CN109709353A - A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point - Google Patents

A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point Download PDF

Info

Publication number
CN109709353A
CN109709353A CN201910031214.8A CN201910031214A CN109709353A CN 109709353 A CN109709353 A CN 109709353A CN 201910031214 A CN201910031214 A CN 201910031214A CN 109709353 A CN109709353 A CN 109709353A
Authority
CN
China
Prior art keywords
iridium
needle point
prepared
electrolyte
preparation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910031214.8A
Other languages
Chinese (zh)
Inventor
郑磊
刘华荣
王学慧
程协
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CETC 38 Research Institute
Original Assignee
CETC 38 Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CETC 38 Research Institute filed Critical CETC 38 Research Institute
Priority to CN201910031214.8A priority Critical patent/CN109709353A/en
Publication of CN109709353A publication Critical patent/CN109709353A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)

Abstract

The present invention discloses the electrochemistry preparation facilities and preparation method of a kind of metal iridium needle point, including etching regulating device, control circuit and electrochemical cell, electrode is placed in electrolyte, the end of iridium wire to be prepared is placed in electrolyte by probe clamp, and the positive and negative anodes of pressure-variable alternating-current voltage source connect to form etched circuit with electrode and probe clamp respectively by control circuit;Etching regulating device adjusts the length dimension that the iridium wire to be prepared protrudes under the liquid level of electrolyte;Effective real-time current value and the connection or disconnection of etched circuit are controlled in control circuit acquisition etched circuit;The terminal that the present invention passes through control circuit control etching, etching voltage break time can be accurately controlled, it is easy to operate, the iridium needle point radius of curvature of preparation is small, it is reproducible, it is easy to get the optimum condition of iridium wire etching, the needle point of preparation is made to keep preferable pattern, and success rate with higher and preferable reproducibility.

Description

A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point
Technical field
The present invention relates to scanning probe preparation technical fields, and in particular to a kind of electrochemistry preparation facilities of metal iridium needle point And preparation method.
Background technique
Iridium wire has high Young's modulus and chemical stability, has wider potential window in the solution, is adapted to Probe as scanning probe microscopy;Iridium needle point, can be with other than the application in scanning probe microscopy field simultaneously Using the fields such as lift-off technology on the scene and Tip-Enhanced Raman Spectroscopy technology, field is had a wide range of applications.
In scanning probe microscopy field, size, shape and the chemical component of probe tip directly affect scanning The quality of probe microscope image, needle point tip is more sharp, shape is more symmetrical, and the quality and resolution ratio of image are higher.Laboratory In more commonly used needle point preparation method have mechanical shearing method and electrochemical etching method, the needle point tip shape that mechanical shearing method obtains Looks are asymmetric, come to the scanning probe microscopy needle point Wrapping belt in subsequent solution difficult;The equipment of electrochemical etching method is simple, It is easy to operate, according to the alive property of institute, and direct current chemical etching method and AC electrochemical etching method can be divided into.However, iridium Wire material is because of its chemical stability height, and required etching voltage is high, etch period is long, no matter is carved using direct current or AC electrochemical The difficulty that erosion method prepares needle point is all larger, is especially difficult to control tip dimensions and shape.
The electrochemical etching method of existing probe tip preparation, generally use two-step method: first electricity consumption chemical etching method obtains song The biggish needle point of rate radius, then fast moving in film etching liquid makes that needle point is more sharp, surface is more smooth.But existing side Two steps in method need to use different electrolyte, and the instrument and equipment being related to is more, and making step is complicated.
In view of the above drawbacks, creator of the present invention obtains the present invention by prolonged research and practice finally.
Summary of the invention
To solve above-mentioned technological deficiency, the technical solution adopted by the present invention is, provides a kind of electrification of metal iridium needle point Preparation facilities, including etching regulating device, control circuit and electrochemical cell are learned, the etching regulating device includes probe clamp; The electrochemical cell includes electrode, iridium wire to be prepared and electrolyte;The electrode is placed in the electrolyte, the Probe clip Tool clamps the iridium wire to be prepared and the end of the iridium wire to be prepared is placed in the electrolyte, pressure-variable alternating-current voltage source Positive and negative anodes connect with the electrode and the probe clamp respectively by the control circuit and to form etched circuit;The etching Regulating device controls the height of the probe clamp to adjust the length that the iridium wire to be prepared protrudes under the liquid level of electrolyte Spend size;The control circuit acquires effective real-time current value in the etched circuit and controls the connection of the etched circuit Or it disconnects.
Preferably, the control circuit includes upper computer control module, relay module, signal acquisition module and leads to Believe interface;The relay module and the signal acquisition module access the etched circuit, the relay module control Make the connection and disconnection of the etched circuit;The signal acquisition module acquires effective electricity in real time in the etched circuit Flow valuve;The relay module and the signal acquisition module pass through the communication interface and the PC control mould Block connection.
Preferably, the etching regulating device further includes L-type support, manual slide unit, working plate;Equipped with the electrolyte Container is arranged on the working plate, and the probe clamp is arranged in the L-type support, and the L-type support passes through the hand Dynamic slide unit is arranged on the working plate, and the manual slide unit is provided with micrometer head, and the hand is adjusted by the micrometer head Dynamic height and position of the slide unit on the working plate.
Preferably, a kind of electrochemistry preparation facilities using the metal iridium needle point carries out the preparation side of metal iridium needle point Method, including step;
S1 configures the electrolyte;
S2 pours into the electrolyte in the container, and the probe clamp for being fixed with the iridium wire to be prepared is consolidated Determine onto the manual slide unit, adjusts the micrometer head, the end of the iridium wire to be prepared is immersed to the liquid level of the electrolyte Under;
