CN109962117B - 一种多重响应波段的半导体探测器 - Google Patents
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Abstract
本发明公开一种多重响应波段的半导体探测器,依次包括衬底、第一导电型氮化物半导体,InxGa1‑xN/GaN量子阱,V‑pits,第一Au纳米颗粒,Ga2O3/ZnO核壳结构纳米柱,第二Au纳米颗粒,SiC纳米柱核层,(Ga2O3)y/(GaN)z纳米柱壳层,第三Au纳米颗粒,第二导电型Si基板,其特征在于所述InxGa1‑xN/GaN量子阱的V‑pits上方依次沉积第一Au纳米颗粒,Ga2O3/ZnO,第二Au纳米颗粒,SiC纳米柱核层,(Ga2O3)y/(GaN)z纳米柱壳层,第三Au纳米颗粒。
Description
技术领域
本发明涉及半导体光电探测器领域,特别是一种多重响应波段的半导体探测器。
背景技术
第三代化合物半导体具有较宽的带隙、电子迁移率高、击穿场强大、抗辐射性能强等优点,适合于制作发光二极管、激光器、探测器等光电子器件。带隙为3.3eV的碳化硅SiC、3.4eV的氮化镓GaN、6.2eV的氮化铝AlN以及带隙为4.2~4.9eV的氮化镓Ga2O3具有宽的带隙以及良好的化学性质,适合于制作紫外光电二极管和日盲探测器。
发明内容
本发明公开一种多重响应波段的半导体探测器,依次包括衬底、第一导电型氮化物半导体,InxGa1-xN/GaN量子阱,V-pits,第一Au纳米颗粒,Ga2O3/ZnO核壳结构纳米柱,第二Au纳米颗粒,SiC纳米柱核层,(Ga2O3)y/(GaN)z纳米柱壳层,第三Au纳米颗粒,第二导电型Si基板,其特征在于所述InxGa1-xN/GaN量子阱的V-pits上方依次沉积第一Au纳米颗粒,Ga2O3/ZnO核壳结构纳米柱,第二Au纳米颗粒,SiC纳米柱核层,(Ga2O3)y/(GaN)z纳米柱壳层,第三Au纳米颗粒。
进一步地,所述InxGa1-xN/GaN量子阱形成第一探测响应波段,所述第一探测响应波段为420~480nm;所述第一、第二Au纳米颗粒夹着Ga2O3/ZnO核壳结构纳米柱组成Au/Ga2O3/ZnO/Au三明治纳米结构,形成第二探测响应波段,所述第二探测响应波段为520~560nm;所述第二、第三Au纳米颗粒夹着SiC纳米柱核层/(Ga2O3)y/(GaN)z纳米柱壳层的核壳纳米柱组成Au/SiC-(Ga2O3)y/(GaN)z /Au三明治纳米结构,与第二导电型Si基板组成Au/SiC-(Ga2O3)y/(GaN)z/Au/Si,形成第三响应波段,所述第三响应波段为360~400 nm,从而在将多重响应波段集成在单个探测器的外延结构中。
进一步地,所述第一Au纳米颗粒/Ga2O3/ZnO核壳结构纳米柱/第二Au纳米颗粒/SiC纳米柱核层/(Ga2O3)y/(GaN)z纳米柱壳层/第三Au纳米颗粒形成复合纳米结构的击穿场强大于8 Mv/cm,该强大击穿强场的复合纳米结构填充于位错线顶端,提升该多重响应波段的半导体探测器的抗高压能力和ESD能力。
进一步地,所述V-pits的尺寸为50~500 nm,所述第一、第二、第三Au纳米颗粒的尺寸为50~500 nm,所述Ga2O3/ZnO核壳结构纳米柱的尺寸为50~500 nm,所述SiC纳米柱核层的尺寸为50~500 nm,所述GaN纳米柱壳层的尺寸为50~500 nm。
进一步地,所述V-pits的深度为D,所述第一Au纳米颗粒/Ga2O3纳米柱/第二Au纳米颗粒/SiC纳米柱核层/(Ga2O3)y/(GaN)z纳米柱壳层/第三Au纳米颗粒形成复合纳米结构的高度为H,其中H≤D,即复合纳米结构被包覆在V-pits里。
进一步地,所述第一、第二和第三Au纳米颗粒的形状为球状或半球状或椭球状。
进一步地,所述InxGa1-xN/GaN量子阱的In组分为x,其中0≤x≤1。
