CN110058099A - A kind of automatic rapid measurement device of electrooptic modulator frequency response and method - Google Patents
A kind of automatic rapid measurement device of electrooptic modulator frequency response and method Download PDFInfo
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- CN110058099A CN110058099A CN201910371997.4A CN201910371997A CN110058099A CN 110058099 A CN110058099 A CN 110058099A CN 201910371997 A CN201910371997 A CN 201910371997A CN 110058099 A CN110058099 A CN 110058099A
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- frequency response
- electrooptic modulator
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- component analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Abstract
Present disclose provides a kind of automatic rapid measurement device of electrooptic modulator frequency response and methods.Wherein, a kind of automatic rapid measurement device of electrooptic modulator frequency response, including light wave component analysis instrument are used to export rf modulated signal from radio frequency mouth and gradually be sent in each electrooptic modulator to be measured through 1*n RF switch;Polarization-maintaining direct current optical signal source, it is used to export polarization-maintaining direct current optical signal and is modulated into corresponding modulated optical signal through the rf modulated signal in each electrooptic modulator to be measured, and respective channel of each modulated optical signal respectively through n*1 coupler is exported to the optical port of light wave component analysis instrument;The light wave component analysis instrument, it is also used to: measuring the frequency response parameter of tested link, it recycles and measures the frequency response parameter for being tested link divided by the product of the given frequency response parameter of 1*n RF switch and n*1 coupler, the frequency response of electrooptic modulator can be obtained;Wherein, n is the positive integer more than or equal to 2.
Description
Technical field
The disclosure belongs to electro-optical investigation field more particularly to a kind of automatic rapid measurement device of electrooptic modulator frequency response
And method.
Background technique
Only there is provided background technical informations relevant to the disclosure for the statement of this part, it is not necessary to so constitute first skill
Art.
Electrooptic modulator on rf-signal modulation to direct current light, can will realize that signal is high-speed light by the conversion of electricity to light
Core devices in Transmission system.Core technology index of the frequency response as electrooptic modulator, needs in product development, production
Carry out stringent test.
Inventors have found that frequently with separate apparatus test system building or using integrated light wave component analysis instrument in engineering
Electrooptic modulator is tested, the shortcomings that there are methods is complicated, calibration difficulties using separate apparatus test system building, and two
The shortcomings that kind of method measures every time is only capable of one electrooptic modulator of test, and that there are testing efficiencies is low, bad measurement repeatability, can not
Meet the quick testing requirement of high-precision of producing line batch electrooptic modulator frequency response.
Summary of the invention
To solve the above-mentioned problems, it is automatically quick to provide a kind of electrooptic modulator frequency response for the first aspect of the disclosure
Measuring device, can the frequency response disposably to multichannel electrooptic modulator test, substantially increase measurement efficiency;Simultaneously
It is calibrated for error for the device introduced in test link using two-port network, improves measurement accuracy.
To achieve the goals above, the disclosure adopts the following technical scheme that
A kind of automatic rapid measurement device of electrooptic modulator frequency response, comprising:
Light wave component analysis instrument is used to export rf modulated signal from radio frequency mouth and gradually transmit through 1*n RF switch
To in each electrooptic modulator to be measured;
Polarization-maintaining direct current optical signal source is used to export polarization-maintaining direct current optical signal and through penetrating in each electrooptic modulator to be measured
Frequency modulation is modulated into corresponding modulated optical signal, respective channel of each modulated optical signal respectively through n*1 coupler export to
The optical port of light wave component analysis instrument;
The light wave component analysis instrument, is also used to: measuring the frequency response parameter of tested link, recycles measurement by surveyor's chain
Electricity can be obtained divided by the product of the given frequency response parameter of 1*n RF switch and n*1 coupler in the frequency response parameter on road
The frequency response of optical modulator;Wherein, n is the positive integer more than or equal to 2.
To solve the above-mentioned problems, it is automatically quick to provide a kind of electrooptic modulator frequency response for the second aspect of the disclosure
The measurement method of measuring device, can the frequency response disposably to multichannel electrooptic modulator test, substantially increase survey
Amount efficiency;It is calibrated for error simultaneously for the device introduced in test link using two-port network, improves measurement accuracy.