S3, the positive and negative polarities of the pressure-variable alternating-current voltage source are respectively arranged with the connection with electrode holder and switch and lead Line, by the electrode holder by the positive and negative polarities of the pressure-variable alternating-current voltage source respectively with the probe clamp and the electrode Connection;
S4 opens the pressure-variable alternating-current voltage source, adjusts the voltage parameter of the etched circuit, starts the connection and leads The switch on line, to carry out electrochemical etching until the end of the iridium wire to be prepared is formed initial iridium needle point;
S5 is processed by shot blasting the initial iridium needle point;
S6 after the polishing treatment, disconnects the switch;
S7 adjusts the micrometer head, and the iridium wire to be prepared is made to be fully removed the electrolyte;
S8 collects the iridium wire needle point of the iridium wire end to be prepared and is carried out with distilled water and alcohol to the iridium wire needle point Cleaning.
Preferably, the alternating voltage virtual value of the initial etched circuit is set as 30V~40V in the step S4, when When the diameter of the iridium wire to be prepared is reduced to a quarter of initial diameter, the alternating voltage virtual value of the etched circuit is set It is set to 20V.
Preferably, when the voltage value of the etched circuit is fixed, with iridium wire end to be prepared described in the electrolyte The progress of etching passes through the host computer along with the continuous diminution of iridium wire diameter to be prepared described under the liquid level of electrolyte The etched circuit real-time current value of control module observation is gradually reduced, and is judged by the real-time current value described to be prepared The diameter change of iridium wire.
Preferably, chopping current value is set in the upper computer control module, when the iridium wire to be prepared starts etching, The real-time current value is compared by the upper computer control module with the chopping current value, when judging the real-time current When value is lower than the chopping current value, the relay module on the etched circuit receives the upper computer control module The cutting order of sending quickly cuts off the ac voltage signal that the pressure-variable alternating-current voltage source provides, thus by the electrification Etching process is learned to stop and form the initial iridium needle point.
Preferably, the step S5 is to adjust the micrometer head, the iridium wire to be prepared is moved up until the initial iridium Needle point largely removes the liquid level of the electrolyte, and the initial iridium needle point protrudes into the subsurface length dimension of the decomposed solution and sets It is set to 0.1mm~0.2mm.
Preferably, restarting the control circuit, the alternating voltage of the etched circuit is set as 1V, to the decomposed solution The interior initial iridium needle point continues fine polishing;Set pre-set current value, when the upper computer control module monitor it is described When real-time current value is lower than the pre-set current value, the etched circuit is cut off by the relay module, to obtain iridium Silk needle point.
Preferably, restarting the control circuit, the alternating voltage of the etched circuit is set as 1V, to the decomposed solution The interior initial iridium needle point continues fine polishing;Default polishing time is set, when the upper computer control module monitors institute It states after the polishing treatment time reaches the default polishing time, the etched circuit is cut off by the relay module, thus Obtain iridium wire needle point.
The beneficial effects of the present invention are the ends that: the present invention passes through control circuit control etching compared with the prior art Point can be accurately controlled etching voltage break time, and easy to operate, the iridium needle point radius of curvature of preparation is small, reproducible, hold The optimum condition for easily obtaining iridium wire etching makes the needle point of preparation keep preferable pattern, and success rate with higher and preferably Reproducibility.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the electrochemistry preparation facilities of metal iridium needle point of the present invention;
Fig. 2 is the process schematic of step s4 in the preparation method of metal iridium needle point of the present invention;
Fig. 3 is the process schematic of step S5 in the preparation method of metal iridium needle point of the present invention;
Fig. 4 is the scanning electron microscope master drawing of the iridium wire needle point obtained.
Digital representation in figure:
1-L type bracket;The manual slide unit of 2-;3- working plate;4- probe clamp;5- control circuit;6- pressure-variable alternating voltage Source;7- upper computer control module;8- relay module;9- signal acquisition module;10- communication interface;11- electrode;12- is waited for Prepare iridium wire;13- container;14- electrolyte.
Specific embodiment
Below in conjunction with attached drawing, the forgoing and additional technical features and advantages are described in more detail.
Embodiment one
As shown in FIG. 1, FIG. 1 is the structural schematic diagrams of the electrochemistry preparation facilities of metal iridium needle point of the present invention.It is described The electrochemistry preparation facilities of metal iridium needle point includes etching regulating device, control circuit and electrochemical cell, and the etching adjusts dress It sets including L-type support 1, manual slide unit 2, working plate 3 and probe clamp 4;The control circuit 5 includes pressure-variable alternating-current voltage source 6, upper computer control module 7, relay module 8, signal acquisition module 9 and communication interface 10;The electrochemical cell includes Electrode 11, iridium wire to be prepared 12, container 13 and electrolyte 14.
The electrolyte 14 is arranged in the container 13, and the electrode 11 is placed in the electrolyte 14, the spy Needle fixture 4 clamps the iridium wire to be prepared 12 and is placed in the electrolyte 14, the positive and negative anodes of the pressure-variable alternating-current voltage source 6 It is connect respectively with the electrode 11 and the probe clamp 4 by the control circuit 5, to form etched circuit.
The container 13 equipped with the electrolyte 14 is arranged on the working plate 3, and the probe clamp 4 is arranged in institute It states in L-type support 1, the L-type support 1 is arranged on the working plate 3 by the manual slide unit 2, and the manual slide unit 2 is set It is equipped with micrometer head, height and position of the manual slide unit 2 on the working plate 3 is adjusted by the micrometer head, to adjust It saves the iridium wire to be prepared 12 and protrudes into the subsurface length dimension of the electrolyte 14.
The relay module 8 and the signal acquisition module 9 access the etched circuit, the relay module The connection and disconnection of the 8 control etched circuits;The signal acquisition module 9 acquires effective real in the etched circuit When current value;The relay module 8 and the signal acquisition module 9 by the communication interface 10 with it is described upper Machine control module 7 connects.
Specifically, the pressure-variable alternating-current voltage source 6 generates alternating voltage and loads in the electrode 11 and the probe On fixture 4, to generate 0 to 300mA or so etching electric current in the electrochemical cell.Using the high-precision AC signal Acquisition module 9 acquires effective real-time current value in the etched circuit, and passes through the communication interface 10 and the host computer Control module 7 carries out data communication, and the upper computer control module 7 is according to the real-time current value real-time display of acquisition Current waveform in etched circuit.
Preferably, chopping current value is arranged in the upper computer control module 7, when the signal acquisition module 9 When real-time current value in the collected etched circuit meets condition, the relay in the control circuit 5 is set Device module 8 receives cutting order, quickly cuts off the ac voltage signal that the pressure-variable alternating-current voltage source 6 provides.
The technical scheme is that preparing iridium wire needle point using AC electrochemical etching method, pass through the control circuit 5 The terminal for controlling etching can be accurately controlled etching voltage break time, easy to operate, the iridium needle point radius of curvature of preparation It is small, it is reproducible, it is easy to get the optimum condition of iridium wire etching, so that the needle point of preparation is kept preferable pattern, and have higher Success rate and preferable reproducibility.
Embodiment two
The preparation method of metal iridium needle point of the present invention, specifically includes step;
S1 configures the electrolyte 14;
S2 pours into the electrolyte 14 in the container 13, will be fixed with the probe of the iridium wire to be prepared 12 Fixture 4 is fixed on the manual slide unit 2, adjusts the micrometer head, and the electricity is immersed in the end of the iridium wire 12 to be prepared Under the liquid level for solving liquid 14;
S3, the positive and negative polarities of the pressure-variable alternating-current voltage source 6 are respectively arranged with the connection with electrode holder and switch and lead Line, by the electrode holder by the positive and negative polarities of the pressure-variable alternating-current voltage source 6 respectively with the probe clamp 4 and the electricity Pole 11 connects;
S4 opens the pressure-variable alternating-current voltage source 6, adjusts the voltage parameter of the etched circuit, starts the connection The switch on conducting wire, to carry out electrochemical etching until the end of the iridium wire 12 to be prepared is formed initial iridium needle Point;
S5 is processed by shot blasting the initial iridium needle point;
S6 after the polishing treatment, disconnects the switch;
S7 adjusts the micrometer head, and the iridium wire to be prepared 12 is made to be fully removed the electrolyte 14;
S8, collect the iridium wire needle point of 12 end of iridium wire to be prepared and with distilled water and alcohol to the iridium wire needle point into Row cleaning.
In step sl, specifically, a certain amount of CaCl that will be weighed in the balance2Powder pours into beaker, then with measuring cup amount A certain amount of deionized water is taken, by CaCl2Powder and deionized water mixed configuration are saturated CaCl2Solution, the saturation CaCl2It is molten Liquid is the electrolyte 14.
As shown in Fig. 2, Fig. 2 is the process schematic of step S4 in the preparation method of metal iridium needle point of the present invention;Institute It states in step S4, when the voltage value of the etched circuit is fixed, with 12 end of iridium wire to be prepared described in the electrolyte 14 The progress of portion's etching, the upper computer control module 7 acquire the electricity of the etched circuit by the signal acquisition module 9 Stream signal simultaneously shows effective real-time current value, not along with 12 diameter of iridium wire to be prepared described under 14 liquid level of electrolyte It is disconnected to reduce, it is gradually reduced by the real-time current value that the upper computer control module 7 can observe the etched circuit;It is logical Cross the diameter change that the real-time current value judges the iridium wire to be prepared.
Preferably, the alternating voltage virtual value of the initial etched circuit may be configured as between 30V~40V, when it is described to Prepare iridium wire 12 diameter reduce be about original diameter a quarter when, the etched circuit alternating voltage virtual value setting more It is changed to 20V.The original diameter, that is, iridium wire 12 to be prepared initial diameter, it is described specially before being put into the electrolyte 14 The diameter of iridium wire 12 to be prepared.
Chopping current value is set in the upper computer control module 7, it is described when the iridium wire 12 to be prepared starts etching The real-time current value is compared by upper computer control module 7 with the chopping current value, when judging the real-time current value When lower than the chopping current value, the relay module 8 on the etched circuit receives the upper computer control module 7 The cutting order of sending quickly cuts off the ac voltage signal that the pressure-variable alternating-current voltage source 6 provides, thus by the electrification Etching process is learned to stop being formed and the initial iridium needle point.
Fig. 3 is the process schematic of step S5 in the preparation method of metal iridium needle point of the present invention;Step S5 specifically, The micrometer head is adjusted, the iridium wire 12 to be prepared is moved up until the initial iridium needle point largely removes the electrolyte 14 Liquid level;Preferably, retaining the part initial iridium needle point under the decomposed solution liquid level, the initial iridium needle point protrudes into described The subsurface length dimension L of decomposed solution is about set as 0.1mm~0.2mm.
Restart the control circuit 5, the alternating voltage of the etched circuit is set as 1V, to the institute in the decomposed solution It states initial iridium needle point and continues fine polishing;Pre-set current value and default polishing time are set, when the upper computer control module 7 is supervised When measuring the real-time current value lower than the pre-set current value or the polishing treatment time reaches the default polishing time Afterwards, the etched circuit is cut off by the relay module 8, to obtain sharp iridium wire needle point.The pre-set current value With the default polishing time best practices value can be obtained by repeating experiment several times.As shown in figure 4, Fig. 4 is the described of acquisition The scanning electron microscope master drawing of iridium wire needle point.
The present invention have preparation method is simple and convenient to operate, preparation cost is cheap, high yield rate, high repeatability and other advantages, The iridium wire needle point of the minimum 5nm of front end radius of curvature can be made, can be applied to scanning probe microscopy and field emission electron Source.
The foregoing is merely presently preferred embodiments of the present invention, is merely illustrative for the purpose of the present invention, and not restrictive 's.Those skilled in the art understand that in the spirit and scope defined by the claims in the present invention many changes can be carried out to it, It modifies or even equivalent, but falls in protection scope of the present invention.

Claims (10)

1. a kind of electrochemistry preparation facilities of metal iridium needle point, which is characterized in that including etching regulating device, control circuit and electricity Chemical bath, the etching regulating device includes probe clamp;The electrochemical cell includes electrode, iridium wire to be prepared and electrolyte; The electrode is placed in the electrolyte, and the probe clamp clamps the iridium wire to be prepared for the end of the iridium wire to be prepared Portion is placed in the electrolyte, the positive and negative anodes of pressure-variable alternating-current voltage source by the control circuit respectively with the electrode and The probe clamp connects to form etched circuit;The etching regulating device controls the height of the probe clamp to adjust institute State the length dimension that iridium wire to be prepared protrudes under the liquid level of electrolyte;The control circuit acquires in the etched circuit effectively Real-time current value and control the connection or disconnection of the etched circuit.
2. the electrochemistry preparation facilities of metal iridium needle point as described in claim 1, which is characterized in that the control circuit includes Upper computer control module, relay module, signal acquisition module and communication interface;The relay module is exchanged with described Signal acquisition module accesses the etched circuit, and the relay module controls the connection and disconnection of the etched circuit;It is described Signal acquisition module acquires effective real-time current value in the etched circuit;The relay module exchanges letter with described Number acquisition module is connect by the communication interface with the upper computer control module.
3. the electrochemistry preparation facilities of metal iridium needle point as described in claim 1, which is characterized in that the etching regulating device It further include L-type support, manual slide unit, working plate;Container equipped with the electrolyte is arranged on the working plate, the probe Fixture is arranged in the L-type support, and the L-type support is arranged on the working plate by the manual slide unit, the hand Dynamic slide unit is provided with micrometer head, and height and position of the manual slide unit on the working plate is adjusted by the micrometer head.
4. a kind of preparation side of the electrochemistry preparation facilities using metal iridium needle point as claimed in any one of claims 1-3 Method, which is characterized in that including step;
S1 configures the electrolyte;
S2 pours into the electrolyte in the container, and the probe clamp for being fixed with the iridium wire to be prepared is fixed to On the manual slide unit, the micrometer head is adjusted, the end of the iridium wire to be prepared is immersed under the liquid level of the electrolyte;
S3, the positive and negative polarities of the pressure-variable alternating-current voltage source are respectively arranged with the connecting wire with electrode holder and switch, lead to The electrode holder is crossed to connect the positive and negative polarities of the pressure-variable alternating-current voltage source with the probe clamp and the electrode respectively;
S4 opens the pressure-variable alternating-current voltage source, adjusts the voltage parameter of the etched circuit, starts in the connecting wire The switch, to carry out electrochemical etching until the end of the iridium wire to be prepared formed initial iridium needle point;
S5 is processed by shot blasting the initial iridium needle point;
S6 after the polishing treatment, disconnects the switch;
S7 adjusts the micrometer head, and the iridium wire to be prepared is made to be fully removed the electrolyte;
S8 collects the iridium wire needle point of the iridium wire end to be prepared and is carried out clearly with distilled water and alcohol to the iridium wire needle point It washes.
5. preparation method as claimed in claim 3, which is characterized in that in the step S4, the friendship of the initial etched circuit Stream voltage effective value is set as 30V~40V, when the diameter of the iridium wire to be prepared is reduced to a quarter of initial diameter, The alternating voltage virtual value of the etched circuit is set as 20V.
6. preparation method as claimed in claim 5, which is characterized in that when the voltage value of the etched circuit is fixed, with institute The progress of the iridium wire end etching to be prepared in electrolyte is stated, it is straight along with iridium wire to be prepared described under the liquid level of electrolyte The continuous diminution of diameter is gradually reduced by the etched circuit real-time current value that the upper computer control module is observed, is passed through The real-time current value judges the diameter change of the iridium wire to be prepared.
7. preparation method as claimed in claim 5, which is characterized in that chopping current is arranged in the upper computer control module Value, when the iridium wire to be prepared starts etching, the upper computer control module is by the real-time current value and the chopping current Value is compared, the relay when judging the real-time current value lower than the chopping current value, on the etched circuit Device module receives the cutting order that the upper computer control module issues, and quickly cuts off the pressure-variable alternating-current voltage source and provides Ac voltage signal, so that the electrochemical etching process be stopped and form the initial iridium needle point.
8. preparation method as claimed in claim 3, which is characterized in that the step S5 is to adjust the micrometer head, will be described Iridium wire to be prepared moves up until the initial iridium needle point largely removes the liquid level of the electrolyte, and the initial iridium needle point protrudes into The subsurface length dimension of decomposed solution is set as 0.1mm~0.2mm.
9. preparation method as claimed in claim 8, which is characterized in that restart the control circuit, the etched circuit Alternating voltage is set as 1V, continues fine polishing to the initial iridium needle point in the decomposed solution;Pre-set current value is set, when When the upper computer control module monitors the real-time current value lower than the pre-set current value, pass through the relay module The etched circuit is cut off, to obtain iridium wire needle point.
10. preparation method as claimed in claim 8, which is characterized in that restart the control circuit, the etched circuit Alternating voltage is set as 1V, continues fine polishing to the initial iridium needle point in the decomposed solution;Default polishing time is set, After the upper computer control module monitors that the polishing treatment time reaches the default polishing time, pass through the relay Device module cuts off the etched circuit, to obtain iridium wire needle point.
CN201910031214.8A 2019-01-11 2019-01-11 A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point Pending CN109709353A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910031214.8A CN109709353A (en) 2019-01-11 2019-01-11 A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910031214.8A CN109709353A (en) 2019-01-11 2019-01-11 A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point

Publications (1)

Publication Number Publication Date
CN109709353A true CN109709353A (en) 2019-05-03

Family

ID=66260124

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910031214.8A Pending CN109709353A (en) 2019-01-11 2019-01-11 A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point

Country Status (1)

Country Link
CN (1) CN109709353A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110333371A (en) * 2019-06-21 2019-10-15 武汉科技大学 A kind of gold nano-probe preparation facilities and preparation method thereof
CN111190032A (en) * 2020-01-08 2020-05-22 中国科学院力学研究所 Atomic force probe preparation device and method and atomic force probe

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU787145A1 (en) * 1978-08-14 1980-12-15 Предприятие П/Я В-2892 Electrochemical treatment method
WO2006041691A2 (en) * 2004-10-06 2006-04-20 The Regents Of The University Of California Improved nanotube-based nanoprobe structure and method for making the same
EP1655265A3 (en) * 2004-10-09 2007-10-24 Academia Sinica Single-atom tip and preparation method thereof
CN101118789A (en) * 2007-07-31 2008-02-06 厦门大学 Method for manufacturing platinum-iridium needlepoint and device thereof
CN101701352A (en) * 2008-12-15 2010-05-05 中国矿业大学(北京) Method for preparing high-resolution emitter tungsten tip and device thereof
US20100155253A1 (en) * 2002-05-07 2010-06-24 Microfabrica Inc. Microprobe Tips and Methods for Making
CN203479833U (en) * 2013-09-30 2014-03-12 贵州大学 Modification device for pure metal probe of scanning tunnel microscope
CN104785871A (en) * 2015-04-17 2015-07-22 清华大学深圳研究生院 Probe manufacturing method and device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU787145A1 (en) * 1978-08-14 1980-12-15 Предприятие П/Я В-2892 Electrochemical treatment method
US20100155253A1 (en) * 2002-05-07 2010-06-24 Microfabrica Inc. Microprobe Tips and Methods for Making
WO2006041691A2 (en) * 2004-10-06 2006-04-20 The Regents Of The University Of California Improved nanotube-based nanoprobe structure and method for making the same
EP1655265A3 (en) * 2004-10-09 2007-10-24 Academia Sinica Single-atom tip and preparation method thereof
CN101118789A (en) * 2007-07-31 2008-02-06 厦门大学 Method for manufacturing platinum-iridium needlepoint and device thereof
CN101701352A (en) * 2008-12-15 2010-05-05 中国矿业大学(北京) Method for preparing high-resolution emitter tungsten tip and device thereof
CN203479833U (en) * 2013-09-30 2014-03-12 贵州大学 Modification device for pure metal probe of scanning tunnel microscope
CN104785871A (en) * 2015-04-17 2015-07-22 清华大学深圳研究生院 Probe manufacturing method and device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110333371A (en) * 2019-06-21 2019-10-15 武汉科技大学 A kind of gold nano-probe preparation facilities and preparation method thereof
CN111190032A (en) * 2020-01-08 2020-05-22 中国科学院力学研究所 Atomic force probe preparation device and method and atomic force probe

Similar Documents

Publication Publication Date Title
Merrill et al. Glass-coated platinum-plated tungsten microelectrodes
Levick Another tungsten microelectrode
CN105203607B (en) A kind of preparation method of carbon fibre ultramicro-electrode
CN109709353A (en) A kind of the electrochemistry preparation facilities and preparation method of metal iridium needle point
CN108169518B (en) Preparation system for needle tip of morphology-controllable scanning tunnel microscope
CN104785871B (en) A kind of preparation method of probe and preparation facilitiess
CN105301288B (en) A kind of device and method preparing metal needle point
CN102901846B (en) The device and method of preparation metal needle point
CN102339704A (en) Alternating-current electrochemical corrosion method of field emission electron source
CN106370891A (en) Preparation method for scanning probe of scanning tunneling microscope and control circuit
CN108169003B (en) Ampere force-based micro-nano material in-situ mechanical property testing device and method
CN203479833U (en) Modification device for pure metal probe of scanning tunnel microscope
EP0445679B1 (en) Method and apparatus for fabricating electrically conductive probe heads
CN116695230A (en) Preparation device and method for high-deflection micro-shovel structure metal needle tip and electrode
CN100527285C (en) Method for manufacturing platinum-iridium needlepoint and device thereof
CN107515316B (en) Device and method for etching needle tip of scanning tunnel microscope
CN206177991U (en) Scanning tunnel microscope scanning probe's control circuit
Liu et al. Investigation of electrochemical nanostructuring with ultrashort pulses by using nanoscale electrode
CN113341179B (en) Device and method for preparing scanning tunnel microscope needle tip based on liquid film electrochemical corrosion
CN206876728U (en) Producing device for the extraordinary probe of needlepoint type scanning micro-measurement apparatus
CN204287230U (en) A kind of needle tip of scanning tunnel microscope corrosion tester
RU2389033C2 (en) Method of making needles for scanning tunnel microscopy
CN113073376B (en) Application of corrosion powder in shaping platinum probe and shaping method of platinum probe
CN107102174A (en) A kind of preparation method for the extraordinary probe that micro-measurement apparatus is scanned for needlepoint type
Cabrera et al. Micro EDM milling with electrochemical fabrication of ultra-thin microtools and mapping of electrical microdischarges

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20190503

RJ01 Rejection of invention patent application after publication