CN109781031A - A kind of large scale mirror surface face type detection system and its method - Google Patents

A kind of large scale mirror surface face type detection system and its method Download PDF

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Publication number
CN109781031A
CN109781031A CN201910065781.5A CN201910065781A CN109781031A CN 109781031 A CN109781031 A CN 109781031A CN 201910065781 A CN201910065781 A CN 201910065781A CN 109781031 A CN109781031 A CN 109781031A
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CN
China
Prior art keywords
acquisition device
image acquisition
under test
object under
code pattern
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Pending
Application number
CN201910065781.5A
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Chinese (zh)
Inventor
王昌灵
沈平
孙楠
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SHANGHAI JINGDIAN NEW ENERGY CO Ltd
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SHANGHAI JINGDIAN NEW ENERGY CO Ltd
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Priority to CN201910065781.5A priority Critical patent/CN109781031A/en
Publication of CN109781031A publication Critical patent/CN109781031A/en
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Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24HEATING; RANGES; VENTILATING
    • F24SSOLAR HEAT COLLECTORS; SOLAR HEAT SYSTEMS
    • F24S80/00Details, accessories or component parts of solar heat collectors not provided for in groups F24S10/00-F24S70/00
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24HEATING; RANGES; VENTILATING
    • F24SSOLAR HEAT COLLECTORS; SOLAR HEAT SYSTEMS
    • F24S23/00Arrangements for concentrating solar-rays for solar heat collectors
    • F24S23/70Arrangements for concentrating solar-rays for solar heat collectors with reflectors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/40Solar thermal energy, e.g. solar towers

Abstract

The present invention relates to a kind of large scale mirror surface face type detection system and its methods, including at least a set of image acquisition device and code pattern chopping board, data processing system composition;Described image collector and code pattern chopping board Relative distribution are in the two sides of object under test, and for the camera lens of image acquisition device with mirror-image arrangement formed by a fixed angle of altitude and face code pattern chopping board measuring targets, object under test will be completely covered in the visual field of image acquisition device;Data processing system is connected by data line with image acquisition device, and after image acquisition device acquires mirror image formed by code pattern chopping board measuring targets, storage is in a data processing system.Rationally, testing efficiency is high, system cost is low, and it is of less demanding that detection system tests environment for the configuration of the present invention is simple, design, the object detection of applicable open air open space, image acquisition device is independent from each other each other, will not be interfered with each other, and the stability of detection system is preferable.

Description

A kind of large scale mirror surface face type detection system and its method
Technical field
The present invention relates to a kind of large scale mirror surface face type detection system and its methods, belong to optical 3-dimensional surface detection technique Field.
Background technique
Usual situation, mirror surface surface type measurement mode are broadly divided into contact (CMM) and contactless two class.Contact three is sat Mark measuring instrument is usually that probe stroke on surface to be measured is utilized to obtain three-dimensional appearance, and measurement accuracy is very high, but it detects speed Slowly (more than usual a few hours), point cloud data is sparse, and may measuring targets surface damage.Non-contact measurement skill What art most represented is optical three-dimensional measurement technology.Common optical measurement measuring technique has interferometry, laser triangulation, structure Light method, photogrammetry etc..Interferometry technology and use coherent light, therefore this method have very high sensitivity and precision. But it is stringent to the requirements such as testee vibration, space floating dust, ambient light intensity, it limits its application;Structured light technique application is most Wide is the Schlieren method, is broadly divided into the fringe projection three-dimensional measurement technology detected for diffusing reflection body surface and for mirror The streak reflex three-dimensional measurement technology of face or class mirror article.The two principle is all to be projected sine streak using projection device Test object surface, striped are distorted after surface topography is modulated, deform, by analyzing collected modulation stripe Obtain object height or gradient information.The Schlieren method measuring speed is fast, high-precision, can measurement of full field, but since striped is by environment light Serious interference is not suitable for open air measurement.Exist simultaneously because tested mirror surface face type deforms excessive or discontinuous situation, causes image There is situations such as mutation, striped is intersected with each other, also all increases difficulty to later data processing.
3-D measuring apparatus based on optical touchless amount technological development all has some limitations, such as single test zone Small, outdoor environmental conditions interference etc..Since its single area of detection is small, it is difficult to realize large sized object Surface testing, is needed attached Part mechanical scanning mechanism increases the complexity of system.Meanwhile in order to obtain the integral face type of testee, the later period is needed Several partial face type result figures are spliced, will cause deviation accumulation in this way, measuring accuracy and detection efficiency are difficult to ensure.
Secondary mirror is the extremely crucial device of secondary reflection type photo-thermal power generation, and major function is to collect heliostat too Sunlight is reflexed to again at heat absorption tower position, and the sunlight of reflection converts the final generation for realizing electric energy by energy.For two For secondary reflection, the optical energy density after heliostat collects is higher, and optical energy loss caused by the type deviation of face is compared to the settled date It is even more serious for mirror, so must assure that the surface precision of secondary mirror to guarantee that solar-thermal generating system collects the effect of sunlight Rate.
For secondary mirror mould group have large scale (6.5m*7.5m), mirror-reflection, outdoor free environments (light intensity variation, Vibration caused by wind, personnel's operation etc.), the detection feature such as have certain measurement efficiency, propose detection system according to the present invention System and detection method.
Summary of the invention
It is an object of the invention to: it is not able to satisfy existing needs for current technology, a kind of large scale mirror surface face is provided Type detection system and its method, to solve the problems, such as above-mentioned background technique.
The technical scheme adopted by the invention is that: a kind of large scale mirror surface face type detection system, including at least a set of image Collector and code pattern chopping board, data processing system composition;Described image collector and code pattern chopping board Relative distribution to The two sides of object are surveyed, the camera lens of image acquisition device is with mirror image cloth formed by a fixed angle of altitude and face code pattern chopping board measuring targets It sets, object under test will be completely covered in the visual field of image acquisition device;Data processing system passes through data line and image acquisition device It is connected, after image acquisition device acquires mirror image formed by code pattern chopping board measuring targets, storage is in a data processing system.
In the present invention: the image acquisition device is with a fixed angle of altitude and is directed toward object under test fixed placement;Coding pattern Plate is with certain inclination angle fixed placement, and coding pattern is towards object under test.
In the present invention: the size of the code pattern chopping board is corresponding with the size of object under test, on code pattern chopping board Coding pattern be to be put together by several cell encoding patterns.
A kind of large scale mirror surface face type detection method, includes the following steps:
(1), measurement coordinate system is established on the horizontal plane in region to be tested, coordinate system meets right-handed system;The light of image acquisition device Subpoint of the geometric center of the heart and object under test and code pattern chopping board in horizontal plane (x/y plane) crosses reference axis x, coordinate Axis z crosses the geometric center of object under test;
(2), the pitch angle for adjusting image acquisition device, makes the virtual face where the mirror image of its optical axis face code pattern chopping board;
(3), four extreme coordinates values for mapping out object under test, are stored in data processing system;
(4), the image of control image acquisition device acquisition object under test and code pattern chopping board, and it is stored in data processing system In;
(5), four endpoint values are surveyed by object under test, according to the ideal model of object under test, generated in the case where measuring coordinate system The ideal face type of object under test;
(6), it according to the ideal face type of object under test, is originated from image acquisition device image planes and carries out light against trace;Establish pixel With the mapping relations of each point on code pattern chopping board;
(7), according to the collected coding pattern of image acquisition device, object under test surface each point normal vector is calculated.
Beneficial effects of the present invention:
