor through an internal AD of the integrated microprocessor, setting a circuit noise threshold value in consideration of noise factors, comparing the collected voltage value with the circuit noise threshold value, and if the collected voltage value is greater than the circuit noise threshold value, proving that current flows through, and no power field effect transistor is open-circuited; when the current is less than the circuit noise threshold value, no current flows, and the power field effect tube is bound to generate open-circuit fault. To which power fet the open circuit fails? Taking a loop formed by the power field effect transistor Q5, the winding coil 5, the power field effect transistor Q10 and the sampling resistor R3 as an example for explanation, the specific process is as follows,
firstly, stopping all driving signals (namely all pins of the singlechip output low levels), switching on the bidirectional thyristor D1 to enable the power field effect tube Q13, the bidirectional thyristor D1, the power field effect tube Q10, the winding coil 5 and the sampling resistor R3 in the figure 3 to form a new 'loop' (the newly-connected power field effect tube Q13 and the sampling resistor R3 are intact), switching on the Q13 and the Q10, then collecting the voltage on the R3 through the internal AD conversion of the integrated microprocessor 7, and if the voltage is smaller than a circuit noise threshold, considering that the loop is switched off, so that the Q10 is in open circuit fault (because the newly-connected power field effect tube Q13 is intact); if the collected voltage is larger than the circuit noise threshold value, the Q10 is considered to be normal, and the power field effect transistor 5 is in open circuit failure.
Then, all driving signals are stopped (namely, all pins of the single chip microcomputer output low levels), the bidirectional thyristor D2 is switched on, so that the power field effect transistor Q5, the winding coil 5, the bidirectional thyristor D2, the power field effect transistor Q16 and the sampling resistor R6 in fig. 3 form a new 'loop' (the newly connected power field effect transistor Q16 and the sampling resistor R6 are intact), so that the power field effect transistor Q5 and the power field effect transistor Q16 are switched on, then the voltage on the power field effect transistor Q6 is collected through internal AD conversion of the integrated microprocessor 7, if the voltage is smaller than a circuit noise threshold value, the 'loop' is considered to be switched off, and the power field effect transistor Q5 is in an open-circuit fault (because the newly connected power field effect transistor Q16 is intact). If the voltage is greater than the circuit noise threshold, this "loop" is turned on, the power fet 5 has no problem, and the power fet 10 fails open.
After determining that the element with the open fault exists, the following operations are carried out:
when Q10 is in open-circuit fault (Q5 is normal), the bidirectional thyristor D2 is conducted, and the Q16 is connected into a loop to replace the Q10 with the open-circuit fault, so that fault tolerance is completed.
When Q5 has open circuit fault (Q10 is normal), the bidirectional thyristor D1 is conducted, and Q13 is connected into a 'loop' to replace the Q5 with open circuit fault, so that fault tolerance is completed.
When Q5 and Q10 both have open circuit faults, the bidirectional thyristors D1 and D2 are both conducted, and Q13 and Q16 are both connected into a 'loop' circuit to replace the Q5 and Q10 which have open circuit faults, so that fault tolerance is completed.
The driving system structure and the method can find open-circuit faults at the first time, determine the specific position of the faults within 1ms (because the time of one-time resistance sampling of an internal AD module of the integrated microprocessor is 500 microseconds), realize fault tolerance within about 2ms (0.5 ms is used for AD conversion, then determine fault elements and finally replace the fault elements, and can finish the fault tolerance within 2 ms), ensure the normal operation of the motor, and further ensure that the time of the motor working in an abnormal state is very short.
The system adopts hardware to cooperate with a simple software algorithm to diagnose and fault-tolerant faults; a complex software algorithm is eliminated, and the working efficiency of the system is improved; the system is added with a small number of redundant elements on the basis of the traditional two-phase direct current motor driving system, and the whole work from fault positioning to fault tolerance is completed.
Nothing in this specification is said to apply to the prior art.
Claims (3)
1. A two-phase direct current motor driving system structure comprises a direct current stabilized voltage power supply, an integrated microprocessor and two H bridges, wherein each H bridge is provided with four power field effect transistors and a winding coil; the integrated circuit is characterized in that each H bridge is connected with a redundant arm, each redundant arm is provided with two power field effect transistors, the joint of the two power field effect transistors of each redundant arm is connected with two bidirectional thyristors, the other end of each bidirectional thyristor is connected with one end of a coil winding, and all the power field effect transistors and the bidirectional thyristors are respectively connected with one pin of the integrated microprocessor; the structure comprises six arms, wherein one end of each arm is connected with a direct-current stabilized voltage supply, the other end of each arm is connected with a sampling resistor, the sampling resistors are grounded simultaneously, and a pin of the integrated microprocessor is connected with the connection position of the sampling resistor and the adjacent power field effect transistor; a program for determining open-circuit fault is loaded in the integrated microprocessor;
the working process of the open-circuit fault tolerance method of the two-phase direct current motor driving system using the two-phase direct current motor driving system structure is as follows:
1) When the driving circuit is normal, current flows through a corresponding loop, and the voltage on a sampling resistor in the loop is not zero; the voltage on a sampling resistor in a loop which is in a conducting state is collected through an AD module in the integrated microprocessor, the collected voltage is compared with a circuit noise threshold, if the collected voltage is larger than the circuit noise threshold, the loop is considered to work normally, namely two power field effect transistors on the loop work normally; if the noise threshold value of the circuit is less than the circuit noise threshold value, the 'loop' is considered to be abnormal in operation, namely one or two power field effect transistors on the 'loop' have an open-circuit fault;
2) Then, a power field effect tube on one redundant arm is connected into the fault loop, the power field effect tube on the redundant arm is considered to be capable of working normally, the power field effect tube on the redundant arm is used for replacing one power field effect tube in the fault loop, if the system can work normally after replacement, the replaced power field effect tube is considered to have an open-circuit fault, and if the system can not work normally after replacement; and then, selecting to form a loop by the corresponding power field effect transistor on the other redundant arm and the replaced power field effect transistor, wherein if the system normally works, the replaced power field effect transistor does not have the open circuit fault, and if the system cannot normally work, the replaced power field effect transistor has the open circuit fault, namely, fault tolerance is realized.
2. The two-phase dc motor driving system structure of claim 1, wherein said power fet, triac, sampling resistor and integrated microprocessor are all located on a circuit board, and the winding coil is located inside the two-phase dc motor.
3. The two-phase dc motor drive system architecture of claim 1, wherein the process flow of the open-circuit fault determination procedure is: firstly, two redundant arms do not work, a corresponding loop is conducted, then an internal AD module of the integrated microprocessor collects the voltage value of a sampling resistor on the corresponding loop, the collected value is compared with a circuit noise threshold, and if the collected value is larger than the circuit noise threshold, the loop is considered to be in normal work; if the collected value is less than the circuit noise threshold, one or both of the two power FETs on the "loop" are considered to have an open circuit fault.
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