CN109765411A - Waveform display apparatus and history waveform statistical method - Google Patents
Waveform display apparatus and history waveform statistical method Download PDFInfo
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Abstract
The present invention is suitable for DATA REASONING and processing technology field, provide Waveform display apparatus and history waveform statistical method, it include: first processing units and the second processing unit, first processing units include parameters measurement module, and the second processing unit includes history measurement statistical module and waveform display module.Parameters measurement module, the waveform parameter for measured waveform frame data obtain parameter measurements；The parameter measurements that history measurement statistical module is used to obtain and count from parameters measurement module multiple waveform frame data in history measurement range generate statistics list；Waveform display module is for showing statistics list, and according to checking that instruction transfers and show the waveform of waveform frame data to be viewed corresponding with instruction is checked.Technical solution of the present invention combines two processing units, can accelerate calculation process speed, while conveniently checking history waveform parameter measurement result, be also convenient for quickly finding out abnormal data and checking unusual waveforms.
Description
Technical field
The invention belongs to DATA REASONING and processing technology field more particularly to Waveform display apparatus and history waveform statistics sides
Method.
Background technique
With the increasingly complication of electronic equipment, designs engineering team and need better tool to record, analyze and visually
Change Wave data and measurement statistical data.Most of industry measurement test equipment all provides waveform voltage parameter/range parameter with
The automatic measurement function of time parameter, the measurement function is generally directed to the single frames screen waveform captured in instrument memory, by more
The secondary available measurement statistical data (current value, maximum value, minimum value, sample number, average and standard deviation) of acquisition, but it is general
It can only obtain the final measurement statistical result of all frames of history, cannot independently check the measurement statistical result of every frame waveform in detail,
The waveform of particular measurement statistical data can not be shown in instrument screen.
Summary of the invention
In view of this, the present invention provides Waveform display apparatus and history waveform statistical method, to solve in the prior art
The problem of frame data of history cannot being operated.
The first aspect of the embodiment of the present invention provides at a kind of Waveform display apparatus, including first processing units and second
Unit is managed, the first processing units include parameters measurement module, and described the second processing unit includes history measurement statistical module
And waveform display module,
Wherein, the parameters measurement module is joined for the waveform to the multiple waveform frame data for being located at history measurement range
Number measures, and obtains the parameter measurements of multiple waveform frame data；
The history measurement statistical module is connect with the parameters measurement module, for obtaining historical statistics instruction, and root
It is instructed according to the historical statistics, is obtained from the parameters measurement module and count multiple institutes in the history measurement range
The parameter measurements of waveform frame data are stated, statistics list is generated；
The waveform display module is connect with history measurement statistical module, for showing the history measurement statistics mould
The statistics list that block generates, and detect user and instruction is checked based on the statistics list triggering, finger is checked according to described
Order, which is transferred, checks the corresponding waveform frame data to be viewed of instruction with described, and shows the wave of the waveform frame data to be viewed
Shape.
The second aspect of the embodiment of the present invention provides a kind of history waveform statistical method, is applied to Waveform display apparatus,
The Waveform display apparatus includes first processor and second processor characterized by comprising
Second processor obtains historical statistics instruction；
Second processor is based on historical statistics and the acquisition from the first processor is instructed to be located at preset history measurement model
The parameter measurements of the waveform parameter of multiple waveform frame data in enclosing generate statistics list and show；
Second processor detects user and checks instruction based on the statistics list triggering, checks that instruction is transferred according to described
The corresponding waveform frame data to be viewed of instruction are checked with described, and show the waveform to be viewed and parameter measurements.
Existing beneficial effect is the upper embodiment of the present invention compared with prior art:
In the present invention, it is responsible for waveform parameter by setting first processing units and the second processing unit, first processing units
Measurement, the second processing unit is responsible for the statistics of waveform parameter and the display of waveform, compared to simply using a processing unit,
It can accelerate calculation process speed.Meanwhile history measurement statistical module of the invention can be based on parameters measurement module to history
The measurement results of waveform parameter of waveform frame data counted, and generate statistics list display and come out, it is unified convenient for user
Check the waveform parameter measurement result of the waveform frame data of history.It is based in addition, can also be received in technical solution of the present invention
Instruction is checked in statistics list, and shows the waveform and parameter measurement knot of waveform frame data to be viewed corresponding with instruction is checked
Fruit realizes checking for the frame data of history, is also convenient for user and is quickly found out abnormal data based on statistics list and checked
Unusual waveforms.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the system construction drawing of Waveform display apparatus first embodiment provided in an embodiment of the present invention；
Fig. 2 is the system construction drawing of Waveform display apparatus second embodiment provided in an embodiment of the present invention；
Fig. 3 is the system construction drawing of Waveform display apparatus 3rd embodiment provided in an embodiment of the present invention；
Fig. 4 is the flow diagram of the first embodiment of history waveform statistical method provided in an embodiment of the present invention；
Fig. 5 is the refined flow chart of the S12 of history waveform statistical method provided in an embodiment of the present invention；
Fig. 6 is the refined flow chart of the S122 of history waveform statistical method provided in an embodiment of the present invention；
Fig. 7 is the flow diagram of the second embodiment of history waveform statistical method provided in an embodiment of the present invention；
Fig. 8 is the flow diagram of the 3rd embodiment of history waveform statistical method provided in an embodiment of the present invention；
Fig. 9 is the schematic diagram of terminal device provided in an embodiment of the present invention.
Specific embodiment
In being described below, for illustration and not for limitation, the tool of such as particular system structure, technology etc is proposed
Body details, to understand thoroughly the embodiment of the present invention.However, it will be clear to one skilled in the art that there is no these specific
The present invention also may be implemented in the other embodiments of details.In other situations, it omits to well-known system, device, electricity
The detailed description of road and method, in case unnecessary details interferes description of the invention.
