CN110011943B - Debugging method and device of electronic product debugging equipment - Google Patents
Debugging method and device of electronic product debugging equipment Download PDFInfo
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- CN110011943B CN110011943B CN201910211059.8A CN201910211059A CN110011943B CN 110011943 B CN110011943 B CN 110011943B CN 201910211059 A CN201910211059 A CN 201910211059A CN 110011943 B CN110011943 B CN 110011943B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/02—Transmitters
- H04B1/04—Circuits
- H04B1/0458—Arrangements for matching and coupling between power amplifier and antenna or between amplifying stages
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/06—Receivers
- H04B1/16—Circuits
- H04B1/18—Input circuits, e.g. for coupling to an antenna or a transmission line
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
- H04L25/0264—Arrangements for coupling to transmission lines
- H04L25/0278—Arrangements for impedance matching
Abstract
The application relates to a debugging method and device of electronic product debugging equipment, computer equipment and a storage medium. The method in one embodiment comprises: acquiring circuit parameters of a signal transceiving component, configuring circuit parameters of a first impedance matching circuit according to the circuit parameters of the signal transceiving component, acquiring circuit parameters of a control component, configuring circuit parameters of a second impedance matching circuit according to the circuit parameters of the control component, and detecting that a first impedance value at the side of the first impedance matching circuit and a second impedance value at the side of the second impedance matching circuit are not connected when the first impedance matching circuit and the second impedance matching circuit are not connected; when the first impedance value and the second impedance value are not equal to the preset threshold value, circuit parameters of the first impedance matching circuit and the second impedance matching circuit are adjusted until the first impedance value and the second impedance value are equal to the preset threshold value. The first impedance matching circuit and the second impedance matching circuit form a conjugate relation, so that the accuracy of impedance matching can be effectively improved.
Description
Technical Field
The present application relates to the field of radio frequency communications technologies, and in particular, to a method and an apparatus for debugging electronic product debugging equipment, a computer device, and a storage medium.
Background
The impedance matching is mainly used on a transmission line, so that the aim that all high-frequency microwave signals can be transmitted to a load point is fulfilled, and the energy benefit is improved. The signal source internal resistance is equal to the characteristic impedance of the connected transmission line in magnitude and same in phase, or the characteristic impedance of the transmission line is equal to the characteristic impedance of the connected load impedance in magnitude and same in phase, which is called that the input end or the output end of the transmission line is in an impedance matching state. Taking a bluetooth headset as an example, the bluetooth headset includes a Central Processing Unit (CPU) chip, a bluetooth antenna, and an antenna matching circuit disposed between the CPU chip and the bluetooth antenna.
In the traditional impedance matching method, a network analyzer is adopted to measure the impedance value, the resonant frequency and other parameters of a chip end and an antenna end respectively, and then a proper matching circuit is selected to match the impedance of the antenna end to the conjugate position of the impedance of the chip end so as to realize the maximum power transmission of signals. However, this is limited to theoretical calculations, and in practice the port impedance of the network analyzer is a standard 50 ohm when tuning the impedance match. The impedance value and the resonant frequency measured after the antenna end passes through the matching circuit are calculated by taking 50 ohms as reference, if the impedance of the chip end is not equal to 50 ohms, impedance matching cannot be realized, so that the maximum power transmission of signals cannot be realized, namely the traditional impedance matching method has the problem of low impedance matching accuracy.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a method and an apparatus for debugging an electronic product debugging device, a computer device, and a storage medium, which can improve matching accuracy.
A debugging method of electronic product debugging equipment comprises a first impedance matching circuit and a second impedance matching circuit, wherein the first impedance matching circuit is connected with a signal transceiving component in an electronic product to be debugged, and the second impedance matching circuit is connected with a control component in the electronic product to be debugged;
the debugging method comprises the following steps:
acquiring circuit parameters of the signal transceiving component, and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component;
obtaining circuit parameters of the control assembly, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control assembly;
detecting a first impedance value at a first impedance matching circuit side and a second impedance value at a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected;
when the first impedance value and the second impedance value are not equal to a preset threshold value, adjusting circuit parameters of the first impedance matching circuit and the second impedance matching circuit until the first impedance value and the second impedance value are equal to the preset threshold value.
In one embodiment, the obtaining of the circuit parameter of the signal transceiving component and the configuring of the circuit parameter of the first impedance matching circuit according to the circuit parameter of the signal transceiving component include:
acquiring an impedance value of the signal transceiving component when the signal transceiving component is not connected with the control component;
configuring circuit parameters of the first impedance matching circuit according to the impedance value of the signal transceiving component;
the obtaining of the circuit parameter of the control component and the configuring of the circuit parameter of the second impedance matching circuit according to the circuit parameter of the control component include:
acquiring an impedance value of the control assembly when the signal transceiving assembly is not connected with the control assembly;
and configuring circuit parameters of the second impedance matching circuit according to the impedance value of the control component.
