CN110068287A - Method for correcting phase, device, computer equipment and computer readable storage medium - Google Patents
Method for correcting phase, device, computer equipment and computer readable storage medium Download PDFInfo
- Publication number
- CN110068287A CN110068287A CN201910336936.4A CN201910336936A CN110068287A CN 110068287 A CN110068287 A CN 110068287A CN 201910336936 A CN201910336936 A CN 201910336936A CN 110068287 A CN110068287 A CN 110068287A
- Authority
- CN
- China
- Prior art keywords
- phase
- error
- deforming stripe
- approximate
- striped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
The present invention relates to a kind of method for correcting phase, device, computer equipment and computer readable storage mediums, wherein method for correcting phase includes: the deforming stripe figure for obtaining video camera shooting, and extracts the measurement phase of deforming stripe figure；High-pass filtering processing is carried out to the measurement phase of the deforming stripe figure, obtains error phase and approximate phase；The characterisitic parameter of the error phase is obtained, and the corresponding error span of the error phase is obtained according to the characterisitic parameter；Phasing is carried out to the deforming stripe figure according to the error span and the approximate phase.Above-mentioned method for correcting phase may be implemented after carrying out phasing to the measurement phase of deforming stripe figure, can also retain object appearance details.
Description
Technical field
The present invention relates to three-dimensional measurement technical fields, more particularly to a kind of method for correcting phase, device, computer equipment
And computer readable storage medium.
Background technique
Optical triangle method technology based on Structured Illumination industrial detection, control of product quality, machine vision, immediately
Positioning is widely used with fields such as map structuring (SLAM), ideo display stunt and biomedicines.Phase shift fringe projection three-dimensional is surveyed
The packing density that amount technology obtains is high, measurement accuracy is high, is a kind of important optical triangle method technology.Phase measurement error is
One of key index of measuring system is directly related to the precision of three-dimensional measurement.Project displacement (being equivalent to phase shift) sieve of defocus
Outstanding grating is one of realization high speed measurement method, but Luo Qi grating harmonic wave rich in, influences phase measurement accuracy.
Traditionally, low-pass filtering is carried out by the measurement phase to deforming stripe figure to correct measurement phase, still, the party
Method has obscured the details of object appearance while filtering out phase error.
Summary of the invention
The application provides a kind of method for correcting phase, device, computer equipment and computer readable storage medium, Ke Yishi
After now carrying out phasing to the measurement phase of deforming stripe figure, object appearance details can also be retained.
A kind of method for correcting phase, which comprises
The deforming stripe figure of video camera shooting is obtained, and extracts the measurement phase of deforming stripe figure；
High-pass filtering processing is carried out to the measurement phase of the deforming stripe figure, obtains error phase and approximate phase；
The characterisitic parameter of the error phase is obtained, and the corresponding mistake of the error phase is obtained according to the characterisitic parameter
Spread degree；
Phasing is carried out to the deforming stripe figure according to the error span and the approximate phase.
In one embodiment, the measurement phase to the deforming stripe figure carries out high-pass filtering processing, obtains error
Phase and approximate phase, comprising:
Multiple stripeds of the deforming stripe figure are obtained, and obtain the corresponding measurement phase of each striped；
High-pass filtering processing is carried out to the measurement phase of each striped, to obtain the corresponding mistake of measurement phase of each striped
Poor phase and approximate phase.
In one embodiment, the phase progress high-pass filtering to each striped, which is handled, includes:
Vertical direction along each striped carries out high-pass filtering processing to the phase of each striped.
In one embodiment, the characterisitic parameter for obtaining the error phase, and institute is obtained according to the characterisitic parameter
Stating the corresponding error span of error phase includes:
Obtain the envelope of the error phase；
The corresponding error span of the error phase is obtained according to the envelope.
In one embodiment, the characterisitic parameter for obtaining the error phase, and institute is obtained according to the characterisitic parameter
Stating the corresponding error span of error phase includes:
Obtain the frequency spectrum of the error phase；
The corresponding error span of the error phase is obtained according to the frequency spectrum.
In one embodiment, described according to the error span and the approximate phase carries out the deforming stripe figure
Phasing, comprising:
According to projection grating feature, the phase error expression formula of deforming stripe figure is established；
The error span and the approximate phase are substituted into the phase error and express formula, the deformation is calculated
The phase error of striped；
Phasing is carried out to the deforming stripe figure according to the phase error.
