CN110082376A - A kind of biserial monocrystalline neutron analyzer module - Google Patents
A kind of biserial monocrystalline neutron analyzer module Download PDFInfo
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- CN110082376A CN110082376A CN201910418644.5A CN201910418644A CN110082376A CN 110082376 A CN110082376 A CN 110082376A CN 201910418644 A CN201910418644 A CN 201910418644A CN 110082376 A CN110082376 A CN 110082376A
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- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 9
- 210000004907 gland Anatomy 0.000 claims description 7
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 4
- 229910052796 boron Inorganic materials 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000001507 sample dispersion Methods 0.000 claims description 3
- 238000009434 installation Methods 0.000 abstract description 4
- 230000004907 flux Effects 0.000 abstract description 3
- 239000000126 substance Substances 0.000 description 8
- 238000004458 analytical method Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 239000000306 component Substances 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000001427 incoherent neutron scattering Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001956 neutron scattering Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
- G01N23/204—Measuring back scattering using neutrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2073—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions using neutron detectors
Abstract
The present invention relates to a kind of biserial monocrystalline neutron analyzer modules, comprising: bottom plate, for being located in light path system；Analyzer bracket is arranged on the bottom plate and is in tuning fork shape；The front side of the analyzer bracket is arranged in first row monocrystalline；The rear side of the analyzer bracket is arranged in secondary series monocrystalline.Analyzer bracket of the invention uses two lists of arrangement brilliant and with Rowland circle for focusing mode, has not only been able to satisfy energy resolution requirement, but also neutron beam neutron flux can be made full use of to greatly improve.Simultaneously, the analyzer bracket is used cooperatively using trapezoidal dovetail groove and trapezoidal dovetail guide, not only facilitate the multiple analyzer bracket installations of installation but also can accurately guarantee alignment, the neutron of more kinds of energy can be detected, so that the momentum point that the neutron analyzer of different-energy detects is comparable.
Description
Technical field
The present invention relates to a kind of neutron spectrometers, specifically about a kind of biserial monocrystalline neutron analyzer module, belong to neutron
Scattering technology field.
Background technique
Neutron analyzer is one of the core component of neutron inelasstic scattering spectrometer.Utilize Bragg diffraction law, neutron
Neutron of the analyzer for a certain energy of selection analysis from the neutron beam scattered through sample.In selecting through neutron analyzer
The energy of son is commonly referred to as final energy.Traditional three axis spectrometer of neutron, in horizontal dispersion plane, using neutron analyzer and
Detector realizes the measurement analytical model of (energy, momentum) point one by one, but detection efficient is too low.Scientists are being explored always
The measurement analytical model of a wide range of energy of multichannel multiple kinds of energy, momentum point can be carried out simultaneously.
A kind of changeable neutron energy in horizontal dispersion plane of the U.S. Patent Publication of Publication No. US7099437B2
The twin crystal analyzer linkage of amount, and foreign literature " MACS-a new high intensity cold neutron
Spectrometer at NIST, J.A.Rodriguez etc., Meas.Sci.Technol.19,2008 " report by will be upper
It states twin crystal analyzer linkage disclosed in patent (US7099437B2) and forms one along the circumference array centered on sample
The neutron of a 152 ° of ranges of covering analyzes detection system, can carry out 20 channel energy in a kind of horizontal dispersion plane simultaneously
Amount, momentum survey.Foreign literature " The FlatCone multianalyzer setup for ILL's three-axis
Spectrometers, M.Kempa etc., Phys.B 385-386,2006 " report a kind of 75 ° of covering in vertically scattering plane
The focusing neutron analyzer of two kinds of energy is arranged in 31 multichannel analysis detection systems of range, each channel, selects every time wherein
A kind of energy measure analysis, but do not report the focusing mode and structure of neutron analyzer；Foreign literature " CAMEA-A
Novel multiplexing analyzer for neutron spectroscopy, Felix Groitl etc.,
Rev.Sci.Instrum.87,2016 " and " MultiFLEXX-The new multi-analyzer at the cold
Triple-axis spectrometer FLEXX, Felix Groitl etc., Sci.Rep.7 (1), 2017 " report vertical
The analyzer principle in plane by multiple with Rowland circle for focusing mode is scattered, which uses single-row monocrystalline, due to list
Gap between crystalline substance is bigger, so that the neutron of a part of sample scattering causes the waste and reality of neutron beam directly through gap
It is low to test neutron flux, to largely effect on measurement efficiency, but the specific structure of above-mentioned two documents also non-analysis of report device.
And the domestic research for the neutron analyzer module for the more momentum point measurements of multipotency amount still belongs to blank.
Summary of the invention
In view of the above-mentioned problems, the object of the present invention is to provide one kind to be not only able to achieve high energy resolution but also can effectively improve
Sub- utilization rate, and the biserial monocrystalline neutron analyzer of multiple kinds of energy and momentum survey is easily extended to array manner
Unit.
To achieve the above object, the present invention takes following technical scheme: a kind of biserial monocrystalline neutron analyzer module, packet
It includes: bottom plate, for being located in light path system；Analyzer bracket is arranged on the bottom plate and is in tuning fork shape；First list
The front side of the analyzer bracket is arranged in crystalline substance；The rear side of the analyzer bracket is arranged in secondary series monocrystalline.
The biserial monocrystalline neutron analyzer module, it is preferred that trapezoidal dovetail guide, institute are provided on the bottom plate
It states to be spaced apart along its length on trapezoidal dovetail guide and is equipped with multiple pin holes；The analyzer bracket includes: pedestal, the pedestal
Bottom be formed with the trapezoidal dovetail groove matched with the trapezoidal dovetail guide；First side plate and the second side plate, described first
Side plate and the second side plate about the pedestal the setting of length direction Parallel Symmetric on the base, and first side plate and
Second side plate tilts upward extension；First row monocrystalline slot is formed in the front bevel of first side plate and the second side plate；Secondary series
Monocrystalline slot is formed in the back bevel of first side plate and the second side plate；Dowel hole, be provided with positioned at first side plate and
On the pedestal between second side plate；The first row monocrystalline and secondary series monocrystalline are successively symmetrically located in the analysis respectively
In the first row monocrystalline slot and secondary series monocrystalline slot of device bracket, the analyzer bracket is mounted on institute by the trapezoidal dovetail groove
It states on trapezoidal dovetail guide, the first alignment pin passes through the dowel hole and the trapezoidal dovetail guide of the analyzer bracket
Pin hole, with the relatively described trapezoidal dovetail guide of the determination analyzer bracket along the position of optical path direction.
The biserial monocrystalline neutron analyzer module, it is preferred that more than two analyzer brackets are symmetrically
It is mounted on the trapezoidal dovetail guide.
The biserial monocrystalline neutron analyzer module, it is preferred that the first row monocrystalline on the analyzer bracket
The quantity of slot is odd number, and the quantity of the secondary series monocrystalline slot is even number, and the quantity of the secondary series monocrystalline slot is than described the
The quantity of one list crystalline substance slot is one more, and the first row monocrystalline slot and secondary series monocrystalline slot are from top to bottom from front to back in staggeredly
Structure.
The biserial monocrystalline neutron analyzer module, it is preferred that the both ends of the first row monocrystalline and secondary series monocrystalline
It is fixed by screws on the analyzer bracket with a monocrystalline gland respectively, the monocrystalline gland is in inverted L shape, using boracic
Rubber material is process.
The biserial monocrystalline neutron analyzer module, it is preferred that the bottom plate is in beloid sector, the bottom plate
Front end there is a cylinder pin hole, rear end has a long pinhole, and the bottom plate is fixed by pass through its front end cylinder pin hole second
Position pin shaft and the third alignment pin across its rear end long pinhole, the bottom plate is located in entire light path system.
The biserial monocrystalline neutron analyzer module, it is preferred that described on the basis of the bottom surface of the analyzer bracket
The angle precision of first row monocrystalline slot and secondary series monocrystalline slot is ± 0.01 °, and position precision is ± 0.01mm, and straightness precision is
0.004mm；The symmetry precision of the trapezoidal dovetail groove and trapezoidal dovetail guide is ± 0.01mm, and flatness precision is
0.008mm。
The biserial monocrystalline neutron analyzer module, it is preferred that the first side plate and second side of the analyzer bracket
The inner distance of plate is 4mm smaller than the length of the first row monocrystalline and secondary series monocrystalline, first side plate and the second side plate
With a thickness of 6mm.
