CN109739279A - Temprature control method, device, electronic equipment and storage medium - Google Patents
Temprature control method, device, electronic equipment and storage medium Download PDFInfo
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- CN109739279A CN109739279A CN201811603922.6A CN201811603922A CN109739279A CN 109739279 A CN109739279 A CN 109739279A CN 201811603922 A CN201811603922 A CN 201811603922A CN 109739279 A CN109739279 A CN 109739279A
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Abstract
A kind of temprature control method, which comprises obtain the temperature of multiple test points of electronic equipment；For each test point, judge whether the temperature of the test point is in the corresponding safe temperature section of the test point；If the temperature of the test point is not in the safe temperature section of the test point setting, will be compared between the temperature of test point temperature-controlled area corresponding with the test point, with target temperature control interval locating for the temperature of the determination test point；Judge that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than preset duration；If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, start the corresponding target temperature control strategy of the target temperature control interval.The present invention also provides a kind of temperature control equipment, electronic equipment and storage mediums.The present invention can ensure that electronic device works are stablized.
Description
Technical field
The present invention relates to intelligent terminal technical field more particularly to a kind of temprature control method, device, electronic equipment and deposit
Storage media.
Background technique
With the fast development of AI (Artificial Intelligence, artificial intelligence) technology, AI product also meet the tendency of and
It is raw.Also there are some problems while bringing convenient in AI product.Since the heat dissipation of AI product is different, power consumption is not
Together, some AI products also operate at outdoor, if outdoor temperature is high, this easilys lead to AI product causes since temperature is excessively high
The problem of job insecurity.
Summary of the invention
In view of the foregoing, it is necessary to a kind of temprature control method, device, electronic equipment and storage medium are provided, it can
Ensure that electronic device works are stablized.
The first aspect of the present invention provides a kind of temprature control method, which comprises
Obtain the temperature of multiple test points of electronic equipment；
For each test point, judge whether the temperature of the test point is in the corresponding safety temperature of the test point
It spends in section；
If the temperature of the test point is not in the safe temperature section of the test point setting, by the test point
It is compared between temperature temperature-controlled area corresponding with the test point, with target temperature locating for the temperature of the determination test point
Spend control interval；
Judge that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than preset duration；
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, described in starting
The corresponding target temperature control strategy of target temperature control interval.
In one possible implementation, if the temperature of the test point is in the target temperature control interval
Duration be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the mesh
The blip position of corresponding target temperature control strategy is set as first identifier between mark temperature-controlled area, and the first identifier is used
It is tactful in indicating to start；
When there are flag bit being the first identifier in all flag bits for detecting the target temperature control strategy
When blip position, start the target temperature control strategy.
In one possible implementation, the method also includes:
If the duration that the temperature of the test point is in the target temperature control interval is less than or equal to described default
It is long, second identifier is set by the blip position of the corresponding target temperature control strategy of the target temperature control interval, institute
State second identifier for indicate cancel it is tactful.
In one possible implementation, if the temperature of the test point is in the target temperature control interval
Duration be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the temperature of the test point be in the target temperature control interval duration be greater than preset duration, determine described in
The corresponding target temperature control strategy of target temperature control interval；
If the target temperature control strategy is related to the objective chip core system of the electronic equipment, by internuclear logical
Believe interrupt mode, notifies the objective chip core system；
Start the target temperature control strategy by the objective chip core system.
In one possible implementation, the method also includes:
Temperature detection is carried out to each test point of the electronic equipment within a preset time, obtains multiple temperature values；
According to the multiple temperature value, temperature curve is generated；
According to the temperature curve, between the safe temperature section and temperature-controlled area that determine the test point；
According to the product characteristic of the electronic equipment, corresponding temperature control plan between each temperature-controlled area is determined
Slightly.
The second aspect of the present invention provides a kind of temperature control equipment, and described device includes:
Obtain module, the temperature of multiple test points for obtaining electronic equipment；
Judgment module judges whether the temperature of the test point is in the detection for being directed to each test point
In the corresponding safe temperature section of point；
Comparison module, if the temperature for the test point is not in the safe temperature section of the test point setting,
It will be compared between the temperature of test point temperature-controlled area corresponding with the test point, with the temperature of the determination test point
The locating target temperature control interval of degree；
The judgment module is also used to judge that the temperature of the test point is in the duration of the target temperature control interval
Whether preset duration is greater than；
Starting module is preset if the duration that the temperature for the test point is in the target temperature control interval is greater than
Duration starts the corresponding target temperature control strategy of the target temperature control interval.
In one possible implementation, if the temperature of the starting module test point is in the target temperature
The duration of control interval is greater than preset duration, starts the side of the corresponding target temperature control strategy of the target temperature control interval
Formula specifically:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the mesh
The blip position of corresponding target temperature control strategy is set as first identifier between mark temperature-controlled area, and the first identifier is used
It is tactful in indicating to start；
When there are flag bit being the first identifier in all flag bits for detecting the target temperature control strategy
When blip position, start the target temperature control strategy.
In one possible implementation, the temperature control equipment further include:
Setup module, if the duration that the temperature for the test point is in the target temperature control interval is less than or waits
In the preset duration, set the blip position of the corresponding target temperature control strategy of the target temperature control interval to
Second identifier, the second identifier cancel strategy for indicating.
The third aspect of the present invention provides a kind of electronic equipment, and the electronic equipment includes processor and memory, described
Processor realizes the temprature control method when being used to execute the computer program stored in the memory.
