CN109917270A - Analytical equipment, method and the I&C system of the test data of the board of I&C system - Google Patents
Analytical equipment, method and the I&C system of the test data of the board of I&C system Download PDFInfo
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Abstract
The invention discloses a kind of analytical equipment of the test data of the board of I&C system, method and I&C system, the analytical equipment includes test macro and data processing system；The test macro is for testing the board, to obtain the test data；Whether the data processing system judges the test data within preset reference range for receiving the test data；If the determination result is YES, then the difference according to the test data and scoring a reference value scores to the board；If judging result be it is no, generate fault cues information.Technical solution of the present invention can not only mitigate the working strength of research staff, and error in judgement caused by effectively avoiding artificial contrast from analyzing can also improve the efficiency of test and the analysis of board.
Description
Technical field
The present invention relates to I&C system Integrated-manufacturing Techniques field more particularly to a kind of test numbers of the board of I&C system
According to analytical equipment, method and I&C system.
Background technique
A kind of board (printed circuit board) of I&C system is composition nuclear power station security level or non-security grade I&C system
The board of basic unit, high quality can be such that I&C system efficiently and accurately runs, and low-quality board then will affect instrument control
The running precision and operational efficiency of system, or even will cause the operation troubles of entire nuclear power station, cause safety accident.
In the prior art, it before using board assembly I&C system, needs to parameters such as the electric properties of board
It is tested, the board only met the requirements can just circulate to next link of integrated manufacture I&C system, be unsatisfactory for requiring
Board will provide for research staff, technique expert, manual analysis goes out its reason of generating defect of the board that is unsatisfactory for requiring,
It recycles analysis result to redesign or manufacture board, and test analysis is carried out again to the board after redesign or manufacture,
Until board meets integrated require.
However, the production cycle of I&C system is compressed as the market demand of nuclear power plant instrument control system is continuously increased,
Largely increase the working strength of research staff and technique expert.Meanwhile the quantity and energy of expert have very much
Limit, has been unable to satisfy high-volume board testing requirement and Resolving probiems demand, leads to the production of board, integrates inefficiency,
The packaging efficiency of I&C system and the update iteration of I&C system finally are constrained, or even also will affect the stabilization of nuclear power, height
Effect development.
Summary of the invention
The technical problem to be solved by the present invention is to production, the collection effects in order to overcome the board of I&C system in the prior art
The low defect of rate provides analytical equipment, method and the I&C system of a kind of test data of the board of I&C system.
The present invention is to solve above-mentioned technical problem by following technical proposals:
A kind of analytical equipment of the test data of the board of I&C system, the analytical equipment includes test macro and number
According to processing system；
The test macro is for testing the board, to obtain the test data；
Whether the data processing system judges the test data in preset reference for receiving the test data
Within the scope of, the preset reference range includes preset reference lower limit value and preset reference upper limit value；
If the determination result is YES, then the difference according to the test data and scoring a reference value comments the board
Point, the size of the difference and the score value of the scoring are negatively correlated, wherein the scoring a reference value is under the preset reference
The average value of limit value and preset reference upper limit value；
If judging result be it is no, generate fault cues information.
Preferably, the analytical equipment further includes user interface, the user interface is for showing the fault cues letter
Breath and/or the terminal that the fault cues information is sent to the user bound in advance.
Preferably, the analytical equipment further includes inquiry system, the inquiry system is used to be believed according to the fault cues
Breath inquiry in knowledge base obtains failure cause, and the multipair fault cues information and the failure are stored in the knowledge base
The one-to-one relationship of reason.
Preferably, the analytical equipment further includes data update system, the data update system refers to for receiving to update
Order and more new data, and the knowledge base is updated according to the more new command and the more new data.
Preferably, each described board includes the test data of multiple sub-projects, each described sub-project
The test data correspond to a preset reference range；
The data processing system is used for according to the test data of sub-project described in each and corresponding institute's commentary
Point a reference value obtains the son scoring of each sub-project, the data processing system be also used to by multiple sub- scorings by
It is summed up according to different weighted values, to obtain the scoring of the board.
A kind of I&C system, including board, the I&C system further include the analysis dress of the test data of the board
It sets.