The biserial monocrystalline neutron analyzer module, it is preferred that the first row monocrystalline slot includes arranging from top to bottom
First before monocrystalline slot before monocrystalline slot and third before monocrystalline slot, second；The secondary series monocrystalline slot includes arranging from top to bottom
Monocrystalline slot after monocrystalline slot and the 4th after monocrystalline slot, third after monocrystalline slot, second after first；
The first row monocrystalline includes monocrystalline before monocrystalline and third before monocrystalline, second before first；The secondary series monocrystalline packet
Monocrystalline, the length of the first row monocrystalline and secondary series monocrystalline after monocrystalline and first after monocrystalline, first after monocrystalline, first after including first
It spends identical.
The biserial monocrystalline neutron analyzer module, it is preferred that each monocrystalline slot and each monocrystalline on the analyzer bracket
Position and method for determining dimension the following steps are included:
1) defining sample center is O point, and establishes X-axis in the horizontal direction, A point and A ' point is taken in X-axis, A point is described
The central point of monocrystalline before second, the horizontal distance between A point and A ' are L, and B point and B ' are respectively the center of the first detector
The central point of point and the second detector, the horizontal distance between B point and B ' is also L, vertical between B point and B ' and X-axis
Distance is H；The neutron angle of divergence of definition in vertical plane is located at OE ' and OE " between line；
2) defining OAB is first Rowland circle, and defining OA ' B ' is second Rowland circle, monocrystalline before described first,
The center of monocrystalline is located on first Rowland circle before monocrystalline and third before second, single after monocrystalline, second after described first
The center of monocrystalline is located on second Rowland circle after monocrystalline and the 4th after crystalline substance, third；
3) monocrystalline before described first, before second before monocrystalline and third the endpoint of monocrystalline be respectively defined as from top to bottom a, b, c,
d,e,f；Connect the determining reflected ray cc ' in c point of Oc line, monocrystalline before adjusting described first on first Rowland circle
Center, until endpoint b and cc ' is without intersecting；The determining reflected ray ee ' in e point of Oe line is connected, at described first
The center that monocrystalline before the third is adjusted on Rowland circle, until endpoint d and ee ' is without intersecting；Determine aa ", bb ", cc ",
Dd ", ee ", ff " six are parallel to the straight line of X-axis；
4) endpoint of monocrystalline is distinguished from top to bottom after monocrystalline and the 4th after monocrystalline, third after monocrystalline, second after described first
It is defined as g, h, i, j, k, l, m, n；So that gh is located in the region that aa " and OE ' is determined, ij is located at bb " and cc " really for adjustment first
In fixed region, kl is located in the region that dd " with ee " is determined, mn is located at the line that ff " and sample dispersion angle determine；Connect Om
The determining reflected ray mm ' in m point of line, the center of monocrystalline after adjusting the third on second Rowland circle, directly
To l point and mm ' without intersecting；Connection Ok line determines the reflected ray kk ' in k point, the center of monocrystalline after adjustment described second, directly
To j point and pp ' without intersecting；Connection Oi line determines the reflected ray ii ' in i point, the center of monocrystalline after adjustment described first, directly
To h point and ii ' without intersecting；
5) it is repeatedly adjusted according to the above method, so that the width summation of the first row monocrystalline and secondary series monocrystalline is maximum,
Before determining described first before monocrystalline, second before monocrystalline, third after monocrystalline, first after monocrystalline, second after monocrystalline, third monocrystalline and
The width of monocrystalline after 4th；
6) center and the width of corresponding each monocrystalline slot are determined respectively further according to the thickness and width of each monocrystalline.
The invention adopts the above technical scheme, which has the following advantages: 1, analyzer bracket of the invention uses cloth
It is brilliant and round for focusing mode with Rowland to set two lists, had not only been able to satisfy energy resolution requirement, but also neutron beam can be made full use of
Neutron flux greatly improves.2, analyzer bracket of the invention being used cooperatively using trapezoidal dovetail groove and trapezoidal dovetail guide,
Not only facilitate the multiple analyzer bracket installations of installation but also can accurately guarantee alignment, can detect in more kinds of energy
Son, so that the momentum point that the neutron analyzer of different-energy detects is comparable.3, the present invention uses boron-loaded rubber gland matter
Ground had not only been avoided that scratch, abrasion chip, but also effectively chip can be fixed on analyzer bracket.4, bottom plate is arranged the present invention
At be in beloid sector, therefore a set of analyzer bracket together with bottom plate can along the circumference array centered on sample at
The neutron analyzer system of one polarizers of big angle scope, while multiple energy, momentum are detected, greatly improve measurement efficiency.