In order to illustrate technical solutions according to the invention, the following is a description of specific embodiments.
Fig. 1 is the system results figure of the first embodiment of Waveform display apparatus 100 of the present invention, comprising: first processing units
110 and the second processing unit 120, first processing units 110 include parameters measurement module 111, and the second processing unit 120 includes going through
History measures statistical module 121 and waveform display module 122.In the present embodiment, first processor uses field programmable device
FPGA carries out the measurement of waveform parameter, and FPGA carries out data manipulation by the way of pipeline and parallel design, to guarantee magnanimity
The processing capability in real time of data, and arithmetic speed is fast, Wave data measures exhaustive.Second processor uses central processing unit
CPU is responsible for record and history waveform parameter measurement result is counted, sorted and analyzed, and show with waveform it is associated, favorably
Unusual waveforms reason is found out in quick.
Wherein, parameters measurement module 111 is used for the wave to the multiple waveform frame data for being located at preset history measurement range
Shape parameter measures, and obtains the parameter measurements of multiple waveform frame data；111 module of parameters measurement module includes measurement
Object module and parallel arrangement of voltage parameter/range parameter measurement module 111, count ginseng at time parameter measurement module 111
Number measurement module 111 etc..After parameters measurement module 111 gets waveform frame data, through voltage parameter measurement module 111, when
Between after parameters measurement module 111 and count parameter measurement module 111 measure each waveform parameter, parameter measurements are stored in survey
Object module is measured, and is that history measurement statistical module 121 provides the data of parameter measurements by measurement result module.Voltage ginseng
Number/range parameter include such as amplitude, peak-to-peak value, maximum value, minimum value, overshoot, virtual value, the time parameter such as rise time/
Fall time, period/frequency, pulse width, duty ratio, time difference, settling time/retention time etc., count parameter such as up/down
Drop is along counting, triggering frequency, statistical sample quantity etc..
History measurement statistical module 121 with parameters measurement module 111 for connecting, for obtaining in historical statistics, and root
It is obtained according to historical statistics instruction from parameters measurement module 111 and counts multiple waveform frame data in history measurement range
Parameter measurements generate statistics list.After history measurement statistical module 121 detects historical statistics instruction, based on preset
History measurement range, from the waveform parameter for obtaining the multiple waveform frame data being located in history measurement range in first processor
Parameter measurements.It should be noted that preset history measurement range is based on same signal sampling channel, including current form
Multiple waveform frame data before frame data and current form frame data, can be the waveform frame number of preset certain amount frame
According to can not also be limited herein with all waveform frame data before current form frame data.
Waveform display module 122 is connect with history measurement statistical module 121, and for showing that history measures statistical module
The 121 statistics lists generated, waveform display module 122 are also used to detect check instruction of the user based on statistics list triggering, and
According to checking that instruction transfers waveform frame data to be viewed corresponding with instruction is checked, and show waveform frame data to be viewed
Waveform and parameter measurements.When user notes abnormalities Wave data according to statistics list, checked based on statistics list triggering
Instruction.Check that instruction includes waveform frame data to be viewed.Waveform display module 122 detect user triggering check instruction
When, according to checking that instruction transfers waveform frame data to be viewed and show corresponding waveform.For example, user passes through statistics list hair
The parameter measurements of existing the 5th frame of history and the parameter measurements of other frames have deviation, then by double-clicking in statistics list
Instruction is checked in a column corresponding to the 5th frame of history, triggering, then waveform display module 122 automatic jumps to waveform display interface simultaneously
Show the waveform of the 5th frame of history.Preferably, the second processing unit 120 is additionally provided with the waveform recording for acquiring initial data
Module 123, waveform recording module 123 as unit of frame and save collected initial data.Every frame waveform frame data are corresponding
It is provided with number information.It is obtained from waveform recording module 123 according to the number information of waveform frame data to be viewed to be viewed
Waveform frame data and show.
In the present embodiment, the survey of waveform parameter is responsible for by setting first processor and second processor, first processor
Amount, second processor are responsible for the statistics of waveform parameter and the display of waveform, compared to a processor is simply used, can be accelerated
Calculation process speed.Meanwhile the parameter measurements that second processor is handled according to first, and generate history waveform frame data
The parameter measurements of each history waveform frame data are uniformly checked in the statistics list of parameter measurements convenient for user, so as to
User quickly finds out unusual waveforms.In addition, second processor can also check single frames according to the idsplay order that user triggers
History waveform frame realizes checking for the frame data of history, is also convenient for user and further analyzes unusual waveforms.
Further, history measurement statistical module 121 includes that instruction acquisition module (not shown) and statistical module (are not schemed
Show), instruction acquisition module includes echo signal acquisition channel and target wave for obtaining historical statistics instruction, historical statistics instruction
Shape parameter；Statistical module is used for based on preset history measurement range and historical statistics instruction in history measurement range
The parameter measurements of multiple waveform frame data are counted to obtain statistical result, and generate statistics list according to statistical result.
The display interface of Waveform display apparatus 100 provides alternative signal sampling channel, by determining target letter
Number acquisition channel determines the data source of target waveform, at the same display interface additionally provide alternative voltage parameter, when
Between the multiple parameters such as parameter, count parameter, to determine the waveform ginseng of parameter measurements that target waveform needs to count and show
Number.User is based on display interface, selects corresponding signal sampling channel when triggering history measurement statistics and executing and needs to count
Waveform parameter.It can be based on the current form triggering historical statistics instruction shown, at this time when user triggers historical statistics
When instruction, directly using the corresponding signal sampling channel of current form and waveform parameter as echo signal acquisition channel and target wave
Shape parameter, the echo signal acquisition channel that the instruction of historical statistics at this time includes is corresponding with current form, and target waveform parameter can be with
And the waveform parameter corresponding with current form that display interface is shown is corresponding.It is selected when can also trigger historical statistics instruction by user
Select corresponding echo signal acquisition channel and target waveform parameter.
