CN110083497B - Time management system for integrated circuit test equipment - Google Patents
Time management system for integrated circuit test equipment Download PDFInfo
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- CN110083497B CN110083497B CN201910327541.8A CN201910327541A CN110083497B CN 110083497 B CN110083497 B CN 110083497B CN 201910327541 A CN201910327541 A CN 201910327541A CN 110083497 B CN110083497 B CN 110083497B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The invention relates to a machine-hour management system of integrated circuit test equipment, which comprises a machine-hour application module, a machine-hour scheduling module, a comprehensive information display module and a background database, wherein the machine-hour application module, the machine-hour scheduling module and the comprehensive information display module are respectively electrically connected with the database through a server, a plurality of ATE (automatic test equipment) client sides are in bidirectional signal transmission connection with the server, the machine-hour application module supports different types of user to carry out machine-hour application, an applicant provides the type and configuration requirements of applied ATE, specific parameter requirements and expected use time periods, and the demand information of a plurality of application parties is gathered to the machine-hour scheduling module through the background database and is automatically matched with the current test equipment; the machine-time scheduling module realizes machine-time intelligent scheduling management, extracts machine-time matched with the type and configuration of the required ATE, the parameter requirements of the ATE and the use time period from a background database, and automatically lists the machine-time matched with the ATE according to the matching degree sequence for a machine-time scheduling manager to select.
Description
Technical Field
The invention relates to integrated circuit test equipment, in particular to a system for realizing intelligent on-demand scheduling of the integrated circuit test equipment and facilitating the machine-hour management of the integrated circuit test equipment.
Background
The prior art is as follows: manual allocation of test equipment machine time:
in an integrated circuit test facility, there are typically hundreds or thousands of integrated circuit test devices. During CP test, different configured ATE and Prober with different parameters are collocated together to realize CP test of integrated circuit with various requirements; during FT test, ATE with different configurations is matched with handlers with different parameters, and FT test of integrated circuits with various requirements is achieved. The common configuration of ATE includes different numbers of power boards, digital channel boards, optional mixed signal boards, radio frequency boards, and the like; the parameters of the Prober include the size of the support wafer, such as 6 inches, 8 inches, 12 inches, etc., and the supported test temperature, such as normal temperature, high temperature, low temperature, etc.; the parameters of the Handler comprise the circuit simultaneous test supporting a plurality of stations, such as single station, 4 stations, 8 stations and the like, and the test supporting temperature, such as normal temperature, high temperature, low temperature and the like.
What are the test equipment available for each type of integrated circuit test? What are the test devices that meet the requirements in the application period available at idle? These problems are all that at present, the specific configurations and parameters of ATE, prober, handler and the like are manually checked to determine which test devices are satisfactory, then checked which test devices are not faulty and are available in idle time period, if a plurality of integrated circuits require the same set of test devices at the same time, the test devices need to be sorted according to priority, and finally a certain set of test devices is allocated to the circuit for use. When the machine is used, the manual allocation is carried out, the efficiency is low, the allocation error is easily caused by human negligence or manual error, the use is delayed, and when the equipment is used, a user is not in time to return the machine, and the machine time waste is caused; the use condition of the actual machine needs to be manually registered and counted, and the method is not accurate enough and is inconvenient to analyze.
Therefore, a set of intelligent machine time management system for integrated circuit test equipment is required to intelligently distribute the use requirements of the test machines provided by different users, and can acquire and analyze the use states of all the test equipment in real time.
Disclosure of Invention
The invention provides a machine hour management system of integrated circuit test equipment, which aims to solve the problem that various test equipment cannot be automatically allocated when in machine hour during integrated circuit test, realize intelligent scheduling of the integrated circuit test equipment according to needs and facilitate machine hour management of the integrated circuit test equipment.
In order to achieve the purpose, the technical scheme of the invention is as follows: the utility model provides a management system when integrated circuit test equipment machine, applies for module, dispatch module, integrated information display module, backstage database when machine including machine, application module, dispatch module, integrated information display module when machine are connected the database through server electricity respectively, and a plurality of ATE customer ends are connected with the two-way signal transmission of server, wherein:
the machine-hour application module supports different types of users to carry out machine-hour application, an applicant provides the type and configuration requirements of applied ATE, specific parameter requirements and expected use time periods, and the requirement information of a plurality of application parties is summarized to the machine-hour scheduling module by a background database and is automatically matched with the current existing testing equipment;
the machine-time scheduling module realizes machine-time intelligent scheduling management, extracts machine-time matched with the type and configuration of the required ATE, the parameter requirements of the ATE and the use time period from a background database, and automatically lists the machine-time matched with the ATE according to the matching degree sequence for a machine-time scheduling manager to select;
the background database supports distribution and response of the requirements of each ATE client at each stage;
the comprehensive information display module supports all corresponding users with authority to inquire: displaying the use state of the machine; displaying the working state of an operator; displaying the yield; a call support status prompt; and (6) warning the abnormity.
Further, when a plurality of opportunistic demands exist, the opportunistic scheduling module can give an automatic matching result according to the demands; after a large amount of historical use records are accumulated in the system, a neural network model is trained by adopting an enhanced learning method, and the optimal recommendation can be given according to the past use experience of an applicant when the user applies for the next machine offering.
Furthermore, after the machine is scheduled by the machine scheduling module, when a user logs in at an ATE client, the system can automatically identify the user type and display a corresponding interface, and if the user is a production interface, the system can display the work prompt and the patrol point inspection functions of the current batch, the previous batch and the next batch; if the engineering debugging is carried out, a starting/ending function, call support and setup function are provided; counting when starting the machine from user login, reminding the current user before the current task is finished, and storing the debugging program and the collected data in time; when the user logs out after use, the system records the corresponding machine hour use time;
furthermore, when in use, if necessary, a user can call the production scheduling center through the call support function of the system to provide technology, equipment and operation support; meanwhile, when the user uses the ATE client, the system background records all action records of the user for query; in addition, each ATE client side can display the scheduling condition of the ATE when the ATE is in operation, and can query all scheduling of a preamble, a current sequence and a subsequent sequence by self.
Furthermore, the system collects all the test equipment in real time by taking day/week/month as a cycle, automatically forms a real-time use report, and can perform corresponding real-time use condition and operation normative analysis according to needs.
The invention has the beneficial effects that:
the intelligent machine hour management system for the integrated circuit test equipment intelligently distributes the use requirements of the test machines proposed by different users, and can acquire and analyze the use states of all the test equipment machines in real time.
By the technical scheme, the problems that the existing testing equipment is low in efficiency due to manual distribution, distribution errors are easily caused by human negligence or manual errors, use is delayed, a user cannot timely return the equipment after the equipment is used, machine time waste is caused, manual registration statistics is needed for use conditions of actual machine time, and the equipment is inaccurate and inconvenient to analyze are solved. The intelligent scheduling of the integrated circuit testing equipment according to the requirements is realized, and the on-line management of the integrated circuit testing equipment is facilitated.
Drawings
FIG. 1 is a diagram of the present invention's machine management system architecture;
FIG. 2 is a machine hour application interface of the machine hour management system;
fig. 3 is a real-time display interface of the comprehensive information of the testing equipment.
Detailed Description
The invention is further described with reference to the following figures and examples.
As shown in fig. 1, a system for managing integrated circuit testing equipment in machine time includes three modules of machine time application, machine time scheduling, and comprehensive information display, and a background database. The machine-time application module, the machine-time scheduling module and the comprehensive information display module are respectively electrically connected with the database through the server, and the plurality of ATE clients are in bidirectional signal transmission connection with the server.
The on-line application module supports different types of users to apply on-line, the applicant needs to provide the type and configuration requirements of the applied ATE, the types of matched equipment such as Prober and Handler, specific parameter requirements of the matched equipment and the expected use time period, and the required information of a plurality of application parties can be gathered to the on-line scheduling module through a background database and is automatically matched with the current existing testing equipment.