In one embodiment, described by the error span and the approximate phase substitutes into the phase error expression
Formula, the phase error that the deforming stripe is calculated include:
According to the error span, the first error amplitude of each pixel on each striped is obtained；
According to the approximate phase, the corresponding first approximate phase of first error amplitude of each pixel is obtained；
According to the first error amplitude and the first approximate phase, the phase of each pixel on each striped is obtained
Error.
A kind of phase correction unit, described device include:
First obtains module, for obtaining the deforming stripe figure of video camera shooting, and extracts the measurement phase of deforming stripe figure
Position；
High-pass filtering module carries out high-pass filtering processing for the measurement phase to the deforming stripe figure, to be missed
Poor phase and approximate phase；
Second obtains module, obtains institute for obtaining the characterisitic parameter of the error phase, and according to the characterisitic parameter
State the corresponding error span of error phase；
Phase correction module, for being carried out according to the error span and the approximate phase to the deforming stripe figure
Phasing.
The application also provides a kind of computer equipment, including memory and processor, and the memory is stored with computer
The step of program, the processor realizes the above method when executing the computer program.
The application also provides a kind of computer readable storage medium, is stored thereon with computer program, the computer journey
The step of above method is realized when sequence is executed by processor.
Method for correcting phase provided by the embodiments of the present application by obtaining the deforming stripe figure of video camera shooting, and extracts
The measurement phase of deforming stripe figure；High-pass filtering processing is carried out to the measurement phase of the deforming stripe figure, obtains error phase
With approximate phase；The characterisitic parameter of the error phase is obtained, and the error phase is obtained according to the characterisitic parameter and is corresponded to
Error span；Phasing is carried out to the deforming stripe figure according to the error span and the approximate phase, it can be with
It realizes after carrying out phasing to the measurement phase of deforming stripe figure, object appearance details can also be retained.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of application for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is a kind of flow chart of the method for correcting phase provided in one embodiment；
Fig. 2 is the deforming stripe figure of the simple surface provided in one embodiment；
Fig. 3 is the 300th line frequency spectrogram of the error phase of deforming stripe figure in Fig. 2；
Fig. 4 is the error phase of the 300th row striped of deforming stripe figure in Fig. 2；
Fig. 5 is the envelope of the error phase of the 300th row striped of deforming stripe figure in Fig. 4；
Fig. 6 is the phase in Fig. 2 before the correction of deforming stripe figure；
Fig. 7 is the phase in Fig. 2 after the correction of deforming stripe figure；
Fig. 8 is the deforming stripe figure of flowerpot；
Fig. 9 is the phase in Fig. 8 before the correction of deforming stripe figure；
Figure 10 is the phase in Fig. 8 after the correction of deforming stripe figure；
Figure 11 is the structural schematic diagram of the phase correction unit provided in one embodiment；
Figure 12 is the schematic diagram of internal structure of electronic equipment in one embodiment.
Specific embodiment
The application in order to facilitate understanding, in order to make the above objects, features, and advantages of the present application more apparent, under
Face is described in detail in conjunction with specific embodiment of the attached drawing to the application.It is explained in the following description many details
In order to fully understand the application, the better embodiment of the application is given in attached drawing.But the application can be with many not
With form realize, however it is not limited to embodiments described herein.On the contrary, the purpose of providing these embodiments is that making
Disclosure of this application is understood more thorough and comprehensive.The application can be to be much different from other way described herein
Implement, those skilled in the art can do similar improvement without prejudice to the application intension, therefore the application not by
The limitation of following public specific embodiment.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include at least one this feature.In the description of the present application, the meaning of " plurality " is at least two, such as two, three
It is a etc., unless otherwise specifically defined.In the description of the present application, " several " are meant that at least one, such as one,
Two etc., unless otherwise specifically defined.
Unless otherwise defined, all technical and scientific terms used herein and the technical field for belonging to the application
The normally understood meaning of technical staff is identical.Term used herein is intended merely to the mesh of description specific embodiment
, it is not intended that in limitation the application.Term " and or " used herein includes one or more relevant listed items
Any and all combinations.
