CN109829886A - A kind of pcb board defect inspection method based on depth information - Google Patents
A kind of pcb board defect inspection method based on depth information Download PDFInfo
- Publication number
- CN109829886A CN109829886A CN201811586272.9A CN201811586272A CN109829886A CN 109829886 A CN109829886 A CN 109829886A CN 201811586272 A CN201811586272 A CN 201811586272A CN 109829886 A CN109829886 A CN 109829886A
- Authority
- CN
- China
- Prior art keywords
- image
- pcb board
- depth
- depth information
- method based
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
The invention discloses a kind of pcb board defect inspection method based on depth information, the described method comprises the following steps: acquire the depth data of pcb board to be detected, standard pcb board respectively;According to the depth data of two pcb boards, corresponding depth image is generated respectively;Standard picture is obtained according to the depth image of standard pcb board, testing image is obtained according to the depth image of pcb board to be detected;Standard picture and testing image are subjected to image registration;Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;It determines that pcb board defect, this method carry out 3-D scanning to pcb board by line laser, obtain pcb board depth information according to bianry image, reduces the data volume that need to be handled, low to illumination condition requirement, range data processing can reduce false detection rate.
Description
Technical field
The present invention relates to electronic component detection fields, and in particular to a kind of pcb board defects detection based on depth information
Method.
Background technique:
Industrial pcb board defects detection is the Two-dimensional Color Image information based on pcb board, Two-dimensional Color Image mostly at present
Middle data volume is excessive and many garbages, and processing speed is slow, to shooting two dimensional image processing essence under the scene of illumination condition difference
To spend low, false detection rate is big, it is extracted by features such as color, angle points to two dimensional image, then be compared with on-gauge plate, thus
Detect defect present in pcb board.
Summary of the invention
The purpose of the present invention is to provide a kind of pcb board defect inspection method based on depth information, to solve existing skill
Caused above-mentioned defects in art.
A kind of pcb board defect inspection method based on depth information, the described method comprises the following steps:
The depth data of pcb board to be detected, standard pcb board is acquired respectively;
According to the depth data of two pcb boards, corresponding depth image is generated respectively;
Standard picture is obtained according to the depth image of standard pcb board, is obtained according to the depth image of pcb board to be detected to be measured
Image;
Standard picture and testing image are subjected to image registration;
Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;
Pcb board defect is determined according to bianry image.
Preferably, the generation method of the depth image includes: that the depth data is normalized between 0~255.
Preferably, the method for described image registration includes: using Hough transform method difference examination criteria image and to mapping
The circle Mark of picture and the center of circle;It is rotated and is translated by coordinate, realize image registration.
Preferably, described to compare the difference of standard picture and testing image and preset threshold, preset threshold will be less than
Pixel set 0, rest of pixels point sets 1, to obtain differentiated bianry image.
Preferably, the calculation method of the difference includes: the picture that the pixel value of standard picture is subtracted to testing image corresponding points
Plain value or the pixel value that the pixel value of testing image is subtracted to standard picture corresponding points.
Preferably, the defect of the pcb board determines that method includes: to carry out etching operation to the bianry image, after corrosion
White area in image is defect.
The present invention has the advantages that this method carries out 3-D scanning to pcb board by line laser, pcb board depth letter is obtained
Breath reduces the data volume that need to be handled, low to illumination condition requirement, and range data processing can reduce false detection rate.
Detailed description of the invention
Fig. 1 is according to a kind of process of the pcb board defect inspection method based on depth information provided in an embodiment of the present invention
Figure.
Specific embodiment
To be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, below with reference to
Specific embodiment, the present invention is further explained.
As shown in Figure 1, a kind of pcb board defect inspection method based on depth information, the described method comprises the following steps:
The depth data for acquiring pcb board to be detected, standard pcb board respectively, using line laser structured light standard pcb board just
Face and the back side, the depth data of collection plate front and back sides;
According to the depth data of two pcb boards, corresponding depth image is generated respectively;
Standard picture is obtained according to the depth image of standard pcb board, is obtained according to the depth image of pcb board to be detected to be measured
Image is filtered operation removal noise to obtained depth image, generates on-gauge plate image, and mark different elements region;
Standard picture and testing image are subjected to image registration;
Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;
Pcb board defect is determined according to bianry image.
In the present embodiment, the generation method of the depth image includes: that the depth data is normalized to 0~255
Between.
In the present embodiment, described image registration method include: using Hough transform method difference examination criteria image and
The circle Mark of testing image and the center of circle;It is rotated and is translated by coordinate, realize image registration.
In the present embodiment, the acquisition methods of the bianry image include: to be arranged not according to component size to be detected
Same threshold value, and compared with the difference of standard picture and testing image and threshold value, the pixel for being less than threshold value is set 0, remaining
Pixel sets 1, to obtain differentiated bianry image.
In the present embodiment, the calculation method of the difference includes: that standard picture is subtracted testing image and testing image
Subtract the value that standard picture obtains.
In the present embodiment, there are a large amount of false defects in the bianry image, carry out to differentiated bianry image rotten
Erosion operation, the white area after corrosion in image is defect.
