CN110132546A - A kind of multiple light courcess component optical parameter test method - Google Patents
A kind of multiple light courcess component optical parameter test method Download PDFInfo
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- CN110132546A CN110132546A CN201910375980.6A CN201910375980A CN110132546A CN 110132546 A CN110132546 A CN 110132546A CN 201910375980 A CN201910375980 A CN 201910375980A CN 110132546 A CN110132546 A CN 110132546A
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- multiple light
- optical parameter
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- optical
- light courcess
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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Abstract
The invention discloses a kind of multiple light courcess component optical parameter test methods.S1: the optical parameter of multiple light sources is acquired respectively with inspection electro-optical device;S2: meeting optical parameter setting value and be labeled as 1, is unsatisfactory for optical parameter setting value and is labeled as 0, the optical parameter of multiple light sources is shown in display screen by 1 or 0;Whether technical staff the multiple light courcess component can be met the requirements by 1 or 0 quick discrimination of display, and other equipment can quickly handle data according to 1 or 0 value, to understanding of the lift technique personnel to multiple light courcess component optical parameter situation, such as the single source optical parameter qualification rate of the multiple light courcess component.
Description
Technical field
The present invention relates to a kind of multiple light courcess component optical parameter test methods.
Background technique
The optical parameter by testing single source is needed to judge whether the multiple light courcess component meets multiple light courcess component
Optical parameter requirement, so that whole judge can whether the multiple light courcess component meet the requirements or be used for down one of technique;However, single
The numerical value of a light source light parameter testing is not easy to data processing and technical staff judges the optical parameter situation of the multiple light courcess component.
Summary of the invention
To solve the problems, such as that the processing of multiple light courcess component optical parameter is inconvenient, the present invention proposes a kind of multiple light courcess component optical parameter
Test method.
The technical solution of the present invention is as follows: a kind of multiple light courcess component optical parameter test method,
S1: the optical parameter of multiple light sources is acquired respectively with inspection electro-optical device;
S2: meeting optical parameter setting value and be labeled as 1, is unsatisfactory for optical parameter setting value and is labeled as 0, the optical parameter of multiple light sources passes through
1 or 0 is shown in display screen.
Further, the optical parameter is optical power, and the single source optical power of setting value W1, inspection electro-optical device acquisition are big
In W1, then the light source shows 1 on a display screen, and single source optical power is less than W1, and then the light source shows 0 on a display screen;It will survey
The multiple light courcess component of examination is shown on a display screen according to single source position is corresponding by 1 or 0.
Further, 1 or 0 is shown on a display screen when single source optical power is equal to W1.
Further, the sum of all light source optical powers labeled as 1 are overall optical power.
Further, the optical parameter is wavelength, setting value λ, when the single source wavelength of inspection electro-optical device acquisition is greater than λ
When the then light source wavelength be shown as 1, when the single source wavelength for examining electro-optical device acquisition is less than λ, the optical source wavelength is shown as 0.
Further, the wavelength of the light source is shown as 1 or 0 when single source wavelength is equal to λ.
Further, the multiple light courcess component is LED wafer.
Further, the LED wafer is bright with needle stuck point.
Further, the multiple light courcess component is the lamp plate of LED lamp bead composition.
Further, S3: the quantity of light source that numerical value is 1 is m, and the quantity of light source that numerical value is 0 is n, light in multiple light courcess component
Parameter qualification rate is*100%。
The beneficial effects of the present invention are: technical staff the multiple light courcess component can be by 1 or 0 quick discrimination of display
It is no to meet the requirements and other equipment quickly handle data according to 1 or 0 value, so that lift technique personnel are to multiple light courcess group
The understanding of part optical parameter situation, such as the single source optical parameter qualification rate of the multiple light courcess component.
Specific embodiment
For convenient for those skilled in the art understand that technical solution of the present invention, technical solution of the present invention is combined have below
Body embodiment is described in further detail.
A kind of multiple light courcess component optical parameter test method needs to examine its whole optical parameter for multiple light courcess component
It surveys, to differentiate whether its whole optical parameter meets requirement;
S1: the optical parameter of multiple light sources is acquired respectively with inspection electro-optical device;To obtain the optical parameter of single source, the inspection light dress
It is set to the device for being able to detect optical power and/or optical wavelength, such as infrared CCD, the spectrometer with flash ranging probe header;
S2: meeting optical parameter setting value and be labeled as 1, is unsatisfactory for optical parameter setting value and is labeled as 0, the optical parameter of multiple light sources passes through
1 or 0 is shown in display screen;To the ordered series of numbers that the optical parameter test result of multiple light courcess component is made of 1 or 0, by judging 1
Quantity or 1 quantity account for the ratio of 1 and 0 total quantity and can judge whether multiple light courcess component meets requirement;When
So, indicate whether meet optical parameter setting value, those skilled in the art at 1 or 0 mode just for the sake of difference single source
Also the test case of multiple light courcess optical parameter can be obtained by marking the forms such as 0 or 1, a or b;
By using the above method, those skilled in the art can come out the optical parameter quick discrimination of multiple light courcess, for example, for
LED wafer, by this method can in the quick discrimination LED wafer LED grain optical parameter qualification rate, improve test effect
Rate;By the LED lamp panel for being used to be made of LED light by above-mentioned multiple light courcess component optical parameter test method, can quickly detect most
Whether the LED lamp panel assembled eventually can satisfy optical parameter requirement.
S3: the quantity of light source that numerical value is 1 is m, and the quantity of light source that numerical value is 0 is n, optical parameter qualification rate in multiple light courcess component
For*100%;
Obtain the ratio of each total quantity of light source of quantity of light source Zhan, thus obtain the quantity to light source qualified in light source assembly,
Can judge whether the multiple light courcess component is qualified according to the ratio;For the product of LED lamp bead composition, due to producing LED light
The every procedure of pearl needs to detect, i.e., every LED lamp bead before being assembled into multiple light courcess component (LED lamp bead) is qualified production
Product, if being assembled into, qualification rate after LED lamp panel is too low, reflects that the packaging technology of LED lamp bead is unqualified, consequently facilitating technology people
Member improves the packaging technology of LED lamp bead.
The multiple light courcess component of test is shown on a display screen according to single source position is corresponding by 1 or 0, technology people is convenient for
The position of the intuitive observation multiple light courcess component qualification single source of member, retains the different use ages in multiple light courcess component use process
Light source position improved consequently facilitating technical staff observes the rule of multiple light courcess aging in use convenient for technical staff
Arrangement to single source in light source assembly promotes the service life of multiple light courcess component.
The optical parameter is optical power, and the single source optical power of setting value W1, inspection electro-optical device acquisition then should greater than W1
Light source shows 1 on a display screen, and single source optical power is less than W1, and then the light source shows 0 on a display screen;Test multiple light courcess
The optical power of component, to calculate effective optical power of multiple light courcess component.
Single source optical power shows 1 or 0 when being equal to W1 on a display screen, and technical staff sets according to actual needs.
The sum of multiple light sources optical power labeled as 1 is overall optical power, which is considered as the light of multiple light courcess component
Power goes out the optical power of multiple light courcess component by the method rapid survey;Certainly, the total optical power is no more than multiple light courcess component
Practical optical power.
The optical parameter is wavelength, setting value λ, the then light when the single source wavelength for examining electro-optical device acquisition is greater than λ
The wavelength in source is shown as 1, and when the single source wavelength for examining electro-optical device acquisition is less than λ, the optical source wavelength is shown as 0;To single
Optical source wavelength meets setting value λ, to show whether the wavelength of single source in multiple light courcess component meets setting value, convenient for quick
Differentiate the qualification rate of single source in the multiple light courcess component.
The wavelength of the light source is shown as 1 or 0 when single source wavelength is equal to λ;It will meet or be unsatisfactory for wavelength using 1 or 0
Whether wavelength value also can be met setting value using other symbols such as a or b by setting value λ difference, certainly, those skilled in the art
It differentiates.
The multiple light courcess component is LED wafer;LED wafer is tested, can quickly be judged by the method single led
The optical parameter of crystal grain whether meet the requirements and the LED wafer in qualified LED grain very little then unnecessarily to the LED grain into
Row is tested in next step, convenient for reducing the testing cost of LED wafer.
The LED wafer is bright with needle stuck point, this is a kind of mode for making single led crystal grain (single source) luminous, for
Small LED grain can be improved the accuracy of acupuncture treatment resetting using needle card, promote testing efficiency.The multiple light courcess component
For the lamp plate of LED lamp bead composition.
The above are preferred embodiments of the present invention, is not intended to limit the scope of the invention.It should approve, this field skill
Art personnel made non-creative deformation and change after understanding technical solution of the present invention, should also belong to protection of the invention
The scope of disclosure and.
Claims (10)
1. a kind of multiple light courcess component optical parameter test method, it is characterised in that:
S1: the optical parameter of multiple light sources is acquired respectively with inspection electro-optical device;
S2: meeting optical parameter setting value and be labeled as 1, is unsatisfactory for optical parameter setting value and is labeled as 0, the optical parameter of multiple light sources passes through
1 or 0 is shown in display screen.
2. multiple light courcess component optical parameter test method according to claim 1, it is characterised in that:
The optical parameter is optical power, and the single source optical power of setting value W1, inspection electro-optical device acquisition are greater than W1 then light source
1 is shown on a display screen, and single source optical power is less than W1, and then the light source shows 0 on a display screen;By the multiple light courcess group of test
Part is shown on a display screen according to single source position is corresponding by 1 or 0.
3. multiple light courcess component optical parameter test method according to claim 2, it is characterised in that: single source optical power etc.
Show 1 or 0 on a display screen when W1.
4. according to multiple light courcess component optical parameter test method described in Claims 2 or 3 any one, it is characterised in that: label
It is overall optical power for 1 the sum of all light source optical powers.
5. multiple light courcess component optical parameter test method according to claim 1, it is characterised in that:
The optical parameter is wavelength, setting value λ, the then light source when the single source wavelength for examining electro-optical device acquisition is greater than λ
Wavelength is shown as 1, and when the single source wavelength for examining electro-optical device acquisition is less than λ, the optical source wavelength is shown as 0.
6. multiple light courcess component optical parameter test method according to claim 5, it is characterised in that:
The wavelength of the light source is shown as 1 or 0 when single source wavelength is equal to λ.
7. multiple light courcess component optical parameter test method according to claim 1, it is characterised in that:
The multiple light courcess component is LED wafer.
8. multiple light courcess component optical parameter test method according to claim 7, it is characterised in that:
The LED wafer is bright with needle stuck point.
9. multiple light courcess component optical parameter test method according to claim 1, it is characterised in that:
The multiple light courcess component is the lamp plate of LED lamp bead composition.
10. multiple light courcess component optical parameter test method according to claim 1, it is characterised in that:
S3: the quantity of light source that numerical value is 1 is m, and the quantity of light source that numerical value is 0 is n, and optical parameter qualification rate is in multiple light courcess component*100%。
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Citations (6)
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CN102004029A (en) * | 2010-09-21 | 2011-04-06 | 江苏宏康节能服务有限公司 | Light source parameter testing method and device for testing light source parameters |
CN102540036A (en) * | 2010-12-24 | 2012-07-04 | 苏州明玖节能科技有限公司 | High-efficiency testing method for photoelectric property of LED (Light-Emitting Diode) |
CN204241191U (en) * | 2014-12-02 | 2015-04-01 | 宁波协源光电科技有限公司 | Be used for detecting the servicing unit of LED lamp bead luminous mass |
CN105116354A (en) * | 2015-09-06 | 2015-12-02 | 深圳市源磊科技有限公司 | Online testing apparatus and online testing method for LED encapsulation |
CN105675268A (en) * | 2016-03-22 | 2016-06-15 | 苏州伽蓝致远电子科技股份有限公司 | Fiber connector adjustable square wave tester |
CN106443539A (en) * | 2016-08-31 | 2017-02-22 | 安徽芯瑞达电子科技有限公司 | Method for calibration and re-test of LED beam splitter |
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2019
- 2019-05-07 CN CN201910375980.6A patent/CN110132546A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102004029A (en) * | 2010-09-21 | 2011-04-06 | 江苏宏康节能服务有限公司 | Light source parameter testing method and device for testing light source parameters |
CN102540036A (en) * | 2010-12-24 | 2012-07-04 | 苏州明玖节能科技有限公司 | High-efficiency testing method for photoelectric property of LED (Light-Emitting Diode) |
CN204241191U (en) * | 2014-12-02 | 2015-04-01 | 宁波协源光电科技有限公司 | Be used for detecting the servicing unit of LED lamp bead luminous mass |
CN105116354A (en) * | 2015-09-06 | 2015-12-02 | 深圳市源磊科技有限公司 | Online testing apparatus and online testing method for LED encapsulation |
CN105675268A (en) * | 2016-03-22 | 2016-06-15 | 苏州伽蓝致远电子科技股份有限公司 | Fiber connector adjustable square wave tester |
CN106443539A (en) * | 2016-08-31 | 2017-02-22 | 安徽芯瑞达电子科技有限公司 | Method for calibration and re-test of LED beam splitter |
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