CN109829886A - A kind of pcb board defect inspection method based on depth information - Google Patents

A kind of pcb board defect inspection method based on depth information Download PDF

Info

Publication number
CN109829886A
CN109829886A CN201811586272.9A CN201811586272A CN109829886A CN 109829886 A CN109829886 A CN 109829886A CN 201811586272 A CN201811586272 A CN 201811586272A CN 109829886 A CN109829886 A CN 109829886A
Authority
CN
China
Prior art keywords
image
pcb board
depth
depth information
method based
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811586272.9A
Other languages
Chinese (zh)
Inventor
林斌
汪婷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU JIANGAO OPTOELECTRONICS TECHNOLOGY Co Ltd
Original Assignee
SUZHOU JIANGAO OPTOELECTRONICS TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU JIANGAO OPTOELECTRONICS TECHNOLOGY Co Ltd filed Critical SUZHOU JIANGAO OPTOELECTRONICS TECHNOLOGY Co Ltd
Priority to CN201811586272.9A priority Critical patent/CN109829886A/en
Publication of CN109829886A publication Critical patent/CN109829886A/en
Pending legal-status Critical Current

Links

Abstract

The invention discloses a kind of pcb board defect inspection method based on depth information, the described method comprises the following steps: acquire the depth data of pcb board to be detected, standard pcb board respectively;According to the depth data of two pcb boards, corresponding depth image is generated respectively;Standard picture is obtained according to the depth image of standard pcb board, testing image is obtained according to the depth image of pcb board to be detected;Standard picture and testing image are subjected to image registration;Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;It determines that pcb board defect, this method carry out 3-D scanning to pcb board by line laser, obtain pcb board depth information according to bianry image, reduces the data volume that need to be handled, low to illumination condition requirement, range data processing can reduce false detection rate.

Description

A kind of pcb board defect inspection method based on depth information
Technical field
The present invention relates to electronic component detection fields, and in particular to a kind of pcb board defects detection based on depth information Method.
Background technique:
Industrial pcb board defects detection is the Two-dimensional Color Image information based on pcb board, Two-dimensional Color Image mostly at present Middle data volume is excessive and many garbages, and processing speed is slow, to shooting two dimensional image processing essence under the scene of illumination condition difference To spend low, false detection rate is big, it is extracted by features such as color, angle points to two dimensional image, then be compared with on-gauge plate, thus Detect defect present in pcb board.
Summary of the invention
The purpose of the present invention is to provide a kind of pcb board defect inspection method based on depth information, to solve existing skill Caused above-mentioned defects in art.
A kind of pcb board defect inspection method based on depth information, the described method comprises the following steps:
The depth data of pcb board to be detected, standard pcb board is acquired respectively;
According to the depth data of two pcb boards, corresponding depth image is generated respectively;
Standard picture is obtained according to the depth image of standard pcb board, is obtained according to the depth image of pcb board to be detected to be measured Image;
Standard picture and testing image are subjected to image registration;
Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;
Pcb board defect is determined according to bianry image.
Preferably, the generation method of the depth image includes: that the depth data is normalized between 0~255.
Preferably, the method for described image registration includes: using Hough transform method difference examination criteria image and to mapping The circle Mark of picture and the center of circle;It is rotated and is translated by coordinate, realize image registration.
Preferably, described to compare the difference of standard picture and testing image and preset threshold, preset threshold will be less than Pixel set 0, rest of pixels point sets 1, to obtain differentiated bianry image.
Preferably, the calculation method of the difference includes: the picture that the pixel value of standard picture is subtracted to testing image corresponding points Plain value or the pixel value that the pixel value of testing image is subtracted to standard picture corresponding points.
Preferably, the defect of the pcb board determines that method includes: to carry out etching operation to the bianry image, after corrosion White area in image is defect.
The present invention has the advantages that this method carries out 3-D scanning to pcb board by line laser, pcb board depth letter is obtained Breath reduces the data volume that need to be handled, low to illumination condition requirement, and range data processing can reduce false detection rate.
Detailed description of the invention
Fig. 1 is according to a kind of process of the pcb board defect inspection method based on depth information provided in an embodiment of the present invention Figure.
Specific embodiment
To be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, below with reference to Specific embodiment, the present invention is further explained.
As shown in Figure 1, a kind of pcb board defect inspection method based on depth information, the described method comprises the following steps:
The depth data for acquiring pcb board to be detected, standard pcb board respectively, using line laser structured light standard pcb board just Face and the back side, the depth data of collection plate front and back sides;
According to the depth data of two pcb boards, corresponding depth image is generated respectively;
Standard picture is obtained according to the depth image of standard pcb board, is obtained according to the depth image of pcb board to be detected to be measured Image is filtered operation removal noise to obtained depth image, generates on-gauge plate image, and mark different elements region;
Standard picture and testing image are subjected to image registration;
Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;
Pcb board defect is determined according to bianry image.
In the present embodiment, the generation method of the depth image includes: that the depth data is normalized to 0~255 Between.
In the present embodiment, described image registration method include: using Hough transform method difference examination criteria image and The circle Mark of testing image and the center of circle;It is rotated and is translated by coordinate, realize image registration.
In the present embodiment, the acquisition methods of the bianry image include: to be arranged not according to component size to be detected Same threshold value, and compared with the difference of standard picture and testing image and threshold value, the pixel for being less than threshold value is set 0, remaining Pixel sets 1, to obtain differentiated bianry image.
In the present embodiment, the calculation method of the difference includes: that standard picture is subtracted testing image and testing image Subtract the value that standard picture obtains.
In the present embodiment, there are a large amount of false defects in the bianry image, carry out to differentiated bianry image rotten Erosion operation, the white area after corrosion in image is defect.
Based on above-mentioned, in this method, if to subtract the white area in detection figure corresponding in detection plate depth image for standard drawing The depth value of position is pcb board height, then weldering is lacked at the position;If detection figure subtracts the white area in standard drawing in on-gauge plate depth The depth value for spending corresponding position in image is pcb board height, then welds at the position more;For white area remaining in difference image Judge that mistake is welded at the position.
As known by the technical knowledge, the present invention can pass through the embodiment party of other essence without departing from its spirit or essential feature Case is realized.Therefore, embodiment disclosed above, in all respects are merely illustrative, not the only.Institute Have within the scope of the present invention or is included in the invention in the change being equal in the scope of the present invention.