Based on above-mentioned, in this method, if to subtract the white area in detection figure corresponding in detection plate depth image for standard drawing
The depth value of position is pcb board height, then weldering is lacked at the position;If detection figure subtracts the white area in standard drawing in on-gauge plate depth
The depth value for spending corresponding position in image is pcb board height, then welds at the position more;For white area remaining in difference image
Judge that mistake is welded at the position.
As known by the technical knowledge, the present invention can pass through the embodiment party of other essence without departing from its spirit or essential feature
Case is realized.Therefore, embodiment disclosed above, in all respects are merely illustrative, not the only.Institute
Have within the scope of the present invention or is included in the invention in the change being equal in the scope of the present invention.
Claims (6)
1. a kind of pcb board defect inspection method based on depth information, which is characterized in that the described method comprises the following steps:
The depth data of pcb board to be detected, standard pcb board is acquired respectively;
According to the depth data of two pcb boards, corresponding depth image is generated respectively;
Standard picture is obtained according to the depth image of standard pcb board, is obtained according to the depth image of pcb board to be detected to mapping
Picture;
Standard picture and testing image are subjected to image registration;
Image difference operation is carried out with testing image to the standard picture after registration, obtains bianry image;
Pcb board defect is determined according to bianry image.
2. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described
The generation method of depth image includes:
The depth data is normalized between 0~255.
3. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described
The method of image registration includes:
Using circle Mark and the center of circle of Hough transform method difference examination criteria image and testing image;
It is rotated and is translated by coordinate, realize image registration.
4. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described
The acquisition methods of bianry image include:
The difference of standard picture and testing image and preset threshold are compared, the pixel for being less than preset threshold is set 0, remaining
Pixel sets 1, to obtain differentiated bianry image.
5. a kind of pcb board defect inspection method based on depth information according to claim 4, it is characterised in that: described
The calculation method of difference includes:
The pixel value of standard picture is subtracted into the pixel value of testing image corresponding points or the pixel value of testing image is subtracted into standard picture
The pixel value of corresponding points.
6. a kind of pcb board defect inspection method based on depth information according to claim 1, it is characterised in that: described
Pcb board defect determines that method includes:
Etching operation is carried out to the bianry image, the white area after corrosion in image is defect.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811586272.9A CN109829886A (en) | 2018-12-25 | 2018-12-25 | A kind of pcb board defect inspection method based on depth information |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811586272.9A CN109829886A (en) | 2018-12-25 | 2018-12-25 | A kind of pcb board defect inspection method based on depth information |
Publications (1)
Publication Number | Publication Date |
---|---|
CN109829886A true CN109829886A (en) | 2019-05-31 |
Family
ID=66861041
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201811586272.9A Pending CN109829886A (en) | 2018-12-25 | 2018-12-25 | A kind of pcb board defect inspection method based on depth information |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN109829886A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110455815A (en) * | 2019-09-05 | 2019-11-15 | 西安多维机器视觉检测技术有限公司 | A kind of method and system of electronic component open defect detection |
CN111044522A (en) * | 2019-12-14 | 2020-04-21 | 中国科学院深圳先进技术研究院 | Defect detection method and device and terminal equipment |
CN111812545A (en) * | 2020-07-07 | 2020-10-23 | 苏州精濑光电有限公司 | Line defect detection method, device, equipment and medium |
CN112614088A (en) * | 2020-12-01 | 2021-04-06 | 安徽维德工业自动化有限公司 | Identification and detection method based on 3D visual detection technology |
CN113781424A (en) * | 2021-09-03 | 2021-12-10 | 苏州凌云光工业智能技术有限公司 | Surface defect detection method, device and equipment |
CN114663430A (en) * | 2022-05-18 | 2022-06-24 | 爱科赛智能科技(浙江)有限公司 | PCB surface defect detection method based on frequency domain information double confirmation |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103913465A (en) * | 2014-04-04 | 2014-07-09 | 北京科技大学 | Multi-information fused online high-temperature casting blank surface defect detection method |
CN106897994A (en) * | 2017-01-20 | 2017-06-27 | 北京京仪仪器仪表研究总院有限公司 | A kind of pcb board defect detecting system and method based on layered image |
CN107450840A (en) * | 2017-08-04 | 2017-12-08 | 歌尔科技有限公司 | The determination method, apparatus and electronic equipment of finger touch connected domain |
CN107491763A (en) * | 2017-08-24 | 2017-12-19 | 歌尔科技有限公司 | Finger areas dividing method and device based on depth image |
CN107578435A (en) * | 2017-09-11 | 2018-01-12 | 清华-伯克利深圳学院筹备办公室 | A kind of picture depth Forecasting Methodology and device |
CN107607546A (en) * | 2017-09-19 | 2018-01-19 | 佛山缔乐视觉科技有限公司 | Leather defect inspection method, system and device based on photometric stereo vision |
CN107632022A (en) * | 2017-08-30 | 2018-01-26 | 武汉理工大学 | A kind of detection method of surface flaw of steel rail and device based on data processing |
CN109001230A (en) * | 2018-05-28 | 2018-12-14 | 中兵国铁(广东)科技有限公司 | Welding point defect detection method based on machine vision |
-
2018
- 2018-12-25 CN CN201811586272.9A patent/CN109829886A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103913465A (en) * | 2014-04-04 | 2014-07-09 | 北京科技大学 | Multi-information fused online high-temperature casting blank surface defect detection method |
CN106897994A (en) * | 2017-01-20 | 2017-06-27 | 北京京仪仪器仪表研究总院有限公司 | A kind of pcb board defect detecting system and method based on layered image |
CN107450840A (en) * | 2017-08-04 | 2017-12-08 | 歌尔科技有限公司 | The determination method, apparatus and electronic equipment of finger touch connected domain |
CN107491763A (en) * | 2017-08-24 | 2017-12-19 | 歌尔科技有限公司 | Finger areas dividing method and device based on depth image |
CN107632022A (en) * | 2017-08-30 | 2018-01-26 | 武汉理工大学 | A kind of detection method of surface flaw of steel rail and device based on data processing |
CN107578435A (en) * | 2017-09-11 | 2018-01-12 | 清华-伯克利深圳学院筹备办公室 | A kind of picture depth Forecasting Methodology and device |
CN107607546A (en) * | 2017-09-19 | 2018-01-19 | 佛山缔乐视觉科技有限公司 | Leather defect inspection method, system and device based on photometric stereo vision |
CN109001230A (en) * | 2018-05-28 | 2018-12-14 | 中兵国铁(广东)科技有限公司 | Welding point defect detection method based on machine vision |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110455815A (en) * | 2019-09-05 | 2019-11-15 | 西安多维机器视觉检测技术有限公司 | A kind of method and system of electronic component open defect detection |
CN110455815B (en) * | 2019-09-05 | 2023-03-24 | 西安多维机器视觉检测技术有限公司 | Method and system for detecting appearance defects of electronic components |
CN111044522A (en) * | 2019-12-14 | 2020-04-21 | 中国科学院深圳先进技术研究院 | Defect detection method and device and terminal equipment |
CN111044522B (en) * | 2019-12-14 | 2022-03-11 | 中国科学院深圳先进技术研究院 | Defect detection method and device and terminal equipment |
CN111812545A (en) * | 2020-07-07 | 2020-10-23 | 苏州精濑光电有限公司 | Line defect detection method, device, equipment and medium |
CN112614088A (en) * | 2020-12-01 | 2021-04-06 | 安徽维德工业自动化有限公司 | Identification and detection method based on 3D visual detection technology |
CN113781424A (en) * | 2021-09-03 | 2021-12-10 | 苏州凌云光工业智能技术有限公司 | Surface defect detection method, device and equipment |
CN113781424B (en) * | 2021-09-03 | 2024-02-27 | 苏州凌云光工业智能技术有限公司 | Surface defect detection method, device and equipment |
CN114663430A (en) * | 2022-05-18 | 2022-06-24 | 爱科赛智能科技(浙江)有限公司 | PCB surface defect detection method based on frequency domain information double confirmation |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109829886A (en) | A kind of pcb board defect inspection method based on depth information | |
CN109813727A (en) | A kind of pcb board weld defects detection method based on depth information | |
CN109816678B (en) | Automatic nozzle atomization angle detection system and method based on vision | |
JP5699788B2 (en) | Screen area detection method and system | |
KR101590831B1 (en) | Method of inspecting foreign substance on a board | |
CN110473165A (en) | A kind of welding quality of circuit board detection method and device | |
CN109472271B (en) | Printed circuit board image contour extraction method and device | |
CN105718931B (en) | System and method for determining clutter in acquired images | |
CN111982921A (en) | Hole defect detection method and device, conveying platform and storage medium | |
CN109986201B (en) | Tracking detection method and device for welding seam, storage medium and laser welding equipment | |
KR20130126370A (en) | Method and apparatus for inspecting via hole | |
CN105303573B (en) | The pin detection method and system of acupuncture needle class component | |
JPWO2016208626A1 (en) | Surface defect detection method, surface defect detection apparatus, and steel material manufacturing method | |
CN112284260A (en) | Visual displacement monitoring method, equipment and system | |
CN105205803A (en) | Display panel defect detection method | |
CN106327464A (en) | Edge detection method | |
CN104749801B (en) | High Precision Automatic optical detecting method and system | |
WO2017050082A1 (en) | Method for determining terminal position and terminal equipment | |
JP2013213733A (en) | Apparatus and method for inspecting object to be inspected | |
CN111223078B (en) | Method for determining flaw level and storage medium | |
CN103903284A (en) | Multi-circle detecting method based on least square method | |
TW201516397A (en) | Bubble inspection system for glass | |
CN109087265B (en) | Multi-camera image coordinate conversion method and device | |
CN114964032B (en) | Blind hole depth measurement method and device based on machine vision | |
CN107564001B (en) | Magnetic sheet corner defect detection method based on pit search |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |