CN108534715A - A kind of expansion phase solution phase method applied to different wave length three-dimensional measurement - Google Patents
A kind of expansion phase solution phase method applied to different wave length three-dimensional measurement Download PDFInfo
- Publication number
- CN108534715A CN108534715A CN201810329567.1A CN201810329567A CN108534715A CN 108534715 A CN108534715 A CN 108534715A CN 201810329567 A CN201810329567 A CN 201810329567A CN 108534715 A CN108534715 A CN 108534715A
- Authority
- CN
- China
- Prior art keywords
- phase
- value
- formula
- wavelength
- expansion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2509—Color coding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention belongs to field of three-dimensional machine vision, are related to a kind of expansion phase solution phase method applied to different wave length three-dimensional measurement.It is respectively λ that this method projects 3 kinds of wavelength by light source projection device to testee1、λ2And λ3Sine or cosine rule variation optical information, the phase-shift pattern of each wavelength is acquired using colour TV camera, calculate the phase value of each pixel of each wavelength, the expansion phase value of each pixel is calculated by the phase value of each pixel of each wavelength, and then the overall picture three-dimensional coordinate data of object is obtained by three-dimensional rebuilding method.Expansion phase solution phase method designed by the present invention is better than traditional Gray's code phase solution phase method, can be not necessarily to spray development agent with the inconsistent measurement problem of testee surface color in effective solution three-dimensional measurement, more environmentally protective.
Description
Technical field
The present invention relates to a kind of expansion phase solution phase methods applied to different wave length three-dimensional measurement, more specifically, this
Invention is related to a kind of solution phase method that can be used in high precision three-dimensional measurement and obtain testee expansion phase from different wave length.
Background technology
Optical three-dimensional measuring method is widely used to industrial detection, reverse-engineering, body scans, historical relic's protection, clothes
The multiple fields such as shoes and hats, have the detection of free form surface that speed is fast, advantage with high accuracy.Not according to imaging illumination mode
Together, optical three-dimensional measurement technology can be divided into passive three-dimensional measurement and active three-dimensional measurement two major classes.In active three-dimensional measurement technology
In, structural light three-dimensional measuring technique is with the fastest developing speed, especially phase measuring profilometer (Phase Measuring
Profilometry, PMP), also referred to as phase-shift measurement technology of profiling (Phase Shifting Profilometry, PSP) is
Common measurement method in three-dimensional measurement product at present.Method for Phase Difference Measurement be on testee project the fixed cycle according to
The brightness image of trigonometric function (sinusoidal or cosine) rule variation, this brightness image pass through the uniform phase shift more than 3 steps,
Preferably 4-6 walks uniform phase shift, projects 4-6 brightness image to object, is finally completed the phase shift of a cycle.Object
Each point above can obtain several different brightness values respectively in the picture after the projection of phase shifted images.This brightness value
By solving phase operation, unique phase value can be obtained.Since the breadth of current the image collected is larger, in order to improve phase essence
Degree needs the phase diagram that multi-wavelength is projected to testee, and therefore, in piece image, same phase value will appear repeatedly.
In order to obtain unique phase value in the picture, Gray code method is common auxiliary solution phase method.The three-dimensional survey occurred at present
Volume production product generally use the optical projecting method of gray code, such as the Atos-I type structural light three-dimensionals of GOM companies of Germany to survey
Amount system, the COMMET series structure light three-dimension measuring system of Steinbichler companies of Germany, Breuckmann companies of Germany
OptoTOP series structure light three-dimension measuring system, the remote three-dimensional Science and Technology Ltd. in Beijing day OKIO-II type 3-D scannings
Instrument, the comprehensive spatial digitizers of 3DSS of Shanghai Shuo Zao Science and Technology Ltd.s, the Tianjin century limited public affairs of power photoelectricity scientific instrument
CPOS spatial digitizers of department etc..It is right since the coding method of Gray code is encoded mainly by the binaryzation of image
Change more situation in color of object surface, preferable measurement effect could be realized by generally requiring spray development agent.To understand
Certainly can not the three-dimensional measurement problem of spray development agent devise a kind of new the present invention is based on the optical projecting method of different wave length
The expansion phase solution phase method based on different wave length.
