CN109898064B - DLC/Me-C composite film and preparation method thereof - Google Patents

DLC/Me-C composite film and preparation method thereof Download PDF

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CN109898064B
CN109898064B CN201910249651.7A CN201910249651A CN109898064B CN 109898064 B CN109898064 B CN 109898064B CN 201910249651 A CN201910249651 A CN 201910249651A CN 109898064 B CN109898064 B CN 109898064B
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魏秋平
马莉
周科朝
余志明
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Hunan Xinfeng Technology Co ltd
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Central South University
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Abstract

一种DLC/Me‑C复合薄膜及其制备方法,所述复合薄膜是在金属或合金基体表面采用磁控溅射技术依次制备Me‑C薄膜、DLC薄膜。其制备方法是是将金属或合金基体置于磁控溅射设备中,在金属或合金基体表面原位制备Me‑C薄膜和DLC薄膜。本发明采用射频偏压辅助磁控溅射沉积DLC,高效率地制备出膜基结合强度高,力学性能、耐摩擦性能和耐腐蚀性能均优异的类金刚石薄膜。本发明选用Me‑C过渡层作为缓冲层,解决了DLC膜内应力过高的问题;同时在制备Me‑C缓冲层之前,使用等离子体轰击基底,制备非晶改性层,改善基体表面状态,减小基体和第二相之间腐蚀电位,结果证实非晶层/Me‑C/DLC膜具有优异的力学性能和耐腐蚀性能。

Figure 201910249651

A DLC/Me-C composite thin film and a preparation method thereof. The composite thin film is prepared by using magnetron sputtering technology on the surface of a metal or alloy substrate to sequentially prepare a Me-C thin film and a DLC thin film. The preparation method is that a metal or alloy substrate is placed in a magnetron sputtering device, and Me-C thin films and DLC thin films are prepared in situ on the surface of the metal or alloy substrate. The invention adopts radio frequency bias to assist magnetron sputtering to deposit DLC, and efficiently prepares a diamond-like film with high bonding strength of film base and excellent mechanical properties, friction resistance and corrosion resistance. In the present invention, the Me-C transition layer is selected as the buffer layer, which solves the problem of excessive stress in the DLC film; at the same time, before the Me-C buffer layer is prepared, the substrate is bombarded with plasma to prepare the amorphous modified layer, and the surface state of the substrate is improved. , reducing the corrosion potential between the matrix and the second phase, and the results confirm that the amorphous layer/Me‑C/DLC film has excellent mechanical properties and corrosion resistance.

Figure 201910249651

Description

一种DLC/Me-C复合薄膜及其制备方法A kind of DLC/Me-C composite film and preparation method thereof

技术领域technical field

本发明公开了一种DLC/Me-C复合薄膜及其制备方法,属于类金刚石薄膜材料制备技术领域。The invention discloses a DLC/Me-C composite film and a preparation method thereof, belonging to the technical field of diamond-like film material preparation.

背景技术Background technique

类金刚石薄膜具有优异的力学、耐摩擦性能、抗腐蚀性能,且可以在低温下沉积,在摩擦学、生物医用等领域有着很大的应用潜力。但类金刚石薄膜存在一个特性——内应力高,这使得膜基结合力十分弱且自身厚度十分有限。为此类金刚石薄膜必须添加过渡层或者掺杂。而掺杂则可能弱化类金刚石薄膜某一方面的性能。所以寻找一种合适的过渡层是促进类金刚石薄膜应用的关键。过渡层不仅仅影响类金刚石薄膜的结合力,对耐腐蚀性能也影响很大,所以除了与基体和类金刚石薄膜都结合强度高外,还得自身腐蚀电阻大,不加速薄膜或者基底的腐蚀。Diamond-like carbon films have excellent mechanical, friction resistance, corrosion resistance, and can be deposited at low temperature, and have great application potential in tribology, biomedical and other fields. However, the diamond-like carbon film has a characteristic - high internal stress, which makes the bonding force of the film base very weak and its own thickness is very limited. A transition layer or doping must be added for such diamond films. Doping, on the other hand, may weaken the performance of a certain aspect of the diamond-like carbon film. Therefore, finding a suitable transition layer is the key to promoting the application of diamond-like carbon films. The transition layer not only affects the bonding force of the diamond-like carbon film, but also has a great influence on the corrosion resistance. Therefore, in addition to the high bonding strength with the matrix and the diamond-like carbon film, it also has a high corrosion resistance and does not accelerate the corrosion of the film or substrate.

目前,类金刚石薄膜主要有阴极弧沉积、等离子增强CVD(PECVD)和磁控溅射三种制备方法。At present, there are three main preparation methods for diamond-like carbon films: cathodic arc deposition, plasma enhanced CVD (PECVD) and magnetron sputtering.

阴极弧是最早用来沉积类金刚石薄膜的一种方法,是在强电场的作用下,将碳原子沉积到基底上,其存在的主要缺陷是:1,制备的类金刚石薄膜具有极高的内应力局限了类金刚石薄膜的厚度在纳米级,难以添加过渡层或者掺杂;2,强电场导致会有大量石墨颗粒被轰击出来最后沉积在基底上,无法获得高质量的类金刚石薄膜,而通过添加磁过滤装置减少石墨颗粒却会同时过滤很大一部分碳离子或原子降低沉积效率,且过滤装置复杂成本高。尽管磁过滤阴极弧能制备出高sp3C含量的类金刚石薄膜,但无法工业化应用,并未受到企业的青睐。Cathodic arc is one of the earliest methods used to deposit diamond-like carbon films. It is to deposit carbon atoms on the substrate under the action of a strong electric field. The main defects are: 1. The prepared diamond-like carbon films have extremely high internal The stress limits the thickness of the diamond-like carbon film to the nanometer level, and it is difficult to add a transition layer or doping; 2. The strong electric field causes a large number of graphite particles to be bombarded and finally deposited on the substrate, so high-quality diamond-like carbon film cannot be obtained. Adding a magnetic filter device to reduce graphite particles will filter a large part of carbon ions or atoms at the same time and reduce the deposition efficiency, and the filter device is complicated and costly. Although magnetic filtration cathodic arc can prepare diamond-like carbon films with high sp3C content, it cannot be applied industrially and is not favored by enterprises.

