CN109856157A - It is a kind of based on the LCD panel defect inspection method adaptively focused - Google Patents

It is a kind of based on the LCD panel defect inspection method adaptively focused Download PDF

Info

Publication number
CN109856157A
CN109856157A CN201910069316.9A CN201910069316A CN109856157A CN 109856157 A CN109856157 A CN 109856157A CN 201910069316 A CN201910069316 A CN 201910069316A CN 109856157 A CN109856157 A CN 109856157A
Authority
CN
China
Prior art keywords
picture
display
readability
image
capture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910069316.9A
Other languages
Chinese (zh)
Inventor
袁捷宇
张胜森
郑增强
罗巍巍
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan Jingce Electronic Group Co Ltd
Wuhan Jingli Electronic Technology Co Ltd
Wuhan Jingce Electronic Technology Co Ltd
Original Assignee
Wuhan Jingce Electronic Group Co Ltd
Wuhan Jingli Electronic Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuhan Jingce Electronic Group Co Ltd, Wuhan Jingli Electronic Technology Co Ltd filed Critical Wuhan Jingce Electronic Group Co Ltd
Priority to CN201910069316.9A priority Critical patent/CN109856157A/en
Publication of CN109856157A publication Critical patent/CN109856157A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

The invention discloses a kind of based on the LCD panel defect inspection method adaptively focused, which is characterized in that verifies including showing picture on display panel to be measured, and to the legitimacy of the picture;The display image under multiple capture modes is obtained respectively, and clarity detection is carried out to it, confirms that the display image definition under each capture mode meets the requirements;Defects detection is carried out to display image, completes the defect recognition of display panel.The case where technical solution of the present invention is for identical capture focal length is used under different capture modes at present, focus adjustment is carried out respectively for every kind of capture mode, it can obtain and correspond to satisfactory display picture under different capture modes, to realize accurately identifying for LCD panel defect.

Description

It is a kind of based on the LCD panel defect inspection method adaptively focused
Technical field
The invention belongs to LCD panel defects detection fields, and in particular to a kind of based on the LCD panel defect adaptively focused Detection method.
Background technique
By AOI technical application, in the defects detection of LCD panel, picture quality is very crucial one in defects detection A part, the height of quality directly influence the accuracy of defects detection result.
But it is imperfect due to optical system itself, the camera lens of camera cannot be the light focusing of different wave length to same One focal plane (focal length of the light of different wave length is different).That is camera lens is obtained in same focal length The image focus level of Red/Green/Blue/L48 picture be it is different, this also have led to different pictures acquisition image Quality difference is larger and picture quality of each picture of bad tradeoff when adjusting, as shown in Figure 1.
In addition, as shown in Figure 1, in the producing line of LCD panel vendor, due to the deviation and AOI machine of LCD panel placement location The kinematic error of structure, changes will occur for the capture quality of every piece of panel to be detected of inflow AOI equipment.If each picture image Quality difference and fluctuation are larger, and the serious problems of inspection and missing inspection can be carried out to AOI equipment belt.It is stable in order to obtain as much as possible Picture quality needs to propose a kind of defects detection side that focus level matches with different pictures to bring stable detection effect Method.
Since the detection of AOI algorithm needs to obtain the image of the more pictures of LCD panel, before carrying out defects detection, generally all Need to carry out AOI equipment tune machine, and most crucial during this is exactly adjustment to picture quality.Under normal conditions, exist When adjusting picture quality, way is all the focal length that a certain Pattern (such as L48 picture) is adjusted to camera lens as benchmark, Meet the image quality requirements of tune machine standard, but the figure obtained under other Pattern with the image focusing state of current Pattern Surely reach ideal focusing state as different.
Existing take is had the following problems with the detection technique scheme of upper type adjusting image quality:
1. current Pattern image focusing state can be able to satisfy the image quality requirements of tune machine standard, but other Pattern Image clearly degree it is impossible to meet requiring, existing on detection effect influences.
2. the focusing state of image judges picture quality using the mode of human eye subjective judgement, exist inaccuracy and Otherness.
3. difference Pattern picture quality has differences, also inconvenient in algorithm parameter configuration, each picture setting Parameter value difference is big, and the focusing degree of different pictures is different, and subsequent classification logic is difficult unified parameters setting standard.
In producing line actual use, the movement of wire body board is there are accuracy error, and there is also the differences of display between different panels Different, these situations may take plot quality to affect fluctuation Pattern, and then influence detection stability.
Summary of the invention
Aiming at the above defects or improvement requirements of the prior art, the present invention provides a kind of based on the LCD adaptively to focus Panel defect detection method at least can partially solve the above problems.Technical solution of the present invention is for different capture modes at present Lower the case where using identical capture focal length, focus adjustment is carried out respectively for every kind of capture mode, can obtain different captures Satisfactory display picture is corresponded under mode, to realize accurately identifying for LCD panel defect.
To achieve the above object, according to one aspect of the present invention, it provides a kind of based on the LCD panel adaptively focused Defect inspection method, which is characterized in that including
S1 shows picture on display panel to be measured, and verifies to the legitimacy of the picture;
S2 obtains the display image under multiple capture modes respectively, and carries out clarity detection to it, confirms each capture Display image definition under mode all meets the requirements;
S3 carries out defects detection to display image, completes the defect recognition of display panel.
One as technical solution of the present invention is preferred, and the legitimacy verifies of picture include judging that image is in step S1 It is no be lit, brightness of image whether uniformly and display picture readability whether meet the requirements, be then by picture it is legal Property verification, otherwise not pass through verification.
Preferably as one of technical solution of the present invention, step S2 includes,
S21 determines current capture mode, calculates the whole readability of current display picture;
If S22 shows that the readability of picture meets the requirements, current display picture is saved as into image to be detected, otherwise Enter step S23;
S23 calculates the difference between current display picture readability and standard value, according to difference to current capture mode Under capture focal length be adjusted, obtain the satisfactory display picture of readability;
S24 obtains the satisfactory display picture of readability under all capture modes.
Preferably as one of technical solution of the present invention, in step S3 preferably to the display picture under each capture mode into Row defects detection is finally completed the defect recognition of display panel.
One as technical solution of the present invention is preferred, and capture mode preferably includes red picture format, green picture lattice One of formula, blue picture format and L48 picture format are a variety of.
One as technical solution of the present invention is preferred, shows that the readability of picture preferably passes through the acutance of display picture It is evaluated, according to the difference between the current acutance and standard value of display picture, calculates focus error and simultaneously adjusted accordingly It is whole, to obtain satisfactory display picture.
According to the one aspect of technical solution of the present invention, a kind of storage equipment is provided, wherein it is stored with a plurality of instruction, institute Instruction is stated to be suitable for being loaded and being executed by processor:
S1 shows picture on display panel to be measured, and verifies to the legitimacy of the picture;
S2 obtains the display image under multiple capture modes respectively, and carries out clarity detection to it, confirms each capture Display image definition under mode all meets the requirements;
S3 carries out defects detection to display image, completes the defect recognition of display panel.
One as technical solution of the present invention is preferred, and described instruction applies also for being loaded by processor and being executed:
S21 determines current capture mode, calculates the whole readability of current display picture;
If S22 shows that the readability of picture meets the requirements, current display picture is saved as into image to be detected, otherwise Enter step S23;
S23 calculates the difference between current display picture readability and standard value, according to difference to current capture mode Under capture focal length be adjusted, obtain the satisfactory display picture of readability;
S24 obtains the satisfactory display picture of readability under all capture modes.
According to the one aspect of technical solution of the present invention, a kind of terminal, including processor are provided, is adapted for carrying out each finger It enables;And storage equipment, it is suitable for storing a plurality of instruction, described instruction is suitable for being loaded and being executed by processor:
S1 shows picture on display panel to be measured, and verifies to the legitimacy of the picture;
S2 obtains the display image under multiple capture modes respectively, and carries out clarity detection to it, confirms each capture Display image definition under mode all meets the requirements;
S3 carries out defects detection to display image, completes the defect recognition of display panel.
One as technical solution of the present invention is preferred, and instruction is further adapted for being loaded by processor and being executed:
S21 determines current capture mode, calculates the whole readability of current display picture;
If S22 shows that the readability of picture meets the requirements, current display picture is saved as into image to be detected, otherwise Enter step S23;