The fourth aspect of the present invention provides a kind of computer readable storage medium, deposits on the computer readable storage medium
Computer program is contained, the temprature control method is realized when the computer program is executed by processor.
By above technical scheme, in the present invention, the temperature of multiple test points of available electronic equipment, for each institute
Test point is stated, judges whether the temperature of the test point is in the corresponding safe temperature section of the test point, if described
The temperature of test point is not in the safe temperature section of the test point setting, can be further by the temperature of the test point
It is compared between temperature-controlled area corresponding with the test point, with target temperature control locating for the temperature of the determination test point
Section processed, and when judging that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than default
It is long, if the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, it can star institute
State the corresponding target temperature control strategy of target temperature control interval.As it can be seen that not locating in the present invention in the temperature for determining test point
When in the safe temperature section of test point setting, show that the temperature of the test point has been over the electronic equipment
The temperature range of normal work, since temperature changes at any time, it is also necessary to judge that the temperature of the test point is in described
Whether the duration of target temperature control interval is greater than preset duration, if it is greater than preset duration, shows the temperature of the test point
Time more than safe temperature section is long, at this point, starting the corresponding target temperature control of the target temperature control interval
System strategy, enables to after executing the target temperature control strategy, the temperature of the electronic equipment can be in safe temperature
In section, so as to ensure that electronic device works are stablized.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of flow chart of the preferred embodiment of temprature control method disclosed by the invention.
Fig. 2 is a kind of functional block diagram of the preferred embodiment of temperature control equipment disclosed by the invention.
Fig. 3 is the structural schematic diagram of the electronic equipment for the preferred embodiment that the present invention realizes temprature control method.
Specific embodiment
To better understand the objects, features and advantages of the present invention, with reference to the accompanying drawing and specific real
Applying example, the present invention will be described in detail.It should be noted that in the absence of conflict, the embodiment of the present invention and embodiment
In feature can be combined with each other.
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
Unless otherwise defined, all technical and scientific terms used herein and belong to technical field of the invention
The normally understood meaning of technical staff is identical.Term as used herein in the specification of the present invention is intended merely to description tool
The purpose of the embodiment of body, it is not intended that in the limitation present invention.
In order to make the foregoing objectives, features and advantages of the present invention clearer and more comprehensible, with reference to the accompanying drawing and specific real
Applying mode, the present invention is described in further detail.
The temprature control method application of the embodiment of the present invention in the electronic device, can also apply in electronic equipment and pass through
In the hardware environment that the server that network and the electronic equipment are attached is constituted, held jointly by server and electronic equipment
Row.Network includes but is not limited to: wide area network, Metropolitan Area Network (MAN) or local area network.
Wherein, the electronic equipment includes that one kind can be automatic to carry out numerical value meter according to the instruction for being previously set or storing
It calculates and/or the electronic equipment of information processing, hardware includes but is not limited to microprocessor, specific integrated circuit (ASIC), can compile
Journey gate array (FPGA), digital processing unit (DSP), embedded device etc..The electronic equipment may also include the network equipment and/or
User equipment.Wherein, the network equipment includes but is not limited to the service of single network server, multiple network servers composition
Device group or the cloud being made of a large amount of hosts or network server for being based on cloud computing (Cloud Computing), wherein cloud computing
It is one kind of distributed computing, a super virtual computer consisting of a loosely coupled set of computers.The user
Equipment include but is not limited to any one can with user by the modes such as keyboard, mouse, remote controler, touch tablet or voice-operated device into
The electronic product of row human-computer interaction, for example, personal computer, tablet computer, smart phone, personal digital assistant PDA, game
Machine, Interactive Internet TV IPTV, intellectual wearable device etc..Wherein, net locating for the user equipment and the network equipment
Network includes but is not limited to internet, wide area network, Metropolitan Area Network (MAN), local area network, Virtual Private Network VPN etc..
Referring to Figure 1, Fig. 1 is a kind of flow chart of the preferred embodiment of temprature control method disclosed by the invention.Wherein,
The sequence of step can change in the flow chart according to different requirements, and certain steps can be omitted.
S11, electronic equipment obtain the temperature of multiple test points of electronic equipment.
Wherein, the electronic equipment can be any equipment for being easy to be influenced to work normally by temperature, such as AI people
The electronic equipment of face Dynamic Recognition.
Wherein, test point can be some position on the complete machine surface of electronic equipment, be also possible to electronic equipment internal core
Some position of piece, the embodiment of the present invention is without limitation.
, can be with the temperature of each test point of real-time detection electronic equipment in the embodiment of the present invention, and save the every of detection
The temperature of a test point.A preset period of time can be set, every preset period of time, passes through some line of electronic equipment
Journey carrys out the temperature of each test point of timing acquisition, alternatively, can inquire the temperature of each test point after receiving interruption.This
Outside, the information and temperature that can also be will test a little are write in memory, and release semaphore.Another thread of electronic equipment obtains
After getting semaphore, test point and temperature can be read from memory.
S12, it is directed to each test point, electronic equipment judges whether the temperature of the test point is in the test point
In corresponding safe temperature section, if it is not, step S13 is executed, if so, terminating this process.
Wherein, safe temperature section is the temperature range that the electronic equipment is capable of steady operation, in general, the safety temperature
Section electronic equipment related with the product characteristic of the electronic equipment, different is spent, correspondingly, safe temperature section is also different.
S13, electronic equipment will be compared between the temperature of test point temperature-controlled area corresponding with the test point,
With target temperature control interval locating for the temperature of the determination test point.
