CN109870128A - Micro-nano structure pattern real-time monitoring light path system in a kind of inkjet printing - Google Patents

Micro-nano structure pattern real-time monitoring light path system in a kind of inkjet printing Download PDF

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Publication number
CN109870128A
CN109870128A CN201910207498.1A CN201910207498A CN109870128A CN 109870128 A CN109870128 A CN 109870128A CN 201910207498 A CN201910207498 A CN 201910207498A CN 109870128 A CN109870128 A CN 109870128A
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convex lens
real
micro
inkjet printing
time monitoring
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CN201910207498.1A
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CN109870128B (en
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吕浩
秦汉唐
张校
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Qingdao University of Science and Technology
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Qingdao University of Science and Technology
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Abstract

The invention belongs to printed electronics fields, it is related to micro-nano structure pattern real-time monitoring light path system in a kind of inkjet printing, the light beam that laser issues adjusts beam energy by attenuator, light beam successively passes through the first convex lens and the second convex lens after penetrating printed sample, light finally converges at CCD camera, CCD camera is connected with external computer, observe the print structure in printed sample in real time by computer, different according to the focal length of selected convex lens, the result that computer is observed is the image of print structure bi-directional scaling;Its optical path simple, intuitive, component facilitate adjustable, and principle is reliable, and it is convenient to operate, it is easy to accomplish, it can be widely applied to various micro-nano structures and electronic manufacturing field based on inkjet printing technology.

Description

Micro-nano structure pattern real-time monitoring light path system in a kind of inkjet printing
Technical field:
The invention belongs to printed electronics fields, are related to a kind of inkjet printing real-time monitoring system, especially a kind of spray Micro-nano structure pattern real-time monitoring light path system in ink printing.
Background technique:
Inkjet printing technology (InkjetPrinting) is the printed electronics of a kind of " directly writing ", it is in computer Under accurate control, functional oil film is ejected into all kinds of substrate tables dropwise using the power of gas pressure, electric field force or other forms Face obtains specific micro-nano structure or film, which has at low cost, environmental-friendly, high-efficient and the advantages such as write direct, It is widely used in novel electron Material Field in recent years.Inkjet printing is different according to the mode of ink-jet, can be divided into continuous spray (spray head sprays when being worked according to design requirement for ink printing (realizing that ink continuously sprays using electric field driven) and drop on demand ink jet printing Ink) two kinds, select different modes to be operated in different electronic device preparations.
In the use process of inkjet printing technology, the quality of ink, the control of voltage, the control of mobile platform and substrate The many factors such as material can influence printing as a result, thus process control and result monitoring become inkjet printing research and The Important Problems of application.In existing research approach, take parameter quantitative control method more, such as given ink kind and property, Then parameter in quantitatively regulating and controlling print procedure characterizes the features such as pattern, the electricity of print result by certain equipment, thus It realizes the one-to-one correspondence of print structure and parameter, and is thus preferred beneficial for all kinds of conditions of printing.Although these solutions Be real-time sampling, but can not be analyzed and be observed in real time, need print after print result is analyzed, then with printing Parameter is compared, and not only reduces printing effect to a certain extent, and be not easy to find the defects of print procedure carry out and When amendment.
Summary of the invention:
It is an object of the invention to overcome defect of the existing technology, design provides micro-nano structure in a kind of inkjet printing Pattern real-time monitoring light path system is using inkjet printing by adjusting the position of different optical components and parameter in optical path When technology makes all kinds of micro-nano structures, real-time monitoring observes the shape characteristic of print result, is fed back and is controlled to print procedure System.
To achieve the goals above, in inkjet printing of the present invention micro-nano structure pattern real-time monitoring light path system master Body structure includes laser, attenuator, the first convex lens, the second convex lens and CCD camera, and the center of each optical element is located at On straight line, and surface is perpendicular to direction of beam propagation, to ensure that homogenizer is propagated;Printed sample and the first convex lens it Between distance it is equal with the focal length of the first convex lens, the distance between the second convex lens and CCD camera and the second convex lens The sum of both focal length is equal, and the distance between the first convex lens and the second convex lens are focal length, it is ensured that gained image is clear figure Picture;The light beam that laser issues adjusts beam energy by attenuator, and light beam successively passes through the first convex lens after penetrating printed sample Mirror and the second convex lens, light finally converge at CCD camera, and CCD camera is connected with external computer, real-time by computer Observe the print structure in printed sample, different according to the focal length of selected convex lens, the result that computer is observed is printing knot The image of structure bi-directional scaling.
Micro-nano structure pattern real-time monitoring light path system makes with ink-jet print system cooperation in inkjet printing of the present invention To realize real time monitoring function, the position of printed sample is located at the printing in ink-jet print system in real-time detection light path system As a result locate, be placed with electrode plate on the accurate control mobile platform in ink-jet print system, place printed substrates on electrode plate, beat Pull product are printed upon in printed substrates, and precision control mobile platform, electrode plate and printed substrates can penetrate visible light, and Thus precision control mobile platform can prepare micro-nano knot of different shapes according to the print routine of setting planar accurate movement Structure.
The laser that laser of the present invention issues is any visible light wavelengths, and the direction of propagation of light beam is perpendicular to printing base Bottom.
First convex lens and the second convex lens of the present invention are the optical lens of the optical maser wavelength issued suitable for laser Mirror, position are freely adjusted according to actual needs.
CCD camera of the present invention uses commercially available imaging camera device, can be connected with external computer end with real-time Show image, resolution ratio is greater than 640 × 480.
The present invention is during inkjet printing makes micro-nano structure, by obtaining with the matched CCD camera of computer end The image of print structure, and Image Acquisition and video record are carried out, to observe the quality of print structure.
Compared with prior art, the present invention having the advantage that first is that light path system is integrated into ink-jet print system It goes, under the premise of the system for not changing print procedure is arranged, realizes lossless observation;Second is that light path system has real-time, The shape characteristic that the real-time observation structure of CCD camera can be passed through in computer end;Third is that it is low to condition depended degree, it is moved in sample In the case where dynamic, slight shift, surface topography imaging clear in structure can be obtained;Fourth is that obtained image resolution ratio is high, make When with high-definition camera, image information high-definition can get;Its optical path simple, intuitive, component facilitate adjustable, original Reason is reliable, and it is convenient to operate, it is easy to accomplish, it can be widely applied to various micro-nano structures and electronic manufacture based on inkjet printing technology Field.
Detailed description of the invention:
Fig. 1 is that the main structure principle of micro-nano structure pattern real-time monitoring light path system in inkjet printing of the present invention is shown It is intended to.
Fig. 2 is that micro-nano structure pattern real-time monitoring light path system is matched with ink-jet print system in inkjet printing of the present invention The principle schematic diagram used is closed, is micro-nano structure pattern real-time monitoring light path system in inkjet printing in dotted line frame.
Fig. 3 be the present embodiments relate to observation image, wherein (a) be printed sample structure ordinary optical microscope Picture is shot, is (b) the real-time observation image acquired using light path system of the present invention, material used in inkjet printing is in image Nano-Ag particles ink.
Specific embodiment:
The present invention will be further described by way of example and in conjunction with the accompanying drawings.
Embodiment:
Main structure such as Fig. 1 institute of micro-nano structure pattern real-time monitoring light path system in inkjet printing described in the present embodiment Show, including laser 1, attenuator 2, the first convex lens L1, the second convex lens L2 and CCD camera 3, the center of each optical element It is located in a straight line, and surface is perpendicular to direction of beam propagation, to ensure that homogenizer is propagated;Printed sample and the first convex lens The focal length f of the distance between mirror L1 and the first convex lens L11It is equal, the distance between the second convex lens L2 and CCD camera 3 with The focal length f of second convex lens L22Equal, the distance between the first convex lens L1 and the second convex lens L2 are the sum of the two focal length, Ensure that gained image is clear image;The light beam that laser 1 issues adjusts beam energy by attenuator 3, and light beam is through printing Successively pass through the first convex lens L1 and the second convex lens L2 after sample, light finally converges at CCD camera 3, CCD camera 3 It is connected with external computer, the print structure 7 in printed sample is observed in real time by computer, according to the focal length of selected convex lens Difference, the result that computer is observed are the image of print structure bi-directional scaling.
Micro-nano structure pattern real-time monitoring light path system and ink-jet print system cooperate in inkjet printing described in the present embodiment Using to realize real time monitoring function, the position of printed sample is located at beating in ink-jet print system in real-time detection light path system It prints at result 7, is placed with electrode plate 5 on the accurate control mobile platform 4 in ink-jet print system, places printing on electrode plate 5 Substrate 6, printed sample are printed upon in printed substrates 6, and precision control mobile platform 4, electrode plate 5 and printed substrates 6 can penetrate Visible light, and thus accurate control mobile platform 4 can be prepared not according to the print routine of setting planar accurate movement The micro-nano structure of similar shape.
It is any visible light wavelengths that the present embodiment, which invents the laser that the laser 1 issues, and the direction of propagation of light beam is vertical In printed substrates 6.
First convex lens L1 and the second convex lens L2 described in the present embodiment are the optical maser wavelength issued suitable for laser 1 Optical lens, position are freely adjusted according to actual needs.
CCD camera 3 described in the present embodiment uses commercially available imaging camera device, can be connected with external computer end with reality When show image, resolution ratio is greater than 640 × 480.
The present embodiment couples light path system with ink-jet print system, that is, allows the position of printed sample in Fig. 1 lucky At the print result of inkjet printing in Fig. 2, thus laser beam can pass through the print structure in printed sample, and pass through First convex lens L1 and the second convex lens L2 image in the surface CCD, according to optical lens image-forming principle, the structure bit of inkjet printing In the front focal length of the first convex lens L1, with the first convex lens L1 at a distance of f1, then the second convex lens passes through at the virtual image in print structure institute L2 just CCD camera surface be imaged, institute at image enlargement ratio be f2/f1, the first convex lens L1, the second convex lens L2 Be all placed in camera on fine-tuning platform, can along the round-trip fine adjustment position of optical element in direction of beam propagation, by This ensures to get a distinct image.
Accurate control mobile platform in the present embodiment in ink-jet print system can be moved planar, to realize not The direction of propagation of the printing of similar shape structure, light beam will be perpendicular to the surface of printed substrates 6, so that it is guaranteed that platform is in in-plane moving When be at the front focal plane position of the first convex lens L1, clearly image is obtained in CCD camera just.
Printed substrates 6 in the present embodiment are generally planar translucent material, if this can also be used using flexible material System is observed, and in the detection process, according to the sample position of the fluctuating of flexible substrates and observation, adjusts each lens position in real time It sets, meets above-mentioned position corresponding relationship, also can get clearly surface topography image.
Image observed by the present embodiment is as shown in figure 3, wherein (a) is that printed sample is seen under ordinary optical microscope The result observed;(b) for using the present invention real-time monitor as a result, due to use different focal length the first convex lens L1 and Second convex lens L2, thus the enlargement ratio of two images has certain difference.
The present embodiment can adjust the light intensity of laser by regulated attenuator, to adjust the bright dark of final collection image Contrast;Resolution ratio of camera head that can also be different according to the size selection of print structure obtains the images of different display sizes. Since gained image is the higher electronic photo of clarity, the later period can also carry out all kinds of places to the image using other softwares Reason, preferably to observe and characterize testing result.
The present embodiment selects optical approach to monitor inkjet printing as a result, having following reason: first is that optical path used Component is few, is easy to adjust and in conjunction with existing ink-jet print system, the adjusting of optical path easy to accomplish and print result it is real-time Monitoring;Second is that all optical paths are small to the dependency degree of environment, the fluctuating small for movement of the platform in face, print structure all will not The imaging in CCD camera is influenced, can get clearly image;Third is that light path devices price used is lower, to laser light source, Optical lens, CCD camera are common optical element without particular/special requirement;Fourth is that light path system can be with computer end phase Even, additional data export and transmission are not needed, can observe the structure and morphology of sample in print procedure by software in real time, Truly realize real-time monitoring.