In addition, instruction acquisition module is also used to receive ordering instruction, the ordering instruction includes reference waveform parameter, described
The benchmark survey item and sortord of reference waveform parameter, statistical module is based on statistical result, by multiple waveform frame data
Statistical result corresponding with the reference waveform parameter is that sequence benchmark generates system according to sortord with the benchmark survey item
Count list.
It needs to count multiple statistical items of waveform parameter in waveform parameter measurement.The statistics of each waveform parameter
Item includes that average value, maximum value, minimum value etc. are multinomial.Statistics list includes multiple waveform parameters of multiple history waveform frame data
Parameter measurements, and the corresponding measurement result for showing each statistical items of each waveform parameter.In the present embodiment, in order to
It is checked convenient for user, the reference waveform parameter display statistics column for including in the ordering instruction that instruction acquisition module is triggered according to user
Table had counted list both as user and has provided the selection menu of reference waveform parameter, and user selects the reference wave parameter for needing to check
When digital display shows, the measurement of each statistical items corresponding with reference waveform parameter of each history waveform frame data of list display is counted
As a result.Meanwhile being checked for the ease of user, statistical module is based on ordering instruction, and a certain statistical items of each waveform parameter are made
For benchmark statistical items, and according to certain sortord display statistics list on the basis of benchmark survey item.Sortord includes
Descending arrangement and ascending order arrangement.Statistical module shows statistics list, for example preset sequence first, in accordance with preset ordering instruction
The reference waveform parameter for including in instruction is " frequency ", and benchmark survey item is " average value ", and sortord is that descending arranges, then the
The statistics list display that two processors are generated according to statistical result " frequency " parameter of each history waveform frame data it is each
The measurement result of statistical items, and be that sequence benchmark is arranged according to descending with " average value " item.User is based on statistics list triggering row
Sequence instruction, checks to switch between each waveform parameter, can also change sortord.
In addition, searching unusual waveforms for the ease of user, the corresponding maximum of each statistical items and minimum are being counted
It highlights and marks in list.
Fig. 2 is the system construction drawing of 100 second embodiment of Waveform display apparatus of the present invention, referring to fig. 2, the second processing unit
120 further include history waveform recording module 123, and first processing units 110 further include acquisition memory module 113 and data load mould
Block 112,
Wherein, history waveform recording module 123 is for acquiring initial data, and the initial data is stored as unit of frame
Obtain several waveform frame data；
Acquisition memory module 113 is used for when history measurement statistical module 121 gets historical statistics instruction, from history wave
Waveform frame data corresponding with preset history measurement range are obtained in shape logging modle 123 frame by frame；
Data loading module 112 is connect with triggering collection module and parameters measurement module 111, is used for from acquisition memory module
Loaded contact analysis frame data and parameters measurement module 111 is sent in 113.
In this embodiment, initial data is acquired by the history waveform recording module 123 of the second processing unit 120, by first
The acquisition memory module 113 and data module of processing unit 110 are parameters measurement module 111 from history waveform recording module 123
Middle Loaded contact analysis frame data, the i.e. measurement of 110 responsible waveform parameters of first processing units are conducive to accelerate measurement efficiency and fortune
Line efficiency.After history waveform recording module 123 collects initial data, initial data is stored as unit of frame and obtains several waveforms
Frame data.
After history measures the acquisition historical statistics instruction of statistical module 121, triggering collection is issued to first processing units 110 and is referred to
It enables, first processing units 110 receive after triggering collection instruction by acquisition memory module 113 from history waveform recording module 123
In obtain corresponding with preset history measurement range waveform frame data frame by frame, and the waveform of measured waveform frame data is joined one by one
Number, obtains the parameter measurements of multiple waveform frame data.Preferably, parameters measurement module 111 uses pipeline and parallel design
Mode measured waveform frame data waveform parameter, to accelerate the speed of service.
Fig. 3 is the system construction drawing of 100 3rd embodiment of Waveform display apparatus of the present invention, referring to Fig. 3, first processing units
110 further include waveform searching module 114, and waveform searching module 114 includes type search module 1141 and result cache module
1142,
Wherein, history measurement statistical module 121 is used to detect the waveform triggering based on the waveform frame data to be viewed
Search instruction, search instruction includes waveform parameter and searching bar corresponding with the waveform parameter to be searched to be searched
Part；
Type search module 1141 measures statistical module 121 with history and parameters measurement module 111 is connect, and searches for basis
Suo Zhiling obtains the parameter measurements of waveform parameter to be searched from parameters measurement module 111, and surveys based on the parameter
Amount result and corresponding search condition obtain search result；
Result cache module 1142 is connect with type search module 1141, for caching described search result；
History measurement statistical module 121 is connect with result cache module 1142, and is obtained from result cache module 1142
Described search is as a result, generate acquisition waveforms section according to described search result simultaneously, and shown and searched for by waveform display module 122
Waveform section.
The reason of in order to further check unusual waveforms, when the waveform of waveform frame data to be viewed is shown in display interface
When, user triggers search instruction, and search instruction includes waveform parameter to be searched and corresponding with waveform parameter to be searched searches
Rope condition.For example, abnormal position occurs in " voltage parameter " that user requires to look up out unusual waveforms, corresponding search condition is
" voltage peak be greater than preset value ", at this time waveform display module 122 it is corresponding find out voltage peak in unusual waveforms be greater than it is default
The abnormal position point of value, and obtain search result, search result may include abnormal position point in the location information of display waveform
With the information such as specific value.