In the embodiment of the present invention, if to judge that the temperature of the test point is not at the test point corresponding for electronic equipment
In safe temperature section, i.e., the temperature of the described test point is between the corresponding temperature-controlled area of the test point, due to the inspection
There are multiple subintervals between the corresponding temperature-controlled area of measuring point, it is also necessary to which the temperature of the test point is corresponding with the test point
It is compared between temperature-controlled area, with target temperature control interval locating for the temperature of the determination test point.
Wherein it is possible to carry out repeated detection to the temperature of each test point in advance, and according to the temperature and production detected
Product characteristic, between the safe temperature section and temperature-controlled area to determine the electronic equipment, wherein i.e. super between temperature-controlled area
Cross the temperature range in safe temperature section.
As an alternative embodiment, the method also includes:
Temperature detection is carried out to each test point of the electronic equipment within a preset time, obtains multiple temperature values；
According to the multiple temperature value, temperature curve is generated；
According to the temperature curve, between the safe temperature section and temperature-controlled area that determine the test point；
According to the product characteristic of the electronic equipment, corresponding temperature control plan between each temperature-controlled area is determined
Slightly.
It, can be within a preset time (such as in one month) to the every of the electronic equipment in the optional embodiment
A test point carries out temperature detection, obtains multiple temperature values, wherein, can be by the electronic equipment when carrying out temperature detection
It is placed on different outdoor environments, and the institute for starting the electronic equipment is functional, is unable to institute under environment it is also desirable to record
State the operating condition of electronic equipment.Further, according to the multiple temperature value, temperature curve is generated, at the same time it can also basis
Temperature breakthrough on the temperature curve analyze the electronic equipment whether steady operation, and determine the safety of the test point
Between temperature range and temperature-controlled area；In general, in safe temperature section, the electronic equipment energy steady operation, and in temperature
Spend control interval in, the electronic equipment can not steady operation, being usually expressed as the electronic equipment cannot achieve some function,
Alternatively, there are certain variations in the appearance of the electronic equipment.It further, can be special according to the product of the electronic equipment
Property, determine corresponding temperature control strategy between each temperature-controlled area.Wherein, corresponding temperature control strategy is being executed
Afterwards, the temperature of the electronic equipment can be in safe temperature section, meanwhile, the electronic equipment being capable of steady operation.
It is illustrated using test point as complete machine surface and chip, on the one hand, actual measurement complete machine surface temperature (from low to high), it is another
Aspect reads the temperature of chip.For example product temperature requires to be no more than 70 degree, using this temperature as the highest temperature on complete machine surface
Degree.
Table 1
| Test point | T0 | T1 | T2 | T3 | T4 |
| Complete machine surface temperature | 57 degree | 61 degree | 64 degree | 67 degree | 70 degree |
| Chip temperature | 67 degree | 71 degree | 74 degree | 77 degree | 80 degree |
Wherein, upper table 1 is that the complete machine surface temperature detected and chip temperature, T0, T1, T2, T3, T4 indicate temperature.
Based on upper table 1, T0, T1, T2, T3, T4 can be used by temperature and be divided into multiple sections, due to the temperature difference of different test points
Bigger, therefore, it is necessary to the corresponding temperature ranges of each test point.Wherein, T is the observed temperature of test point, be can be set
Safe temperature section T < T0 includes multiple sections, i.e. T0 < T < T1, T1 < T < T2, T2 < T < T3, T3 < T < T4, T between temperature-controlled area
>T4.Wherein, safe temperature section does not need to take any measure, and needs to carry out temperature control between temperature-controlled area, it is ensured that produces
Product steady operation.
Wherein, corresponding temperature control strategy between each temperature-controlled area can also be set according to product characteristic, it is as follows
Table 2.Wherein, ddr (double data rate, Double Data Rate), cpu (central processing unit, central processing
Device).
Table 2
Wherein, combination product characteristic, the corresponding temperature control strategy of T0 < T < T1 is strategy between temperature-controlled area can be set
1, the corresponding temperature control strategy of T1 < T < T2 is strategy 2, the corresponding temperature of T2 < T < T3 between temperature-controlled area between temperature-controlled area
Control strategy is strategy 3, and the corresponding temperature control strategy of T3<T<T4 is strategy 4, T>T4 between temperature-controlled area between temperature-controlled area
Corresponding temperature control strategy is strategy 5.
S14, electronic equipment judge the temperature of the test point be in the target temperature control interval duration it is whether big
In preset duration, if so, step S15 is executed, if it is not, terminating this process.
In the embodiment of the present invention, the temperature of the electronic equipment constantly changes with the time, if the temperature of the test point
Degree is more than only the safe temperature section that the test point is set in some moment, and in other long periods, the test point
Temperature be in the test point setting safe temperature section, then the electronic equipment still can steady operation, and if
The temperature of the test point be more than the test point setting safe temperature section time it is long, then the electronic equipment according to
It so just cannot steady operation.Therefore, when the temperature for determining the test point is in target temperature control interval, it is also necessary into
One step judges that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than preset duration, wherein
The preset duration is for measuring whether the temperature of the test point can influence the most short of the electronic equipment normal work
Time limit value.
S15, electronic equipment start the corresponding target temperature control strategy of the target temperature control interval.
In the embodiment of the present invention, if electronic equipment judges that the temperature of the test point is in the target temperature control zone
Between duration be greater than preset duration, show that the temperature of presently described test point has influenced the normal work of the electronic equipment
, therefore, it is necessary to start the corresponding target temperature control strategy of the target temperature control interval immediately.
