CN110018679A - The autonomous temperature control system closed loop test system of spacecraft and test method - Google Patents
The autonomous temperature control system closed loop test system of spacecraft and test method Download PDFInfo
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- CN110018679A CN110018679A CN201910290434.2A CN201910290434A CN110018679A CN 110018679 A CN110018679 A CN 110018679A CN 201910290434 A CN201910290434 A CN 201910290434A CN 110018679 A CN110018679 A CN 110018679A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
Abstract
The present invention relates to a kind of autonomous temperature control system closed loop test system of the spacecraft of electronic equipment on satellite technical field and test methods；The system comprises the autonomous temperature control system of spacecraft and closed loop test systems for the test macro；The autonomous temperature control system of spacecraft includes telemetry-acquisition module, heater-driven module, processor module；The closed loop test system includes thermistor simulation board, heater-driven detection board, host computer, test terminal；The invention further relates to the test methods of aforementioned test macro.Present system proposes the autonomous temperature control system closed loop test methods of spacecraft, specify the relevant components of closed loop test system, and system structure of the invention is simple and reliable, and stability is good, and test method is easy to operate, and test effect is good；The product test period can substantially be shortened, improve the progress of development, the reliability and testing efficiency of development is promoted, improve the test coverage of autonomous temperature control system, there is significant technological progress.
Description
Technical field
The present invention relates to electronic equipment on satellite technical fields, and in particular to a kind of autonomous temperature control system closed loop test of spacecraft
System and test method.
Background technique
Two kinds of temperature control modes, i.e. active temperature control and passive temperature control are generallyd use on spacecraft at present.It is most classical most common
Design method is based on passive temperature control, supplemented by active temperature control, with being more widely thermal control coating in passive temperature control, actively temperature
Control is then generally using heating sheet, fluid circuit etc..The autonomous temperature control system of spacecraft, which is realized, carries out temperature survey to each bay section of spacecraft
Amount and control guarantee that the structure member of spacecraft, instrument and equipment, in a suitable temperature range, make it in space environment
It can work normally, be commonly used one of active temperature control technology.
The autonomous temperature control system of spacecraft as automatic control device, adopted by temperature signal by the feature with normal controller
Collection, control generate, control executes three parts composition.Wherein temperature signal generally passes through thermosensitive resistance measurement, turns after AD quantifies
Voltage signal acquisition is turned to, and collected temperature signal is uniformly sent to processor and carries out calculating judgement, to determine whether to need
Heater or shutdown heater are driven, thus by temperature control in certain section.
With the development of technology, the temperature control requirement of instrument and equipment is higher and higher, heater quantity, temperature measuring point number
Amount demand is more and more, and temperature control strategy is more and more various, causes autonomous temperature control system complexity to be significantly increased, the product test period
It is doubled and redoubled, seriously affects development progress and reliability.In addition, only being developed due to the particularity of spacecraft development process
True closed-loop simulation test could be compared when later period heat test to autonomous temperature control system, the time compares lag.Therefore, certainly
Main temperature control system exploitation side test is particularly important.This field needs to propose the closed loop of the autonomous temperature control system of completely new spacecraft
Test method, to improve testing efficiency and product reliability.
Through the literature search of existing technologies, Chinese invention patent application 201110309956.6 discloses a kind of temperature
Degree closed-loop control device and test method, the temperature closed-loop control device of the invention including fixture, are arranged in fixture at least
One temperature sensor, control device and executive device；But the method that the invention is recorded is applied to the autonomous temperature control system of spacecraft
It is difficult to obtain good effect when the test of system.
Summary of the invention
In view of the drawbacks of the prior art, the purpose of the present invention is to provide a kind of autonomous temperature control system closed loop tests of spacecraft
Method.Test method of the invention can be improved testing efficiency, guarantee product correctness and reliability.
