CN109743221B - Test method suitable for communication equipment - Google Patents
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- CN109743221B CN109743221B CN201811586687.6A CN201811586687A CN109743221B CN 109743221 B CN109743221 B CN 109743221B CN 201811586687 A CN201811586687 A CN 201811586687A CN 109743221 B CN109743221 B CN 109743221B
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Abstract
The invention discloses a testing method suitable for communication equipment, which is used for measuring different parameters of a plurality of tested equipment and storing respective equipment instructions of the plurality of tested equipment into a function library; storing instrument instructions of a plurality of test instruments for measuring different equipment parameters into a database in a classified manner; the control unit calls the function library instruction to realize the test of different parameters of a plurality of tested devices. The invention has the advantages of modular design, simple and convenient operation, strong reusability and greatly improved testing efficiency.
Description
Technical Field
The invention relates to a test method suitable for communication equipment.
Background
The test of the prior communication equipment is particularly troublesome, N times of keys are needed to set one parameter of the tested equipment, then a test instrument is set again, a test index is read and recorded, then N times of keys are used to set the next parameter of the tested equipment, then the test instrument is set again, the test index is read and recorded, the test of one equipment needs to be repeated for more than one time, the requirement on a tester is that the test instrument can be used and the equipment can be skillfully operated, the test wastes manpower and time, automatic test platforms appear on the market, a computer is used for controlling the equipment control instrument aiming at certain equipment to finish one test, the platform needs to be used for setting up a test environment by a computer every time, and the equipment and the instrument are connected, so that the test is relatively troublesome.
Disclosure of Invention
In view of the above-mentioned shortcomings, the present invention provides a testing method for measuring different parameters of a plurality of devices under test.
The technical problem to be solved by the invention is realized by the following technical scheme:
a testing method for a communication device for measuring different parameters of a plurality of devices under test, comprising the steps of:
(1) storing respective device instructions of a plurality of tested devices into a function library and recording the device instructions as a function library M; storing instrument instructions of a plurality of test instruments for measuring different equipment parameters into a database in a classified manner and recording the instrument instructions into a function library N;
(2) when measuring a certain tested device, using the tested device as the current tested device;
(3) the control unit calls a function library M instruction to read the current tested equipment, sets the current index value of the current tested equipment, reads the current index value displayed by the tested equipment and ensures that the read current index value is consistent with the set current index value;
(4) the control unit determines a test instrument corresponding to the current tested parameter according to the corresponding relation between the current index value and the current tested parameter in the preset method library;
(5) the control unit calls a function library N instruction to read the test instrument, initializes the test instrument, sets parameters of the test instrument, reads back displayed parameter values of the test instrument and ensures that the read back parameter values are consistent with the set parameter values;
(6) the control unit controls the test instrument to test the current tested equipment, and then reads the tested parameters of the test instrument and uploads the tested parameters to the storage module of the control unit;
(7) judging whether the test is finished or not, and if so, finishing the test; otherwise, judging whether to continue testing the current tested parameter of the current tested device, if so, turning to the step (8), and if the next tested parameter of the current tested device needs to be tested, turning to the step (9); if the next tested device needs to be tested, the step (10) is carried out;
(8) the control unit sets the next index value corresponding to the current measured parameter of the current measured equipment, and executes the steps (3) to (7) after taking the next index value as the current index value;
(9) the control unit sets an index value corresponding to the next measured parameter of the current measured equipment, takes the next measured parameter as the current measured parameter, and executes the steps (3) to (7) after taking the index value corresponding to the next measured parameter as the current index value;
(10) and (4) taking the next tested device as the current tested device, and turning to the step (3).
The testing instrument comprises a power tester, a signal source tester, a frequency spectrum tester, a network analyzer and an error code tester.
The invention has the following advantages:
1. the method can test different parameters of various devices, gives a test connection block diagram and specific operation steps, is simple and convenient to operate and strong in reusability, and greatly improves the test efficiency;
2. the requirements on the testing level of testers and the familiarity of the testers to equipment are low, the testers can test even if the testers do not contact the equipment, and the testing method adopts a universal idea and is flexible and convenient to use;
3. the controller carries out modular design on some common test indexes, can carry out input setting and then carries out prompt operation test, the test process is simple, the test method is simple and easy, and other tested equipment and test methods can be recorded for the second time.
Drawings
FIG. 1 is a block diagram of a test method of the present invention;
FIG. 2 is a flow chart of the control unit design of the present invention;
fig. 3 is a diagram of the process of using the present invention.
Detailed Description
The invention will be further explained below with reference to fig. 1-3.
As shown in fig. 1, the testing method applicable to the communication device of the present invention includes a device under test set, a testing instrument set, and a control unit, where the device under test set includes a device a, a device B, a device C, a device D, and other devices under test; the test instrument set consists of various instruments such as a power meter, a signal source, a frequency spectrograph, a network analyzer and an error code detector; the control unit comprises a circuit board assembly, an interface module, a storage module, a liquid crystal display, a keyboard, a power interface, a rechargeable module and a control program.