进一步地,所述Ga2O3/ZnO核壳结构纳米柱的核层为Ga2O3,壳层为ZnO,或者核层为ZnO,壳层为Ga2O3;所述Ga2O3/ZnO核壳结构纳米柱亦可为周期结构,即(Ga2O3/ZnO)m,周期m≥1。
进一步地,所述Ga2O3/ZnO核壳结构纳米柱的Ga2O3结构包括α-Ga2O3,β-Ga2O3,γ-Ga2O3,δ-Ga2O3的任意一种或任意组合。
进一步地,所述Ga2O3/ZnO核壳结构纳米柱的Ga2O3结构包括α-Ga2O3,β-Ga2O3,γ-Ga2O3,δ-Ga2O3的任意组合包括二元混合结构α-Ga2O3/β-Ga2O3,α-Ga2O3/β-Ga2O3,α-Ga2O3/γ-Ga2O3,α-Ga2O3/δ-Ga2O3,β-Ga2O3/γ-Ga2O3,β-Ga2O3/δ-Ga2O3,γ-Ga2O3/δ-Ga2O3,以及三元混合结构α-Ga2O3/β-Ga2O3/γ-Ga2O3,α-Ga2O3/β-Ga2O3/δ-Ga2O3,β-Ga2O3/γ-Ga2O3/δ-Ga2O3,以及四元混合结构α-Ga2O3/β-Ga2O3/γ-Ga2O3/δ-Ga2O3。
进一步地,所述(Ga2O3)y/(GaN)z纳米柱壳层为周期性结构,所述周期y≥0,z≥0。
进一步地,所述第二导电型Si基板组成Au/SiC-(Ga2O3)y/(GaN)z/Au/Si的结构包括Au/SiC-(Ga2O3)y/(GaN)z/Au/Si(当y>0,z>0时),Au/SiC-(GaN)z/Au/Si(当y=0时),Au/SiC-(Ga2O3)y/Au/Si(当z=0时),以及Au/SiC/Au/Si(当y=0,z=0时)。
附图说明
图1为本发明一种多重响应波段的半导体探测器的结构示意图。
图2为本发明一种多重响应波段的半导体探测器的效果示意图。
图示说明:100:衬底;101:第一导电型氮化物半导体,102:InxGa1-xN/GaN量子阱,103:V-pits,104a:第一Au纳米颗粒,105:Ga2O3/ZnO核壳结构纳米柱,104b:第二Au纳米颗粒,106:SiC纳米柱核层,107:(Ga2O3)y/(GaN)z纳米柱壳层,104c:第三Au纳米颗粒,108:第二导电型Si基板,109:位错线。
具体实施方式
实施例
本发明公开一种多重响应波段的半导体探测器,如图1所示,依次包括衬底100、第一导电型氮化物半导体101,InxGa1-xN/GaN量子阱102,V-pits 103,第一Au纳米颗粒104a,Ga2O3/ZnO核壳结构纳米柱105,第二Au纳米颗粒104b,SiC纳米柱核层106,(Ga2O3)y/(GaN)z纳米柱壳层107,第三Au纳米颗粒104c,第二导电型Si基板108,其特征在于所述InxGa1-xN/GaN量子阱102的V-pits 103上方依次沉积第一Au纳米颗粒104a,Ga2O3/ZnO核壳结构纳米柱105,第二Au纳米颗粒104b,SiC纳米柱核106层,(Ga2O3)y/(GaN)z纳米柱壳层107,第三Au纳米颗粒104c。
所述InxGa1-xN/GaN量子阱102形成第一探测响应波段,所述第一探测响应波段为420~480nm;所述第一Au纳米颗粒104a、第二Au纳米颗粒104b夹着Ga2O3/ZnO核壳结构纳米柱105组成Au/Ga2O3/ZnO/Au三明治纳米结构,形成第二探测响应波段,所述第二探测响应波段为520~560 nm;所述第二Au纳米颗粒104b、第三Au纳米颗粒104c夹着SiC纳米柱核层106/(Ga2O3)y/(GaN)z纳米柱壳层107的核壳纳米柱组成Au/SiC-(Ga2O3)y/(GaN)z/Au三明治纳米结构,与第二导电型Si基板108组成Au/SiC-(Ga2O3)y/(GaN)z/Au/Si,形成第三响应波段,所述第三响应波段为360~400 nm,从而在将多重响应波段集成在单个探测器的外延结构中,如图2所示。
所述第一Au纳米颗粒104a/Ga2O3/ZnO核壳结构纳米柱105/第二Au纳米颗粒104b/SiC纳米柱核层106/(Ga2O3)y/(GaN)z纳米柱壳层107/第三Au纳米颗粒104c形成复合纳米结构的击穿场强大于8 Mv/cm,该强大击穿强场的复合纳米结构填充于位错线109顶端,提升该多重响应波段的半导体探测器的抗高压能力和ESD能力。
所述V-pits 103的尺寸为50~500 nm,所述第一Au纳米颗粒104a、第二Au纳米颗粒104b、第三Au纳米颗粒104c的尺寸为50~500 nm,所述Ga2O3纳米柱105的尺寸为50~500 nm,所述SiC纳米柱核层106的尺寸为50~500 nm,所述(Ga2O3)y/(GaN)z纳米柱壳层107的尺寸为50~500 nm。
所述V-pits 103的深度为D,所述第一Au纳米颗粒104a/Ga2O3/ZnO核壳结构纳米柱105/第二Au纳米颗粒104b/SiC纳米柱核层106/(Ga2O3)y/(GaN)z纳米柱壳层107/第三Au纳米颗粒104c形成复合纳米结构的高度为H,其中H≤D,即复合纳米结构被包覆在V-pits里。
所述第一Au纳米颗粒104a、第二Au纳米颗粒104b、第三Au纳米颗粒104c的形状为球状或半球状或椭球状。
所述InxGa1-xN/GaN量子阱103的In组分为x,其中0≤x≤1。
所述Ga2O3/ZnO核壳结构纳米柱105的核层为Ga2O3,壳层为ZnO,或者核层为ZnO,壳层为Ga2O3;所述Ga2O3/ZnO核壳结构纳米柱105亦可为周期结构,即(Ga2O3/ZnO)m,周期m≥1。
所述Ga2O3/ZnO核壳结构纳米柱105的Ga2O3结构包括α-Ga2O3,β-Ga2O3,γ-Ga2O3,δ-Ga2O3的任意一种或任意组合。
所述Ga2O3/ZnO核壳结构纳米柱105的Ga2O3结构包括α-Ga2O3,β-Ga2O3,γ-Ga2O3,δ-Ga2O3的任意组合包括二元混合结构α-Ga2O3/β-Ga2O3,α-Ga2O3/β-Ga2O3,α-Ga2O3/γ-Ga2O3,α-Ga2O3/δ-Ga2O3,β-Ga2O3/γ-Ga2O3,β-Ga2O3/δ-Ga2O3,γ-Ga2O3/δ-Ga2O3,以及三元混合结构α-Ga2O3/β-Ga2O3/γ-Ga2O3,α-Ga2O3/β-Ga2O3/δ-Ga2O3,β-Ga2O3/γ-Ga2O3/δ-Ga2O3,以及四元混合结构α-Ga2O3/β-Ga2O3/γ-Ga2O3/δ-Ga2O3。
所述(Ga2O3)y/(GaN)z纳米柱壳层107为周期性结构,所述周期y≥0,z≥0。
所述第二导电型Si基板组成Au/SiC-(Ga2O3)y/(GaN)z/Au/Si的结构包括Au/SiC-(Ga2O3)y/(GaN)z/Au/Si(当y>0,z>0时),Au/SiC-(GaN)z/Au/Si(当y=0时),Au/SiC-(Ga2O3)y/Au/Si(当z=0时),以及Au/SiC/Au/Si(当y=0,z=0时)。
以上实施方式仅用于说明本发明,而并非用于限定本发明,本领域的技术人员,在不脱离本发明的精神和范围的情况下,可以对本发明做出各种修饰和变动,因此所有等同的技术方案也属于本发明的范畴,本发明的专利保护范围应视权利要求书范围限定。
Claims (9)
1.一种多重响应波段的半导体探测器,依次包括衬底、第一导电型氮化物半导体,InxGa1-xN/GaN量子阱,V-pits,第一Au纳米颗粒,Ga2O3/ZnO核壳结构纳米柱,第二Au纳米颗粒,SiC纳米柱核层,(Ga2O3)y/(GaN)z纳米柱壳层,第三Au纳米颗粒,第二导电型Si基板,其特征在于所述InxGa1-xN/GaN量子阱的V-pits上方依次沉积第一Au纳米颗粒,Ga2O3/ZnO核壳结构纳米柱,第二Au纳米颗粒,SiC纳米柱核层,(Ga2O3)y/(GaN)z纳米柱壳层,第三Au纳米颗粒;所述(Ga2O3)y/(GaN)z纳米柱壳层为周期性结构,周期y≥0,z≥0;所述InxGa1-xN/GaN量子阱的In组分为x,其中0≤x≤1。
2.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述InxGa1-xN/GaN量子阱形成第一探测响应波段,所述第一探测响应波段为420~480nm;所述第一、第二Au纳米颗粒夹着Ga2O3/ZnO核壳结构纳米柱组成Au/Ga2O3/ZnO/Au三明治纳米结构,形成第二探测响应波段,所述第二探测响应波段为520~560 nm;所述第二、第三Au纳米颗粒夹着SiC纳米柱核层/(Ga2O3)y/(GaN)z纳米柱壳层的核壳纳米柱组成Au/SiC-(Ga2O3)y/(GaN)z/Au三明治纳米结构,与第二导电型Si基板组成Au/SiC-(Ga2O3)y/(GaN)z/Au/Si,形成第三响应波段,所述第三响应波段为360~400 nm,从而在将多重响应波段集成在单个探测器的外延结构中。
3.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述第一Au纳米颗粒/Ga2O3/ZnO核壳结构纳米柱/第二Au纳米颗粒/SiC纳米柱核层/(Ga2O3)y/(GaN)z纳米柱壳层/第三Au纳米颗粒形成复合纳米结构的击穿场强大于8 Mv/cm,该复合纳米结构填充于位错线顶端,提升该多重响应波段的半导体探测器的抗高压能力和ESD能力;所述V-pits的尺寸为50~500 nm,所述第一、第二、第三Au纳米颗粒的尺寸为50~500 nm,所述Ga2O3/ZnO核壳结构纳米柱的尺寸为50~500 nm,所述SiC纳米柱核层的尺寸为50~500 nm,所述(Ga2O3)y/(GaN)z纳米柱壳层的尺寸为50~500 nm。
4.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述V-pits的深度为D,所述第一Au纳米颗粒/Ga2O3/ZnO核壳结构纳米柱/第二Au纳米颗粒/SiC纳米柱核层/(Ga2O3)y/(GaN)z纳米柱壳层/第三Au纳米颗粒形成复合纳米结构的高度为H,其中H≤D,即复合纳米结构被包覆在V-pits里。
5.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述第一、第二和第三Au纳米颗粒的形状为球状或半球状或椭球状。
6.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述Ga2O3/ZnO核壳结构纳米柱的核层为Ga2O3,壳层为ZnO,或者核层为ZnO,壳层为Ga2O3;所述Ga2O3/ZnO核壳结构纳米柱亦可为周期结构,即(Ga2O3/ZnO)m,周期m≥1。
7.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述Ga2O3/ZnO核壳结构纳米柱的Ga2O3结构包括α-Ga2O3,β-Ga2O3,γ-Ga2O3,δ-Ga2O3的任意一种或任意组合。
8.根据权利要求1所述一种多重响应波段的半导体探测器,其特征在于:所述Ga2O3/ZnO核壳结构纳米柱的Ga2O3结构包括α-Ga2O3,β-Ga2O3,γ-Ga2O3,δ-Ga2O3的任意组合,包括二元混合结构α-Ga2O3/β-Ga2O3,α-Ga2O3/γ-Ga2O3,α-Ga2O3/δ-Ga2O3,β-Ga2O3/γ-Ga2O3,β-Ga2O3/δ-Ga2O3,γ-Ga2O3/δ-Ga2O3,以及三元混合结构α-Ga2O3/β-Ga2O3/γ-Ga2O3,α-Ga2O3/β-Ga2O3/δ-Ga2O3,β-Ga2O3/γ-Ga2O3/δ-Ga2O3,以及四元混合结构α-Ga2O3/β-Ga2O3/γ-Ga2O3/δ-Ga2O3。
9.根据权利要求1或2所述一种多重响应波段的半导体探测器,其特征在于:所述第二导电型Si基板组成Au/SiC-(Ga2O3)y/(GaN)z/Au/Si的结构包括:当y>0,z>0时,Au/SiC-(Ga2O3)y/(GaN)z/Au/Si;当y=0时,Au/SiC-(GaN)z/Au/Si;当z=0时,Au/SiC-(Ga2O3)y/Au/Si;当y=0,z=0时,Au/SiC/Au/Si。
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4122925A1 (de) * | 1991-07-11 | 1993-01-21 | Fraunhofer Ges Forschung | Optisches spektrometer |
EP2495358A1 (en) * | 2011-03-02 | 2012-09-05 | Soitec | Methods of forming III/V semiconductor materials, and semiconductor structures formed using such methods |
KR20150055454A (ko) * | 2013-11-13 | 2015-05-21 | 한국과학기술원 | 양자광 소자 및 이의 제조방법 |
KR20160087160A (ko) * | 2015-01-13 | 2016-07-21 | 울산과학기술원 | GaN 기반 다공성 피라미드 광전극 및 그 제조방법 |
CN106848013A (zh) * | 2017-02-14 | 2017-06-13 | 郑锦坚 | 一种半导体发光二极管及其制作方法 |
CN108598227A (zh) * | 2018-04-25 | 2018-09-28 | 黎明职业大学 | 一种半导体白光发光二极管 |
CN109599467A (zh) * | 2018-12-01 | 2019-04-09 | 王星河 | 一种半导体发光元件 |
-
2019
- 2019-04-10 CN CN201910284569.8A patent/CN109962117B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4122925A1 (de) * | 1991-07-11 | 1993-01-21 | Fraunhofer Ges Forschung | Optisches spektrometer |
EP2495358A1 (en) * | 2011-03-02 | 2012-09-05 | Soitec | Methods of forming III/V semiconductor materials, and semiconductor structures formed using such methods |
KR20150055454A (ko) * | 2013-11-13 | 2015-05-21 | 한국과학기술원 | 양자광 소자 및 이의 제조방법 |
KR20160087160A (ko) * | 2015-01-13 | 2016-07-21 | 울산과학기술원 | GaN 기반 다공성 피라미드 광전극 및 그 제조방법 |
CN106848013A (zh) * | 2017-02-14 | 2017-06-13 | 郑锦坚 | 一种半导体发光二极管及其制作方法 |
CN108598227A (zh) * | 2018-04-25 | 2018-09-28 | 黎明职业大学 | 一种半导体白光发光二极管 |
CN109599467A (zh) * | 2018-12-01 | 2019-04-09 | 王星河 | 一种半导体发光元件 |
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