To achieve the goals above, the disclosure adopts the following technical scheme that
A kind of measurement method of the automatic rapid measurement device of electrooptic modulator frequency response, comprising:
Rf modulated signal is simultaneously gradually sent in each electrooptic modulator to be measured through 1*n RF switch;
Polarization-maintaining direct current optical signal, which is modulated into corresponding modulation light through the rf modulated signal in each electrooptic modulator to be measured, to be believed
Number, respective channel of each modulated optical signal respectively through n*1 coupler is exported to the optical port of light wave component analysis instrument;
The frequency response parameter for measuring tested link recycles the frequency response parameter for measuring tested link to penetrate divided by 1*n
The product of the given frequency response parameter of frequency switch and n*1 coupler, can be obtained the frequency response of electrooptic modulator;Wherein, n
For the positive integer more than or equal to 1.
The beneficial effect of the disclosure is:
The automatic rapid measurement device of electrooptic modulator frequency response of the disclosure increases on the basis of light wave component analysis instrument
Added control terminal, 1*n RF switch, n*1 coupler, can the frequency response disposably to multichannel electrooptic modulator test,
Substantially increase measurement efficiency;
It is calibrated for error simultaneously for the device introduced in test link using two-port network, improves measurement accuracy, with
The prior art is compared, and is improved electrooptic modulator testing efficiency, is improved measurement accuracy.
Detailed description of the invention
The Figure of description for constituting a part of this disclosure is used to provide further understanding of the disclosure, and the disclosure is shown
Meaning property embodiment and its explanation do not constitute the improper restriction to the disclosure for explaining the disclosure.
Fig. 1 is the separate apparatus test system building method schematic that the embodiment of the present disclosure provides.
Fig. 2 is the automatic rapid measurement device structural schematic diagram of electrooptic modulator frequency response that the embodiment of the present disclosure provides.
Specific embodiment
The disclosure is described further with embodiment with reference to the accompanying drawing.
It is noted that following detailed description is all illustrative, it is intended to provide further instruction to the disclosure.Unless another
It indicates, all technical and scientific terms used herein has usual with disclosure person of an ordinary skill in the technical field
The identical meanings of understanding.
It should be noted that term used herein above is merely to describe specific embodiment, and be not intended to restricted root
According to the illustrative embodiments of the disclosure.As used herein, unless the context clearly indicates otherwise, otherwise singular
Also it is intended to include plural form, additionally, it should be understood that, when in the present specification using term "comprising" and/or " packet
Include " when, indicate existing characteristics, step, operation, device, component and/or their combination.
In electrooptic modulator frequency response test, existing method is frequently with separate apparatus test system building or use
The method of integrated light wave component analysis instrument carries out the test of single electrooptic modulator.
Separate apparatus test system building method, system using Microwave Scanning signal generator, polarization-maintaining as shown in Figure 1, swashed
The discrete instruments such as light source, optical attenuator, high-speed photodetector, microwave power meter, spectrum analyzer and integrated computing unit are taken
The electrooptic modulator test macro built, though the system can be realized the test of the frequency response to electrooptic modulator, there are systems
Build complexity, the problem of calibration difficulties, and there are test operation complexity, the deficiencies such as testing efficiency is low.
The method measured using integrated light wave component analysis instrument is only capable of surveying an electrooptic modulator every time
Examination, testing efficiency is low, needs to repeat plug connection, bad measurement repeatability when multiple device detections.There is test side in these methods
Method complexity, the shortcomings that calibration difficulties, measurement accuracy is poor, testing efficiency is low, bad measurement repeatability, are unable to satisfy producing line batch electric light
The high-precision rapid survey demand of modulator frequency response.
Wherein, light wave component analysis instrument is using integrated table model measuring equipment, mainly includes vector network analyzer
With optical tests module, console of the vector network analyzer as measurement is realized the transmitting of microwave modulated signal and is received, and carry out
Final S parameter analysis, optical tests module mainly include optical sender and photoreceiver, it is different for test object, it can be achieved that
A plurality of types of high speed optoelectronic device frequency response tests such as photoelectric device, electro-optical device, light optical device.