After history measurement statistical module 121 detects search instruction, triggering search is issued to type search module 1141 and is referred to
It enables, type search module 1141 enables waveform searching function to target waveform progress abnormal position after receiving triggering search instruction
Search and obtain search result, search result is cached in result cache module 1142.History measures statistical module 121 from result
Cache module 1142 obtains search result, and is marked on target waveform according to search result in the corresponding search of search result
Position, while the corresponding waveform of search result can also be shown with individual resize-window.Target waveform is to be currently displayed at display
Waveform on interface.
The present invention also provides a kind of history waveform statistical method, the execution of history waveform statistical method process of the present invention
Main body is terminal device, which includes but is not limited to laptop, computer, server, tablet computer and intelligence
The terminal devices with software-development function such as energy mobile phone, and terminal device includes first processor 601 and second processor
602, first processor 601 and second processor 602 cooperate jointly and complete the measurement of each waveform parameter of history waveform frame data
As a result statistics and display.
Fig. 4 is the flow diagram of the first embodiment of history waveform statistical method of the present invention, and details are as follows:
S11: second processor 602 obtains historical statistics instruction；
The equipment that terminal device 6 can have wave data processing function for electrographic recording instrument or oscillograph etc..In this reality
Shi Zhong, using electrographic recording instrument as terminal device for be illustrated.Electrographic recording instrument includes display, and display is for showing
Waveform corresponding to the acquired data of each signal sampling channel of electrographic recording instrument, while the ginseng of each waveform parameter of display waveform
Number measurement result.Waveform parameter include voltage parameter/range parameter for example amplitude, peak-to-peak value, maximum value, minimum value, overshoot, effectively
Value etc.；Time parameter such as rise time/fall time, period/frequency, pulse width, duty ratio, time difference, settling time/guarantor
Hold time etc.；Count parameter as above/failing edge counts, triggering frequency, 55 kinds of parameter types such as statistical sample quantity.
Electrographic recording instrument display interface provides alternative signal sampling channel, by determining that echo signal acquisition is logical
Road determines the data source of target waveform, while display interface additionally provides alternative voltage parameter, time parameter, meter
The multiple parameters such as number parameter, with the waveform parameter for the parameter measurements for determining target waveform needs statistics and showing.It chooses
After signal sampling channel and the waveform parameter for needing to count, the displaying target waveform on the display interface of electrographic recording instrument, for
User checks waveform.
Since initial data collected in echo signal acquisition channel is that continuously, the display of target waveform becomes in dynamic
Change, or since echo signal acquisition channel original data volume collected is big, needs split screen display available target waveform more to be formed
A frame waveform.When needs check the parameter measurements of multiple historical frames waveforms including present frame waveform to judge exception
When waveform, the target waveform triggering historical statistics instruction that user is shown based on display interface, and historical statistics instruction is by second
Device 602 is managed to obtain.
It should be noted that in the present embodiment, first processor 601 carries out waveform using on-site programmable device FPGA
The measurement of parameter, and FPGA carries out data manipulation by the way of pipeline and parallel design, to guarantee the real-time place of mass data
Reason ability, and arithmetic speed is fast, Wave data measures exhaustive.For example, it is assumed that the storage depth of every frame waveform be 100M (with it is hard
Part memory capacity is related), history waveform parameter measurement function is executed after acquiring N frame data, FPGA is per second can parallel processing 100M
Data (clock used with system is related), regardless of how many waveform parameters (parallel measurement) of measurement, every frame waveform parameter measurement
Theoretically (ignore the data load propagation delay time) and only need 1 second time, measurement history N frame Wave data only needs N seconds.I.e.
Illustrate that measurement total time is unrelated with measurement parameter item quantity, increasing any measurement item not will increase time of measuring, to help
In raising arithmetic speed.It should be noted that the numerical value in above-mentioned example is only illustrated, it is not the specific restriction of numerical value.The
Two processors 602 are responsible for record using central processor CPU and history waveform parameter measurement result are counted, sorted and divided
Analysis, and show with waveform associated, be conducive to quickly find out unusual waveforms reason.
S12: second processor 602 is based on historical statistics instruction and obtains from the first processor 601 positioned at preset
The parameter measurements of the waveform parameter of multiple waveform frame data in history measurement range generate statistics list and show；
After second processor 602 gets historical statistics instruction, it is based on preset history measurement range, from first processor
The parameter measurements of the waveform parameter for the multiple waveform frame data being located in history measurement range are obtained in 601, and are counted more
The parameter measurements of the waveform parameter of a waveform frame data form statistics list, display statistics list.
It should be noted that preset history measurement range is based on same signal sampling channel, including current form frame number
According to and current form frame data before multiple waveform frame data, can be the waveform frame data of preset certain amount frame,
It can not be limited herein with all waveform frame data before current form frame data.
The parameter measurements of the waveform parameter of each waveform frame data of history are completed by first processor 601, and second
Processor 602 is responsible for get parms from first processor 601 measurement result and statistical parameter measurement result, using the first processing
Device 601 and second processor 602 are shared out the work and help one another, and are conducive to improve arithmetic speed, are improved the response speed of instrument, can be realized
The parameter measurements for carrying out history waveform to full storage depth waveform count, compared with prior art since arithmetic speed has
Limit only extracts a small amount of history waveform and is counted, and can really reflect original signal characteristic, provides accurately and reliably measurement knot
Fruit.
S13: second processor 602 detects user and checks instruction based on the statistics list triggering, is checked according to described
Instruction, which is transferred, checks the corresponding waveform frame data to be viewed of instruction with described, and shows the waveform frame data to be viewed
Waveform.
