CN109946628A - A method of separation magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width - Google Patents
A method of separation magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width Download PDFInfo
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- CN109946628A CN109946628A CN201910232031.2A CN201910232031A CN109946628A CN 109946628 A CN109946628 A CN 109946628A CN 201910232031 A CN201910232031 A CN 201910232031A CN 109946628 A CN109946628 A CN 109946628A
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- magnetic field
- line width
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- pumped magnetometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
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Abstract
The present invention provides a kind of separation magnetic field strength and the method that is influenced on high temperature optically pumped magnetometer line width of magnetic field gradient, wherein high temperature optically pumped magnetometer line width test device of the present invention, including high temperature optically pumped magnetometer system, tests coil, shields bucket, current source.High temperature optically pumped magnetometer system is placed in test coil central axes, and test coil is placed in shielding bucket and coaxial, and current source is used for test coil input current to generate controllable magnetic field.The formant line width generated in high temperature optically pumped magnetometer by magnetic fields can be tested using above-mentioned apparatus, line width finally characterizes magnetometer sensitivity.Since magnetic field strength has an impact line width by different mechanism from magnetic field gradient, influence of the two to it is separated by control variate method, the quantitative relationship that the two influences line width is finally obtained, is compared with theoretical formula.High temperature optically pumped magnetometer system model can be improved using the method, measure its gradient tolerance, while having positive effect to line width is narrowed to reach more highly sensitive.
Description
Technical field
The present invention relates to magnetic survey technical fields, and in particular to a kind of high temperature optically pumped magnetometer system, and separation magnetic
The method that field intensity and magnetic field gradient influence high temperature optically pumped magnetometer line width, adopting said method can improve high temperature optically pumped magnetometer
System model measures its gradient tolerance, while having positive effect to line width is narrowed to reach more highly sensitive.
Background technique
Optically pumped magnetometer is utilized by the polarized high density hot atom of specific frequency circular polarization pumping light (about 140 DEG C), with
It will do it Larmor precession under the consistent external magnetic field of pumping light direction, precession frequency ω and external magnetic field B are in a certain range
It is interior directly proportional, ω=γ B.Applying a branch of linear polarization detection light perpendicular to pumping light direction, using Faraday effect come
Detect the variation of atom assemblage.Applying transverse rotating magnetic field with external magnetic field vertical plane, when its speed and precession frequency
It resonates when consistent, detected amplitude reaches maximum, to complete the purpose in measurement magnetic field.When magnetic field strength is larger, magnetic is total
Vibration can be divided further inside peak, and the line width of whole magnetic resonance is caused to increase.Sensitive source hot atom is loaded in glass gas chamber, when
When gas chamber is in gradient magnetic, due to the bulk of glass gas chamber cause not homoatomic assemblage experience field strength values not
Unanimously, it is finally reflected when on formant, increases its line width.And when using test coil to simulate magnetic field to be measured, magnetic field
Intensity can change simultaneously with magnetic field gradient, can not determine which factor leads to widening for magnetic resonance in the two.Therefore, in order to more
High temperature optically pumped magnetometer system is accurately described, on the basis of existing high temperature optically pumped magnetometer test macro, needs to find one
Kind can separate the method that magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width.
Summary of the invention
It is an object of the invention to separate magnetic field strength and magnetic field gradient to influence high temperature optically pumped magnetometer line width, height is improved
Warm optically pumped magnetometer system model.In addition, adopting said method can measure its its gradient tolerance, while to narrowing line width to reach
It is more highly sensitive to have positive effect.
To achieve the goals above, The technical solution adopted by the invention is as follows:
A kind of high temperature optically pumped magnetometer line width test device, including high temperature optically pumped magnetometer system, test coil, shielding
Bucket, current source.Wherein, high temperature optically pumped magnetometer system is located at test coil center, and test coil is located at front and back inside shielding bucket
Concordant and coaxial, current source is located at outside, is connect between test coil with cable.
In above-mentioned high temperature optically pumped magnetometer line width test device, high temperature optically pumped magnetometer system uses and is heated to 140
DEG C high-temperature high-density K atom do sensitive source, sensitive direction is the direction z.
In above-mentioned high temperature optically pumped magnetometer line width test device, test coil forms not similar shape by copper conductor coiling
Shape can be controlled by current source, generate the magnetic field of x, y, z direction varying strength, the uniformity.
