CN109946862A - For bad analysis sheet-fetching system and take piece method - Google Patents
For bad analysis sheet-fetching system and take piece method Download PDFInfo
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- CN109946862A CN109946862A CN201910319979.1A CN201910319979A CN109946862A CN 109946862 A CN109946862 A CN 109946862A CN 201910319979 A CN201910319979 A CN 201910319979A CN 109946862 A CN109946862 A CN 109946862A
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Abstract
The present invention relates to a kind of sheet-fetching system for bad analysis and take piece method.Sheet-fetching system for bad analysis of the invention includes reporting system and operating system；The reporting system is collected and shows to the faceplate formation in producing line, and the operating system carries out assignment to the flow direction of the panel in producing line；User takes piece logic to reporting system input, the reporting system is built-in with logic development module, the reporting system need to parse panel according to taking piece logic to select by logic development module, and the data information transfer of panel will need to be parsed to operating system, to that need to parse panel addition process code and execute the operation of jump station to that need to parse panel, the operating system need to parse panel and be transferred to paddle website the operating system；Therefore, the present invention can be realized the movement for making paddle analysis in time when producing line panel occurs extremely, and the bad intellectually and automatically level of operation analyzed and take piece is substantially improved.
Description
Technical field
The present invention relates to field of display technology more particularly to a kind of sheet-fetching system for bad analysis and take piece method.
Background technique
In field of display technology, liquid crystal display (LCD) and active matrix drive type organic electroluminescent (AMOLED) are aobvious
Show that the panel display apparatus such as device because of many merits such as thin, high image quality, power saving, radiationless with fuselage, are widely used,
Such as: mobile phone, personal digital assistant (PDA), digital camera, computer screen or notebook screens.
Liquid crystal display device on existing market is largely backlight liquid crystal display device comprising liquid crystal display panel
And backlight module (backlight module).The working principle of liquid crystal display panel is in the parallel glass substrate of two panels
Liquid crystal molecule is placed, liquid crystal molecule is controlled whether energization by glass substrate and changes direction, by the light refraction of backlight module
Picture is generated out.Usual liquid crystal display panel is by color film (Color Filter, CF) substrate, thin film transistor (TFT) (Thin Film
Transistor, TFT) array substrate, be sandwiched between color membrane substrates and tft array substrate liquid crystal (Liquid Crystal,
LC) and sealing glue frame (Sealant) forms.The moulding process of liquid crystal display panel generally comprises: leading portion array (Array) processing procedure
(film, yellow light, etching and stripping), middle section are at box (Cell) processing procedure (tft array substrate and CF substrate in batch found into box) and back segment
Module group assembling processing procedure (driving IC and printed circuit board press)；Wherein, middle section is at box
In LCD manufacturing process, the defective products scrapped at box factory need to carry out anomaly analysis in order to provide bad improvement direction.
As shown in Figure 1, it uses reporting system and work to take piece flow chart in bad analysis at box station-service before prior art improvement
Industry (operator interface, OPI) system carry out, wherein reporting system can real-time display factory yield data, analyze people
Member can grab the relevent information of bad panel (panel) by reporting system；OPI system can be to the stream for operating panel in factory
To progress assignment；Piece process is taken to specifically comprise the following steps:
Step S10, analysis personnel obtain from reporting system and check the data information of panel, are provided according to reporting system
Data information calculates the bad type of occurrence quantity panel in the top (Top Defect), thus filter out need to parse it is bad
Panel.
Step S20, analysis personnel add specific process code to the bad panel that need to extract parsing in OPI system
(flag)。
Step S30, OPI system, which executes the panel with specific process code, jumps station movement, makes it into specific paddle station
Point executes paddle.
Step S40, paddle is completed, and paddle operating personnel notification analysis personnel take out the panel that need to be parsed.
Step S50, analysis personnel take out the bad panel that need to be parsed.
It can thus be seen that taking piece operation at existing bad of box factory is mostly to be accomplished manually, it and is nothing after abnormal occur
Method carry out in time it is bad take piece analytic process and need to by after analysis personnel screening systems' data just carry out, take piece from abnormal
It can not accomplish full-automation in process, prevent in advance, quick-fried amount carried out extremely taking piece in advance, it is therefore, existing bad at box factory
A large amount of manpowers need to be expended to carry out screening system data, execution flag addition and system and choose piece by taking piece process daily, and the process is every
It at least expends 4 hours, and whole paddle time-histories more lags.
Summary of the invention
Therefore, a primary object of the present invention is to provide a kind of sheet-fetching system for bad analysis, can be in exception
The bad intellectually and automatically level of operation analyzed and take piece is substantially improved in the movement for making paddle analysis when generation in time.
Another main purpose of the invention be to provide it is a kind of take piece method for bad analysis, can be in abnormal generation
When make the movement of paddle analysis in time, bad analyze is substantially improved and takes the intellectually and automatically level of operation of piece.
To achieve the above object, the present invention provides a kind of sheet-fetching system for bad analysis, including reporting system and with
The operating system of data concatenating between the reporting system；The reporting system is collected and shows to the faceplate formation in producing line
Show, the operating system carries out assignment to the flow direction of the panel in producing line；
The reporting system is built-in with logic development module, and the logic development module is used to take piece to patrol according to what is received
Panel need to be parsed by volume selecting, and will need to parse the data information transfer of panel to operating system, and the operating system is to needing to solve
Analysis panel addition process code simultaneously jumps station operation to that need to parse panel and execute, and the operating system, which need to parse panel and be transferred to, pulls out
Piece website.
The sheet-fetching system for bad analysis further includes terminal device, and the terminal device has system administration circle
Face takes piece logic to reporting system input by the system management interface of terminal device, described to take piece logical transport to institute
State logic development module.
The system management interface of the terminal device is equipped with for generating the multiple tabss for taking piece logic.
The multiple tabs includes product type tabs, abnormality code tabs, exception level tabs, the choosing of mould position
Item blocks and takes piece quantity tabs.
The terminal device is computer.
The paddle website has automatic paddle machine, and the automatic paddle machine reads the process generation that need to be parsed on panel automatically
Code and identify that this need to parse panel, then need to parse panel and be transferred in collection box.
The present invention also provides a kind of using as described above for the sheet-fetching system of bad analysis for bad analysis
Take piece method, comprising: the input of Xiang Suoshu reporting system takes piece logic, the logic development of the reporting system for bad panel
Module need to parse panel according to taking piece logic to select, and will need to parse the data information transfer of panel to operating system, described
Operating system need to parse panel and be transferred to that need to parse panel addition process code and execute the operation of jump station to that need to parse panel
Paddle website need to parse panel from the taking-up of paddle website to carry out bad analysis.
In producing line, panel is made by motherboard, and the multiple mould positions for being correspondingly formed multiple panels are arranged on each motherboard；
The reporting system calculate in minimum time unit by abnormality code represented by the bad type of panel hair
Raw amount and occurrence quantity ranking, calculate high-incidence mould position according to the bad panel number on motherboard difference mould position, according in different producing lines
Bad panel number to calculate high hair line other.
The minimum time unit is 0.5-1h；
The decision condition of the high-incidence mould position are as follows: assuming that a mould position meets following formula, single mode position corresponding panel scrap number/
Several * motherboard mould positions typesetting number >=1.5 are always scrapped, then the mould position is high-incidence mould position；
The other decision condition of high hair line is；Assuming that a producing line meets following formula, (per unit area yield report from a liner is useless count/always to scrap
Number) * (per unit area yield line output number/Gross Output number) >=0.25%, then the mould position is high-incidence producing line.
It include: that there are high-incidence mould position and high hair lines for hypothesis for the piece logic that takes of bad panel to reporting system input
Not, then panel preferentially need to be parsed from high-incidence mould position by the output sequential selection of bad panel, then Xuan Ze need to parse from high hair line
Panel；Assuming that high-incidence mould position is not present, then panel need to be parsed to the selection of different mould positions at random.
Sheet-fetching system for bad analysis of the invention includes reporting system and operating system；The reporting system is to production
Faceplate formation on line is collected and shows, the operating system carries out assignment to the flow direction of the panel in producing line；Institute
It states reporting system and is built-in with logic development module, the reporting system is needed to solve according to taking piece logic to select by logic development module
Panel is analysed, and will need to parse the data information transfer of panel to operating system, the operating system is to need to parse panel addition stream
Range code simultaneously executes the operation of jump station to that need to parse panel, and the operating system need to parse panel and be transferred to paddle website；Therefore,
The present invention can be realized the movement for making paddle analysis in time when producing line panel occurs extremely, and bad analysis is substantially improved and takes piece
Intellectually and automatically level of operation.Of the invention takes piece method for bad analysis, using as described above for not
The sheet-fetching system of good analysis carries out, and can be realized the movement for making paddle analysis in time when producing line panel occurs extremely, substantially
Promote the bad intellectually and automatically level of operation analyzed and take piece.
Detailed description of the invention
With reference to the accompanying drawing, by the way that detailed description of specific embodiments of the present invention, technical solution of the present invention will be made
And other beneficial effects are apparent.
In attached drawing,
Fig. 1 is to take piece flow chart in bad analysis at box station-service before the prior art improves；
Fig. 2 is work flow diagram of the present invention for the sheet-fetching system of bad analysis.
Specific embodiment
Refer to Fig. 2, the present invention provides a kind of sheet-fetching system for bad analysis, including reporting system and with the report
The concatenated operating system of table data among systems；The reporting system is collected and shows to the faceplate formation in producing line, institute
It states operating system and assignment is carried out to the flow direction of the panel in producing line；User takes piece logic to reporting system input,
The reporting system is built-in with logic development module, and the reporting system takes piece logic to select as logic development module according to
It need to parse panel out, and will need to parse the data information transfer of panel to operating system, the operating system is to need to parse panel
Addition process code (Flag) simultaneously jumps station operation to need to parse panel and execute, and the operating system, which need to parse panel and be transferred to, pulls out
Piece website.
Specifically, the sheet-fetching system for bad analysis further includes terminal device, and the terminal device has system
Administration interface, user take piece for bad panel to reporting system input by the system management interface of terminal device
Logic.
Specifically, the system management interface of the terminal device, which is equipped with, takes piece logic for bad panel for generating
Multiple tabss.
Specifically, in producing line, panel is made by motherboard, is arranged on each motherboard and is correspondingly formed the multiple of multiple panels
Mould position；The multiple tabs includes product type tabs, abnormality code tabs, exception level tabs, mould position option
Block and take piece quantity tabs.
Specifically, the terminal device is computer.
Specifically, the paddle website has automatic paddle machine, and the automatic paddle machine reads automatically and need to parse on panel
Process code and identify that this need to parse panel, then need to parse panel and be transferred in collection box.
Specifically, the piece logic that takes that analysis personnel input to the reporting system under normal conditions is that default takes piece logic,
To which without in special circumstances, analysis personnel take piece logic without re-entering daily, and analyzing personnel certainly can also be according to tool
The setting of body situation specifically takes piece logic.
Sheet-fetching system for bad analysis of the invention, during taking piece at the bad analysis of box factory, sheet-fetching system is certainly
Dynamic identification need to parse panel, add flag, automatic jump station automatically, and analysis personnel only take piece to patrol during taking piece with execution setting
Two steps that need to parse panel are collected and taken out, manpower is saved, while high-incidence exception can be carried out in time to take piece, promote abnormal solve
Response speed is analysed, the bad intellectually and automatically level of operation analyzed and take piece is substantially improved.
Piece method is taken for bad analysis the present invention also provides a kind of, using taking for bad analysis as described above
Piece system carries out, comprising: analysis personnel take piece logic, the reporting system for bad panel to reporting system input
Panel need to be parsed according to taking piece logic to select by logic development module, and will need to parse the data information transfer of panel to operation
System, the operating system will need to parse to that need to parse panel addition process code and execute the operation of jump station to that need to parse panel
Panel is transferred to paddle website, and analysis personnel need to parse panel from the taking-up of paddle website to carry out bad analysis.
Specifically, in producing line, panel is made by motherboard, is arranged on each motherboard and is correspondingly formed the multiple of multiple panels
Mould position；The reporting system calculate in minimum time unit by abnormality code represented by the bad type of panel occurrence quantity
And occurrence quantity ranking, high-incidence mould position is calculated according to the bad panel number on motherboard difference mould position, according in different producing lines not
It is other that good panel number calculates high hair line.
Specifically, the minimum time unit is 0.5-1h；
Specifically, the decision condition of the high-incidence mould position are as follows: assuming that a mould position meets following formula, single mode position corresponding panel
It scraps and count/always scraps several * motherboard mould positions typesetting number >=1.5, then the mould position is high-incidence mould position；
Specifically, the other decision condition of high hair line is；Assuming that a producing line meets following formula, (the useless number of per unit area yield report from a liner/
Always scrap number) * (per unit area yield line output number/Gross Output number) >=0.25%, then the mould position is high-incidence producing line.
Specifically, it includes: to assume exist that analysis personnel, which input to the reporting system for the piece logic that takes of bad panel,
High-incidence mould position and high hair line are other, then preferentially carry out chip select by the output sequence of bad panel from high-incidence mould position and select that face need to be parsed
The piece amount that takes of plate, then Xuan Ze not need to parse panel from high hair line, high-incidence mould position is that 80%, the Dan Gaofa mould position of piece amount is always taken to take
The piece number is no more than 5, such as high-incidence mould position can get it is specified take piece quantity, then no longer see that high hair line is other；Assuming that there is no high-incidence
Mould position then need to parse panel to the selection of different mould positions at random, and each line is other, and to take piece amount be that the line is not scrapped the piece number/totality and scrapped
The piece number * totally takes piece set amount.
It is of the invention to take piece method for bad analysis, using be used for as described above the sheet-fetching system of bad analysis into
Row, during taking piece at the bad analysis of box factory, sheet-fetching system automatic identification need to parse panel, add flag, automatic jump automatically
It stands, analysis personnel, only with two steps that setting takes piece logic and taking-up need to parse panel are executed, save people during taking piece
Power, while can take piece to high-incidence exception in time, promotes analysis of anomaly response speed, be substantially improved it is bad analyze take piece from
Dynamicization and intelligent operation are horizontal.
In conclusion sheet-fetching system for bad analysis of the invention and taking piece method, taken at the bad analysis of box factory
During piece, sheet-fetching system automatic identification need to parse panel, add flag, automatic jump station automatically, and analysis personnel are taking piece process
In only need to parse two steps of panel with executing setting and take piece logic and take out, save manpower, while can be in time to high-incidence different
It often carries out taking piece, promotes analysis of anomaly response speed, the bad intellectually and automatically level of operation analyzed and take piece is substantially improved.
The above for those of ordinary skill in the art can according to the technique and scheme of the present invention and technology
Other various corresponding changes and modifications are made in design, and all these change and modification all should belong to the appended right of the present invention
It is required that protection scope.
Claims (10)
1. a kind of sheet-fetching system for bad analysis, which is characterized in that including reporting system and between the reporting system
The operating system of data concatenating；The reporting system is collected and shows to the faceplate formation in producing line, the operating system
Assignment is carried out to the flow direction of the panel in producing line；
The reporting system is built-in with logic development module, and the logic development module is used to take piece logic to select according to what is received
Panel need to be parsed by selecting out, and will need to parse the data information transfer of panel to operating system, and the operating system is to need to parse face
Plate addition process code simultaneously executes the operation of jump station to that need to parse panel, and the operating system need to parse panel and be transferred to paddle station
Point.
