CN109813451B - Full-phase measurement and locking method of ultrafast laser pulse and corresponding device - Google Patents
Full-phase measurement and locking method of ultrafast laser pulse and corresponding device Download PDFInfo
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Abstract
The invention provides a full-phase measurement method of an ultrafast laser pulse, wherein the spectral range of the ultrafast laser pulse is more than one octave, and the method comprises the following steps: the method comprises the following steps: splitting the ultrafast laser pulse into a first beam and a second beam, whereinThe first light beam comprises a wavelength lambda0The second light beam comprises a wavelength of 2 λ0The light of (2); step two: the wavelength is 2 lambda0To wavelength lambda of the light0And then with said wavelength lambda0The fundamental frequency light of (2) is interfered; step three: fourier transforming the interference spectrum of the interference; and step four: obtaining a wavelength λ based on a result of the Fourier transform0The relative envelope delay RED and the carrier envelope phase CEP between the fundamental light and the doubled light. The method can adopt a set of simple devices to simultaneously realize the full-phase measurement of the ultrafast laser pulse, and has high measurement precision.
Description
Technical Field
The invention belongs to the technical field of laser, and particularly relates to a full-phase measuring and locking device of ultrafast laser pulses and a corresponding method.
Background
In the field of laser technology, how to obtain laser pulses with stronger energy and shorter pulse width has been an important research direction. Coherent control and synthesis can realize synthesized pulses which are shorter than each incident pulse in pulse width, and can greatly improve the energy of the incident pulses, so that the application of the coherent control and synthesis in the field of generation of ultra-strong and ultra-fast laser pulses is a leading-edge topic which has strategic significance internationally at present. The key factor in coherent control and synthesis is how to achieve full-phase measurement and locking of ultrafast laser pulses.
The total phase of the ultrafast laser is the relative phase between the plurality of coherent combined laser pulses, which includes both the Relative Envelope Delay (RED) between the plurality of coherent combined laser pulses, which is the relative phase difference between the envelopes of the two pulses, and the Carrier Envelope Phase (CEP) of the laser pulses after coherent combination, which is the phase difference between the carrier and the envelope peak in a single pulse. In the field of periodic-scale laser pulses, RED and CEP have a large impact on the coherent synthesis of the pulses. Currently, lock control can be performed on RED and CEP internationally, wherein a method for lock control RED includes a balanced optical cross correlation (BOC), a spectral interference scheme, and the like, and a method for lock control CEP includes an f-2f scheme, and the like. To lock and control RED and CEP simultaneously, two different devices must be provided, which makes the measurement process extremely complicated, difficult to operate, and poor in measurement accuracy.
Disclosure of Invention
It is therefore an object of the present invention to overcome the above-mentioned drawbacks of the prior art and to provide a method for full-phase measurement of ultrafast laser pulses, said ultrafast laser pulses having a spectral range greater than one octave, said method comprising the steps of:
the method comprises the following steps: splitting the ultrafast laser pulse into a first beam and a second beam, wherein the first beam comprises a wavelength λ0The second light beam comprises a wavelength of 2 λ0The light of (2);
step two: the wavelength is 2 lambda0To wavelength lambda of the light0And then with said wavelength lambda0The fundamental frequency light of (2) is interfered;
step three: fourier transforming the interference spectrum of the interference; and
step four: obtaining a wavelength λ based on a result of the Fourier transform0The relative envelope delay RED and the carrier envelope phase CEP between the fundamental light and the doubled light.
According to the full-phase measurement method of the present invention, preferably, the ultrafast laser pulse has a spectral range of 450nm to 1000 nm.
According to the all-phase measurement method of the present invention, preferably, the λ0Is 480 nm.
According to the full-phase measurement method of the present invention, preferably, in the fourth step, in the result of the fourier transform, the abscissa and the ordinate of the first peak point represent the relative envelope delay RED and the total relative phase RTP, respectively.
According to the full-phase measurement method of the present invention, preferably, the carrier wave includes a phase CEP calculated according to the following formula:
where Φ is the total relative phase RTP, w is the frequency of the ultrafast laser pulse, Δ t is the relative envelope delay RED,
is the carrier envelope phase CEP.
The all-phase measurement method according to the present invention preferably further includes:
step five: a step of feedback locking based on the relative envelope delay RED and the carrier including phase CEP.
The invention also provides a full-phase measuring device of ultrafast laser pulse, comprising:
the ultrafast laser source is used for emitting ultrafast laser pulses with a spectral range larger than one octave;
a beam splitting element for splitting the ultrafast laser pulse into a first beam and a second beam, wherein the first beam comprises a wavelength λ0The second light beam comprises a wavelength of 2 λ0The light of (2);
at least one optical path adjusting means for adjusting an optical path of the first light beam or the second light beam;
a beam combining element disposed behind the at least one optical path adjusting member for combining the first light beam and the second light beam;
frequency doubling crystal for doubling the wavelength 2 λ0Frequency of light to λ0；
Polarization adjustment member for adjusting wavelength λ0Fundamental light and wavelength λ of0The polarization direction of the light is doubled so that the two interfere with each other;
the spectrum acquisition device is used for acquiring the spectral pattern of the interference; and
a data processing unit for Fourier transforming the spectral pattern and extracting a wavelength λ0The relative envelope delay RED and the carrier envelope phase CEP between the fundamental light and the doubled light.
The apparatus for full-phase measurement of ultrafast laser pulses according to the present invention preferably further comprises a feedback control unit for feeding back said relative envelope delay RED to said at least one optical path adjusting means and said carrier envelope phase CEP to said ultrafast laser source.
According to the full-phase measurement device of the ultrafast laser pulse of the present invention, preferably, in the result of the fourier transform, the abscissa and the ordinate of the first peak point represent the relative envelope delay RED and the total relative phase RTP, respectively.
According to the full-phase measurement apparatus of ultrafast laser pulse of the present invention, preferably, the data processing unit calculates the carrier wave including phase CEP according to the following formula:
where Φ is the total relative phase RTP, w is the frequency of the ultrafast laser pulse, Δ t is the relative envelope delay RED,
is the carrier envelope phase CEP.
Compared with the prior art, the invention has the advantages that: the method can simultaneously obtain the full-phase information of the ultrafast laser, and has the advantages of simple device, easy operation and high measurement precision.
Drawings
Embodiments of the invention are further described below with reference to the accompanying drawings, in which:
FIG. 1 is an optical diagram of measuring and locking the full phase of an ultrafast laser pulse, in accordance with an embodiment of the present invention;
FIG. 2 is a graph of an interference spectrum according to an embodiment of the present invention;
FIG. 3 is a Fourier transform pattern of the interference spectrum curve shown in FIG. 2; and
fig. 4 shows RED data, RTP data, and interference spectrum patterns of an ultrafast laser in both full phase lock and unlock conditions.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail by embodiments with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Embodiments of the present invention provide a method for measuring and locking the full phase of ultrafast laser pulses, referring to the optical path diagram of measuring and locking the full phase of ultrafast laser pulses shown in fig. 1. The ultra-fast light source 1 composed of a titanium gem laser and a spectrum broadening component outputs ultra-continuous spectrum light with the energy of 0.4mJ and the wavelength band of 450-750nm to a dichroic mirror 2, the ultra-continuous spectrum light is divided into a long wave beam with the wavelength of 650-1000nm and a short wave beam with the wavelength of 450-750nm, the long wave beam passes through a piezoelectric ceramic translation stage PZT1 and reaches the dichroic mirror 5 through a reflecting mirror 3, the short wave beam passes through a piezoelectric ceramic translation stage PZT2 and reaches the dichroic mirror 5 through a reflecting mirror 4, the piezoelectric ceramic translation stages PZT1 and PZT2 are used for adjusting the optical path of two paths of light, the long wave beam and the short wave beam are combined through the dichroic mirror 5 and then reach a wedge pair beam splitter 6, most of light is output as output light, and a small part of light is used as measurement and locking light to realize the subsequent measurement locking process. Specifically, the lock light is focused through the parabolic mirror 7 onto the class I phase matching BBO crystal 8, wherein the light in the long-wavelength beam having a wavelength of around 960nm is frequency-doubled by the BBO crystal 8 to around 480nm, and the polarization state is rotated by 90 ° from that of the fundamental light. Then, the band-pass filter 9 filters out the fundamental light and the frequency-doubled light with a wavelength of about 480nm, and filters out the light with other wavelengths. The light of about 480nm emitted from the band-pass filter 9 enters the half-wave plate 10 and the glan prism 11, and the half-wave plate and the glan prism jointly adjust the polarization state of the light beam, so that the fundamental frequency light and the frequency doubling light have polarization components in the same direction, and interference occurs. Then, the interference light is focused by a broadband concave silver mirror 12 with a curvature radius of 100nm onto a spectrometer 13 with a precision of 0.5nm to collect the interference spectrum, and the curve of the interference spectrum is shown in FIG. 2.
In the frequency domain, the short-wave fundamental frequency light and the long-wave frequency doubling light in the supercontinuum can be written as follows:
wherein, If(w) and Ish(w) the intensities of the short-wave part and the long-wave part of the fundamental frequency light after frequency doubling, respectively, w is the laser pulse frequency,
for the laser pulse Carrier Envelope Phase (CEP), Δ t is the Relative Envelope Delay (RED) between the two pulses, and from maxwell's equations, the second harmonic electric field of the long-wave section has a fixed phase shift of pi/2 from the fundamental frequency. Therefore, it is not only easy to use
And
the spectral phases of the fundamental light and the frequency doubled light respectively.
The light intensity after interference superposition is
Wherein the third term is an interference term and contains the information of CEP and RED.
The spectrometer 13 is connected to the data processing unit 14, and the data processing unit 14 performs fourier transform on the interference light intensity information of formula (3), and extracts an imaginary part, which is the total relative phase RTP:
from the above equation, the total relative phase RTP between the two beams includes the relative envelope delay Δ t and the carrier envelope phase
Performing fourier transform on an interference pattern acquired by a spectrometer to obtain a curve shown in fig. 3, wherein fig. 3 is a fourier transform pattern of the interference spectrum curve shown in fig. 2, a horizontal axis represents time, a vertical axis represents intensity, an abscissa and an ordinate of a first peak point (first order) in the curve are RED (namely Δ t) and RTP (namely Φ), respectively, and substituting the values of Δ t and Φ into the formula (4) can obtain values of Δ t and Φ
I.e., CEP information, and thus obtains the relative envelope delay RED and the carrier envelope phase CEP, i.e., obtains the main phase information of the ultrafast laser. To achieve lock control, with continued reference to fig. 1, the lock on RED is achieved by the first feedback module PID1 feeding RED back to PZT1, and the lock on CEP is achieved by the second feedback module PID2 feeding CEP back to the compressor in the ultrafast light source 1, and finally full phase lock on supercontinuum is achieved.
In order to demonstrate the effect of the present invention, the inventors monitored the RED data, RTP data, and interference spectrum patterns both in the case of full phase lock and unlocked, and locked at 0s-20s and unlocked at 20s-40s, with the results shown in fig. 4. Referring to FIG. 4 (a), at 0-20s, the Root Mean Square (RMS) value of RED is about 25as, and at 20-40s, the RMS value of RED is about 130 as; referring to FIG. 4 (b), at 0-20s, the RMS value at RTP is about 300mrad, and at 20-40s, the RMS value of RTP is about 1000 rmad; referring to FIG. 4 (c), the interference spectrum is relatively clean in 0-20s, and relatively disordered in 20-40 s. It can be seen that the full phase lock of the present invention greatly improves the performance of the supercontinuum light source.
In the embodiment of the invention, the BBO crystal 8, the band-pass filter 9, the half-wave plate 10, the Glan prism 11, the broadband concave silver mirror 12 and the spectrometer 13 form an f-2f device for obtaining the interference spectrum information of the two beams of light. The key point of the invention is that the relative envelope delay and the carrier envelope phase of two beams of light are extracted from the interference spectrum information and then are respectively fed back to the piezoelectric ceramic and the ultrafast light source, thereby realizing the full-phase locking of the ultrafast laser.
In addition, in this embodiment, the RED can be fed back to the PZT2 by the first feedback module PID1 to achieve locking of RED, and the CEP can be fed back to other components in the light source, such as an amplifier, a stretcher, and the like.
According to other embodiments of the invention, a fiber laser is used, and the output light of the fiber laser is widened to obtain the ultrafast laser.
According to other embodiments of the present invention, the piezoelectric ceramics may be replaced with optical path adjusting means known in the art. In addition, only one optical path adjusting member may be provided for adjusting the optical path of the long-wavelength band light beam or the short-wavelength band light beam and then adjusting the optical path difference of the two light beams.
According to other embodiments of the present invention, the dichroic mirror 2 and the dichroic mirror 5 may be replaced by other beam splitting/combining elements known in the art.
According to other embodiments of the present invention, the data processing unit, the first feedback module and the second feedback module are integrated in a computer, so as to realize extraction and feedback locking of the fourier transform of the spectrum, the relative envelope delay and the carrier envelope phase.
According to other embodiments of the present invention, the frequency doubling crystal uses other third order nonlinear media, such as: KDP, PPLN, Ammonium Dihydrogen Phosphate (ADP), potassium dihydrogen phosphate (KDP), potassium dideuterium phosphate (DKDP), cesium dideuterium arsenate (DCDA), Cesium Dihydrogen Arsenate (CDA), and the like.
In summary, in the present invention, the spectrum range of the supercontinuum output by the ultrafast laser source is larger than one octave, and in order to realize full phase locking, the ultrafast laser is divided into two beams, the first beam contains the wavelength λ0And the second light beam comprises light having a wavelength of 2 lambda0So that the wavelength is 2 lambda0After frequency doubling with a wavelength of lambda0The fundamental frequency light is interfered, interference spectrum is collected and further Fourier change is carried out, corresponding Relative Envelope Delay (RED) and Carrier Envelope Phase (CEP) can be extracted, and ultrafast laser pulse is further realizedFull phase lock of (1). The method of the invention is also suitable for full-phase measurement of electromagnetic spectrum of other frequency bands, such as x-ray, ultraviolet light, visible light, infrared light or terahertz wave bands.
Although the present invention has been described by way of preferred embodiments, the present invention is not limited to the embodiments described herein, and various changes and modifications may be made without departing from the scope of the present invention.
Claims (8)
1. A method for full phase measurement of ultrafast laser pulses, said ultrafast laser pulses having a spectral range greater than one octave, said method comprising the steps of:
the method comprises the following steps: splitting the ultrafast laser pulse into a first beam and a second beam, wherein the first beam comprises a wavelength λ0The second light beam comprises a wavelength of 2 λ0The light of (2);
step two: the wavelength is 2 lambda0To wavelength lambda of the light0And then with said wavelength lambda0The fundamental frequency light of (2) is interfered;
step three: fourier transforming the interference spectrum of the interference; and
step four: obtaining a wavelength λ based on a result of the Fourier transform0Relative envelope delay RED and carrier envelope phase CEP between the fundamental light and the doubled light, wherein
In the result of said fourier transform of said step four, the abscissa and the ordinate of the first peak point represent said relative envelope delay RED and the total relative phase RTP, respectively.
2. The all-phase measurement method according to claim 1, wherein the ultrafast laser pulse has a spectral range of 450nm-1000 nm.
3. The all-phase measurement method of claim 2, wherein λ0Is 480 nm.
4. The all-phase measurement method of claim 1, wherein calculating the carrier wave according to the following formula comprises phase CEP:
where Φ is the total relative phase RTP, w is the frequency of the ultrafast laser pulse, Δ t is the relative envelope delay RED,
is the carrier envelope phase CEP.
5. The full phase measurement method according to any one of claims 1-3, further comprising:
step five: a step of feedback locking based on the relative envelope delay RED and the carrier including phase CEP.
6. An apparatus for full phase measurement of ultrafast laser pulses, comprising:
the ultrafast laser source is used for emitting ultrafast laser pulses with a spectral range larger than one octave;
a beam splitting element for splitting the ultrafast laser pulse into a first beam and a second beam, wherein the first beam comprises a wavelength λ0The second light beam comprises a wavelength of 2 λ0The light of (2);
at least one optical path adjusting means for adjusting an optical path of the first light beam or the second light beam;
a beam combining element disposed behind the at least one optical path adjusting member for combining the first light beam and the second light beam;
frequency doubling crystal for doubling the wavelength 2 λ0Frequency of light to λ0；
Polarization adjustment member for adjusting wavelength λ0Fundamental light and wavelength λ of0The polarization direction of the light is doubled so that the two interfere with each other;
the spectrum acquisition device is used for acquiring the spectral pattern of the interference; and
a data processing unit for Fourier transforming the spectral pattern and extracting a wavelength λ0Relative envelope delay RED and carrier envelope phase CEP between the fundamental light and the doubled light, wherein
In the result of the fourier transformation, the abscissa and ordinate of the first peak point represent the relative envelope delay RED and the total relative phase RTP, respectively.
7. The apparatus for full-phase measurement of ultrafast laser pulses according to claim 6, further comprising a feedback control unit for feeding back said relative envelope delay RED to said at least one optical path length adjusting means and said carrier envelope phase CEP to said ultrafast laser source.
8. The apparatus for full-phase measurement of ultrafast laser pulses according to claim 6 or 7, wherein said data processing unit calculates said carrier wave including phase CEP according to the following formula:
where Φ is the total relative phase RTP, w is the frequency of the ultrafast laser pulse, Δ t is the relative envelope delay RED,
is the carrier envelope phase CEP.
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