The present invention relates to a kind of autonomous temperature control system closed loop test systems of spacecraft, and it is independently warm that the system comprises spacecrafts
Control system and closed loop test system；
The autonomous temperature control system of spacecraft includes telemetry-acquisition module, heater-driven module, processor module；
The telemetry-acquisition module acquires spacecraft temperature controlling point remote temperature sensing, and processor module is according to collected temperature controlling point
The temperature control of temperature and heater requirement, it is determined whether output heater button instruction；
The heater-driven module receives and executes heater button instruction, and processor module is simultaneously by temperature controlling point temperature
The telemetering of degree, heater button state is by reaching test terminal under observing and controlling channel；
The closed loop test system includes thermistor simulation board, heater-driven detection board, host computer, tests eventually
End；The thermistor analog board card Simulated Spacecraft temperature control dotted state is acquired for telemetry-acquisition module, heater-driven detection
Board detects the switch state of heater-driven module output, and the output policy of PC control thermistor simulation board simultaneously connects
The detection information for receiving heater-driven detection board receives boat body device telemetry intelligence (TELINT) by test terminal and test system and test is believed
Breath compares output closed-loop test result through analysis, and then completes closed loop test.
The invention further relates to a kind of test methods such as the autonomous temperature control system closed loop test system of aforementioned spacecraft, including such as
Lower step:
(1) host computer starts to test No. i-th heater HiAutonomous function of temperature control, HiTemperature controlling point be respectively Ti,1、Ti,2、…、
Ti,j、…、Ti,N, it is respectively R that each temperature controlling point, which requires the resistance value of setting,i,1、Ri,2、…、Ri,j、…、Ri,N；Wherein, j=1, L,
N, N are heater HiTemperature controlling point number；
(2) quantization circuit design is acquired according to telemetry-acquisition module temperature, host computer calculates resistance value set by temperature controlling point
Theoretical voltage be respectively Vi,1、VI, 2、…、VI, j、…、VI, N；
(3) according to heater HiTemperature controlling point theoretical voltage Vi,1、VI, 2、…、VI, j、…、VI, NWith heater temperature control strategy, on
Position machine calculates theoretical temperature voltage Vi；
(4) according to heater HiTemperature control threshold value and temperature controlling point theoretical temperatures voltage Vi, host computer calculating heater HiTheory
Switch state Si；
(5) temperature controlling point Ti,j, resistance value Ri,jWith theoretical collection voltages VI, jFor one-to-one relationship, by host computer by N number of control
Warm spot information and corresponding resistance value information export to thermistor and simulate board；
(6) thermistor simulates board according to the corresponding relationship of temperature controlling point and board output channel, while N number of temperature control is arranged
The resistance value R in the corresponding channel of pointi,j；
(7) resistance value of telemetry-acquisition module acquisition thermistor simulation board setting, formation temperature is distant after AD quantifies
Survey VI, 1′、VI, 2′、…、VI, j′、…、VI, N', and remote temperature sensing is transmitted to processor module；
(8) according to heater HiTemperature controlling point actual temperature telemetering VI, 1′、VI, 2′、…、VI, j′、…、VI, N' and heater control
Warm strategy, processor module calculate actual temperature voltage Vi′；
(9) according to heater HiTemperature control threshold value and temperature controlling point actual temperature voltage Vi', processor module calculating determines whether
It is turned on or off No. i-th heater；
(10) it is turned on or off heater instruction to be executed by processor module sending, heater-driven module, heater
Switch state telemetering is back to processor module, No. i-th heater H by drive moduleiSwitch state telemetering be Si′；
(11) heater-driven detection plate card wheel askes detection heater-driven module output state, and institute's having heaters is opened
It closes detection information and is transmitted to host computer, No. i-th heater HiSwitch detecting state be Si″；
(12) information such as all collected remote temperature sensings, heater button state are passed through downlink telemetry by processor module
Channel transfer is to testing terminal；
(13) host computer passes the information such as the temperature controlling point theory collection voltages of institute's having heaters, heater button detecting state
Transport to test terminal；
(14) test terminal compares heater HiEach circuit temperature-controlling point theory collection voltages VI, jWith actual acquisition electricity on star
Press VI, j', if | VI, j-VI, j′|≤ΔQAD, then temperature simulation and acquisition function are normal, can be transferred in next step, otherwise check and adopt
Collect deviating cause, wherein Δ QADFor maximum deflection difference value；
(15) test terminal compares heater HiTheoretical switch state Si, switch state telemetering Si' and switch detecting state
Si", if Si=Si'=Si", then No. i-th heater HiAutonomous function of temperature control is normal, otherwise checks error reason；
(16) it repeats the above steps until completing the autonomous temperature control test of institute's having heaters.