The machine-time scheduling module realizes machine-time intelligent scheduling management, extracts machine-time matched with required ATE types and configuration, supporting equipment types such as Prober, handler and the like, parameter requirements thereof and use time periods from the database, and sorts and automatically lists the machine-time matched types and configuration, the parameter requirements thereof and the use time periods to a machine-time scheduling manager according to matching degree for selection; when a plurality of opportunistic demands exist, the opportunistic scheduling module can give out an automatic matching result according to the demands. Furthermore, after a large amount of historical use records are accumulated in the system, a neural network model is trained by methods such as reinforcement learning, and the optimal recommendation can be given according to the experience of the former used machine of the applicant when the user applies for the next machine offering.
After the machine-hour is scheduled by the machine-hour scheduling module, when a user logs in at an ATE client, the system can automatically identify the user type and display a corresponding interface, and if the user is a production interface, the system can display the current batch, the previous batch, the next batch of work prompts, the inspection spot inspection function and the like; if the engineering debugging is carried out, a starting/ending function, call support, a setup function and the like are provided; counting when starting the machine from user login, reminding the current user before the current task is finished, and timely storing debugging programs, collected data and the like; and when the user logs out after use, the system records the corresponding machine hour use time. When in use, if necessary, a user can call the production scheduling center through the call support function of the system to provide support for technology, equipment, operation and the like; meanwhile, when the user uses the ATE, the system background records all action records of the user for query. In addition, each ATE client side can display the scheduling condition of the ATE when the ATE is in operation, and can query all scheduling of a preamble, a current sequence and a subsequent sequence by self.
The system collects all the test equipment in terms of time and day/week/month, automatically forms a time and use report, and can analyze the time and use condition and operation normative according to the requirement.
The background database supports distribution and response of the client requirements at each stage.
The comprehensive information display module supports the following state display and can be used for all corresponding users with authority to inquire: displaying the use state of the machine (in use, idle, fault, etc.); displaying the working state of the operator (whether the patrol is in place); displaying the yield; a call support status prompt; abnormal warning, etc.
As shown in fig. 2, for the machine hour application interface of the machine hour management system, a required test device class such as "tester" may be selected as required, and a specific test device model such as "J750Ex" fills out a required test device configuration such as "HSD200 × 2, dps × 6" and a machine hour application time period such as "2019/04/02 pm 15. After the system is requested by an application, the system is matched with all J750Ex tester configurations in the database, all J750Ex testers which meet the configurations are screened out, then the distribution is carried out according to the test equipment state (whether idle) in the applied time period, the application user is informed, and meanwhile, corresponding production operators 2019/04/02 are informed in the afternoon of 15.
And each user uses corresponding test equipment according to the time schedule, and the time schedule state can be directly acquired through the system and is correspondingly analyzed. The real-time display of the comprehensive information of the test equipment is shown in fig. 3, which test equipment is idle and which test equipment is abnormal can be visually seen, and the processing is conveniently and timely arranged.
The specific use condition of all the test equipment can be recorded in the background database, each record comprises information such as equipment name, equipment number, user, use type, product name and batch, start time, end time, machine hours and the like, for example, the actual use condition statistical table 1 of the test equipment in one week machine can be very conveniently counted and analyzed if necessary.
TABLE 1
| Serial number | Device name | Device numbering | User of the invention | Type of use | Name of product | Batch number | Starting time | End time | Machine hour number |
| 1 | J750Ex | T32 | YY | Engineering commissioning | ABC | 1911 | 2019/3/2 12:00 | 2019/3/2 16:00 | 4 |
| 2 | J750Ex | T32 | WW | Mass production testing | ABC | 1911 | 2019/3/2 16:00 | 2019/3/3 12:00 | 20 |
| 3 | J750Ex | T32 | KK | Engineering debugging | DEF | 1919 | 2019/3/3 12:00 | 2019/3/3 18:00 | 6 |
| 4 | J750Ex | T32 | WW | Mass production testing | ABC | 1911 | 2019/3/3 18:00 | 2019/3/4 18:00 | 24 |
| 5 | J750Ex | T32 | KK | Engineering commissioning | DEF | 1919 | 2019/3/5 10:00 | 2019/3/5 18:00 | 8 |
| 6 | J750Ex | T32 | WW | Mass production test | ABC | 1911 | 2019/3/5 18:00 | 2019/3/7 18:00 | 48 |
| 7 | J750Ex | T32 | KK | Engineering commissioning | DEF | 1919 | 2019/3/8 12:00 | 2019/3/8 18:00 | 6 |
| 8 | J750Ex | T32 | WW | Mass production testing | DEF | 1919 | 2019/3/8 18:00 | 2019/3/9 12:00 | 18 |
The invention solves the problems that the existing testing equipment is low in efficiency due to manual distribution, the use is delayed due to distribution errors caused by human negligence or manual errors, the user is not timely returned after the equipment is used, the machine time waste is caused, and the use condition of the actual machine time needs manual registration and statistics, so that the equipment is inaccurate and inconvenient to analyze. The intelligent scheduling of the integrated circuit test equipment as required is realized, the service state acquisition and analysis of all the test equipment machines can be carried out in real time, and the management of the integrated circuit test equipment machines is facilitated.
Claims (5)
1. The utility model provides an integrated circuit test equipment machine hour management system, includes machine hour application module, machine hour scheduling module, integrated information display module, backstage database which characterized in that: the machine-hour application module, the machine-hour scheduling module and the comprehensive information display module are respectively electrically connected with the database through the server, and a plurality of ATE clients are connected with the server through bidirectional signal transmission, wherein:
the machine-hour application module is used for supporting different types of users to carry out machine-hour applications, an applicant provides the types and configuration requirements of ATE (automatic test equipment) to be applied, specific parameter requirements and expected use time periods, and the demand information of a plurality of application parties is gathered to the machine-hour scheduling module by a background database and is automatically matched with the current existing test equipment;
the machine-time scheduling module is used for realizing machine-time intelligent scheduling management, extracting machine-time matched with the type and configuration of the required ATE, the parameter requirements of the ATE and the use time period from a background database, and automatically listing the machine-time matched with the ATE to a machine-time scheduling manager according to the matching degree for selection;
the background database is used for supporting distribution and response of the requirements of each ATE client in each stage;
the comprehensive information display module is used for supporting inquiry, machine-hour use state display, operator working state display, yield display, call support state prompt and abnormal warning of all corresponding users with authority.
2. The integrated circuit test equipment machine time management system of claim 1, wherein: when a plurality of opportunistic demands exist, the opportunistic scheduling module gives an automatic matching result according to the demands; after a large number of historical use records are accumulated in the system, a neural network model is trained by adopting an enhanced learning method, and optimal recommendation can be given according to the experience of the former used machine of an applicant when the user applies for the next machine offering.
3. The integrated circuit test equipment machine time management system of claim 1, wherein: after the machine is scheduled by the machine-hour scheduling module, when a user logs in at an ATE client, the system can automatically identify the user type and display a corresponding interface, and if the user is a production interface, the system can display the functions of current batch, previous batch, next batch of work prompt and inspection tour point inspection; if the engineering debugging is carried out, a starting/ending function, call support and setup function are provided; counting when starting the machine from user login, reminding the current user before the current task is finished, and storing the debugging program and the collected data in time; and when the user logs out after use, the system records the corresponding machine hour use time.
4. The integrated circuit test equipment runtime management system of claim 3, wherein: when in use, if necessary, a user can call the production scheduling center through the call support function of the system to provide technology, equipment and operation support; meanwhile, when the user uses the ATE client, the system background records all action records of the user for query; in addition, each ATE client side can display the scheduling condition of the ATE when the ATE is in operation, and can query all scheduling of a preamble, a current sequence and a subsequent sequence by self.
5. The integrated circuit test equipment runtime management system of any of claims 1-4, wherein: the integrated circuit test equipment machine-hour management system collects all test equipment in a time-sharing mode in a day/week/month period, automatically forms a machine-hour use report, and can perform corresponding machine-hour use condition and operation normative analysis according to needs.
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| CN113553318A (en) * | 2020-04-23 | 2021-10-26 | 海太半导体（无锡）有限公司 | ATE test failure analysis system |
| CN113359014A (en) * | 2021-08-11 | 2021-09-07 | 深圳英集芯科技股份有限公司 | Fool-proof method and system for chip test |
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