CN110082244A - A kind of test impact specimen v-notch Alignment measuring device - Google Patents
A kind of test impact specimen v-notch Alignment measuring device Download PDFInfo
- Publication number
- CN110082244A CN110082244A CN201910403758.2A CN201910403758A CN110082244A CN 110082244 A CN110082244 A CN 110082244A CN 201910403758 A CN201910403758 A CN 201910403758A CN 110082244 A CN110082244 A CN 110082244A
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- China
- Prior art keywords
- notch
- center line
- blade
- card base
- locating piece
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- 238000012360 testing method Methods 0.000 title claims abstract description 18
- 238000005259 measurement Methods 0.000 abstract description 16
- 239000000523 sample Substances 0.000 description 22
- 239000000463 material Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 238000009863 impact test Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000003723 Smelting Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000013068 control sample Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/62—Manufacturing, calibrating, or repairing devices used in investigations covered by the preceding subgroups
Abstract
The invention discloses a kind of test impact specimen v-notch Alignment measuring devices, including blade, position card base, v-notch locating piece and about blade center line symmetrically arranged clamping screw in pairs, vernier, ruler frame, main scale, movable card base, fine motion nut and inching gear, the positioning card base is set to right above blade position of center line, the v-notch locating piece is set to immediately below blade position of center line, the positioning card base and v-notch locating piece center line are overlapped with blade center line, the graduation mark of two sets of main scales and vernier is about blade center line symmetrical setting, and zero graduation line is close to blade center line side, the Alignment measuring device forms the symmetrical structure about blade center line for axis.The present invention have it is easy to operate, be capable of precise positioning notch the plane of symmetry be measurement distance starting point, that is, zero point, the notch plane of symmetry can be measured simultaneously at a distance from sample end face, reduce the irrelevant variable during general measure, it is time saving, laborsaving.
Description
Technical field
The present invention relates to Impact Properties of Materials testing fields, especially provide a kind of test impact specimen v-notch centering
Measuring device.
Background technique
The ability of material impact load is known as the impact property of material.Shock loading, which refers to, is applied to zero with higher speed
Load on part.When part is when absorbing impact load, when stress caused by moment impact and deformation ratio dead load, will be big
It is more.Therefore, when manufacturing this kind of part, it just must take into account the impact property of material.
Impact test is using conservation of energy principle, by the examination with V-type or U-shaped notch with certain shapes and size
Sample is thrust under impact loading, to measure a kind of its test method for absorbing energy.Impact test is that sample is tried in impact
Test a kind of dynamic mechanical test under the action of power.Impact test is very sensitive to the defect of material, it can delicately reflect
The gross imperfection of material, the minor change of microscopic structure and quality of materials out.Therefore, impact test is to be used to examine smelting in production
Refining, hot-working, heat treatment process quality effective ways.
During the test, the Shaft alignment state of v-notch seriously affects the mechanical property of material, therefore is carrying out impact examination
It needs to control the v-notch Shaft alignment state of sample before testing.Especially for automatic positioning testing machine, the notch plane of symmetry and end
Can the range deviation requirement in portion be tightened up, therefore, the notch plane of symmetry is accurately measured at a distance from end, for shock-testing knot
Fruit is most important.
Due to the particularity of v-notch sample, there is no both at home and abroad at present directly measurement the sample break plane of symmetry and end away from
From measurer.Using conventional vernier caliper measurement notch two edges and threshold value and specimen length, notch is calculated or estimated
When the plane of symmetry and threshold value, movable card base is often difficult to snap at notch center, thus is difficult with the notch plane of symmetry for survey
Measure starting point.This process is cumbersome, and there are biggish artificial measurement errors, because v-notch side and sample end face are not parallel, measurement
When, movable card base can be crooked, not can guarantee upright position, and it is bigger than normal so as to cause measurement result, shock-testing result is influenced indirectly.
Existing notch whether the method for centering, also have using the projector with notch size tolerance come control sample notch pair
Title face is at a distance from end, if within the scope of standard of tolerance.The projector be unable to measure the notch plane of symmetry of notched specimen with
Whether the specific value of end can only embody within the scope of standard error.In practical application, the specimen size of processing is a variety of more
Sample is compared using projector, both laborious and time consuming.In addition, during the comparison process, artificial measurement error is larger.
Summary of the invention
The notch plane of symmetry measures the Shaft alignment state of notched specimen, the present invention provides one at a distance from end in order to obtain
Kind of test impact specimen v-notch Alignment measuring device, it can be achieved that directly the measurement notch plane of symmetry and sample both ends away from
From.
