CN110033725A - The resistance measurement method of broken line repairing line and the electric resistance measuring apparatus of broken line repairing line - Google Patents
The resistance measurement method of broken line repairing line and the electric resistance measuring apparatus of broken line repairing line Download PDFInfo
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- CN110033725A CN110033725A CN201910330951.8A CN201910330951A CN110033725A CN 110033725 A CN110033725 A CN 110033725A CN 201910330951 A CN201910330951 A CN 201910330951A CN 110033725 A CN110033725 A CN 110033725A
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- line
- broken string
- broken
- display panel
- auxiliary patterns
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
- G02F1/136263—Line defects
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
Abstract
The present invention provides a kind of resistance measurement method of broken line repairing line and the electric resistance measuring apparatus of broken line repairing line.The resistance measurement method of the broken line repairing line in the external zones of display panel by forming the auxiliary patterns connecting with one end at broken string, the structure of the auxiliary patterns is identical as the structure of the sub-pixel in viewing area, it is subsequently formed the both ends at patch cord connection broken string, the patch cord is located in auxiliary patterns, so that the patch cord being located in the external zones of display panel is equal in the viewing area of display panel, the resistance value that measurement is located at the patch cord in external zones is equal to the resistance value for the patch cord that measurement is located in viewing area, to the resistance value of effective monitoring patch cord, improve the success rate of broken line repairing, and then improve display panel yield.
Description
Technical field
The present invention relates to field of display technology more particularly to a kind of resistance measurement methods and broken line repairing of broken line repairing line
The electric resistance measuring apparatus of line.
Background technique
Thin film transistor (TFT) (Thin Film Transistor, TFT) is current liquid crystal display device (Liquid Crystal
Display, LCD) and active matrix drive type organic electroluminescence display device and method of manufacturing same (Active Matrix Organic Light-
Emitting Diode, AMOLED) in main driving element, the display performance of direct relation panel display apparatus.
Liquid crystal display on existing market is largely backlight liquid crystal display comprising liquid crystal display panel and back
Optical mode group (backlight module).The working principle of liquid crystal display panel is in thin-film transistor array base-plate (Thin
Film Transistor Array Substrate, TFT Array Substrate) and colored filter (Color
Filter, CF) liquid crystal molecule is poured between substrate, and apply pixel voltage and common voltage respectively on two plate bases, pass through
The direction of rotation of the electric field controls liquid crystal molecule formed between pixel voltage and common voltage transmits the light of backlight module
Picture is generated out.
Broken line repairing machine is widely used in the controlling grid scan line or data for repairing tft array substrate in LCD and OLED at present
The metal disconnection defect of line is connected at metal broken string by the long line of plated film, and metal broken string is made to restore conducting, Lai Tisheng TFT
The yield of array substrate.The resistance value of plated film is to ensure that successful important parameter is connected in long line, if resistance value is excessive, disconnection defect is repaired
Mend unsuccessful, display panel can only just scrap processing.
Since there is complicated circuit design in the viewing area of display panel, it is difficult to carry out acupuncture treatment test, existing prison to resistance value
The mode for controlling plated film resistance value is to be designed to test for the feeler switch (Test Key) of plated film resistance value in the external zones of display panel.
Existing feeler switch is mainly made of the metal broken string of two panels metal pins (Pad) and connection two panels metal pins, disconnected in metal
After carrying out the long line of plated film at line, with the resistance value of the measuring device measurement long line of plated film.Existing feeler switch is due to designing in display surface
The external zones of plate, therefore only metal pattern, since the processing procedure of the viewing area of display panel is more complicated than external zones very much, so
Plated film resistance value is measured by such feeler switch, can not accurately be monitored the effect in viewing area repairing metal disconnection defect, can be made
Fail at display panel repairing, to influence yield.
Summary of the invention
The purpose of the present invention is to provide a kind of resistance measurement methods of broken line repairing line, can be with effective monitoring patch cord
Resistance value improves the success rate of broken line repairing, and then improves display panel yield.
The object of the invention is also to provide a kind of electric resistance measuring apparatus of broken line repairing line, can be with effective monitoring patch cord
Resistance value, improve the success rate of broken line repairing, and then improve display panel yield.
To achieve the above object, the present invention provides a kind of resistance measurement method of broken line repairing line, include the following steps:
Step S1, display panel is provided, the display panel includes viewing area and the external zones for surrounding viewing area；It is described aobvious
Show that area includes multiple sub-pixels in array arrangement；
Step S2, it is arranged in the external zones of display panel and is located at the broken string in external zones with the display panel respectively
Both ends connection at least two spaced feeler switch；
Step S3, the auxiliary patterns connecting with one end at broken string are formed in the external zones of display panel；The auxiliary
The structure of pattern and the structure of sub-pixel are identical；
Step S4, the patch cord for connecting both ends at the broken string is formed；The patch cord is located in auxiliary patterns；
Step S5, the resistance value of the patch cord is measured by feeler switch.
In the step S4, the patch cord for connecting both ends at the broken string is formed by radium-shine chemical vapor deposition.
The sub-pixel and auxiliary patterns include the scan line extended transversely, the data line extended longitudinally and thin
Film transistor；Wherein, the grid of the thin film transistor (TFT) connects scan line, and source electrode connects data line, drain electrode connection pixel electrode.
At broken string at the broken string for the scan line of sub-pixel；The scan line of the auxiliary patterns and one end at broken string
Connection.
At broken string at the broken string for the data line of sub-pixel, the data line of the auxiliary patterns and one end at broken string
Connection.
The present invention also provides a kind of electric resistance measuring apparatus of broken line repairing line, comprising: at least two on display panel
A spaced feeler switch and the pattern unit being keyed respectively with the test, long line are at film unit and measuring unit；
The display panel includes viewing area and the external zones for surrounding viewing area；The viewing area includes arranging in array
Multiple sub-pixels；
The feeler switch is for being arranged in the external zones of display panel and being located at external zones with the display panel respectively
In broken string at both ends connection；
The pattern unit in the external zones of display panel for forming the auxiliary patterns connecting with one end at broken string；
The structure of the auxiliary patterns and the structure of sub-pixel are identical；
The long line is used to form the patch cord for connecting both ends at the broken string at film unit；The patch cord is located at auxiliary
In pattern；
The measuring unit is used to measure the resistance value of the patch cord by feeler switch.
The long line forms the patch cord for connecting both ends at the broken string at film unit by radium-shine chemical vapor deposition.
The sub-pixel and auxiliary patterns include the scan line extended transversely, the data line extended longitudinally and thin
Film transistor；Wherein, the grid of the thin film transistor (TFT) connects scan line, and source electrode connects data line, drain electrode connection pixel electrode.
At broken string at the broken string for the scan line of sub-pixel；The scan line of the auxiliary patterns and one end at broken string
Connection.
At broken string at the broken string for the data line of sub-pixel, the data line of the auxiliary patterns and one end at broken string
Connection.
Beneficial effects of the present invention: the resistance measurement method of broken line repairing line of the invention passes through in the periphery of display panel
The auxiliary patterns connecting with one end at broken string, the structure of the sub-pixel in the structure and viewing area of the auxiliary patterns are formed in area
It is identical, the both ends at patch cord connection broken string are subsequently formed, which is located in auxiliary patterns, so that being located at display panel
Patch cord in external zones is equal in the viewing area of display panel, and measurement is located at the resistance value of the patch cord in external zones
It is equal to the resistance value for the patch cord that measurement is located in viewing area, so that the resistance value of effective monitoring patch cord, improves broken string and repair
The success rate of benefit, and then improve display panel yield.The electric resistance measuring apparatus of broken line repairing line of the invention, can be with effective monitoring
The resistance value of patch cord improves the success rate of broken line repairing, and then improves display panel yield.
Detailed description of the invention
For further understanding of the features and technical contents of the present invention, it please refers to below in connection with of the invention detailed
Illustrate and attached drawing, however, the drawings only provide reference and explanation, is not intended to limit the present invention.
In attached drawing,
Fig. 1 is the flow chart of the resistance measurement method of broken line repairing line of the invention；
Fig. 2 is the schematic diagram of the step S2 of the resistance measurement method of broken line repairing line of the invention；
Fig. 3 is the schematic diagram of the step S3 of the resistance measurement method of broken line repairing line of the invention；
Fig. 4 is the schematic diagram of the step S4 of the resistance measurement method of broken line repairing line of the invention；
Fig. 5 is the sub-pixel of the resistance measurement method of broken line repairing line of the invention and the schematic diagram of auxiliary patterns；
Fig. 6 is the schematic diagram of the electric resistance measuring apparatus of broken line repairing line of the invention.
Specific embodiment
Further to illustrate technological means and its effect adopted by the present invention, below in conjunction with preferred implementation of the invention
Example and its attached drawing are described in detail.
Referring to Fig. 1, the present invention provides a kind of resistance measurement method of broken line repairing line, include the following steps:
Step S1, display panel 50 is provided, the display panel 50 includes viewing area 52 and the periphery for surrounding viewing area 52
Area 51；The viewing area 52 includes multiple sub-pixels 521 in array arrangement；
Step S2, it is located at respectively with the display panel 50 referring to Fig. 2, being arranged in the external zones 51 of display panel 50
At least two spaced feeler switch 10 of 501 both ends connection at broken string in external zones 51；
Step S3, it connect referring to Fig. 3, being formed in the external zones 51 of display panel 50 at broken string 501 one end
Auxiliary patterns 502；；The structure of the auxiliary patterns 502 is identical as the structure of sub-pixel 521；
Step S4, referring to Fig. 4, forming the patch cord 31 for connecting 501 both ends at the broken string；The patch cord 31 is located at
In auxiliary patterns 502；
Step S5, the resistance value of the patch cord 31 is measured (for example, carrying out acupuncture treatment survey to feeler switch 10 by feeler switch 10
The resistance value of examination measurement patch cord 31).
It should be noted that the present invention passes through for the external zones 51 of display panel 50 and the processing procedure difference of viewing area 52
The auxiliary patterns 502 connecting at broken string 501 one end, the auxiliary patterns 502 are formed in the external zones 51 of display panel 50
Structure it is identical as the structure of sub-pixel 521 in viewing area 52, be subsequently formed patch cord 31 connect broken string at 501 both ends,
The patch cord 31 is located in auxiliary patterns 502, so that the patch cord 31 being located in the external zones 51 of display panel 50 is equal to position
In the viewing area of display panel 50 52, the resistance value that measurement is located at the patch cord 31 in external zones 51 is equal to measurement positioned at aobvious
Show the resistance value of the patch cord 31 in area 52, so that the resistance value of effective monitoring patch cord 31, improves the success rate of broken line repairing,
And then improve 50 yield of display panel.
Specifically, passing through radium-shine chemical vapor deposition (Laser Chemical Vapor in the step S4
Deposition, LCVD) form the patch cord 31 for connecting 501 both ends at the broken string.
Specifically, referring to Fig. 5, the sub-pixel 521 and auxiliary patterns 502 include the scan line extended transversely
200, the data line 300 and thin film transistor (TFT) 400 extended longitudinally；Wherein, the grid 401 of the thin film transistor (TFT) 400 connects
Scan line 200 is connect, source electrode 402 connects data line 300,403 connection pixel electrode 100 of drain electrode.
Specifically, at the broken string 501 for sub-pixel 521 scan line 200 broken string at 501；The auxiliary patterns 502
Scan line 200 connect at broken string 501 one end；
Specifically, at the broken string 501 for sub-pixel 521 data line 300 broken string at 501, the auxiliary patterns 502
Data line 300 connect at broken string 501 one end.
Referring to Fig. 6, the resistance measurement method based on above-mentioned broken line repairing line, the present invention provides a kind of broken line repairing line
Electric resistance measuring apparatus, comprising: at least two spaced feeler switch 10 on display panel 50 and respectively with it is described
Pattern unit 20 that feeler switch 10 connects, long line is at film unit 30 and measuring unit 40；
The display panel 50 includes viewing area 52 and the external zones 51 for surrounding viewing area 52；The viewing area 52 includes
Multiple sub-pixels 521 of array arrangement；
The feeler switch 10 for be arranged in the external zones 51 of display panel 50 and respectively with the display panel 50
501 both ends connection at broken string in external zones 51；
The pattern unit 20 is used for what the formation in the external zones 51 of display panel 50 was connect at broken string 501 one end
Auxiliary patterns 502；The structure of the auxiliary patterns 502 is identical as the structure of sub-pixel 521；
The long line is used to form the patch cord 31 for connecting 501 both ends at the broken string at film unit 30；The patch cord
31 are located in auxiliary patterns 502；
The measuring unit 40 is used to measure the resistance value of the patch cord 31 by feeler switch 10.
It should be noted that the present invention passes through for the external zones 51 of display panel 50 and the processing procedure difference of viewing area 52
The auxiliary patterns 502 connecting at broken string 501 one end, the auxiliary patterns 502 are formed in the external zones 51 of display panel 50
Structure it is identical as the structure of sub-pixel 521, be subsequently formed patch cord 31 connect broken string at 501 both ends, the patch cord 31
In auxiliary patterns 502, so that the patch cord 31 being located in the external zones 51 of display panel 50 is equal to positioned at display panel 50
Viewing area 52 in, measuring unit 40 measurement be located at external zones 51 in patch cord 31 resistance value be equal to measurement be located at display
The resistance value of patch cord 31 in area 52, so that the resistance value of effective monitoring patch cord 31, improves the success rate of broken line repairing, into
And improve 50 yield of display panel.
Specifically, the long line, which is formed at film unit 30 by radium-shine chemical vapor deposition, connects at the broken string 501 liang
The patch cord 31 at end.
Specifically, the sub-pixel 521 and auxiliary patterns 502 include the scan line 200 extended transversely, prolong along longitudinal direction
The data line 300 and thin film transistor (TFT) 400 stretched；Wherein, the grid 401 of the thin film transistor (TFT) 400 connects scan line 200,
Source electrode 402 connects data line 300,403 connection pixel electrode 100 of drain electrode.
Specifically, at the broken string 501 for sub-pixel 521 scan line 200 broken string at 501；The auxiliary patterns 502
Scan line 200 connect at broken string 501 one end；
Specifically, at the broken string 501 for sub-pixel 521 data line 300 broken string at 501, the auxiliary patterns 502
Data line 300 connect at broken string 501 one end.
In conclusion the resistance measurement method of broken line repairing line of the invention in the external zones of display panel by forming
The structure of the auxiliary patterns connecting with one end at broken string, the auxiliary patterns is identical as the structure of the sub-pixel in viewing area, after
The continuous both ends formed at patch cord connection broken string, which is located in auxiliary patterns, so that being located at the external zones of display panel
In patch cord be equal in the viewing area of display panel, the resistance value of patch cord that measurement is located in external zones is equal to
Measurement is located at the resistance value of the patch cord in viewing area, thus the resistance value of effective monitoring patch cord, improve broken line repairing at
Power, and then improve display panel yield.The electric resistance measuring apparatus of broken line repairing line of the invention, can be with effective monitoring patch cord
Resistance value, improve the success rate of broken line repairing, and then improve display panel yield.
The above for those of ordinary skill in the art can according to the technique and scheme of the present invention and technology
Other various corresponding changes and modifications are made in design, and all these change and modification all should belong to the claims in the present invention
Protection scope.
Claims (10)
1. a kind of resistance measurement method of broken line repairing line, which comprises the steps of:
Step S1, display panel (50) are provided, the display panel (50) includes viewing area (52) and surrounds viewing area (52)
External zones (51)；The viewing area (52) includes multiple sub-pixels (521) in array arrangement；
Step S2, setting is located at external zones with the display panel (50) respectively in the external zones (51) of display panel (50)
(51) at least two spaced feeler switch (10) of the both ends connection of (501) at the broken string in；
Step S3, the auxiliary patterns connecting with the one end of (501) at broken string are formed in the external zones (51) of display panel (50)
(502)；The structure of the auxiliary patterns (502) is identical as the structure of sub-pixel (521)；
Step S4, the patch cord (31) for connecting (501) both ends at the broken string is formed；The patch cord (31) is located at auxiliary patterns
(502) in；
Step S5, the resistance value of the patch cord (31) is measured by feeler switch (10).
2. the resistance measurement method of broken line repairing line as described in claim 1, which is characterized in that in the step S4, pass through
Radium-shine chemical vapor deposition forms the patch cord (31) for connecting (501) both ends at the broken string.
3. the resistance measurement method of broken line repairing line as described in claim 1, which is characterized in that the sub-pixel (521) and
Auxiliary patterns (502) include that the scan line (200) extended transversely, the data line (300) extended longitudinally and film are brilliant
Body pipe (400)；Wherein, the grid (401) of the thin film transistor (TFT) (400) connects scan line (200), source electrode (402) connection number
According to line (300), drain (403) connection pixel electrode (100).
4. the resistance measurement method of broken line repairing line as claimed in claim 3, which is characterized in that (501) are at the broken string
At the broken string of the scan line (200) of sub-pixel (521) (501)；At the scan line (200) and broken string of the auxiliary patterns (502)
(501) one end connection.
5. the resistance measurement method of broken line repairing line as claimed in claim 3, which is characterized in that (501) are at the broken string
At the broken string of the data line (300) of sub-pixel (521) (501), at the data line (300) and broken string of the auxiliary patterns (502)
(501) one end connection.
6. a kind of electric resistance measuring apparatus of broken line repairing line characterized by comprising at least two be set on display panel (50)
A spaced feeler switch (10) and the pattern unit (20) connecting respectively with the feeler switch (10), long line are at film unit
(30) and measuring unit (40)；
The display panel (50) includes viewing area (52) and the external zones (51) for surrounding viewing area (52)；The viewing area (52)
Including multiple sub-pixels (521) in array arrangement；
The feeler switch (10) for be arranged in the external zones (51) of display panel (50) and respectively with the display panel
(50) it is located at the both ends connection of (501) at the broken string in external zones (51)；
The pattern unit (20) is used to be formed in the external zones (51) of display panel (50) to be connected with the one end of (501) at broken string
The auxiliary patterns (502) connect；The structure of the auxiliary patterns (502) is identical as the structure of sub-pixel (521)；
The long line is used to form the patch cord (31) for connecting (501) both ends at the broken string at film unit (30)；The repairing
Line (31) is located in auxiliary patterns (502)；
The measuring unit (40) is used to measure the resistance value of the patch cord (31) by feeler switch (10).
7. the electric resistance measuring apparatus of broken line repairing line as claimed in claim 6, which is characterized in that the long line is at film unit
(30) patch cord (31) for connecting (501) both ends at the broken string is formed by radium-shine chemical vapor deposition.
8. the electric resistance measuring apparatus of broken line repairing line as claimed in claim 6, which is characterized in that the sub-pixel (521) and
Auxiliary patterns (502) include that the scan line (200) extended transversely, the data line (300) extended longitudinally and film are brilliant
Body pipe (400)；Wherein, the grid (401) of the thin film transistor (TFT) (400) connects scan line (200), source electrode (402) connection number
According to line (300), drain (403) connection pixel electrode (100).
9. the electric resistance measuring apparatus of broken line repairing line as claimed in claim 8, which is characterized in that (501) are at the broken string
At the broken string of the scan line (200) of sub-pixel (521) (501)；At the scan line (200) and broken string of the auxiliary patterns (502)
(501) one end connection.
10. the electric resistance measuring apparatus of broken line repairing line as claimed in claim 8, which is characterized in that (501) are at the broken string
At the broken string of the data line (300) of sub-pixel (521) (501), at the data line (300) and broken string of the auxiliary patterns (502)
(501) one end connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910330951.8A CN110033725B (en) | 2019-04-23 | 2019-04-23 | Resistance measuring method and resistance measuring device for disconnection repairing line |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910330951.8A CN110033725B (en) | 2019-04-23 | 2019-04-23 | Resistance measuring method and resistance measuring device for disconnection repairing line |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110033725A true CN110033725A (en) | 2019-07-19 |
| CN110033725B CN110033725B (en) | 2022-05-31 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201910330951.8A Active CN110033725B (en) | 2019-04-23 | 2019-04-23 | Resistance measuring method and resistance measuring device for disconnection repairing line |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW490856B (en) * | 2001-03-27 | 2002-06-11 | Acer Display Tech Inc | Repairing method for data line of liquid crystal display |
| TW200739181A (en) * | 2006-04-14 | 2007-10-16 | Chi Mei Optoelectronics Corp | Flat display panel, flat display apparatus and broken line repairing method |
| CN101082709A (en) * | 2007-08-01 | 2007-12-05 | 昆山龙腾光电有限公司 | Liquid crystal display board capable of mending defect of data-wire and mending method |
| CN201000518Y (en) * | 2006-11-29 | 2008-01-02 | 上海广电光电子有限公司 | LCD device capable of reducing signal delay of repair line |
| CN101887179A (en) * | 2009-05-12 | 2010-11-17 | 华映视讯（吴江）有限公司 | Display panel with repairing structure and method for repairing same |
| CN102314007A (en) * | 2011-09-01 | 2012-01-11 | 南京中电熊猫液晶显示科技有限公司 | Disconnected cable repair method of liquid crystal display |
| CN108227324A (en) * | 2018-01-15 | 2018-06-29 | 深圳市华星光电技术有限公司 | For the feeler switch and test method and method for repairing disconnected lines of broken line repairing |
-
2019
- 2019-04-23 CN CN201910330951.8A patent/CN110033725B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW490856B (en) * | 2001-03-27 | 2002-06-11 | Acer Display Tech Inc | Repairing method for data line of liquid crystal display |
| TW200739181A (en) * | 2006-04-14 | 2007-10-16 | Chi Mei Optoelectronics Corp | Flat display panel, flat display apparatus and broken line repairing method |
| CN201000518Y (en) * | 2006-11-29 | 2008-01-02 | 上海广电光电子有限公司 | LCD device capable of reducing signal delay of repair line |
| CN101082709A (en) * | 2007-08-01 | 2007-12-05 | 昆山龙腾光电有限公司 | Liquid crystal display board capable of mending defect of data-wire and mending method |
| CN101887179A (en) * | 2009-05-12 | 2010-11-17 | 华映视讯（吴江）有限公司 | Display panel with repairing structure and method for repairing same |
| CN102314007A (en) * | 2011-09-01 | 2012-01-11 | 南京中电熊猫液晶显示科技有限公司 | Disconnected cable repair method of liquid crystal display |
| CN108227324A (en) * | 2018-01-15 | 2018-06-29 | 深圳市华星光电技术有限公司 | For the feeler switch and test method and method for repairing disconnected lines of broken line repairing |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110033725B (en) | 2022-05-31 |
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