CN110118929B - Testing device and testing method for cut-off equipment - Google Patents
Testing device and testing method for cut-off equipment Download PDFInfo
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- CN110118929B CN110118929B CN201810916506.5A CN201810916506A CN110118929B CN 110118929 B CN110118929 B CN 110118929B CN 201810916506 A CN201810916506 A CN 201810916506A CN 110118929 B CN110118929 B CN 110118929B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
Abstract
The invention provides a test device and a test method for cut-off equipment, wherein the test device comprises: a first charging circuit, a second charging circuit and a discharging circuit; the first charging circuit is connected with the discharging circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit; the second charging circuit is connected with the discharging branch circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit; the discharge circuit is provided with a port for accessing the cut-off device. The test method is based on the test device to perform the on-off, on-off and reclosing tests on the to-be-detected on-off equipment. The invention realizes effective and comprehensive test of the breaking performance of the breaking equipment.
Description
Technical Field
The invention belongs to the technical field of power electronics, and particularly relates to a test device and a test method for a switching-on/off device.
Background
The switching device is an important device in a power transmission and distribution system and is mainly used for switching on and switching off current under an abnormal circuit condition within a specified time. The current on-off test occupies an important position in the research and development process of the on-off equipment, and is a main means for evaluating the on-off performance of the on-off equipment. In the prior art, a discharge capacitor is connected with an inductor in series, and the current rises to simulate circuit faults when the capacitor discharges, so that the switching-off performance of the switching-off equipment is tested. However, in practical applications, the switching device needs to have not only the capability of switching off the fault current, but also the capability of switching on and off and reclosing. There is therefore a higher and more comprehensive requirement for the performance check of the breaking device.
Disclosure of Invention
The present invention is directed to overcome the above-mentioned drawbacks of the prior art, and provides a device and a method for testing a breaking apparatus.
An aspect of the present invention provides a test apparatus for a cut-off device, including:
a first charging circuit, a second charging circuit and a discharging circuit;
the first charging circuit is connected with the discharging circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit;
the second charging circuit is connected with the discharging branch circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit;
the discharge circuit is provided with a port for accessing the cut-off device.
Further, the first charging circuit comprises a first direct current power supply, a first mechanical switch, a first diode and a first capacitor which are connected in series; the first mechanical switch is connected to the high-voltage end of the first direct-current power supply, and the first capacitor is connected to the low-voltage end of the first direct-current power supply; the first charging circuit further comprises a third fast mechanical switch connected with the high potential end of the first capacitor;
the second charging circuit comprises a second direct-current power supply, a second mechanical switch, a second diode and a second capacitor which are connected in series; the second mechanical switch is connected to the high-voltage end of the second direct-current power supply, and the second capacitor is connected to the low-voltage end of the second direct-current power supply; the second charging circuit also comprises a fourth quick mechanical switch connected with the high potential end of the second capacitor;
the third quick mechanical switch and the fourth quick mechanical switch are connected; the low-voltage ends of the power supplies of the two charging circuits are connected;
the discharge circuit comprises a current-limiting reactor and a solid-state switch, wherein the current-limiting reactor is connected in series and is used for being connected to a port of a to-be-tested cut-off device;
the current-limiting reactor is connected with the third quick mechanical switch and the fourth quick mechanical switch; the solid-state switch is connected with the low-voltage ends of the two power supplies;
further, the test device for the cut-off equipment further comprises:
a bleeding circuit;
the bleeder circuit comprises an energy consuming element;
the bleeder circuit is connected in parallel across the solid state switch.
Further, the test device for the cut-off equipment further comprises:
a test monitoring device, said test monitoring device comprising: the current monitoring device, the voltage monitoring device and the controller are used for controlling the mechanical switch and the quick mechanical switch to act.