Invention content
The present invention provides a kind of expansion phase solution phase method based on different wave length, and this method can be applied to high-precision three
During dimension measures, defect existing for traditional heterodyne multi-frequency solution phase method can be made up.
The hardware system of the phase solution phase method based on different wave length includes：
Light source projection device for projecting multi-wavelength's optical signal, the resolution ratio of the light source projection device be W ×
H；
For precision controlling, Image Acquisition and the computer of data processing；
The image resolution ratio of colour TV camera for acquiring image, the colour TV camera is CR×CC, camera number
It is 1-2；
Scanning platform for placing the light source projection device and the colour TV camera；
Expansion phase solution phase method designed by the present invention, it is characterized in that：Expansion for each point (x, y) in image
Steps are as follows for the calculating of phase value：
Step 1：Start the light source projection device for projecting multi-wavelength's optical signal, point of the light source projection device
Resolution is W × H；λ is set1、λ2、λ3、N1And N2Value, the λ1、λ2And λ3Value between 0-w, N1=λ1/λ2, N2
=λ2/λ3；The step number that phase shifted images are arranged is N (N ＞ 3, and N ∈ [4,8])；
Step 2：It is λ to object projection wavelength using the light source projection device1Phase shifted images, the phase shift
The step number of image is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to formula (1)I.e. in formula (1)I values be 1：
Wherein, In(x, y) indicates the light intensity value that video camera receives,For the wrapped phase of every bit to be calculated
Value (value of i is respectively 1,2,3)；
Step 3：It is λ to object projection wavelength using the light source projection device2Phase shifted images, the phase shift
The step number of image is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to formula (1)I.e. in formula (1)I values be 2；
Step 4：It is λ to object projection wavelength using the light source projection device3Phase shifted images, the phase shift
The step number of image is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to formula (1)I.e. in formula (1)I values be 3；
Step 5：Utilize N set in step 11And N2Value and step 3 and step 4 in calculated
WithPhase unwrapping operation is carried out, expansion phase value Φ is solved according to formula (2)3(x, y)：
Wherein, INT expressions take the integer nearest more than or equal to this number and with it；
Step 6：Error correction is carried out to the phase unwrapping operation described in step 5, it is as follows：
WhenOrAndOrAndOrWhen, by formula (3) to institute
The expansion phase value Φ stated3(x, y) is modified：
WhenOrAnd
OrOrWhen, by formula (4) to the expansion phase value Φ3(x,
Y) it is modified：
WhenAndOr
AndOrWhen, by formula (5) to the expansion phase value Φ3(x,
Y) it is modified：
The expansion phase value operation of (x, y) point finishes.
It is as shown in Figure 1 that phase solution phase method flow chart is unfolded.Phase after solution phase can be directly used in the three-dimensional seat of calculating
Mark.
The beneficial effects of the invention are as follows：The expansion phase solution phase method introduced through the invention, can solve object table
The inconsistent problem of face color is not necessarily to spray development agent, you can realize the high precision three-dimensional measurement under complex colors environment, it can be with
Avoid defect present in Gray's code phase solution phase method.
Description of the drawings
Fig. 1：Phase solution phase method schematic diagram is unfolded；
Fig. 2：Six step phase shift calculating process schematic diagram of standard；
Fig. 3：The projection deforming stripe pattern schematic diagram that camera takes；
(a) wavelength is λ1Fringe projection, λ1=1008
(b) wavelength is λ2Fringe projection, λ2=144
(c) wavelength is λ3Fringe projection, λ3=16
Fig. 4：The phase diagram schematic diagram obtained after six step phase shifts；
(a) wavelength is λ1Phase diagram, λ1=1008
(b) wavelength is λ2Phase diagram, λ2=144
(c) wavelength is λ3Phase diagram, λ3=16
Specific implementation mode
The method of multi-wavelength is that the sine or cosine function wave of at least two wavelength, each wavelength are projected to testee
Function pass through 4-8 walk phase shift.By the phase function of two kinds of wavelength, a kind of waveform that wavelength is longer can be superimposed out.
