CN110146768B - Leakage protector self-checking device and leakage protector - Google Patents

Leakage protector self-checking device and leakage protector Download PDF

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CN110146768B
CN110146768B CN201910366354.0A CN201910366354A CN110146768B CN 110146768 B CN110146768 B CN 110146768B CN 201910366354 A CN201910366354 A CN 201910366354A CN 110146768 B CN110146768 B CN 110146768B
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self
checking
leakage
chip
circuit
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CN110146768A (en
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于默涵
韩雁
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Zhejiang University ZJU
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Zhejiang University ZJU
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02HEMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/26Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to difference between voltages or between currents; responsive to phase angle between voltages or between currents
    • H02H3/32Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to difference between voltages or between currents; responsive to phase angle between voltages or between currents involving comparison of the voltage or current values at corresponding points in different conductors of a single system, e.g. of currents in go and return conductors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The invention discloses a leakage protector self-checking device and a leakage protector. The self-checking device comprises an application circuit, a self-checking chip and a simulation leakage generation circuit. The application circuit comprises a tripping coil, a thyristor, a current-limiting resistor, a high-power switching tube, a resistor voltage-dividing branch, a power supply circuit and a mutual inductor; the mutual inductance coil induces the simulation leakage current generated by the simulation leakage current generation circuit; the power supply circuit is used for supplying power supply voltage to the leakage protector chip and the self-checking chip; the self-checking chip includes: the reference voltage generating module is used for providing reference voltage for the comparator; the hysteresis comparator compares the divided voltage of the resistance voltage dividing branch with a reference voltage to generate a comparison pulse of the divided voltage of the resistance voltage dividing branch; a reference circuit providing a DC bias; and the clock generating module is used for providing a clock for the digital processing module. And the digital processing module comprises a counting module and a self-checking module. The invention can periodically carry out the self-checking of the leakage protector, and does not influence the normal work of the load electrical appliance during the self-checking period.

Description

Leakage protector self-checking device and leakage protector
Technical Field
The invention relates to the field of integrated circuit design, in particular to a self-checking chip for periodic self-checking of a leakage protector.
Background
With the increasing living standard, the safety of electricity utilization is more and more emphasized by the nation and the society. The leakage protector becomes an indispensable leakage protection electric appliance for each household. However, a leakage protector with a fail-safe operation causes the user to lose protection from electric shock and electrical fire. Because the regular inspection of the existing leakage protector needs manual operation, power supply interruption can be caused in the operation process, more than 90 percent of users do not carry out periodic tripping self-inspection, and the risk of abnormal work of the leakage protector cannot be ignored.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a leakage protector self-checking device and a leakage protector.
A self-test device for a leakage protector, comprising: the device comprises a self-checking chip, an application circuit and a simulation leakage generation circuit;
the application circuit includes: the high-power switch tube comprises a tripping coil, a thyristor, a current-limiting resistor, a high-power switch tube, a resistor voltage-dividing branch, a power supply circuit and a mutual inductor;
the analog leakage generating circuit comprises a triode and a resistor and generates analog leakage current;
the mutual inductance coil induces the simulation leakage current generated by the simulation leakage current generation circuit;
the power supply circuit is used for supplying power supply voltage to the leakage protector chip and the self-checking chip;
the self-checking chip comprises:
the reference voltage generating module is used for providing reference voltage for the comparator;
the hysteresis comparator compares the divided voltage of the resistance voltage dividing branch with a reference voltage to generate a comparison pulse of the divided voltage of the resistance voltage dividing branch;
a reference circuit providing a DC bias;
the clock generation module is used for providing a clock for the digital processing module;
the digital processing module comprises a counting module and a self-checking module;
the self-checking module comprises two parts, wherein one part is a high-power switching tube self-checking submodule, and the other part is a self-checking submodule of a mutual inductor, a leakage protection chip, a thyristor and a trip coil; the digital processing module is used for generating a control signal of an application circuit, controlling the working state of an output pin of the self-checking chip, processing a comparison result output by the hysteresis comparator, judging whether the functions of the tripping coil, the thyristor, the mutual inductor and the leakage protection chip are normal or not, and outputting a termination signal if a fault is found.
The self-checking chip 1 detects a tripping coil, a thyristor, a mutual inductor, a high-power switching tube and a leakage protection chip after being electrified for 2s for the first time, and generates a termination signal to disconnect a circuit if a fault is found; if the function is normal, the self-checking is carried out every 15min after the first self-checking is finished, and the normal work of the load electric appliance is not influenced during the self-checking period.