In order to solve the prior art there are electrooptic modulator measurement method complexity, calibration difficulties, measurement accuracy be poor, test effect
The shortcomings that rate is low, bad measurement repeatability, present disclose provides a kind of automatic rapid survey dresses of broad band electrooptic modulator frequency response
It sets and method, improves electrooptic modulator testing efficiency, realized based on light wave component analysis instrument, improve measurement accuracy.
As shown in Fig. 2, the automatic rapid measurement device of electrooptic modulator frequency response of the present embodiment, including control terminal, light
Wave component analysis instrument, 1*n RF switch, polarization-maintaining laser source, 1*n polarization-maintaining beam splitter, n*1 coupler;Wherein, n is to be greater than or wait
In 2 positive integer.
Control terminal controls light wave component analysis instrument by program-controlled or other communication means and exports radio-frequency modulations from radio frequency mouth R1
Signal, control RF switch carry out control radiofrequency signal and are sequentially output 1~electrooptic modulator of electrooptic modulator n to be tested
On, polarization-maintaining direct current optical signal is output on electrooptic modulator to be measured by polarization-maintaining laser source by 1*n polarization-maintaining beam splitter, polarization-maintaining direct current
Optical signal is modulated into modulated optical signal through electrooptic modulator, and modulated optical signal is exported through n*1 coupler to light wave component analysis instrument
Optical port O2, light wave component analysis instrument is that can measure by the frequency response parameter of sidelinks, and light wave component analysis instrument penetrates 1*n
Frequency switchs, the influence data of n*1 coupler are removed, and the frequency response of electrooptic modulator can be obtained.
In the present embodiment, 1*n RF switch, n*1 coupler influence data refer to 1*n RF switch and n*1 coupling
The frequency response parameter of clutch.
Wherein, the frequency response parameter of 1*n RF switch and n*1 coupler be obtained by metering, such as:
The frequency response parameter of 1*n RF switch is obtained by light wave component analysis instrument measurement.
The frequency response parameter of n*1 coupler is obtained by light wave component analysis instrument measurement.
It should be noted that the frequency response parameter of 1*n RF switch and n*1 coupler can also be measured by other instruments
It obtains, such as vector network analyzer.
In specific implementation, using the frequency response parameter of the tested link of measurement divided by 1*n RF switch and n*1 coupler
Given frequency response parameter product, the frequency response of electrooptic modulator can be obtained.
The automatic rapid measurement device of electrooptic modulator frequency response of the present embodiment, on the basis of light wave component analysis instrument
Increase control terminal, 1*n RF switch, n*1 coupler, can the frequency response disposably to multichannel electrooptic modulator survey
Examination, substantially increases measurement efficiency;
It is calibrated for error simultaneously for the device introduced in test link using two-port network, improves measurement accuracy, with
The prior art is compared, and is improved electrooptic modulator testing efficiency, is improved measurement accuracy.
The measuring process of the automatic rapid measurement device of electrooptic modulator frequency response of the present embodiment is as follows:
Step 1. control terminal controls light wave component analysis instrument and exports rf modulated signal, the control of integrated control end from radio frequency mouth R1
Radiofrequency signal is loaded on electrooptic modulator 1 by 1*n RF switch processed, and polarization-maintaining laser source passes through 1*n polarization-maintaining beam splitter for polarization-maintaining
Direct current light is output on all electrooptic modulators to be measured, most roads n.Wherein, n is the positive integer more than or equal to 2.
Step 2. direct current optical signal is modulated into modulated optical signal by electrooptic modulator, and modulated optical signal is through n*1 coupler
It exports to the optical port O2 of light wave component analysis instrument, light wave component analysis instrument is that can measure by the frequency response parameter of sidelinks.
Influence of the step 3. using twin port calibration method to 1*n RF switch, n*1 coupler is removed.
1*n RF switch, n*1 coupler influence data be respectively SR、SO, light wave component analysis instrument is measured in step 2
Tested link frequency response parameter be SAlways, according to double-port network parameter model, electrooptic modulator frequency response parameter S to be measured
Are as follows:
Wherein, the frequency response parameter of 1*n RF switch and n*1 coupler be obtained by metering, such as:
The frequency response parameter of 1*n RF switch is obtained by light wave component analysis instrument measurement.
The frequency response parameter of n*1 coupler is obtained by light wave component analysis instrument measurement.
It should be noted that the frequency response parameter of 1*n RF switch and n*1 coupler can also be measured by other instruments
It obtains, such as vector network instrument.
In specific implementation, using the frequency response parameter of the tested link of measurement divided by 1*n RF switch and n*1 coupler
Given frequency response parameter product, the frequency response of electrooptic modulator can be obtained.
Step 4. successively controls 1*n RF switch by integrated control end and radiofrequency signal is loaded into 2~n of electrooptic modulator
On, repeat step 2~3, can all electrooptic modulators of automatic measurement frequency response.
The present embodiment can the frequency response disposably to multichannel electrooptic modulator test, substantially increase measurement effect
Rate;It is calibrated for error simultaneously for the device introduced in test link using two-port network, measurement accuracy is improved, with existing skill
Art is compared, and is improved electrooptic modulator testing efficiency, is improved measurement accuracy.
The foregoing is merely preferred embodiment of the present disclosure, are not limited to the disclosure, for the skill of this field
For art personnel, the disclosure can have various modifications and variations.It is all within the spirit and principle of the disclosure, it is made any to repair
Change, equivalent replacement, improvement etc., should be included within the protection scope of the disclosure.
Claims (8)
1. a kind of automatic rapid measurement device of electrooptic modulator frequency response characterized by comprising
Light wave component analysis instrument is used to export rf modulated signal from radio frequency mouth and gradually be sent to respectively through 1*n RF switch
In a electrooptic modulator to be measured;
Polarization-maintaining direct current optical signal source is used to export polarization-maintaining direct current optical signal and through the radio frequency tune in each electrooptic modulator to be measured
At corresponding modulated optical signal, respective channel of each modulated optical signal respectively through n*1 coupler is exported to light wave signal modulation processed
The optical port of component analysis instrument;
The light wave component analysis instrument, is also used to: measuring the frequency response parameter of tested link, recycles and measure tested link
Electric light tune can be obtained divided by the product of the given frequency response parameter of 1*n RF switch and n*1 coupler in frequency response parameter
The frequency response of device processed;Wherein, n is the positive integer more than or equal to 2.
2. a kind of automatic rapid measurement device of electrooptic modulator frequency response as described in claim 1, which is characterized in that described
The automatic rapid measurement device of electrooptic modulator frequency response, further includes:
Control terminal is used to control light wave component analysis instrument from radio frequency mouth and exports rf modulated signal, and controls 1*n RF switch
Cut-off so that rf modulated signal is sequentially delivered in each electrooptic modulator to be measured.
3. a kind of automatic rapid measurement device of electrooptic modulator frequency response as described in claim 1, which is characterized in that described
Polarization-maintaining direct current optical signal source, including polarization-maintaining laser source and 1*n polarization-maintaining beam splitter;The polarization-maintaining laser source is for exporting polarization-maintaining direct current
Optical signal is simultaneously output in each electrooptic modulator to be measured through 1*n polarization-maintaining beam splitter.
4. a kind of automatic rapid measurement device of electrooptic modulator frequency response as described in claim 1, which is characterized in that 1*n
The frequency response parameter of RF switch is obtained by light wave component analysis instrument measurement.
5. a kind of automatic rapid measurement device of electrooptic modulator frequency response as described in claim 1, which is characterized in that n*1
The frequency response parameter of coupler is obtained by light wave component analysis instrument measurement.
6. a kind of measurement of the automatic rapid measurement device of electrooptic modulator frequency response according to any one of claims 1 to 5
Method characterized by comprising
Rf modulated signal is simultaneously gradually sent in each electrooptic modulator to be measured through 1*n RF switch;
Polarization-maintaining direct current optical signal is modulated into corresponding modulated optical signal through the rf modulated signal in each electrooptic modulator to be measured, respectively
Respective channel of a modulated optical signal respectively through n*1 coupler is exported to the optical port of light wave component analysis instrument;
The frequency response parameter for measuring tested link recycles the frequency response parameter for measuring tested link to open divided by 1*n radio frequency
The product with the given frequency response parameter of n*1 coupler is closed, the frequency response of electrooptic modulator can be obtained;Wherein, n is big
In or equal to 1 positive integer.
7. the measurement method of the automatic rapid measurement device of electrooptic modulator frequency response as claimed in claim 6, feature exist
In the measurement method of the automatic rapid measurement device of electrooptic modulator frequency response, further includes:
Light wave component analysis instrument is controlled using control terminal and exports rf modulated signal from radio frequency mouth, and controls 1*n RF switch
It cut-offs so that rf modulated signal is sequentially delivered in each electrooptic modulator to be measured.
8. the measurement method of the automatic rapid measurement device of electrooptic modulator frequency response as claimed in claim 6, feature exist
In, the output of polarization-maintaining direct current optical signals polarization-maintaining laser source, and each electrooptic modulator to be measured is output to through 1*n polarization-maintaining beam splitter
In.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113252316A (en) * | 2021-05-25 | 2021-08-13 | 中国电子科技集团公司第四十一研究所 | Calibration method of light wave element analyzer and light wave element analyzer |
CN113381805A (en) * | 2021-06-10 | 2021-09-10 | 青岛兴仪电子设备有限责任公司 | TOSA bandwidth rapid measurement device and method based on vector network analyzer |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105606890A (en) * | 2015-11-04 | 2016-05-25 | 中国电子科技集团公司第四十一研究所 | Device for measuring frequency response characteristic parameter of light wave component |
CN105675260A (en) * | 2015-11-20 | 2016-06-15 | 电子科技大学 | Measuring device and method for frequency response of mach-zehnder electrooptical modulator |
CN106501601A (en) * | 2016-11-03 | 2017-03-15 | 南京航空航天大学 | A kind of photodetector frequency response measurement method and measuring system |
CN107085143A (en) * | 2017-04-24 | 2017-08-22 | 电子科技大学 | A kind of photoelectricity frequency sound test instrument and method of testing |
CN107132027A (en) * | 2017-04-18 | 2017-09-05 | 中国科学院半导体研究所 | The measuring method and device of optical device broadband frequency response value |
CN108088655A (en) * | 2017-12-18 | 2018-05-29 | 南京航空航天大学 | Optical device measuring method, device based on double sideband modulation and frequency displacement |
JP2019047338A (en) * | 2017-09-01 | 2019-03-22 | 日本電信電話株式会社 | Digital signal processing circuit, optical transceiver, and method of driving the same |
-
2019
- 2019-05-06 CN CN201910371997.4A patent/CN110058099B/en not_active Withdrawn - After Issue
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105606890A (en) * | 2015-11-04 | 2016-05-25 | 中国电子科技集团公司第四十一研究所 | Device for measuring frequency response characteristic parameter of light wave component |
CN105675260A (en) * | 2015-11-20 | 2016-06-15 | 电子科技大学 | Measuring device and method for frequency response of mach-zehnder electrooptical modulator |
CN106501601A (en) * | 2016-11-03 | 2017-03-15 | 南京航空航天大学 | A kind of photodetector frequency response measurement method and measuring system |
CN107132027A (en) * | 2017-04-18 | 2017-09-05 | 中国科学院半导体研究所 | The measuring method and device of optical device broadband frequency response value |
CN107085143A (en) * | 2017-04-24 | 2017-08-22 | 电子科技大学 | A kind of photoelectricity frequency sound test instrument and method of testing |
JP2019047338A (en) * | 2017-09-01 | 2019-03-22 | 日本電信電話株式会社 | Digital signal processing circuit, optical transceiver, and method of driving the same |
CN108088655A (en) * | 2017-12-18 | 2018-05-29 | 南京航空航天大学 | Optical device measuring method, device based on double sideband modulation and frequency displacement |
Non-Patent Citations (1)
Title |
---|
QUANYI YE等: "《Improved frequency response measurement method of half-wavevoltage for phase modulator》", 《OPTIK》 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113252316A (en) * | 2021-05-25 | 2021-08-13 | 中国电子科技集团公司第四十一研究所 | Calibration method of light wave element analyzer and light wave element analyzer |
CN113252316B (en) * | 2021-05-25 | 2023-01-24 | 中国电子科技集团公司第四十一研究所 | Calibration method of light wave element analyzer and light wave element analyzer |
CN113381805A (en) * | 2021-06-10 | 2021-09-10 | 青岛兴仪电子设备有限责任公司 | TOSA bandwidth rapid measurement device and method based on vector network analyzer |
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