By taking a kind of optical signal of wavelength as an example, some pixel (x, y), the brightness I that actual acquisition arrivesn(x's, y)
Shown in formula such as formula (6)：
Wherein, A (x, y) indicates that background light intensity, B (x, y) indicate that the light intensity of image compares modulation item, represent shaking for light intensity
Width, λ are the wavelength of striped,It is the function of body form for the relative phase values of every bit to be calculated, δ (x, y) is
The phase shift value of image, phaseIn contain the information of object Shape ' h (x, y).
By taking six step phase shifts as an example, for some pixel (x, y), by six light projections, and make each phase-shift phase point
Not Wei 0,2 π/6,4 π/6, π, 8 π/6,10 π/6, the image collected gray value is respectively I1(x, y), I2(x, y), I3(x, y),
I4(x, y), I5(x, y), I6(x, y), phase value at this timeIt can be obtained by formula (7).
Six step phase shift calculating process schematic diagram of standard is as shown in Figure 2.
The λ selected with the present invention1=1008, λ2=144, λ3For=16, chooses a tooth model and measure.Such as
Fig. 3 show the deforming stripe pattern that camera takes, and is illustrated in figure 4 the phase diagram obtained after six step phase shifts.
Analysis according to three wavelength fringe projection phase-unwrapping algorithms to phase error tolerance, at this time maximum phase errorForIf the maximum phase error of wrapped phaseIt is known that so the selection of striped wavelength must at least expire
Two of which in three conditions described in sufficient formula (8).
Wherein, λ1=kg1, λ2=kg2, λ3=kg3, k λ1, λ2, λ3Greatest common divisor, g1、g2、g3It is relatively prime two-by-two
Positive integer；k1For λ1And λ2Greatest common divisor, k2For λ1And λ3Greatest common divisor, k3For λ2And λ3Greatest common divisor.With this
Three kinds of wavelength that invention is selected can carry out correct phase unwrapping.
Expansion phase solution phase method designed by the present invention, it is characterized in that：Expansion for each point (x, y) in image
Steps are as follows for the calculating of phase value：
Step 1：Start the light source projection device for projecting multi-wavelength's optical signal, point of the light source projection device
Resolution is W × H；λ is set1、λ2、λ3、N1And N2Value, the λ1、λ2And λ3Value between 0-w, N1=λ1/λ2, N2
=λ2/λ3；The step number that phase shifted images are arranged is N (N ＞ 3, and N ∈ [4,8])；
Step 2：It is λ to object projection wavelength using the light source projection device1Phase shifted images, the phase shift
The step number of image is N set in step 1, acquires each image, calculates corresponding wrapped phase value according to the following formulaI.e. in formula (1)I values be 1：
Wherein, In(x, y) indicates the light intensity value that video camera receives,For the wrapped phase of every bit to be calculated
Value (value of i is respectively 1,2,3)；
Step 3：It is λ to object projection wavelength using the light source projection device2Phase shifted images, the phase shift
The step number of image is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to above formulaI.e. in formula (1)I values be 2；
Step 4：It is λ to object projection wavelength using the light source projection device3Phase shifted images, the phase shift
The step number of image is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to above formulaI.e. in formula (1)I values be 3；
Step 5：Utilize N set in step 11And N2Value and step 3 and step 4 in calculated
WithPhase unwrapping operation is carried out, solves expansion phase value Φ according to the following formula3(x, y)：
Wherein, INT expressions take the integer nearest more than or equal to this number and with it；
Step 6：Error correction is carried out to the phase unwrapping operation described in step 5, it is as follows：
WhenOrAndOrAndOrWhen, by following formula to described
Expansion phase value Φ3(x, y) is modified：
WhenOrAnd
OrOrWhen, by following formula to the expansion phase value Φ3(x, y)
It is modified：
WhenAndOr
AndOrWhen, by following formula to the expansion phase value Φ3(x, y)
It is modified：
The expansion phase value operation of (x, y) point finishes.