In above-mentioned high temperature optically pumped magnetometer line width test device, shielding bucket is a kind of commonly used equipment, outer for shielding
The external world can be greatly reduced to the interference of internal magnetic field strength and the interference of magnetic noise in ground magnetic environment in boundary simultaneously.
In above-mentioned high temperature optically pumped magnetometer line width test device, current source is a kind of commonly used equipment, output connection
In test lead-out wires of coil, for supplying power for.
A method of separation magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width, including walk as follows
It is rapid:
(1) current source applies a constant current in test coil, and high temperature optically pumped magnetometer is placed in test coil central axes
And mobile different location, test the magnetic field value and magnetic resonance line width at different location.It is fitted the 4 of out position and magnetic field strength
Secondary curve.
(2) to Magnetic field strength curve figure derivation, 3 curve graphs of you can get it position and magnetic field gradient.
(3) change different current values, repeat step 1, obtain different magnetic field intensity, position curve figure.
(4) change different current values, repeat step 2, obtain different magnetic field gradient, position curve figure.
(5) magnetic field strength, position curve figure are indicated on same figure, and an auxiliary line is drawn at particular magnetic field strength value,
Obtain itself and line width corresponding to the intersection point of different curves.This can obtain one timing of magnetic field strength, the pass of magnetic field gradient and line width
It is formula.
(6) magnetic field gradient, position curve figure are indicated on same figure, and an auxiliary line is drawn at specific magnetic fields gradient value,
Obtain itself and line width corresponding to the intersection point of different curves.This can obtain one timing of magnetic field gradient, the pass of magnetic field strength and line width
It is formula.
Compared with prior art, the present invention having the following beneficial effects:
(1) method that separation magnetic field strength of the invention and magnetic field gradient influence high temperature optically pumped magnetometer line width, is passing
On the basis of high temperature optically pumped magnetometer system of uniting, the magnetic field strength of different location on test coil central axes is surveyed with line width
Amount, by obtaining magnetic field gradient position curve to curve derivation.It is compared to center magnetic field gradient in traditionally shielding bucket
The reduction for being zero, can be more accurately perfect to model.
(2) method that separation magnetic field strength of the invention and magnetic field gradient influence high temperature optically pumped magnetometer line width, finally
It can obtain the expression formula that magnetic field gradient influences line width, in conjunction with the physical size of sensitive source gas room, can finally obtain high temperature optical pumping
The gradient tolerance of magnetometer system.
(3) method that separation magnetic field strength of the invention and magnetic field gradient influence high temperature optically pumped magnetometer line width, finally
More accurately system model is obtained, based on this, bucking coil is superimposed on the basis of testing coil, optimizes sensitive source gas room
The magnetic field gradient of present position narrows line width, promotes sensitivity.
Detailed description of the invention
Fig. 1 be high temperature optically pumped magnetometer line width test device of the invention, wherein 1 be high temperature optically pumped magnetometer system, 2
To test coil, 3 be shielding bucket, and 4 be current source, and 5 be support plate.
Fig. 2 is relevant high temperature optically pumped magnetometer system schematic in the present invention.
Fig. 3 is magnetic field strength and positional diagram of the invention.
Fig. 4 is magnetic field gradient and positional diagram of the invention.
Specific embodiment
The present invention is further described in detail with reference to the accompanying drawing:
As shown in Figure 1, high temperature optically pumped magnetometer line width test device of the invention, including high temperature optically pumped magnetometer system 1,
Test coil 2, shielding bucket 3, current source 4.Wherein, high temperature optically pumped magnetometer system 1 is located at 2 center of test coil, tests coil 2
Concordant and coaxial positioned at 3 inside front and back of shielding bucket, current source 4 is located at outside, is connect between test coil 2 with cable.
