CN109709424A - A kind of implementation method of the more test item concurrent testings of EMC Auto-Test System - Google Patents
A kind of implementation method of the more test item concurrent testings of EMC Auto-Test System Download PDFInfo
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Abstract
The invention discloses a kind of implementation methods of the more test item concurrent testings of EMC Auto-Test System, belong to electromagnetic compatibility test field, the present invention passes through the demand analysis to test resource, to the reasonable distribution of test item made rational planning for test resource, under the premise of not generating conflict, classifying rationally is carried out to hardware resource, it is proposed that susceptibility test and conducted emission test the hardware plan carried out simultaneously, resources idle is reduced to the full extent, on the basis of not increasing existing hardware device, it is called by the multithreading of software systems realization test resource and establishes corresponding test access, finally realize electromagnetic compatibility test system testing item concurrent testing, testing efficiency has been turned up, shorten the testing time, testing cost is saved.
Description
Technical field
The invention belongs to electromagnetic compatibility test fields, and in particular to a kind of more test items of EMC Auto-Test System are surveyed parallel
The implementation method of examination.
Background technique
With the development of modern science and technology, the application field of electronic equipment is more and more extensive, locating electromagnetic environment is also more next
It is more complicated, therefore produce more and more electromagnetic compatibility problems.In order to ensure the safety of electronic equipment and user of service, electromagnetism
Compatibility has become the necessary condition of electronics, the electric information product market access.And whether Electromagnetic Compatibility meets market
It is required that be measured by electromagnetic compatibility test, electromagnetic compatibility test can not only assess whether test product reaches related mark
Quasi- requirement, moreover it is possible to be positioned by testing, analyze existing electromagnetic compatibility problem, to help producer's Curve guide impeller.
Electromagnetic compatibility test, which is broadly divided into, emits test (EMI) and susceptibility test (EMS), real required for two class testings
Testing room test resource includes test equipment, TCH test channel and test site.Transmitting test and many tests in susceptibility test
Resource is shared, such as test site is all in darkroom or in control room, TCH test channel be all by switch matrix with it is various
Cable interface board group at access, signal source in test equipment uses in transmitting test as calibrator (-ter) unit, while quick
It is used again as interference field strength generating device in sensitivity test.In order to avoid the use conflict of test resource, in the process of test
In, most of laboratory same time only carries out the test of a test item, and the resource that current test item is not used is then in not busy
State is set, leads to that device resource utilization rate is not high, testing efficiency is low, especially in susceptibility test, is being surveyed for a long time
Other tests can not be carried out during examination, cause the significant wastage of laboratory test resource.Therefore, some test assignment weights
Laboratory need to configure the same or similar equipment of more/set function, the test job of multiple projects could be carried out simultaneously, made
At the raising of laboratory cost.
In current electromagnetic compatibility test system, for different test items test implementation method there are two types of:
First method is to carry out item by item.Due between each susceptibility test test item and each transmitting test test item
There are shared test equipments, in order to guarantee that every test not by mutual interference, guarantees that test is normally carried out, many realities
It tests room and takes the method tested item by item, i.e., the same time only tests a test item, carries out down again after the completion of current test item
The test of one test item.Such method causes the idle of other test resources, reduces testing efficiency.
Second method is to purchase test equipment/system similar in more/set function.Part Experiment room is due to test assignment
Heavy, the testing time is nervous, in order to more fully utilize test resource, has purchased equipment component separately to realize different test items
It tests simultaneously.Such as signal source similar in two functions, one uses for emitting detection calibration, and one is used for susceptibility test
It generates interference signal to use, improves the utilization rate of resource to a certain extent, but increase laboratory hardware cost, cause
The waste of resource.
When directlying adopt the problem of more test items of existing method progress electromagnetic compatibility are tested, have the following disadvantages:
Low efficiency.It is interfered with each other to guarantee in test process that different test items do not generate, while only carrying out a test
The test of item, the current unwanted test resource of test item are in idle state, testing efficiency are reduced, when extending test
Between.
It is at high cost.It is real there are test equipment/system similar in more/set function in test macro to improve testing efficiency
Test while having showed more test items reduces the idle of test resource, but increases the hardware device for needing to purchase, and increases
The construction cost in laboratory.
Summary of the invention
For the above-mentioned technical problems in the prior art, the invention proposes a kind of EMC (Electro Magnetic
Compatibility, electromagnetic compatibility) the more test item concurrent testings of Auto-Test System implementation method, design rationally, overcome
The deficiencies in the prior art have good effect.
To achieve the goals above, the present invention adopts the following technical scheme:
A kind of implementation method of the more test item concurrent testings of EMC Auto-Test System, includes the following steps:
Step 1: operation test item 1；Select testing time longer test item for test item 1, to test in test item 1
During carry out other testing times shorter test item；
Step 2: judging whether the test resource of test item 1 is occupied；
If: judging result is that the test resource of test item 1 is occupied, continues to judge；
Or judging result is that the test resource of test item 1 does not have occupied, thens follow the steps 3；
Step 3: test item 1 is calibrated；
Step 4: after the completion of calibration, the test resource of release calibration occupancy；
Step 5: test item 1 is tested；
Step 6: after the completion of test item 1 is tested, discharging test resource；
During test item 1 is tested, if there is the request of other test items is using the test resource currently occupied, then send out
Test resource occupied message is sent, sends the message that test resource has discharged after the completion of the test of item 1 to be tested；
Step 7: the test of test item 1 terminates；
Step 8: test item 2,2 institute's test resource in need of planning test item are run using multi-threading；
Step 9: judging whether the test resource of test item 2 is occupied；
If: judging result is that the test resource of test item 2 is occupied, continues to judge, until judging the survey of test item 2
Examination resource do not have it is occupied, then execute step 10；
Or judging result is that the test resource of test item 2 does not have occupied, thens follow the steps 10；
Step 10: test item 2 is calibrated；
Step 11: after the completion of calibration, the test resource of release calibration occupancy；
Step 12: test item 2 is tested；
Step 13: after the completion of test, discharging test resource；
Step 14: the test of test item 2 terminates.
Preferably, EMC test includes transmitting test and susceptibility test, and each test is divided into multiple test items again；Wherein,
The testing process for emitting test is as follows:
Step S11: transmitting test starts；
Step S12: calibration signal is generated by signal source；
Step S13: measured value is read by receiver；
Step S14: calibration is completed；
Step S15: Device under test is captured by sensor and generates signal；
Step S16: measured value is read by receiver；
Step S17: judge whether qualification compared with calibration；
Step S18: release test resource；
Step S19: transmitting test terminates；
The testing process of susceptibility test is as follows:
Step S21: susceptibility test starts；
Step S22: calibration signal is generated by signal source；
Step S23: measured value is read by sensor；
Step S24: calibration is completed；
Step S25: test signal is generated by signal source；
Step S26: measured value is read by sensor；
Step S27: judge whether Device under test works normally；
Step S28: release test resource；
Step S29: susceptibility test terminates.
Advantageous effects brought by the present invention:
The present invention is by the demand analysis to test resource, to making rational planning for for test item and rationally dividing for test resource
Match, under the premise of not generating conflict, classifying rationally is carried out to hardware resource, proposes that susceptibility test and conducted emission test are same
The hardware plan of Shi Jinhang, reduces resources idle to the full extent, on the basis of not increasing existing hardware device, by soft
Part system realizes that the multithreading of test resource calls and establishes corresponding test access, finally realizes electromagnetic compatibility test system
Test item concurrent testing, has been turned up testing efficiency, shortens the testing time, has saved testing cost.
Detailed description of the invention
Fig. 1 is EMC test flow chart；
Wherein, Fig. 1 (a) is transmitting test flow chart；Fig. 1 (b) is susceptibility test flow chart.
Fig. 2 is the flow chart of the more test item Implementation Method of Parallel Test of EMC Auto-Test System of the present invention.
Specific embodiment
With reference to the accompanying drawing and specific embodiment invention is further described in detail:
The present invention provides a kind of method realizes the more test item concurrent testings of EMC Auto-Test System, improves test resource
Utilization rate shortens the testing time, improves testing efficiency.