The present invention and the maximum difference of the existing solution phase method based on Gray code are：Gray code method is to pass through image
Threshold segmentation is converted into 0 and 1 two kind of signal, can not solve the inconsistent situation of color of object surface；And designed by the present invention
Phase method is solved, is not encoded only by 0 and 1 two kind of signal, is encoded by the phase value of each point.
Therefore the method designed by the present invention can solve the inconsistent measurement problem of color of object surface, be not necessarily to spray development agent, i.e.,
High-precision measurement can be achieved.
The present invention and the difference of existing multi-frequency solution phase method are：Existing multi-frequency solution phase method, only according to most
Whole synthesis phase carries out phase division to detected space, also carries out last three-dimensional just with final synthesis phase
It calculates, since the calculating error of final synthesis phase is larger, carrying out three-dimensional computations only according to final synthesis phase can band
Carry out prodigious calculating error.And the different wave length solution phase method designed by the present invention, it is not only according to final synthesis phase
Phase information to carry out three-dimensional computations, but comprehensively utilize three kinds of different wave lengths carries out phase unwrapping operation and phase is repaiied
Just.Since the original phase computational accuracy of three kinds of wavelength is better than traditional multi-frequency solution phase method, designed by the present invention
Phase solution phase method is unfolded, measurement accuracy and reliability can be improved to greatest extent.
In conclusion the advantages of solution phase method of the present invention, is：
(1) due to not being to determine phase code by simple Threshold segmentation, the solution phase method accuracy of the present invention
Higher than Gray code solution phase method；
(2) due to not being mutually to be operated only according to final synthesis phase to carry out solution, the phase designed by the present invention
Position solution phase method has higher solution phase precision than traditional multi-frequency solution phase method；
(3) the inconsistent measurement problem of color of object surface is solved, without the coloured materials such as spray development agent, measurement process
It is environmentally protective, also save consumables cost in measurement.
Schematically the present invention and embodiments thereof are described above, this describes no limitation, institute in attached drawing
What is shown is also one of embodiments of the present invention.So if those skilled in the art are enlightened by it, do not departing from
In the case of the invention objective, each component layouts mode of the same item or other forms that take other form, without
Creative designs technical solution similar with the technical solution and embodiment, is within the scope of protection of the invention.
Claims (1)
1. the expansion phase solution phase method designed by the present invention, it is characterized in that：For the expansion phase of each point (x, y) in image
Steps are as follows for the calculating of place value：
Step 1：Start the light source projection device for projecting multi-wavelength's optical signal, the resolution ratio of the light source projection device
For W × H；λ is set1、λ2、λ3、N1And N2Value, the λ1、λ2And λ3Value between 0-W, N1=λ1/λ2, N2=λ2/
λ3；The step number that phase shifted images are arranged is N (N ＞ 3, and N ∈ [4,8])；
Step 2：It is λ to object projection wavelength using the light source projection device1Phase shifted images, the phase shifted images
Step number is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to formula (1)I.e.
In formula (1)I values be 1：
Wherein, In(x, y) indicates the light intensity value that video camera receives,For the wrapped phase value (i of every bit to be calculated
Value be respectively 1,2,3)；
Step 3：It is λ to object projection wavelength using the light source projection device2Phase shifted images, the phase shifted images
Step number is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to formula (1)I.e.
In formula (1)I values be 2；
Step 4：It is λ to object projection wavelength using the light source projection device3Phase shifted images, the phase shifted images
Step number is N set in step 1, acquires each image, and corresponding wrapped phase value is calculated according to formula (1)I.e.
