CN110081817A - Eliminate method, apparatus, computer equipment and the storage medium of bias light - Google Patents
Eliminate method, apparatus, computer equipment and the storage medium of bias light Download PDFInfo
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- CN110081817A CN110081817A CN201910335841.0A CN201910335841A CN110081817A CN 110081817 A CN110081817 A CN 110081817A CN 201910335841 A CN201910335841 A CN 201910335841A CN 110081817 A CN110081817 A CN 110081817A
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- 238000000034 method Methods 0.000 title claims abstract description 64
- 230000007613 environmental effect Effects 0.000 claims description 21
- 238000004590 computer program Methods 0.000 claims description 14
- 238000013507 mapping Methods 0.000 claims description 5
- 241000208340 Araliaceae Species 0.000 claims description 3
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- 235000003140 Panax quinquefolius Nutrition 0.000 claims description 3
- 235000008434 ginseng Nutrition 0.000 claims description 3
- 238000005259 measurement Methods 0.000 description 13
- 230000008030 elimination Effects 0.000 description 12
- 238000003379 elimination reaction Methods 0.000 description 12
- 230000010363 phase shift Effects 0.000 description 8
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
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- G06T5/77—
Abstract
The present invention relates to a kind of method, apparatus, computer equipment and computer readable storage medium for eliminating bias light, by passing through under bias light phase shifted sinusoidal striped is covered projector more, and obtain several deforming stripe figures；According to deforming stripe figure, calculate every set phase shifted sinusoidal striped striped and；Then according to striped and, calculate the background light component of every amplitude variation shape bar graph, and several deforming stripe figures are handled according to background light component, to eliminate the background light component in several deforming stripe figures, it can rapidly and accurately remove the bias light in deforming stripe figure.
Description
Technical field
The present invention relates to optical three-dimensional measurement fields, more particularly to a kind of method, apparatus for eliminating bias light, computer
Equipment and computer readable storage medium.
Background technique
Optical triangle method technology based on Structured Illumination industrial detection, control of product quality, machine vision, immediately
Positioning is widely used with fields such as map structuring (SLAM), ideo display stunt and biomedicines.Phase measuring profilometer (PMP)
It is a kind of important optical triangle method technology since the packing density that its measurement accuracy is high, obtains is high.In phase measurement profile
It requires bias light invariable in one-shot measurement in art, exists in the phase otherwise measured and striped is missed with the undulating of frequency
Difference equally exists this error in the three-dimensional data finally obtained.Indoors in three-dimensional measurement, power frequency lighting environment light is common
Variation bias light.
Traditionally, there are three types of methods to remove bias light, and first method is that had using what is be not present in environment light spectrum
The projection light source of special spectrum (such as ultraviolet light or infrared light), adds filtering apparatus, filtering environmental light before camera lens.It is this
Method realization acquires a certain degree of difficulty, and use occasion has certain limitations.For example ultraviolet source is not suitable for human body or other biological three
Dimension measurement；And there are more short-wave infrared ingredients in environment light, and general pattern sensor is low to LONG WAVE INFRARED line sensitivity.
Second method is by carrying out mean value adjustment and contrast correction to the deforming stripe image of acquisition to remove environmental background
Light.But the mean square deviation that this method will carry out image calculates and the operations such as Fourier transformation, algorithm comparison complexity.This method simultaneously
Assuming that the average value of each image acquired in measurement process is approximately equal, in some cases the hypothesis and actual deviation compared with
Greatly.The third method is will to project and acquire number of cycles times or time for exposure that image temporal is arranged to environment light much larger than it
Period, but this method is unfavorable for rapid survey.
Summary of the invention
The embodiment of the present application provides a kind of method, apparatus, computer equipment and computer-readable storage for eliminating bias light
Medium can rapidly and accurately remove the bias light in deforming stripe figure.
A method of eliminating bias light, which comprises
By covering phase shifted sinusoidal striped projector under bias light, and obtaining several deforming stripe figures more；
According to the deforming stripe figure, calculate the striped of phase shifted sinusoidal striped described in every set and；
And, the background light component of deforming stripe figure described in every width is calculated according to the striped；
Several described deforming stripe figures are handled according to the background light component, to eliminate several deforming stripes
Background light component in figure.