2. being used for the sheet-fetching system of bad analysis as described in claim 1, which is characterized in that it further include terminal device, it is described
Terminal device has system management interface, takes piece to patrol to reporting system input by the system management interface of terminal device
Volume, it is described to take piece logical transport to the logic development module.
3. being used for the sheet-fetching system of bad analysis as claimed in claim 2, which is characterized in that the system pipes of the terminal device
Reason interface is equipped with for generating the multiple tabss for taking piece logic.
4. being used for the sheet-fetching system of bad analysis as claimed in claim 3, which is characterized in that the multiple tabs includes producing
Category type tabs, abnormality code tabs, exception level tabs, mould position tabs and take piece quantity tabs.
5. being used for the sheet-fetching system of bad analysis as claimed in claim 2, which is characterized in that the terminal device is to calculate
Machine.
6. being used for the sheet-fetching system of bad analysis as described in claim 1, which is characterized in that the paddle website has automatic
Paddle machine, the automatic paddle machine read the process code that need to be parsed on panel automatically and identify that this need to parse panel, then will
Panel need to be parsed to be transferred in collection box.
7. a kind of be used for bad analysis using such as the sheet-fetching system of any of claims 1-6 for bad analysis
Take piece method characterized by comprising Xiang Suoshu reporting system input piece logic, the report are taken for bad panel
The logic development module of system need to parse panel according to taking piece logic to select, and will need to parse the data information transfer of panel to
Operating system, the operating system, need to that need to parse panel addition process code and execute the operation of jump station to that need to parse panel
Parsing panel is transferred to paddle website, need to parse panel from the taking-up of paddle website to carry out bad analysis.
8. taking piece method for bad analysis as claimed in claim 7, which is characterized in that in producing line, panel is by motherboard
It is made, the multiple mould positions for being correspondingly formed multiple panels is arranged on each motherboard；
The reporting system calculate in minimum time unit by abnormality code represented by the bad type of panel occurrence quantity
And occurrence quantity ranking, high-incidence mould position is calculated according to the bad panel number on motherboard difference mould position, according in different producing lines not
It is other that good panel number calculates high hair line.
9. taking piece method for bad analysis as claimed in claim 8, which is characterized in that the minimum time unit is
0.5-1h；
The decision condition of the high-incidence mould position are as follows: assuming that a mould position meets following formula, single mode position corresponding panel scraps number/total report
Useless number * motherboard mould position typesetting number >=1.5, then the mould position is high-incidence mould position；
The other decision condition of high hair line is；Assuming that a producing line meets following formula, (the useless number of per unit area yield report from a liner/always scrap number) *
(per unit area yield line output number/Gross Output number) >=0.25%, then the mould position is high-incidence producing line.
10. taking piece method for bad analysis as claimed in claim 9, which is characterized in that the input of Xiang Suoshu reporting system
The piece logic that takes for bad panel includes: hypothesis there are high-incidence mould position and high hair line are other, then preferentially from high-incidence mould position by bad
The output sequential selection of panel need to parse panel, then Xuan Ze not need to parse panel from high hair line；Assuming that high-incidence mould position is not present, then
Panel need to be parsed to the selection of different mould positions at random.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910319979.1A CN109946862B (en) | 2019-04-19 | 2019-04-19 | Film taking system and method for failure analysis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910319979.1A CN109946862B (en) | 2019-04-19 | 2019-04-19 | Film taking system and method for failure analysis |
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| CN109946862A true CN109946862A (en) | 2019-06-28 |
| CN109946862B CN109946862B (en) | 2021-09-21 |
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ID=67014362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910319979.1A Active CN109946862B (en) | 2019-04-19 | 2019-04-19 | Film taking system and method for failure analysis |
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| CN115741945A (en) * | 2023-01-06 | 2023-03-07 | 江苏泰治科技股份有限公司 | Lamination method and system applied to ceramic tube shell production |
| US11797557B2 (en) | 2020-12-03 | 2023-10-24 | Boe Technology Group Co., Ltd. | Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis |
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