Fig. 1 is a kind of flow chart of the method for correcting phase provided in one embodiment, as shown in Figure 1, phasing side
Method includes step 110 to step 140, wherein
Step 110, the deforming stripe figure of video camera shooting is obtained, and extracts the measurement phase of deforming stripe figure.
To there is projector the striped template of setting rule to project to testee surface, since each point is deep in testee
The difference of degree is deformed bar graph, video camera is for absorbing by testee surface shape so that striped template deforms
The deforming stripe figure modulated.
In the full period, N is walked in phase shift method at equal intervals, and the deforming stripe figure comprising higher hamonic wave of video camera shooting can be with table
Show as follows:
Wherein, R (x, y) is the surface reflectivity for measuring object, and M is the highest number of harmonic wave, and a (x, y) is to include environment
The background illumination of light, bj(x, y) is the harmonic amplitude of projected fringe,For the phase of deforming stripe, δi=2 π i/N, i=
1,2 ..., N, is phase-shift phase, and N is total phase shift step number.
The measurement phase of deforming stripe figure can be extracted from deforming stripe figure by following formula:
Since each pixel of the measurement phase in deforming stripe figure of deforming stripe figure is all identical extracting mode, because
This, the described below coordinate of ignoring pixel easy for narration.In deforming stripe figure, phase error caused by higher hamonic wave can
To indicate are as follows:
Wherein, m belongs to arbitrary integer.From the above equation, we can see that the measurement phase of deforming stripe figure only with (m*N) ± 1 subharmonic
It is related.
Step 120, high-pass filtering processing is carried out to the measurement phase of deforming stripe figure, obtains error phase and approximate phase
Position.
In one embodiment, multiple stripeds of deforming stripe figure are obtained, and obtain the corresponding measurement phase of each striped；It is right
The measurement phase of each striped carries out high-pass filtering processing, to obtain the corresponding error phase of measurement phase of each striped and close
Patibhaga-nimitta position.
Each amplitude variation shape bar graph includes multirow or multiple row striped, first acquisition multirow or multiple row striped, and for every
One striped, the vertical direction along each striped carry out high-pass filtering processing to its phase.As shown in Fig. 2, the item of deforming stripe figure
Line be it is approximately perpendicular, then high-pass filtering be measurement phase diagram in a line a line do, what is obtained is each in every a line
The error phase of pixel and approximate phase.High pass is carried out to the measurement phase of deforming stripe figure in the vertical direction of projected fringe
Filtering processing, filters out the error phase of deforming stripe figure.Measurement phase is subtracted into error phase simultaneously, is obtained close to desired phase
Approximate phase (details that the phase has obscured object appearance while filtering out error).It is understood that if deformation
Bar graph is vertical stripes, then carries out high-pass filtering processing to the phase of every a line striped；If deforming stripe figure is horizontal bar
Line then carries out high-pass filtering processing to the phase of each column striped.If measuring phase to useIt indicates, error phase is usedIt indicates,
Approximate phase is usedIt indicates, high-pass filter impulse response function indicates that this process can be indicated with following formula with h are as follows:
Step 130, the characterisitic parameter of error phase is obtained, and the corresponding error width of error phase is obtained according to characterisitic parameter
Degree.
The characterisitic parameter of error phase can be the envelope of error phase；It is corresponding that error phase is obtained according to envelope
Error span.
The characterisitic parameter of error phase is also possible to the frequency spectrum of error phase；The corresponding mistake of error phase is obtained according to frequency spectrum
Spread degree.
The present embodiment is illustrated so that the characterisitic parameter of error phase is the envelope of error phase as an example.It acquiresIn it is every
The envelope of one row/column error phase, obtains the error span of each pixel on envelope, so as to calculate error width
Degree.
Step 140, phasing is carried out to deforming stripe figure according to error span and approximate phase.
In one embodiment, according to projection grating feature, the phase error expression formula of deforming stripe figure is established；By error width
Degree and approximate phase substitute into phase error and express formula, and the phase error of deforming stripe is calculated；According to phase error to change
Shape bar graph carries out phasing.
According to (3) formula, phase error caused by higher hamonic wave can be with approximate representation are as follows:
It follows that the phase error of the measurement phase of deforming stripe figure is the letter in the m*N frequency multiplication period of deforming stripe figure
Number combination.