In one embodiment, the electronic product to be debugged is connected with an external test instrument through a test point, and the test point is arranged between the first impedance matching circuit and the second impedance matching circuit;
the detecting a first impedance value at a first impedance matching circuit side and a second impedance value at a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected includes:
detecting, by the external test instrument at the test point, a first impedance value on a first impedance matching circuit side and a second impedance value on a second impedance matching circuit side when the first impedance matching is not connected to the second impedance matching circuit.
In one embodiment, the method further comprises:
controlling the electronic product to be debugged to establish wireless communication with external equipment, and acquiring the sensitivity corresponding to each frequency of the electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency through the external equipment;
when the sensitivity increases with the increase of the frequency, adjusting the circuit parameters of the first impedance matching circuit so that the sensitivity presents a lowest value with the increase of the frequency, and the lowest value is equal to a preset value, wherein the preset value is a median value of an interval between the preset lower limit frequency and the preset upper limit frequency.
In an embodiment, after the obtaining, by the external device, the sensitivities corresponding to the frequencies of the electronic product to be debugged between the preset lower limit frequency and the preset upper limit frequency, the method further includes:
when the sensitivity decreases with the increase of the frequency, adjusting the circuit parameters of the first impedance matching circuit to make the sensitivity exhibit a lowest value with the increase of the frequency, wherein the lowest value is equal to a preset value, and the preset value is a median value of an interval between the preset lower limit frequency and the preset upper limit frequency.
In an embodiment, after the obtaining, by the external device, the sensitivities corresponding to the frequencies of the electronic product to be debugged between the preset lower limit frequency and the preset upper limit frequency, the method further includes:
and when the sensitivity shows a lowest value along with the increase of the frequency and the lowest value is smaller than the preset value, adjusting the circuit parameters of the first impedance matching circuit to enable the resonant frequency value of the first impedance matching circuit to be increased so as to update the lowest value until the updated lowest value is equal to the preset value, wherein the preset value is the median value of the interval between the preset lower limit frequency and the preset upper limit frequency.
In an embodiment, after the obtaining, by the external device, the sensitivities corresponding to the frequencies of the electronic product to be debugged between the preset lower limit frequency and the preset upper limit frequency, the method further includes:
when the sensitivity shows a lowest value along with the increase of the frequency and the lowest value is larger than the preset value, adjusting the circuit parameters of the first impedance matching circuit to reduce the resonant frequency value of the first impedance matching circuit so as to update the lowest value until the updated lowest value is equal to the preset value, wherein the preset value is the median value of the interval between the preset lower limit frequency and the preset upper limit frequency.
A debugging device of electronic product debugging equipment comprises a first impedance matching circuit and a second impedance matching circuit, wherein the first impedance matching circuit is connected with a signal receiving and transmitting component in an electronic product to be debugged, and the second impedance matching circuit is connected with a control component in the electronic product to be debugged;
the debugging device comprises:
the first matching circuit configuration module is used for acquiring the circuit parameters of the signal transceiving component and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component;
the second matching circuit configuration module is used for acquiring the circuit parameters of the control component and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control component;
a detection module for detecting a first impedance value on a first impedance matching circuit side and a second impedance value on a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected;
and the impedance value adjusting module is used for adjusting the circuit parameters of the first impedance matching circuit and the second impedance matching circuit when the first impedance value and the second impedance value are not equal to a preset threshold value until the first impedance value and the second impedance value are equal to the preset threshold value.
A computer device comprising a memory and a processor, the memory storing a computer program, the processor implementing the following steps when executing the computer program:
acquiring circuit parameters of the signal transceiving component, and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component;
obtaining circuit parameters of the control assembly, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control assembly;
detecting a first impedance value at a first impedance matching circuit side and a second impedance value at a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected;
when the first impedance value and the second impedance value are not equal to a preset threshold value, adjusting circuit parameters of the first impedance matching circuit and the second impedance matching circuit until the first impedance value and the second impedance value are equal to the preset threshold value.
A computer-readable storage medium, on which a computer program is stored which, when executed by a processor, carries out the steps of:
acquiring circuit parameters of the signal transceiving component, and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component;
obtaining circuit parameters of the control assembly, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control assembly;
detecting a first impedance value at a first impedance matching circuit side and a second impedance value at a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected;
when the first impedance value and the second impedance value are not equal to a preset threshold value, adjusting circuit parameters of the first impedance matching circuit and the second impedance matching circuit until the first impedance value and the second impedance value are equal to the preset threshold value.
The electronic product debugging equipment comprises a first impedance matching circuit and a second impedance matching circuit, wherein the first impedance matching circuit is connected with a signal transceiving component in the electronic product to be debugged, the second impedance matching circuit is connected with a control component in the electronic product to be debugged, circuit parameters of the signal transceiving component are obtained, circuit parameters of the first impedance matching circuit are configured according to the circuit parameters of the signal transceiving component, circuit parameters of the control component are obtained, circuit parameters of the second impedance matching circuit are configured according to the circuit parameters of the control component, and when the first impedance matching circuit is not connected with the second impedance matching circuit, a first impedance value at the side of the first impedance matching circuit and a second impedance value at the side of the second impedance matching circuit are detected; when the first impedance value and the second impedance value are not equal to the preset threshold value, circuit parameters of the first impedance matching circuit and the second impedance matching circuit are adjusted until the first impedance value and the second impedance value are equal to the preset threshold value, a conjugate relation is formed between the first impedance matching circuit and the second impedance matching circuit, the first impedance value and the second impedance value are adjusted to the preset threshold value, and then impedance matching can be achieved, so that the accuracy of impedance matching can be effectively improved.