A kind of analysis method of the test data of the board of I&C system, the analysis method include the following steps:
The board is tested, to obtain the test data；
Receive the test data, and judge the test data whether within preset reference range, the default base
Quasi- range includes preset reference lower limit value and preset reference upper limit value；
If the determination result is YES, then the difference according to the test data and scoring a reference value comments the board
Point, the size of the difference and the score value of the scoring are negatively correlated, wherein the scoring a reference value is under the preset reference
The average value of limit value and preset reference upper limit value；
If judging result be it is no, generate fault cues information.
Preferably, the analysis method further includes following steps:
It shows the fault cues information and/or the fault cues information is sent to the end of the user bound in advance
End.
Preferably, the analysis method further includes following steps:
It is inquired in knowledge base according to the fault cues information and obtains failure cause, be stored in the knowledge base multipair
The one-to-one relationship of the fault cues information and the failure cause.
Preferably, the analysis method further includes following steps:
More new command and more new data are received, and is known according to the more new command and more new data update
Know library.
Preferably, each described board includes the test data of multiple sub-projects, each described sub-project
The test data correspond to a preset reference range；
The step of difference according to the test data and scoring a reference value scores to the board is specifically wrapped
It includes:
Each institute is obtained with the corresponding scoring a reference value according to the test data of sub-project described in each
State the son scoring of sub-project；
Multiple sub- scorings are summed up according to different weighted values, to obtain the scoring of the board.
The positive effect of the present invention is that: the analytical equipment in the present invention surveys board using test macro
Examination, obtains the test data of board, judges whether the test data meets preset reference range by data processing system, if
Satisfaction then scores to the board, and the fault message of board is generated if being unsatisfactory for.Thus, it is possible to automatic distinguishing qualification
Board and underproof board, can not only mitigate the working strength of research staff, can also effectively avoid artificial contrast point
Error in judgement caused by analysis improves the efficiency and precision of board test and analysis.
Further, for underproof board, can by inquiry system according to the fault cues information in knowledge
Inquiry obtains failure cause in library.Thus, it is possible to analyze the event for searching unqualified board in time using artificial taste intelligent system
Hinder reason, saves the time of manual analysis, allow research staff to employ one's energies in the research and development of new product, design etc. rich
In creative work.
Further, by the knowledge base data that timely update, new fault category and failure cause is continuously replenished,
Knowledge base data can be made to keep higher timeliness, and improve the precision of failure comparative analysis.
Detailed description of the invention
Fig. 1 is a kind of structural representation of the analytical equipment of the test data of the board of I&C system of the embodiment of the present invention 1
Figure.
Fig. 2 is a kind of structural representation of the analytical equipment of the test data of the board of I&C system of the embodiment of the present invention 2
Figure.
Fig. 3 is a kind of flow chart of the analysis method of the test data of the board of I&C system of the embodiment of the present invention 5.
Fig. 4 is a kind of flow chart of the analysis method of the test data of the board of I&C system of the embodiment of the present invention 6.
Fig. 5 is a kind of flow chart of the analysis method of the test data of the board of I&C system of the embodiment of the present invention 7.
Specific embodiment
The present invention is further illustrated below by the mode of embodiment, but does not therefore limit the present invention to the reality
It applies among a range.
Embodiment 1
A kind of analytical equipment of the test data of the board of I&C system, as shown in Figure 1, the analytical equipment 2 can wrap
Include test macro 21 and data processing system 22；
The test macro 21 is for testing the board 1, to obtain the test data；
Whether the data processing system 22 judges the test data in default base for receiving the test data
Within the scope of standard, the preset reference range includes preset reference lower limit value and preset reference upper limit value；
If the determination result is YES, then the difference according to the test data and scoring a reference value comments the board
Point, the size of the difference and the score value of the scoring are negatively correlated, wherein the scoring a reference value is under the preset reference
The average value of limit value and preset reference upper limit value；
If judging result be it is no, generate fault cues information.
In the present embodiment, the board 1 can be a kind of printed circuit board (pcb board), can be used to control in nuclear power station
Equipment, to realize control and the defencive function of nuclear power station.For example, the board 1 can be an analog acquisition card,
The analog signal of electricity or non electrical quantity form can be acquired, and by the number of collected analog signal processing established practice order position
Value, the numerical value obtained after processing are used as the operating parameter of other equipment.