Further, with approximate phaseInstead of in (5) formulaThen there is phase error caused by higher hamonic wave can be with table
It is shown as:
By finding out approximate phaseWith error span Cm, the phase error of deforming stripe figure can be found out
In one embodiment, according to error span, the first error amplitude of each pixel on each striped is obtained；It is each
Amplitude variation shape bar graph includes multirow or multiple row striped, and every a line or each column striped include multiple pixels, can be first
The first error amplitude for first obtaining multiple pixels in every a line or each column striped, can similarly obtain each in deforming stripe figure
The first error amplitude of pixel.According to approximate phase, corresponding first approximation of first error amplitude of each pixel is obtained
Phase；According to first error amplitude and the first approximate phase, the phase error of each pixel on each striped is obtained.
To measurement phaseIt is handled using following formula:
Phase will be measured and the phase error that finds out carries out making poor processing, so as to the phase after being corrected
It should be understood that although each step in the flow chart of Fig. 1 is successively shown according to the instruction of arrow, this
A little steps are not that the inevitable sequence according to arrow instruction successively executes.Unless expressly state otherwise herein, these steps
It executes there is no the limitation of stringent sequence, these steps can execute in other order.Moreover, at least part in Fig. 1
Step may include that perhaps these sub-steps of multiple stages or stage are executed in synchronization to multiple sub-steps
It completes, but can execute at different times, the execution sequence in these sub-steps or stage, which is also not necessarily, successively to be carried out,
But it can be executed in turn or alternately at least part of the sub-step or stage of other steps or other steps.
In the embodiment of the present application, tested using Luo Qi optical grating projection and 3 step phase shift methods.First to the phase of measurement
High-pass filtering is done, while obtaining the data and the low-frequency information close with desired phase comprising error；Again to the margin of error of acquisition
According to being analyzed, error span is obtained according to its frequency spectrum or envelope；Then according to Luo Qi grating harmonic wave feature and corresponding mistake
Poor feature is corrected using phase of the low-frequency information to measurement.This method is weakening periodic error, while remaining object
Bodily form looks details.
Luo Qi grating is the identical two-value grating of black, white ratio, and doing Fourier expansion to its projected image can obtain:
Wherein, f0For the fundamental frequency of Luo Qi grating, it is seen that it is containing only odd harmonic.Overtone order is higher, and amplitude is lower.It is practical
The deforming stripe figure of shooting contains only odd harmonic, i.e., j only takes odd number in (1) formula.Using full period 3 step phase shift at equal intervals
When, only 5,7,9,11,13 ... subharmonic have an impact to the measurement phase of deforming stripe figure.By (5) formula it is found that measurement phase
Error in contain only the integer frequency of striped 6, i.e., the periodic error of 6,12,18 ... frequencys multiplication, error magnitude increases with frequency
Add reduction.
The projection of Luo Qi grating defocus, which is equivalent to, carries out low-pass filtering to the bar graph of projection, and defocusing amount is bigger, higher hamonic wave
Filter out more, at the same fringe contrast also decline it is more.The error span of deforming stripe figure and the amplitude of higher hamonic wave are related.
In practice, the striped after defocus 11 times or more higher hamonic waves are filtered out, and only 7 times higher hamonic wave below generates phase measurement
Error (6 frequencys multiplication that corresponding phase measurement error frequency is striped).The present embodiment only considers that the phase measurement of 6 frequency multiplication of striped misses
Difference.One timing of defocusing amount, it is also different to the higher hamonic wave amount of filtering out of the Luo Qi grating of different frequency.
1 simple surface (curved A4 paper) is measured first carries out experimental verification.Fig. 2 is the deforming stripe of simple surface
Figure.Fig. 3 is the 300th line frequency spectrogram of the error phase of deforming stripe figure in Fig. 2, it can be seen that mainly 3,5,7 subharmonic.Its
In 3 subharmonic on phase measurement without influence, 5,7 subharmonic generate 6 multiple frequency phase errors.Fig. 4 is deforming stripe figure the in Fig. 2
The error phase of 300 row stripeds, Fig. 5 are the envelope of the error phase of the 300th row striped of deforming stripe figure in Fig. 4.It can see
Out, for different location due to defocus degree difference, error magnitude is also difference, can not be corrected with unified correction parameter.Fig. 6
For the phase (phase shown here is all the phase after subtracting reference planes) before deforming stripe figure correction in Fig. 2, Fig. 7 is figure
Phase in 2 after the correction of deforming stripe figure.As can be seen from Figures 6 and 7, periodic error is weakened severely.Phase after correction
Standard deviation is reduced to 0.0328 radian from 0.102 radian, is original 1/3 or so.