Claims (5)

1. micro-nano structure pattern real-time monitoring light path system in a kind of inkjet printing, it is characterised in that main structure includes laser Device, attenuator, the first convex lens, the second convex lens and CCD camera, the center of each optical element are located in a straight line, and Surface is perpendicular to direction of beam propagation, to ensure that homogenizer is propagated;The distance between printed sample and the first convex lens and The focal length of one convex lens is equal, and the second convex lens and the distance between CCD camera are equal with the focal length of the second convex lens, and first The distance between convex lens and the second convex lens are the sum of the two focal length, it is ensured that gained image is clear image;Laser issues Light beam by attenuator adjust beam energy, light beam penetrate printed sample after successively pass through the first convex lens and the second convex lens Mirror, light finally converge at CCD camera, and CCD camera is connected with external computer, observe printing sample in real time by computer Print structure on product, different according to the focal length of selected convex lens, the result that computer is observed is print structure bi-directional scaling Image.
2. micro-nano structure pattern real-time monitoring light path system in inkjet printing according to claim 1, it is characterised in that its with Ink-jet print system is used cooperatively to realize real time monitoring function, and the position of printed sample is located at spray in real-time detection light path system At print result in black print system, electrode plate, electrode are placed on the accurate control mobile platform in ink-jet print system Printed substrates are placed on plate, printed sample is printed upon in printed substrates, and precision control mobile platform, electrode plate and printed substrates are equal Can be through visible light, and accurate control mobile platform can be according to the print routine of setting planar accurate movement, thus Prepare micro-nano structure of different shapes.
3. micro-nano structure pattern real-time monitoring light path system in inkjet printing according to claim 2, it is characterised in that described The laser beam that laser issues is any visible light wavelengths, and the direction of propagation of laser beam is perpendicular to printed substrates.
4. micro-nano structure pattern real-time monitoring light path system in inkjet printing according to claim 2, it is characterised in that described First convex lens and the second convex lens are the optical lens of the optical maser wavelength issued suitable for laser, and position is according to actual needs Freely adjust.
5. micro-nano structure pattern real-time monitoring light path system in inkjet printing according to claim 2, it is characterised in that described CCD camera uses commercially available imaging camera device, can be connected with external computer end with real-time display image, resolution ratio is big In 640 × 480.
CN201910207498.1A 2019-03-19 2019-03-19 Micro-nano structure morphology real-time monitoring optical path system in ink-jet printing Active CN109870128B (en)

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Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19903486C2 (en) * 1999-01-29 2003-03-06 Leica Microsystems Method and device for the optical examination of structured surfaces of objects
JP2004191214A (en) * 2002-12-12 2004-07-08 Kokusai Gijutsu Kaihatsu Co Ltd Line lighting system, and inspection device using line lighting system
CN101263382A (en) * 2005-06-28 2008-09-10 天鹤加拿大公司 Method and apparatus for detecting overlapped substrates
CN102427502A (en) * 2011-10-01 2012-04-25 麦克奥迪实业集团有限公司 Scanning method and device for microscopic section
CN103245287A (en) * 2012-02-07 2013-08-14 富士胶片株式会社 Image evaluating apparatus, image evaluating method, and non-transitory storage medium
CN104797906A (en) * 2011-12-20 2015-07-22 3M创新有限公司 Sensor for measuring surface non-uniformity
CN104807406A (en) * 2014-01-27 2015-07-29 康耐视公司 System and method for determining 3d surface features and irregularities on an object
CN105818374A (en) * 2014-10-03 2016-08-03 泰科电子公司 Three dimensional printing inspection apparatus and method
CN107339951A (en) * 2017-06-26 2017-11-10 华中科技大学 The precision measurement method of Micropicture profile information on a kind of three-dimension curved surface
US20180143415A1 (en) * 2010-04-19 2018-05-24 Witec Wissenschaftliche Instrumente Und Technologie Gmbh Device For Imaging A Sample Surface
CN108971747A (en) * 2018-08-29 2018-12-11 华中科技大学 A kind of ultrafast laser micro-nano technology device having on-line monitoring function

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19903486C2 (en) * 1999-01-29 2003-03-06 Leica Microsystems Method and device for the optical examination of structured surfaces of objects
JP2004191214A (en) * 2002-12-12 2004-07-08 Kokusai Gijutsu Kaihatsu Co Ltd Line lighting system, and inspection device using line lighting system
CN101263382A (en) * 2005-06-28 2008-09-10 天鹤加拿大公司 Method and apparatus for detecting overlapped substrates
US20180143415A1 (en) * 2010-04-19 2018-05-24 Witec Wissenschaftliche Instrumente Und Technologie Gmbh Device For Imaging A Sample Surface
CN102427502A (en) * 2011-10-01 2012-04-25 麦克奥迪实业集团有限公司 Scanning method and device for microscopic section
CN104797906A (en) * 2011-12-20 2015-07-22 3M创新有限公司 Sensor for measuring surface non-uniformity
CN103245287A (en) * 2012-02-07 2013-08-14 富士胶片株式会社 Image evaluating apparatus, image evaluating method, and non-transitory storage medium
CN104807406A (en) * 2014-01-27 2015-07-29 康耐视公司 System and method for determining 3d surface features and irregularities on an object
CN105818374A (en) * 2014-10-03 2016-08-03 泰科电子公司 Three dimensional printing inspection apparatus and method
CN107339951A (en) * 2017-06-26 2017-11-10 华中科技大学 The precision measurement method of Micropicture profile information on a kind of three-dimension curved surface
CN108971747A (en) * 2018-08-29 2018-12-11 华中科技大学 A kind of ultrafast laser micro-nano technology device having on-line monitoring function

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘迅等: "《中学生实用百科全书》", 31 January 1991 *
张建寰等: "非连续光滑表面超精密光学测头研究", 《 厦门市科协2005年学术年会暨福建省科协第五届学术年会卫星会议》 *

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