User according to statistics list note abnormalities Wave data when, based on statistics list triggering check instruction.Check instruction
Including waveform frame data to be viewed.Second processor 602 detects when checking instruction of user's triggering, adjusts according to checking to instruct
It takes waveform frame data to be viewed and shows corresponding waveform.For example, user has found the parameter of the 5th frame of history by statistics list
Measurement result and the parameter measurements of other frames have deviation, then by double-clicking corresponding to the 5th frame of history in statistics list
Instruction is checked in one column, triggering, then electrographic recording instrument automatic jumps to waveform display interface and shows the waveform of the 5th frame of history.
In the present embodiment, waveform is responsible for by setting first processor 601 and second processor 602, first processor 601
The measurement of parameter, second processor 602 are responsible for the statistics of waveform parameter and the display of waveform, compared to simply using a processing
Device can accelerate calculation process speed.Meanwhile the parameter measurements that second processor 602 is handled according to first, and generate and go through
The parameter of each history waveform frame data is uniformly checked in the statistics list of the parameter measurements of history waveform frame data convenient for user
Measurement result, so that user quickly finds out unusual waveforms.In addition, second processor 602 can also be according to the aobvious of user's triggering
Show that the history waveform frame of single frames is checked in instruction, realize checking for the frame data of history, be also convenient for user further analyze it is different
Ordinary wave shape.
Fig. 5 is the refined flow chart of S12 in the first embodiment of history waveform statistical method of the present invention, and S12 includes S121
And S122, details are as follows:
S121: second processor 602 determines derived from the echo signal acquisition channel and measures model in preset history
Interior multiple waveform frame data are enclosed, the parameter measurements of the target waveform parameter of multiple waveform frame data are counted,
And obtain statistical result；
S122: second processor 602 generates statistics list and shows according to the statistical result.
It is understood that historical statistics instruction includes echo signal acquisition channel and target waveform parameter.Second processing
Device 602, which determines, is derived from echo signal acquisition channel and multiple waveform frame data in preset history measurement range, and from
The ginseng of the target waveform parameter of the multiple history waveform frame data passed through derived from echo signal acquisition is obtained in first processor 601
Number measurement result.For example, the voltage ginseng of the history waveform frame data of the first signal sampling channel of statistics is pointed out in historical statistics
Several parameter measurements, then second processor 602 obtains the wave of the first signal sampling channel from first processor 601
The parameter measurements of the voltage parameter of shape frame data simultaneously count parameter measurements to obtain statistical result, and according to system
Meter result generates statistics list and shows.
It can be based on the current form triggering historical statistics instruction shown, at this time when user triggers historical statistics instruction
When, directly join using the corresponding signal sampling channel of current form and waveform parameter as echo signal acquisition channel and target waveform
Number, historical statistics at this time instruction include echo signal acquisition channel it is corresponding with current form, target waveform parameter can with show
Show that the waveform parameter corresponding with current form of interface display is corresponding.Selection pair when can also trigger historical statistics instruction by user
The echo signal acquisition channel and target waveform parameter answered.
Fig. 6 is the refined flow chart of S122 in the first embodiment of history waveform statistical method of the present invention, and S122 includes
S1221 and S1222, details are as follows:
S1221: second processor 602 obtains ordering instruction, and the ordering instruction includes reference waveform parameter, the benchmark
The benchmark survey item and sortord of waveform parameter；
In the present embodiment, multiple statistical items of each waveform parameter are counted.Statistical items include average value, maximum
Value, minimum value etc..Statistics list includes the parameter measurements of multiple waveform parameters of multiple history waveform frame data, and each
The corresponding measurement result for showing each statistical items of waveform parameter.In the present embodiment, it is checked for the ease of user, according to user
The reference waveform parameter display statistics list for including in the ordering instruction of triggering, had counted list both as user and has provided reference waveform
The selection menu of parameter, user select the reference waveform parameter for needing to check, count each history waveform frame data of list display
Each statistical items corresponding with reference waveform parameter measurement result.Meanwhile being checked for the ease of user, user can also incite somebody to action
The a certain statistical items of each waveform parameter are as benchmark survey item, and according to certain sortord on the basis of benchmark survey item
Display statistics list.Sortord is divided into descending arrangement and ascending order arrangement.
S1222: second processor 602 is based on the statistical result, by multiple waveform frame data and the reference waveform
The corresponding statistical result of parameter is sequence benchmark according to sortord generation statistics list with the benchmark survey item and shows
Show.
It is understood that second processor 602 shows statistics list first, in accordance with preset ordering instruction, for example preset
Ordering instruction in include reference waveform parameter be " frequency ", benchmark survey item be " average value ", sortord be descending arrange
It arranges, then shows the " frequency of each history waveform frame data in the statistics list that second processor 602 is generated according to statistical result
The measurement result of each statistical items of rate " parameter, and be that sequence benchmark is arranged according to descending with " average value " item.User is based on system
It counts list and triggers ordering instruction, checked to switch between each waveform parameter, sortord can also be changed.
In addition, searching unusual waveforms for the ease of user, the corresponding maximum of each statistical items and minimum are being counted
It highlights and marks in list.
Fig. 7 is the system flow chart in the second embodiment of history waveform statistical method of the present invention, including S21~S26,
Middle S22, S25~S26 are identical with S11, S12~S13, and this will not be repeated here, and S21 and S23, S24 are newly-increased step, and details are as follows:
S21: second processor 602 acquires initial data, and stores the initial data as unit of frame and obtain several waves
Shape frame data；
S23: second processor 602 instructs to first processor 601 according to the historical statistics and sends triggering collection instruction；
S24: first processor 601 receives triggering collection instruction, and according to triggering collection instruction from described the
Waveform frame data corresponding with preset history measurement range are obtained in two processors 602 frame by frame, and measure the waveform one by one
The waveform parameter of frame data obtains the parameter measurements of multiple waveform frame data.