In one embodiment, phase school provided in this embodiment is verified by measuring the deforming stripe figure of 1 flowerpot
The validity of correction method.Fig. 8 is the deforming stripe figure of flowerpot, and Fig. 9 is the phase in Fig. 8 before the correction of deforming stripe figure, Tu10Wei
Phase in Fig. 8 after the correction of deforming stripe figure.The periodic error of the deforming stripe figure of flowerpot it can be seen from Fig. 9 and Figure 10
It is weakened severely.It is therefore seen that method for correcting phase provided by the present application is effective.
Method for correcting phase provided by the embodiments of the present application by obtaining the deforming stripe figure of video camera shooting, and extracts
The measurement phase of deforming stripe figure；High-pass filtering processing is carried out to the measurement phase of deforming stripe figure, obtains error phase and close
Patibhaga-nimitta position；The characterisitic parameter of error phase is obtained, and the corresponding error span of error phase is obtained according to characterisitic parameter；According to accidentally
Spread degree and approximate phase carry out phasing to deforming stripe figure, may be implemented to carry out the measurement phase of deforming stripe figure
After phasing, object appearance details can also be retained.In addition, width of fringe difference, defocus journey in Luo Qi fringe projection system
Degree is different, and the ratio of harmonic wave is also different.Traditionally, in fringe period difference, but under the premise of harmonic wave constant rate, by building in advance
Vertical error correction table, carries out phasing by tabling look-up.But used when establishing the fringe period of table use than measuring
Fringe period is much bigger, therefore this method is not applicable to the phasing in Luo Qi fringe projection system.The embodiment of the present application
The method of offer can carry out phasing to the deforming stripe figure in Luo Qi fringe projection system, and this method does not need to increase
The speed of correction can be improved in shift number.
Figure 11 is a kind of structural schematic diagram of the phase correction unit provided in one embodiment, as shown in figure 11, phase
Means for correcting includes: the first acquisition module 1110, the acquisition module 1130 of high-pass filtering module 1120, second and phase correction module
1140, wherein
First obtains module 1110, for obtaining the deforming stripe figure of video camera shooting, and extracts the survey of deforming stripe figure
Measure phase；
High-pass filtering module 1120, high-pass filtering module 1120 are used to carry out high pass filter to the measurement phase of deforming stripe figure
Wave processing, to obtain error phase and approximate phase；
In one embodiment, multiple stripeds of deforming stripe figure are obtained, and obtain the corresponding phase of each striped；
High-pass filtering processing is carried out to the phase of each striped, the corresponding error phase of phase to obtain each striped and
Approximate phase.
In one embodiment, high-pass filtering processing is carried out along phase of the vertical direction of each striped to each striped.
Second obtains module 1130, obtains error phase for obtaining the characterisitic parameter of error phase, and according to characterisitic parameter
The corresponding error span in position；
In one embodiment, second the envelope that module 1130 obtains error phase is obtained；Error is obtained according to envelope
The corresponding error span of phase.
In one embodiment, second the frequency spectrum that module 1130 obtains error phase is obtained；
The corresponding error span of error phase is obtained according to frequency spectrum.
Phase correction module 1140, for carrying out phase school to deforming stripe figure according to error span and approximate phase
Just.
In one embodiment, phase correction module 1140 according to projection grating feature, miss by the phase for establishing deforming stripe figure
Poor expression formula；
Error span and approximate phase are substituted into phase error and express formula, the phase error of deforming stripe is calculated；
Phasing is carried out to deforming stripe figure according to phase error.
In one embodiment, phase correction module 1140 obtains each pixel on each striped according to error span
First error amplitude；
According to approximate phase, the corresponding first approximate phase of first error amplitude of each pixel is obtained；
According to first error amplitude and the first approximate phase, the phase error of each pixel on each striped is obtained.
The division of modules is only used for for example, in other embodiments in above-mentioned phase correction unit, can be by phase
Bit correction device is divided into different modules as required, to complete all or part of function of above-mentioned phase correction unit.
Specific about phase correction unit limits the restriction that may refer to above for method for correcting phase, herein not
It repeats again.Modules in above-mentioned phase correction unit can be realized fully or partially through software, hardware and combinations thereof.On
Stating each module can be embedded in the form of hardware or independently of in the processor in computer equipment, can also store in a software form
In memory in computer equipment, the corresponding operation of the above modules is executed in order to which processor calls.
Realizing for the modules in phase correction unit provided in the embodiment of the present application can be the shape of computer program
Formula.The computer program can be run in terminal or server.The program module that the computer program is constituted is storable in terminal
Or on the memory of server.When the computer program is executed by processor, method described in the embodiment of the present application is realized
Step.
Figure 12 is the schematic diagram of internal structure of computer equipment in one embodiment.As shown in figure 12, the computer equipment
Including the processor, memory and network interface connected by system bus.Wherein, which calculates and controls for providing
Ability supports the operation of entire computer equipment.Memory for storing data, program etc., store at least one on memory
Computer program, the computer program can be executed by processor, to realize that is provided in the embodiment of the present application is suitable for computer
The wireless network communication method of equipment.Memory may include non-volatile memory medium and built-in storage.Non-volatile memories are situated between
Matter is stored with operating system and computer program.The computer program can be performed by processor, for realizing following each
A kind of method of phasing provided by embodiment.Built-in storage is the operating system computer in non-volatile memory medium
The running environment of program offer cache.Network interface can be Ethernet card or wireless network card etc., based on outside
Machine equipment is calculated to be communicated.The computer equipment can be mobile terminal, tablet computer or personal digital assistant or wearable
Equipment etc..
Wherein, the above-mentioned method for correcting phase referred to is specifically as follows:
The deforming stripe figure of video camera shooting is obtained, and extracts the measurement phase of deforming stripe figure；
High-pass filtering processing is carried out to the measurement phase of deforming stripe figure, obtains error phase and approximate phase；
The characterisitic parameter of error phase is obtained, and the corresponding error span of error phase is obtained according to characterisitic parameter；
Phasing is carried out to deforming stripe figure according to error span and approximate phase.
The embodiment of the present application also provides a kind of computer readable storage mediums.One or more is executable comprising computer
The non-volatile computer readable storage medium storing program for executing of instruction, when computer executable instructions are executed by one or more processors,
So that the step of processor execution of phase correction method.
A kind of computer program product comprising instruction, when run on a computer, so that computer executes phase
The step of bearing calibration.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (10)
1. a kind of method for correcting phase, which is characterized in that the described method includes:
The deforming stripe figure of video camera shooting is obtained, and extracts the measurement phase of deforming stripe figure；
High-pass filtering processing is carried out to the measurement phase of the deforming stripe figure, obtains error phase and approximate phase；
The characterisitic parameter of the error phase is obtained, and the corresponding error width of the error phase is obtained according to the characterisitic parameter
Degree；
Phasing is carried out to the deforming stripe figure according to the error span and the approximate phase.
2. the method according to claim 1, wherein the measurement phase to the deforming stripe figure carries out height
Pass filter processing obtains error phase and approximate phase, comprising:
Multiple stripeds of the deforming stripe figure are obtained, and obtain the corresponding measurement phase of each striped；
High-pass filtering processing is carried out to the measurement phase of each striped, the corresponding error phase of measurement phase to obtain each striped
Position and approximate phase.
3. according to the method described in claim 2, it is characterized in that, the phase to each striped carries out high-pass filtering processing
Include:
Vertical direction along each striped carries out high-pass filtering processing to the phase of each striped.
4. the method according to claim 1, wherein the characterisitic parameter for obtaining the error phase, and root
Obtaining the corresponding error span of the error phase according to the characterisitic parameter includes:
Obtain the envelope of the error phase；
The corresponding error span of the error phase is obtained according to the envelope.
5. the method according to claim 1, wherein the characterisitic parameter for obtaining the error phase, and root
Obtaining the corresponding error span of the error phase according to the characterisitic parameter includes:
Obtain the frequency spectrum of the error phase；
The corresponding error span of the error phase is obtained according to the frequency spectrum.