Drawings
FIG. 1 is a flow chart illustrating a method for debugging electronic product debugging equipment in one embodiment;
FIG. 2 is a flow diagram illustrating the circuit parameter configuration steps of the impedance matching circuit in one embodiment;
FIG. 3 is a schematic flow chart of the steps of adjusting the impedance matching circuit in one embodiment;
FIG. 4 is a diagram illustrating hardware configuration testing for initial circuit parameter acquisition of a matching circuit in one embodiment;
FIG. 5 is a diagram illustrating a hardware configuration of an impedance matching circuit according to an embodiment;
FIG. 6 is a diagram illustrating hardware configuration testing for port impedance acquisition in one embodiment;
FIG. 7 is a hardware diagram of an electronic product to be debugged in another embodiment;
FIG. 8 is a graph of sensitivity versus frequency for different conditions in one embodiment;
FIG. 9 is a block diagram showing the configuration of a debugging unit of the electronic product debugging apparatus according to one embodiment;
FIG. 10 is a diagram showing an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In one embodiment, as shown in fig. 1, there is provided a debugging method of an electronic product debugging device, including the steps of:
and 102, acquiring circuit parameters of the signal transceiving component, and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component.
The signal transceiving component is used for transmitting and receiving electromagnetic wave energy in an electronic product, specifically, the signal transceiving component can be an antenna, and the circuit parameter of the signal transceiving component can be an impedance value and a resonant frequency value of an antenna end in the electronic product.
And 104, acquiring circuit parameters of the control assembly, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control assembly.
The control component is used in an electronic product to implement each function of the electronic product, for example, in a bluetooth headset, the control chip may specifically be a bluetooth control chip, and the circuit parameter of the control component may be an impedance value and a resonant frequency value of a control chip end in the electronic product. The first impedance matching circuit and the second impedance matching circuit can select an L-type impedance matching circuit, a T-type impedance matching circuit or a pi-type impedance matching circuit according to circuit parameters of the signal transceiving component and the control component.
Step 106, detecting a first impedance value at the first impedance matching circuit side and a second impedance value at the second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected.
For example, a test point may be set between the first impedance circuit and the second impedance circuit, the test point is connected to the tester, a circuit on the left side of the test point, that is, the control component and the second impedance matching circuit are disconnected, and the impedance value of the signal transceiving component + the first impedance matching circuit is tested by the tester; and disconnecting the circuit on the right side of the test point, namely disconnecting the antenna and the first impedance matching circuit, and testing the impedance value of the control component and the second impedance matching circuit through the tester.
In one embodiment, the electronic product to be debugged is connected with an external test instrument through a test point, and the test point is arranged between the first impedance matching circuit and the second impedance matching circuit; detecting a first impedance value of the first impedance matching circuit and a second impedance value of the second impedance matching circuit when the first impedance matching circuit is not connected to the second impedance matching circuit, comprising: when the first impedance matching circuit and the second impedance matching circuit are not connected, a first impedance value on the side of the first impedance matching circuit and a second impedance value on the side of the second impedance matching circuit are detected at a test point by an external test instrument.
And 108, when the first impedance value and the second impedance value are not equal to the preset threshold value, adjusting circuit parameters of the first impedance matching circuit and the second impedance matching circuit until the first impedance value and the second impedance value are equal to the preset threshold value.
The first impedance matching circuit is used for adjusting the impedance of the antenna end to a preset threshold value, and the second impedance matching circuit is used for adjusting the impedance of the chip end to the preset threshold value.
The debugging method of the electronic product debugging equipment comprises the steps that the electronic product debugging equipment comprises a first impedance matching circuit and a second impedance matching circuit, the first impedance matching circuit is connected with a signal transceiving component in an electronic product to be debugged, the second impedance matching circuit is connected with a control component in the electronic product to be debugged, circuit parameters of the signal transceiving component are obtained, the circuit parameters of the first impedance matching circuit are configured according to the circuit parameters of the signal transceiving component, the circuit parameters of the control component are obtained, the circuit parameters of the second impedance matching circuit are configured according to the circuit parameters of the control component, and when the first impedance matching circuit is not connected with the second impedance matching circuit, the first impedance value of the first impedance matching circuit side and the second impedance value of the second impedance matching circuit side are detected; when the first impedance value and the second impedance value are not equal to the preset threshold value, circuit parameters of the first impedance matching circuit and the second impedance matching circuit are adjusted until the first impedance value and the second impedance value are equal to the preset threshold value, a conjugate relation is formed between the first impedance matching circuit and the second impedance matching circuit, the first impedance value and the second impedance value are adjusted to the preset threshold value, and then impedance matching can be achieved, so that the accuracy of impedance matching can be effectively improved.