Detailed description of the invention
Fig. 1 is schematic perspective view of the invention；
Fig. 2 is another schematic perspective view of the invention；
Fig. 3 is the schematic perspective view of analyzer bracket of the present invention；
Fig. 4 is the position view of first row monocrystalline and secondary series monocrystalline of the invention；
Fig. 5 is the position view of each monocrystalline slot and each monocrystalline on the analyzer bracket of 3meV energy of the invention；
Fig. 6 is the position view of each monocrystalline slot and each monocrystalline on the analyzer bracket of 5meV energy of the invention.
Specific embodiment
Presently preferred embodiments of the present invention is described in detail below with reference to attached drawing, it is of the invention to be clearer to understand
Objects, features and advantages.It should be understood that embodiment shown in the drawings does not limit the scope of the present invention, and only it is
Illustrate the connotation of technical solution of the present invention.
As shown in Figure 1 and Figure 2, biserial monocrystalline neutron analyzer module provided by the invention, comprising: bottom plate 70, for positioning
In light path system；Analyzer bracket 10, is in tuning fork shape, and analyzer bracket 10 is arranged on bottom plate 70；First row monocrystalline 20, if
It sets in the front side of analyzer bracket 10；The rear side of analyzer bracket 10 is arranged in secondary series monocrystalline 30.
In the above-described embodiments, it is preferred that trapezoidal dovetail guide 50 is provided on bottom plate 70, on trapezoidal dovetail guide 50
It is spaced apart along its length and is equipped with multiple pin holes.As shown in Figure 1, Figure 3, analyzer bracket 10 includes: pedestal 13, the bottom of pedestal 13
Portion is formed with the trapezoidal dovetail groove 17 matched with trapezoidal dovetail guide 50；First side plate 11 and the second side plate 12, the first side plate
11 and second side plate 12 be arranged on pedestal 13 about the length direction Parallel Symmetric of pedestal 13, and the first side plate 11 and second side
Plate 12 tilts upward extension；First row monocrystalline slot 14 is formed in the front bevel of the first side plate 11 and the second side plate 12；Second list
Brilliant slot 15 is formed in the back bevel of the first side plate 11 and the second side plate 12；Dowel hole 16 is provided with positioned at 11 He of the first side plate
On pedestal 13 between second side plate 12.First row monocrystalline 20 and secondary series monocrystalline 30 are successively symmetrically located in analyzer branch respectively
In the first row monocrystalline slot 14 and secondary series monocrystalline slot 15 of frame 10, analyzer bracket 10 is mounted on trapezoidal by trapezoidal dovetail groove 17
On dovetail guide 50, the first alignment pin 60 passes through the dowel hole 16 of analyzer bracket 10 and the pin of trapezoidal dovetail guide 50
Hole, to determine the relatively trapezoidal dovetail guide 50 of analyzer bracket 10 along the position of optical path direction.
In the above-described embodiments, it is preferred that more than two analyzer brackets 10 symmetrically are mounted on trapezoidal dovetail and lead
On rail 50, it is possible thereby to the array of multiple analyzer brackets 10 is extended on a bottom plate 70, multiple analyzers after extension
The symmetry of bracket 10 is also more preferable.
In the above-described embodiments, it is preferred that the quantity of the first row monocrystalline slot 14 on analyzer bracket 10 be odd number, second
The quantity of list crystalline substance slot 15 is even number, and the quantity of secondary series monocrystalline slot 15 than first row monocrystalline slot 14 quantity more than one, the
One list crystalline substance slot 14 and secondary series monocrystalline slot 15 are in cross structure from front to back from top to bottom.
In the above-described embodiments, it is preferred that use a monocrystalline respectively in the both ends of first row monocrystalline 20 and secondary series monocrystalline 30
Gland 40 is fixed by screws on analyzer bracket 10, and monocrystalline gland 40 is in inverted L shape, using the processing of boron-loaded rubber material
At boron-loaded rubber texture material is soft or hard suitable, can either fix monocrystalline and avoid damage to monocrystalline again, but also can effectively absorb
Scattered neutron effectively improves signal-to-noise ratio.