6. the method according to claim 1, wherein described according to the error span and the approximate phase
Phasing is carried out to the deforming stripe figure, comprising:
According to projection grating feature, the phase error expression formula of deforming stripe figure is established；
The error span and the approximate phase are substituted into the phase error and express formula, the deforming stripe is calculated
Phase error；
Phasing is carried out to the deforming stripe figure according to the phase error.
7. according to the method described in claim 6, it is characterized in that, described by the error span and the approximate phase generation
Enter the phase error expression formula, the phase error that the deforming stripe is calculated includes:
According to the error span, the first error amplitude of each pixel on each striped is obtained；
According to the approximate phase, the corresponding first approximate phase of first error amplitude of each pixel is obtained；
According to the first error amplitude and the first approximate phase, the phase for obtaining each pixel on each striped is missed
Difference.
8. a kind of phase correction unit, which is characterized in that described device includes:
First obtains module, for obtaining the deforming stripe figure of video camera shooting, and extracts the measurement phase of deforming stripe figure；
High-pass filtering module carries out high-pass filtering processing for the measurement phase to the deforming stripe figure, to obtain error phase
Position and approximate phase；
Second obtains module, obtains the mistake for obtaining the characterisitic parameter of the error phase, and according to the characterisitic parameter
The corresponding error span of poor phase；
Phase correction module, for carrying out phase to the deforming stripe figure according to the error span and the approximate phase
Correction.
9. a kind of computer equipment, including memory and processor, the memory are stored with computer program, feature exists
In the step of processor realizes any one of claims 1 to 7 the method when executing the computer program.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of claims 1 to 7 is realized when being executed by processor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910336936.4A CN110068287B (en) | 2019-04-24 | 2019-04-24 | Phase correction method, phase correction device, computer device and computer-readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910336936.4A CN110068287B (en) | 2019-04-24 | 2019-04-24 | Phase correction method, phase correction device, computer device and computer-readable storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110068287A true CN110068287A (en) | 2019-07-30 |
| CN110068287B CN110068287B (en) | 2020-12-29 |
Family
ID=67368763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910336936.4A Active CN110068287B (en) | 2019-04-24 | 2019-04-24 | Phase correction method, phase correction device, computer device and computer-readable storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110068287B (en) |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2011998C1 (en) * | 1991-04-01 | 1994-04-30 | Данелян Аркадий Гайкович | Calibrator of phase shifts |
| US20010024311A1 (en) * | 2000-01-06 | 2001-09-27 | Larkin Kieran Gerard | Demodulation and phase estimation of two-dimensional patterns |
| US20070115484A1 (en) * | 2005-10-24 | 2007-05-24 | Peisen Huang | 3d shape measurement system and method including fast three-step phase shifting, error compensation and calibration |
| CN101187585A (en) * | 2007-11-05 | 2008-05-28 | 北京航空航天大学 | Integral aperture phase measurement and compensation method and system |
| CN102589479A (en) * | 2012-03-06 | 2012-07-18 | 天津大学 | Three-dimensional topography central perturbation composite grating projection measuring method and device |
| WO2016025505A1 (en) * | 2014-08-12 | 2016-02-18 | Zygo Corporation | Calibration of scanning interferometers |
| CN106197321A (en) * | 2016-07-06 | 2016-12-07 | 太原科技大学 | Projector calibrating method based on red blue gridiron pattern scaling board |
| CN106197320A (en) * | 2015-05-29 | 2016-12-07 | 苏州笛卡测试技术有限公司 | A kind of time-sharing multiplex quick three-dimensional scanning and data processing method thereof |
| CN107589618A (en) * | 2017-10-23 | 2018-01-16 | 杭州光粒科技有限公司 | The micro projection system of high refresh rate and the method for improving micro-display refresh rate |
| CN108168464A (en) * | 2018-02-09 | 2018-06-15 | 东南大学 | For the phase error correction approach of fringe projection three-dimension measuring system defocus phenomenon |
| CN108981611A (en) * | 2018-07-25 | 2018-12-11 | 浙江大学 | A kind of digital projection raster image fitting correction method based on distortion complete modification |