S23 calculates the difference between current display picture readability and standard value, according to difference to current capture mode Under capture focal length be adjusted, obtain the satisfactory display picture of readability;
S24 obtains the satisfactory display picture of readability under all capture modes.
In general, through the invention it is contemplated above technical scheme is compared with the prior art, have below beneficial to effect Fruit:
1) technical solution of the present invention uses identical focusing for the image of difference Pattern in the prior art, is obtained Display picture in display picture only under part capture mode meet the problem of clarity requires, selection is directed to each difference Capture mode is focused respectively, obtains the corresponding display picture for meeting required precision of each capture mode, thus realization pair LCD panel carries out more accurate defects detection.
2) technical solution of the present invention relies primarily on human eye assessment for showing that the precision of images of picture is measured in the prior art To the larger problem of error, a kind of quantitative image quality measure standard is introduced to provide the picture quality of each Pattern Method, judged by clarity of the image sharpness to image frame, so that the quality evaluation standard of LCD panel Change, avoids significant errors existing when artificial judgement.
3) technical solution of the present invention is obtained every respectively when being shot using multiple capture modes to display picture The picture of exact focus, optimizes picture quality under a capture mode, improves the stability of AOI detection, has quantified image matter Evaluation criteria is measured, tune machine process is simplified, is operated simpler.
Detailed description of the invention
Fig. 1 is the principle that different colours picture is imaged in optical imaging system in the prior art;
Fig. 2 is the overview flow chart for the defect inspection method adaptively focused in the embodiment of technical solution of the present invention;
Fig. 3 is in the embodiment of technical solution of the present invention based on the defects detection flow chart adaptively focused.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.As long as in addition, technical characteristic involved in the various embodiments of the present invention described below Not constituting a conflict with each other can be combined with each other.The present invention is described in more detail With reference to embodiment.
It is an object of the invention to take figure for LCD panel difference Pattern, there are the othernesses in focus level, propose A method of based on the defects detection adaptively focused.This method is by each Pattern to be detected of LCD panel using different Focusing degree allows camera lens when taking figure as the switching of picture uses different focal lengths, in conjunction with a kind of image of quantization Criteria of quality evaluation judges whether image meets the requirements, while according to the picture quality currently obtained and can require between standard Difference focus automatically, take in a manner of adaptive focusing figure for defects detection use to realize.
As shown in Fig. 2, being the flow chart for the LCD panel defect inspection method of the application adaptively focused, wherein AOI is lacked The algorithm for falling into detection part is to belong to existing complete mature technology, is not developed in details herein, this process mainly describes will figure The method of picture adaptively focused applies the realization process in AOI defects detection.
Overall procedure executes as follows:
Step 1: PG lights panel and shows picture after LCD panel enters station.
Step 2: image validity judgement is carried out when showing each Pattern, if being unsatisfactory for validity judgement condition, Then directly this piece LCD panel of Pass or verification can be lighted again.It, can be according to each capture mode under different measurement demands (Pattern) demand judges the legitimacy of image.Image validity judgement in the present embodiment, preferably by sentencing Whether disconnected image grayscale, which meets the requirements, is realized.Specifically, including the following steps:
It is to judge whether the gray average of image overall meets preset value BaseGrayValue ± fluctuation range first GrayRange, and then several regions are divided an image into, judge whether the gray average in every piece of region meets preset value BaseGrayValue ± fluctuation range GrayRange.
Secondly, judging whether image clearly degree meets the requirements, including judging whether the acutance mean value of image overall meets Preset value BaseSharpnessValue ± fluctuation range SharpnessRange, and several regions are divided an image into, often Whether the acutance mean value in block region meets preset value BaseSharpnessValue ± fluctuation range SharpnessRange.
In a specific embodiment, when carrying out legitimacy verifies for LCD panel, it is necessary first to judge that the image is It is no to be lit, that is, whether the panel completely black, is not to be lit.Then judge that this is lighted on image with the presence or absence of split screen Whether the Huaping phenomenon of flashing, that is, brightness of image are uniform, and the image of brightness uniformity is not colored screen.It is finally preferred root Judge whether it meets the requirement of AOI tune machine according to the acutance of image image.
Step 3: requiring to carry out picture quality quantum chemical method respectively, passing through electricity to each picture of panel switching display Machine control lens focusing is adjusted in desired image quality level.In the present embodiment, for the display under each capture mode When image carries out capture, needs to calculate separately the clarity of the display image obtained under the mode, confirm clear under each mode Clear degree all meets the requirements, and just can be used for LCD panel panel using current display image as display image corresponding under the mode The defects detection of volume.
Step 4: obtaining the Display panel image under all capture modes, it is transmitted to detection algorithm and carries out defects detection.Due to It is only once focused in the prior art, the clarity that display image obtained is not able to satisfy all capture modes is wanted It asks, therefore is focused respectively in this city embodiment for each capture mode, corresponding obtain meets under each capture mode The display image that clarity requires.
Step 5: can export final defect result after the completion of detection, panel can flow out station and enter subsequent processing.
To the different Pattern shown on panel, the mode adaptively focused is respectively adopted to obtain image, it is full to provide The image of sufficient image quality criteria completes defect, and concrete implementation process is as shown in Figure 3.Specific step is as follows:
A) the picture progress validity judgement that the LCD panel captured to camera is currently shown is different with the presence or absence of picture, if deposited It is different drawing, then stop detecting;If image is normal, continue subsequent operation.
B) the picture Pattern1 currently shown for panel, will do it following processing operation:
Firstly, calculating the whole readability of picture, it will usually with acutance come taking under quantitatively evaluating Pattern1 picture Image quality amount.
Secondly, judging the capture quality under Pattern1 picture, if its sharpness value is more than or less than defined Tune machine standard sharpness value (the usual numerical value is that each picture is set separately according to detection demand), then can enter and grasp in next step Make;If its sharpness value is equal to defined tune machine standard sharpness value, which can be stored as image to be detected.
Third, the image required for being unsatisfactory for defined tune machine standard sharpness value by present image acutance and can adjust machine The difference of standard sharpness value feeds back to the kinetic control system of camera, which can send instructions to motor to camera lens according to difference Focal length is adjusted, until image sharpness meets the requirement of tune machine standard sharpness value under final focusing degree.
C) when panel image switching is to Pattern2~PatternN, the same operation for executing step b) is obtained Respective image of the Pattern under adaptive focusing state.
After whole image to be detected that camera has obtained, the detection algorithm of AOI can carry out defect to image to be detected Detection and identification.
As it will be easily appreciated by one skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention, not to The limitation present invention, any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should all include Within protection scope of the present invention.

Claims (10)

1. a kind of based on the LCD panel defect inspection method adaptively focused, which is characterized in that including
S1 shows picture on display panel to be measured, and verifies to the legitimacy of the picture;
S2 obtains the display image under multiple capture modes respectively, and carries out clarity detection to it, confirms each capture mode Under display image definition all meet the requirements;
S3 carries out defects detection to display image, completes the defect recognition of display panel.
2. according to claim 1 a kind of based on the LCD panel defect inspection method adaptively focused, wherein the step The legitimacy verifies of picture include judging whether image is lit, whether brightness of image is uniform and display picture in rapid S1 Whether readability meets the requirements, and is otherwise not to pass through verification then by picture legitimacy verifies.
3. according to claim 1 or 2 a kind of based on the LCD panel defect inspection method adaptively focused, wherein described Step S2 includes,
S21 determines current capture mode, calculates the whole readability of current display picture;
If S22 shows that the readability of picture meets the requirements, current display picture is saved as into image to be detected, is otherwise entered Step S23;
S23 calculates the difference between current display picture readability and standard value, according to difference under current capture mode Capture focal length is adjusted, and obtains the satisfactory display picture of readability;
S24 obtains the satisfactory display picture of readability under all capture modes.
4. it is described in any item a kind of based on the LCD panel defect inspection method adaptively focused according to claim 1~3, In, defects detection preferably is carried out to the display picture under each capture mode in the step S3, is finally completed display panel Defect recognition.
5. it is according to any one of claims 1 to 4 a kind of based on the LCD panel defect inspection method adaptively focused, In, the capture mode preferably includes in red picture format, green picture format, blue picture format and L48 picture format It is one or more.
6. it is described in any item a kind of based on the LCD panel defect inspection method adaptively focused according to claim 1~5, In, the readability of the display picture is preferably evaluated by showing the acutance of picture, according to the current of display picture Difference between acutance and standard value calculates focus error and is adjusted accordingly, to obtain satisfactory display picture.
7. a kind of storage equipment, wherein being stored with a plurality of instruction, described instruction is suitable for being loaded and being executed by processor:
S1 shows picture on display panel to be measured, and verifies to the legitimacy of the picture;
S2 obtains the display image under multiple capture modes respectively, and carries out clarity detection to it, confirms each capture mode Under display image definition all meet the requirements;
S3 carries out defects detection to display image, completes the defect recognition of display panel.
8. a kind of storage equipment according to claim 7, wherein be stored with a plurality of instruction, described instruction apply also for by Reason device is loaded and is executed:
S21 determines current capture mode, calculates the whole readability of current display picture;
If S22 shows that the readability of picture meets the requirements, current display picture is saved as into image to be detected, is otherwise entered Step S23;
S23 calculates the difference between current display picture readability and standard value, according to difference under current capture mode Capture focal length is adjusted, and obtains the satisfactory display picture of readability;
S24 obtains the satisfactory display picture of readability under all capture modes.
9. a kind of terminal, including processor are adapted for carrying out each instruction;And storage equipment, it is suitable for storing a plurality of instruction, the finger It enables and is suitable for being loaded and being executed by processor:
S1 shows picture on display panel to be measured, and verifies to the legitimacy of the picture;
S2 obtains the display image under multiple capture modes respectively, and carries out clarity detection to it, confirms each capture mode Under display image definition all meet the requirements;
S3 carries out defects detection to display image, completes the defect recognition of display panel.
10. a kind of terminal according to claim 9, including processor, are adapted for carrying out each instruction;And storage equipment, it fits In storing a plurality of instruction, described instruction is further adapted for being loaded by processor and being executed:
S21 determines current capture mode, calculates the whole readability of current display picture;
If S22 shows that the readability of picture meets the requirements, current display picture is saved as into image to be detected, is otherwise entered Step S23;
S23 calculates the difference between current display picture readability and standard value, according to difference under current capture mode Capture focal length is adjusted, and obtains the satisfactory display picture of readability;
S24 obtains the satisfactory display picture of readability under all capture modes.
CN201910069316.9A 2019-01-24 2019-01-24 It is a kind of based on the LCD panel defect inspection method adaptively focused Pending CN109856157A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910069316.9A CN109856157A (en) 2019-01-24 2019-01-24 It is a kind of based on the LCD panel defect inspection method adaptively focused