PECVD制备类金刚石薄膜沉积效率高,且类金刚石薄膜sp3C含量高的同时内应力相对较低,综合性能优异,然而其掺杂元素必须以气氛形式输入,这极大的阻碍了制备金属掺杂类金刚石薄膜。The deposition efficiency of the diamond-like carbon film prepared by PECVD is high, and the sp3C content of the diamond-like carbon film is relatively low, and the internal stress is relatively low, and the comprehensive performance is excellent. However, its doping elements must be input in the form of atmosphere, which greatly hinders the preparation of metal-doped films diamond film.

磁控溅射主要包括离子源辅助磁控溅射和直流偏压磁控溅射;离子源辅助磁控溅射可以制备的类金刚石薄膜结合强度高,种类多,但综合性能上稍差,离子源及其维护成本高。而直流偏压磁控溅射制备类金刚石薄膜时,由于溅射时靶表面会生成并累积覆盖碳化物等而导致金属靶绝缘,轰击靶面的正离子会在靶面上累积,导致靶电位上升,使得电极间的电场逐渐变小,直至辉光放电熄灭和溅射停止,同时,由于DLC膜本身导电性很差,直流偏压效果则会减弱甚至不再起作用,导致薄膜沉积厚度受限。在三种不同制备方法中,基底偏压都是必不可少的,但由于类金刚石薄膜的电导率极低,而现有技术通常采用直流偏压,因此,随着沉积厚度的增加基底偏压对类金刚石薄膜结构的影响减弱,当厚度达到4μm时完全失效。Magnetron sputtering mainly includes ion source assisted magnetron sputtering and DC bias magnetron sputtering; ion source assisted magnetron sputtering can prepare diamond-like carbon films with high bonding strength and many types, but the overall performance is slightly worse. Source and maintenance costs are high. When DC bias magnetron sputtering is used to prepare diamond-like carbon films, the metal target is insulated due to the formation and accumulation of carbides on the target surface during sputtering, and the positive ions bombarding the target surface will accumulate on the target surface, resulting in the potential of the target. The electric field between the electrodes gradually decreases until the glow discharge is extinguished and the sputtering stops. At the same time, due to the poor conductivity of the DLC film itself, the DC bias effect will weaken or even no longer work, resulting in limited film deposition thickness. . In the three different preparation methods, the substrate bias is essential, but since the conductivity of the diamond-like carbon film is extremely low, and the prior art usually uses a DC bias, the substrate bias increases with the increase of the deposition thickness. The effect on the structure of the diamond-like carbon film is weakened, and it fails completely when the thickness reaches 4 μm.

另外,由于DLC薄膜的缺陷,电解质沿着缺陷扩散到基底,形成微电池腐蚀,腐蚀速率非常快甚至超过没有薄膜保护的基底,导致DLC薄膜保护的基体长期耐腐蚀性能不良。现有技术虽然有采用过渡层的结构,但其并未解决膜层、过渡层与基体之间的电位问题,其耐腐蚀性能并不如人意。In addition, due to the defects of the DLC film, the electrolyte diffuses to the substrate along the defects, resulting in corrosion of the microbattery, and the corrosion rate is very fast even exceeding the substrate without film protection, resulting in poor long-term corrosion resistance of the substrate protected by the DLC film. Although the prior art adopts the structure of the transition layer, it does not solve the potential problem between the film layer, the transition layer and the substrate, and its corrosion resistance performance is not satisfactory.

综上,现有技术存在膜基结合力不理想、膜层内应力大、耐腐蚀性能不理想、制备成本高等缺陷,因此,急需提供一种有效解决方案。To sum up, the existing technology has the defects of unsatisfactory film-base bonding force, large internal stress of the film layer, unsatisfactory corrosion resistance, and high preparation cost. Therefore, it is urgent to provide an effective solution.

发明内容SUMMARY OF THE INVENTION

本发明的目的在于提供一种低成本高效率制备综合性能优异的类金刚石薄膜的方法。The purpose of the present invention is to provide a low-cost and high-efficiency method for preparing a diamond-like carbon film with excellent comprehensive properties.

本发明一种DLC/Me-C复合薄膜,是在金属或合金基体表面采用磁控溅射技术依次制备Me-C薄膜、DLC薄膜。The present invention is a DLC/Me-C composite film, which is to prepare Me-C film and DLC film sequentially on the surface of a metal or alloy substrate by using magnetron sputtering technology.

本发明一种DLC/Me-C复合薄膜,在金属或合金基体表面制备非晶态金属或合金改性层后,采磁控溅射技术依次制备Me-C薄膜、DLC薄膜;非晶态金属或合金改性层的厚度为5~100nm。The invention is a DLC/Me-C composite film. After the amorphous metal or alloy modified layer is prepared on the surface of the metal or alloy substrate, the Me-C film and the DLC film are sequentially prepared by the magnetron sputtering technology; Or the thickness of the alloy modified layer is 5-100 nm.

本发明一种DLC/Me-C复合薄膜,金属或合金基体选自金属镁、铝、钛、铜、铁及其合金。The present invention is a DLC/Me-C composite film, wherein the metal or alloy matrix is selected from the group consisting of metal magnesium, aluminum, titanium, copper, iron and alloys thereof.

本发明一种DLC/Me-C复合薄膜,所述的Me-C薄膜为梯度结构,所述的Me-C薄膜中Me含量依次递减,而C含量依次增加,Me-C薄膜中的Me选自可形成强碳化物元素;具体选自Cr、Ti、Si、W、Mo中的一种。The present invention is a DLC/Me-C composite film, wherein the Me-C film has a gradient structure, the Me content in the Me-C film decreases sequentially, while the C content increases sequentially, and the Me in the Me-C film is selected Self-formable strong carbide element; specifically selected from one of Cr, Ti, Si, W, Mo.

本发明一种DLC/Me-C复合薄膜的制备方法,是将金属或合金基体置于磁控溅射设备中,在金属或合金基体表面原位制备Me-C薄膜和DLC薄膜。A method for preparing a DLC/Me-C composite thin film of the present invention is to place a metal or alloy substrate in a magnetron sputtering device, and in-situ prepare a Me-C thin film and a DLC thin film on the surface of the metal or alloy substrate.

本发明一种DLC/Me-C复合薄膜的制备方法,Me-C薄膜采用反应磁控溅射制备,以Me作为溅射靶材,溅射气氛为Ar与C2H2、CH4中的至少一种的混合气氛,溅射源选自射频、中频或直流电源中的一种,制备过程中,控制Me的含量线性降低,含碳气氛的流量线性增加,制备梯度Me-C薄膜;Me的含量线性降低的速率与含碳气氛的流量线性增加的速率相同;The present invention provides a method for preparing a DLC/Me-C composite thin film. The Me-C thin film is prepared by reactive magnetron sputtering, Me is used as a sputtering target, and the sputtering atmosphere is Ar, C 2 H 2 , and CH 4 . At least one mixed atmosphere, the sputtering source is selected from one of radio frequency, intermediate frequency or DC power supply, during the preparation process, the content of Me is controlled to decrease linearly, and the flow rate of the carbon-containing atmosphere increases linearly to prepare a gradient Me-C thin film; The rate of linear decrease of the content of carbon-containing atmosphere is the same as the rate of linear increase of the flow rate of carbon-containing atmosphere;

磁控溅射工艺参数为:The magnetron sputtering process parameters are:

混合气氛中Ar与C2H2或者Ar与CH4的流量比为1-8,靶功率密度为3.5-18.5W·cm-2,工作气压为0.5-10Pa,沉积时间5-60min。In the mixed atmosphere, the flow ratio of Ar to C 2 H 2 or Ar to CH 4 is 1-8, the target power density is 3.5-18.5W·cm -2 , the working pressure is 0.5-10Pa, and the deposition time is 5-60min.

制备过程中,Me的含量逐渐减小到0,含碳气氛的含量从0逐渐增加到100%;During the preparation process, the content of Me gradually decreased to 0, and the content of carbon-containing atmosphere gradually increased from 0 to 100%;

DLC薄膜制备时,采用石墨靶或者金属作为溅射靶材,采用石墨作为靶材时溅射气氛为氩气,溅射源为射频、中频或直流电源;磁控溅射工艺参数为:When the DLC film is prepared, a graphite target or metal is used as the sputtering target. When graphite is used as the target, the sputtering atmosphere is argon, and the sputtering source is radio frequency, intermediate frequency or DC power supply; the magnetron sputtering process parameters are:

靶功率密度为3.5-18.5W·cm-2,工作气压为0.25-5Pa,沉积时间5-60min,施加偏压20V-300V。The target power density is 3.5-18.5W·cm -2 , the working pressure is 0.25-5Pa, the deposition time is 5-60min, and the bias voltage is 20V-300V.

采用金属靶溅射时,溅射气氛为Ar与C2H2或者Ar与CH4的混合气氛,溅射源为射频或中频电源;金属靶材选自W、Mo、Ti、Cr、Si、Al中的一种或其合金;磁控溅射工艺参数为:When a metal target is used for sputtering, the sputtering atmosphere is a mixed atmosphere of Ar and C 2 H 2 or Ar and CH 4 , and the sputtering source is a radio frequency or intermediate frequency power supply; the metal target is selected from W, Mo, Ti, Cr, Si, One of Al or its alloy; the magnetron sputtering process parameters are:

混合气氛中Ar与C2H2或者Ar与CH4的流量比为0.5-6,靶功率密度为3.5-18.5W·cm-2,工作气压为0.5-10Pa,沉积时间5-60min,施加偏压20V-300V。In the mixed atmosphere, the flow ratio of Ar and C 2 H 2 or Ar and CH 4 is 0.5-6, the target power density is 3.5-18.5W·cm -2 , the working pressure is 0.5-10Pa, the deposition time is 5-60min, and the bias is applied. Voltage 20V-300V.

本发明一种DLC/Me-C复合薄膜的制备方法,制备DLC薄膜时,初始偏压为20-25V,磁控溅射过程中,每隔5-10分钟调增一次偏压,偏压调增幅度为5-30V,当偏压达到300V时,停止偏压调增,使得薄膜具有由内而外不断增强的梯度硬度,降低薄膜内的残余应力,提高薄膜抗磨损性能。The invention provides a method for preparing a DLC/Me-C composite film. When preparing the DLC film, the initial bias voltage is 20-25V. During the magnetron sputtering process, the bias voltage is increased every 5-10 minutes, and the bias voltage is adjusted The increase rate is 5-30V. When the bias voltage reaches 300V, the bias voltage adjustment is stopped, so that the film has a gradient hardness that is continuously enhanced from the inside to the outside, reduces the residual stress in the film, and improves the wear resistance of the film.

本发明一种DLC/Me-C复合薄膜的制备方法,将金属或合金基体置于磁控溅射设备的样品基台上,样品基台与接地的真空室绝缘并连接射偏电源,对纯金属或合金基体施加偏压的同时,采用等离子轰击金属或合金基体表面,在金属或合金基体表面进行离子刻蚀与离子注入,得到表面改性层后,采用磁控溅射在金属或合金基体表面改性层上制备Me-C薄膜和DLC薄膜。The present invention is a preparation method of a DLC/Me-C composite film. A metal or alloy substrate is placed on a sample base of a magnetron sputtering equipment, and the sample base is insulated from a grounded vacuum chamber and connected to a polarizing power supply. While the metal or alloy substrate is biased, the surface of the metal or alloy substrate is bombarded with plasma, ion etching and ion implantation are performed on the surface of the metal or alloy substrate, and after the surface modification layer is obtained, magnetron sputtering is used on the metal or alloy substrate. Me-C thin films and DLC thin films were prepared on the surface modified layer.

本发明一种DLC/Me-C复合薄膜的制备方法,等离子轰击处理工艺参数为:A preparation method of a DLC/Me-C composite film of the present invention, and the parameters of the plasma bombardment treatment process are:

施加偏压500-1000V,Ar等离子体或Ar和N等离子体,持续时间10-60min;表面改性层厚度5~100nm,表面改性层为非晶态层。A bias voltage of 500-1000V is applied, Ar plasma or Ar and N plasma, and the duration is 10-60min; the thickness of the surface modification layer is 5-100nm, and the surface modification layer is an amorphous layer.

本发明根据现有技术种种缺陷,提出了射频偏压辅助磁控溅射沉积DLC,对基底可以施加不同大小的射频偏压,可以高效率地制备出膜基结合强度高,力学性能、耐摩擦性能和耐腐蚀性能均优异的类金刚石薄膜。通过改变射频偏压,可以改变类金刚石薄膜中sp2与sp3之间的比例,可以对类金刚石薄膜的结构进行大范围的有效调控。由于本发明既可以通过通入气体掺杂源,也可以使用金属靶对DLC进行掺杂或制备过渡层。本发明选用了Me-C过渡层作为DLC膜与基体之间的缓冲层,解决了DLC膜内应力过高的问题,进一步的提升了DLC性能,同时在制备Me-C过渡层之前,我们使用高射频偏压条件下,使用Ar,N等离子体轰击基底,在基底制备了非晶改性层,制备的非晶改性层具有改善基体表面状态使表面更密实、提高基体与过渡层之间结合性能、减小基体和第二相之间腐蚀电位等优势,结果证实非晶层/Me-C/DLC膜具有优异的力学性能和耐腐蚀性能。According to various defects of the prior art, the present invention proposes a radio frequency bias-assisted magnetron sputtering deposition of DLC, which can apply radio frequency bias voltages of different sizes to the substrate, and can efficiently prepare a film substrate with high bonding strength, mechanical properties and friction resistance. Diamond-like carbon film with excellent performance and corrosion resistance. By changing the RF bias, the ratio between sp2 and sp3 in the diamond-like carbon film can be changed, and the structure of the diamond-like carbon film can be effectively controlled in a wide range. Because of the present invention, the DLC can be doped or the transition layer can be prepared by using a gas doping source or a metal target. In the present invention, the Me-C transition layer is selected as the buffer layer between the DLC film and the substrate, which solves the problem of excessive stress in the DLC film and further improves the performance of the DLC. At the same time, before preparing the Me-C transition layer, we use Under the condition of high radio frequency bias, the substrate was bombarded with Ar and N plasma, and an amorphous modified layer was prepared on the substrate. Combining the advantages of performance and reducing the corrosion potential between the matrix and the second phase, the results confirm that the amorphous layer/Me-C/DLC film has excellent mechanical properties and corrosion resistance.

本发明由于采用上述工艺方法及膜层结构,具有以下优点:The present invention has the following advantages due to the adoption of the above-mentioned process method and film structure:

1、采用射频偏压辅助磁控溅射制备技术,具有低成本高效率制备综合性能优异的类金刚石薄膜的优势。这种技术既能使用射频偏压对基底进行离子清洗用以提升结合力,也能用射频偏压在提升含碳气氛的离化率同时施加基底偏压提升力学性能,且磁控靶既能沉积过渡层也能提供掺杂元素,或者使用石墨靶制备本征类金刚石薄膜。1. The use of radio frequency bias-assisted magnetron sputtering preparation technology has the advantages of low-cost and high-efficiency preparation of diamond-like carbon films with excellent comprehensive properties. This technology can not only use RF bias to ion clean the substrate to improve the bonding force, but also use RF bias to improve the ionization rate of the carbon-containing atmosphere while applying substrate bias to improve the mechanical properties, and the magnetron target can not only Deposition of transition layers can also provide doping elements, or use graphite targets to prepare intrinsic diamond-like carbon films.

射频基底偏压还有一个优势是不会随着薄膜厚度的增加而使偏压效果大幅度下降。因为,射频电源是交流电,周期交替作用在靶上,当溅射靶处于正半周时,电子流向靶面,中和其表面积累的正电荷,并且积累电子,使其表面呈现负偏压,在射频电压的负半周期时吸引正离子轰击靶材,从而使溅射过程得以持续进行,减轻或防止靶中毒现象发生;另外,射频电压可以穿过任何种类的阻抗,所以当DLC膜沉积较厚时,由于DLC薄膜自身对射频电源的屏蔽效果较弱所以可以继续施加偏压而不受厚度的影响。An additional advantage of RF substrate biasing is that there is no significant reduction in biasing effect with increasing film thickness. Because the radio frequency power supply is alternating current, the cycle acts on the target alternately, when the sputtering target is in the positive half cycle, the electrons flow to the target surface, neutralize the positive charge accumulated on the surface, and accumulate electrons, making the surface present a negative bias. The negative half cycle of the RF voltage attracts positive ions to bombard the target, so that the sputtering process can continue, reducing or preventing the occurrence of target poisoning; in addition, the RF voltage can pass through any kind of impedance, so when the DLC film is deposited thicker When the DLC film itself has a weak shielding effect on the RF power supply, the bias voltage can continue to be applied without being affected by the thickness.

2、制备非晶过渡层,有效改善膜基结合力2. Prepare an amorphous transition layer to effectively improve the bonding force of the film base

1)非晶改性层改善了基体表面状态使表面更密实;1) The amorphous modified layer improves the surface state of the substrate and makes the surface denser;

由于非晶层的均匀单相,成分和组织更为均匀,成分起伏较少,无明显晶界,无第二相颗粒或位错等特点,所以在基体表面制备非晶改性层,可以大大改善基体金属或者合金表面的不平整状态,消除基体表面业已存在的孔洞或孔隙、裂纹、针孔等缺陷,从而,大幅度降低基体表面腐蚀核心缺陷的数量,提高复合膜层结构的耐腐蚀性能。Due to the uniform single phase of the amorphous layer, the composition and structure are more uniform, the composition fluctuates less, there is no obvious grain boundary, no second phase particles or dislocations, etc., so the preparation of the amorphous modified layer on the surface of the substrate can greatly improve the Improve the unevenness of the surface of the base metal or alloy, and eliminate existing defects such as holes or pores, cracks, and pinholes on the base surface, thereby greatly reducing the number of core corrosion defects on the base surface and improving the corrosion resistance of the composite film structure. .

2)非晶改性层减小了基体和第二相之间的腐蚀电位;2) The amorphous modified layer reduces the corrosion potential between the matrix and the second phase;

非晶层制备过程中的离子轰击或刻蚀可以使基体或其中的杂质元素与同样的离子发生化学结合而产生相似结构的新相,增大了基体表面的化学均匀性,减小了原本基体和第二相之间的腐蚀电位。另外,非晶层可以抑制基体中的杂质元素向基体表面的扩散,避免因杂质扩散到基体表面而成为点蚀核心的情况。The ion bombardment or etching during the preparation of the amorphous layer can chemically combine the matrix or its impurity elements with the same ions to generate a new phase with similar structure, which increases the chemical uniformity of the surface of the matrix and reduces the original matrix. and the corrosion potential between the second phase. In addition, the amorphous layer can inhibit the diffusion of impurity elements in the matrix to the surface of the matrix, and avoid the situation that the impurities diffuse to the surface of the matrix and become the pitting core.

3)非晶改性层制备过程中基体有耐腐蚀新相产生:3) During the preparation of the amorphous modified layer, a new corrosion-resistant phase is produced in the matrix:

离子轰击或者离子注入的过程中将与基体原子结合形成新相。例如N等离子体轰击或者N离子注入镁合金基体表面将生成耐腐蚀相的Mg3N2新相是耐腐蚀相,从而提升基体表面的耐腐蚀性能。During the process of ion bombardment or ion implantation, a new phase will be formed by combining with the matrix atoms. For example, N plasma bombardment or N ion implantation on the surface of the magnesium alloy substrate will generate a new phase of Mg3N2, which is a corrosion-resistant phase, which is a corrosion-resistant phase, thereby improving the corrosion resistance of the substrate surface.

4)由于非晶层本身结构原子的无序性,使得非晶层本身就具备较好的耐腐蚀性能,同时,杂质离子或电解质中离子在非晶层中移动也变得非常困难,从而阻碍了基体腐蚀的发生。4) Due to the disorder of the structural atoms of the amorphous layer itself, the amorphous layer itself has good corrosion resistance, and at the same time, it is very difficult for impurity ions or ions in the electrolyte to move in the amorphous layer, thus hindering the The occurrence of substrate corrosion.

本发明采用等离子轰击金属或者合金表面,由于使用几百伏甚至上千伏的偏压,是在较大偏压条件下完成的等离子轰击,这使得基体表面温度会迅速升高,基体表面成分与等离子体成分在较高温度下会发生一定的冶金结合,或者基体表层成分会重新固溶,等离子体轰击结束后将偏压突减至很低的值或直接关闭开始沉积过渡层,由于等离子轰击基体表面整个过程大约只需持续10-20分钟左右,所以基体快速升至高温的同时其周围环境的温度不会明显升高,当轰击结束后,表面处于高温的基体直接暴露于温度较低的周围环境中,迅速冷却,所以等离子轰击近似是一个快速熔化快速凝固的过程,满足形成非晶层所需的快冷条件。另外,在很高的偏压作用下进行等离子体轰击基体表面,高能粒子撞击基体表面使其产生大量的空位或者填隙原子,这些点缺陷会在热激活作用下不断迁移运动并形成位错。在高能量的较长时间轰击下,会造成更高的位错密度,由于每种金属或者合金表面所能维持的位错密度存在着固有极限,当等离子体轰击基体表面造成的位错密度超过这个固有极限时,会造成基体表面内部晶格崩溃造成无序态而最终使基体表面形成非晶层。The present invention uses plasma to bombard the metal or alloy surface. Because of the use of a bias voltage of several hundred volts or even thousands of volts, the plasma bombardment is completed under the condition of a relatively large bias voltage, which causes the surface temperature of the substrate to rise rapidly, and the surface composition of the substrate is different from that of the substrate. The plasma composition will undergo a certain metallurgical bond at a higher temperature, or the composition of the surface layer of the matrix will be re-dissolved. After the plasma bombardment ends, the bias voltage is suddenly reduced to a very low value or the transition layer is directly turned off to start the deposition of the transition layer. The whole process on the surface of the substrate only lasts about 10-20 minutes, so the temperature of the surrounding environment will not increase significantly when the substrate rapidly rises to high temperature. In the surrounding environment, it cools rapidly, so the plasma bombardment is approximately a process of rapid melting and solidification, which satisfies the rapid cooling conditions required for the formation of an amorphous layer. In addition, when plasma bombards the surface of the substrate under the action of a high bias voltage, high-energy particles strike the surface of the substrate to generate a large number of vacancies or interstitial atoms. These point defects will continuously migrate and form dislocations under the action of thermal activation. Under high-energy bombardment for a longer time, higher dislocation density will be caused. Due to the inherent limit of the dislocation density that can be maintained on the surface of each metal or alloy, when the dislocation density caused by plasma bombardment on the surface of the substrate exceeds When this inherent limit is reached, the internal lattice collapse on the surface of the matrix will cause a disordered state and eventually an amorphous layer will be formed on the surface of the matrix.

3、通过非晶过渡层,有效改善膜基电位3. Through the amorphous transition layer, the film base potential can be effectively improved

本发明将等离子浸入式离子注入技术作为沉积薄膜的前处理方式,因其需要的能量低,效率高,容易实现与其他真空制备技术复合,十分适合注入N离子。除了改变成分外,还可以通过改变金属或者合金的结构提升耐腐蚀性能;使得金属或合金具有长期稳定的耐腐蚀性能。The present invention uses the plasma immersion ion implantation technology as the pretreatment method for depositing thin films, which is very suitable for implanting N ions because of its low energy requirement, high efficiency, and easy realization of compounding with other vacuum preparation technologies. In addition to changing the composition, the corrosion resistance can also be improved by changing the structure of the metal or alloy; so that the metal or alloy has long-term stable corrosion resistance.

4、本发明采用原位连续制备Me-C/DLC膜,Me-C膜层与DLC之间没有明显界限,膜层之间结合非常紧密,基本无缺陷或者孔洞,有效的阻挡了电解质的穿透,极大的提高了耐腐蚀性能;另外,Me-C/DLC膜中,Me与C呈梯度变化,即从Me-C层到DLC薄膜中C元素含量逐渐升高,而金属元素Me含量逐渐减少至0;特别是DLC膜是在变化的偏压下制备的,其DLC薄膜结构连续变化,具体表现在DLC薄膜中的sp3比例逐渐升高,有效的降低了薄膜的残余应力,提高薄膜质量和性能。4. The present invention adopts in-situ continuous preparation of Me-C/DLC film. There is no obvious boundary between the Me-C film layer and the DLC. The film layers are combined very closely, and there are basically no defects or holes, which effectively blocks the penetration of the electrolyte. In addition, in the Me-C/DLC film, Me and C change in a gradient, that is, the content of C element gradually increases from the Me-C layer to the DLC film, while the content of metal element Me Gradually reduce to 0; especially the DLC film is prepared under changing bias voltage, and the structure of the DLC film changes continuously, which is manifested in the gradual increase of the sp3 ratio in the DLC film, which effectively reduces the residual stress of the film and improves the film. quality and performance.

综合以上,本发明的射频偏压辅助磁控溅射技术解决了现有技术存在的多种缺陷,具有明显的优势。To sum up, the radio frequency bias-assisted magnetron sputtering technology of the present invention solves various defects existing in the prior art, and has obvious advantages.

附图说明Description of drawings

附图1为本发明实施例3制备的薄膜的横截面图;1 is a cross-sectional view of the film prepared in Example 3 of the present invention;

附图2为附图1中水平白色线条位置对应的元素线能谱分布图。FIG. 2 is an element line energy spectrum distribution diagram corresponding to the position of the horizontal white line in FIG. 1 .

从附图1可以看出,本发明制备的梯度成分DLC:H,厚度大概为4μm,制备的薄膜膜层之间无新界面。It can be seen from FIG. 1 that the gradient composition DLC:H prepared by the present invention has a thickness of about 4 μm, and there is no new interface between the prepared thin film layers.

从附图2的元素分布图中可以看出:本发明制备的薄膜,C含量从0逐渐增加到100%,而Cr含量逐渐降低到0,且在最外层1μm范围内几乎全是C。It can be seen from the element distribution diagram in FIG. 2 that the C content of the film prepared by the present invention gradually increases from 0 to 100%, while the Cr content gradually decreases to 0, and almost all of the outermost layer is C in the range of 1 μm.

具体实施方式Detailed ways

下面结合实施例及对比例对本发明作进一步详细书说明。Below in conjunction with embodiment and comparative example, the present invention is described in further detail.

实施例1:含非晶层的DLC/Me-C复合膜制备(非原位沉积)Example 1: Preparation of DLC/Me-C composite film with amorphous layer (ex-situ deposition)

(1)Ar,N等离子体改性层制备(1) Preparation of Ar, N plasma modified layer

以不锈钢为基体,将清洗好的不锈钢基底放入溅射室内,基底正对石墨靶,基底连接射频电源,通入氩气和氮气,流量比为4:1,溅射电源为直流电源,电源功率为37W,工作气压1.1pa,施加基体偏压700V,轰击时间15min,在基体表面得到非晶改性层。Using stainless steel as the substrate, put the cleaned stainless steel substrate into the sputtering chamber, the substrate is facing the graphite target, the substrate is connected to a radio frequency power supply, and argon and nitrogen gas are introduced, the flow ratio is 4:1, the sputtering power supply is a DC power supply, and the power supply The power was 37W, the working pressure was 1.1pa, the substrate bias was 700V, and the bombardment time was 15min, and an amorphous modified layer was obtained on the surface of the substrate.

(2)梯度Cr掺杂的CrC过渡层的制备(2) Preparation of gradient Cr-doped CrC transition layer

使不锈钢基底正对金属铬靶,基底连接射频电源,同时通入氩气和乙炔,沉积过程中,氩气流量固定为16sccm,乙炔流量比从0(sccm)缓慢增加6(sccm),偏压从40V逐步增加至110V。溅射电源为直流电源,电源功率200W,工作气压0.8pa,沉积时间15min;由于采用直流溅射源,溅射时靶表面因生成并累积覆盖的碳化物将导致金属靶绝缘,随着溅射时间的延长,金属铬靶中的铬离子数量将逐步减少直至为零,实现膜层中Cr与C的梯度分布。Make the stainless steel substrate face the metal chromium target, connect the RF power supply to the substrate, and feed argon and acetylene at the same time. During the deposition process, the argon flow rate is fixed at 16sccm, and the acetylene flow rate is slowly increased from 0 (sccm) to 6 (sccm), the bias voltage Gradually increase from 40V to 110V. The sputtering power supply is a DC power supply, the power supply power is 200W, the working pressure is 0.8pa, and the deposition time is 15min; due to the use of a DC sputtering source, the carbides generated and accumulated on the surface of the target during sputtering will cause the metal target to be insulated. With the extension of time, the number of chromium ions in the metal chromium target will gradually decrease to zero, and the gradient distribution of Cr and C in the film layer will be realized.

(3)DLC膜制备(3) Preparation of DLC film

基底正对石墨靶,基底连接射频电源,施加偏压130V,同时通入氩气和乙炔,流量比为8:3,溅射电源为射频电源,电源功率200W,工作气压7.0pa,沉积时间15min。The substrate is facing the graphite target, the substrate is connected to a radio frequency power supply, a bias voltage of 130V is applied, and argon and acetylene are fed at the same time. The flow ratio is 8:3. .

实施例2:原位沉积(无非晶层)制备DLC/Me-C复合膜Example 2: Preparation of DLC/Me-C composite film by in-situ deposition (without amorphous layer)

(1)原位沉积梯度偏压和成分的包含过渡层的DLC膜使不锈钢基底正对金属铬靶,基底连接射频电源,同时通入氩气和乙炔,沉积过程中,氩气流量固定为16sccm,乙炔流量从0(sccm)每2分钟增加1sccm直至增加至8(sccm),同时线性增加基体偏压,从25V每分钟增加5V直至增加至140V。溅射电源为直流电源,电源功率150W,工作气压0.75Pa,沉积时间30min。(1) In-situ deposition of a DLC film containing a transition layer with gradient bias and composition so that the stainless steel substrate faces the metal chromium target, the substrate is connected to a radio frequency power supply, and argon and acetylene are fed at the same time. During the deposition process, the argon gas flow is fixed at 16sccm , the acetylene flow increased from 0 (sccm) every 2 minutes by 1 sccm to 8 (sccm), while linearly increasing the substrate bias, increasing from 25V per minute to 5V to 140V. The sputtering power source is a DC power source, the power source is 150W, the working pressure is 0.75Pa, and the deposition time is 30min.

实施例3:含非晶层原位沉积制备DLC/Me-C复合膜制备Example 3: Preparation of DLC/Me-C composite film by in-situ deposition of amorphous layer

(1)Ar,N等离子体改性层制备(1) Preparation of Ar, N plasma modified layer

以不锈钢为基体,将清洗好的不锈钢基底放入溅射室内,基底正对石墨靶,基底连接射频电源,通入氩气和氮气,流量比为4:1,溅射电源为直流电源,电源功率为37W,工作气压1.1pa,施加基体偏压700V,轰击时间15min,在基体表面得到非晶改性层。Using stainless steel as the substrate, put the cleaned stainless steel substrate into the sputtering chamber, the substrate is facing the graphite target, the substrate is connected to a radio frequency power supply, and argon and nitrogen gas are introduced, the flow ratio is 4:1, the sputtering power supply is a DC power supply, and the power supply The power was 37W, the working pressure was 1.1pa, the substrate bias was 700V, and the bombardment time was 15min, and an amorphous modified layer was obtained on the surface of the substrate.

(2)原位沉积梯度偏压和成分的包含过渡层的DLC膜(2) In-situ deposition of gradient bias and composition of DLC films containing transition layers

使不锈钢基底正对金属铬靶,基底连接射频电源,同时通入氩气和乙炔,沉积过程中,氩气流量固定为16sccm,乙炔流量从0(sccm)每2分钟增加1sccm直至增加至8(sccm),同时线性增加基体偏压,从25V每分钟增加5V直至增加至140V。溅射电源为直流电源,电源功率150W,工作气压0.75Pa,沉积时间30min;由于采用直流溅射源,溅射时靶表面因生成并累积覆盖的碳化物将导致金属靶绝缘,随着溅射时间的延长,金属铬靶中的铬离子数量将逐步减少直至为零,实现膜层中Cr与C的梯度分布。The stainless steel substrate is facing the metal chromium target, the substrate is connected to the RF power supply, and argon gas and acetylene gas are fed at the same time. During the deposition process, the argon gas flow rate is fixed at 16sccm, and the acetylene flow rate increases from 0 (sccm) every 2 minutes to 1sccm until it increases to 8 ( sccm), while linearly increasing the substrate bias, increasing 5V per minute from 25V to 140V. The sputtering power supply is a DC power supply, the power supply power is 150W, the working pressure is 0.75Pa, and the deposition time is 30min; due to the use of a DC sputtering source, the carbides generated and accumulated on the surface of the target during sputtering will cause the metal target to be insulated. With the extension of time, the number of chromium ions in the metal chromium target will gradually decrease to zero, and the gradient distribution of Cr and C in the film layer will be realized.

实施例4:Example 4:

采用射频溅射源实现Me-C梯度调节制备的DLC/Me-C复合膜DLC/Me-C composite films prepared by Me-C gradient adjustment using RF sputtering source

(1)Ar,N等离子体改性层制备(1) Preparation of Ar, N plasma modified layer

以不锈钢为基体,将清洗好的不锈钢基底放入溅射室内,基底正对石墨靶,基底连接射频电源,通入氩气和氮气,流量比为4:1,溅射电源为直流电源,电源功率为37W,工作气压1.1pa,施加基体偏压700V,轰击时间15min,在基体表面得到非晶改性层。Using stainless steel as the substrate, put the cleaned stainless steel substrate into the sputtering chamber, the substrate is facing the graphite target, the substrate is connected to a radio frequency power supply, and argon and nitrogen gas are introduced, the flow ratio is 4:1, the sputtering power supply is a DC power supply, and the power supply The power was 37W, the working pressure was 1.1pa, the substrate bias was 700V, and the bombardment time was 15min, and an amorphous modified layer was obtained on the surface of the substrate.

(2)原位沉积梯度偏压和成分的包含过渡层的DLC膜(2) In-situ deposition of gradient bias and composition of DLC films containing transition layers

使不锈钢基底正对金属铬靶,基底连接射频电源,同时通入氩气和乙炔,沉积过程中,氩气流量固定为16sccm,乙炔流量从0(sccm)每2分钟增加1sccm直至增加至8(sccm),同时线性增加基体偏压,从25V每分钟增加5V直至增加至140V。溅射电源为射频源,电源功率150W,每2分钟调减射频功率20W,直至射频功率为零,实现膜层中Cr与C的梯度分布,工作气压0.75Pa,沉积时间30min;The stainless steel substrate is facing the metal chromium target, the substrate is connected to the RF power supply, and argon gas and acetylene gas are fed at the same time. During the deposition process, the argon gas flow rate is fixed at 16sccm, and the acetylene flow rate increases from 0 (sccm) every 2 minutes to 1sccm until it increases to 8 ( sccm), while linearly increasing the substrate bias, increasing 5V per minute from 25V to 140V. The sputtering power source is a radio frequency source, the power supply is 150W, and the radio frequency power is adjusted by 20W every 2 minutes until the radio frequency power is zero, and the gradient distribution of Cr and C in the film layer is realized, the working pressure is 0.75Pa, and the deposition time is 30min;

对比例1:无非晶层、非原位沉积的DLC/Me-C复合膜Comparative Example 1: DLC/Me-C composite film without amorphous layer and ex-situ deposition

(1)梯度Cr掺杂的CrC过渡层的制备(1) Preparation of gradient Cr-doped CrC transition layer

使不锈钢基底正对金属铬靶,基底连接射频电源,同时通入氩气和乙炔,沉积过程中,氩气流量固定为16sccm,乙炔流量比从0(sccm)缓慢增加6(sccm),偏压从40V逐步增加至110V。溅射电源为直流电源,电源功率200W,工作气压0.8pa,沉积时间15min。Make the stainless steel substrate face the metal chromium target, connect the RF power supply to the substrate, and feed argon and acetylene at the same time. During the deposition process, the argon flow rate is fixed at 16sccm, and the acetylene flow rate is slowly increased from 0 (sccm) to 6 (sccm), the bias voltage Gradually increase from 40V to 110V. The sputtering power source is a DC power source, the power source is 200W, the working pressure is 0.8pa, and the deposition time is 15min.

(2)DLC膜制备(2) Preparation of DLC film

基底正对石墨靶,基底连接射频电源,施加偏压130V,同时通入氩气和乙炔,流量比为8:3,溅射电源为射频电源,电源功率200W,工作气压7.0pa,沉积时间15min。The substrate is facing the graphite target, the substrate is connected to a radio frequency power supply, a bias voltage of 130V is applied, and argon and acetylene are fed at the same time. The flow ratio is 8:3. .

对比例2:无梯度成分变化的DLC/Me-C膜Comparative Example 2: DLC/Me-C film without gradient composition change

(1)CrC过渡层的制备(1) Preparation of CrC transition layer

基底正对铬靶,基底连接射频电源,施加偏压50V,同时通入氩气和乙炔,流量比为16:3,溅射电源为直流电源,电源功率200W,工作气压0.8pa,沉积时间15min。The substrate is facing the chromium target, the substrate is connected to a radio frequency power supply, a bias voltage of 50V is applied, and argon and acetylene are fed at the same time, the flow ratio is 16:3, the sputtering power supply is a DC power supply, the power supply power is 200W, the working pressure is 0.8pa, and the deposition time is 15min .

(2)DLC膜制备(2) Preparation of DLC film

基底正对石墨靶,基底连接射频电源,施加偏压130V,同时通入氩气和乙炔,流量比为8:3,溅射电源为射频电源,电源功率200W,工作气压7.0pa,沉积时间15min。The substrate is facing the graphite target, the substrate is connected to a radio frequency power supply, a bias voltage of 130V is applied, and argon and acetylene are fed at the same time. The flow ratio is 8:3. .

性能检测结果:Performance test results:

对所得类金刚石复合薄膜的各项性能进行检测,结果见表1。使用纳米压痕技术测量薄膜的纳米硬度,测试纳米硬度时使用恒载荷模式使得压入深度不超过薄膜整体厚度的十分之一。耐磨性使用摩擦磨损测试进行表征,使用对偶件为氮化硅球(直径4.2mm),滑行距离8mm,载荷8N,频率为8Hz。通过电化学测试(测试条件:三电极体系,参比电极为饱和Ag/AgCl电极,对电极为Pt片(15mm×15mm×0.1mm),样品为工作电极(暴露面积0.25cm2),电解质3.5wt.%NaCl溶液)了解其抗腐蚀性能,通过塔菲尔极化曲线获得其腐蚀电流。The properties of the obtained diamond-like composite films were tested, and the results are shown in Table 1. The nanoindentation technique was used to measure the nanohardness of the film, and the constant load mode was used to test the nanohardness so that the indentation depth did not exceed one tenth of the overall thickness of the film. The wear resistance was characterized by a friction and wear test, using a silicon nitride ball (diameter 4.2 mm) as a counterpart, a sliding distance of 8 mm, a load of 8 N, and a frequency of 8 Hz. Passed the electrochemical test (test conditions: three-electrode system, the reference electrode was a saturated Ag/AgCl electrode, the counter electrode was a Pt sheet (15mm×15mm×0.1mm), the sample was a working electrode (exposed area 0.25cm 2 ), and the electrolyte was 3.5 wt.%NaCl solution) to understand its corrosion resistance, and obtain its corrosion current through the Tafel polarization curve.

表1Table 1

Figure BDA0002012035920000141
Figure BDA0002012035920000141

综合性能比较:Comprehensive performance comparison:

纳米硬度:Nanohardness:

实施例3>实施例4>实施例2>实施例1>对比例2>对比例1Example 3>Example 4>Example 2>Example 1>Comparative Example 2>Comparative Example 1

摩擦系数:Friction coefficient:

实施例4=实施例3<实施例2<实施例1<对比例1<对比例2;Example 4=Example 3<Example 2<Example 1<Comparative example 1<Comparative example 2;

腐蚀电流密度:Corrosion current density:

实施例3<实施例4<实施例2<实施例1<对比例1<对比例2。Example 3<Example 4<Example 2<Example 1<Comparative Example 1<Comparative Example 2.

Claims (7)

1. A DLC/Me-C composite film is characterized in that after an amorphous metal or alloy modified layer is prepared on the surface of a metal or alloy substrate, a magnetron sputtering technology is adopted to prepare a Me-C film and a DLC film in sequence.
2. The DLC/Me-C composite film according to claim 1, wherein the amorphous metal or alloy-modified layer has a thickness of 5 to 100 nm.
3. DLC/Me-C composite film according to claim 2, characterized in that the metal or alloy matrix is selected from the group consisting of metallic magnesium, aluminium, titanium, copper, iron and alloys thereof.
4. The DLC/Me-C composite film according to claim 3, wherein said Me-C film has a gradient structure, the content of Me in said Me-C film decreases in sequence, the content of C in said Me-C film increases in sequence, and Me in said Me-C film is selected from the group consisting of elements capable of forming strong carbides; specifically, the metal is one selected from Cr, Ti, Si, W and Mo.
5. A method of producing a DLC/Me-C composite film according to claim 1, characterized in that:
placing a metal or alloy matrix on a sample base station of a magnetron sputtering device, insulating the sample base station and a grounded vacuum chamber and connecting a jet bias power supply, applying bias voltage to a pure metal or alloy matrix, bombarding the surface of the metal or alloy matrix by adopting plasma, performing ion etching and ion implantation on the surface of the metal or alloy matrix to obtain a surface modification layer, and preparing a Me-C film and a DLC film on the surface modification layer of the metal or alloy matrix by adopting magnetron sputtering;
the Me-C film is prepared by adopting reactive magnetron sputtering, Me is taken as a sputtering target material, and the sputtering atmosphere is Ar and C2H2Ar and CH4The sputtering source is selected from one of radio frequency, intermediate frequency or direct current power supply, during the preparation process, the content of Me is controlled to be linearly reduced, the flow of the carbon-containing atmosphere is linearly increased, and the gradient Me-C film is prepared; the magnetron sputtering process parameters are as follows:
ar and C in mixed atmosphere2H2Or Ar and CH4The flow ratio of (A) is 1-8, and the target power density is 3.5-18.5 W.cm-2The working pressure is 0.5-10Pa, and the deposition time is 5-60 min;
in the preparation process, the content of Me is gradually reduced to 0, and the content of carbon-containing atmosphere is gradually increased to 100 percent from 0;
when the DLC film is prepared, a graphite target or metal is used as a sputtering target material, when the graphite is used as the target material, the sputtering atmosphere is argon, and a sputtering source is a radio frequency, intermediate frequency or direct current power supply; the magnetron sputtering process parameters are as follows:
the target power density is 3.5-18.5 W.cm-2The working pressure is 0.25-5Pa, the deposition time is 5-60min, and the bias voltage is applied to 20V-300V;
when the metal target is adopted for sputtering, the sputtering atmosphere is Ar and C2H2Or Ar and CH4The sputtering source is a radio frequency or medium frequency power supply; the metal target is selected from one of W, Mo, Ti, Cr, Si and Al or alloy thereof; the magnetron sputtering process parameters are as follows:
ar and C in mixed atmosphere2H2Or Ar and CH4The flow ratio of (A) is 0.5-6, and the target power density is 3.5-18.5 W.cm-2The working pressure is 0.5-10Pa, the deposition time is 5-60min, and the bias voltage is 20V-300V.
6. The method for preparing DLC/Me-C composite film according to claim 5, wherein: when preparing the DLC film, the initial bias voltage is 20-25V, the bias voltage is adjusted and increased once every 5-10 minutes in the magnetron sputtering process, the amplitude of the bias voltage is 5-30V, and when the bias voltage reaches 300V, the bias voltage is stopped to be adjusted and increased.
7. The method for preparing DLC/Me-C composite film according to claim 6, wherein: the plasma bombardment treatment process parameters are as follows:
applying a bias voltage of 500-1000V, Ar plasma or Ar and N plasma for 10-60 min; the thickness of the surface modification layer is 5-100 nm, and the surface modification layer is an amorphous layer.
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