-
2019
- 2019-04-24 CN CN201910336936.4A patent/CN110068287B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2011998C1 (en) * | 1991-04-01 | 1994-04-30 | Данелян Аркадий Гайкович | Calibrator of phase shifts |
| US20010024311A1 (en) * | 2000-01-06 | 2001-09-27 | Larkin Kieran Gerard | Demodulation and phase estimation of two-dimensional patterns |
| US20070115484A1 (en) * | 2005-10-24 | 2007-05-24 | Peisen Huang | 3d shape measurement system and method including fast three-step phase shifting, error compensation and calibration |
| CN101187585A (en) * | 2007-11-05 | 2008-05-28 | 北京航空航天大学 | Integral aperture phase measurement and compensation method and system |
| CN102589479A (en) * | 2012-03-06 | 2012-07-18 | 天津大学 | Three-dimensional topography central perturbation composite grating projection measuring method and device |
| WO2016025505A1 (en) * | 2014-08-12 | 2016-02-18 | Zygo Corporation | Calibration of scanning interferometers |
| CN106197320A (en) * | 2015-05-29 | 2016-12-07 | 苏州笛卡测试技术有限公司 | A kind of time-sharing multiplex quick three-dimensional scanning and data processing method thereof |
| CN106197321A (en) * | 2016-07-06 | 2016-12-07 | 太原科技大学 | Projector calibrating method based on red blue gridiron pattern scaling board |
| CN107589618A (en) * | 2017-10-23 | 2018-01-16 | 杭州光粒科技有限公司 | The micro projection system of high refresh rate and the method for improving micro-display refresh rate |
| CN108168464A (en) * | 2018-02-09 | 2018-06-15 | 东南大学 | For the phase error correction approach of fringe projection three-dimension measuring system defocus phenomenon |
| CN108981611A (en) * | 2018-07-25 | 2018-12-11 | 浙江大学 | A kind of digital projection raster image fitting correction method based on distortion complete modification |
Non-Patent Citations (1)
| Title |
|---|
| 付福兴 等: "《畸变波前相位校正效果分析》", 《强激光与粒子束》 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110068287B (en) | 2020-12-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20200334840A1 (en) | Three-Dimensional Scanning System and Scanning Method Thereof | |
| CN101881605B (en) | Optical three-dimensional measuring method based on phase coding technology | |
| Wieneke | Improvements for volume self-calibration | |
| CN106949968B (en) | A kind of digital hologram Harmonic Detection and removing method based on spectrum energy | |
| CN110310237A (en) | Remove the method and system of image moire fringes, the brightness measurement of display panel sub-pixel point, Mura defects reparation | |
| CN107220997A (en) | A kind of solid matching method and system | |
| CN106896403B (en) | Elastic Gaussian beam offset imaging method and system | |
| CN110567398A (en) | Binocular stereo vision three-dimensional measurement method and system, server and storage medium | |
| CN103414844A (en) | Video dithering correction method and device | |
| CN101236066B (en) | Projection grating self-correction method | |
| CN108364319A (en) | Scale determines method, apparatus, storage medium and equipment | |
| CN102129680A (en) | Real-time geometry aware projection and fast re-calibration | |
| JP6598673B2 (en) | Data processing apparatus and method | |
| CN109186492B (en) | Three-dimensional reconstruction method, device and system based on single camera | |
| CN110268223A (en) | Three-dimensional shape measuring device, three-dimensional shape measuring method and program | |
| CN106197321A (en) | Projector calibrating method based on red blue gridiron pattern scaling board | |
| CN103679693A (en) | Multi-camera single-view calibration device and calibration method thereof | |
| CN102538709A (en) | Method for utilizing GPU (Graphics Processing Unit) concurrent computation in three-dimensional measurement system based on structured light | |
| CN114111633A (en) | Projector lens distortion error correction method for structured light three-dimensional measurement | |
| CN109324796A (en) | Quick interface arrangement method and device | |
| Zhang et al. | Depth recovering method immune to projector errors in fringe projection profilometry by use of cross-ratio invariance | |
| CN110081817A (en) | Eliminate method, apparatus, computer equipment and the storage medium of bias light | |
| CN110068287A (en) | Method for correcting phase, device, computer equipment and computer readable storage medium | |
| CN110132173A (en) | High-precision three-dimensional structured light reconstruction method based on area modulation phase shift template | |
| CN109470269A (en) | Scaling method, calibration facility and the calibration system of extraterrestrial target measuring mechanism |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |