CN109959851A - It is a kind of for detecting the technique of luminous diode temperature - Google Patents
It is a kind of for detecting the technique of luminous diode temperature Download PDFInfo
- Publication number
- CN109959851A CN109959851A CN201910225941.8A CN201910225941A CN109959851A CN 109959851 A CN109959851 A CN 109959851A CN 201910225941 A CN201910225941 A CN 201910225941A CN 109959851 A CN109959851 A CN 109959851A
- Authority
- CN
- China
- Prior art keywords
- temperature
- power light
- emitting diodes
- probe
- constant temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Led Devices (AREA)
Abstract
The invention discloses a kind of for detecting the technique of luminous diode temperature, comprising the following steps: S1 prepares, S2 processing, S3 installation, and S4 detection and S5 are summarized;By passing through constant temperature cabinet and probe in detecting when detecting, and by the hole opened up to detect when detecting more accurate, closed environment and dust etc. is handled so that its is safer, and this method can more accurately judge the use environment for being suitable at its heating rate, cooling rate, maximum temperature and assessment when in use.
Description
Technical field
It is specially a kind of for detecting the technique of luminous diode temperature the present invention relates to diode detection technical field.
Background technique
Light emitting diode is referred to as LED.It is made of the compound containing gallium (Ga), arsenic (As), phosphorus (P), nitrogen (N) etc..Work as electricity
Visible light can be given off when son is with hole-recombination, thus can be used to that light emitting diode is made.It is used as and refers in circuit and instrument
Show lamp, or composition text or number display.Gallium arsenide diode glows, gallium phosphide diode green light, two pole of silicon carbide
Pipe Yellow light-emitting low temperature, gallium nitride diode blue light-emitting.Because chemical property divides Organic Light Emitting Diode OLED and inorganic light-emitting diode again
LED。
However existing light emitting diode is not comprehensive enough when detecting warm spend and following insufficient in detection:
Diode temperature detection mode in the prior art when in use, could be used and directly be measured and result measured directly can not
Accurately, and when detecting it may cause danger, suitable use environment to large-power light-emitting diodes when using and most
Big temperature can not provide more accurate assessment, so be unable to satisfy needed for the prior art.
Summary of the invention
The purpose of the present invention is to provide a kind of for detecting the technique of luminous diode temperature, to solve above-mentioned background skill
The problem of being proposed in art.
To achieve the above object, the invention provides the following technical scheme: it is a kind of for detecting the work of luminous diode temperature
Skill, comprising the following steps:
S1: prepare, prepare a constant temperature cabinet and room temperature detection sensor be installed inside it, and check the leakproofness of constant temperature cabinet with
And safety, then by the mounting rack of constant temperature cabinet inner axes position installation and large-power light-emitting diodes to be detected, prepare five
Large-power light-emitting diodes, then prepare a probe-type galvanic couple temperature measurer.
S2: five large-power light-emitting diodes that needs detect are opened in processing in its two sides and center first
Hole is then dusted drying process to five large-power light-emitting diodes after discharging, this process carries out in dust free room,
It is also required to be stored in dust free room after the completion, three string holes is opened up on the tempered glass of constant temperature cabinet front, by probe-type electricity
Even temperature measurer is inserted, and it is left to sufficiently long line inside constant temperature cabinet, then uses the positive string holes of constant temperature cabinet
Glass cement is sealed processing, and dedusting then is dried to constant temperature cabinet inside in dust free room;
Wherein, it robs to using pneumatic dust collection in large-power light-emitting diodes dust removal process, dust removal process is to high-power light-emitting two
The protective layer of pole pipe periphery and its heat dissipation region and its chip region periphery carries out emphasis dedusting, is dusted process to constant temperature cabinet
It is middle to be carried out with high power vacuum cleaner.
S3: large-power light-emitting diodes are mounted on the mounting rack in constant temperature cabinet, then by three probes by installation first
The probe of formula galvanic couple temperature measurer is inserted into, and in the hole offered on large-power light-emitting diodes in S2, is opened in constant temperature cabinet
Thermostatic equipment, and at the same time opening large-power light-emitting diodes and probe-type galvanic couple temperature measurer.
S4: detecting, every two minutes in the detection process temperature values recorded on primary each probe-type galvanic couple temperature measurer, when
Record peak temperature data close large-power light-emitting diodes when temperature reaches peak value, record within then every two minutes primary each spy
Temperature value on pin type galvanic couple temperature measurer stops detection when temperature, which is reduced to minimum, no longer to be reduced, closes constant temperature at this time
Cabinet and probe-type galvanic couple temperature measurer, take out the large-power light-emitting diodes that detection is completed, and replacement one is the high-power hair of detection
Optical diode continuation is checked with the above process, one by one carries out five large-power light-emitting diodes.
S5: summarizing, arranged and compared to each group of data, comment to this this large-power light-emitting diodes
Estimate, heating rate, cooling rate and maximum temperature, and assesses its safety and usage scenario.
Preferably, it is responsible for overall management by giving birth to skill portion in record, classification and the notice of wherein the defects of S1 report, and transports
Row portion, maintenance portion and supply department employed personnel are notified and are counted by Human Resources Department, are given birth to skill portion when recording defect record, are needed
On-the-spot investigation and more operation portion staff practical operation situation fix defect situation, lack in raw skill portion record and classification
Operation portion, maintenance portion and supply department operate normally when falling into, active line normal operation when S1 is executed.
Wherein, 15 times of the large-power light-emitting diodes volume selected when storage volume in the constant temperature cabinet in S1, take
Until be full of to it when probe-type galvanic couple temperature measurer.
Wherein, the hole aperture opened up in S2 is greater than one millimeter of probe of probe-type galvanic couple temperature measurer, and hole bosom is protected
It holds and must not exceed 3 points 5 millimeters with two millimeters of lamp bead distance or more.
Wherein, when the temperature peak temperature value that periodically five detections of appearance obtain really is identical in S4, which is considered as
Peak temperature, occur detecting for eight times when the minimum temperature of cooling determines obtained temperature value it is identical when, Gai Wendu room temperature lowest temperature
Degree.
Wherein, the heating rate in S5 and cooling rate are most fast using removing, and three numerical value for removing most slow centre go to put down
Mean, takes the average value of five numerical value as maximum temperature, and the assessment of safety and the assessment of usage scenario are according to testing result
Maximum temperature assessed.
Compared with prior art, the beneficial effects of the present invention are:
Pass through constant temperature cabinet and probe in detecting when detecting, and while detecting to detect by the hole opened up it is more accurate, it is close
Closed loop border and dust etc. is handled so that its is safer, and this method can more accurately judge its heating speed when in use
The use environment for being suitable at degree, cooling rate, maximum temperature and assessment.
Specific embodiment
Below in conjunction with the embodiment of the present invention, technical scheme in the embodiment of the invention is clearly and completely described,
Obviously, described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Based in the present invention
Embodiment, every other embodiment obtained by those of ordinary skill in the art without making creative efforts, all
Belong to the scope of protection of the invention.
It is a kind of for detecting the technique of luminous diode temperature, comprising the following steps:
S1: prepare, prepare a constant temperature cabinet and room temperature detection sensor be installed inside it, and check the leakproofness of constant temperature cabinet with
And safety, then by the mounting rack of constant temperature cabinet inner axes position installation and large-power light-emitting diodes to be detected, prepare five
Large-power light-emitting diodes, then prepare a probe-type galvanic couple temperature measurer.
Wherein, 15 times of the large-power light-emitting diodes volume selected when storage volume in the constant temperature cabinet in S1, take
Until be full of to it when probe-type galvanic couple temperature measurer.
S2: five large-power light-emitting diodes that needs detect are opened in processing in its two sides and center first
Hole is then dusted drying process to five large-power light-emitting diodes after discharging, this process carries out in dust free room,
It is also required to be stored in dust free room after the completion, three string holes is opened up on the tempered glass of constant temperature cabinet front, by probe-type electricity
Even temperature measurer is inserted, and it is left to sufficiently long line inside constant temperature cabinet, then uses the positive string holes of constant temperature cabinet
Glass cement is sealed processing, and dedusting then is dried to constant temperature cabinet inside in dust free room;
Wherein, it robs to using pneumatic dust collection in large-power light-emitting diodes dust removal process, dust removal process is to high-power light-emitting two
The protective layer of pole pipe periphery and its heat dissipation region and its chip region periphery carries out emphasis dedusting, is dusted process to constant temperature cabinet
Middle to be carried out with high power vacuum cleaner, the hole aperture opened up is greater than one millimeter of probe of probe-type galvanic couple temperature measurer, and hole is most deep
Place keeps must not exceed 3 points 5 millimeters with two millimeters of lamp bead distance or more.
S3: large-power light-emitting diodes are mounted on the mounting rack in constant temperature cabinet, then by three probes by installation first
The probe of formula galvanic couple temperature measurer is inserted into, and in the hole offered on large-power light-emitting diodes in S2, is opened in constant temperature cabinet
Thermostatic equipment, and at the same time opening large-power light-emitting diodes and probe-type galvanic couple temperature measurer.
S4: detecting, every two minutes in the detection process temperature values recorded on primary each probe-type galvanic couple temperature measurer, when
Record peak temperature data close large-power light-emitting diodes when temperature reaches peak value, record within then every two minutes primary each spy
Temperature value on pin type galvanic couple temperature measurer stops detection when temperature, which is reduced to minimum, no longer to be reduced, closes constant temperature at this time
Cabinet and probe-type galvanic couple temperature measurer, take out the large-power light-emitting diodes that detection is completed, and replacement one is the high-power hair of detection
Optical diode continuation is checked with the above process, one by one carries out five large-power light-emitting diodes.
Wherein, when the temperature peak temperature value that periodically five detections of appearance obtain really is identical in S4, which is considered as
Peak temperature, occur detecting for eight times when the minimum temperature of cooling determines obtained temperature value it is identical when, Gai Wendu room temperature lowest temperature
Degree.
S5: summarizing, arranged and compared to each group of data, comment to this this large-power light-emitting diodes
Estimate, heating rate, cooling rate and maximum temperature, and assesses its safety and usage scenario.
Wherein, the heating rate in S5 and cooling rate are most fast using removing, and three numerical value for removing most slow centre go to put down
Mean, takes the average value of five numerical value as maximum temperature, and the assessment of safety and the assessment of usage scenario are according to testing result
Maximum temperature assessed.
It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to
Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with
A variety of variations, modification, replacement can be carried out to these embodiments without departing from the principles and spirit of the present invention by understanding
And modification, the scope of the present invention is defined by the appended.
Claims (5)
1. a kind of for detecting the technique of luminous diode temperature, it is characterised in that: the following steps are included:
S1: prepare, prepare a constant temperature cabinet and room temperature detection sensor be installed inside it, and check the leakproofness of constant temperature cabinet with
And safety, then by the mounting rack of constant temperature cabinet inner axes position installation and large-power light-emitting diodes to be detected, prepare five
Large-power light-emitting diodes, then prepare a probe-type galvanic couple temperature measurer,
S2: processing, to five large-power light-emitting diodes that needs detect, first in its two sides and center aperture, and
Drying process is dusted to five large-power light-emitting diodes after discharging afterwards, this process carries out in dust free room, completes
After be also required to be stored in dust free room, three string holes are opened up on the tempered glass of constant temperature cabinet front, probe-type galvanic couple is surveyed
Wen Yi is inserted, and it is left to sufficiently long line inside constant temperature cabinet, then by the positive string holes glass of constant temperature cabinet
Glue is sealed processing, and dedusting then is dried to constant temperature cabinet inside in dust free room;
Wherein, it robs to using pneumatic dust collection in large-power light-emitting diodes dust removal process, dust removal process is to high-power light-emitting two
The protective layer of pole pipe periphery and its heat dissipation region and its chip region periphery carries out emphasis dedusting, is dusted process to constant temperature cabinet
It is middle to be carried out with high power vacuum cleaner,
S3: large-power light-emitting diodes are mounted on the mounting rack in constant temperature cabinet, then by three probe-type electricity by installation first
The probe of even temperature measurer is inserted into, and in the hole offered on large-power light-emitting diodes in S2, opens the constant temperature in constant temperature cabinet
Equipment, and at the same time large-power light-emitting diodes and probe-type galvanic couple temperature measurer are opened,
S4: detecting, and every two minutes in the detection process temperature values recorded on primary each probe-type galvanic couple temperature measurer work as temperature
Record peak temperature data close large-power light-emitting diodes when reaching peak value, record within then every two minutes primary each probe-type
Temperature value on galvanic couple temperature measurer, when temperature, which is reduced to minimum, no longer to be reduced stop detection, at this time close constant temperature cabinet with
Probe-type galvanic couple temperature measurer, takes out the large-power light-emitting diodes that detection is completed, and replacement one is the high-power light-emitting two of detection
Pole pipe continuation is checked with the above process, one by one carries out five large-power light-emitting diodes,
S5: summarizing, arranged and compared to each group of data, assess to this this large-power light-emitting diodes,
Its heating rate, cooling rate and maximum temperature, and assess its safety and usage scenario.
2. according to claim 1 a kind of for detecting the technique of luminous diode temperature, it is characterised in that: wherein, S1
In constant temperature cabinet in storage volume when select 15 times of large-power light-emitting diodes volume, take probe-type galvanic couple temperature measurer
When it be full of until.
3. according to claim 1 a kind of for detecting the technique of luminous diode temperature, it is characterised in that: wherein, S2
In the hole aperture that opens up be greater than one millimeter of probe of probe-type galvanic couple temperature measurer, and hole bosom is kept and two milli of lamp bead distance
Meter or more must not exceed 3 points 5 millimeters.
4. according to claim 1 a kind of for detecting the technique of luminous diode temperature, it is characterised in that: wherein, S4
When the middle temperature peak temperature value that periodically five detections of appearance obtain really is identical, which is considered as peak temperature, cooling
Occur detecting for eight times when minimum temperature determines obtained temperature value it is identical when, Gai Wendu room temperature minimum temperature.
5. according to claim 4 a kind of for detecting the technique of luminous diode temperature, it is characterised in that: wherein, S5
In heating rate and cooling rate it is most fast using removing, three numerical value for removing most slow centre remove average, as the highest temperature
Degree takes the average value of five numerical value, and the assessment of safety and the maximum temperature of usage scenario assessed according to testing result are commented
Estimate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910225941.8A CN109959851A (en) | 2019-03-25 | 2019-03-25 | It is a kind of for detecting the technique of luminous diode temperature |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910225941.8A CN109959851A (en) | 2019-03-25 | 2019-03-25 | It is a kind of for detecting the technique of luminous diode temperature |
Publications (1)
Publication Number | Publication Date |
---|---|
CN109959851A true CN109959851A (en) | 2019-07-02 |
Family
ID=67024820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910225941.8A Pending CN109959851A (en) | 2019-03-25 | 2019-03-25 | It is a kind of for detecting the technique of luminous diode temperature |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN109959851A (en) |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102680207A (en) * | 2012-05-04 | 2012-09-19 | 黄智辉 | Aging test method and device for LED luminaire production |
US20130027438A1 (en) * | 2011-07-27 | 2013-01-31 | Ming-Hung Hu | Display capable of calibrating white balance and method thereof |
CN103792441A (en) * | 2012-10-31 | 2014-05-14 | 海洋王(东莞)照明科技有限公司 | Method for testing LED driver |
CN103995223A (en) * | 2014-04-11 | 2014-08-20 | 清华大学深圳研究生院 | Method and apparatus for measuring thermal characteristic of LED |
CN104515944A (en) * | 2014-12-18 | 2015-04-15 | 华中科技大学 | PID (proportion integration differentiation) feedback based predistortion correction method and LED (light emitting diode) junction temperature measurement method |
WO2015057223A1 (en) * | 2013-10-17 | 2015-04-23 | Smith, Dana Maerta Af Rosenborg | Environmental conditioning system for cut flowers and other flora |
CN104729742A (en) * | 2013-12-21 | 2015-06-24 | 中科科隆光电仪器设备无锡有限公司 | Non-contact LED whole-lamp junction temperature measuring system |
CN107807321A (en) * | 2017-10-27 | 2018-03-16 | 河海大学常州校区 | A kind of ultraviolet LED Online Transaction Processing |
CN207502700U (en) * | 2017-12-15 | 2018-06-15 | Tcl海外电子(惠州)有限公司 | LED component and display equipment |
CN108375706A (en) * | 2018-02-09 | 2018-08-07 | 广州视源电子科技股份有限公司 | The method that temperature rises Auto-Test System and tests Wen Sheng |
-
2019
- 2019-03-25 CN CN201910225941.8A patent/CN109959851A/en active Pending
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130027438A1 (en) * | 2011-07-27 | 2013-01-31 | Ming-Hung Hu | Display capable of calibrating white balance and method thereof |