As shown in Fig. 2, the high temperature optically pumped magnetometer system 1 done using the high-temperature high-density K atom for being heated to 140 DEG C it is quick
Sense source, sensitive direction are the direction z.It include that conventional important component has: laser source, lens group, excitation coil, heating in the system
Device, electronic measurement and control and data acquisition device.Laser source chooses energy level transition D1 line or D2 line, i.e. wavelength corresponding to K atom
For 770.7nm or 766.7nm.Lens group is for changing the polarizability and stability for passing through light, to reach necessary requirement.Excitation
Coil is the executing agency of rotating excitation field.Heating device is for measuring and stablizing gas chamber temperature.When by scanning transverse rotation magnetic
When field frequencies range, at the Frequency point consistent with Larmor precession frequency, magnetometer output signal is reinforced, and it is total that an envelope is integrally formed
Shake peak, so as to complete the conversion measured from magnetic field signal to formant line width.
The test coil 2 forms different shape by copper conductor coiling, is controlled by current source 4, generates x, y, z direction not
The magnetic field of same intensity, the uniformity.9449 coils are generally used, the uniformity in coil center is relatively high, with offset from center,
Field strength values increase in 4 powers, therefore its magnetic field gradient value changes in 3 powers.The coil constant of used test coil is about
500nT/mA。
In above-mentioned high temperature optically pumped magnetometer line width test device, shielding bucket 3 is a kind of commonly used equipment, outer for shielding
The external world can be greatly reduced to the interference of internal magnetic field strength and the interference of magnetic noise in ground magnetic environment in boundary simultaneously.Shielding used
Bucket shields bucket for 4 layers of permalloy, and armoured magnetic field decay factor is 10-5, internal diameter 40cm has sufficiently large space to load
Coil 2 and high temperature optically pumped magnetometer 1 are tested, while can guarantee that there is certain field homogeneity area in coil center.
In above-mentioned high temperature optically pumped magnetometer line width test device, current source 4 is a kind of commonly used equipment, output connection
In test 2 lead-out wire of coil, for supplying power for.Current source used is the LDC205C of Thorlabs company.
Using high temperature optically pumped magnetometer line width test device of the present invention, separation magnetic field strength and magnetic field gradient are realized
On the method that high temperature optically pumped magnetometer line width influences, as shown in Figure 1, including the following steps:
1) current source applies a constant current in test coil, and high temperature optically pumped magnetometer is placed in test coil central axes simultaneously
Mobile different location tests magnetic field value and magnetic resonance line width at different location.It is fitted 4 times of out position and magnetic field strength
Curve.
2) to Magnetic field strength curve figure derivation, 3 curve graphs of you can get it position and magnetic field gradient.
3) change different current values, repeat step 1, obtain different magnetic field intensity, position curve figure.
4) change different current values, repeat step 2, obtain different magnetic field gradient, position curve figure.
5) magnetic field strength, position curve figure are indicated on same figure, an auxiliary line are drawn at particular magnetic field strength value, such as
Shown in Fig. 3, itself and line width corresponding to the intersection point of different curves are obtained.This can obtain the timing of magnetic field strength one, magnetic field gradient with
The relational expression of line width.Simulation curve expression formula in Fig. 3 are as follows:
Y (n)=nx4+2(n-1)
Wherein, y indicates magnetic field strength, and x indicates position, and n is Curve numberings.Particular magnetic field strength chooses 10, and corresponding 4 are not
Same position, line width herein are influenced by magnetic field gradient completely, are no longer influenced by magnetic field strength.
6) magnetic field gradient, position curve figure are indicated on same figure, an auxiliary line are drawn at specific magnetic fields gradient value, such as
Shown in Fig. 4, itself and line width corresponding to the intersection point of different curves are obtained.This can obtain the timing of magnetic field gradient one, magnetic field strength with
The relational expression of line width.Simulation curve expression formula in Fig. 4 are as follows:
Z (n)=4nx3
Wherein, z indicates that magnetic field gradient, x indicate position, and n is Curve numberings.Specific magnetic fields gradient chooses 30, and corresponding 4 are not
Same position, line width herein are influenced by magnetic field strength completely, are no longer influenced by magnetic field gradient.
The foregoing is merely a specific implementation methods of the invention, but protection scope of the present invention is not limited to
This, any related personnel for being familiar with the art in the technical scope disclosed by the present invention, the variation that can readily occur in or
Person's replacement, should all cover within protection scope of the present invention.
The content that description in the present invention is not described in detail belongs to the well-known technique of professional and technical personnel in the field.