If as an alternative embodiment, the temperature of the test point is in the target temperature control interval
Duration be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the mesh
The blip position of corresponding target temperature control strategy is set as first identifier between mark temperature-controlled area, and the first identifier is used
It is tactful in indicating to start；
When there are flag bit being the first identifier in all flag bits for detecting the target temperature control strategy
When blip position, start the target temperature control strategy.
Wherein, multiple flag bits can be set in each temperature control strategy, for example 8 bit of setting, each flag bit have two
A mark, i.e. first identifier and second identifier, the first identifier is for indicating starting strategy, and the second identifier is for indicating
Cancel strategy.For example the first identifier is indicated with 1, the second identifier is indicated with 0.Wherein, each temperature control strategy can
With corresponding one or more test points.
It is greater than preset duration in the duration that the temperature for determining the test point is in the target temperature control interval, it can be with
First identifier is set by the blip position of the corresponding target temperature control strategy of the target temperature control interval.
For target temperature control strategy, as long as there are flag bits in all flag bits of the target temperature control strategy
For the blip position of the first identifier, the target temperature control strategy can be started.
If as an alternative embodiment, the temperature of the test point is in the target temperature control interval
Duration be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the temperature of the test point be in the target temperature control interval duration be greater than preset duration, determine described in
The corresponding target temperature control strategy of target temperature control interval；
If the target temperature control strategy is related to the objective chip core system of the electronic equipment, by internuclear logical
Believe interrupt mode, notifies the objective chip core system；
Start the target temperature control strategy by the objective chip core system.
In the optional embodiment, if the target temperature control strategy is related to the target of the electronic equipment
Chip core system, such as face system FP (Face Processor) can notify FP by intercore communication interrupt mode,
Once FP receives interruption, FP can read the corresponding flag bit bit of on-chip memory RAM, according to corresponding bit performance objective temperature
Spend control strategy.
As an alternative embodiment, the method also includes:
If the duration that the temperature of the test point is in the target temperature control interval is less than or equal to described default
It is long, second identifier is set by the blip position of the corresponding target temperature control strategy of the target temperature control interval, institute
State second identifier for indicate cancel it is tactful.
In the optional embodiment, if the temperature of the test point be in the target temperature control interval when
It is long to be less than or equal to the preset duration, it can be by the mesh of the corresponding target temperature control strategy of the target temperature control interval
Mark flag bit is set as second identifier.
Wherein, some thread in the electronic equipment can periodically inquire the flag bit of each temperature control strategy, such as
All flag bits of temperature control strategy described in fruit are all second identifiers, then cancel the temperature control strategy, as long as conversely, institute
Any flag bit for stating temperature control strategy is first identifier, then can star the temperature control strategy.
Optionally, if the temperature of the test point is in the safe temperature section of test point setting, electronic equipment
All flag bits for the temperature control strategy that the test point is arranged can be both configured to second identifier, that is, cancel all temperature
Control strategy is spent, namely does not need to take any measure.
In the method flow described in Fig. 1, the temperature of multiple test points of available electronic equipment, for each institute
Test point is stated, judges whether the temperature of the test point is in the corresponding safe temperature section of the test point, if described
The temperature of test point is not in the safe temperature section of the test point setting, can be further by the temperature of the test point
It is compared between temperature-controlled area corresponding with the test point, with target temperature control locating for the temperature of the determination test point
Section processed, and when judging that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than default
It is long, if the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, it can star institute
State the corresponding target temperature control strategy of target temperature control interval.As it can be seen that not locating in the present invention in the temperature for determining test point
When in the safe temperature section of test point setting, show that the temperature of the test point has been over the electronic equipment
The temperature range of normal work, since temperature changes at any time, it is also necessary to judge that the temperature of the test point is in described
Whether the duration of target temperature control interval is greater than preset duration, if it is greater than preset duration, shows the temperature of the test point
Time more than safe temperature section is long, at this point, starting the corresponding target temperature control of the target temperature control interval
System strategy, enables to after executing the target temperature control strategy, the temperature of the electronic equipment can be in safe temperature
In section, so as to ensure that electronic device works are stablized.
The above is only a specific embodiment of the invention, but scope of protection of the present invention is not limited thereto, for
For those skilled in the art, without departing from the concept of the premise of the invention, improvement, but these can also be made
It all belongs to the scope of protection of the present invention.
Fig. 2 is referred to, Fig. 2 is a kind of functional block diagram of the preferred embodiment of temperature control equipment disclosed by the invention.
In some embodiments, the temperature control equipment is run in electronic equipment.The temperature control equipment can be with
Including multiple functional modules as composed by program code segments.The program code of each program segment in the temperature control equipment
It can store in memory, and as performed by least one processor, to execute in temprature control method described in Fig. 1
Part or all of step.
In the present embodiment, function of the temperature control equipment according to performed by it can be divided into multiple function moulds
Block.The functional module may include: to obtain module 201, judgment module 202, comparison module 203 and starting module 204.This hair
Bright so-called module, which refers to, a kind of performed by least one processor and can complete a series of meters of fixed function
Calculation machine program segment, storage is in memory.It in some embodiments, will be in subsequent embodiment about the function of each module
It is described in detail.
The temperature control equipment includes:
Obtain module 201, the temperature of multiple test points for obtaining electronic equipment；
Wherein, the electronic equipment can be any product for being easy to be influenced to work normally by temperature, such as certain
AI face Dynamic Recognition product.
Wherein, test point can be some position on the complete machine surface of electronic equipment, be also possible to electronic equipment internal core
Some position of piece, the embodiment of the present invention is without limitation.