Claims (6)

1. a kind of pcb board defect inspection method based on depth information, which is characterized in that the described method comprises the following steps:
The depth data of pcb board to be detected, standard pcb board is acquired respectively;
According to the depth data of two pcb boards, corresponding depth image is generated respectively;
Standard picture is obtained according to the depth image of standard pcb board, is obtained according to the depth image of pcb board to be detected to mapping Picture;
Standard picture and testing image are subjected to image registration;
Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;
Pcb board defect is determined according to bianry image.
2. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described The generation method of depth image includes:
The depth data is normalized between 0~255.
3. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described The method of image registration includes:
Using circle Mark and the center of circle of Hough transform method difference examination criteria image and testing image;
It is rotated and is translated by coordinate, realize image registration.
4. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described The acquisition methods of bianry image include:
The difference of standard picture and testing image and preset threshold are compared, the pixel for being less than preset threshold is set 0, remaining Pixel sets 1, to obtain differentiated bianry image.
5. a kind of pcb board defect inspection method based on depth information according to claim 4, it is characterised in that: described The calculation method of difference includes:
The pixel value of standard picture is subtracted into the pixel value of testing image corresponding points or the pixel value of testing image is subtracted into standard picture The pixel value of corresponding points.
6. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described Pcb board defect determines that method includes:
Etching operation is carried out to the bianry image, the white area after corrosion in image is defect.
CN201811586272.9A 2018-12-25 2018-12-25 A kind of pcb board defect inspection method based on depth information Pending CN109829886A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811586272.9A CN109829886A (en) 2018-12-25 2018-12-25 A kind of pcb board defect inspection method based on depth information

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811586272.9A CN109829886A (en) 2018-12-25 2018-12-25 A kind of pcb board defect inspection method based on depth information

Publications (1)

Publication Number Publication Date
CN109829886A true CN109829886A (en) 2019-05-31

Family

ID=66861041

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811586272.9A Pending CN109829886A (en) 2018-12-25 2018-12-25 A kind of pcb board defect inspection method based on depth information

Country Status (1)

Country Link
CN (1) CN109829886A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110455815A (en) * 2019-09-05 2019-11-15 西安多维机器视觉检测技术有限公司 A kind of method and system of electronic component open defect detection
CN111044522A (en) * 2019-12-14 2020-04-21 中国科学院深圳先进技术研究院 Defect detection method and device and terminal equipment
CN111812545A (en) * 2020-07-07 2020-10-23 苏州精濑光电有限公司 Line defect detection method, device, equipment and medium
CN112614088A (en) * 2020-12-01 2021-04-06 安徽维德工业自动化有限公司 Identification and detection method based on 3D visual detection technology
CN113781424A (en) * 2021-09-03 2021-12-10 苏州凌云光工业智能技术有限公司 Surface defect detection method, device and equipment
CN114663430A (en) * 2022-05-18 2022-06-24 爱科赛智能科技(浙江)有限公司 PCB surface defect detection method based on frequency domain information double confirmation

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103913465A (en) * 2014-04-04 2014-07-09 北京科技大学 Multi-information fused online high-temperature casting blank surface defect detection method
CN106897994A (en) * 2017-01-20 2017-06-27 北京京仪仪器仪表研究总院有限公司 A kind of pcb board defect detecting system and method based on layered image
CN107450840A (en) * 2017-08-04 2017-12-08 歌尔科技有限公司 The determination method, apparatus and electronic equipment of finger touch connected domain
CN107491763A (en) * 2017-08-24 2017-12-19 歌尔科技有限公司 Finger areas dividing method and device based on depth image
CN107578435A (en) * 2017-09-11 2018-01-12 清华-伯克利深圳学院筹备办公室 A kind of picture depth Forecasting Methodology and device
CN107607546A (en) * 2017-09-19 2018-01-19 佛山缔乐视觉科技有限公司 Leather defect inspection method, system and device based on photometric stereo vision
CN107632022A (en) * 2017-08-30 2018-01-26 武汉理工大学 A kind of detection method of surface flaw of steel rail and device based on data processing
CN109001230A (en) * 2018-05-28 2018-12-14 中兵国铁(广东)科技有限公司 Welding point defect detection method based on machine vision

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103913465A (en) * 2014-04-04 2014-07-09 北京科技大学 Multi-information fused online high-temperature casting blank surface defect detection method
CN106897994A (en) * 2017-01-20 2017-06-27 北京京仪仪器仪表研究总院有限公司 A kind of pcb board defect detecting system and method based on layered image
CN107450840A (en) * 2017-08-04 2017-12-08 歌尔科技有限公司 The determination method, apparatus and electronic equipment of finger touch connected domain
CN107491763A (en) * 2017-08-24 2017-12-19 歌尔科技有限公司 Finger areas dividing method and device based on depth image
CN107632022A (en) * 2017-08-30 2018-01-26 武汉理工大学 A kind of detection method of surface flaw of steel rail and device based on data processing
CN107578435A (en) * 2017-09-11 2018-01-12 清华-伯克利深圳学院筹备办公室 A kind of picture depth Forecasting Methodology and device
CN107607546A (en) * 2017-09-19 2018-01-19 佛山缔乐视觉科技有限公司 Leather defect inspection method, system and device based on photometric stereo vision
CN109001230A (en) * 2018-05-28 2018-12-14 中兵国铁(广东)科技有限公司 Welding point defect detection method based on machine vision

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110455815A (en) * 2019-09-05 2019-11-15 西安多维机器视觉检测技术有限公司 A kind of method and system of electronic component open defect detection
CN110455815B (en) * 2019-09-05 2023-03-24 西安多维机器视觉检测技术有限公司 Method and system for detecting appearance defects of electronic components
CN111044522A (en) * 2019-12-14 2020-04-21 中国科学院深圳先进技术研究院 Defect detection method and device and terminal equipment
CN111044522B (en) * 2019-12-14 2022-03-11 中国科学院深圳先进技术研究院 Defect detection method and device and terminal equipment
CN111812545A (en) * 2020-07-07 2020-10-23 苏州精濑光电有限公司 Line defect detection method, device, equipment and medium
CN112614088A (en) * 2020-12-01 2021-04-06 安徽维德工业自动化有限公司 Identification and detection method based on 3D visual detection technology
CN113781424A (en) * 2021-09-03 2021-12-10 苏州凌云光工业智能技术有限公司 Surface defect detection method, device and equipment
CN113781424B (en) * 2021-09-03 2024-02-27 苏州凌云光工业智能技术有限公司 Surface defect detection method, device and equipment
CN114663430A (en) * 2022-05-18 2022-06-24 爱科赛智能科技(浙江)有限公司 PCB surface defect detection method based on frequency domain information double confirmation

Similar Documents

Publication Publication Date Title
CN109829886A (en) A kind of pcb board defect inspection method based on depth information
CN109813727A (en) A kind of pcb board weld defects detection method based on depth information
CN109816678B (en) Automatic nozzle atomization angle detection system and method based on vision
JP5699788B2 (en) Screen area detection method and system
KR101590831B1 (en) Method of inspecting foreign substance on a board
CN110473165A (en) A kind of welding quality of circuit board detection method and device
CN109472271B (en) Printed circuit board image contour extraction method and device
CN105718931B (en) System and method for determining clutter in acquired images
CN111982921A (en) Hole defect detection method and device, conveying platform and storage medium
CN109986201B (en) Tracking detection method and device for welding seam, storage medium and laser welding equipment
KR20130126370A (en) Method and apparatus for inspecting via hole
CN105303573B (en) The pin detection method and system of acupuncture needle class component
JPWO2016208626A1 (en) Surface defect detection method, surface defect detection apparatus, and steel material manufacturing method
CN112284260A (en) Visual displacement monitoring method, equipment and system
CN105205803A (en) Display panel defect detection method
CN106327464A (en) Edge detection method
CN104749801B (en) High Precision Automatic optical detecting method and system
WO2017050082A1 (en) Method for determining terminal position and terminal equipment
JP2013213733A (en) Apparatus and method for inspecting object to be inspected
CN111223078B (en) Method for determining flaw level and storage medium
CN103903284A (en) Multi-circle detecting method based on least square method
TW201516397A (en) Bubble inspection system for glass
CN109087265B (en) Multi-camera image coordinate conversion method and device
CN114964032B (en) Blind hole depth measurement method and device based on machine vision
CN107564001B (en) Magnetic sheet corner defect detection method based on pit search

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination