CN109727885A - Cell piece Al-BSF voidage test method - Google Patents
Cell piece Al-BSF voidage test method Download PDFInfo
- Publication number
- CN109727885A CN109727885A CN201811526315.4A CN201811526315A CN109727885A CN 109727885 A CN109727885 A CN 109727885A CN 201811526315 A CN201811526315 A CN 201811526315A CN 109727885 A CN109727885 A CN 109727885A
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- voidage
- measured
- region
- bsf
- cell piece
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- 238000010998 test method Methods 0.000 title claims abstract description 23
- 238000012360 testing method Methods 0.000 claims abstract description 51
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 14
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 13
- 238000005192 partition Methods 0.000 claims abstract description 9
- 238000006073 displacement reaction Methods 0.000 claims abstract description 8
- 239000000080 wetting agent Substances 0.000 claims abstract description 8
- 239000012459 cleaning agent Substances 0.000 claims abstract description 7
- 238000007790 scraping Methods 0.000 claims abstract description 7
- 239000002002 slurry Substances 0.000 claims abstract description 7
- 230000001154 acute effect Effects 0.000 claims abstract description 4
- 238000005259 measurement Methods 0.000 claims abstract description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 238000005245 sintering Methods 0.000 description 7
- 239000004411 aluminium Substances 0.000 description 6
- 238000012512 characterization method Methods 0.000 description 6
- 229910000632 Alusil Inorganic materials 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 5
- 239000000956 alloy Substances 0.000 description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000003463 adsorbent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000013082 photovoltaic technology Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Abstract
The invention discloses a kind of cell piece Al-BSF voidage test methods, comprising the following steps: S1, is placed at the sample back side on partition upward；S2, wetting agent is dripped in the region to be measured of sample surfaces, be then allowed to stand；S3, the aluminum slurry for wiping region to be measured off with scraper, blade and sample surfaces are at an acute angle when scraping；S4, sample surfaces are rinsed with cleaning agent, it is dry to sample surfaces；S5, the sample handled well is fixed on 3D microscope testing stand；S6, selection low power lens, adjustment test platform displacement makes camera lens face regional center position to be measured, it is clearest that focusing adjusts into form image, fine tuning displacement makes the laser tear strip number N for occurring most in test windows, the length Ln for measuring and recording each laser aperture lines hole region, is calculated from the formula the voidage of the secondary measurement；S7, mobile test platform continue to carry out above-mentioned steps S6 to the region to be measured, and repeatedly, averaged is the voidage in the region to be measured.
Description
Technical field
The invention belongs to area of solar cell, and in particular to a kind of cell piece Al-BSF voidage test method.
Background technique
Photovoltaic technology is the technology converted solar energy into electrical energy using the p-n junction diode of large area.This p-n
Junction diode is called solar battery.The semiconductor material of production solar battery all has certain forbidden bandwidth, works as the sun
When energy battery is by solar radiation, energy is more than that the photon of forbidden bandwidth generates electron hole pair in solar cell, and p-n junction will
Electron hole pair separation, the asymmetry of p-n junction determine the flow direction of different types of photo-generated carrier, pass through external electrical
Road connection can outside output power.This is similar with common electrochemical cell principle.
Industrialized production p-type crystal silicon solar batteries generally use full Al-BSF structure, i.e. back side whole face prints aluminium paste, burn
Al-BSF is formed after knot.The shortcomings that this structure is that no passivating back and backside reflection rate are low, to affect the electricity of battery
Pressure and current capability.Local Al-BSF battery overcomes disadvantage mentioned above, and this battery uses the thin film passivation with passivation effect
Battery back surface increases back surface reflectivity simultaneously.Passivating film is effectively passivated largely dangle existing for silicon materials surface key and defect
(such as dislocation, crystal boundary and point defect etc.), to reduce photo-generated carrier silicon face recombination rate, that improves minority carrier has
The service life is imitated, to promote the promotion of solar cell photoelectric transformation efficiency.Passivating film has the effect of increase backside reflection simultaneously,
To increase absorption of the silicon body material to sunlight, the concentration of photo-generated carrier is improved to increase density of photocurrent.