In another aspect of the present disclosure, a disconnection testing method based on the above disconnection device testing apparatus is provided, which includes the following steps:
before the test, the first charging circuit, the second charging circuit and the discharging circuit are respectively in a non-conducting state, and the to-be-tested cut-off equipment is connected between test ports provided by the discharging circuit;
the switching-on and switching-off equipment to be tested is in a switching-on state;
the solid-state switch is conducted, and the bleeder circuit is bypassed;
the first mechanical switch is closed, the first charging circuit is controlled to be conducted, the capacitor in the first charging circuit is charged, the first mechanical switch is disconnected after charging is completed, and the first charging circuit is disconnected;
during testing, the third mechanical switch is closed, the first charging circuit is controlled to be communicated with the discharging circuit, the first capacitor in the first charging circuit discharges, an oscillating circuit is formed by the first capacitor and a current-limiting reactor in the discharging circuit, and current in the circuit rises;
after the preset time, controlling the switching-off equipment to execute switching-off operation;
after the preset time, the solid-state switch is switched off, the discharge circuit is switched in, and the residual charge is discharged.
In another aspect of the present disclosure, a closing test method based on the above test device for a switching device is further provided, which includes the following steps:
before the test, the first charging circuit, the second charging circuit and the discharging circuit are respectively in a non-conducting state, and the to-be-tested cut-off equipment is connected between test ports provided by the discharging circuit;
the switching-off equipment to be tested is in a switching-off state;
the solid-state switch is conducted, and the bleeder circuit is bypassed;
the first mechanical switch is closed, the first charging circuit is controlled to be conducted, the capacitor in the first charging circuit is charged, the first mechanical switch is disconnected after charging is completed, and the first charging circuit is disconnected;
during testing, the third mechanical switch is closed, the first charging circuit is controlled to be communicated with the discharging circuit, the first capacitor in the first charging circuit discharges, an oscillating circuit is formed by the first capacitor and a current-limiting reactor in the discharging circuit, and current in the circuit rises;
after preset time, controlling the switching-on/off equipment to execute switching-on operation;
after the preset time, the solid-state switch is switched off, the discharge circuit is switched in, and the residual charge is discharged.
The closing operation is used for rapid closing under the condition of simulating circuit faults, and the closing operation is carried out several milliseconds after the circuit faults. The method mainly aims to verify whether the fault is a permanent fault, if so, the fault on-off equipment is disconnected again, and if not, the fault on-off equipment is switched on.
In another aspect of the present disclosure, a reclosing test method based on the above test device for a switching device is further provided, which includes the following steps:
before the test, the first charging circuit, the second charging circuit and the discharging circuit are respectively in a non-conducting state, and the to-be-tested cut-off equipment is connected between test ports provided by the discharging circuit;
the switching-on and switching-off equipment to be tested is in a switching-on state;
the solid-state switch is conducted, and the bleeder circuit is bypassed;
the first mechanical switch is closed, the first charging circuit is controlled to be conducted, the capacitor in the first charging circuit is charged, the first mechanical switch is disconnected after charging is completed, and the first charging circuit is disconnected;
closing the second mechanical switch to control the second charging circuit to be conducted, charging the capacitor in the second charging circuit, disconnecting the second mechanical switch after charging is finished, and disconnecting the second charging circuit;
during testing, the third mechanical switch is closed, the first charging circuit is controlled to be communicated with the discharging circuit, the first capacitor in the first charging circuit discharges, an oscillating circuit is formed by the first capacitor and a current-limiting reactor in the discharging circuit, and current in the circuit rises;
after the preset time, controlling the switching-off equipment to execute switching-off operation;
after the preset time, the third mechanical switch is switched off, the first charging circuit and the discharging circuit are controlled to be switched off, the fourth mechanical switch is switched on, the second charging circuit and the discharging circuit are controlled to be communicated, a capacitor in the second charging circuit discharges, an oscillating circuit is formed by the capacitor and a reactor in the discharging circuit, and the current in the circuit rises;
after preset time, controlling the switching-off equipment to execute reclosing operation;
after the preset time, the solid-state switch is disconnected, the discharging circuit is connected to the discharging circuit, and the residual charges are discharged.
Reclosing is an operation performed several hundred milliseconds after a fault, and is used for judging whether the system successfully implements fault isolation and recovery, if the system is successfully recovered, closing is performed, and if the system is not successfully recovered, opening is continuously performed.
The breaking equipment testing device disclosed by the invention can effectively simulate fault current and test the breaking performance, the closing performance and the reclosing performance of the breaking equipment. The effective and comprehensive inspection of the performance of the switching-off equipment is realized.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and are intended to provide further explanation of the claimed technology.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent by describing in more detail embodiments of the present invention with reference to the attached drawings. The accompanying drawings are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. The drawings are not to be considered as drawn to scale unless explicitly indicated. In the drawings, like reference numbers generally represent the same component or step. In the drawings:
fig. 1 shows a current controller open test circuit diagram.
Fig. 2 shows the current over time during the switching-off of the current controller.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, exemplary embodiments according to the present invention will be described in detail below with reference to the accompanying drawings. It is to be understood that the described embodiments are merely a subset of embodiments of the invention and not all embodiments of the invention, with the understanding that the invention is not limited to the example embodiments described herein. All other embodiments, which can be derived by a person skilled in the art from the embodiments described herein without inventive step, are intended to be within the scope of the present invention.
The invention discloses a test device and a test method of a breaking device, wherein the embodiment of the invention takes a current controller as the breaking device as an example, and the test device and the test method are explained in detail, but the invention is not limited to the current controller, and any device capable of realizing circuit breaking can be suitable for the invention.
Fig. 1 shows a current controller open test circuit diagram comprising:
a first charging circuit, a second charging circuit and a discharging circuit;
the first charging circuit is connected with the discharging circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit;
the second charging circuit is connected with the discharging branch circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit;
the discharge circuit is provided with a port for accessing the current controller.
The first charging circuit comprises a direct current power supply DC1, a mechanical switch K1, a diode D1 and a capacitor Cs1 which are connected in series; the mechanical switch K1 is connected to the high-voltage end of the direct-current power supply, and the capacitor Cs1 is connected to the low-voltage end of the direct-current power supply; the first charging circuit further comprises a fast mechanical switch K3 connected to the high potential terminal of the capacitor Cs 1;
the second charging circuit comprises a direct current power supply DC2, a mechanical switch K2, a diode D2 and a capacitor Cs2 which are connected in series; the mechanical switch K2 is connected to the high-voltage end of the direct-current power supply, and the capacitor Cs2 is connected to the low-voltage end of the direct-current power supply; the second charging circuit further comprises a fast mechanical switch K4 connected to the high potential terminal of the capacitor Cs 2;
the K3 and the K4 are connected; the low-voltage ends of power supplies DC1 and DC2 of the two charging circuits are connected;
the discharge circuit comprises a current-limiting reactor Ls, a current controller to be tested and a solid-state switch which are connected in series;
in this embodiment, the current controller includes a current limiter LK, a fast mechanical switch KT, a commutation branch, and a metal oxide varistor MOV; the mechanical switch KT, the current conversion branch and the metal oxide piezoresistor MOV are connected in parallel and then are connected in series with the current limiter LK; the current conversion branch circuit consists of a charging power supply, a capacitor and a solid-state switch;
a current limiter LK of the current controller is connected with a current limiting reactor Ls, and the other end of the current controller is connected with the solid-state switch;
the current limiting reactor Ls is connected with K3 and K4; the solid-state switch connected in series with the discharge circuit is connected with the low-voltage ends of two power supplies DC1 and DC 2;
the current controller testing device also comprises a bleeder circuit; the bleeder circuit comprises a dissipation resistor Rs; the bleeder circuit is connected in parallel at two ends of the solid-state switch.
The current controller testing device further comprises a testing monitoring device, and the testing monitoring device comprises: current monitoring device CT, voltage monitoring device VT, controller for controlling mechanical switch and quick mechanical switch.