In formula (1)I values be 3；
Step 5：Utilize N set in step 11And N2Value and step 3 and step 4 in calculatedWithPhase unwrapping operation is carried out, expansion phase value Φ is solved according to formula (2)3(x, y)：
Wherein, INT expressions take the integer nearest more than or equal to this number and with it；
Step 6：Error correction is carried out to the phase unwrapping operation described in step 5, it is as follows：
WhenOrAndOrAndOrWhen, it is right by formula (3)
The expansion phase value Φ3(x, y) is modified：
WhenOrAndOrOrWhen, by formula (4) to the expansion phase value Φ3(x, y)
It is modified：
WhenAndOrAndOrWhen, by formula (5) to the expansion phase value Φ3(x, y)
It is modified：
The expansion phase value operation of (x, y) point finishes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810329567.1A CN108534715A (en) | 2018-04-11 | 2018-04-11 | A kind of expansion phase solution phase method applied to different wave length three-dimensional measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810329567.1A CN108534715A (en) | 2018-04-11 | 2018-04-11 | A kind of expansion phase solution phase method applied to different wave length three-dimensional measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108534715A true CN108534715A (en) | 2018-09-14 |
Family
ID=63480096
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810329567.1A Pending CN108534715A (en) | 2018-04-11 | 2018-04-11 | A kind of expansion phase solution phase method applied to different wave length three-dimensional measurement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108534715A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110234954A (en) * | 2017-03-08 | 2019-09-13 | 欧姆龙株式会社 | It is mutually reflected detection device, is mutually reflected detection method and program |
| CN111174731A (en) * | 2020-02-24 | 2020-05-19 | 五邑大学 | Color segmentation based double-stripe projection phase unwrapping method and device |
| CN112378576A (en) * | 2020-10-29 | 2021-02-19 | 西北工业大学 | Optical pressure sensitive coating pressure calibrating device based on CCD camera |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10122834A (en) * | 1996-10-24 | 1998-05-15 | Tokyo Gas Co Ltd | Noncontact measuring method and measuring equipment of three-dimensional form |
| CN102589478A (en) * | 2012-02-29 | 2012-07-18 | 天津工业大学 | Overall phase demodulating method applied to multi-frequency three-dimensional measurement |
| CN102881043A (en) * | 2012-09-18 | 2013-01-16 | 天津工业大学 | High-precision three-dimensional reconstruction method applied to scenes with large light and shade contrast |
| CN104330052A (en) * | 2014-11-21 | 2015-02-04 | 天津工业大学 | Heterodyne three-frequency unequal range phase displacement solution phase method |
| JP2015206749A (en) * | 2014-04-23 | 2015-11-19 | 株式会社ニコン | Coupling method of three-dimensional data, shape measurement method, coupling device of three-dimensional data, shape measurement device, structure manufacturing method, structure manufacturing system and shape measurement program |
-
2018
- 2018-04-11 CN CN201810329567.1A patent/CN108534715A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10122834A (en) * | 1996-10-24 | 1998-05-15 | Tokyo Gas Co Ltd | Noncontact measuring method and measuring equipment of three-dimensional form |
| CN102589478A (en) * | 2012-02-29 | 2012-07-18 | 天津工业大学 | Overall phase demodulating method applied to multi-frequency three-dimensional measurement |
| CN102881043A (en) * | 2012-09-18 | 2013-01-16 | 天津工业大学 | High-precision three-dimensional reconstruction method applied to scenes with large light and shade contrast |
| JP2015206749A (en) * | 2014-04-23 | 2015-11-19 | 株式会社ニコン | Coupling method of three-dimensional data, shape measurement method, coupling device of three-dimensional data, shape measurement device, structure manufacturing method, structure manufacturing system and shape measurement program |
| CN104330052A (en) * | 2014-11-21 | 2015-02-04 | 天津工业大学 | Heterodyne three-frequency unequal range phase displacement solution phase method |
Non-Patent Citations (1)
| Title |
|---|