In order to which electric current is exported, it usually needs overleaf aperture or burst at the seams on passivating film, after republishing aluminium paste sintering
Form local Al-BSF.The gross area of hole or line typically constitutes from the 1-15% at the back side, the too small contact electricity that will increase the back side of area
Resistance, it is excessive, the recombination rate at the back side is increased, either way will affect the incident photon-to-electron conversion efficiency of battery.Aperture is burst at the seams
The general method for using laser or chemical attack.Printing aluminium paste generally uses full back surface field figure, i.e. aluminium paste covering removes back electrode
Whole rear surface regions in addition.
In solar battery sintering process, front and back sides are formed simultaneously good Metals-semiconductor contacts, and front side silver paste is used
In contact emitter, back side aluminium paste forms liquid phase alusil alloy and in temperature-fall period in laser opening with silicon during the sintering process
Position formed and mix the epitaxial silicon of aluminium i.e. part Al-BSF and alusil alloy.Since liquid phase alusil alloy is during cooling
There is the silicon of part to be diffused into printing aluminum metal layer without being to revert to original position, leads to the probability for having certain in the position of laser opening
Cavity is formed, without filling alusil alloy and local Al-BSF is partially thin leads to the compound speed of these surface of positions inside these cavities
Rate is higher, to be revealed as stain or black line on electroluminescent figure and generate negative shadow to the electrical property of battery
It rings.
Therefore it needs to be tested for Al-BSF voidage.Al-BSF voidage test at present is asked there are following prominent
Topic:
1. needing to carry out cross sectional testing using scanning electron microscope SEM, time-consuming for single-spot testing；
2.SEM test only tests part, cannot observe sample entirety；
3.SEM equipment is expensive, and part body or company do not have test condition.
It is necessary to improve regarding to the issue above.
Summary of the invention
The purpose of the present invention is to provide a kind of cell piece Al-BSF voidage test sides at low cost, applied widely
Method.
One of for achieving the above object, the present invention provides a kind of cell piece Al-BSF voidage test method, packets
Include following steps:
S1, the sample back side is placed on partition upward, partition area is greater than cell piece area；
S2, wetting agent is dripped in the region to be measured of sample surfaces, is then allowed to stand preset time；
S3, the aluminum slurry for wiping region to be measured off with scraper, blade plane and sample surfaces are at an acute angle when scraping；
S4, sample surfaces are rinsed with cleaning agent, it is dry to sample surfaces；
S5, the sample handled well is placed on 3D microscope testing stand, is fixed on table top；
S6, selection low power lens, adjustment test platform displacement make camera lens face regional center position to be measured, and focusing is adjusted to view
Image is clearest in window, and fine tuning displacement makes the laser tear strip number N for occurring most in test windows, measures and records each and swashs
The length Ln of light aperture lines hole region, according to formula
Calculate the voidage of the secondary measurement；
S7, mobile test platform continue to carry out above-mentioned steps S6 to the region to be measured, and repeatedly, averaged is
For the voidage in the region to be measured.
As the further improvement of embodiment of the present invention, the test method further include sample surfaces choose it is multiple to
Region is surveyed, repeats step S6 and S7, seeks the voidage of sample multiple regions respectively to characterize the cavity of monolithic battery piece
Rate information.
As the further improvement of embodiment of the present invention, each one of the region to be measured that sample surfaces close on quadrangle is chosen,
The voidage in this five regions of sample is sought respectively to characterize the sky of monolithic battery piece in one, region to be measured among sample surfaces
Hole rate information.
As the further improvement of embodiment of the present invention, in step s 2, the area in the region to be measured of selection exists
Between 0.5cm*0.5cm to 3cm*3cm.
As the further improvement of embodiment of the present invention, in step s3, blade plane is in sample surfaces when scraping
Between 20 degree to 60 degree.
As the further improvement of embodiment of the present invention, in step s 2, the wetting agent of selection is alcohol or pure water.
As the further improvement of embodiment of the present invention, in step s 4, the cleaning agent of selection is alcohol or pure water.
As the further improvement of embodiment of the present invention, in step s 4, sample surfaces are dried up using air gun.
As the further improvement of embodiment of the present invention, in step s 2, the preset time of standing is 10-50 seconds.
As the further improvement of embodiment of the present invention, in the step s 7, duplicate number is 5-20 times.
Compared with prior art, cell piece Al-BSF voidage test method disclosed by the invention uses the micro- of routine
Mirror can carry out the test of cell piece Al-BSF voidage；And monolithic single-spot testing time-consuming is short；The data volume that can be measured increases, and mentions
High characterization accuracy；Both the test of cell piece local cavity rate can have been carried out, whole voidage test characterization can also be carried out.In this way, drop
The cost of low test, and the test of local cavity rate and whole voidage test are applicable in, it is applied widely.
Detailed description of the invention
Fig. 1 is scraper and sample placed angle schematic diagram in the preferred embodiment of the present invention；
Fig. 2 is that hole region and the comparison of normal region two dimensional image are shown in test sample in the preferred embodiment of the present invention
It is intended to；
Fig. 3 is the hole region schematic diagram of test sample in the preferred embodiment of the present invention；
Fig. 4 is the hole region of test sample and the comparison of normal region 3-D image in the preferred embodiment of the present invention；
The area schematic to be measured of test sample in Fig. 5 preferred embodiment of the present invention.
Specific embodiment
Below with reference to specific embodiment shown in the drawings, the present invention will be described in detail.But these embodiments are simultaneously
The present invention is not limited, structure that those skilled in the art are made according to these embodiments, method or functionally
Transformation is included within the scope of protection of the present invention.
It should be understood that the art of the representation space relative position used herein such as "upper", " top ", "lower", " lower section "
Language be for convenient for explanation purpose come describe as shown in the drawings a unit or feature relative to another unit or spy
The relationship of sign.The term of relative space position can be intended to include equipment in use or work other than orientation as shown in the figure
Different direction.
As depicted in figs. 1 and 2, in the preferred embodiment of the present invention, cell piece Al-BSF voidage test method includes
Following steps:
S1, the sample back side is placed on partition upward, partition area is greater than cell piece area；
S2, wetting agent is dripped in the region to be measured of sample surfaces, is then allowed to stand preset time；
S3, the aluminum slurry for wiping region to be measured off with scraper, blade and sample surfaces are at an acute angle when scraping；
S4, sample surfaces are rinsed with cleaning agent, it is dry to sample surfaces；
S5, the sample handled well is placed on 3D microscope testing stand, is fixed on table top；
S6, selection low power lens, adjustment test platform displacement make camera lens face regional center position to be measured, and focusing is adjusted to view
Image is clearest in window, and fine tuning displacement makes the laser tear strip number N for occurring most in test windows, measures and records each and swashs
The length Ln of light aperture lines hole region, according to formula
Calculate the voidage of the secondary measurement；
S7, mobile test platform continue to carry out above-mentioned steps S6 to the region to be measured, and repeatedly, averaged is
For the voidage in the region to be measured.
Using above-mentioned cell piece Al-BSF voidage test method, Al-BSF cavity can be carried out using conventional microscope
Rate test, testing cost is lower, and monolithic single-spot testing time-consuming is short；The data volume that can be measured increases, and improves characterization accuracy.
Above-mentioned Al-BSF voidage test method can both carry out the test of cell piece local cavity rate, can also carry out whole voidage test
Characterization, it is applied widely.
In above-mentioned steps S1, sample, that is, finished product cell piece, partition is preferably plastic septum, preferably clean plastic partition
Plate, mainly support sample to be tested, cheap therefore at low cost, hardness is also suitable, too hard or too soft, be easy to cause sample broke.
In above-mentioned steps S2, the effect of wetting agent is to prevent occurring dust during scraping off aluminum slurry, relatively easily
Scrape off aluminum slurry；Wetting agent can be alcohol or pure water, be preferably alcohol in the present embodiment, and alcohol is volatile, fast drying,
It will not be with example reaction.The area in the region to be measured chosen is between 0.5cm*0.5cm to 3cm*3cm, furthermore it is possible to using glue
Head dropper drips 1-3 drop alcohol in sample surfaces, and the preset time of standing can be 10-50 seconds.Certainly, the drop number and standing of alcohol
Time can also adjust according to the actual situation.
Shown referring to Fig.1 in above-mentioned steps S3, blade 20 and the angle, θ on 10 surface of sample are preferably 20-60 when scraping
Between degree, angle is too big, and downward component is larger, can destroy the alusil alloy layer under aluminum slurry, influence actual test.
In above-mentioned steps S4, cleaning agent is also possible to alcohol or pure water, and preferably alcohol, alcohol is easy in the present embodiment
Volatilization, fast drying.Further, it is possible to use air gun dries up sample surfaces, to accelerate to test.
In above-mentioned steps S5, the fixation of sample can be by the adsorbent equipment vacuum suction that 3D microscope carries in table top
On.Sample can also be pushed down, there cannot be warpage, otherwise will affect test.
In above-mentioned steps S6, it can choose selection x5 times of object lens of low power, it is two-dimentional under 3D microscope referring to shown in Fig. 2
A-quadrant is normal region in visual field, and normal region is silvery white, even width；B area is hole region, during hole region is
Heart silver color filament, edge black.Referring to shown in Fig. 3, it is hole region that the region of √ is marked in the microscopical two dimensional image of 3D.
Referring to shown in Fig. 4, x10 times of object lens are selected, in 3D microscope three-dimensional scan image, normal region A is more smooth silvery white,
Hole region B is portion concave, and color is non-silver color.
In above-mentioned steps S7, data deviation is larger when test sample amount is very few, for the sample of different manufacturers, sample size
Selection might have difference, preferred duplicate number is 5-20 times, which can guarantee the accuracy of test result.
Further, above-mentioned cell piece Al-BSF voidage test method further includes choosing multiple areas to be measured in sample surfaces
Domain repeats above-mentioned steps S6 and S7, seeks the voidage of sample multiple regions respectively to characterize the cavity of monolithic battery piece
Rate information.Because in sintering process silicon chip edge and furnace zone thimble contact & sintering furnace leakproofness will lead to sintering temperature center height, two
Side is low.Furnace zone thimble supports cell piece during the sintering process, it is therefore desirable to monitor edge quadrangle and center.Referring to Figure 5, excellent
Choosing, the region to be measured that selection sample surfaces close on quadrangle is each one (a, b, c, d), one, region to be measured among sample surfaces
(e), the voidage of sample this five regions (a, b, c, d, e) is sought respectively to characterize the voidage information of monolithic battery piece.When
So, area size to be measured and position can be according to the contact positions and thimble size appropriate adjustment of actual cell piece and furnace zone.
By using above-mentioned cell piece Al-BSF voidage test method, Al-BSF can be carried out using conventional microscope
Voidage test；And monolithic single-spot testing time-consuming is short；The data volume that can be measured increases, and improves characterization accuracy；Both it can carry out
The test of cell piece local cavity rate can also carry out whole voidage test characterization.In this way, reducing the cost of test, and office
The test of portion's voidage and whole voidage test are applicable in, applied widely.
It should be appreciated that although this specification is described in terms of embodiments, but not each embodiment only includes one
A independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should will say
As a whole, the technical solution in each embodiment may also be suitably combined to form those skilled in the art can for bright book
With the other embodiments of understanding.
The series of detailed descriptions listed above only for feasible embodiment of the invention specifically
Protection scope bright, that they are not intended to limit the invention, it is all without departing from equivalent implementations made by technical spirit of the present invention
Or change should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of cell piece Al-BSF voidage test method, which comprises the following steps:
S1, the sample back side is placed on partition upward, partition area is greater than cell piece area；
S2, wetting agent is dripped in the region to be measured of sample surfaces, is then allowed to stand preset time；
S3, the aluminum slurry for wiping region to be measured off with scraper, blade and sample surfaces are at an acute angle when scraping；
S4, sample surfaces are rinsed with cleaning agent, it is dry to sample surfaces；
S5, the sample handled well is placed on 3D microscope testing stand, is fixed on table top；
S6, selection low power lens, adjustment test platform displacement make camera lens face regional center position to be measured, and focusing is adjusted into form
Image is clearest, and fine tuning displacement makes the laser tear strip number N for occurring most in test windows, measures and records each laser and opens
The length Ln of mouth line hole region, according to formula
Calculate the voidage of the secondary measurement；
S7, mobile test platform continue to carry out above-mentioned steps S6 to the region to be measured, and repeatedly, averaged is should
The voidage in region to be measured.
2. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that the test method is also
It is included in sample surfaces and chooses multiple regions to be measured, repeats step S6 and S7, seek the cavity of sample multiple regions respectively
Rate is to characterize the voidage information of monolithic battery piece.
3. cell piece Al-BSF voidage test method according to claim 2, which is characterized in that choose sample surfaces and face
Each one of the region to be measured of nearly quadrangle, the sky in this five regions of sample is sought in one, the region to be measured among sample surfaces respectively
Hole rate is to characterize the voidage information of monolithic battery piece.
4. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in step s 2, choosing
The area in the region to be measured taken is between 0.5cm*0.5cm to 3cm*3cm.
5. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in step s3, scrape
Blade plane and sample surfaces are between 20 degree to 60 degree when dynamic.
6. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in step s 2, choosing
The wetting agent taken is alcohol or pure water.
7. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in step s 4, choosing
The cleaning agent taken is alcohol or pure water.
8. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in step s 4, adopt
Sample surfaces are dried up with air gun.
9. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in step s 2, quiet
The preset time set is 10-50 seconds.
10. cell piece Al-BSF voidage test method according to claim 1, which is characterized in that in the step s 7, weight
Multiple number is 5-20 times.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811526315.4A CN109727885B (en) | 2018-12-13 | 2018-12-13 | Method for testing void ratio of aluminum back surface field of battery piece |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811526315.4A CN109727885B (en) | 2018-12-13 | 2018-12-13 | Method for testing void ratio of aluminum back surface field of battery piece |
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| Publication Number | Publication Date |
|---|---|
| CN109727885A true CN109727885A (en) | 2019-05-07 |
| CN109727885B CN109727885B (en) | 2020-07-10 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104864813A (en) * | 2015-05-18 | 2015-08-26 | 苏州阿特斯阳光电力科技有限公司 | Method for measuring height and width of crystalline silica solar cell grid line |
| CN105162416A (en) * | 2015-10-13 | 2015-12-16 | 苏州阿特斯阳光电力科技有限公司 | Testing method of local contact windowing region in local contact back passivation solar cell |
| CN107068777A (en) * | 2017-02-13 | 2017-08-18 | 晶澳（扬州）太阳能科技有限公司 | A kind of local Al-BSF solar cell and preparation method thereof |
| CN207868207U (en) * | 2017-12-12 | 2018-09-14 | 苏州阿特斯阳光电力科技有限公司 | Photovoltaic cell and corresponding halftone |
-
2018
- 2018-12-13 CN CN201811526315.4A patent/CN109727885B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104864813A (en) * | 2015-05-18 | 2015-08-26 | 苏州阿特斯阳光电力科技有限公司 | Method for measuring height and width of crystalline silica solar cell grid line |
| CN105162416A (en) * | 2015-10-13 | 2015-12-16 | 苏州阿特斯阳光电力科技有限公司 | Testing method of local contact windowing region in local contact back passivation solar cell |
| CN107068777A (en) * | 2017-02-13 | 2017-08-18 | 晶澳（扬州）太阳能科技有限公司 | A kind of local Al-BSF solar cell and preparation method thereof |
| CN207868207U (en) * | 2017-12-12 | 2018-09-14 | 苏州阿特斯阳光电力科技有限公司 | Photovoltaic cell and corresponding halftone |
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| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: No.88, Xiexin Avenue, Funing Economic Development Zone, Yancheng City, Jiangsu Province Patentee after: Funing atlas sunshine Power Technology Co., Ltd Patentee after: CSI Cells Co.,Ltd. Patentee after: Atlas sunshine Power Group Co.,Ltd. Address before: 224400 No.88, Xiexin Avenue, Funing Economic Development Zone, Yancheng City, Jiangsu Province Patentee before: CSI-GCL SOLAR MANUFACTURING (YANCHENG) Co.,Ltd. Patentee before: CSI Cells Co.,Ltd. Patentee before: CSI SOLAR POWER GROUP Co.,Ltd. |