The invention also discloses a series of test methods based on the current controller test device. The method comprises the following steps: a current on-off test method, a current off-on test method and a reclosing test method; the following describes the test methods in detail.
The current on-off test method comprises the following specific steps:
before testing, the change-over switches K1, K2, K3 and K4 are in an opening state, the solid-state switches are in a conducting state, the current controller to be tested is in a closing state, and the current controller is in a closing monitoring state;
controlling K1 to be switched on, starting a direct-current charging power supply DC1 to charge the capacitor bank Cs1 to a specified voltage, then controlling K1 to be switched off, and ending charging;
in the test, K3 is turned on, and the capacitor bank Cs1 discharges through the reactor Ls, so that the current of the discharge circuit increases. After a preset time, the current controller executes the opening operation; in this embodiment, the certain time is generally several milliseconds to several tens milliseconds, and the opening operation is used to detect whether the current controller has the capability of opening and closing the current under certain conditions.
After a predetermined time, the solid-state switch is turned off to discharge the residual charge. In this embodiment, the predetermined time is generally several milliseconds. The operation of discharging the residual electricity effectively protects circuit elements and avoids element damage caused by the fact that the current controller cannot normally operate.
The current closing test method comprises the following specific steps:
before testing, the change-over switches K1, K2, K3 and K4 are in a switching-off state, the solid-state switches are in a conducting state, and the current controller to be tested is in a switching-off state;
controlling K1 to be switched on, starting a direct-current charging power supply DC1 to charge the capacitor bank Cs1 to a specified voltage, then controlling K1 to be switched off, and ending charging;
during testing, K3 is switched on, the capacitor bank Cs1 discharges through the reactor Ls, the current of a discharging circuit rises, and the current controller executes switching-on operation after preset time; in the present embodiment, the predetermined time is several milliseconds to several tens milliseconds. The switching-on operation is used for detecting whether the current controller has the capability of switching on under a certain condition, and in practical application, when a circuit fails and the current controller automatically switches off, the current controller needs to be switched on for trial to confirm the existence of the fault.
After a predetermined time, the solid-state switch is turned off to discharge the residual charge. In this embodiment, the predetermined time is several milliseconds. The operation of discharging the residual electricity effectively protects circuit elements and avoids element damage caused by the fact that the current controller cannot normally operate.
The reclosing test method specifically comprises the following steps:
before the test, the change-over switches K1, K2, K3 and K4 are in a closing state, the solid-state switches are in a conducting state, and the current controller to be tested is in a closing state;
controlling K1 to be switched on, starting a direct-current charging power supply DC1 to charge the capacitor bank Cs1 to a specified voltage, then controlling K1 to be switched off, and ending charging;
controlling K2 to be switched on, starting a direct-current charging power supply DC2 to charge the capacitor bank Cs2 to a specified voltage, then controlling K2 to be switched off, and ending charging;
during testing, K3 is switched on, the capacitor bank Cs1 discharges through the reactor Ls, the current of a discharging circuit rises, and after a preset time, the current controller executes switching-off operation; in this embodiment, the predetermined time is generally several milliseconds to several tens milliseconds.
After a preset time, generally hundreds of milliseconds, opening a brake K3 and closing a brake K4; after a certain time is set, the current controller executes reclosing operation; the certain time is typically several hundred milliseconds.
After a predetermined time, the solid-state switch is turned off to discharge the residual charge. In this embodiment, the predetermined time is generally several milliseconds. The operation of discharging the residual electricity effectively protects circuit elements and avoids element damage caused by normal incapability of operating the current controller.
By using the current controller testing device and the testing method, the dynamic processes of voltage recovery and fault current recovery at the current conversion stage can be effectively equalized, and the on-off and on-off functions of the current controller can be detected. The arrangement of two charging circuits in the device can provide analog current for two continuous switching-on operations within a certain time interval. Therefore, the current controller testing device and the testing method can perform multi-aspect equivalent testing on the actual application scene of the current controller, and guarantee is provided for the reliability of the current controller.