In the above-described embodiments, it is preferred that as shown in Figure 1 and Figure 2, bottom plate 70 is in beloid sector, before bottom plate 70
End has a cylinder pin hole, and rear end has a long pinhole, and bottom plate 70 passes through the second alignment pin across its front end cylinder pin hole
80 and across its rear end long pinhole third alignment pin 90, bottom plate 70 is located in entire light path system.
In the above-described embodiments, it is preferred that on the basis of the bottom surface of analyzer bracket 10, first row monocrystalline slot 14 and second
The angle precision of list crystalline substance slot 15 is ± 0.01 °, and position precision is ± 0.01mm, and straightness precision is 0.004mm；Trapezoidal dovetail
The symmetry precision of slot 16 and trapezoidal dovetail guide 50 is ± 0.01mm, and flatness precision is 0.008mm.
In the above-described embodiments, it is preferred that the first side plate 11 of analyzer bracket 10 and the inner distance of the second side plate 12
It is 4mm smaller than the length of first row monocrystalline 20 and secondary series monocrystalline 30, the first side plate 11 and the second side plate 12 with a thickness of 6mm.
In the above-described embodiments, it is preferred that as shown in figure 3, first row monocrystalline slot 14 includes first arranged from top to bottom
Monocrystalline slot 143 before monocrystalline slot 142 and third before preceding monocrystalline slot 141, second；Secondary series monocrystalline slot 15 includes arranging from top to bottom
Monocrystalline slot 154 after monocrystalline slot 153 and the 4th after monocrystalline slot 152, third after monocrystalline slot 151, second after first.
In the above-described embodiments, it is preferred that as shown in Fig.1 and Fig.2, first row monocrystalline 20 includes monocrystalline 201, the before first
Monocrystalline 203 before monocrystalline 202 and third before two；Secondary series monocrystalline 30 includes after first after monocrystalline 301, first after monocrystalline 302, first
Monocrystalline 304 after monocrystalline 303 and first, first row monocrystalline 20 are identical with the length of secondary series monocrystalline 30.
In the above-described embodiments, it is preferred that the position and size of each monocrystalline slot and each monocrystalline be really on analyzer bracket 10
Determine method the following steps are included:
1) defining sample center is O point, and establishes X-axis in the horizontal direction, and A point and A ' point are taken in X-axis, and A point is second
The central point of preceding monocrystalline 202, the horizontal distance between A point and A ' are L, and B point and B ' are respectively the center of the first detector
The central point of point and the second detector, the horizontal distance between B point and B ' is also L, vertical between B point and B ' and X-axis
Distance is H；The neutron angle of divergence of definition in vertical plane is located at OE ' and OE " between line；
2) OAB is defined as first Rowland (rowland) circle, and defining OA ' B ' is second Rowland circle, list before first
The center of monocrystalline 203 is located on first Rowland circle before monocrystalline 202 and third before crystalline substance 201, second, monocrystalline 301 after first,
The center of monocrystalline 304 is located on second Rowland circle after monocrystalline 303 and the 4th after monocrystalline 302, third after second；
3) monocrystalline 201 before first, the endpoint of monocrystalline 203 is respectively defined as from top to bottom before monocrystalline 202 and third before second
a,b,c,d,e,f；Connect the determining reflected ray cc ' in c point of Oc line, monocrystalline 201 before adjusting first on first Rowland circle
Center, until endpoint b and cc ' is without intersecting；The determining reflected ray ee ' in e point of Oe line is connected, in first Rowland
The center that monocrystalline 203 before third is adjusted on circle, until endpoint d and ee ' is without intersecting；Determine aa ", bb ", cc ", dd ", ee ",
Ff " six are parallel to the straight line of X-axis；
4) after first after monocrystalline 301, second after monocrystalline 302, third after monocrystalline 303 and the 4th endpoint of monocrystalline 304 from upper
G, h, i, j, k, l, m, n are respectively defined as under and；So that gh is located in the region that aa " and OE ' is determined, ij is located at for adjustment first
In the region that bb " and cc " is determined, kl is located in the region that dd " with ee " is determined, mn is located at what ff " was determined with sample dispersion angle
Line；The determining reflected ray mm ' in m point of Om line is connected, the centre bit of monocrystalline 303 after third is adjusted on second Rowland circle
It sets, until l point and mm ' are without intersecting；Connect the determining reflected ray kk ' in k point of Ok line, the centre bit of monocrystalline 302 after adjustment second
It sets, until j point and pp ' are without intersecting；Connect the determining reflected ray ii ' in i point of Oi line, the centre bit of monocrystalline 301 after adjustment first
It sets, until h point and ii ' are without intersecting；
5) it is repeatedly adjusted according to the above method, so that the width summation of first row monocrystalline 20 and secondary series monocrystalline 30 is maximum,
Monocrystalline 302 after monocrystalline 301, second after monocrystalline 203, first before monocrystalline 202, third before monocrystalline 201, second before determining first,
After third after monocrystalline 303 and the 4th monocrystalline 304 width；
6) center and the width of corresponding each monocrystalline slot are determined respectively further according to the thickness and width of each monocrystalline.