The application circuit controls the on-off of the branch where the high-power switching tube is located by controlling the grid or base voltage of the high-power switching tube.
When the high-power switching tube is out of the self-checking period, the grid or the base of the high-power switching tube keeps high level, and the normal work of the leakage protector is not influenced.
The said simulation leakage generating circuit, during the fault detection of mutual inductance coil, leakage protection chip, thyristor and trip coil, the triode is conducted, the branch generates simulation leakage current to detect the functions of mutual inductance coil, leakage protection chip, thyristor and trip coil.
The counting module comprises a 2s counter, a 15min counter, two 20ms counters and a 60ms counter, wherein the 2s counter is used for power-on self-test for the first time and triggering the two 20ms counters; the 15min counter is used for carrying out self-checking once every 15min after the first self-checking is finished, and triggering two 20ms counters; the 20ms first counter is used for limiting fault detection on the high-power switching tube within 0-20 ms, and the 20ms second counter is used for triggering the 60ms counter and simulating a leakage signal; the 60ms counter is used for limiting fault detection on the mutual inductor, the leakage protection chip, the thyristor and the trip coil within 20-80 ms.
The high-power switching tube detection module locks a grid electrode or a base electrode of the high-power switching tube at a low level within 0-4 ms, the digital processing module outputs a function control signal to set the SCR TEST pin function as high-power switching tube detection, and a drain electrode or a collector electrode of the high-power switching tube is locked at a high level through the SCR TEST pin; after 4ms, sending a high level to a grid electrode or a base electrode of the high-power switching tube, and monitoring the voltage of a drain electrode or a collector electrode of the high-power switching tube through a detection pin of the switching tube; if the voltage falling edge is detected by the switch tube detection pin within 4-20 ms, the function of the high-power switch tube is normal, the first counter is closed and cleared for 20ms, the grid or the base of the high-power switch tube is locked to be low level again, and the SCR TEST pin function is switched to be the thyristor detection function; if the detection pin of the switching tube is continuously at the high level within 4-20 ms, the high-power switching tube is not normally conducted, and after the first counter of 20ms finishes counting, a high-level trigger termination signal is output.
After the second counter of 20ms finishes counting, the counter of 60ms is triggered, and the FAU L T TEST pin is triggered to output high level, so that the triode is turned on to generate analog leakage current.
The counting module triggers a 60ms counter through a 20ms second counter and triggers a FAU L TTEST pin to output high level to generate simulated leakage current when 20ms is carried out, a mutual inductor induces the simulated leakage current, a leakage protection chip processes a leakage signal induced by the mutual inductor and sends a tripping signal to drive a thyristor to be switched on, a grid or a base of a high-power switch tube is locked at low level and only can switch on the thyristor through a resistance branch, the current of the resistance branch is only enough to switch on the thyristor and cannot trip the trip coil, the normal work of a load appliance is not influenced, if the mutual inductor and the leakage protection chip are normal in function, a tripping signal can be generated, if the thyristor is normal in function and the trip coil is normally connected with a phase line, after the tripping signal switches on the thyristor, the peak voltage of the resistance voltage dividing branch is higher than a reference level, the dividing voltage obtained by a SCR TEST monitoring circuit is used for monitoring the dividing voltage, if the peak voltage of the resistance dividing circuit is higher than the reference voltage, a hysteresis comparator outputs high-level pulse which indicates that the high-level pulse generated by the leakage protection chip, the trip coil, the tripping chip, the tripping and the thyristor trip coil is normally output when the high-level of the high-level pulse counter is not reached after the high-level of the fault of the grid of the fault protection chip is triggered, the fault of the transformer is triggered, the high-level of the counter, the.
The leakage protector adopting the leakage protector self-checking device comprises a self-checking chip, an application circuit, a simulation leakage generation circuit and a leakage protection chip, wherein the application circuit is connected with the leakage protection chip.
The invention has the beneficial effects that: the leakage protector can be periodically self-checked, and if a fault is found, a termination signal is output. And during the self-checking period, the normal work of the load electrical appliance is not influenced.
Drawings
FIG. 1 is a circuit diagram of an application of the self-checking device of the earth leakage protector of the present invention; in the figure, a self-checking chip 1, an application circuit 2, a simulation leakage generating circuit 3, a mutual inductance coil 4, a leakage protection chip 5 and a power supply circuit 6.
FIG. 2 is a block diagram of a self-test chip;
FIG. 3 is a schematic diagram of the SCR TEST pin function control module.
Detailed Description
The following describes the leakage self-test device of the present invention in detail.