, can be with the temperature of each test point of real-time detection electronic equipment in the embodiment of the present invention, and save the every of detection
The temperature of a test point.A preset period of time can be set, every preset period of time, passes through some line of electronic equipment
Journey carrys out the temperature of each test point of timing acquisition, alternatively, can inquire the temperature of each test point after receiving interruption.This
Outside, the information and temperature that can also be will test a little are write in memory, and release semaphore.Another thread of electronic equipment obtains
After getting semaphore, test point and temperature can be read from memory.
Judgment module 202 judges whether the temperature of the test point is in the inspection for being directed to each test point
In the corresponding safe temperature section of measuring point；
Wherein, safe temperature section is the temperature range that the electronic equipment is capable of steady operation, in general, the safety temperature
Section electronic equipment related with the product characteristic of the electronic equipment, different is spent, correspondingly, safe temperature section is also different.
Comparison module 203, if the temperature for the test point is not at the safe temperature section of the test point setting
It is interior, it will be compared between the temperature of test point temperature-controlled area corresponding with the test point, with the determination test point
Temperature locating for target temperature control interval；
In the embodiment of the present invention, if to judge that the temperature of the test point is not at the test point corresponding for electronic equipment
In safe temperature section, i.e., the temperature of the described test point is between the corresponding temperature-controlled area of the test point, due to the inspection
There are multiple subintervals between the corresponding temperature-controlled area of measuring point, it is also necessary to which the temperature of the test point is corresponding with the test point
It is compared between temperature-controlled area, with target temperature control interval locating for the temperature of the determination test point.
Wherein it is possible to carry out repeated detection to the temperature of each test point in advance, and according to the temperature and production detected
Product characteristic, between the safe temperature section and temperature-controlled area to determine the electronic equipment, wherein i.e. super between temperature-controlled area
Cross the temperature range in safe temperature section.
The judgment module 202 is also used to judge that the temperature of the test point is in the target temperature control interval
Whether duration is greater than preset duration；
In the embodiment of the present invention, the temperature of the electronic equipment constantly changes with the time, if the temperature of the test point
Degree is more than only the safe temperature section that the test point is set in some moment, and in other long periods, the test point
Temperature be in the test point setting safe temperature section, then the electronic equipment still can steady operation, and if
The temperature of the test point be more than the test point setting safe temperature section time it is long, then the electronic equipment according to
It so just cannot steady operation.Therefore, when the temperature for determining the test point is in target temperature control interval, it is also necessary into
One step judges that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than preset duration, wherein
The preset duration is for measuring whether the temperature of the test point can influence the most short of the electronic equipment normal work
Time limit value.
Starting module 204, if the duration that the temperature for the test point is in the target temperature control interval is greater than
Preset duration starts the corresponding target temperature control strategy of the target temperature control interval.
In the embodiment of the present invention, if electronic equipment judges that the temperature of the test point is in the target temperature control zone
Between duration be greater than preset duration, show that the temperature of presently described test point has influenced the normal work of the electronic equipment
, therefore, it is necessary to start the corresponding target temperature control strategy of the target temperature control interval immediately.
Optionally, if the temperature of the test point of the starting module 204 be in the target temperature control interval when
It is long to be greater than preset duration, start the mode of the corresponding target temperature control strategy of the target temperature control interval specifically:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the mesh
The blip position of corresponding target temperature control strategy is set as first identifier between mark temperature-controlled area, and the first identifier is used
It is tactful in indicating to start；
When there are flag bit being the first identifier in all flag bits for detecting the target temperature control strategy
When blip position, start the target temperature control strategy.
Wherein, multiple flag bits can be set in each temperature control strategy, for example 8 bit of setting, each flag bit have two
A mark, i.e. first identifier and second identifier, the first identifier is for indicating starting strategy, and the second identifier is for indicating
Cancel strategy.For example the first identifier is indicated with 1, the second identifier is indicated with 0.Wherein, each temperature control strategy can
With corresponding one or more test points.
It is greater than preset duration in the duration that the temperature for determining the test point is in the target temperature control interval, it can be with
First identifier is set by the blip position of the corresponding target temperature control strategy of the target temperature control interval.
For target temperature control strategy, as long as there are flag bits in all flag bits of the target temperature control strategy
For the blip position of the first identifier, the target temperature control strategy can be started.
Optionally, the temperature control equipment further include:
Setup module, if the duration that the temperature for the test point is in the target temperature control interval is less than or waits
In the preset duration, set the blip position of the corresponding target temperature control strategy of the target temperature control interval to
Second identifier, the second identifier cancel strategy for indicating.
In the optional embodiment, if the temperature of the test point be in the target temperature control interval when
It is long to be less than or equal to the preset duration, it can be by the mesh of the corresponding target temperature control strategy of the target temperature control interval
Mark flag bit is set as second identifier.
Wherein, some thread in the electronic equipment can periodically inquire the flag bit of each temperature control strategy, such as
All flag bits of temperature control strategy described in fruit are all second identifiers, then cancel the temperature control strategy, as long as conversely, institute
Any flag bit for stating temperature control strategy is first identifier, then can star the temperature control strategy.
Optionally, if the temperature of the test point of the starting module 204 be in the target temperature control interval when
Long to be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the temperature of the test point be in the target temperature control interval duration be greater than preset duration, determine described in
The corresponding target temperature control strategy of target temperature control interval；
If the target temperature control strategy is related to the objective chip core system of the electronic equipment, by internuclear logical
Believe interrupt mode, notifies the objective chip core system；
Start the target temperature control strategy by the objective chip core system.