In the above-described embodiments, it is preferred that L=38mm, H=500mm.
Embodiment 1: as shown in figure 5, on the analyzer bracket 10 of 3meV energy each monocrystalline slot and each monocrystalline position and ruler
It is very little as follows:
OA=960mm；
± 0.01 ° of 141:52.33 ° of monocrystalline slot before first, the center point coordinate (6.22,20.39) of monocrystalline 201 before first；
± 0.01 ° of 142:51.12 ° of monocrystalline slot before second, the center point coordinate (0,0) of monocrystalline 202 before second；
± 0.01 ° of 143:49.95 ° of monocrystalline slot before third, before third monocrystalline 203 center point coordinate (- 6.82 ,-
19.41)；
± 0.01 ° of 151:52.89 ° of monocrystalline slot after first, the center point coordinate (46.52,31.06) of monocrystalline 301 after first；
± 0.01 ° of 152:51.70 ° of monocrystalline slot after second, the center point coordinate (41.01,10.16) of monocrystalline 302 after second；
± 0.01 ° of 153:50.56 ° of monocrystalline slot after third, the center point coordinate (34.90, -9.74) of monocrystalline 303 after third；
± 0.01 ° of 154:49.33 ° of monocrystalline slot after 4th, after the 4th monocrystalline 304 center point coordinate (27.42 ,-
30.92)；
Monocrystalline after monocrystalline 301, second after monocrystalline 203, first before monocrystalline 202, third before monocrystalline 201, second before first
302, the size of monocrystalline 304 is 30mm (length) × 12mm (width) × 2mm (thickness) after monocrystalline 303 and the 4th after third.
Embodiment 2: as shown in fig. 6, on the analyzer bracket 10 of 5meV energy each monocrystalline slot and each monocrystalline position and ruler
It is very little as follows:
OA=1265mm；
± 0.01 ° of 141:38.37 ° of monocrystalline slot before first, the center point coordinate (19.45,28.71) of monocrystalline 201 before first；
± 0.01 ° of 142:37.09 ° of monocrystalline slot before second, the center point coordinate (0,0) of monocrystalline 202 before second；
± 0.01 ° of 143:35.88 ° of monocrystalline slot before third, before third monocrystalline 203 center point coordinate (- 19.45 ,-
26.19)；
± 0.01 ° of 151:38.73 ° of monocrystalline slot after first, the center point coordinate (62.98,38.06) of monocrystalline 301 after first；
± 0.01 ° of 152:37.71 ° of monocrystalline slot after second, the center point coordinate (47.75,14.29) of monocrystalline 302 after second；
± 0.01 ° of 153:36.50 ° of monocrystalline slot after third, after third monocrystalline 303 center point coordinate (28.62 ,-
13.15)；
± 0.01 ° of 154:35.43 ° of monocrystalline slot after 4th, after the 4th monocrystalline 304 center point coordinate (10.59 ,-
36.94)；
Monocrystalline 304 after monocrystalline the 301, the 4th after monocrystalline 203, first before monocrystalline 202, third before monocrystalline 201, second before first
Size be 36mm (length) × 16mm (width) × 2mm (thickness), after second after monocrystalline 302 and third monocrystalline 303 ruler
Very little is 36mm (length) × 22mm (width) × 2mm (thickness).
The various embodiments described above are merely to illustrate the present invention, wherein the structure of each component, connection type and manufacture craft etc. are all
It can be varied, all equivalents and improvement carried out based on the technical solution of the present invention should not exclude
Except protection scope of the present invention.
Claims (10)
1. a kind of biserial monocrystalline neutron analyzer module characterized by comprising
Bottom plate (70), for being located in light path system；
Analyzer bracket (10) is arranged on the bottom plate (70) and is in tuning fork shape；
First row monocrystalline (20) is arranged in the front side of the analyzer bracket (10)；
The rear side in the analyzer bracket (10) is arranged in secondary series monocrystalline (30).
2. biserial monocrystalline neutron analyzer module according to claim 1, which is characterized in that set on the bottom plate (70)
It is equipped with trapezoidal dovetail guide (50), is spaced apart along its length on the trapezoidal dovetail guide (50) and is equipped with multiple pin holes；
The analyzer bracket (10) includes:
Pedestal (13), the bottom of the pedestal (13) are formed with the trapezoidal dovetail groove matched with the trapezoidal dovetail guide (50)
(17)；
First side plate (11) and the second side plate (12), first side plate (11) and the second side plate (12) are about the pedestal (13)
Length direction Parallel Symmetric be arranged on the pedestal (13), and first side plate (11) and the second side plate (12) are tilted towards
Upper extension；
First row monocrystalline slot (14) is formed in the front bevel of first side plate (11) and the second side plate (12)；
Secondary series monocrystalline slot (15) is formed in the back bevel of first side plate (11) and the second side plate (12)；
Dowel hole (16), the pedestal (13) being provided between first side plate (11) and the second side plate (12)
On；
The first row monocrystalline (20) and secondary series monocrystalline (30) are successively symmetrically located in the analyzer bracket (10) respectively
In first row monocrystalline slot (14) and secondary series monocrystalline slot (15), the analyzer bracket (10) passes through the trapezoidal dovetail groove (17)
It is mounted on the trapezoidal dovetail guide (50), the first alignment pin (60) passes through the dowel hole of the analyzer bracket (10)
(16) and the pin hole of the trapezoidal dovetail guide (50), with the relatively described trapezoidal dovetail guide of the determination analyzer bracket (10)
(50) along the position of optical path direction.
3. biserial monocrystalline neutron analyzer module according to claim 2, which is characterized in that more than two analyzers
Bracket (10) symmetrically is mounted on the trapezoidal dovetail guide (50).
4. biserial monocrystalline neutron analyzer module according to claim 2, which is characterized in that the analyzer bracket (10)
On the quantity of the first row monocrystalline slot (14) be odd number, the quantity of the secondary series monocrystalline slot (15) is even number, and described
The quantity of secondary series monocrystalline slot (15) is one more than the quantity of the first row monocrystalline slot (14), the first row monocrystalline slot (14)
It is from top to bottom from front to back in cross structure with secondary series monocrystalline slot (15).
5. biserial monocrystalline neutron analyzer module according to claim 1, which is characterized in that the first row monocrystalline (20)
The analyzer bracket (10) is fixed by screws in a monocrystalline gland (40) respectively with the both ends of secondary series monocrystalline (30)
On, the monocrystalline gland (40) is in inverted L shape, is process using boron-loaded rubber material.
6. biserial monocrystalline neutron analyzer module according to claim 1, which is characterized in that the bottom plate (70) is in preceding narrow
Wide sector afterwards, the front end of the bottom plate (70) have a cylinder pin hole, and rear end has a long pinhole, and the bottom plate (70) passes through
The second alignment pin (80) across its front end cylinder pin hole and the third alignment pin (90) across its rear end long pinhole, will
The bottom plate (70) is located in entire light path system.
7. biserial monocrystalline neutron analyzer module according to claim 2, which is characterized in that with the analyzer bracket
(10) on the basis of bottom surface, the angle precision of the first row monocrystalline slot (14) and secondary series monocrystalline slot (15) is ± 0.01 °, position
Setting precision is ± 0.01mm, and straightness precision is 0.004mm；Pair of the trapezoidal dovetail groove (16) and trapezoidal dovetail guide (50)
Degree precision is referred to as ± 0.01mm, and flatness precision is 0.008mm.
8. biserial monocrystalline neutron analyzer module according to claim 2, which is characterized in that the analyzer bracket (10)
The first side plate (11) and the second side plate (12) inner distance than the first row monocrystalline (20) and secondary series monocrystalline (30)
The small 4mm of length, first side plate (11) and the second side plate (12) with a thickness of 6mm.
9. biserial monocrystalline neutron analyzer module according to claim 2, which is characterized in that the first row monocrystalline slot
(14) include arrange from top to bottom first before monocrystalline slot (143) before monocrystalline slot (142) and third before monocrystalline slot (141), second；
The secondary series monocrystalline slot (15) include arrange from top to bottom first after monocrystalline slot (152), after monocrystalline slot (151), second
Monocrystalline slot (154) after monocrystalline slot (153) and the 4th after three；
The first row monocrystalline (20) includes monocrystalline (203) before monocrystalline (202) and third before monocrystalline (201), second before first；Institute
State secondary series monocrystalline (30) include after first after monocrystalline (301), first after monocrystalline (302), first after monocrystalline (303) and first singly
Brilliant (304), the first row monocrystalline (20) are identical with the length of secondary series monocrystalline (30).
10. biserial monocrystalline neutron analyzer module according to claim 9, which is characterized in that the analyzer bracket
(10) position and the method for determining dimension of each monocrystalline slot and each monocrystalline on the following steps are included:
1) defining sample center is O point, and establishes OX axis in the horizontal direction, and A point and A ' point are taken in X-axis, and A point is described second
The central point of preceding monocrystalline (202), the horizontal distance between A point and A ' are L, and B point and B ' are respectively in the first detector
The central point of the heart point and the second detector, the horizontal distance between B point and B ' are also L, hanging down between B point and B ' and X-axis
Straight distance is H；The neutron angle of divergence of definition in vertical plane is located at OE ' and OE " between line；
2) defining OAB is first Rowland circle, and defining OA ' B ' is second Rowland circle, monocrystalline before described first
(201), the center of monocrystalline (203) is located on first Rowland circle before monocrystalline (202) and third before second, and described
Described in the center of monocrystalline (304) is located at after monocrystalline (303) and the 4th after monocrystalline (302), third after monocrystalline (301), second after one
On second Rowland circle；
3) monocrystalline (201) before described first, the endpoint of monocrystalline (203) is distinguished from top to bottom before monocrystalline (202) and third before second
It is defined as a, b, c, d, e, f；The determining reflected ray cc ' in c point of Oc line is connected, adjusts institute on first Rowland circle
The center of monocrystalline (201) before stating first, until endpoint b and cc ' is without intersecting；Connect the determining reflected ray in e point of Oe line
Ee ', the center of monocrystalline (203) before adjusting the third on first Rowland circle, until endpoint d and ee ' nothing
Intersect；Determine aa ", bb ", cc ", dd ", ee ", ff " six straight lines for being parallel to X-axis；
4) monocrystalline (304) after monocrystalline (303) and the 4th after monocrystalline (302), third after monocrystalline (301), second after described first
Endpoint is respectively defined as g, h, i, j, k, l, m, n from top to bottom；First adjustment so that gh be located at aa " and OE ' determination region in,
Ij is located in the region that bb " and cc " is determined, kl is located in the region that dd " with ee " is determined, mn is located at ff " and sample dispersion angle
Determining line；The determining reflected ray mm ' in m point of Om line is connected, list after the third is adjusted on second Rowland circle
The center of brilliant (303), until l point and mm ' are without intersecting；It connects Ok line and determines reflected ray kk ' in k point, adjust described the
The center of monocrystalline (302) after two, until j point and pp ' are without intersecting；Connect the determining reflected ray ii ' in i point of Oi line, adjustment
The center of monocrystalline (301) after described first, until h point and ii ' are without intersecting；
5) it is repeatedly adjusted according to the above method, so that the width summation of the first row monocrystalline (20) and secondary series monocrystalline (30) is most
Monocrystalline (301) after monocrystalline (203), first before monocrystalline (202), third before monocrystalline (201), second before greatly, determining described first,
After second after monocrystalline (302), third after monocrystalline (303) and the 4th monocrystalline (304) width；
6) center and the width of corresponding each monocrystalline slot are determined respectively further according to the thickness and width of each monocrystalline.
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