According to the connection of FIG. 1, selecting a tested device; the control unit prompts a user to connect with the test instrument according to a given block diagram, and the test instrument is connected with the control unit through the interface module.
A testing method for a communication device for measuring different parameters of a plurality of devices under test, comprising the steps of:
(1) storing respective device instructions of a plurality of tested devices into a function library and recording the device instructions as a function library M; storing instrument instructions of a plurality of test instruments for measuring different equipment parameters into a database in a classified manner and recording the instrument instructions into a function library N; the testing instrument comprises a power tester, a signal source tester, a frequency spectrum tester, a network analyzer and an error code tester.
(2) When measuring a certain tested device, using the tested device as the current tested device;
(3) the control unit calls a function library M instruction to read the current tested equipment, sets the current index value of the current tested equipment, reads the current index value displayed by the tested equipment and ensures that the read current index value is consistent with the set current index value;
(4) the control unit determines a test instrument corresponding to the current tested parameter according to the corresponding relation between the current index value and the current tested parameter in the preset method library;
(5) the control unit calls a function library N instruction to read the test instrument, initializes the test instrument, sets parameters of the test instrument, reads back displayed parameter values of the test instrument and ensures that the read back parameter values are consistent with the set parameter values;
(6) the control unit controls the test instrument to test the current tested equipment, and then reads the tested parameters of the test instrument and uploads the tested parameters to the storage module of the control unit;
(7) judging whether the test is finished or not, and if so, finishing the test; otherwise, judging whether to continue testing the current tested parameter of the current tested device, if so, turning to the step (8), and if the next tested parameter of the current tested device needs to be tested, turning to the step (9); if the next tested device needs to be tested, the step (10) is carried out;
(8) the control unit sets the next index value corresponding to the current measured parameter of the current measured equipment, and executes the steps (3) to (7) after taking the next index value as the current index value;
(9) the control unit sets an index value corresponding to the next measured parameter of the current measured equipment, takes the next measured parameter as the current measured parameter, and executes the steps (3) to (7) after taking the index value corresponding to the next measured parameter as the current index value;
(10) and (4) taking the next tested device as the current tested device, and turning to the step (3).
The following description is given with reference to specific examples:
FIG. 2 is a flow chart of the control unit, first the control unit records all the tested devices and the protocols used by the testing instruments into the database, when a tested device is selected, the control unit calls the functions in the database to intercommunicate the tested devices, sets the current index value of the tested devices, reads the displayed current index value of the tested devices, ensures that the read current index value is consistent with the set current index value, then the control unit calls the testing method used by the tested devices, in the testing method, according to the instruments used for specific testing, calls the instrument instructions in the database, initializes the testing instruments, sets the parameters of the testing instruments, reads the displayed parameter values of the testing instruments, ensures that the parameter values are consistent with the set parameter values, then reads the tested parameters of the testing instruments and uploads the tested parameters to the storage module of the control unit, the test of the first test item index 1 of the equipment 1 is completed, then the control unit sets the cycle to start the setting and the test of the index 2 of the equipment 1, and also sets the next parameter of the test instrument, reads the displayed parameter value of the test instrument, then reads the tested parameter of the test instrument and uploads the tested parameter to the storage module of the control unit until the control unit completes all the test indexes of the first test item of the equipment 1, the start of the next test item of the equipment 1 is prompted, the design process of the control unit is the same as the test process of the first test item, only the used instruments are different, and the control unit calls the instrument corresponding to the test item to perform the test.
Fig. 3 is a usage process diagram of the present invention, in which a tested device is selected first, then the control unit calls the test block diagram in the storage module to provide a connection block diagram of the tested device, the tested device and the test instrument are connected according to the connection block diagram, the test indexes of the tested device 1 are tested according to the specific steps in fig. 2 and stored, and another tested device can be selected after the test is completed.
The method specifically comprises the following steps:
1. designing a database of tested equipment and a tested instrument, storing instructions of the tested equipment into a function library to be recorded as a function library M, storing instructions of instruments of types such as a power meter type, an error code meter type, a frequency spectrograph type, a network analyzer type and a signal source type into the database to be recorded as a function library N in a classified manner, wherein the power meter is classified as a subfunction library a, the error code meter is classified as a subfunction library b, the frequency spectrograph is classified as a subfunction library c, the network analyzer is classified as a subfunction library d and other multiple subfunction libraries, because the instructions of different instruments of different manufacturers have different types, the function library classifies the different types of instruments of different manufacturers, each sub-function library comprises the instrument of the type of each manufacturer, classifies all the instructions, and compares the programs when calling one instruction, if the read back value is correct to the set value, stopping comparison and taking charge of continuing comparison until the read back value is completely correct;
2. the testing methods of the equipment A, the equipment B, the equipment C, the equipment D and the like are designed in a classified manner, for example, the testing power of the equipment A is marked as class Fa, the testing error code of the equipment A is marked as class Fb, the testing error code of the equipment B is marked as class Fc, the testing stray of the equipment B is marked as class Fd, the testing power of the equipment C is marked as class Fe, the testing harmonic class Ff of the equipment C, the testing gain of the equipment D is marked as class Fh, the testing threshold of the equipment D is marked as class Fg and the;
3. storing test method block diagrams of equipment A, equipment B, equipment C, equipment D and the like to a storage module in a picture form, wherein the test block diagram corresponding to the equipment A is p1, the test block diagram corresponding to the equipment B is p2, the test block diagram corresponding to the equipment C is p3, and the test block diagram corresponding to the equipment D is p4 and the like;
4. selecting the type of the tested equipment as equipment A through a key instruction, calling a p1 picture by a program to display the picture to a user through a display screen, and connecting the tested equipment and the tested instrument by the user according to a block diagram;
5. the equipment set is connected with the program through an interface module, a circuit board assembly and the like, the program calls the database M to read the name of the equipment A, the name of the equipment A is consistent with that of the equipment to be tested, and the equipment A starts to be set and tested, and the method specifically comprises the following steps: a) setting a first index of a first measured parameter of the equipment A, and reading back a corresponding parameter value of the equipment A to ensure that the read value is consistent with a set value; b) calling a testing method Fa of the equipment A, wherein a testing instrument used by the method Fa is a power meter, a program calls a power meter subfunction library a, the power meter is initialized, corresponding parameters of the power meter are set, the set parameters of the read power meter are judged to be consistent with the set parameters, then the measured power is read, and the read value is uploaded to a storage module; c) setting a second tested index of the equipment A, repeating the processes a) and b) until the Fa index test is finished, and prompting by the program through a prompt tone and a prompt message to start testing the testing method Fb of the equipment A; d) setting a first test index of a second measured parameter of the equipment A, and reading back a corresponding parameter value of the equipment to ensure that the read value is consistent with the set value; e) calling a testing method Fb of the equipment A, wherein the testing instruments used by the method Fb are an error code meter, a power meter and the like, and a program calls an error code meter subfunction library b and a power meter subfunction library a to initialize the error code meter and the power meter and set corresponding parameters thereof, and the setting parameters are retrieved, and finally the error code rate is read and reported to a storage module; f) setting a second test index of a second measured parameter of the equipment A, and repeating the processes d) and e) until all the test indexes of the second measured parameter of the equipment A are finished; g) setting a third measured parameter, a fourth measured parameter and the like of the equipment A;
6. device B, device C, device D … … were tested according to the methods of procedures 5 and 6, with different test methods calling different method libraries.
Claims (2)
1. A testing method for a communication device for measuring different parameters of a plurality of devices under test, comprising the steps of:
(1) storing respective device instructions of a plurality of tested devices into a function library and recording the device instructions as a function library M; storing instrument instructions of a plurality of test instruments for measuring different equipment parameters into a database in a classified manner and recording the instrument instructions into a function library N;
(2) when measuring a certain tested device, using the tested device as the current tested device;
(3) the control unit calls a function library M instruction to read the current tested equipment, sets the current index value of the current tested equipment, reads the current index value displayed by the tested equipment and ensures that the read current index value is consistent with the set current index value;
(4) the control unit determines a test instrument corresponding to the current tested parameter according to the corresponding relation between the current index value and the current tested parameter in the preset method library;
(5) the control unit calls a function library N instruction to read the test instrument, initializes the test instrument, sets parameters of the test instrument, reads back displayed parameter values of the test instrument and ensures that the read back parameter values are consistent with the set parameter values;
(6) the control unit controls the test instrument to test the current tested equipment, and then reads the tested parameters of the test instrument and uploads the tested parameters to the storage module of the control unit;
(7) judging whether the test is finished or not, and if so, finishing the test; otherwise, judging whether to continue testing the current tested parameter of the current tested device, if so, turning to the step (8), and if the next tested parameter of the current tested device needs to be tested, turning to the step (9); if the next tested device needs to be tested, the step (10) is carried out;
(8) the control unit sets the next index value corresponding to the current measured parameter of the current measured equipment, and executes the steps (3) to (7) after taking the next index value as the current index value;
(9) the control unit sets an index value corresponding to the next measured parameter of the current measured equipment, takes the next measured parameter as the current measured parameter, and executes the steps (3) to (7) after taking the index value corresponding to the next measured parameter as the current index value;
(10) and (4) taking the next tested device as the current tested device, and turning to the step (3).
2. A test method suitable for a communication device according to claim 1, characterized in that: the testing instrument comprises a power tester, a signal source tester, a frequency spectrum tester, a network analyzer and an error code tester.
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