Electromagnetic compatibility (EMC) test is broadly divided into transmitting test (EMI) and susceptibility test (EMS), and each test divides again
For multiple test items, the testing process of two class testings is analyzed first.
Transmitting test is mainly used to the interference for examining Device under test externally to generate whether in the range of standard regulation, is divided into
Two parts of calibration and test, the test equipment mainly used are signal source, receiver, interference capture sensor, switch matrix
Deng the testing time is shorter, and different according to route of transmission can be divided into radiation-emitting and conducted emission again, and wherein radiation-emitting needs
It to be carried out in darkroom, testing time general more than ten minutes to dozens of minutes etc., conducted emission can also be in darkroom
It is carried out in control room, the testing time generally in a few minutes to more than ten minutes etc., emits shown in testing process such as Fig. 1 (a):
Can susceptibility test be mainly used to work normally under examining Device under test to interfere as defined in standard, is equally divided into
Calibration and test two parts, the test equipment mainly used is signal source, power amplifier, power meter, field intensity meter etc., according to dry
The mode for disturbing coupling is different, can also be divided into radiosensitivity test and conducted susceptibility test, and radiosensitivity test needs
It is carried out in darkroom, conducted susceptibility test can carry out in darkroom or in control room, and the frequency range tested as needed is not
Together, testing time span is larger, by taking RS103 in GJB151B as an example, if to accomplish full frequency band by test step-length as defined in standard
(10kHz-40GHz) test, the uninterrupted test time needed is a couple of days, as fruit product has particular/special requirement to need to subtract step-length
Small, then the time needed is longer, shown in susceptibility test process such as Fig. 1 (b):
In two class testings, calibration test does not need all to carry out in each test, need to only carry out whithin a period of time primary
Calibration test, therefore test equipment used in calibration test is not included in core test equipment.It can from testing process
To find out, the core equipment for emitting test is receiver, the core equipment of susceptibility test be signal source, power amplifier and
Sensor, same type of test core equipment is identical as test site, so cannot achieve concurrent testing, but different test class
The test core equipment of type does not conflict, and susceptibility class testing can carry out part transmitting class testing completely while progress, is
Concurrent testing provides theoretic possibility.
In order to realize the concurrent testing of more test items, on the basis of traditional EMC test macro, need to increase test money
The multithreading of the management in source and test item such as calls at the contents, specific testing process as indicated with 2:
Step 1: operation test item 1；Select testing time longer test item for test item 1, to test in test item 1
During carry out other testing times shorter test item；
Step 2: judging whether the test resource of test item 1 is occupied；
If: judging result is that the test resource of test item 1 is occupied, continues to judge；
Or judging result is that the test resource of test item 1 does not have occupied, thens follow the steps 3；
Step 3: test item 1 is calibrated；
Step 4: after the completion of calibration, the test resource of release calibration occupancy；
Step 5: test item 1 is tested；
Step 6: after the completion of test item 1 is tested, discharging test resource；
During test item 1 is tested, if there is the request of other test items is using the test resource currently occupied, then send out
Test resource occupied message is sent, sends the message that test resource has discharged after the completion of the test of item 1 to be tested；
Step 7: the test of test item 1 terminates；
Step 8: test item 2,2 institute's test resource in need of planning test item are run using multi-threading；
Step 9: judging whether the test resource of test item 2 is occupied；
If: judging result is that the test resource of test item 2 is occupied, continues to judge, until judging the survey of test item 2
Examination resource do not have it is occupied, then execute step 10；
Or judging result is that the test resource of test item 2 does not have occupied, thens follow the steps 10；
Step 10: test item 2 is calibrated；
Step 11: after the completion of calibration, the test resource of release calibration occupancy；
Step 12: test item 2 is tested；
Step 13: after the completion of test, discharging test resource；
Step 14: the test of test item 2 terminates.