Preferably, thermistor analog board card flexibly setting by programmable resistance realization resistance value in the step (6)
It sets.
Preferably, temperature control strategy is using single temperature spot temperature control in the step (3) and (8), then theoretical temperatures voltage Vi=
Vi,1, actual temperature voltage Vi'=VI, 1′。
Preferably, temperature control strategy uses maximum temperature values temperature control in the step (3) and (8), then theoretical temperatures voltage Vi
=Max (VI, 1,VI, 2,L,VI, N), actual temperature voltage Vi'=Max (VI, 1′,VI, 2′,L,VI, N′)。
Preferably, temperature control strategy uses minimum temperature value temperature control in the step (3) and (8), then theoretical temperatures voltage Vi
=Min (VI, 1,VI, 2,L,VI, N), actual temperature voltage Vi'=Min (VI, 1′,VI, 2′,L,VI, N′)。
Preferably, temperature control strategy uses average temperature value temperature control in the step (3) and (8), then theoretical temperatures voltageActual temperature voltage
Preferably, temperature control threshold value includes temperature control upper threshold V in the step (4) and (9)i,maxWith temperature control bottom threshold
Vi,min。
Preferably, in the step (4) and (9), temperature is measured according to negative tempperature coefficient thermistor, temperature voltage is small
In upper limit Vi,max, heater is closed, temperature voltage is greater than lower limit Vi,min, open heater；For using posive temperature coefficient thermistor
Temperature is measured, temperature voltage is greater than upper limit Vi,max, heater is closed, temperature voltage is less than lower limit Vi,min, open heater.
Compared with prior art, the present invention has following the utility model has the advantages that present system proposes spacecrafts is independently warm
Control system closed loop test method specifies the relevant components of closed loop test system, and system structure of the invention is simple and reliable, stablizes
Property is good, and test method is easy to operate, and test effect is good；The product test period can substantially be shortened, the progress of development is improved, mention
The reliability developed and testing efficiency are risen, the test coverage of autonomous temperature control system is improved, there is significant technological progress.
Detailed description of the invention
Upon reading the detailed description of non-limiting embodiments with reference to the following drawings, other feature of the invention,
Objects and advantages will become more apparent upon:
Fig. 1 is the autonomous temperature control test macro block diagram of spacecraft；
Fig. 2 is that remote temperature sensing acquires schematic diagram.
Specific embodiment
The present invention is described in detail combined with specific embodiments below.Following embodiment will be helpful to the technology of this field
Personnel further understand the present invention, but the invention is not limited in any way.It should be pointed out that the ordinary skill of this field
For personnel, without departing from the inventive concept of the premise, several changes and improvements can also be made.These belong to the present invention
Protection scope.
Embodiment
In the present embodiment, the autonomous temperature control system closed loop test system of spacecraft of the present invention, system includes spacecraft
Autonomous temperature control system and closed loop test system；
The autonomous temperature control system of spacecraft includes telemetry-acquisition module, heater-driven module, processor module；
The telemetry-acquisition module acquires spacecraft temperature controlling point remote temperature sensing, and processor module is according to collected temperature controlling point
The temperature control of temperature and heater requirement, it is determined whether output heater button instruction；
The heater-driven module receives and executes heater button instruction, and processor module is simultaneously by temperature controlling point temperature
The telemetering of degree, heater button state is by reaching test terminal under observing and controlling channel；
The closed loop test system includes thermistor simulation board, heater-driven detection board, host computer, tests eventually
End；The thermistor analog board card Simulated Spacecraft temperature control dotted state is acquired for telemetry-acquisition module, heater-driven detection
Board detects the switch state of heater-driven module output, and the output policy of PC control thermistor simulation board simultaneously connects
The detection information for receiving heater-driven detection board receives boat body device telemetry intelligence (TELINT) by test terminal and test system and test is believed
Breath compares output closed-loop test result through analysis, and then completes closed loop test.
For further the present invention is described in detail, with the autonomous temperature control test macro of spacecraft designed by the invention
For, as shown in Figure 1, including autonomous temperature control system and closed loop test system two parts.
The autonomous temperature control system of spacecraft is made of telemetry-acquisition module, heater-driven module, processor module.By telemetering
Acquisition module acquires spacecraft temperature controlling point remote temperature sensing, and temperature sensor selects negative tempperature coefficient thermistor, and Acquisition Circuit is such as
Fig. 2 signal.Processor module is according to collected remote temperature sensing and the requirement of heater temperature control, it is determined whether output heater button
Instruction is received by heater-driven module and is executed heater button instruction, and processor module is simultaneously by temperature controlling point temperature, heating
The telemeterings such as device switch state, which pass through, reaches test terminal under observing and controlling channel.
Closed loop test system is by thermistor simulation board, heater-driven detection board, host computer, test set of terminal
At thermistor analog board card Simulated Spacecraft temperature control dotted state is acquired for telemetry-acquisition module, and heater-driven detects board
The switch state of heater-driven module output is detected, PC control thermistor, which is simulated the output policy of board and received, to be added
The detection information of hot device driving detection board, receives boat body device telemetry intelligence (TELINT) and test system and test information, warp by test terminal
Output closed-loop test result is compared in analysis.
Negative tempperature coefficient thermistor is using temperature-sensing element (device) made of semiconductor material, and resistance value can be with temperature
The raising of degree and become smaller.The resistance-temperature characteristics of negative tempperature coefficient thermistor are non-linear relation, and each thermistor is all
Resistance v. temperature calibration value can be provided by producer.A 5V reference voltage is configured in telemetry-acquisition module and one is used as partial pressure
Reference resistance, using thermistor and reference resistance to the series connection partial pressure value of 5V as the input of analog channel, conversion formula
Are as follows:
Wherein, U is 5V reference voltage, R1For benchmark resistance, usually 10K Ω, RTFor thermistor, V is collected electricity
Pressure.
Telemetry-acquisition module uses 8 bit quantization AD, 0~5V of acquisition range, and quantization layered values are 0.0196V.
Illustrate the specific steps of autonomous temperature control system closed loop test method for the test of the heater shown in the table 1.
1 heater test sample of table
Temperature controlling point thermistor selects MF501, and table 2 is the phasing meter of a MF501 thermistor.Because of MF501 consistency
Preferably, therefore in calculating, "+X interior plate module temperature measuring point 1 " and "+X interior plate module temperature measuring point 2 " selects table 2
Numerical value.
The corresponding resistance value of each temperature spot of 2 thermistor of table
| Temperature | Survey resistance | Temperature | Survey resistance | Temperature | Survey resistance | Temperature | Survey resistance |
| ℃ | kΩ | ℃ | kΩ | ℃ | kΩ | ℃ | kΩ |
| -40 | 193.2196 | -10 | 29.5383 | 10 | 10.1639 | 30 | 3.9621 |
| -30 | 99.1308 | -9 | 27.9219 | 11 | 9.6678 | 31 | 3.7913 |
| -20 | 53.0400 | -8 | 26.4025 | 12 | 9.1990 | 32 | 3.6289 |
| -10 | 29.5383 | -7 | 24.9738 | 13 | 8.7557 | 33 | 3.4745 |
| 0 | 17.0681 | -6 | 23.6300 | 14 | 8.3365 | 34 | 3.3275 |
| 10 | 10.1639 | -5 | 22.3656 | 15 | 7.9398 | 35 | 3.1876 |
| 20 | 6.2514 | -4 | 21.1755 | 16 | 7.5644 | 36 | 3.0544 |
| 30 | 3.9621 | -3 | 20.0549 | 17 | 7.2090 | 37 | 2.9276 |
| 40 | 2.5819 | -2 | 18.9996 | 18 | 6.8724 | 38 | 2.8068 |
| 50 | 1.7265 | -1 | 18.0052 | 19 | 6.5536 | 39 | 2.6916 |
| 60 | 1.1818 | 0 | 17.0681 | 20 | 6.2514 | 40 | 2.5819 |
| 70 | 0.8280 | 1 | 16.1846 | 21 | 5.9649 | 41 | 2.4773 |
| 80 | 0.5912 | 2 | 15.3515 | 22 | 5.6933 | 42 | 2.3775 |
| 3 | 14.5655 | 23 | 5.4356 | 43 | 2.2823 | ||
| 4 | 13.8238 | 24 | 5.1911 | 44 | 2.1915 | ||
| 5 | 13.1237 | 25 | 4.9591 | 45 | 2.1048 | ||
| 6 | 12.4627 | 26 | 4.7387 | 46 | 2.0221 | ||
| 7 | 11.8383 | 27 | 4.5294 | 47 | 1.9430 | ||
| 8 | 11.2484 | 28 | 4.3306 | 48 | 1.8676 | ||
| 9 | 10.6909 | 29 | 4.1417 | 49 | 1.7954 | ||