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910069316.9A CN109856157A (en) 2019-01-24 2019-01-24 It is a kind of based on the LCD panel defect inspection method adaptively focused

Publications (1)

Publication Number Publication Date
CN109856157A true CN109856157A (en) 2019-06-07

Family

ID=66895997

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910069316.9A Pending CN109856157A (en) 2019-01-24 2019-01-24 It is a kind of based on the LCD panel defect inspection method adaptively focused

Country Status (1)

Country Link
CN (1) CN109856157A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112595496A (en) * 2020-12-31 2021-04-02 深圳惠牛科技有限公司 Method, device and equipment for detecting defects of near-eye display equipment and storage medium
CN112798235A (en) * 2021-03-19 2021-05-14 武汉精测电子集团股份有限公司 Method and device for detecting micro or miniature defects
CN113639630A (en) * 2021-04-01 2021-11-12 浙江大学台州研究院 Dimension measuring instrument system based on multi-template matching and automatic focusing functions
CN116049863A (en) * 2023-03-28 2023-05-02 东莞锐视光电科技有限公司 System, method and application for generating stripe light by LCD display screen

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06236162A (en) * 1993-02-09 1994-08-23 Sharp Corp Test method for defect of color liquid crystal panel and device for test
KR20060118700A (en) * 2005-05-17 2006-11-24 엘지.필립스 엘시디 주식회사 Liquid crystal display device
CN102055900A (en) * 2009-10-27 2011-05-11 鸿富锦精密工业(深圳)有限公司 Method for adjusting focus of monitor
CN103869511A (en) * 2012-12-13 2014-06-18 乐金显示有限公司 Mura detection apparatus and method of display device
CN104931957A (en) * 2015-06-01 2015-09-23 广东欧珀移动通信有限公司 Distance measurement method and device based on mobile terminal
CN105070247A (en) * 2015-07-29 2015-11-18 信利(惠州)智能显示有限公司 Method for determining nonuniform-brightness pixel points in display screen
CN105938243A (en) * 2016-06-29 2016-09-14 华南理工大学 Multi-magnification microscope fast focusing method applied to TFT-LCD detection
CN106770362A (en) * 2016-12-27 2017-05-31 武汉精测电子技术股份有限公司 Gross imperfection detection means and method based on AOI
CN107845087A (en) * 2017-10-09 2018-03-27 深圳市华星光电半导体显示技术有限公司 The detection method and system of the uneven defect of liquid crystal panel lightness
CN107966836A (en) * 2017-11-29 2018-04-27 南昌工程学院 TFT-L CD defect optical automatic detection system
CN109035226A (en) * 2018-07-12 2018-12-18 武汉精测电子集团股份有限公司 Mura defects detection method based on LSTM model

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06236162A (en) * 1993-02-09 1994-08-23 Sharp Corp Test method for defect of color liquid crystal panel and device for test
KR20060118700A (en) * 2005-05-17 2006-11-24 엘지.필립스 엘시디 주식회사 Liquid crystal display device
CN102055900A (en) * 2009-10-27 2011-05-11 鸿富锦精密工业(深圳)有限公司 Method for adjusting focus of monitor
CN103869511A (en) * 2012-12-13 2014-06-18 乐金显示有限公司 Mura detection apparatus and method of display device
CN104931957A (en) * 2015-06-01 2015-09-23 广东欧珀移动通信有限公司 Distance measurement method and device based on mobile terminal
CN105070247A (en) * 2015-07-29 2015-11-18 信利(惠州)智能显示有限公司 Method for determining nonuniform-brightness pixel points in display screen
CN105938243A (en) * 2016-06-29 2016-09-14 华南理工大学 Multi-magnification microscope fast focusing method applied to TFT-LCD detection
CN106770362A (en) * 2016-12-27 2017-05-31 武汉精测电子技术股份有限公司 Gross imperfection detection means and method based on AOI
CN107845087A (en) * 2017-10-09 2018-03-27 深圳市华星光电半导体显示技术有限公司 The detection method and system of the uneven defect of liquid crystal panel lightness
CN107966836A (en) * 2017-11-29 2018-04-27 南昌工程学院 TFT-L CD defect optical automatic detection system
CN109035226A (en) * 2018-07-12 2018-12-18 武汉精测电子集团股份有限公司 Mura defects detection method based on LSTM model

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
王传东著: "《摄影基础教程》", 31 October 2018, 辽宁科学技术出版社 *
王鸿南等: "图像清晰度评价方法研究", 《中国图象图形学报》 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112595496A (en) * 2020-12-31 2021-04-02 深圳惠牛科技有限公司 Method, device and equipment for detecting defects of near-eye display equipment and storage medium
CN112798235A (en) * 2021-03-19 2021-05-14 武汉精测电子集团股份有限公司 Method and device for detecting micro or miniature defects
CN113639630A (en) * 2021-04-01 2021-11-12 浙江大学台州研究院 Dimension measuring instrument system based on multi-template matching and automatic focusing functions
CN116049863A (en) * 2023-03-28 2023-05-02 东莞锐视光电科技有限公司 System, method and application for generating stripe light by LCD display screen
CN116049863B (en) * 2023-03-28 2023-06-13 东莞锐视光电科技有限公司 System, method and application for generating stripe light by LCD display screen

Similar Documents

Publication Publication Date Title
CN109856157A (en) It is a kind of based on the LCD panel defect inspection method adaptively focused
CN1322307C (en) Apparatus for surface inspection and method and apparatus for inspecting substrate
CN102353519B (en) Resolving power evaluation method for three-generation dim light image intensifier
CN101377918B (en) Electronic display screen system, method and system for correcting electronic display screen brightness
EP0132372B1 (en) Method of and apparatus for examining automotive headlamp
CN112669394B (en) Automatic calibration method for vision detection system
CN103676236B (en) A kind of repair the method for defect pixel, system and display floater
KR100805486B1 (en) A system and a method of measuring a display at multi-angles
CN109167928A (en) Fast automatic exposure method and system based on defects of display panel detection
CN110261069B (en) Detection method for optical lens
CN116433780B (en) Automatic calibration method for laser structured light based on machine vision
US6760096B2 (en) Lens-evaluating method and lens-evaluating apparatus
CN109348216A (en) A kind of combination treatment method of bad point detection peace field calibration
CN110769229A (en) Method, device and system for detecting color brightness of projection picture
CN109949725A (en) A kind of AOI system image grayscale standardized method and system
CN109903245A (en) The non-uniform correction method of infrared image
CN113611242A (en) LED screen correction coefficient generation method, LED screen correction coefficient adjustment method and LED screen correction system
KR102653207B1 (en) Visual inspection apparatus and method of optical calibration of the same
KR101343375B1 (en) Method of checking and setting inspection apparatus
CN105445570B (en) Wide-angle lens camera signal-to-noise ratio testing system and measuring method
CN110248180A (en) Glare testing device
CN111638042B (en) DLP optical characteristic test analysis method
CN115514943B (en) Method for detecting imaging quality of free-form surface lens
CN103673897A (en) Automatic correction method and system of padding height measuring machine
CN107131832A (en) LCD glass edgings effect detection method and device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20190607