Claims (6)
1. a kind of high temperature optically pumped magnetometer line width test device, it is characterised in that: including high temperature optically pumped magnetometer system (1), survey
Try coil (2), shielding bucket (3) and current source (4), wherein high temperature optically pumped magnetometer system (1) is located at test coil (2) center,
It tests coil (2) and is located at that the internal front and back of shielding bucket (3) is concordant and coaxial, and current source (4) is located at outside, between test coil (2)
It is connected with cable.
2. a kind of high temperature optically pumped magnetometer line width test device as described in claim 1, it is characterised in that: the high temperature optical pumping
Magnetometer system (1) does sensitive source using the high-temperature high-density K atom for being heated to 140 DEG C, and sensitive direction is the direction z.
3. a kind of high temperature optically pumped magnetometer line width test device as described in claim 1, it is characterised in that: the test coil
(2) different shape is formed by copper conductor coiling, can be controlled by current source (4), generate x, y, z direction varying strength, the uniformity
Magnetic field.
4. a kind of high temperature optically pumped magnetometer line width test device as described in claim 1, it is characterised in that: the shielding bucket
(3) it is a kind of commonly used equipment, for shielding extraneous ground magnetic environment, the external world can be greatly reduced simultaneously, internal magnetic field strength is done
Disturb the interference with magnetic noise.
5. a kind of high temperature optically pumped magnetometer line width test device as described in claim 1, it is characterised in that: the current source
It (4) is a kind of commonly used equipment, output is connected to test coil (2) lead-out wire, for supplying power for.
6. a kind of method that separation magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width, it is characterised in that: packet
Include following steps:
1) current source applies a constant current in test coil, and high temperature optically pumped magnetometer is placed in test coil central axes and movement
Different location tests magnetic field value and magnetic resonance line width at different location, is fitted 4 songs of out position and magnetic field strength
Line；
2) to Magnetic field strength curve figure derivation, 3 curve graphs of you can get it position and magnetic field gradient；
3) change different current values, repeat step 1, obtain different magnetic field intensity, position curve figure；
4) change different current values, repeat step 2, obtain different magnetic field gradient, position curve figure；
5) magnetic field strength, position curve figure are indicated on same figure, and an auxiliary line is drawn at particular magnetic field strength value, obtains it
From line width corresponding to the intersection point of different curves, this can obtain one timing of magnetic field strength, the relational expression of magnetic field gradient and line width；
6) magnetic field gradient, position curve figure are indicated on same figure, and an auxiliary line is drawn at specific magnetic fields gradient value, obtains it
From line width corresponding to the intersection point of different curves, this can obtain one timing of magnetic field gradient, the relational expression of magnetic field strength and line width.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910232031.2A CN109946628A (en) | 2019-03-26 | 2019-03-26 | A method of separation magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width |
| CN201910806588.2A CN110426654B (en) | 2019-03-26 | 2019-08-29 | Method for separating influence of magnetic field intensity and magnetic field gradient on line width of high-temperature optical pump magnetometer |
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| CN201910232031.2A CN109946628A (en) | 2019-03-26 | 2019-03-26 | A method of separation magnetic field strength and magnetic field gradient influence high temperature optically pumped magnetometer line width |
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| CN201910806588.2A Active CN110426654B (en) | 2019-03-26 | 2019-08-29 | Method for separating influence of magnetic field intensity and magnetic field gradient on line width of high-temperature optical pump magnetometer |
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| CN103033786B (en) * | 2011-10-08 | 2015-07-08 | 中国科学院空间科学与应用研究中心 | Quadrature calibration method and device of triaxial vector magnetometer |
| CN203799001U (en) * | 2014-02-28 | 2014-08-27 | 中国船舶重工集团公司第七一〇研究所 | Dual uniform zone type magnetic field gradient magnetometer calibration device |
| CN103885019B (en) * | 2014-02-28 | 2016-05-04 | 中国船舶重工集团公司第七一〇研究所 | For two homogeneity range type magnetic field generation devices and the calibration steps of magnetometer calibration |
| CN104730484B (en) * | 2015-03-23 | 2017-06-16 | 东南大学 | A kind of decision method of atomic spin magnetometer SERF states |
| CN106872917B (en) * | 2017-03-03 | 2019-08-23 | 电子科技大学 | It is a kind of test magnetic material ferromagnetic resonance line width face in distribution method and system |
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Application publication date: 20190628 |