The test data of the board 1 may include characterizing the data of the electric property or function of board 1.
Specifically, the test data may include input resistance, output resistance, amplification factor, common-mode rejection ratio, differential mode
Inhibit ratio, the amplitude of signal of communication, the period of signal of communication, output voltage, input voltage etc..
It should be noted that those skilled in the art can according to the different type and its concrete application occasion of board 1 and
Select acquisition test data, the embodiment of the present invention to this with no restriction.
In a unrestricted embodiment of the present embodiment, the test data can within preset reference range
To refer to, the test data is greater than the preset reference lower limit value and is less than the preset reference upper limit value.For example, if institute
State certain voltage value V that test data is board0, the preset reference lower limit value is V1, the preset reference upper limit value is V2, when
V0Value meet V1<V0<V2When, it is believed that test data is within preset reference range.
In another unrestricted embodiment of the present embodiment, the test data is within preset reference range
It can refer to, the test data is more than the preset reference lower limit value and below the preset reference upper limit value.Example
Such as: if the test data is certain voltage value V of board0, the preset reference lower limit value is V1, the preset reference upper limit value
For V2, work as V0Value meet V1≤V0≤V2When, it is believed that test data is within preset reference range.
Further, the analytical equipment 2 can also include user interface 24, and the user interface 24 is described for showing
Fault cues information and/or the terminal that the fault cues information is sent to the user bound in advance.
Specifically, the user interface 24 may include display, printer, mouse, keyboard etc., the user interface 24
Information exchange can also be carried out by the terminal of wirelessly or non-wirelessly network and user.The information exchange can be interactive voice
And/or the form of text interaction.
Further, the interactive voice and/or text interaction can by multilingual type (such as: Chinese, English
Language, Japanese etc.), to meet the application of the device in a variety of different occasions of the present embodiment, to expand the region used and range.
The terminal of the user can for disposable type the end PC (PC) or mobile terminal (such as: mobile phone, ipad
(tablet computer)) etc., the present embodiment is without limitation.
In the present embodiment, the form of the scoring can be specifically numerical score form (such as: 100 points, 90 points,
60 points etc.), be also possible to grade classification form (such as: it is excellent, good, in, qualification etc.).Those skilled in the art can be according to tool
Body demand carry out adaptability setting, the embodiment of the present invention is not specifically limited this.
Specifically, the fault cues information can be " voltage performance is unqualified ", " too high in resistance ", " brownout ",
Information such as " amplification factor are unqualified ".
Further, the analytical equipment 2 can also include inquiry system 23, and the inquiry system 23 can be used for basis
The fault cues information is inquired in knowledge base obtains failure cause, and the multipair fault cues are stored in the knowledge base
The one-to-one relationship of information and the failure cause.
In the present embodiment, the scoring, the fault cues information and/or the failure cause can be connect by user
Mouth 24 is shown or is sent to the terminal bound in advance.
It is illustrated below with working principle of the unrestricted concrete application scene to the analytical equipment 2.Example
Such as: the input resistance R3 of the input resistance R1 of board A, the input resistance R2 of board B and board C are tested.
In this concrete application scene, test philosophy can be set to 5.0k Ω -8.5k Ω.That is, working as board
Input resistance meet more than 5.0k Ω and below 8.5k Ω when, the input resistance of the board is met the requirements.
By the test of test device, the input resistance R1 of the board A is 5.2k Ω, the input resistance of the board B
R2 is 6.3k Ω, and the input resistance R3 of the board C is 9.1k Ω.
It is possible, firstly, to be pre-processed to test data, in pretreatment stage, the input electricity of the board A and board B
Resistance can be labeled as board A and board B " input resistance is qualified " all within preset reference range, to board C flag
For " input resistance is excessively high ".
Next, test data can formally be analyzed, in the formal analysis phase, the data processing system identification
Board A and board B is the board of " input resistance is qualified " out, therefore can be directly entered scoring process.Specifically, described
Data processing system can be according to the difference of the specific resistance value of board A and the respective input resistance of board B and scoring a reference value
It is compared, the scoring a reference value can be set to [(5.0+8.5)/2]=6.75k Ω.