In this embodiment, initial data is acquired by second processor 602,601 responsible waveform parameters of first processor
Measurement is conducive to accelerate measurement efficiency and operational efficiency.After second processor 602 collects initial data, deposited as unit of frame
Storage initial data obtains several waveform frame data.
After second processor 602 obtains historical statistics instruction, triggering collection is issued to first processor 601 and is instructed, first
Processor 601 obtains and preset history measurement range pair from second processor 602 frame by frame after receiving triggering collection instruction
The waveform frame data answered, and the waveform parameter of measured waveform frame data one by one, obtain the parameter measurement knot of multiple waveform frame data
Fruit.Preferably, the waveform parameter of the measured waveform frame data by the way of pipeline and parallel design of first processor 601, to add
The fast speed of service.
Fig. 8 is the system flow chart in the 3rd embodiment of history waveform statistical method of the present invention, including S31~S36,
Middle S31~S33 and S11~S13 is identical, and this will not be repeated here, the difference is that S34 and~S36, details are as follows:
S34: second processor 602 detects the search instruction of the waveform based on the waveform frame data to be viewed and to institute
It states first processor 601 and sends triggering search instruction, described search instruction is including waveform parameter to be searched and with described wait search
The corresponding search condition of the waveform parameter of rope；
S35: first processor 601 receives the triggering search instruction, and according to the triggering search instruction based on described
Search condition to the waveform frame data to be viewed parameter measurements corresponding with the waveform parameter of band search into
Row search obtains search result；
S36: second processor 602 obtains described search as a result, and on the waveform of the waveform frame data to be viewed
Mark and the corresponding searching position of described search result and/or waveform corresponding with described search result.
In the present embodiment, in order to further check unusual waveforms the reason of, when the waveform of waveform frame data to be viewed
When being shown in display interface, user triggers search instruction, search instruction include waveform parameter to be searched and with wave to be searched
The corresponding search condition of shape parameter.For example, there is abnormal position in " voltage parameter " that user requires to look up out unusual waveforms, it is right
The search condition answered can be " voltage peak is greater than preset value ", and electrographic recording instrument correspondence finds out voltage in unusual waveforms at this time
Peak value is greater than the abnormal position point of preset value, and obtains search result, and search result may include abnormal position point in display wave
The information such as the location information of shape and specific value.
In the present embodiment, after second processor 602 detects the search instruction that user triggers, to first processor 601
Triggering search instruction is issued, first processor 601 enables waveform searching module progress exception bits after receiving triggering search instruction
The search set obtains search result, and second processor 602 marks on display waveform in search result after obtaining search result
Corresponding searching position and/or with corresponding waveform is shown according to search result in the display interface.
It should be understood that the size of the serial number of each step is not meant that the order of the execution order in above-described embodiment, each process
Execution sequence should be determined by its function and internal logic, the implementation process without coping with the embodiment of the present invention constitutes any limit
It is fixed.
Fig. 9 is the schematic diagram for the terminal device that one embodiment of the invention provides.As shown in figure 9, the terminal of the embodiment is set
Standby 6 include: processor 60 (including first processor 601, second processor 602), memory 61 and are stored in the storage
In device 61 and the computer program 62 that can be run on the processor 60, such as history waveform statistics program.Wherein, memory
61 may include first memory and second memory, and first memory is connect with first processor 601, second memory and
The connection of two processors 602, and computer program 62 is stored on first memory and second memory.Herein, it is set with terminal
For including being illustrated for a memory.The processor 60 realizes above-mentioned each go through when executing the computer program 62
Step in history waveform statistical method embodiment, such as step S11 to S13 shown in Fig. 4, the processor 60 execute the meter
Realize the function of each module/unit in above-mentioned each Installation practice when calculation machine program 62, for example, module 111 shown in Fig. 1,121 to
122 function.
Illustratively, the computer program 62 can be divided into one or more module/units, it is one or
Multiple module/units are stored in the memory 61, and are executed by the processor 60, to complete the present invention.Described one
A or multiple module/units can be the series of computation machine program instruction section that can complete specific function, which is used for
Implementation procedure of the computer program 62 in the terminal device 6 is described.For example, the computer program 62 can be divided
It is cut into parameters measurement module, history measurement statistical module, waveform display module (module in virtual bench), each specific function of module
It can be as follows:
Parameters measurement module is surveyed for the waveform parameter to the multiple waveform frame data for being located at history measurement range
Amount, and obtain the parameter measurements of multiple waveform frame data；
History measurement statistical module is connect with the parameters measurement module, for obtaining historical statistics instruction, and according to institute
Historical statistics instruction is stated, is obtained from the parameters measurement module and counts multiple waves in the history measurement range
The parameter measurements of shape frame data generate statistics list；
Waveform display module is connect with history measurement statistical module, for showing that the history measurement statistical module is raw
At the statistics list, and detect user based on it is described statistics list triggering check instruction, according to it is described check instruction tune
It takes and checks the corresponding waveform frame data to be viewed of instruction with described, and show the waveform of the waveform frame data to be viewed.
The terminal device 6 can be the calculating such as desktop PC, notebook, palm PC and cloud server and set
It is standby.The terminal device may include, but be not limited only to, and processor 60 (including first processor 601, second processor 602) is deposited
Reservoir 61.It will be understood by those skilled in the art that Fig. 9 is only the example of terminal device 6, do not constitute to terminal device 6
It limits, may include perhaps combining certain components or different components, such as described than illustrating more or fewer components
Terminal device 6 can also include input-output equipment, network access equipment, bus etc..