CN102680207A (en) * | 2012-05-04 | 2012-09-19 | 黄智辉 | Aging test method and device for LED luminaire production |
CN103792441A (en) * | 2012-10-31 | 2014-05-14 | 海洋王(东莞)照明科技有限公司 | Method for testing LED driver |
WO2015057223A1 (en) * | 2013-10-17 | 2015-04-23 | Smith, Dana Maerta Af Rosenborg | Environmental conditioning system for cut flowers and other flora |
CN104729742A (en) * | 2013-12-21 | 2015-06-24 | 中科科隆光电仪器设备无锡有限公司 | Non-contact LED whole-lamp junction temperature measuring system |
CN103995223A (en) * | 2014-04-11 | 2014-08-20 | 清华大学深圳研究生院 | Method and apparatus for measuring thermal characteristic of LED |
CN104515944A (en) * | 2014-12-18 | 2015-04-15 | 华中科技大学 | PID (proportion integration differentiation) feedback based predistortion correction method and LED (light emitting diode) junction temperature measurement method |
CN107807321A (en) * | 2017-10-27 | 2018-03-16 | 河海大学常州校区 | A kind of ultraviolet LED Online Transaction Processing |
CN207502700U (en) * | 2017-12-15 | 2018-06-15 | Tcl海外电子(惠州)有限公司 | LED component and display equipment |
CN108375706A (en) * | 2018-02-09 | 2018-08-07 | 广州视源电子科技股份有限公司 | The method that temperature rises Auto-Test System and tests Wen Sheng |
Non-Patent Citations (2)
Title |
---|
JINGWANG: "Experimental study on the thermal management of high-power LED headlight cooling device integrated with thermoelectric cooler package", 《ENERGY CONVERSION AND MANAGEMENT》 * |
宋川川: "大功率LED灯芯温度场测试研究", 《中国优秀硕士学位论文全文数据库 工程科技II辑》 * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107632275A (en) | A kind of LED illumination life of product and method for quickly evaluating reliability | |
CN102608509B (en) | Method for carrying out light/electrical/thermal ageing comprehensive testing on light-emitting diodes | |
CN103048605B (en) | The detection screening technique that a kind of LED is aging | |
US7876103B2 (en) | LED chain failure detection | |
CN103926052A (en) | Laser service life testing system | |
CN108693456A (en) | A kind of chip wafer test method | |
CN109959851A (en) | It is a kind of for detecting the technique of luminous diode temperature | |
Nogueira et al. | Evaluation of AlGaInP LEDs reliability based on accelerated tests | |
Weber et al. | A review of potential induced degradation in thin-film plants | |
CN109724779A (en) | COB-LED lamp inspection examining system and detection method | |
CN105170487A (en) | Automatic control system for LED sorting machine | |
CN105991184B (en) | The self-recovery method of OTDR transmitting terminal optical module test failures | |
CN103605085A (en) | LED thermal characteristic test method based on structure function | |
CN109612956A (en) | A kind of optical correction's chip for the residual detection system of agriculture | |
CN1955730B (en) | Heat testing method for LED car light grading plate | |
CN105203939A (en) | Method for detecting LED lamp declared luminous life compliance | |
CN102340919A (en) | System and method for detecting fault of LED illumination equipment | |
CN104006898B (en) | Method for representing junction temperature of GaN-based LED through weighting width | |
CU et al. | Analysis of accelerated reliability testing data of electronic component in combat vehicles | |
Zhonghong et al. | Research on reliability of LED luminaires in extreme natural environment | |
CN208477024U (en) | A kind of rectifier bridge aging board, rectifier bridge aging board component | |
CN102023085A (en) | Testing apparatus for light-emitting devices and sensing module thereof | |
Ren et al. | Reliability assessment of LED luminaires based on step-stress accelerated degradation test | |
Zhang et al. | Development of a real-time monitoring system with uni-photodetector for LED long term reliability tests | |
CN105301467A (en) | Method for detecting thermal adaptability of LED module and LED lamp |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20190702 |