| 宁召柯: "第2.2.3移相法和3.4 三种波长差很小的相位展开算法", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110234954A (en) * | 2017-03-08 | 2019-09-13 | 欧姆龙株式会社 | It is mutually reflected detection device, is mutually reflected detection method and program |
| US11441896B2 (en) | 2017-03-08 | 2022-09-13 | Omron Corporation | Inter-reflection detection apparatus and inter-reflection detection method |
| CN111174731A (en) * | 2020-02-24 | 2020-05-19 | 五邑大学 | Color segmentation based double-stripe projection phase unwrapping method and device |
| CN111174731B (en) * | 2020-02-24 | 2021-06-08 | 五邑大学 | Color segmentation based double-stripe projection phase unwrapping method and device |
| CN112378576A (en) * | 2020-10-29 | 2021-02-19 | 西北工业大学 | Optical pressure sensitive coating pressure calibrating device based on CCD camera |
| CN112378576B (en) * | 2020-10-29 | 2022-03-25 | 西北工业大学 | Optical pressure sensitive coating pressure calibrating device based on CCD camera |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102322823B (en) | Phase grade self-coding-based optical three-dimensional measurement method | |
| CN109489585B (en) | Three-dimensional measurement method based on improved multi-frequency stripe structured light | |
| CN102589478B (en) | Overall phase demodulating method applied to multi-frequency three-dimensional measurement | |
| CN110174079B (en) | Three-dimensional reconstruction method based on four-step phase-shift coding type surface structured light | |
| CN108955571B (en) | The method for three-dimensional measurement that double frequency heterodyne is combined with phase-shift coding | |
| CN105844633B (en) | Single frames structure optical depth acquisition methods based on De sequence and phase code | |
| CN108534715A (en) | A kind of expansion phase solution phase method applied to different wave length three-dimensional measurement | |
| CN111207694B (en) | Three-dimensional measurement method combining double-step phase shift method with phase coding | |
| CN108195313A (en) | A kind of high dynamic range method for three-dimensional measurement based on Intensity response function | |
| CN102853783A (en) | High-precision multi-wavelength three-dimensional measurement method | |
| CN102261896A (en) | Method and system for measuring three-dimensional shape of object based on phase measurement | |
| CN108596008B (en) | Face shake compensation method for three-dimensional face measurement | |
| CN109523627A (en) | A kind of three-dimensional rebuilding method based on Taylor's exponential expression moulding surface structure light | |
| CN112945089A (en) | Structured light coding method based on stripe width modulation | |
| CN102881043A (en) | High-precision three-dimensional reconstruction method applied to scenes with large light and shade contrast | |
| CN110207620A (en) | A kind of three-dimensional rebuilding method determining digital fringe projection structure optical orders by different frequency | |
| CN111174730A (en) | Rapid phase unwrapping method based on phase encoding | |
| CN112504165A (en) | Composite stereo phase unfolding method based on bilateral filtering optimization | |
| Ding et al. | Recovering the absolute phase maps of three selected spatial-frequency fringes with multi-color channels | |
| CN110440714A (en) | A kind of phase unwrapping package method based on multifrequency and binary system striped | |
| Jiang et al. | High-speed 3D shape measurement using efficient moiré-assisted three-frequency heterodyne phase unwrapping algorithm | |
| CN1302257C (en) | Method for realizing Fourier transfrom contour by generating pi phase shift by two-colour grating template | |
| CN114252026B (en) | Three-dimensional measurement method and system for modulating three-dimensional code on periodic edge | |
| CN114234852B (en) | Multi-view structured light three-dimensional measurement method and system based on optimal mapping point set matching | |
| Cheng et al. | Color fringe projection profilometry using geometric constraints |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20180914 |
|
| WD01 | Invention patent application deemed withdrawn after publication |