The technical scheme is that a kind of test impact specimen v-notch Alignment measuring device, including blade 1, system
Dynamic screw 2, vernier 3, ruler frame 4, main scale 5, movable card base 6, fine motion nut 9 and inching gear 10, the clamping screw 2, vernier
3, ruler frame 4, main scale 5, movable card base 6, fine motion nut 9 and inching gear 10 are symmetrical arranged about 1 center line of blade in pairs；Institute
Stating Alignment measuring device further includes positioning card base 7 and v-notch locating piece 8, and the positioning card base 7 is set to 1 center line position of blade
Right above setting, the v-notch locating piece 8 is set to immediately below 1 position of center line of blade, and the positioning card base 7 and v-notch are fixed
Position 8 center line of block is overlapped with 1 center line of blade, the graduation mark of two sets of main scales 5 and vernier 3 about 1 center line symmetrical setting of blade,
And zero graduation line, close to 1 center line side of blade, the Alignment measuring device forms the symmetrical junction about 1 center line of blade for axis
Structure.
Preferably, the positioning card base 7 and v-notch locating piece 8 and blade 1 are integrally formed.
Preferably, the movable card base 6 is integrally formed with vernier 3.
The present invention has following beneficial effect:
The present invention has easy to operate by being suitable for the measurement of v-notch sample break Shaft alignment state, can precisely determine
The plane of symmetry of position notch is the starting point, that is, zero point for measuring distance, can measure the notch plane of symmetry simultaneously at a distance from sample end face, subtract
Lack the irrelevant variable during general measure, it is time saving, laborsaving.
Detailed description of the invention
Fig. 1 is v-notch sample schematic diagram according to the present invention；
Fig. 2 is structural schematic diagram of the invention；
Fig. 3 is the schematic diagram using present invention measurement v-notch sample centering situation；
Fig. 4 is the scale diagrams of v-notch locating piece 8 in the embodiment of the present invention；
In figure: 1, blade；2, clamping screw；3, vernier；4, ruler frame；5, main scale；6, movable card base；7, card base is positioned；8,V
Type notch locating piece；9, fine motion nut；10, inching gear；11, v-notch sample.
Specific embodiment
The present invention will be described in detail with reference to the accompanying drawings and examples.
As shown in Figs 1-4, a kind of test impact specimen v-notch Alignment measuring device, including blade 1, clamping screw
2, vernier 3, ruler frame 4, main scale 5, movable card base 6, positioning card base 7, v-notch locating piece 8, fine motion nut 9 and inching gear 10；
Clamping screw 2, vernier 3, ruler frame 4, main scale 5, movable card base 6, fine motion nut 9 and inching gear 10 are about 1 center line of blade
It is symmetrical arranged in pairs；It positions card base 7 to be set to right above 1 position of center line of blade, v-notch locating piece 8 is set to 1 center line of blade
Immediately below position, positions card base 7 and 8 center line of v-notch locating piece is overlapped with 1 center line of blade, two sets of main scales 5 and vernier 3
Graduation mark about 1 center line symmetrical setting of blade, and zero graduation line is close to 1 center line side of blade, Alignment measuring device shape
At the symmetrical structure for about 1 center line of blade being axis.It positions card base 7 and v-notch locating piece 8 and blade 1 is integrally formed, favorably
Zero is realized simultaneously in double zero graduation lines, is conducive to v-notch locating piece 8 and is inserted into 11 notch of v-notch sample, and is fixed
The notch plane of symmetry of v-notch sample 11 is arrived in position.Due to unbalance stress during two verniers 3 of sliding, inching gear 10 is utilized
Keep it firmly uniform in measurement, is conveniently adjusted measurement pressure, reduces measurement error.Two movable card bases 6 are in symmetrically
The side of the heart is measuring surface.The schematic diagram that the present invention measures v-notch sample centering situation is as shown in Figure 3.
As can be seen that two zero graduation lines can be realized while are zeroed, it is two corresponding when showing double zero graduation line positions
Movable card base 6 fits, and two ruler frames 4 fit with positioning card base 7 simultaneously, at the same time v-notch locating piece 8, positioning card
7 center line of foot coincides with two movable 6 fitting lines of card base.This design enables inserting for 8 fast accurate of v-notch locating piece
Enter the indentation, there to v-notch sample 11, and the symmetrical center line of notch can be automatically positioned.Measure the notch plane of symmetry with
End face apart from when, v-notch sample 11 is stuck at v-notch locating piece 8, the distance of the notch plane of symmetry to left and right ends is equal
It is test starting point, that is, zero point with the center line of automatic positioning.In this case, the ruler frame 4 of two sides can be slided simultaneously come the activity of moving
Card base 6, it is appropriate to adjust inching gear 10 when two movable card bases 6 are stuck in the both ends of the surface of v-notch sample 11, i.e., in fact
The v-notch plane of symmetry now is measured at a distance from sample both ends of the surface simultaneously, keeps measurement result more acurrate；Movable card base 6 is close to ruler
The side of 1 center line of body is measuring surface, so that activity card base 6 can accurately be close to 11 end face of v-notch sample when measurement,
Also it can guarantee that measurement result is more acurrate, so that it is determined that the Shaft alignment state of 11 notch of v-notch sample.In addition, the present invention realizes
The notch plane of symmetry is measured at a distance from both ends of the surface simultaneously, it is easy to operate, reduce the irrelevant variable during general measure, saves
When, it is laborsaving.
The above embodiments merely illustrate the technical concept and features of the present invention, and its object is to allow person skilled in the art
Scholar cans understand the content of the present invention and implement it accordingly, and it is not intended to limit the scope of the present invention.It is all according to the present invention
Equivalent change or modification made by Spirit Essence, should be covered by the protection scope of the present invention.
Claims (3)
1. it is a kind of test use impact specimen v-notch Alignment measuring device, including blade (1), clamping screw (2), vernier (3),
Ruler frame (4), main scale (5), movable card base (6), fine motion nut (9) and inching gear (10), which is characterized in that the clamping screw
(2), vernier (3), ruler frame (4), main scale (5), movable card base (6), fine motion nut (9) and inching gear (10) are about blade
(1) center line is symmetrical arranged in pairs；The Alignment measuring device further includes positioning card base (7) and v-notch locating piece (8), institute
It states positioning card base (7) to be set to right above blade (1) position of center line, the v-notch locating piece (8) is set to blade (1) center
Immediately below line position, the positioning card base (7) and v-notch locating piece (8) center line are overlapped with blade (1) center line, and two sets
The graduation mark of main scale (5) and vernier (3) is about blade (1) center line symmetrical setting, and zero graduation line is close to blade (1) center line
Side, the Alignment measuring device form the symmetrical structure about blade (1) center line for axis.
2. a kind of test impact specimen v-notch Alignment measuring device described in accordance with the claim 1, which is characterized in that institute
It states positioning card base (7) and v-notch locating piece (8) and blade (1) is integrally formed.
3. a kind of test impact specimen v-notch Alignment measuring device according to claim 2, which is characterized in that institute
Movable card base (6) and vernier (3) are stated to be integrally formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910403758.2A CN110082244A (en) | 2019-05-15 | 2019-05-15 | A kind of test impact specimen v-notch Alignment measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910403758.2A CN110082244A (en) | 2019-05-15 | 2019-05-15 | A kind of test impact specimen v-notch Alignment measuring device |
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| Publication Number | Publication Date |
|---|---|
| CN110082244A true CN110082244A (en) | 2019-08-02 |
Family
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910403758.2A Pending CN110082244A (en) | 2019-05-15 | 2019-05-15 | A kind of test impact specimen v-notch Alignment measuring device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112067461A (en) * | 2020-08-24 | 2020-12-11 | 中国飞机强度研究所 | Composite material bending test device |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1084633A (en) * | 1992-09-23 | 1994-03-30 | 葛腾江 | Slide calliper rule |
| JP2004028711A (en) * | 2002-06-25 | 2004-01-29 | Sano Seisakusho:Kk | Pitch caliper |
| CN101592569A (en) * | 2009-06-23 | 2009-12-02 | 武汉钢铁(集团)公司 | A kind of job operation of standard impact test sample with Charpy V-notch |
| CN103499262A (en) * | 2013-08-28 | 2014-01-08 | 上海众力汽车部件有限公司 | Inspection device for inspecting height of part |
| CN103727852A (en) * | 2013-12-13 | 2014-04-16 | 陈美康 | Novel vernier caliper |
| CN104297053A (en) * | 2014-10-13 | 2015-01-21 | 南京航空航天大学 | Centering device and method used for sheet-shaped material tensile test |
| CN108645327A (en) * | 2018-03-29 | 2018-10-12 | 北京华海基业机械设备有限公司 | A kind of chain monocycle v-notch Alignment measuring device and centering control method |
| CN210221750U (en) * | 2019-05-15 | 2020-03-31 | 中国科学院金属研究所 | Experimental impact specimen V type breach centering measuring device of using |
-
2019
- 2019-05-15 CN CN201910403758.2A patent/CN110082244A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1084633A (en) * | 1992-09-23 | 1994-03-30 | 葛腾江 | Slide calliper rule |
| JP2004028711A (en) * | 2002-06-25 | 2004-01-29 | Sano Seisakusho:Kk | Pitch caliper |
| CN101592569A (en) * | 2009-06-23 | 2009-12-02 | 武汉钢铁(集团)公司 | A kind of job operation of standard impact test sample with Charpy V-notch |
| CN103499262A (en) * | 2013-08-28 | 2014-01-08 | 上海众力汽车部件有限公司 | Inspection device for inspecting height of part |
| CN103727852A (en) * | 2013-12-13 | 2014-04-16 | 陈美康 | Novel vernier caliper |
| CN104297053A (en) * | 2014-10-13 | 2015-01-21 | 南京航空航天大学 | Centering device and method used for sheet-shaped material tensile test |
| CN108645327A (en) * | 2018-03-29 | 2018-10-12 | 北京华海基业机械设备有限公司 | A kind of chain monocycle v-notch Alignment measuring device and centering control method |
| CN210221750U (en) * | 2019-05-15 | 2020-03-31 | 中国科学院金属研究所 | Experimental impact specimen V type breach centering measuring device of using |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112067461A (en) * | 2020-08-24 | 2020-12-11 | 中国飞机强度研究所 | Composite material bending test device |
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