Alleged processor 60 can be central processing unit (Central Processing Unit, CPU), can also be
Other general processors, digital signal processor (Digital Signal Processor, DSP), specific integrated circuit
(Application Specific Integrated Circuit, ASIC), ready-made programmable gate array (Field-
Programmable Gate Array, FPGA) either other programmable logic device, discrete gate or transistor logic,
Discrete hardware components etc..General processor can be microprocessor or the processor is also possible to any conventional processor
Deng.
The memory 61 can be the internal storage unit of the terminal device 6, such as the hard disk or interior of terminal device 6
It deposits.The memory 61 is also possible to the External memory equipment of the terminal device 6, such as be equipped on the terminal device 6
Plug-in type hard disk, intelligent memory card (Smart Media Card, SMC), secure digital (Secure Digital, SD) card dodge
Deposit card (Flash Card) etc..Further, the memory 61 can also both include the storage inside list of the terminal device 6
Member also includes External memory equipment.The memory 61 is for storing needed for the computer program and institute's terminal device 6
Other programs and data.The memory 61 can be also used for temporarily storing the data that has exported or will export.
It is apparent to those skilled in the art that for convenience of description and succinctly, only with above-mentioned each function
Can unit, module division progress for example, in practical application, can according to need and by above-mentioned function distribution by different
Functional unit, module are completed, i.e., the internal structure of described device is divided into different functional unit or module, more than completing
The all or part of function of description.Each functional unit in embodiment, module can integrate in one processing unit, can also
To be that each unit physically exists alone, can also be integrated in one unit with two or more units, it is above-mentioned integrated
Unit both can take the form of hardware realization, can also realize in the form of software functional units.In addition, each function list
Member, the specific name of module are also only for convenience of distinguishing each other, the protection scope being not intended to limit this application.Above system
The specific work process of middle unit, module, can refer to corresponding processes in the foregoing method embodiment, and details are not described herein.
In the above-described embodiments, it all emphasizes particularly on different fields to the description of each embodiment, is not described in detail or remembers in some embodiment
The part of load may refer to the associated description of other embodiments.
Those of ordinary skill in the art may be aware that list described in conjunction with the examples disclosed in the embodiments of the present disclosure
Member and algorithm steps can be realized with the combination of electronic hardware or computer software and electronic hardware.These functions are actually
It is implemented in hardware or software, the specific application and design constraint depending on technical solution.Professional technician
Each specific application can be used different methods to achieve the described function, but this realization is it is not considered that exceed
The scope of the present invention.
In embodiment provided by the present invention, it should be understood that disclosed device/terminal device and method, it can be with
It realizes by another way.For example, device described above/terminal device embodiment is only schematical, for example, institute
The division of module or unit is stated, only a kind of logical function partition, there may be another division manner in actual implementation, such as
Multiple units or components can be combined or can be integrated into another system, or some features can be ignored or not executed.Separately
A bit, shown or discussed mutual coupling or direct-coupling or communication connection can be through some interfaces, device
Or the INDIRECT COUPLING or communication connection of unit, it can be electrical property, mechanical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
In network unit.It can select some or all of unit therein according to the actual needs to realize the mesh of this embodiment scheme
's.
It, can also be in addition, the functional units in various embodiments of the present invention may be integrated into one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.Above-mentioned integrated list
Member both can take the form of hardware realization, can also realize in the form of software functional units.
If the integrated module/unit be realized in the form of SFU software functional unit and as independent product sale or
In use, can store in a computer readable storage medium.Based on this understanding, the present invention realizes above-mentioned implementation
All or part of the process in example method, can also instruct relevant hardware to complete, the meter by computer program
Calculation machine program can be stored in a readable storage medium storing program for executing, and the computer program is when being executed by processor, it can be achieved that above-mentioned each
The step of embodiment of the method.Wherein, the computer program includes computer program code, and the computer program code can be with
For source code form, object identification code form, executable file or certain intermediate forms etc..The computer-readable medium can wrap
It includes: any entity or device, recording medium, USB flash disk, mobile hard disk, magnetic disk, light of the computer program code can be carried
Disk, computer storage, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random
Access Memory), electric carrier signal, telecommunication signal and software distribution medium etc..It should be noted that the computer
The content that readable medium includes can carry out increase and decrease appropriate according to the requirement made laws in jurisdiction with patent practice, such as
It does not include electric carrier signal and telecommunication signal according to legislation and patent practice, computer-readable medium in certain jurisdictions.
Embodiment described above is merely illustrative of the technical solution of the present invention, rather than its limitations；Although referring to aforementioned reality
Applying example, invention is explained in detail, those skilled in the art should understand that: it still can be to aforementioned each
Technical solution documented by embodiment is modified or equivalent replacement of some of the technical features；And these are modified
Or replacement, the spirit and scope for technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution should all
It is included within protection scope of the present invention.
Claims (10)
1. a kind of Waveform display apparatus, which is characterized in that including first processing units and the second processing unit, first processing
Unit includes parameters measurement module, and described the second processing unit includes that history measures statistical module and waveform display module,
Wherein, the parameters measurement module, for be located at history measurement range multiple waveform frame data waveform parameter into
Row measurement, and obtain the parameter measurements of multiple waveform frame data；
The history measurement statistical module is connect with the parameters measurement module, for obtaining historical statistics instruction, and according to institute
Historical statistics instruction is stated, is obtained from the parameters measurement module and counts multiple waves in the history measurement range
The parameter measurements of shape frame data generate statistics list；
The waveform display module is connect with history measurement statistical module, for showing that the history measurement statistical module is raw
At the statistics list, and detect user based on it is described statistics list triggering check instruction, according to it is described check instruction tune
It takes and checks the corresponding waveform frame data to be viewed of instruction with described, and show the waveform of the waveform frame data to be viewed.
2. Waveform display apparatus as described in claim 1, which is characterized in that the history measurement statistical module includes that instruction obtains
Modulus block and statistical module,
Wherein, described instruction obtains module and adopts for obtaining historical statistics instruction, the historical statistics instruction comprising echo signal
Collect channel and target waveform parameter；
The statistical module is used to instruct based on preset history measurement range and the historical statistics, surveys to the history is located at
The parameter measurements of multiple waveform frame data in amount range are counted to obtain statistical result, and according to the statistical result
Generate statistics list.
3. Waveform display apparatus as claimed in claim 2, which is characterized in that
Described instruction obtains module and is also used to receive ordering instruction, and the ordering instruction includes reference waveform parameter, the benchmark
The benchmark survey item and sortord of waveform parameter；
The statistical module, be also used to based on the statistical result, by multiple waveform frame data and the reference waveform parameter
Corresponding statistical result is that sequence benchmark generates statistics list according to the sortord with the benchmark survey item.
4. Waveform display apparatus as claimed any one in claims 1 to 3, which is characterized in that described the second processing unit is also
Including history waveform recording module, the first processing units further include acquiring memory module and data loading module,
Wherein, the history waveform recording module is for acquiring initial data, and stores the initial data as unit of frame and obtain
To several waveform frame data；
The acquisition memory module, for being gone through from described when history measurement statistical module gets historical statistics instruction
Waveform frame data corresponding with preset history measurement range are obtained in history waveform recording module frame by frame；
The data loading module is connect with the acquisition memory module and the parameters measurement module, for depositing from the acquisition
The waveform frame Data Concurrent, which is loaded, in storage module gives the parameters measurement module.
5. Waveform display apparatus as claimed in claim 4, which is characterized in that the first processing units further include waveform searching
Module, the waveform searching module include type search module and result cache module,
Wherein, the history measurement statistical module is also used to detect the triggering of the waveform based on the waveform frame data to be viewed
Search instruction, described search instruction include waveform parameter and searching bar corresponding with the waveform parameter to be searched to be searched
Part；
The type search module measures statistical module with the history and parameters measurement module is connect, for according to described search
Instruction obtains the parameter measurements of the waveform parameter to be searched from the parameters measurement module, and based on the parameter
Measurement result and described search condition obtain search result；
The result cache module is connect with the type search module, for caching described search result；
The history measurement statistical module is connect with the result cache module, for obtaining institute from the result cache module
Search result is stated, and for generating acquisition waveforms section according to described search result；
The waveform display module is for showing described search waveform section.
6. a kind of history waveform statistical method is applied to terminal device, the terminal device includes at first processor and second
Manage device, which is characterized in that the history waveform statistical method includes:
Second processor obtains historical statistics instruction；
Second processor is based on historical statistics and instructs from acquisition in the first processor in preset history measurement range
Multiple waveform frame data waveform parameter parameter measurements, generate statistics list simultaneously show；
Second processor detects user and checks instruction based on the statistics list triggering, checks that instruction is transferred and institute according to described
It states and checks the corresponding waveform frame data to be viewed of instruction, and show the waveform of the waveform frame data to be viewed.
7. history waveform statistical method as claimed in claim 6, which is characterized in that the historical statistics instruction includes that target is believed
Number acquisition channel and target waveform parameter, the second processor are based on historical statistics instruction and obtain from the first processor
The parameter measurements of the waveform parameter of multiple waveform frame data in preset history measurement range generate statistics list
And it shows, comprising:
Second processor is determined derived from the echo signal acquisition channel and multiple waves in preset history measurement range
Shape frame data, count the parameter measurements of the target waveform parameter of multiple waveform frame data, and obtain statistics knot
Fruit；
Second processor generates statistics list and shows according to the statistical result.
8. history waveform statistical method as claimed in claim 7, which is characterized in that the second processor is according to the statistics
As a result, generating statistics list and showing, comprising:
Second processor obtains ordering instruction, and the ordering instruction includes reference waveform parameter, benchmark survey item and the row
Sequential mode；
Second processor is based on the statistical result, by the statistics corresponding with the reference waveform parameter of multiple waveform frame data
As a result it is sequence benchmark according to sortord generation statistics list with the benchmark survey item and shows.
9. history waveform statistical method as claimed in claim 8, which is characterized in that the second processor obtains historical statistics
Before instruction, further includes:
Second processor acquires initial data, and stores the initial data as unit of frame and obtain several waveform frame data；
The second processor obtains after historical statistics instruction, further includes:
Second processor instructs to first processor according to the historical statistics and sends triggering collection instruction；
First processor receives triggering collection instruction, and according to triggering collection instruction from the second processor by
Frame obtains waveform frame data corresponding with preset history measurement range, and measures the waveform ginseng of the waveform frame data one by one
Number, obtains the parameter measurements of multiple waveform frame data.
10. the history waveform statistical method as described in any one of claim 6 to 9, which is characterized in that the second processor
Detection user checks instruction based on the statistics list triggering, checks that instruction is transferred according to described and checks that instruction is corresponding with described
Waveform frame data, and after showing the corresponding waveform of the waveform frame data and parameter measurements, further includes:
Second processor detects the search instruction of the waveform based on the waveform frame data to be viewed and handles to described first
Device sends triggering search instruction, described search instruction include waveform parameter to be searched and with the waveform parameter pair to be searched
The search condition answered；
First processor receives the triggering search instruction, and is based on described search condition to institute according to the triggering search instruction
The parameter measurements corresponding with the waveform parameter of band search for stating waveform frame data to be viewed scan for being searched
Hitch fruit；
Second processor obtain described search as a result, and marked on the waveform of the waveform frame data to be viewed with it is described
The corresponding searching position of search result and/or waveform corresponding with described search result.
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