In this embodiment, the current controller is a device capable of monitoring a current change and interrupting the current under a certain condition. The fault current controller turn-off process will be briefly described with reference to fig. 2:
the breaking test process is mainly divided into 3 stages: a current rise phase, a commutation phase and a voltage recovery phase.
1) Current rise phase (t1-t 3): and at the time K1 of t1, the current source circuit discharge capacitor Cs1 and the current-limiting reactor Ls oscillate to generate a power frequency current i1 to simulate direct-current fault current, and the current i1 flows through the tested mechanical switch KT. And at the time t2, the current controller receives a brake opening command to start brake opening and arc burning, and the effective opening distance is reached before the current peak value.
2) Commutation stage (t3-t 4): at the time of t3, the current i1 reaches a peak value, the solid-state switch on the commutation branch receives a conducting command, the commutation branch generates a high-frequency reverse current i2, the high-frequency reverse current is simultaneously superposed on KT, when i2 is equal to i1, the KT current is switched off at a zero crossing, and the solid-state switch in the commutation branch receives a switching-off command.
3) Recovery voltage phase (t > t 4): after KT current is extinguished in zero crossing, the current conversion branch circuit partially oscillates to generate Transient Recovery Voltage (TRV) which is added at two ends of an MOV fracture, and at the moment, fault current is consumed by the MOV.
Those skilled in the art will understand that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art may modify the technical solutions described in the foregoing embodiments or may substitute some or all of the technical features; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions.
Claims (2)
1. A cut-off test method based on a cut-off equipment test device is characterized in that,
the break-make equipment testing device comprises:
a first charging circuit, a second charging circuit and a discharging circuit;
the first charging circuit is connected with the discharging circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit;
the second charging circuit is connected with the discharging circuit, and the charging circuit can be controlled to discharge after being charged so as to provide current for the discharging circuit;
the discharge circuit is provided with a port for accessing the cut-off equipment;
the first charging circuit comprises a first direct current power supply, a first mechanical switch, a first diode and a first capacitor which are connected in series; the first mechanical switch is connected to the high-voltage end of the first direct-current power supply, and the first capacitor is connected to the low-voltage end of the first direct-current power supply; the first charging circuit further comprises a third fast mechanical switch connected with the high potential end of the first capacitor;
the second charging circuit comprises a second direct-current power supply, a second mechanical switch, a second diode and a second capacitor which are connected in series; the second mechanical switch is connected to the high-voltage end of the second direct-current power supply, and the second capacitor is connected to the low-voltage end of the second direct-current power supply; the second charging circuit also comprises a fourth quick mechanical switch connected with the high potential end of the second capacitor;
the third quick mechanical switch and the fourth quick mechanical switch are connected; the low-voltage ends of the power supplies of the two charging circuits are connected;
the discharge circuit comprises a current-limiting reactor and a solid-state switch, wherein the current-limiting reactor is connected in series and is used for being connected to a port of a to-be-tested cut-off device;
the current-limiting reactor is connected with the third quick mechanical switch and the fourth quick mechanical switch; the solid-state switch is connected with the low-voltage ends of the two power supplies;
the test device of the on-off equipment also comprises a bleeder circuit;
the bleeder circuit comprises an energy consuming element;
the bleeder circuit is connected in parallel at two ends of the solid-state switch;
the break-make testing method comprises the following steps:
before the test, the first charging circuit, the second charging circuit and the discharging circuit are respectively in a non-conducting state, and the to-be-tested cut-off equipment is connected between test ports provided by the discharging circuit;
the switching-on and switching-off equipment to be tested is in a switching-on state;
the solid-state switch is conducted, and the bleeder circuit is bypassed;
the first mechanical switch is closed, the first charging circuit is controlled to be conducted, the capacitor in the first charging circuit is charged, the first mechanical switch is disconnected after charging is completed, and the first charging circuit is disconnected;
during testing, the third mechanical switch is closed, the first charging circuit is controlled to be communicated with the discharging circuit, the first capacitor in the first charging circuit discharges, an oscillating circuit is formed by the first capacitor and a current-limiting reactor in the discharging circuit, and current in the circuit rises;
after the preset time, controlling the switching-off equipment to execute switching-off operation;
after the preset time, the solid-state switch is switched off, the discharge circuit is connected to the discharge circuit, and the residual charge is discharged;
the disconnection testing method further comprises the following steps of:
before the test, the first charging circuit, the second charging circuit and the discharging circuit are respectively in a non-conducting state, and the to-be-tested cut-off equipment is connected between test ports provided by the discharging circuit;
the switching-off equipment to be tested is in a switching-off state;
the solid-state switch is conducted, and the bleeder circuit is bypassed;
the first mechanical switch is closed, the first charging circuit is controlled to be conducted, the capacitor in the first charging circuit is charged, the first mechanical switch is disconnected after charging is completed, and the first charging circuit is disconnected;
during testing, the third mechanical switch is closed, the first charging circuit is controlled to be communicated with the discharging circuit, the first capacitor in the first charging circuit discharges, an oscillating circuit is formed by the first capacitor and a current-limiting reactor in the discharging circuit, and current in the circuit rises;
after preset time, controlling the switching-on/off equipment to execute switching-on operation;
after the preset time, the solid-state switch is switched off, the discharge circuit is connected to the discharge circuit, and the residual charge is discharged;
the switching-on operation is used for simulating the rapid switching-on and switching-off under the condition of circuit failure, and the switching-on operation is carried out several milliseconds after the circuit failure; the switching-on operation is used for verifying whether the fault is a permanent fault, if so, the fault switching-off equipment is disconnected again, and if not, switching-on is carried out;
the disconnection testing method further comprises reclosing operation:
before the test, the first charging circuit, the second charging circuit and the discharging circuit are respectively in a non-conducting state, and the to-be-tested cut-off equipment is connected between test ports provided by the discharging circuit;
the switching-on and switching-off equipment to be tested is in a switching-on state;
the solid-state switch is conducted, and the bleeder circuit is bypassed;
the first mechanical switch is closed, the first charging circuit is controlled to be conducted, the capacitor in the first charging circuit is charged, the first mechanical switch is disconnected after charging is completed, and the first charging circuit is disconnected;
closing the second mechanical switch to control the second charging circuit to be conducted, charging the capacitor in the second charging circuit, disconnecting the second mechanical switch after charging is finished, and disconnecting the second charging circuit;
during testing, the third mechanical switch is closed, the first charging circuit is controlled to be communicated with the discharging circuit, the first capacitor in the first charging circuit discharges, an oscillating circuit is formed by the first capacitor and a current-limiting reactor in the discharging circuit, and current in the circuit rises;
after the preset time, controlling the switching-off equipment to execute switching-off operation;
after the preset time, the third mechanical switch is switched off, the first charging circuit and the discharging circuit are controlled to be switched off, the fourth mechanical switch is switched on, the second charging circuit and the discharging circuit are controlled to be communicated, a capacitor in the second charging circuit discharges, an oscillating circuit is formed by the capacitor and a reactor in the discharging circuit, and the current in the circuit rises;
after preset time, controlling the switching-off equipment to execute reclosing operation;
after the preset time, the solid-state switch is switched off, the discharge circuit is connected to the discharge circuit, and the residual charge is discharged;
reclosing operation is carried out hundreds of milliseconds after the fault, and is used for judging whether the system successfully implements fault isolation and recovery or not, switching on is carried out if the system is successfully recovered, and switching off is carried out continuously if the system is not successfully recovered.
2. The method according to claim 1, wherein the test device further comprises a test monitoring device, and the test monitoring device comprises: the current monitoring device, the voltage monitoring device and the controller are used for controlling the mechanical switch and the quick mechanical switch to act.
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