| 10 | 10.1639 | 30 | 3.9621 | 50 | 1.7265 |
Assuming that lowest temperature is 10 DEG C in table 1, temperature upper limit is 20 DEG C, according to formula 1 and table 2, can obtain Vi,min=
2.52V Vi,max=1.92V.
Detailed process is as follows for test:
(1) "+X interior plate block heater 1 is main " uses average temperature value temperature control strategy, i.e. "+X interior plate module temperature
The average value of measuring point 1+ " and "+X interior plate module temperature measuring point 2 " is as actual temperature voltage.When test, two temperature controlling point electricity
Resistance value is respectively set to Ri,1=15K Ω, Ri,2=9K Ω；
(2) it is designed according to negative tempperature coefficient thermistor temperature acquisition sample circuit, host computer calculates set by temperature controlling point
The theoretical voltage of resistance value is respectively as follows:
(3) because using average temperature value temperature control strategy, host computer calculates theoretical temperature voltage are as follows:
(4) compare theoretical temperatures voltage ViWith temperature upper limit, lowest temperature, ViGreater than lower limit Vi,min, heater is opened, is obtained
Theoretical switch state SiTo open；
(5) the temperature controlling point resistance value R that host computer provides is received in the clamping of thermistor analog boardi,1、Ri,2, programmable by being arranged
Resistance exports defined resistance value in corresponding channel；
(6) telemetry-acquisition module collects "+X interior plate module temperature measuring point 1+ " and "+X interior plate module temperature measuring point
2 " remote temperature sensing digital quantity after AD quantifies is respectively 0x99,0x79, and reverting to voltage value is respectively VI, 1'=2.9988V,
VI, 2Remote temperature sensing digital quantity is transmitted to processor module by '=2.3716V, telemetry-acquisition module；
(7) processor module calculates actual temperature voltage according to average temperature value temperature control policy mandates are as follows:
(8) processor module compares actual temperature voltage Vi' and temperature upper limit, lowest temperature, Vi' it is greater than lower limit Vi,min,
Open "+X interior plate block heater 1 is main "；
(9) it received by heater-driven module, execute heater button instruction, and switch state telemetering is back to processing
Device module, the switch state telemetering S of "+X interior plate block heater 1 is main "i' it is to open；
(10) heater-driven detection plate card wheel askes detection heater-driven module output state, and institute's having heaters is opened
It closes detection information and is transmitted to host computer, the switch detecting state S of "+X interior plate block heater 1 is main "i" to open；
(11) information such as all collected remote temperature sensings, heater button state are passed through downlink telemetry by processor module
Channel transfer is to testing terminal；
(12) host computer passes the information such as the temperature controlling point theory collection voltages of institute's having heaters, heater button detecting state
Transport to test terminal；
(13) because using 8 bit quantization AD, theoretically the voltage deviation after AD quantization is up to 0.0196V, it is contemplated that electricity
Hinder the factors such as simulation precision, quantization, Δ QADIt is chosen to be 0.04V.Test terminal compares "+X interior plate block heater 1
Each circuit temperature-controlling point theory collection voltages V of master "I, 1、VI, 2With actual acquisition voltage V on starI, 1′、VI, 2', if | VI, 1-VI, 1′|
≤ΔQADAnd | VI, 2-VI, 2′|≤ΔQAD, then temperature simulation and acquisition function are normal, by above-mentioned steps it is found that error is respectively less than
ΔQAD, can be transferred in next step；
(15) test terminal compares the theoretical switch state S of "+X interior plate block heater 1 is main "i, switch state telemetering
Si' and switch detecting state Si", if Si=Si'=Si", then "+X interior plate block heater 1 is main " autonomous function of temperature control is normal,
By above-mentioned steps it is found that theoretical switch state Si, switch state telemetering Si' and switch detecting state Si" it is out, illustrates autonomous
Temperature control system passes through the test of the test case.Above-mentioned steps have sketched the specific mistake using this test method by a use-case
Journey, can software and hardware Product Status to autonomous temperature control system carry out closed loop verifying.
To sum up, present system proposes the autonomous temperature control system closed loop test method of spacecraft, specify that closed loop is surveyed
The relevant components of test system, system structure of the invention is simple and reliable, and stability is good, and test method is easy to operate, test effect
Well；The product test period can substantially be shortened, improve the progress of development, the reliability and testing efficiency of development is promoted, have
Significant technological progress.
Specific embodiments of the present invention are described above.It is to be appreciated that the invention is not limited to above-mentioned
Particular implementation, those skilled in the art can make a variety of changes or modify within the scope of the claims, this not shadow
Ring substantive content of the invention.In the absence of conflict, the feature in embodiments herein and embodiment can any phase
Mutually combination.
Claims (9)
1. a kind of autonomous temperature control system closed loop test system of spacecraft, which is characterized in that it is independently warm that the system comprises spacecrafts
Control system and closed loop test system；
The autonomous temperature control system of spacecraft includes telemetry-acquisition module, heater-driven module, processor module；
The telemetry-acquisition module acquires spacecraft temperature controlling point remote temperature sensing, and processor module is according to collected temperature controlling point temperature
With the temperature control requirement of heater, it is determined whether output heater button instruction；
The heater-driven module receive and execute heater button instruction, processor module simultaneously by temperature controlling point temperature, plus
The telemetering of hot device switch state, which passes through, reaches test terminal under observing and controlling channel；
The closed loop test system includes thermistor simulation board, heater-driven detection board, host computer, test terminal；
The thermistor analog board card Simulated Spacecraft temperature control dotted state is acquired for telemetry-acquisition module, and heater-driven detects board
The switch state of heater-driven module output is detected, PC control thermistor, which is simulated the output policy of board and received, to be added
The detection information of hot device driving detection board, receives boat body device telemetry intelligence (TELINT) and test system and test information, warp by test terminal
Output closed-loop test result is compared in analysis, and then completes closed loop test.
2. a kind of test method of the autonomous temperature control system closed loop test system of spacecraft as described in claim 1, feature exist
In including the following steps:
(1) host computer starts to test No. i-th heater HiAutonomous function of temperature control, HiTemperature controlling point be respectively Ti,1、Ti,2、…、
Ti,j、…、Ti,N, it is respectively R that each temperature controlling point, which requires the resistance value of setting,i,1、Ri,2、…、Ri,j、…、Ri,N；Wherein, j=1, L,
N, N are heater HiTemperature controlling point number；
(2) quantization circuit design is acquired according to telemetry-acquisition module temperature, host computer calculates the reason of resistance value set by temperature controlling point
It is respectively V by voltagei,1、VI, 2、…、VI, j、…、VI, N；
(3) according to heater HiTemperature controlling point theoretical voltage Vi,1、VI, 2、…、VI, j、…、VI, NWith heater temperature control strategy, host computer
Calculate theoretical temperature voltage Vi；
(4) according to heater HiTemperature control threshold value and temperature controlling point theoretical temperatures voltage Vi, host computer calculating heater HiTheoretical switch
State Si；
(5) temperature controlling point Ti,j, resistance value Ri,jWith theoretical collection voltages VI, jFor one-to-one relationship, by host computer by N number of temperature controlling point
Information and corresponding resistance value information export to thermistor and simulate board；
(6) thermistor simulates board according to the corresponding relationship of temperature controlling point and board output channel, while N number of temperature controlling point institute is arranged
The resistance value R of corresponding channeli,j；
(7) resistance value of telemetry-acquisition module acquisition thermistor simulation board setting, the formation temperature telemetering after AD quantifies
VI, 1′、VI, 2′、…、VI, j′、…、VI, N', and remote temperature sensing is transmitted to processor module；
(8) according to heater HiTemperature controlling point actual temperature telemetering VI, 1′、VI, 2′、…、VI, j′、…、VI, N' and heater temperature control plan
Slightly, processor module calculates actual temperature voltage Vi′；
(9) according to heater HiThe actual temperature voltage V of temperature control threshold value and temperature controlling pointi', processor module calculating determines whether out
Open or close No. i-th heater；
(10) it is turned on or off heater instruction to be executed by processor module sending, heater-driven module, heater-driven
Switch state telemetering is back to processor module, No. i-th heater H by moduleiSwitch state telemetering be Si′；
(11) heater-driven detection plate card wheel askes detection heater-driven module output state, and all heater buttons are examined
Measurement information is transmitted to host computer, No. i-th heater HiSwitch detecting state be Si″；
(12) processor module passes all collected remote temperature sensings, heater button status information by downlink telemetry channel
Transport to test terminal；
(13) the temperature controlling point theory collection voltages of institute's having heaters, heater button detecting state information are transmitted to survey by host computer
Try terminal；
(14) test terminal compares heater HiEach circuit temperature-controlling point theory collection voltages VI, jWith actual acquisition voltage on star
VI, j', if | VI, j-VI, j′|≤ΔQAD, then temperature simulation and acquisition function are normal, can be transferred in next step, otherwise check acquisition
Deviating cause, wherein Δ QADFor maximum deflection difference value；
(15) test terminal compares heater HiTheoretical switch state Si, switch state telemetering Si' and switch detecting state Si",
If Si=Si'=Si", then No. i-th heater HiAutonomous function of temperature control is normal, otherwise checks error reason；
(16) it repeats the above steps until completing the autonomous temperature control test of institute's having heaters.
3. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
Thermistor analog board card realizes the flexible setting of resistance value by programmable resistance in step (6).
4. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
Temperature control strategy uses single temperature spot temperature control in step (3) and (8), then theoretical temperatures voltage Vi=Vi,1, actual temperature voltage Vi'=
VI, 1′。
5. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
Temperature control strategy uses maximum temperature values temperature control in step (3) and (8), then theoretical temperatures voltage Vi=Max (VI, 1,VI, 2,L,
VI, N), actual temperature voltage Vi'=Max (VI, 1′,VI, 2′,L,VI, N′)。
6. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
Temperature control strategy uses minimum temperature value temperature control in step (3) and (8), then theoretical temperatures voltage Vi=Min (VI, 1,VI, 2,L,
VI, N), actual temperature voltage Vi'=Min (VI, 1′,VI, 2′,L,VI, N′)。
7. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
Temperature control strategy uses average temperature value temperature control in step (3) and (8), then theoretical temperatures voltageActual temperature voltage
8. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
Temperature control threshold value includes temperature control upper threshold V in step (4) and (9)i,maxWith temperature control bottom threshold Vi,min。
9. the test method of the autonomous temperature control system closed loop test system of spacecraft as claimed in claim 2, characterized in that described
In step (4) and (9), temperature is measured according to negative tempperature coefficient thermistor, temperature voltage is less than upper limit Vi,max, Guan Jiare
Device, temperature voltage are greater than lower limit Vi,min, open heater；For measuring temperature, temperature voltage using posive temperature coefficient thermistor
Greater than upper limit Vi,max, heater is closed, temperature voltage is less than lower limit Vi,min, open heater.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910290434.2A CN110018679B (en) | 2019-04-11 | 2019-04-11 | Closed-loop test system and test method for spacecraft autonomous temperature control system |
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