In one embodiment, as shown in fig. 2, acquiring circuit parameters of the signal transceiver component, and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiver component includes: step 202, acquiring an impedance value of the signal transceiving component when the signal transceiving component is not connected with the control component; step 204, configuring circuit parameters of the first impedance matching circuit according to the impedance value of the signal transceiving component. Obtaining circuit parameters of the control component, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control component, wherein the circuit parameters comprise: step 206, acquiring an impedance value of the control assembly when the signal transceiving assembly is not connected with the control assembly; step 208, configuring circuit parameters of the second impedance matching circuit according to the impedance value of the control component. In an electronic product, a chip is directly connected with an antenna, and a test point between the chip and the antenna is connected with a tester. Disconnecting the chip end, and testing the impedance value of the antenna through a tester; and disconnecting the antenna end, and testing the impedance value of the chip end through the tester.
In one embodiment, as shown in fig. 3, the debugging method of the electronic product debugging device further includes: step 302, controlling the electronic product to be debugged to establish wireless communication with external equipment, and acquiring the sensitivity of the electronic product to be debugged corresponding to each frequency between a preset lower limit frequency and a preset upper limit frequency through the external equipment; step 304, when the sensitivity increases with the increase of the frequency, adjusting the circuit parameters of the first impedance matching circuit to make the sensitivity exhibit the lowest value with the increase of the frequency, and the lowest value is equal to a preset value, and the preset value is the median value of the interval between the preset lower limit frequency and the preset upper limit frequency. The electronic product is worn on the human body model, the electronic product is wirelessly connected with the tester, and the wireless transceiving performance, such as sensitivity, of the electronic product is tested through the tester. And recording the sensitivity value corresponding to each frequency value of the electronic product at 2.402GHz-2.48GHz by the tester. When the sensitivity value increases along with the increase of the frequency value, the resonance frequency value corresponding to the electronic product is less than 2.402GHz, namely the resonance frequency value of the electronic product is not in a communication channel, the first impedance matching circuit is debugged, and the resonance frequency value 1 is changed, so that the performance of the electronic product is optimal in a human body model test. The first impedance matching circuit is adjusted to increase the resonant frequency value 1, and the resonant frequency value 1 is increased to cause the resonant frequency value 2 corresponding to the lowest value to be increased. And (3) performing wireless test in the same environment, and repeating the iteration for a few times to enable the resonant frequency value 2 to fall within the frequency band of 2.402GHz-2.48GHz and to be approximately equal to 2.441GHz optimally.
In one embodiment, after obtaining, by an external device, sensitivities corresponding to frequencies of an electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency, the method further includes: when the sensitivity is reduced along with the increase of the frequency, the circuit parameters of the first impedance matching circuit are adjusted to enable the sensitivity to present a lowest value along with the increase of the frequency, the lowest value is equal to a preset value, and the preset value is a median value of a preset lower limit frequency and a preset upper limit frequency interval. When the sensitivity value decreases with the increase of the frequency value, it indicates that the resonant frequency value corresponding to the electronic product is greater than 2.48GHz, i.e. the resonant frequency value of the electronic product is not in the communication channel. The first impedance matching circuit is adjusted to reduce the resonant frequency value 1, and the reduction of the resonant frequency value 1 causes the reduction of the resonant frequency value 2 corresponding to the lowest value. And (3) performing wireless test in the same environment, and repeating the iteration for a few times to enable the resonant frequency value 2 to fall within the frequency band of 2.402-2.48 GHz and to be equal to 2.441GHz optimally.
In one embodiment, after obtaining, by an external device, sensitivities corresponding to frequencies of an electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency, the method further includes: when the sensitivity shows a lowest value along with the increase of the frequency and the lowest value is smaller than a preset value, adjusting circuit parameters of the first impedance matching circuit to enable the resonant frequency value of the first impedance matching circuit to be increased so as to update the lowest value until the updated lowest value is equal to the preset value, wherein the preset value is a median value between a preset lower limit frequency and a preset upper limit frequency. When the sensitivity value has a lowest value in the frequency channel, it indicates that the resonant frequency value of the electronic product is in the frequency channel range, and then determines the relationship between the resonant frequency value and 2.441GHz, and when the resonant frequency value is less than 2.441GHz, the first impedance matching circuit is adjusted to increase the resonant frequency value 1, and the resonant frequency value 1 is increased to cause the resonant frequency value 2 corresponding to the lowest value to be increased. And (3) performing wireless test in the same environment, and repeating the iteration for a few times to enable the resonant frequency value 2 to fall within the frequency band of 2.402GHz-2.48GHz and to be approximately equal to 2.441GHz optimally.
In one embodiment, after obtaining, by an external device, sensitivities corresponding to frequencies of an electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency, the method further includes: when the sensitivity shows a lowest value along with the increase of the frequency and the lowest value is larger than a preset value, adjusting circuit parameters of the first impedance matching circuit to reduce the resonant frequency value of the first impedance matching circuit so as to update the lowest value until the updated lowest value is equal to the preset value, wherein the preset value is a median value between a preset lower limit frequency and a preset upper limit frequency. When the sensitivity value has a lowest value in the frequency channel, it indicates that the resonant frequency value of the electronic product is in the frequency channel range, and then determines the relationship between the resonant frequency value and 2.441GHz, and when the resonant frequency value is greater than 2.441GHz, the first impedance matching circuit is adjusted to reduce the resonant frequency value 1, and the reduction of the resonant frequency value 1 causes the reduction of the resonant frequency value 2 corresponding to the lowest value. And (3) performing wireless test in the same environment, and repeating the iteration for a few times to enable the resonant frequency value 2 to fall within the frequency band of 2.402-2.48 GHz and to be equal to 2.441GHz optimally.
In one embodiment, in the application of the radio frequency wireless field, a chip needs to carry an antenna to propagate a signal, a chip end is a source end, an antenna end is a load end, the signal is transmitted from the source end to the load end through a transmission line, wherein one part of the signal is reflected, one part of the signal is lost, and the rest of the signal is transmitted to the load end. In order to effectively transmit signals, impedance matching is required between ports so as to effectively transmit signals, and therefore an impedance matching circuit is very necessary between a chip and an antenna. The common types of matching circuits include L-type, pi-type, T-type, microstrip lines, etc., and the purpose of the matching circuits is to make the chip end impedance and the antenna end impedance conjugate with each other, so as to reduce signal reflection and realize maximum power transmission. In addition, the transmission line needs to be as short as possible, and the impedance on the transmission line should be equal to the impedance of the load end, so as to prevent the signal from being lost and realize high-efficiency transmission.
The impedance matching method can adopt a network analyzer to respectively measure the impedance value, the resonant frequency and other parameters of the chip end and the antenna end, and then select a proper matching circuit to match the impedance of the antenna end to the conjugate position of the impedance of the chip end, thereby realizing the maximum power transmission of signals. However, this is limited to theoretical calculation, and actually, when the impedance matching is debugged, the port impedance of the network analyzer is 50 ohms, so that the impedance value and the resonant frequency measured after the antenna end passes through the matching circuit are calculated with 50 ohms as a reference. If the chip end impedance is not equal to 50 ohms, the signal cannot realize maximum power transmission. In addition, the impedance of the antenna end is easily affected by the bluetooth chip assembling machine, human body radiation and the like, in other words, only end-to-end conjugate matching is adopted, and the actual effect of the electronic product is difficult to evaluate, for example, whether the effect of the actual bluetooth headset worn on the ear of a person is optimal or not and the impedance matching accuracy is not high, so that the product competitiveness is reduced. In summary, the impedance matching method cannot form a certain 50 ohm impedance value at the test point, and cannot achieve the best debugging effect in the human body model test.
The debugging method of the electronic product debugging equipment comprises the following steps: in the first step, as shown in fig. 4, in the electronic product (1), the chip (101) is directly connected to the antenna (104), and the test point G between the chip and the antenna is connected to the tester 1. Disconnecting the chip end, and testing the impedance value 1 of the antenna through the tester 1; the antenna end is disconnected and the chip end impedance value 2 is tested by the tester 1.
Secondly, as shown in fig. 5, setting an impedance matching circuit 1 with corresponding parameters according to the impedance value 1 obtained by testing; and setting an impedance matching circuit 2 with corresponding parameters according to the impedance value 2 obtained by testing. The structures of the impedance matching circuit 1 and the impedance matching circuit 2 include, but are not limited to: l-type, T-type and pi-type. The impedance matching circuit 1 functions to adjust the impedance of the antenna terminal to 50 ohms, and the impedance matching circuit 2 functions to adjust the impedance of the chip terminal to 50 ohms. Thirdly, as shown in fig. 6, the test point G is connected to the tester 1 again, the circuit on the left side of the test point G is disconnected, and the impedance value 3 of the antenna + the impedance matching circuit 1 is tested by the tester 1; and disconnecting the circuit on the right side of the test point G, and testing the impedance value 4 of the chip + the impedance matching circuit 2 through the tester 1. Judging whether the impedance value 3 and the impedance value 4 are 50 ohms or not, if the impedance value 3 and the impedance value 4 are not 50 ohms, debugging the impedance matching circuit 1 and the impedance matching circuit 2, finally enabling the tested impedance value 3 and the tested impedance value 4 to be 50 ohms and obtaining the resonant frequency value 1 of the impedance matching circuit 1 at the moment.
Fourthly, as shown in fig. 7, the electronic product (1) is worn on the human body model in the shielding room, so that the electronic product (1) is wirelessly connected with the tester 2, and the wireless transceiving performance, such as sensitivity, of the electronic product (1) is tested by the tester 2. And recording a sensitivity value corresponding to each frequency value of the electronic product (1) at 2.402GHz-2.48GHz by the tester 2.
Fifthly, according to the arrangement relation of the sensitivity values, the following three conditions exist:
the first condition is as follows: as shown in fig. 8(a), when the sensitivity value increases with the increase of the frequency value, it indicates that the resonant frequency value corresponding to the electronic product (1) is less than 2.402 GHz;
case two: as shown in fig. 8(b), when the sensitivity value decreases with the increase of the frequency value, it indicates that the resonant frequency value corresponding to the electronic product (1) is greater than 2.48 GHz; the first case and the second case indicate that the resonant frequency value of the electronic product is not in the communication channel.
Case three: as shown in fig. 8(c), when the sensitivity value has a lowest value in the frequency channel, it indicates that the resonant frequency value of the electronic product (1) is in the frequency channel range, and the lowest value corresponds to the resonant frequency value 2. Then judging whether the resonant frequency value 2 is more than 2.441GHz or less than 2.441 GHz; case two can be classified if the resonant frequency value 2 is greater than 2.441GHz, and case one can be classified if the resonant frequency value 2 is less than 2.441 GHz.
And sixthly, debugging the impedance matching circuit 1 according to the first condition or the second condition, and adjusting the impedance value of the impedance matching circuit 1 by the method in the third step so as to change the resonant frequency value 1, wherein the change of the resonant frequency value 1 drives the change of the resonant frequency value 2, so that the performance of the electronic product (1) is optimal in the human body model test. The specific debugging method comprises the following steps: the first condition is as follows: it is indicated that the resonant frequency value is relatively low, and the impedance matching circuit 1 needs to be adjusted to reduce the impedance value thereof, so that the resonant frequency value 1 is increased, the resonant frequency value 2 is driven to be increased, and finally the resonant frequency value 2 is equal to 2.441 GHz. And (3) performing wireless test in the same environment, and repeating the iteration for a few times, such as 1-3 times, so that the resonant frequency value is within the frequency band of 2.402GHz-2.48GHz and is approximately equal to 2.441GHz optimally. In the second case, it is indicated that the resonant frequency value is higher, the impedance matching circuit 1 needs to be adjusted to increase the impedance value thereof, so that the resonant frequency value 1 is reduced, the resonant frequency value 2 is reduced, and finally the resonant frequency value 2 is equal to 2.441 GHz. And (3) performing wireless test in the same environment, and repeating the iteration for a few times, such as 1-3 times, so that the resonant frequency value is within a frequency band of 2.402-2.48 GHz and is approximately equal to 2.441GHz optimally. And thirdly, the resonant frequency value is shown to be proper in position, the impedance matching circuit 1 is finely adjusted as required, and wireless test is carried out under the same environment, so that the resonant frequency value is approximately equal to 2.441 GHz.
The impedance matching circuit 1 and the impedance matching circuit 2 form a conjugate relation, and 50 ohms required by a network test port is achieved. When the wireless test of the human body model is carried out, the impedance value of the impedance matching circuit 1 is adjusted to minimize the loss between the antenna and the chip. The impedance value and the resonant frequency value of the antenna + matching circuit 1 measured by the tester 1 are calculated by taking the port impedance (namely 50 ohms) of the tester 1 as a reference, so that the impedance value of the chip end is adjusted to 50 ohms through the matching circuit 2, and the test data of the tester 1 can visually reflect the actual use effect of the electronic product (1). The impedance value of the antenna end is easy to change due to interference of human body radiation and the like, and the resonant frequency value of the antenna end is also changed, so that the actual use performance of the electronic product (1) is poor, and the problem can be solved through the fifth step and the sixth step. The chip end and the antenna end have impedances of 50 ohms, and are aligned with the impedance of a port of a related instrument in the industry, so that the combination of test and actual use is realized; the testing method can improve the influence of human bodies on electronic products, so that the actual using effect is optimal.
The debugging method can be manually completed by a person or automatically completed by a controller. For example, the electronic product to be debugged comprises a signal transceiving component and a control component, the electronic product debugging device comprises a first impedance matching circuit, a second impedance matching circuit and a controller, the first impedance matching circuit is respectively connected with the signal transceiving component and the controller in the electronic product to be debugged, and the second impedance matching circuit is respectively connected with the control component and the controller in the electronic product to be debugged; the controller acquires circuit parameters of the signal transceiving component and configures the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component; obtaining circuit parameters of the control assembly, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control assembly; detecting a first impedance value on a first impedance matching circuit side and a second impedance value on a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected; when the first impedance value and the second impedance value are not equal to the preset threshold value, circuit parameters of the first impedance matching circuit and the second impedance matching circuit are adjusted until the first impedance value and the second impedance value are equal to the preset threshold value.
It should be understood that although the various steps in the flow charts of fig. 1-3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-3 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternating with other steps or at least some of the sub-steps or stages of other steps.
In one embodiment, as shown in fig. 9, there is provided a debugging apparatus of an electronic product debugging device, including: a first matching circuit configuration module 902, a second matching circuit configuration module 904, a detection module 906, and an impedance value adjustment module 908. The first matching circuit configuration module is used for acquiring circuit parameters of the signal transceiving component and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component. And the second matching circuit configuration module is used for acquiring the circuit parameters of the control component and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control component. The detection module is used for detecting a first impedance value at the first impedance matching circuit side and a second impedance value at the second impedance matching circuit side when the first impedance matching circuit is not connected with the second impedance matching circuit. And the impedance value adjusting module is used for adjusting the circuit parameters of the first impedance matching circuit and the second impedance matching circuit when the first impedance value and the second impedance value are not equal to the preset threshold value until the first impedance value and the second impedance value are equal to the preset threshold value.
In one embodiment, the first matching circuit configuration module is further configured to obtain an impedance value of the signal transceiving component when the signal transceiving component is not connected to the control component, and configure a circuit parameter of the first impedance matching circuit according to the impedance value of the signal transceiving component; the second matching circuit configuration module is further used for acquiring the impedance value of the control component when the signal transceiving component is not connected with the control component, and configuring the circuit parameters of the second impedance matching circuit according to the impedance value of the control component.
In one embodiment, the electronic product to be debugged is connected to an external test instrument through a test point, the test point is disposed between the first impedance matching circuit and the second impedance matching circuit, and the detection module is further configured to detect, through the external test instrument at the test point, a first impedance value of the first impedance matching circuit and a second impedance value of the second impedance matching circuit when the first impedance matching circuit and the second impedance matching circuit are not connected.
In one embodiment, the debugging device of the electronic product debugging equipment further comprises a sensitivity acquisition module, which is used for controlling the electronic product to be debugged to establish wireless communication with external equipment, and acquiring the sensitivity of the electronic product to be debugged corresponding to each frequency between a preset lower limit frequency and a preset upper limit frequency through the external equipment; the first adjusting module is used for adjusting circuit parameters of the first impedance matching circuit when the sensitivity increases along with the increase of the frequency, so that the resonant frequency value of the first impedance matching circuit is increased until the resonant frequency value is equal to a preset value, and the preset value is a median value of a preset lower limit frequency and a preset upper limit frequency interval.
In an embodiment, the sensitivity obtaining module further includes a second debugging module, configured to, when the sensitivity decreases with an increase in frequency, adjust a circuit parameter of the first impedance matching circuit so as to decrease a resonant frequency value of the first impedance matching circuit until the resonant frequency value is equal to a preset value, where the preset value is a median between a preset lower limit frequency and a preset upper limit frequency.
In an embodiment, the sensitivity obtaining module further includes a third debugging module, after the sensitivity obtaining module, configured to adjust a circuit parameter of the first impedance matching circuit when the sensitivity shows a lowest value along with an increase of the frequency, and the lowest value is smaller than a preset value, so as to increase a resonant frequency value of the first impedance matching circuit until the resonant frequency value is equal to the preset value, where the preset value is a median between a preset lower limit frequency and a preset upper limit frequency.
In an embodiment, the sensitivity obtaining module further includes a fourth debugging module, configured to, when the sensitivity shows a lowest value along with an increase of the frequency, and the lowest value is greater than a preset value, adjust a circuit parameter of the first impedance matching circuit, so as to decrease a resonant frequency value of the first impedance matching circuit until the resonant frequency value is equal to the preset value, where the preset value is a median between a preset lower limit frequency and a preset upper limit frequency.
For specific limitations of the debugging apparatus of the electronic product debugging device, reference may be made to the above limitations of the debugging method of the electronic product debugging device, and details are not repeated here. All or part of each module in the debugging device of the electronic product debugging equipment can be realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 10. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a debugging method of an electronic product debugging device. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 10 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory storing a computer program and a processor implementing the steps of the debugging method of the electronic product debugging device in any of the embodiments when the processor executes the computer program.
In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, which, when being executed by a processor, realizes the steps of the debugging method of the electronic product debugging device in any of the embodiments.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. The debugging method of the electronic product debugging equipment is characterized in that the electronic product debugging equipment comprises a first impedance matching circuit and a second impedance matching circuit, wherein the first impedance matching circuit is connected with a signal transceiving component in an electronic product to be debugged, and the second impedance matching circuit is connected with a control component in the electronic product to be debugged;
the debugging method comprises the following steps:
acquiring circuit parameters of the signal transceiving component, and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component;
obtaining circuit parameters of the control assembly, and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control assembly;
detecting a first impedance value at a first impedance matching circuit side and a second impedance value at a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected;
when the first impedance value and the second impedance value are not equal to a preset threshold value, adjusting circuit parameters of the first impedance matching circuit and the second impedance matching circuit until the first impedance value and the second impedance value are equal to the preset threshold value;
controlling the electronic product to be debugged to establish wireless communication with external equipment, and acquiring the sensitivity corresponding to each frequency of the electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency through the external equipment;
when the sensitivity increases with the increase of the frequency, adjusting the circuit parameters of the first impedance matching circuit so that the sensitivity presents a lowest value with the increase of the frequency, and the lowest value is equal to a preset value, wherein the preset value is a median value of an interval between the preset lower limit frequency and the preset upper limit frequency.
2. The method of claim 1, wherein the obtaining circuit parameters of the signal transceiver component and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiver component comprises:
acquiring an impedance value of the signal transceiving component when the signal transceiving component is not connected with the control component;
configuring circuit parameters of the first impedance matching circuit according to the impedance value of the signal transceiving component;
the obtaining of the circuit parameter of the control component and the configuring of the circuit parameter of the second impedance matching circuit according to the circuit parameter of the control component include:
acquiring an impedance value of the control assembly when the signal transceiving assembly is not connected with the control assembly;
and configuring circuit parameters of the second impedance matching circuit according to the impedance value of the control component.
3. The method of claim 1, wherein the electronic product to be debugged is connected to an external test instrument through a test point disposed between the first impedance matching circuit and the second impedance matching circuit;
the detecting a first impedance value at a first impedance matching circuit side and a second impedance value at a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected includes:
detecting, by the external test instrument at the test point, a first impedance value on a first impedance matching circuit side and a second impedance value on a second impedance matching circuit side when the first impedance matching is not connected to the second impedance matching circuit.
4. The method according to claim 1, wherein the obtaining, by the external device, the sensitivity of the electronic product to be debugged corresponding to each frequency between a preset lower limit frequency and a preset upper limit frequency comprises:
and recording the sensitivity of the electronic product to be debugged at each frequency value of 2.402GHz-2.48GHz by using a tester.
5. The method according to claim 4, wherein after the obtaining, by the external device, the sensitivity corresponding to each frequency of the electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency, the method further comprises:
when the sensitivity decreases with the increase of the frequency, adjusting the circuit parameters of the first impedance matching circuit to make the sensitivity exhibit a lowest value with the increase of the frequency, wherein the lowest value is equal to a preset value, and the preset value is a median value of an interval between the preset lower limit frequency and the preset upper limit frequency.
6. The method according to claim 4, wherein after the obtaining, by the external device, the sensitivity corresponding to each frequency of the electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency, the method further comprises:
and when the sensitivity shows a lowest value along with the increase of the frequency and the lowest value is smaller than the preset value, adjusting the circuit parameters of the first impedance matching circuit to enable the resonant frequency value of the first impedance matching circuit to be increased so as to update the lowest value until the updated lowest value is equal to the preset value, wherein the preset value is the median value of the interval between the preset lower limit frequency and the preset upper limit frequency.
7. The method according to claim 4, wherein after the obtaining, by the external device, the sensitivity corresponding to each frequency of the electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency, the method further comprises:
when the sensitivity shows a lowest value along with the increase of the frequency and the lowest value is larger than the preset value, adjusting the circuit parameters of the first impedance matching circuit to reduce the resonant frequency value of the first impedance matching circuit so as to update the lowest value until the updated lowest value is equal to the preset value, wherein the preset value is the median value of the interval between the preset lower limit frequency and the preset upper limit frequency.
8. A debugging device of electronic product debugging equipment is characterized in that the electronic product debugging equipment comprises a first impedance matching circuit and a second impedance matching circuit, wherein the first impedance matching circuit is connected with a signal transceiving component in an electronic product to be debugged, and the second impedance matching circuit is connected with a control component in the electronic product to be debugged;
the debugging device comprises:
the first matching circuit configuration module is used for acquiring the circuit parameters of the signal transceiving component and configuring the circuit parameters of the first impedance matching circuit according to the circuit parameters of the signal transceiving component;
the second matching circuit configuration module is used for acquiring the circuit parameters of the control component and configuring the circuit parameters of the second impedance matching circuit according to the circuit parameters of the control component;
a detection module for detecting a first impedance value on a first impedance matching circuit side and a second impedance value on a second impedance matching circuit side when the first impedance matching circuit and the second impedance matching circuit are not connected;
the impedance value adjusting module is used for adjusting circuit parameters of the first impedance matching circuit and the second impedance matching circuit when the first impedance value and the second impedance value are not equal to a preset threshold value until the first impedance value and the second impedance value are equal to the preset threshold value;
the sensitivity acquisition module is used for controlling the electronic product to be debugged to establish wireless communication with external equipment, and acquiring the sensitivity corresponding to each frequency of the electronic product to be debugged between a preset lower limit frequency and a preset upper limit frequency through the external equipment; when the sensitivity increases with the increase of the frequency, adjusting the circuit parameters of the first impedance matching circuit so that the sensitivity presents a lowest value with the increase of the frequency, and the lowest value is equal to a preset value, wherein the preset value is a median value of an interval between the preset lower limit frequency and the preset upper limit frequency.
9. A computer device comprising a memory and a processor, the memory storing a computer program, wherein the processor implements the steps of the method of any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 7.
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| KR101305597B1 (en) * | 2011-08-08 | 2013-09-09 | 엘지이노텍 주식회사 | Impedance matching apparatus and method |
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| JP5787093B2 (en) * | 2012-02-06 | 2015-09-30 | 横河電機株式会社 | Control circuit, impedance adjustment circuit, automatic impedance adjustment circuit, signal level adjustment circuit, wireless transmission / reception circuit, wireless transmission / reception automatic adjustment circuit, chip, control method, impedance adjustment method, impedance automatic adjustment method, signal level adjustment method, wireless transmission / reception method and Wireless transmission and reception automatic adjustment method |
| CN103337717B (en) * | 2013-06-25 | 2015-07-08 | 华为技术有限公司 | Antenna impedance matching device, semi-conductor chip and antenna impedance matching method |
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