In one embodiment, at least three sets of phase shifted sinusoidal stripeds are projected under bias light.
In one embodiment, the bias light includes environmental background light, and the environmental background light is power frequency lighting environment
Light.
In one embodiment, described according to the deforming stripe figure, calculate the striped of phase shifted sinusoidal striped described in every set and
Include:
It is established according to projector background light intensity, environmental background light DC component, time for exposure and bias light component parameters
Background light intensity expression of every suit phase shifted sinusoidal striped in each amplitude variation shape bar graph；
According to the background light intensity expression, calculate the striped of phase shifted sinusoidal striped described in every set and.
In one embodiment, the striped for calculating phase shifted sinusoidal striped described in every set and include:
Calculate at least three sets of phase shifted sinusoidal stripeds striped and.
In one embodiment, it is described according to the striped and, calculate the background light component packet of deforming stripe figure described in every width
It includes:
And, using least square method, background light component ginseng is calculated according to the striped of at least three sets of phase shifted sinusoidal stripeds
Number；
Bias light component parameters are substituted into background light intensity expression, the bias light of deforming stripe figure described in every width is calculated
Component.
In one embodiment, the method also includes:
Obtain the image coordinate of each pixel in the deforming stripe figure for eliminating background light component；
According to the deforming stripe figure for eliminating background light component, each pixel deforming stripe phase is calculated；
Phase-height mapping relationship is searched according to each pixel deforming stripe phase, obtains each pixel height coordinate；
According to the height coordinate of each pixel in the image coordinate of pixel each in deforming stripe figure and deforming stripe figure,
Generate 3-D image.
A kind of device for eliminating bias light, described device include:
Module is obtained, is used under bias light cover phase shifted sinusoidal striped by projector, and obtain several deformations more
Bar graph；
First computing module, for according to the deforming stripe figure, calculate the striped of phase shifted sinusoidal striped described in every set and；
Second computing module and, calculates the background light component of deforming stripe figure described in every width for according to the striped；
Bias light cancellation module, for being handled according to the background light component several described deforming stripe figures, with
Eliminate the background light component in several described deforming stripe figures.
The application also provides a kind of computer equipment, including memory and processor, and the memory is stored with computer
The step of program, the processor realizes upper method when executing the computer program.
The application also provides a kind of computer readable storage medium, is stored thereon with computer program, the computer journey
The step of above method is realized when sequence is executed by processor.
It is provided by the embodiments of the present application eliminate bias light method, by under bias light pass through projector more cover phase
Sine streak is moved, and obtains several deforming stripe figures；According to the deforming stripe figure, phase shifted sinusoidal striped described in every set is calculated
Striped and；Then according to the striped and, calculate the background light component of deforming stripe figure described in every width, and according to the bias light
Component handles several described deforming stripe figures, can be with to eliminate the background light component in several described deforming stripe figures
Rapidly and accurately remove the bias light in deforming stripe figure.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of application for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is a kind of flow chart of the method for the elimination bias light provided in one embodiment；
Fig. 2 is the amplitude variation shape bar graph provided in one embodiment；
Fig. 3 a is that the deforming stripe figure in Fig. 1 uses the deforming stripe figure obtained with frequency phase shifted sinusoidal striped；
Fig. 3 b is that the deforming stripe figure in Fig. 1 is used with the deforming stripe obtained after frequency phase shifted sinusoidal striped elimination bias light
Figure；
Fig. 4 is phase of the 1 row deforming stripe before and after eliminating bias light on the statue forehead provided in one embodiment
Comparison diagram；
Fig. 5 a is the deformation that the deforming stripe figure in Fig. 1 uses multifrequency heterodyne method to obtain using different frequencies phase shifted sinusoidal striped
Bar graph；
Fig. 5 b is to use different frequencies phase shifted sinusoidal striped to use multifrequency heterodyne after the deforming stripe figure in Fig. 1 eliminates bias light
The deforming stripe figure that method obtains；
Fig. 6 is a kind of structural schematic diagram of the device of the elimination bias light provided in one embodiment；
Fig. 7 is the schematic diagram of internal structure of electronic equipment in one embodiment.
Specific embodiment
The application in order to facilitate understanding, in order to make the above objects, features, and advantages of the present application more apparent, under
Face is described in detail in conjunction with specific embodiment of the attached drawing to the application.It is explained in the following description many details
In order to fully understand the application, the better embodiment of the application is given in attached drawing.But the application can be with many not
With form realize, however it is not limited to embodiments described herein.On the contrary, the purpose of providing these embodiments is that making
Disclosure of this application is understood more thorough and comprehensive.The application can be to be much different from other way described herein
Implement, those skilled in the art can do similar improvement without prejudice to the application intension, therefore the application not by
The limitation of following public specific embodiment.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include at least one this feature.In the description of the present application, the meaning of " plurality " is at least two, such as two, three
It is a etc., unless otherwise specifically defined.In the description of the present application, " several " are meant that at least one, such as one,
Two etc., unless otherwise specifically defined.
Unless otherwise defined, all technical and scientific terms used herein and the technical field for belonging to the application
The normally understood meaning of technical staff is identical.Term used herein is intended merely to the mesh of description specific embodiment
, it is not intended that in limitation the application.Term " and or " used herein includes one or more relevant listed items
Any and all combinations.
Fig. 1 is a kind of flow chart of the method for the elimination bias light provided in one embodiment, as shown in Figure 1, eliminating back
The method of scape light includes step 110 to step 140, wherein
Step 110, by covering phase shifted sinusoidal striped projector under bias light, and several deforming stripes are obtained more
Figure.
Phase measuring profilometer is a kind of important three-dimensional sensing technology, can by projector to testee projection come
Obtain the three-dimensional appearance of testee.The basic thought of structural light three-dimensional measurement method is the geometrical relationship using structured light projection
To obtain the three-dimensional information of testee.To there is projector the striped template of setting rule to project to measured object body surface first
Face so that striped template deforms, is deformed bar graph, video camera is used due to the difference of each point depth in testee
In several deforming stripe figures that intake is modulated by testee surface shape.
Phase measuring profilometer can be using complete cycle, N walks phase shift method at equal intervals, using complete cycle in the embodiment of the present application
It when N walks phase shift method at equal intervals, measures a phase and needs to project N spoke line, while shooting back N width deforming stripe, that is, measure one
Secondary needs projection simultaneously shoots a set of bar graph simultaneously.Wherein, bias light includes projector bias light and environmental background light, environment back
Scape light can be power frequency lighting environment light, and the work frequency of power frequency lighting environment light is 50Hz or 60Hz.
The present embodiment is that more set phase shifted sinusoidal stripeds are projected in 1 of power frequency lighting environment light or several periods, with
Multiple phase measurement is carried out in 1 of power frequency lighting environment light or several periods, i.e., every set phase shifted sinusoidal striped corresponding one
Secondary phase measurement.The power frequency lighting environment light of variation reduces the precision of phase measurement, and the purpose of the application is to eliminate each width
The power frequency lighting environment light of deforming stripe figure improves measurement accuracy.Since each spoke line power frequency lighting environment light can not pass through
A set of striped calculates, it is therefore desirable to more set phase shifts can be projected in 1 of power frequency lighting environment light or several periods
Sine streak, such as at least three sets of phase shifted sinusoidal stripeds can be projected under power frequency lighting environment light.With the same period and with vibration
Width, but dephased multiple sine streak figures are known as phase shifted sinusoidal striped between adjacent two width bar graph.Phase shifted sinusoidal striped
It can be generated by computer, and be projected by projector to testee, shot by video camera and obtain several modified strips
Line figure.More set phase shifted sinusoidal stripeds can be projected in 1 of power frequency lighting environment light or several periods, and every set phase shift is just
Frequency between string striped can be the same or different.More set phase shifted sinusoidal stripeds are projected under environmental background light to be guaranteed
There are multiple sampled points within 1 period of power frequency lighting environment light, measurement accuracy can be improved.
Step 120, according to the deforming stripe figure, calculate the striped of phase shifted sinusoidal striped described in every set and.
Deforming stripe figure can indicate are as follows:
Wherein, ai(x, y) is background light intensity, and b (x, y) is the fringe amplitude of deforming stripe figure,For deforming stripe
The fringe phase of figure, δ related to the pattern of objecti=2 π i/N, i=1,2 ..., N is the phase-shift phase of deforming stripe figure.It can be with
Understand, background light intensity includes projector background light intensity and environmental background light intensity.According to deforming stripe figure, calculate described in every set
The striped of phase shifted sinusoidal striped and, that is, calculate under bias light, every suit phase shifted sinusoidal striped is in several deforming stripe figures
Striped and.Specific calculating process includes the following steps:
It is established according to projector background light intensity, environmental background light DC component, time for exposure and bias light component parameters
Background light intensity expression of every suit phase shifted sinusoidal striped in each amplitude variation shape bar graph；According to the background light intensity expression,
Calculate the striped of phase shifted sinusoidal striped described in every set and.
The phase of deforming stripe figure is acquired by following formula:
Under bias light, jth (j=1,2 ..., M) covers phase shifted sinusoidal striped in i-th (j=1,2 ..., N) width modified strip
Background light component in line, i.e. background light intensity expression can be expressed as follows:
Wherein, I in formulap(x, y) be with projector background light intensity, be constant；Iba(x, y) is environmental background light direct current point
Amount, is constant；Ibb(x, y) is the fluctuation amplitude of environmental background light；TjiTo expose initial time, it is normal that Δ T, which is the time for exposure,
Number；F is environmental background light frequency.
It can set:
Then background light intensity expression can be expressed as follows:
Wherein,
According to background light intensity expression, calculate the striped of phase shifted sinusoidal striped described in every set and.To calculate the phase shift of jth set just
The striped of string striped is illustrated with for, and jth covers the striped of phase shifted sinusoidal striped and covers phase shifted sinusoidal striped in N width for jth
The summation of background light intensity in deforming stripe, can be calculated by following formula:
Wherein,β=- π fN Δ T, β ≠ k π, k is integer.
Using above-mentioned calculation method calculate at least three sets of phase shifted sinusoidal stripeds striped and.
Step 130, according to the striped and, calculate the environmental background light component of deforming stripe figure described in every width.
And, using least square method, background light component ginseng is calculated according to the striped of at least three sets of phase shifted sinusoidal stripeds
Number；In the striped for obtaining at least three sets of phase shifted sinusoidal stripeds with after, bias light component parameters are calculated using least square method, specifically
It is as follows:
Set x=NIc(x, y), y=I "bb(x,y)cos2πfT11, z=-I "bb(x,y)sin2πfT11To form vector X
=[x y z]T；
Set matrix
Set matrix
According to X=A-1B calculates X, so that the amount x, y, z that solve can be obtained:
2πfT11=-arctg (z/y) (11)
Bias light component parameters are substituted into background light intensity expression, the bias light of deforming stripe figure described in every width is calculated
Component.
Known variables I ' in background light intensity expressionbb(x, y) can be indicated are as follows:
By the expression formula (12) and2πfT11=-arctg (z/y) substitutes into light intensity expression (5), then
The work frequency and time for exposure Δ T of combining environmental bias light can find out jth (j=1,2 ..., M) set phase shifted sinusoidal
Background light component of the striped in i-th (j=1,2 ..., N) width deforming stripe, so as to obtain every set phase shifted sinusoidal striped
Background light component a in each width deforming stripeji(x,y)。
Step 140, several described deforming stripe figures are handled according to background light component, to eliminate several deformations
Background light component in bar graph.
For each amplitude variation shape bar graph, it is poor that background light component corresponding with this is made, to eliminate deformation described in the width
Background light component in bar graph.
Every amplitude variation shape bar graph can specifically be handled by following formula:
So as to remove the striped of jth set phase shifted sinusoidal striped and in the background light component of the i-th width deforming stripe, pass through
Take different values that can eliminate the background light component in several described deforming stripe figures i and j.I′ji(x, y) is to eliminate back
The deforming stripe figure of scape light component.
It is provided in this embodiment eliminate bias light method, by under bias light pass through projector more than set phase shift just
String striped, and obtain several deforming stripe figures；According to the deforming stripe figure, the striped of phase shifted sinusoidal striped described in every set is calculated
With；Then according to the striped and, calculate the environmental background light component of deforming stripe figure described in every width, and according to the bias light
Component handles several described deforming stripe figures, can be with to eliminate the background light component in several described deforming stripe figures
Rapidly and accurately remove the bias light in deforming stripe figure.
In one embodiment, the method also includes: obtain eliminate background light component deforming stripe figure in each pixel
Image coordinate；According to the deforming stripe figure for eliminating background light component, each pixel deforming stripe phase is calculated；According to each pixel
Point deformation fringe phase searches Phase-height mapping relationship, obtains each pixel height coordinate；According to picture each in deforming stripe figure
The height coordinate of each pixel in the image coordinate and deforming stripe figure of vegetarian refreshments generates 3-D image.
Each amplitude variation shape bar graph includes multirow or multiple row striped, and every a line or each column striped include multiple pictures
Vegetarian refreshments can obtain the image coordinate of multiple pixels in every a line or each column striped first, then according to elimination bias light
The deforming stripe figure of component calculates each pixel deforming stripe phase.In addition, due in optical triangle method technology,
There are certain mapping relations for the phase of striped and the height of object, it can is found out according to the phase of pixel a certain in striped
Object is in the corresponding height of pixel, then according to camera model, and by the height coordinate of each pixel in deforming stripe figure
The lateral coordinates (height is longitudinal coordinate, is lateral coordinates with the coordinate in high perpendicular plane) of object are found out, so as to
Generate 3-D image.The 3-D image that object is obtained according to the phase of deforming stripe figure is the prior art, specifically refers to Li Yong,
Su Xianyu can obtain PMP three-dimension measuring system [J] Zhejiang Normal University's journal (natural science edition) of color texture, and 2006
(01): the description in 37-41., this embodiment is not repeated.
In the embodiment of the present application, be respectively 18 with the same frequency phase shifted sinusoidal striped and 3 sets of periods that 3 sets of periods are 18 pixels,
21, the different frequencies phase shifted sinusoidal striped of 21.5 pixels is tested, and is surveyed to bias light is eliminated with the phase for not eliminating bias light
Amount result is compared.Using the complete cycle of 3 step phase shift method at equal intervals in experiment, the phase of reliability guiding is used with frequency striped
Method of deploying obtains continuous phase, and different frequencies striped obtains continuous phase using multifrequency heterodyne method.When fringe projection-shooting period
Between be 1/200 second.
Experimental result is following (phase in result is the value subtracted after reference planes phase): Fig. 2 is a wherein amplitude variation shape
Bar graph.Fig. 3 a is deforming stripe figure when same frequency phase shifted sinusoidal striped does not eliminate bias light, as we can clearly see from the figure with
Undulating error of the striped with frequency.Fig. 3 b is the deforming stripe figure obtained after the processing of above-mentioned bias light removing method.Fig. 4 is
1 row deforming stripe on statue forehead obtains the comparison of phase before and after the processing.It can be seen that from Fig. 3 b and Fig. 4 by this method
After processing, the error of undulating is eliminated.Fig. 5 a is the deformation that different frequencies phase shifted sinusoidal striped uses multifrequency heterodyne method to obtain
Bar graph, it can be seen that phase error causes greatly very much a large amount of fringe orders to calculate mistake, and measurement result is nonsensical.Fig. 5 b
It is the deforming stripe figure obtained after the processing of above-mentioned bias light removing method with multifrequency heterodyne method.It can thus be seen that this Shen
The bias light removing method that please be provided can accurately eliminate the bias light in deforming stripe figure.
It should be understood that although each step in the flow chart of Fig. 1 is successively shown according to the instruction of arrow, this
A little steps are not that the inevitable sequence according to arrow instruction successively executes.Unless expressly state otherwise herein, these steps
It executes there is no the limitation of stringent sequence, these steps can execute in other order.Moreover, at least part in Fig. 1
Step may include that perhaps these sub-steps of multiple stages or stage are executed in synchronization to multiple sub-steps
It completes, but can execute at different times, the execution sequence in these sub-steps or stage, which is also not necessarily, successively to be carried out,
But it can be executed in turn or alternately at least part of the sub-step or stage of other steps or other steps.
Fig. 6 is a kind of structural schematic diagram of the device of the elimination bias light provided in one embodiment, as shown in fig. 6, disappearing
Except the device of bias light includes: to obtain module 610, the first computing module 620, the second computing module 630 and bias light to eliminate mould
Block 640, wherein
Module 610 is obtained, is used under bias light cover phase shifted sinusoidal striped by projector, and obtain several changes more
Shape bar graph；
In one embodiment, at least three sets of phase shifted sinusoidal stripeds are projected under bias light.
In one embodiment, the bias light includes environmental background light, and the environmental background light is power frequency lighting environment
Light.
First computing module 620, for calculating the striped of phase shifted sinusoidal striped described in every set according to the deforming stripe figure
With；
In one embodiment, the first computing module 620 is according to projector background light intensity, environmental background light DC component, exposure
Between light time and bias light component parameters establish every suit phase shifted sinusoidal striped in the background light intensity table of each amplitude variation shape bar graph
Up to formula；
According to the background light intensity expression, calculate the striped of phase shifted sinusoidal striped described in every set and.
In one embodiment, calculate at least three sets of phase shifted sinusoidal stripeds striped and.
Second computing module 630 and, calculates the bias light point of deforming stripe figure described in every width for according to the striped
Amount；
In one embodiment, the second computing module 630 according to the stripeds of at least three sets of phase shifted sinusoidal stripeds and, utilize minimum
Bias light component parameters are calculated in square law；
Bias light component parameters are substituted into background light intensity expression, the bias light of deforming stripe figure described in every width is calculated
Component.
Bias light cancellation module 640, for being handled according to the background light component several described deforming stripe figures,
To eliminate the background light component in several described deforming stripe figures.
In one embodiment, the device for eliminating bias light further includes 3-D image generation module (not shown), is used for
Obtain the image coordinate of each pixel in the deforming stripe figure for eliminating background light component；
According to the deforming stripe figure for eliminating background light component, each pixel deforming stripe phase is calculated；
Phase-height mapping relationship is searched according to each pixel deforming stripe phase, obtains each pixel height coordinate；
According to the height coordinate of each pixel in the image coordinate of pixel each in deforming stripe figure and deforming stripe figure,
Generate 3-D image.
The division of modules is only used for for example, in other embodiments in the device of above-mentioned elimination bias light, can
The device for eliminating bias light is divided into different modules as required, with complete the device of above-mentioned elimination bias light whole or
Partial function.
Specific about the device for eliminating bias light limits the method that may refer to above for environmental background light is eliminated
Restriction, details are not described herein.Modules in the device of above-mentioned elimination bias light can be fully or partially through software, hardware
And combinations thereof realize.Above-mentioned each module can be embedded in the form of hardware or independently of in the processor in computer equipment,
It can be stored in a software form in the memory in computer equipment, execute the above modules pair in order to which processor calls
The operation answered.
The realization of modules in the device of the elimination bias light provided in the embodiment of the present application can be computer program
Form.The computer program can be run in terminal or server.The program module that the computer program is constituted is storable in
On the memory of terminal or server.When the computer program is executed by processor, side described in the embodiment of the present application is realized
The step of method.
Fig. 7 is the schematic diagram of internal structure of computer equipment in one embodiment.As shown in fig. 7, the computer equipment packet
Include processor, memory and the network interface connected by system bus.Wherein, which calculates and controls energy for providing
Power supports the operation of entire computer equipment.Memory for storing data, program etc., at least one meter is stored on memory
Calculation machine program, the computer program can be executed by processor, to realize that is provided in the embodiment of the present application sets suitable for computer
Standby wireless network communication method.Memory may include non-volatile memory medium and built-in storage.Non-volatile memory medium
It is stored with operating system and computer program.The computer program can be performed by processor, for realizing following each reality
Apply a kind of method for eliminating bias light provided by example.Built-in storage is the operating system computer in non-volatile memory medium
The running environment of program offer cache.Network interface can be Ethernet card or wireless network card etc., based on outside
Machine equipment is calculated to be communicated.The computer equipment can be mobile terminal, tablet computer or personal digital assistant or wearable
Equipment etc..
Wherein, the method for the above-mentioned elimination bias light referred to is specifically as follows: more by projector under bias light
Phase shifted sinusoidal striped is covered, and obtains several deforming stripe figures；According to the deforming stripe figure, phase shifted sinusoidal item described in every set is calculated
The striped of line and；And, the background light component of deforming stripe figure described in every width is calculated according to the striped；According to the bias light point
Amount handles several described deforming stripe figures, to eliminate the background light component in several described deforming stripe figures.
The embodiment of the present application also provides a kind of computer readable storage mediums.One or more is executable comprising computer
The non-volatile computer readable storage medium storing program for executing of instruction, when the computer executable instructions are executed by one or more processors
When, so that the step of processor executes the method for eliminating bias light.
A kind of computer program product comprising instruction, when run on a computer, so that computer executes elimination
The method of bias light.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (10)
1. a kind of method for eliminating bias light, which is characterized in that the described method includes:
By covering phase shifted sinusoidal striped projector under bias light, and obtaining several deforming stripe figures more；
According to the deforming stripe figure, calculate the striped of phase shifted sinusoidal striped described in every set and；
And, the background light component of deforming stripe figure described in every width is calculated according to the striped；
Several described deforming stripe figures are handled according to the background light component, to eliminate in several described deforming stripe figures
Background light component.
2. the method according to claim 1, wherein projecting at least three sets of phase shifted sinusoidal stripeds under bias light.
3. the method according to claim 1, wherein the bias light includes environmental background light, and the environment
Bias light is power frequency lighting environment light.
4. according to the method described in claim 3, calculating described in every set it is characterized in that, described according to the deforming stripe figure
The striped of phase shifted sinusoidal striped and include:
It is established according to projector background light intensity, environmental background light DC component, time for exposure and bias light component parameters each
Phase shifted sinusoidal striped is covered in the background light intensity expression of each amplitude variation shape bar graph；
According to the background light intensity expression, calculate the striped of phase shifted sinusoidal striped described in every set and.
5. according to the method described in claim 4, it is characterized in that, the striped for calculating phase shifted sinusoidal striped described in every set and
Include:
Calculate at least three sets of phase shifted sinusoidal stripeds striped and.
6. according to the method described in claim 5, it is characterized in that, it is described according to the striped and, calculate deformation described in every width
The background light component of bar graph includes:
And, using least square method, the background light component ginseng is calculated according to the striped of at least three sets of phase shifted sinusoidal stripeds
Number；
The bias light component parameters are substituted into the background light intensity expression, the back of deforming stripe figure described in every width is calculated
Scape light component.
7. according to the method described in claim 5, it is characterized in that, the method also includes:
Obtain the image coordinate of each pixel in the deforming stripe figure for eliminating background light component；
According to the deforming stripe figure for eliminating background light component, each pixel deforming stripe phase is calculated；
Phase-height mapping relationship is searched according to each pixel deforming stripe phase, obtains each pixel height coordinate；
According to the height coordinate of each pixel in the image coordinate of pixel each in deforming stripe figure and deforming stripe figure, generate
3-D image.
8. a kind of device for eliminating bias light, which is characterized in that described device includes:
Module is obtained, is used under bias light cover phase shifted sinusoidal striped by projector, and obtain several deforming stripes more
Figure；
First computing module, for according to the deforming stripe figure, calculate the striped of phase shifted sinusoidal striped described in every set and；
Second computing module and, calculates the background light component of deforming stripe figure described in every width for according to the striped；
Bias light cancellation module, for being handled according to the background light component several described deforming stripe figures, to eliminate
Background light component in several described deforming stripe figures.
9. a kind of computer equipment, including memory and processor, the memory are stored with computer program, feature exists
In the step of processor realizes any one of claims 1 to 7 the method when executing the computer program.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of claims 1 to 7 is realized when being executed by processor.
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