As shown in fig. 1, a self-testing device of a leakage protector comprises: the device comprises a self-checking chip 1, an application circuit 2 and a simulation leakage generation circuit 3; the application circuit 2 includes: the power supply circuit comprises a tripping coil, a thyristor, a current-limiting resistor, a high-power switching tube, a resistor voltage-dividing branch, a power supply circuit 6 and a mutual inductance coil 4; the simulation leakage generating circuit 3 comprises a triode and a resistor and generates simulation leakage current; a mutual inductor 4 for inducing the simulated leakage current generated by the simulated leakage current generating circuit 3; the power supply circuit 6 is used for providing power supply voltage for the leakage protector chip 5 (not belonging to a leakage protector self-checking device, belonging to a leakage protector) and the self-checking chip 1;
as shown in fig. 2, the self-test chip 1 includes:
the reference voltage generating module is used for providing reference voltage for the comparator;
the hysteresis comparator compares the divided voltage of the resistance voltage dividing branch with a reference voltage to generate a comparison pulse of the divided voltage of the resistance voltage dividing branch;
a reference circuit providing a DC bias;
the clock generation module is used for providing a clock for the digital processing module;
the digital processing module comprises a counting module and a self-checking module,
the self-checking module comprises two parts, wherein one part is a high-power switching tube self-checking sub-module, and the other part is a mutual inductor 4, a leakage protection chip 5, a thyristor and a trip coil self-checking sub-module; the digital processing module is used for generating a control signal of the application circuit 2, controlling the working state of an output pin of the self-checking chip 1, processing a comparison result output by the hysteresis comparator, judging whether the functions of the tripping coil, the thyristor, the mutual inductor 4 and the leakage protection chip 5 are normal or not, and outputting a termination signal if a fault is found.
The self-checking chip 1 detects the tripping coil, the thyristor, the mutual inductor 4, the high-power switching tube and the leakage protection chip 5 after being electrified for 2s for the first time, and generates a termination signal to disconnect the circuit if a fault is found; if the function is normal, the self-checking is carried out every 15min after the first self-checking is finished, and the normal work of the load electric appliance is not influenced during the self-checking period.
The application circuit 2 controls the on-off of the branch where the high-power switching tube is located by controlling the grid or base voltage of the high-power switching tube.
When the high-power switching tube is out of the self-checking period, the grid or the base of the high-power switching tube keeps high level, and the normal work of the leakage protector is not influenced.
The said simulation electric leakage produces the circuit 3, while carrying on the mutual inductor 4, earth leakage protective chip 5, thyristor and trip coil fault detection, the triode is turned on, the branch produces the simulation electric leakage, in order to detect the mutual inductor 4, earth leakage protective chip 5, thyristor and function of the trip coil.
The counting module comprises a 2s counter, a 15min counter, two 20ms counters and a 60ms counter, wherein the 2s counter is used for power-on self-test for the first time and triggering the two 20ms counters; the 15min counter is used for carrying out self-checking once every 15min after the first self-checking is finished, and triggering two 20ms counters; the 20ms first counter is used for limiting fault detection on the high-power switching tube within 0-20 ms, and the 20ms second counter is used for triggering the 60ms counter and simulating a leakage signal; the counter of 60ms is used for limiting fault detection on the mutual inductor 4, the leakage protection chip 5, the thyristor and the trip coil within 20-80 ms.
The high-power switching tube detection module locks a grid electrode or a base electrode of the high-power switching tube at a low level within 0-4 ms, the digital processing module outputs a function control signal to set the SCR TEST pin function as high-power switching tube detection, and a drain electrode or a collector electrode of the high-power switching tube is locked at a high level through the SCR TEST pin; after 4ms, sending a high level to a grid electrode or a base electrode of the high-power switching tube, and monitoring the voltage of a drain electrode or a collector electrode of the high-power switching tube through a detection pin of the switching tube; if the voltage falling edge is detected by the switch tube detection pin within 4-20 ms, the function of the high-power switch tube is normal, the first counter is closed and cleared for 20ms, the grid or the base of the high-power switch tube is locked to be low level again, and the SCR TEST pin function is switched to be the thyristor detection function; if the detection pin of the switching tube is continuously at the high level within 4-20 ms, the high-power switching tube is not normally conducted, and after the first counter of 20ms finishes counting, a high-level trigger termination signal is output.
After the second counter of 20ms finishes counting, the counter of 60ms is triggered, and the FAU L T TEST pin is triggered to output high level, so that the triode is turned on to generate analog leakage current.
The counting module triggers a 60ms counter through a 20ms second counter and triggers a FAU L TTEST pin to output high level to generate simulated leakage current when 20ms is carried out, a mutual inductor 4 induces the simulated leakage current, a leakage protection chip 5 processes a leakage signal induced by the mutual inductor 4 and sends a tripping signal to drive a thyristor to be switched on, a grid or a base of a high-power switch tube is locked at low level and only switches on the thyristor through a resistance branch, the current of the resistance branch is only enough to switch on the thyristor and cannot trip the tripping coil, the normal work of a load electrical appliance is not influenced, if the functions of the mutual inductor 4 and the leakage protection chip 5 are normal, a tripping signal can be generated, if the functions of the thyristor are normal and the tripping coil is normally connected with a phase line, the peak voltage of the resistance voltage dividing branch is higher than a reference level after the tripping signal is switched on, the SCR TEST pin monitors the divided voltage obtained by the resistance dividing circuit, if the peak voltage of the resistance dividing branch is higher than the reference voltage, a hysteresis comparator outputs high-level pulse to indicate that the mutual inductor 4, the leakage protection chip 5, the leakage current is normally switched off, the thyristor is used for indicating that the high-level when the high-level of the thyristor counter is not output when the high-level, the high-level of the high-level trigger switch counter is reached, the high-level after the fault-level of the fault-level counter is triggered, the fault-level of the thyristor is reached, the high-level counter, the fault-.
The leakage protector adopting the leakage protector self-checking device comprises a self-checking chip 1, an application circuit 2, a simulation leakage generating circuit 3 and a leakage protection chip 5, wherein the application circuit 2 is connected with the leakage protection chip 5.
The operation of the self-test chip will be described in detail below.
As shown in fig. 2, after the first power-on, the power-on reset circuit resets the modules in the self-test chip and triggers the 2s counter, and after the 2s counter completes the first counting, the counter outputs a high level as a trigger signal for starting the two 20ms counters. Within 0-4 ms, the switch tube controls the pin to output low level, and Q in the figure 12The gate or base level of (1) is locked at a low level; the internal function control signal is at a high level, as shown in fig. 3, when the internal function control signal is at a high level, the SCR TEST pin is used for the detection of the high-power switching tube; through SCR TEST pins and D1Pipe will R3The end is locked at a high level, the level of the drain electrode or the collector electrode of the high-power switching tube is monitored through the detection pin of the switching tube, and the drain electrode or the collector electrode of the high-power switching tube is at the high level. Within 4-20 ms, the control pin of the switching tube outputs high level, at the moment, the grid electrode and the drain electrode or the base electrode and the collector electrode of the power tube are both high level, if the high-power switching tube is normal in function, the high-power switching tube is conducted, the voltage of the drain electrode or the collector electrode of the high-power switching tube is changed into low level, the detection pin of the switching tube detects a falling edge signal, the falling edge detected by the detection pin of the switching tube is used for turning off a 20ms first counter, the control pin of the switching tube outputs low level, the high-power switching tube is turned off, an internal function control signal outputs low level, and the pin function is switched; if switch tube functionAnd if the current is abnormal, the detection pin of the switching tube cannot detect the falling edge, the first counter of 20ms finishes counting, and generates a high level trigger termination signal to cut off power supply.
First, after the 20ms counter finishes counting, a high level is generated to trigger the 60ms counter and trigger the FAU L T TEST pin to output a high level to turn on the Q in FIG. 11Through R7、Q1The branch generates an analog leakage current in the loop. The simulation leakage current is used for detecting whether the functions of the mutual inductor, the leakage protection chip, the thyristor and the trip coil are normal or not. If the functions of the components are normal, the mutual inductor induces and simulates leakage current, and the leakage protection chip processes the induced leakage signal and then outputs a tripping signal to the thyristor Q in the figure 13The thyristor Q being in the positive half cycle3The anode is positive voltage, and the control pin of the switching tube controls Q after the self-test of the high-power switching tube is finished2Is locked at low level, so that Q cannot pass3、R3、Q2Generating a path through only Q3、R1、R2Generating a path, and R1、R2Large resistance value, Q3、R1、R2The current of the branch circuit can only lead the thyristor to be conducted, and the tripping coil can not generate strong enough magnetic force to open the switch. After the thyristor is conducted, the voltage of the phase line passes through R1、R2Branch pressure, R2The obtained partial voltage is input into a self-checking chip through an SCR (silicon controlled rectifier) TEST pin and is compared with a reference level, if the peak level is higher than the internal reference level, a comparator outputs a high level for turning off a 60ms counter, triggering a FAU L T TEST pin to output a low level, turning off a simulated leakage current, after a thyristor is completely turned off, a grid electrode or a base electrode of a high-power switching tube is locked to be the high level again, and functional faults of any device of a mutual inductance coil, a leakage protection chip, the thyristor and a trip coil can cause R2The divided voltage on will always remain low; within the time of the 60ms, the time of the operation,if the comparator does not generate high level to clear the 60ms counter, the 60ms counter triggers a termination signal to cut off power supply after finishing counting.
If the element is not found to be in fault by the first self-test, the operation is repeated every 15 min. And if the element is found to have a fault in the self-test period, the power supply is cut off, and a warning is given out.
At the time outside the self-checking period, the switch tube control pin outputs high level, if the real simulation leakage current is detected, the simulation leakage current chip outputs trip signal, the switch tube control pin is high level, Q3、R3、Q2A low resistance path is created wherein R3Resistance much less than R1And R2The generated large current can enable the trip coil to generate enough magnetic force to open the switch and cut off the power supply.

Claims (2)

1. A self-checking device of a leakage protector is characterized by comprising: the device comprises a self-checking chip (1), an application circuit (2) and an analog leakage generation circuit (3);
the application circuit (2) comprises: the power supply circuit comprises a trip coil, a thyristor, a current-limiting resistor, a high-power switching tube, a resistor voltage-dividing branch, a power supply circuit (6) and a mutual inductor (4);
the analog leakage generating circuit (3) comprises a triode and a resistor and generates analog leakage current;
a mutual inductor (4) for inducing the simulated leakage current generated by the simulated leakage current generation circuit (3);
the power supply circuit (6) is used for providing power supply voltage for the leakage protector chip (5) and the self-checking chip (1);
the self-checking chip (1) comprises:
the reference voltage generating module is used for providing reference voltage for the comparator;
the hysteresis comparator compares the divided voltage of the resistance voltage dividing branch with a reference voltage to generate a comparison pulse of the divided voltage of the resistance voltage dividing branch;
a reference circuit providing a DC bias;
the clock generation module is used for providing a clock for the digital processing module;
the digital processing module comprises a counting module and a self-checking module;
the self-checking module comprises two parts, wherein one part is a high-power switching tube self-checking sub-module, and the other part is a self-checking sub-module of a mutual inductor (4), a leakage protection chip (5), a thyristor and a trip coil; the digital processing module is used for generating a control signal of the application circuit (2), controlling the working state of an output pin of the self-checking chip (1), processing a comparison result output by the hysteresis comparator, judging whether the functions of the trip coil, the thyristor, the mutual inductor (4) and the leakage protection chip (5) are normal or not, and outputting a termination signal if a fault is found;
the self-checking chip (1) detects a tripping coil, a thyristor, a mutual inductor (4), a high-power switching tube and a leakage protection chip (5) after being electrified for 2s for the first time, and generates a termination signal to disconnect a circuit if a fault is found; if the function is normal, performing self-checking every 15min after the first self-checking is finished, and not influencing the normal work of the load electric appliance during the self-checking period;
the application circuit (2) controls the on-off of the branch where the high-power switching tube is located by controlling the grid or base voltage of the high-power switching tube;
when the high-power switching tube is out of the self-checking period, the grid or the base of the high-power switching tube keeps high level, and the normal work of the leakage protector is not influenced;
the simulation leakage generation circuit (3) is used for conducting the triode during fault detection of the mutual inductor (4), the leakage protection chip (5), the thyristor and the trip coil, and generating simulation leakage to detect the functions of the mutual inductor (4), the leakage protection chip (5), the thyristor and the trip coil;
the counting module comprises a 2s counter, a 15min counter, two 20ms counters and a 60ms counter, wherein the 2s counter is used for power-on self-test for the first time and triggering the two 20ms counters; the 15min counter is used for carrying out self-checking once every 15min after the first self-checking is finished, and triggering two 20ms counters; the 20ms first counter is used for limiting fault detection on the high-power switching tube within 0-20 ms, and the 20ms second counter is used for triggering the 60ms counter and simulating a leakage signal; the 60ms counter is used for limiting fault detection on the mutual inductor (4), the leakage protection chip (5), the thyristor and the trip coil within 20-80 ms.
2. A leakage protector using the leakage protector self-test apparatus according to claim 1, comprising a self-test chip (1), an application circuit (2), an analog leakage generation circuit (3), and a leakage protection chip (5), wherein the application circuit (2) is connected to the leakage protection chip (5).
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