There are many testing standard of electromagnetic compatibility test, each testing standard is divided into several test items again, but as long as being to examine
The same capabilities of core equipment under test, test resource needed for test item is just substantially the same under different testing standards, with GJB151B
For, in order to realize the concurrent testing of more test items, three test items are respectively chosen in transmitting test and susceptibility test, to this
The test resource needed in a little test item test process compares as shown in table 1:
Typical test item test resource demand schedule in table 1GJB151B
As can be seen from the table, as long as test resource needed for two test items does not conflict, then coming from the angle of hardware
It says the concurrent testing that can realize test item, by taking testing time longest RS103 as an example, is carrying out the test up to a couple of days
Cheng Zhong, CS101 and current test item share signal source and power amplifier, and RE102 and current test item share darkroom, so not
Concurrent testing may be implemented, but CE101 does not conflict with CE102 with test resource needed for current test item, it is possible to realize
Concurrent testing saves the testing time, improves testing efficiency.
Certainly, the above description is not a limitation of the present invention, and the present invention is also not limited to the example above, this technology neck
The variations, modifications, additions or substitutions that the technical staff in domain is made within the essential scope of the present invention also should belong to of the invention
Protection scope.
Claims (2)
1. a kind of implementation method of the more test item concurrent testings of EMC Auto-Test System, characterized by the following steps:
Step 1: operation test item 1；Select testing time longer test item for test item 1, so as to the mistake tested in test item 1
Other testing times shorter test item is carried out in journey；
Step 2: judging whether the test resource of test item 1 is occupied；
If: judging result is that the test resource of test item 1 is occupied, continues to judge；
Or judging result is that the test resource of test item 1 does not have occupied, thens follow the steps 3；
Step 3: test item 1 is calibrated；
Step 4: after the completion of calibration, the test resource of release calibration occupancy；
Step 5: test item 1 is tested；
Step 6: after the completion of test item 1 is tested, discharging test resource；
During test item 1 is tested, if there is the request of other test items is using the test resource currently occupied, then survey is sent
Resource occupied message is tried, sends the message that test resource has discharged after the completion of the test of item 1 to be tested；
Step 7: the test of test item 1 terminates；
Step 8: test item 2,2 institute's test resource in need of planning test item are run using multi-threading；
Step 9: judging whether the test resource of test item 2 is occupied；
If: judging result is that the test resource of test item 2 is occupied, continues to judge, until judging the test money of test item 2
Source do not have it is occupied, then execute step 10；
Or judging result is that the test resource of test item 2 does not have occupied, thens follow the steps 10；
Step 10: test item 2 is calibrated；
Step 11: after the completion of calibration, the test resource of release calibration occupancy；
Step 12: test item 2 is tested；
Step 13: after the completion of test, discharging test resource；
Step 14: the test of test item 2 terminates.
2. the implementation method of the more test item concurrent testings of EMC Auto-Test System according to claim 1, feature exist
In: EMC test includes transmitting test and susceptibility test, and each test is divided into multiple test items again；Wherein, emit the survey of test
It is as follows to try process:
Step S11: transmitting test starts；
Step S12: calibration signal is generated by signal source；
Step S13: measured value is read by receiver；
Step S14: calibration is completed；
Step S15: Device under test is captured by sensor and generates signal；
Step S16: measured value is read by receiver；
Step S17: judge whether qualification compared with calibration；
Step S18: release test resource；
Step S19: transmitting test terminates；
The testing process of susceptibility test is as follows:
Step S21: susceptibility test starts；
Step S22: calibration signal is generated by signal source；
Step S23: measured value is read by sensor；
Step S24: calibration is completed；
Step S25: test signal is generated by signal source；
Step S26: measured value is read by sensor；
Step S27: judge whether Device under test works normally；
Step S28: release test resource；
Step S29: susceptibility test terminates.
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| CN110618857A (en) * | 2019-08-14 | 2019-12-27 | 中国电力科学研究院有限公司 | Multitask measurement and control method and resource allocation method for calibration platform |
| CN112415307A (en) * | 2020-11-03 | 2021-02-26 | 北京机电工程研究所 | ATS instrument resource control method for parallel test |
| CN112578259A (en) * | 2019-09-29 | 2021-03-30 | 北京君正集成电路股份有限公司 | Thread scheduling method with data space setting |
| CN114236291A (en) * | 2021-12-20 | 2022-03-25 | 宁波奥克斯电气股份有限公司 | Electromagnetic interference detection device, detection method and computer readable storage medium |
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