The difference of the input resistance 5.2k Ω and scoring a reference value 6.75k Ω of board A are 1.55k Ω, and the input of board B
The difference of resistance 6.3k Ω and scoring a reference value 6.75k Ω are 0.45k Ω.In this case, board A is related to input resistance
The scoring of the electric property of R1 can be 75 points, and the scoring of the electric property for being related to input resistance R2 of board B can be 90 points,
After scoring board A and board B, appraisal result can be shown by display, wireless network can also be passed through
Network is sent on the mobile phone that research staff binds in advance in the form of short message, in addition, in the score for sending board A and board B
When, the data processing system can also generate that board A is adapted for mount to system M and board B is adapted for mount to building for system N
View, and by the mobile phone for suggesting that research staff is shown or be sent to together with score also by display, it is convenient for
Research staff in different systems, rationally utilizes board A and board B reasonable installation to realize with different electric properties
Board.
In the formal analysis phase, the data processing system identifies that board C is " input resistance is excessively high ", it is therefore desirable to look into
Look for the underproof reason of input resistance R3 of board C.Specifically, the inquiry system is according to " input resistance is excessively high " of board C
Fault cues information inquired in knowledge base and obtain corresponding failure cause, be stored with human expert in advance in the knowledge base
The one-to-one relationship of multipair the fault cues information and the failure cause audited.
If the storage of knowledge base be " input resistance is excessively high " prompt information it is corresponding with " failure cause W ", can be with
Failure cause W is shown by display, failure cause W can also be sent to the mobile phone of research staff, convenient for grinding
Hair personnel in time optimize board C.
In a change case, the fault cues information of " input resistance is excessively high " can correspond to " failure cause W " or " event
Hinder reason R " or " failure cause Y ", then can all show research staff with aforesaid plurality of failure cause, have needle convenient for research staff
To analyzing for property, and the real failure cause of board C is found from multiple failure causes of prediction.
Analytical equipment in the present embodiment can not only be subtracted with the board and underproof board of automatic distinguishing qualification
The working strength of light research staff, error in judgement caused by can also effectively avoiding artificial contrast from analyzing improve board test
With the efficiency and precision of analysis.Unqualified board is searched furthermore it is also possible to analyze in time using artificial taste intelligent system
Failure cause saves the time of manual analysis, and research staff is allowed to employ one's energies in the richnesses such as the research and development of new product, design
In creative work.
Embodiment 2
A kind of analytical equipment of the test data of the board of I&C system, as shown in Fig. 2, the analytical equipment in the present embodiment
It is the further improvement to embodiment 1.
Specifically, the analytical equipment 1 can also include data update system 25, and the data update system 25 is for connecing
More new command and more new data are received, and the knowledge base is updated according to the more new command and the more new data.
Further, the renewal frequency of the knowledge base can be as unit of hourage, number of days, months or year.It can be with
Understanding, the renewal frequency of knowledge base is higher, is more conducive to inquiry and obtains accurately failure cause, and it is corresponding, also meet
Face higher human cost.Those skilled in the art can rationally setting be known after comprehensively considering renewal frequency and operating cost
Know library renewal frequency, the present embodiment to this with no restriction.
Human expert can be inspected periodically and audit the analysis of the analytical equipment intelligence completion as a result, and according to institute
It states analysis result and adjusts the one-to-one relationship of the fault cues information and failure cause in time, or added in knowledge base
The corresponding relationship of new fault cues information and failure cause.
The present embodiment can make the data in knowledge base keep higher timeliness, to improve the essence of failure comparative analysis
Accuracy.
Embodiment 3
A kind of analytical equipment of the test data of the board of I&C system, the analytical equipment in the present embodiment is to embodiment
1 or embodiment 2 in analytical equipment further improvement.
Further, each described board may each comprise the test data of multiple sub-projects, described in each
The test data of sub-project can correspond to the preset reference range；
Multiple sub-projects, the data processing system, which are used for according to son described in each, to be included the case where for a board
The test data of project scores with the son that the corresponding scoring a reference value obtains each sub-project, the data
Processing system is also used to sum up multiple sub- scorings according to different weighted values, to obtain the scoring of the board.
The mode to score in the present embodiment the corresponding test data of each sub-project can use embodiment 1
In the marking mode that has been described in detail.
Those skilled in the art can be adaptively adjusted different sons and comment according to the application of specific requirements and board
The weighted value divided, so that the scoring for the board being finally calculated more accurately reflects the performance of board, convenient for research and development people
Board is used for more suitable occasion or system according to scoring.
Embodiment 4
A kind of I&C system, the I&C system can be digitizer control system or simulation I&C system.The instrument control
System can connect the system equipment in nuclear power station by communication network, and can be adapted for the fortune of various types of nuclear power stations
Row control.
The I&C system may include board, can also include described in any embodiment of the embodiment 1 into embodiment 3
Board test data analytical equipment.
Embodiment 5
A kind of analysis method of the test data of the board of I&C system, as shown in figure 3, the analysis method may include
Following steps:
Step S1: testing the board, to obtain the test data；
Step S2: receiving the test data, and judge the test data whether within preset reference range, it is described
Preset reference range includes preset reference lower limit value and preset reference upper limit value；
If the determination result is YES, S3 is thened follow the steps；If judging result be it is no, then follow the steps S4；
Step S3: the difference according to the test data and scoring a reference value scores to the board, the difference
Size and the scoring score value it is negatively correlated, wherein the scoring a reference value is the preset reference lower limit value and pre-
If the average value of benchmark upper limit value；
Step S4: fault cues information is generated.
Further, can also include the following steps: after step S4
Step S5: showing the fault cues information and/or the fault cues information is sent to the use bound in advance
The terminal at family.
Further, can also include the following steps: after step S4
Step S6: it is inquired in knowledge base according to the fault cues information and obtains failure cause, deposited in the knowledge base
Contain the one-to-one relationship of multipair the fault cues information and the failure cause.
Further, can also include the following steps: after step S6
Step S7: showing the failure cause and/or the failure cause is sent to the terminal of the user bound in advance
Further, can also include the following steps: after step S3
Step S8: the display scoring and/or the terminal that the scoring is sent to the user bound in advance.
More contents of specific executive mode about the analysis method in embodiment 5, are referred in embodiment 1
The operation logic about analytical equipment associated description, which is not described herein again.
Analysis method in the present embodiment when being executed can be with the board and underproof board of automatic distinguishing qualification, no
The working strength of research staff can only be mitigated, error in judgement caused by can also effectively avoiding artificial contrast from analyzing improves
The efficiency and precision of board test and analysis.Do not conform to furthermore it is also possible to analyze lookup in time using artificial taste intelligent system
The failure cause of panel card saves the time of manual analysis, allow research staff employ one's energies in new product research and development,
In the creative work such as design.
Embodiment 6
A kind of analysis method of the test data of the board of I&C system, as shown in figure 4, the analysis method in the present embodiment
It is further improvement on the basis of embodiment 5.
Specifically, the analysis method can also include the following steps:
Step S9: more new command and more new data are received, and more according to the more new command and the more new data
The new knowledge base.
Updated knowledge base above-mentioned can continue on for the implementation procedure of step S6.
More contents of specific executive mode about the analysis method in embodiment 6, are referred in embodiment 2
The operation logic about analytical equipment associated description, which is not described herein again.
The present embodiment can make the data in knowledge base keep higher timeliness, to improve the essence of failure comparative analysis
Accuracy.
Embodiment 7
A kind of analysis method of the test data of the board of I&C system, as shown in figure 5, the analysis method in the present embodiment
It is further improvement on the basis of embodiment 5 or embodiment 6.
Specifically, each described board may each comprise the test data of multiple sub-projects, each described son
The test data of project can correspond to the preset reference range；
The step of difference according to the test data and scoring a reference value scores to the board specifically may be used
To include:
Step S131: it is obtained according to the test data of sub-project described in each with the corresponding scoring a reference value
The son scoring of each sub-project；
Step S132: multiple sub- scorings are summed up according to different weighted values, to obtain commenting for the board
Point.
More contents of specific executive mode about the analysis method in embodiment 7, are referred in embodiment 3
The operation logic about analytical equipment associated description, which is not described herein again.
The present embodiment operation method in specific execute, pass through the scoring of multiple sub-projects come overall merit board
Performance, consequently facilitating board is used for more suitable occasion or system according to scoring by research and development people.
Although specific embodiments of the present invention have been described above, it will be appreciated by those of skill in the art that this is only
For example, protection scope of the present invention is to be defined by the appended claims.Those skilled in the art without departing substantially from
Under the premise of the principle and substance of the present invention, many changes and modifications may be made, but these change and
Modification each falls within protection scope of the present invention.
Claims (11)
1. a kind of analytical equipment of the test data of the board of I&C system, which is characterized in that the analytical equipment includes test
System and data processing system；
The test macro is for testing the board, to obtain the test data；
Whether the data processing system judges the test data in preset reference range for receiving the test data
Within, the preset reference range includes preset reference lower limit value and preset reference upper limit value；
If the determination result is YES, then the difference according to the test data and scoring a reference value scores to the board, institute
The size for stating difference and the score value of the scoring are negatively correlated, wherein the scoring a reference value is the preset reference lower limit value
And the average value of preset reference upper limit value；
If judging result be it is no, generate fault cues information.
2. the analytical equipment of the test data of the board of I&C system as described in claim 1, which is characterized in that the analysis
Device further includes user interface, and the user interface is for showing the fault cues information and/or believing the fault cues
Breath is sent to the terminal of the user bound in advance.
3. the analytical equipment of the test data of the board of I&C system as described in claim 1, which is characterized in that the analysis
Device further includes inquiry system, and the inquiry system obtains failure for inquiring in knowledge base according to the fault cues information
Reason is stored with the one-to-one relationship of multipair the fault cues information and the failure cause in the knowledge base.
4. the analytical equipment of the test data of the board of I&C system as claimed in claim 3, which is characterized in that the analysis
Device further includes data update system, and the data update system is used to receive more new command and more new data, and according to institute
It states more new command and the more new data updates the knowledge base.
5. the analytical equipment of the test data such as the board of the described in any item I&C systems of Claims 1-4, feature exist
In each described board includes the test data of multiple sub-projects, the test number of each sub-project
According to corresponding preset reference range；
The data processing system is used for according to the test data of sub-project described in each and the corresponding scoring base
Quasi- value obtains the son scoring of each sub-project, and the data processing system is also used to multiple sub- scorings according to not
Same weighted value sums up, to obtain the scoring of the board.
6. a kind of I&C system, including board, which is characterized in that the I&C system further includes any one of claim 1 to 5 institute
The analytical equipment of the test data for the board stated.
7. a kind of analysis method of the test data of the board of I&C system, which is characterized in that the analysis method includes as follows
Step:
The board is tested, to obtain the test data；
Receive the test data, and judge the test data whether within preset reference range, the preset reference model
It encloses including preset reference lower limit value and preset reference upper limit value；
If the determination result is YES, then the difference according to the test data and scoring a reference value scores to the board, institute
The size for stating difference and the score value of the scoring are negatively correlated, wherein the scoring a reference value is the preset reference lower limit value
And the average value of preset reference upper limit value；
If judging result be it is no, generate fault cues information.
8. the analysis method of the test data of the board of I&C system as claimed in claim 7, which is characterized in that the analysis
Method further includes following steps:
It shows the fault cues information and/or the fault cues information is sent to the terminal of the user bound in advance.
9. the analysis method of the test data of the board of I&C system as claimed in claim 7, which is characterized in that the analysis
Method further includes following steps:
It is inquired in knowledge base according to the fault cues information and obtains failure cause, be stored in the knowledge base multipair described
The one-to-one relationship of fault cues information and the failure cause.
10. the analysis method of the test data of the board of I&C system as claimed in claim 9, which is characterized in that described point
Analysis method further includes following steps:
More new command and more new data are received, and the knowledge is updated according to the more new command and the more new data
Library.
11. the analysis method of the test data such as the board of the described in any item I&C systems of claim 7 to 10, feature exist
In each described board includes the test data of multiple sub-projects, the test number of each sub-project
According to corresponding preset reference range；
The step of difference according to the test data and scoring a reference value scores to the board specifically includes:
Each described son is obtained with the corresponding scoring a reference value according to the test data of sub-project described in each
The son scoring of project；
Multiple sub- scorings are summed up according to different weighted values, to obtain the scoring of the board.
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