In the optional embodiment, if the target temperature control strategy is related to the target of the electronic equipment
Chip core system, such as face system FP (Face Processor) can notify FP by intercore communication interrupt mode,
Once FP receives interruption, FP can read the corresponding flag bit bit of on-chip memory RAM, according to corresponding bit performance objective temperature
Spend control strategy.
Optionally, the temperature control equipment further include:
Detection module carries out temperature detection for each test point within a preset time to the electronic equipment, obtains
Multiple temperature values；
Generation module, for generating temperature curve according to the multiple temperature value；
Determining module, for determining safe temperature section and the temperature control of the test point according to the temperature curve
Section processed；
The determining module is also used to the product characteristic according to the electronic equipment, determines each temperature-controlled area
Between corresponding temperature control strategy.
It, can be within a preset time (such as in one month) to the every of the electronic equipment in the optional embodiment
A test point carries out temperature detection, obtains multiple temperature values, wherein, can be by the electronic equipment when carrying out temperature detection
It is placed on different outdoor environments, and the institute for starting the electronic equipment is functional, is unable to institute under environment it is also desirable to record
State the operating condition of electronic equipment.Further, according to the multiple temperature value, temperature curve is generated, at the same time it can also basis
Temperature breakthrough on the temperature curve analyze the electronic equipment whether steady operation, and determine the safety of the test point
Between temperature range and temperature-controlled area；In general, in safe temperature section, the electronic equipment energy steady operation, and in temperature
Spend control interval in, the electronic equipment can not steady operation, being usually expressed as the electronic equipment cannot achieve some function,
Alternatively, there are certain variations in the appearance of the electronic equipment.It further, can be special according to the product of the electronic equipment
Property, determine corresponding temperature control strategy between each temperature-controlled area.Wherein, corresponding temperature control strategy is being executed
Afterwards, the temperature of the electronic equipment can be in safe temperature section, meanwhile, the electronic equipment being capable of steady operation.
In the temperature control equipment described in Fig. 2, the temperature of multiple test points of available electronic equipment, for every
A test point, judges whether the temperature of the test point is in the corresponding safe temperature section of the test point, if
The temperature of the test point is not in the safe temperature section of the test point setting, can be further by the test point
It is compared between temperature temperature-controlled area corresponding with the test point, with target temperature locating for the temperature of the determination test point
Spend control interval, and judge the temperature of the test point be in the target temperature control interval duration whether be greater than it is default
Duration can star if the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration
The corresponding target temperature control strategy of the target temperature control interval.As it can be seen that in the present invention, the temperature for determining test point not
When in the safe temperature section in test point setting, show that the temperature of the test point has been over the electronics and sets
The standby temperature range worked normally, since temperature changes at any time, it is also necessary to judge that the temperature of the test point is in institute
Whether the duration for stating target temperature control interval is greater than preset duration, if it is greater than preset duration, shows the temperature of the test point
Degree is long more than the time in safe temperature section, at this point, starting the corresponding target temperature of the target temperature control interval
Control strategy enables to after executing the target temperature control strategy, and the temperature of the electronic equipment can be in safety temperature
It spends in section, so as to ensure that electronic device works are stablized.
As shown in figure 3, Fig. 3 is the structural representation of the electronic equipment for the preferred embodiment that the present invention realizes temprature control method
Figure.The electronic equipment 3 includes memory 31, at least one processor 32, is stored in the memory 31 and can be described
The computer program 33 and at least one communication bus 34 run at least one processor 32.
It will be understood by those skilled in the art that schematic diagram shown in Fig. 3 is only the example of the electronic equipment 3, not
The restriction to the electronic equipment 3 is constituted, may include components more more or fewer than diagram, or combine certain components, or
The different component of person, such as the electronic equipment 3 can also include input-output equipment, network access equipment etc..
The electronic equipment 3 further include but be not limited to any one can be with user by keyboard, mouse, remote controler, touch
The modes such as plate or voice-operated device carry out the electronic product of human-computer interaction, for example, personal computer, tablet computer, smart phone, a
Personal digital assistant (Personal Digital Assistant, PDA), game machine, Interactive Internet TV (Internet
Protocol Television, IPTV), intellectual wearable device etc..Network locating for the electronic equipment 3 includes but not
It is limited to internet, wide area network, Metropolitan Area Network (MAN), local area network, Virtual Private Network (Virtual Private Network, VPN) etc..
At least one described processor 32 can be central processing unit (Central Processing Unit, CPU),
It can also be other general processors, digital signal processor (Digital Signal Processor, DSP), dedicated integrated
Circuit (Application Specific Integrated Circuit, ASIC), ready-made programmable gate array (Field-
Programmable Gate Array, FPGA) either other programmable logic device, discrete gate or transistor logic,
Discrete hardware components etc..The processor 32 can be microprocessor or the processor 32 is also possible to any conventional processor
Deng the processor 32 is the control centre of the electronic equipment 3, utilizes various interfaces and the entire electronic equipment 3 of connection
Various pieces.
The memory 31 can be used for storing the computer program 33 and/or module/unit, and the processor 32 passes through
Operation executes the computer program and/or module/unit being stored in the memory 31, and calls and be stored in memory
Data in 31 realize the various functions of the electronic equipment 3.The memory 31 can mainly include storing program area and storage
Data field, wherein storing program area can application program needed for storage program area, at least one function (for example sound plays
Function, image player function etc.) etc.；Storage data area, which can be stored, uses created data (such as sound according to electronic equipment 3
Frequency evidence, phone directory etc.) etc..In addition, memory 31 may include high-speed random access memory, it can also include non-volatile
Memory, such as hard disk, memory, plug-in type hard disk, intelligent memory card (Smart Media Card, SMC), secure digital
(Secure Digital, SD) card, flash card (Flash Card), at least one disk memory, flush memory device or other
Volatile solid-state part.
In conjunction with Fig. 1, the memory 31 in the electronic equipment 3 stores multiple instruction to realize a kind of temperature controlling party
The multiple instruction can be performed to realize in method, the processor 32:
Obtain the temperature of multiple test points of electronic equipment；
For each test point, judge whether the temperature of the test point is in the corresponding safety temperature of the test point
It spends in section；
If the temperature of the test point is not in the safe temperature section of the test point setting, by the test point
It is compared between temperature temperature-controlled area corresponding with the test point, with target temperature locating for the temperature of the determination test point
Spend control interval；
Judge that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than preset duration；
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, described in starting
The corresponding target temperature control strategy of target temperature control interval.
In a kind of optional embodiment, if the temperature of the test point is in the target temperature control interval
Duration be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the mesh
The blip position of corresponding target temperature control strategy is set as first identifier between mark temperature-controlled area, and the first identifier is used
It is tactful in indicating to start；
When there are flag bit being the first identifier in all flag bits for detecting the target temperature control strategy
When blip position, start the target temperature control strategy.
In a kind of optional embodiment, the multiple instruction is can be performed to realize in the processor 32:
If the duration that the temperature of the test point is in the target temperature control interval is less than or equal to described default
It is long, second identifier is set by the blip position of the corresponding target temperature control strategy of the target temperature control interval, institute
State second identifier for indicate cancel it is tactful.
In a kind of optional embodiment, if the temperature of the test point is in the target temperature control interval
Duration be greater than preset duration, starting the corresponding target temperature control strategy of the target temperature control interval includes:
If the temperature of the test point be in the target temperature control interval duration be greater than preset duration, determine described in
The corresponding target temperature control strategy of target temperature control interval；
If the target temperature control strategy is related to the objective chip core system of the electronic equipment, by internuclear logical
Believe interrupt mode, notifies the objective chip core system；
Start the target temperature control strategy by the objective chip core system.
In a kind of optional embodiment, the multiple instruction is can be performed to realize in the processor 32:
Temperature detection is carried out to each test point of the electronic equipment within a preset time, obtains multiple temperature values；
According to the multiple temperature value, temperature curve is generated；
According to the temperature curve, between the safe temperature section and temperature-controlled area that determine the test point；
According to the product characteristic of the electronic equipment, corresponding temperature control plan between each temperature-controlled area is determined
Slightly.
Specifically, the processor 32 can refer to the concrete methods of realizing of above-metioned instruction related in Fig. 1 corresponding embodiment
The description of step, this will not be repeated here.
In the electronic equipment 3 described in Fig. 3, the temperature of multiple test points of available electronic equipment, for each
The test point, judges whether the temperature of the test point is in the corresponding safe temperature section of the test point, if institute
The temperature for stating test point is not in the safe temperature section of the test point setting, can be further by the temperature of the test point
It is compared between degree temperature-controlled area corresponding with the test point, with target temperature locating for the temperature of the determination test point
Control interval, and when judging that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than default
It is long, if the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, it can star institute
State the corresponding target temperature control strategy of target temperature control interval.As it can be seen that not locating in the present invention in the temperature for determining test point
When in the safe temperature section of test point setting, show that the temperature of the test point has been over the electronic equipment
The temperature range of normal work, since temperature changes at any time, it is also necessary to judge that the temperature of the test point is in described
Whether the duration of target temperature control interval is greater than preset duration, if it is greater than preset duration, shows the temperature of the test point
Time more than safe temperature section is long, at this point, starting the corresponding target temperature control of the target temperature control interval
System strategy, enables to after executing the target temperature control strategy, the temperature of the electronic equipment can be in safe temperature
In section, so as to ensure that electronic device works are stablized.
If the integrated module/unit of the electronic equipment 3 is realized in the form of SFU software functional unit and as independent
Product when selling or using, can store in a computer readable storage medium.Based on this understanding, the present invention is real
All or part of the process in existing above-described embodiment method, can also instruct relevant hardware come complete by computer program
At the computer program can be stored in a computer readable storage medium, which is being executed by processor
When, it can be achieved that the step of above-mentioned each embodiment of the method.Wherein, the computer program includes computer program code, described
Computer program code can be source code form, object identification code form, executable file or certain intermediate forms etc..The meter
Calculation machine readable medium may include: can carry the computer program code any entity or device, recording medium, USB flash disk,
Mobile hard disk, magnetic disk, CD, computer storage, read-only memory (ROM, Read-Only Memory), random access memory
Device (RAM, Random Access Memory), electric carrier signal, telecommunication signal and software distribution medium etc..It needs to illustrate
It is that the content that the computer-readable medium includes can be fitted according to the requirement made laws in jurisdiction with patent practice
When increase and decrease, such as in certain jurisdictions, according to legislation and patent practice, computer-readable medium does not include electric carrier wave letter
Number and telecommunication signal.
In several embodiments provided by the present invention, it should be understood that disclosed system, device and method can be with
It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the module
It divides, only a kind of logical function partition, there may be another division manner in actual implementation.
The module as illustrated by the separation member may or may not be physically separated, aobvious as module
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
In network unit.Some or all of the modules therein can be selected to realize the mesh of this embodiment scheme according to the actual needs
's.
It, can also be in addition, each functional module in each embodiment of the present invention can integrate in one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.Above-mentioned integrated list
Member both can take the form of hardware realization, can also realize in the form of hardware adds software function module.
It is obvious to a person skilled in the art that invention is not limited to the details of the above exemplary embodiments, Er Qie
In the case where without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power
Benefit requires rather than above description limits, it is intended that all by what is fallen within the meaning and scope of the equivalent elements of the claims
Variation is included in the present invention.Any attached associated diagram label in claim should not be considered as right involved in limitation to want
It asks.Furthermore, it is to be understood that one word of " comprising " does not exclude other units or steps, odd number is not excluded for plural number.It is stated in system claims
Multiple units or device can also be implemented through software or hardware by a unit or device.Second equal words are used to table
Show title, and does not indicate any particular order.
Finally it should be noted that the above examples are only used to illustrate the technical scheme of the present invention and are not limiting, although reference
Preferred embodiment describes the invention in detail, those skilled in the art should understand that, it can be to of the invention
Technical solution is modified or equivalent replacement, without departing from the spirit and scope of the technical solution of the present invention.
Claims (10)
1. a kind of temprature control method, which is characterized in that the described method includes:
Obtain the temperature of multiple test points of electronic equipment；
For each test point, judge whether the temperature of the test point is in the corresponding safe temperature area of the test point
In；
If the temperature of the test point is not in the safe temperature section of the test point setting, by the temperature of the test point
It is compared between temperature-controlled area corresponding with the test point, with target temperature control locating for the temperature of the determination test point
Section processed；
Judge that the temperature of the test point is in the duration of the target temperature control interval and whether is greater than preset duration；
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, start the target
Corresponding target temperature control strategy between temperature-controlled area.
2. if the method according to claim 1, wherein the temperature of the test point is in the target temperature
The duration for spending control interval is greater than preset duration, starts the corresponding target temperature control strategy packet of the target temperature control interval
It includes:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the target temperature
The blip position of the corresponding target temperature control strategy of degree control interval is set as first identifier, and the first identifier is used for table
Show starting strategy；
When there are the targets that flag bit is the first identifier in all flag bits for detecting the target temperature control strategy
When flag bit, start the target temperature control strategy.
3. the method according to claim 1, wherein the method also includes:
It, will if the duration that the temperature of the test point is in the target temperature control interval is less than or equal to the preset duration
The blip position of the corresponding target temperature control strategy of the target temperature control interval is set as second identifier, and described second
Mark cancels strategy for indicating.
4. if the method according to claim 1, wherein the temperature of the test point is in the target temperature
The duration for spending control interval is greater than preset duration, starts the corresponding target temperature control strategy packet of the target temperature control interval
It includes:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, the target is determined
Corresponding target temperature control strategy between temperature-controlled area；
If the target temperature control strategy is related to the objective chip core system of the electronic equipment, by intercore communication
Disconnected mode, notifies the objective chip core system；
Start the target temperature control strategy by the objective chip core system.
5. method according to any one of claims 1 to 4, which is characterized in that the method also includes:
Temperature detection is carried out to each test point of the electronic equipment within a preset time, obtains multiple temperature values；
According to the multiple temperature value, temperature curve is generated；
According to the temperature curve, between the safe temperature section and temperature-controlled area that determine the test point；
According to the product characteristic of the electronic equipment, corresponding temperature control strategy between each temperature-controlled area is determined.
6. a kind of temperature control equipment, which is characterized in that the temperature control equipment includes:
Obtain module, the temperature of multiple test points for obtaining electronic equipment；
Judgment module judges whether the temperature of the test point is in the test point pair for being directed to each test point
In the safe temperature section answered；
Comparison module, if the temperature for the test point is not in the safe temperature section of the test point setting, by institute
It states and is compared between the temperature temperature-controlled area corresponding with the test point of test point, with the temperature institute of the determination test point
The target temperature control interval at place；
The judgment module, be also used to judge the temperature of the test point be in the target temperature control interval duration whether
Greater than preset duration；
Starting module, if the duration that the temperature for the test point is in the target temperature control interval is greater than default
It is long, start the corresponding target temperature control strategy of the target temperature control interval.
7. temperature control equipment according to claim 6, which is characterized in that if the temperature of the starting module test point
Duration of the degree in the target temperature control interval is greater than preset duration, starts the corresponding mesh of the target temperature control interval
Mark the mode of temperature control strategy specifically:
If the duration that the temperature of the test point is in the target temperature control interval is greater than preset duration, by the target temperature
The blip position of the corresponding target temperature control strategy of degree control interval is set as first identifier, and the first identifier is used for table
Show starting strategy；
When there are the targets that flag bit is the first identifier in all flag bits for detecting the target temperature control strategy
When flag bit, start the target temperature control strategy.
8. temperature control equipment according to claim 6, which is characterized in that the temperature control equipment further include:
Setup module, if the duration that the temperature for the test point is in the target temperature control interval is less than or equal to institute
Preset duration is stated, sets second for the blip position of the corresponding target temperature control strategy of the target temperature control interval
Mark, the second identifier cancel strategy for indicating.
9. a kind of electronic equipment, which is characterized in that the electronic equipment includes processor and memory, and the processor is for holding
The computer program stored in line storage is to realize the temprature control method as described in any one of claim 1 to 5.
10. a kind of computer readable storage medium, which is characterized in that the computer-readable recording medium storage has at least one
The temperature controlling party as described in claim 1 to 5 any one is realized in instruction, at least one described instruction when being executed by processor
Method.
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