1, rationally, testing efficiency is high, system cost is low, and detection system tests environmental requirement not for the configuration of the present invention is simple, design Height, the object detection of applicable open air open space, image capture device (image acquisition device) are independent from each other each other, will not It interferes with each other, the stability of detection system is preferable;
2, for the object under test of different scale, detection system can be flexibly matched with suitable image acquisition device number, coding pattern Board size and cell encoding color lump size.
Detailed description of the invention
Fig. 1 is the schematic diagram of system of the invention;
Fig. 2 is the schematic diagram of a coding unit pattern in the present invention;
Fig. 3 is the schematic diagram of a specific embodiment of the invention.
In figure: 1. horizontal planes;2. image acquisition device;3. code pattern chopping board;4. data processing system;5. determinand Body;6. mirror image.
Specific embodiment
Present invention is further described in detail in the following with reference to the drawings and specific embodiments.
As shown in Figure 1, a kind of large scale mirror surface face type detection system, including a set of image acquisition device 2 and coding pattern Plate 3, data processing system 4 form;Described image collector 2 and 3 Relative distribution of code pattern chopping board in the two sides of object under test 5, The camera lens of image acquisition device 2 is adopted with mirror-image arrangement formed by a fixed angle of altitude and 3 measuring targets 5 of face code pattern chopping board, image Object under test 5 will be completely covered in the visual field of storage 2;Data processing system 4 is connected by data line with image acquisition device 2, It after image acquisition device 2 acquires mirror image 6 formed by 3 measuring targets 5 of code pattern chopping board, is stored in data processing system 4, passes through Special algorithm processing obtains 5 surface each point normal vector of object under test.The image acquisition device 2 is with a fixed angle of altitude and is directed toward to be measured 5 fixed placement of object;Code pattern chopping board 3 is with certain inclination angle fixed placement, and coding pattern is towards object under test 5.Described The size of code pattern chopping board 3 is corresponding with the size of object under test 5.In actual operation, 2 number of image acquisition device be according to Survey the size decision of object 5.If an image acquisition device 2(can be camera) effective viewing field can cover entire determinand Body 5, then an image acquisition device 2 is just able to satisfy test.If it is not, needing to add corresponding image acquisition device 2, until each The overlapped fov of image acquisition device 2 can cover object under test 5.For in principle, in the case where meeting test, image is reduced to the greatest extent The number of collector 2 saves system cost.
As shown in Fig. 2, the coding pattern on code pattern chopping board 3 is put together by several cell encoding patterns, in unit In coding pattern, number 10,20,30,40,50,60,70,80 respectively represents a kind of rectangular color lumps of color, rectangular color lumps size It can be determined according to examined object precision, size.Symbol " ★ " indicates identifier, plays coordinate in code pattern chopping board 3 Positioning action.
As attached drawing 3 shows, it is assumed that there are any point A on 5 surface of object under test, enable its ideal normal vector 51.But in determinand Body 5 is during actual production, transport, since technique or the factors such as artificial cause A point face type to be changed, then phase Cause ideal normal vector 51 to be changed as practical normal vector 52 with answering.Due to the variation of A point face type (or normal vector), result in through The object point that A point is imaged in 2 image planes of image acquisition device becomes practical object point C by ideal object point B.If A point ideal normal vector 51 with Deviation between practical normal vector 52 is θ, then being apparent from BA and AC angle is 2 θ.Due to image acquisition device 2, object under test 5, coding Space length between pattern plate 3 is remote enough, and negligible 5 surface undulation factor of object under test influences practical object point C, then It is believed that deviation BC is offset of the practical object point due to caused by practical normal vector deviation to ideal object point.
The angle of code pattern chopping board 3 and horizontal plane 1 is β, and the optical axis 21 and 1 angle of horizontal plane of image acquisition device 2 are δ, at Picture point light and 2 optical axis included angle of image acquisition device are γ.
It is available by geometrical relationship: in △ BAC,
∠BCA=180-β-(δ-γ)
BC/sin(2θ)=AB/sin(∠BCA)
As shown in Fig. 3, a kind of large scale mirror surface face type detection method, includes the following steps:
(1) measurement coordinate system is established on the horizontal plane 1 of the test zone locating for object under test 5, coordinate system meets right-handed system;Image The subpoint mistake of the optical center and object under test 5 of collector 2 and the geometric center of code pattern chopping board 3 in horizontal plane (x/y plane) Reference axis x, reference axis z cross the geometric center of object under test 5.(2), the pitch angle for adjusting image acquisition device 2, makes its optical axis face Virtual face where the mirror image of code pattern chopping board.
(3), four extreme coordinates values for mapping out object under test 5, are stored in data processing system 4.
(4), control image acquisition device 2 acquires the image of object under test 5 and code pattern chopping board 3, and is stored at data In reason system 4;
(5), four endpoint values are surveyed by object under test 5, according to the ideal model of object under test 5, generated in the case where measuring coordinate system Object under test 5 ideal face type.
(6), it according to the ideal face type of object under test 5, is originated from 2 image planes of image acquisition device and carries out light against trace;It establishes The mapping relations of each point on pixel and code pattern chopping board 3 are 2 ideal image of collector reflects with 3 object point of code pattern chopping board Penetrate relationship.
(7), after the image of code pattern chopping board 3 is by the modulation of 5 face type of test object, each color lump occurs corresponding inclined in image It moves, deformation, the practical as corresponding practical object point and reason of the actual coding pattern plate 3 that 2 obtain is acquired by comparative analysis image Think the spatial position change of object point, i.e. BC value shown in attached drawing 3, it is each to calculate place's object under test 5 further according to above formula Point normal vector is directed toward variation.
Above specific embodiments of the present invention have been described, but the present invention is not limited to above description.For this For the technical staff in field, the equal modification and substitution of any pair of the technical program are all within the scope of the invention.Cause This, made equal transformation and modification, all should be contained within the scope of the invention without departing from the spirit and scope of the invention.

Claims (4)

1. a kind of large scale mirror surface face type detection system, it is characterised in that: including at least a set of image acquisition device (2), Yi Jibian Code pattern plate (3), data processing system (4) composition;Described image collector (2) and code pattern chopping board (3) Relative distribution to The two sides of object (5) are surveyed, the camera lens of image acquisition device (2) is with a fixed angle of altitude and face code pattern chopping board (3) measuring targets (5) Object under test (5) will be completely covered in formed mirror-image arrangement, the visual field of image acquisition device (2);Data processing system (4) passes through number It is connected according to transmission line with image acquisition device (2), it is formed that image acquisition device (2) acquires code pattern chopping board (3) measuring targets (5) After mirror image, it is stored in data processing system (4).
2. a kind of large scale mirror surface face according to claim 1 type detection system, it is characterised in that: the Image Acquisition Device (2) is with a fixed angle of altitude and is directed toward object under test (5) fixed placement;Code pattern chopping board (3) with certain inclination angle fixed placement, and Coding pattern is towards object under test (5).
3. a kind of large scale mirror surface face according to claim 1 type detection system, it is characterised in that: the coding pattern The size of plate (3) is corresponding with the size of object under test (5), and the coding pattern on code pattern chopping board (3) is compiled by several units Code pattern is put together.
4. a kind of large scale mirror surface face type detection method, characterized by the following steps:
(1), measurement coordinate system is established on the horizontal plane (1) in region to be tested, coordinate system meets right-handed system;Image acquisition device (2) subpoint mistake of the geometric center of optical center and object under test (5) and code pattern chopping board (3) in horizontal plane (x/y plane) Reference axis x, reference axis z cross the geometric center of object under test (5);
(2), the pitch angle for adjusting image acquisition device (2) makes virtual where the mirror image of its optical axis face code pattern chopping board (3) Face;
(3), four extreme coordinates values for mapping out object under test (5), are stored in data processing system (4);
(4), the image of control image acquisition device (2) acquisition object under test (5) and code pattern chopping board (3), and it is stored in data In processing system (4);
(5), four endpoint values are surveyed by object under test (5), according to the ideal model of object under test (5), generated in measurement coordinate The ideal face type of object under test (5) under system;
(6), it according to the ideal face type of object under test (5), is originated from image acquisition device (2) image planes and carries out light against trace;It establishes The mapping relations of each point on pixel and code pattern chopping board (3);
(7), according to image acquisition device (2) collected coding pattern, object under test (5) surface each point normal vector is calculated.
CN201910065781.5A 2019-01-24 2019-01-24 A kind of large scale mirror surface face type detection system and its method Pending CN109781031A (en)

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Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63273047A (en) * 1987-04-30 1988-11-10 Hitachi Ltd Surface irregularity detector
JPH0663514A (en) * 1992-08-19 1994-03-08 Kyokuto Kaihatsu Kogyo Co Ltd Selecting device for color of bottle
CN101608906A (en) * 2009-07-21 2009-12-23 西安交通大学 A kind of method for measuring optical three-dimensional contour of space encoding
CN101655358A (en) * 2009-07-01 2010-02-24 四川大学 Improved dynamic characteristic of phase measuring profilometry of cross compound grating by color coding
CN101813460A (en) * 2009-02-24 2010-08-25 康宁股份有限公司 The shape measure of specular reflection surface
CN104111036A (en) * 2013-04-18 2014-10-22 中国科学院沈阳自动化研究所 Mirror object measuring device and method based on binocular vision
CN105180840A (en) * 2015-10-14 2015-12-23 苏州大学 Method and device for measuring mirror shape of large-diameter concave mirror face based on color double-frequency fringe reflection
CN105937887A (en) * 2016-04-21 2016-09-14 复旦大学 Three-dimensional shape measurement method based on ternary three-color cross grid fringes
CN108120398A (en) * 2017-12-27 2018-06-05 大连鉴影光学科技有限公司 A kind of surface testing method and device of solid minute surface curved surface

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63273047A (en) * 1987-04-30 1988-11-10 Hitachi Ltd Surface irregularity detector
JPH0663514A (en) * 1992-08-19 1994-03-08 Kyokuto Kaihatsu Kogyo Co Ltd Selecting device for color of bottle
CN101813460A (en) * 2009-02-24 2010-08-25 康宁股份有限公司 The shape measure of specular reflection surface
CN101655358A (en) * 2009-07-01 2010-02-24 四川大学 Improved dynamic characteristic of phase measuring profilometry of cross compound grating by color coding
CN101608906A (en) * 2009-07-21 2009-12-23 西安交通大学 A kind of method for measuring optical three-dimensional contour of space encoding
CN104111036A (en) * 2013-04-18 2014-10-22 中国科学院沈阳自动化研究所 Mirror object measuring device and method based on binocular vision
CN105180840A (en) * 2015-10-14 2015-12-23 苏州大学 Method and device for measuring mirror shape of large-diameter concave mirror face based on color double-frequency fringe reflection
CN105937887A (en) * 2016-04-21 2016-09-14 复旦大学 Three-dimensional shape measurement method based on ternary three-color cross grid fringes
CN108120398A (en) * 2017-12-27 2018-06-05 大连鉴影光学科技有限公司 A kind of surface testing method and device of solid minute surface curved surface

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Application publication date: 20190521