CN109683659A - Real-time clock chip system with self-checking function and checking method thereof - Google Patents
Real-time clock chip system with self-checking function and checking method thereof Download PDFInfo
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- CN109683659A CN109683659A CN201711007385.4A CN201711007385A CN109683659A CN 109683659 A CN109683659 A CN 109683659A CN 201711007385 A CN201711007385 A CN 201711007385A CN 109683659 A CN109683659 A CN 109683659A
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- 238000000034 method Methods 0.000 title claims description 11
- 238000001514 detection method Methods 0.000 claims abstract description 52
- 238000012545 processing Methods 0.000 claims abstract description 30
- 239000013078 crystal Substances 0.000 claims abstract description 28
- 238000004891 communication Methods 0.000 claims abstract description 19
- 230000002159 abnormal effect Effects 0.000 claims abstract description 7
- 238000012360 testing method Methods 0.000 claims description 109
- 230000005856 abnormality Effects 0.000 claims description 6
- 230000005611 electricity Effects 0.000 claims description 2
- 238000007689 inspection Methods 0.000 claims description 2
- 238000012512 characterization method Methods 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 6
- 238000012423 maintenance Methods 0.000 description 3
- 235000013399 edible fruits Nutrition 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 238000011895 specific detection Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
- G06F1/14—Time supervision arrangements, e.g. real time clock
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
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- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
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Abstract
The invention provides a real-time clock chip system with a self-checking function and a detection method thereof. The real-time clock chip system with the self-checking function comprises a real-time clock chip, a battery circuit, a crystal oscillator circuit and a central processing unit, wherein the central processing unit is provided with a detection module, the detection module is used for detecting the state of the real-time clock chip system, the central processing unit is in communication connection with the real-time clock chip through a communication data bus, and the real-time clock chip is respectively electrically connected with the battery circuit and the crystal oscillator circuit. By adopting the technical scheme of the invention, the faults of the real-time clock chip and the circuit thereof can be rapidly, accurately and comprehensively detected, the detection efficiency is high, the detection cost is low, and the communication of the real-time clock chip, the battery circuit, the crystal oscillator circuit and the real-time clock chip can be rapidly and accurately detected whether the real-time clock chip is abnormal or not through one-time detection, so that the comprehensiveness of the detection of the real-time clock chip system and the working efficiency of the detection are improved, and the detection efficiency of the hardware circuit board of the electronic product is further improved.
Description
Technical field
The invention belongs to electronic component and its detection technique fields, and in particular to when a kind of real-time with self-checking function
Clock chip system and its detection method.
Background technique
Currently, electronic product just towards digitlization and intelligent direction stride forward, electronic product hardware circuit board production and assembly,
When factory testing and product maintenance are overhauled, need in hardware circuit board each device or circuit detected and arranged one by one
It looks into.Wherein, real-time timepiece chip (Real Time Clock, RTC) and its circuit as the important composition in hardware circuit board it
One, in debugging or maintenance, it is also desirable to be detected to it.The conventional side that real-time timepiece chip and its circuit are detected
Method generallys use hardware circuit test, increases test point in the circuit board, by its electrical performance indexes of instrument manual test, with
Judge whether its qualification；Or tested using software, RTC time is read or be arranged, if setting or reading are correct, that is, is sentenced
It is normal for breaking；That there are testing efficiencies is low for the above detection mode, needs to increase hardware instruments cost, and testing cost is high, and test is inadequate
The shortcomings that (RTC clock clocking capability not being tested) comprehensively.
Therefore, in order to solve the above problem, the real-time timepiece chip system that the invention discloses a kind of with self-checking function and
Its detection method can be rapidly and accurately to real-time clock core in electronic product production and assembly, factory testing and Maintenance and Repair
Piece and its circuit carry out complete detection, improve detection working efficiency, save testing cost.
Summary of the invention
The embodiment of the present invention provides a kind of real-time timepiece chip system and its detection method with self-checking function, with solution
The problems of certainly existing detection mode is mentioned with rapidly and accurately carrying out complete detection to real-time timepiece chip and its circuit
High detection working efficiency saves testing cost.
In order to achieve the above objectives, the embodiment provides a kind of real-time timepiece chip system with self-checking function
System, comprising: real-time timepiece chip, battery circuit and crystal oscillating circuit, which is characterized in that the real-time timepiece chip system further includes
Central processing unit, the central processing unit have detection module, and the detection module is for detecting real-time timepiece chip system
State, the central processing unit and real-time timepiece chip are communicated to connect by communication data bus, the real-time timepiece chip point
It is not electrically connected with battery circuit and crystal oscillating circuit.
Further, the state of the real-time timepiece chip system includes: that central processing unit is communicated with real-time timepiece chip
Whether normal, and/or battery circuit whether normal, and/or crystal oscillating circuit whether normal, and/or real-time timepiece chip system is
No normal state.
Further, the detection module includes:
Characteristic value writing module, for characteristic value to be written to real-time timepiece chip in real-time timepiece chip system electrification
Data register in；
Characteristic value read module, for reading the characteristic value in real-time timepiece chip data register；
Time acquisition module, for acquiring the real-time timepiece chip time at interval of a unit time；
Testing result generation module was used for according to read characteristic value and/or real-time timepiece chip time collected,
Generate the testing result for characterizing real-time timepiece chip system mode.
Further, the unit time is 0.000001~100 second；
Preferably, the unit time is 1 second.
Further, the testing result generation module includes:
First testing result generation unit, for being to generate according to the judgement that whether can be normally read to characteristic value
Normal testing result is communicated with real-time timepiece chip for characterizing central processing unit；Otherwise it generates for characterizing central processing unit
With the testing result of real-time timepiece chip communication abnormality；
Whether the second testing result generation unit correctly judges the characteristic value read for basis, is then raw
At for characterizing the normal testing result of battery circuit；Otherwise the testing result for characterizing battery circuit exception is generated；
Third testing result generation unit, for according to the real-time timepiece chip time collected in a period of time whether
It for the judgement being increased continuously, is to generate for characterizing crystal oscillating circuit and the normal testing result of real-time timepiece chip；Otherwise it gives birth to
At the testing result for characterizing crystal oscillating circuit and/or real-time timepiece chip exception.
Further, a period of time in the third testing result generation unit is at least 1 second.Preferably, described
A period of time in three testing result generation units is at least 5 seconds.
Optionally, a period of time in the third testing result generation unit is 5 seconds.
Further, the testing result generation module further include:
4th testing result generation unit, if for raw according to the first testing result generation unit, the second testing result
When generating normal testing result at unit and third testing result generation unit, then generate for characterizing real-time timepiece chip
The normal testing result of system；If the first testing result generation unit, the second testing result generation unit and third detection knot
When any testing result generation unit generates abnormal testing result in fruit generation unit, then generate for characterizing real-time clock core
The testing result of piece system exception.
Optionally, the real-time timepiece chip system further include: alarm module, if for generate central processing unit and it is real-time when
Clock chip communication exception, and/or battery circuit exception, and/or crystal oscillating circuit exception, and/or real-time timepiece chip it is abnormal and/
Or real-time timepiece chip system exception testing result when, then carry out warning note.
According to another aspect of the present invention, the embodiment of the present invention also provides a kind of real-time timepiece chip system detection side
Method, comprising:
Real-time timepiece chip system electrification, characteristic value is written in the data register of real-time timepiece chip；
Real-time timepiece chip system re-powers, and reads the characteristic value in the data register of real-time timepiece chip；
Judge whether normally read characteristic value, be, generates logical for characterizing central processing unit and real-time timepiece chip
Believe normal testing result；Otherwise the testing result for characterizing central processing unit Yu real-time timepiece chip communication abnormality is generated；
Judge whether the characteristic value read is correct, is, generates for characterizing the normal testing result of battery circuit；It is no
Then generate the testing result for characterizing battery circuit exception；
The real-time timepiece chip time is acquired at interval of a unit time；
Judge whether real-time timepiece chip time collected is to be increased continuously in a period of time, is, generates for characterizing
Crystal oscillating circuit and the normal testing result of real-time timepiece chip；Otherwise it generates for characterizing crystal oscillating circuit and/or real-time clock core
The testing result of piece exception.
Further, the unit time is 0.000001~100 second.
Preferably, the unit time is 1 second.
Further, described a period of time is at least 1 second.
Preferably, described a period of time is at least 5 seconds.
Optionally, described a period of time is 5 seconds.
Real-time timepiece chip system and its detection method provided in an embodiment of the present invention with self-checking function, beneficial effect
Are as follows: solve the problems, such as that conventional detection is incomplete to real-time timepiece chip and its circuit detection；Solving conventional detection cannot be quasi-
The problem of true positioning failure；Solves the problems, such as conventional detection low efficiency and at high cost；The present invention program can quick and precisely and
The failure of real-time timepiece chip and its circuit is comprehensively detected, detection efficiency is high, and testing cost is low, and disposable detection can be quick
Accurately real-time timepiece chip communication, battery circuit, crystal oscillating circuit, real-time timepiece chip are detected with the presence or absence of abnormal,
And can specific detection system each section, improve the working efficiency of the comprehensive of real-time timepiece chip system detection and detection, into
One step improves the detection efficiency to electronic product hardware circuit board.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described.It should be evident that the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
Other attached drawings are obtained according to these figures.
Fig. 1 is the structural block diagram of the real-time timepiece chip system with self-checking function of the embodiment of the present invention one；
Fig. 2 is the structural block diagram of the real-time timepiece chip system with self-checking function of the embodiment of the present invention two；
Fig. 3 is the structural block diagram of the real-time timepiece chip system with self-checking function of the embodiment of the present invention three；
Fig. 4 is the step flow chart of the real-time timepiece chip system detecting method of the embodiment of the present invention four.
Specific embodiment
(identical label indicates identical element in several attached drawings) has the embodiment of the present invention with reference to the accompanying drawing
The real-time timepiece chip system and its detection method of self-checking function are described in detail.
Embodiment one
Fig. 1 is the structural block diagram of the real-time timepiece chip system with self-checking function of the embodiment of the present invention one.
As shown in Figure 1, this has the real-time timepiece chip system of self-checking function, including real-time timepiece chip 1, battery circuit
2, crystal oscillating circuit 3 and central processing unit 4, the central processing unit 4 have detection module 41, and the detection module 41 is for detecting
The state of real-time timepiece chip system, the central processing unit 4 pass through communication data bus communication link with real-time timepiece chip 1
It connects, the real-time timepiece chip 1 is electrically connected with battery circuit 2 and crystal oscillating circuit 3 respectively.
Further, the state of the real-time timepiece chip system includes: that central processing unit 4 and real-time timepiece chip 1 are logical
Whether letter normal, and/or battery circuit 2 whether normal, and/or crystal oscillating circuit 3 whether normal, and/or real-time timepiece chip system
System whether normal state.
Further, the detection module 41 includes:
Characteristic value writing module 411, for characteristic value to be written to real-time clock in real-time timepiece chip system electrification
In the data register of chip；
Characteristic value read module 412, for reading the characteristic value in real-time timepiece chip data register；
Time acquisition module 413, for acquiring the real-time timepiece chip time at interval of a unit time；When the unit
Between be 0.000001~100 second；Preferably, the unit time is 1 second.
Testing result generation module 414, when for according to read characteristic value and/or real-time timepiece chip collected
Between, generate the testing result for characterizing real-time timepiece chip system mode.
Further, the testing result generation module 414 includes:
First testing result generation unit 4141, for being then according to the judgement that whether can be normally read to characteristic value
It generates and communicates normal testing result with real-time timepiece chip for characterizing central processing unit；Otherwise it generates for characterizing centre
Manage the testing result of device and real-time timepiece chip communication abnormality；
Whether the second testing result generation unit 4142 correctly judges the characteristic value read for basis, is
Then generate for characterizing the normal testing result of battery circuit；Otherwise the testing result for characterizing battery circuit exception is generated；
Third testing result generation unit 4143, for according to the real-time timepiece chip time collected in a period of time
Whether it is the judgement being increased continuously, is, generates for characterizing crystal oscillating circuit and the normal testing result of real-time timepiece chip；It is no
Then generate the testing result for characterizing crystal oscillating circuit and/or real-time timepiece chip exception；The third testing result generates single
A period of time in member is at least 1 second；Preferably, a period of time in the third testing result generation unit is at least 5 seconds；
Optionally, a period of time in the third testing result generation unit is 5 seconds.
Embodiment two
Fig. 2 is the structural block diagram of the real-time timepiece chip system with self-checking function of the embodiment of the present invention two.
As shown in Fig. 2, being indicated with identical part in embodiment illustrated in fig. 1 one using identical appended drawing reference.Under
Face is only illustrated difference, and in the present embodiment, this has the real-time timepiece chip system of self-checking function, further,
The testing result generation module 414 further include:
4th testing result generation unit 4144, if for being examined according to the first testing result generation unit 4141, second
When survey result generation unit 4142 and third testing result generation unit 4143 generate normal testing result, then generates and be used for
Characterize the normal testing result of real-time timepiece chip system；If the first testing result generation unit 4141, the second testing result
Any testing result generation unit generates abnormal detection knot in generation unit 4142 and third testing result generation unit 4143
When fruit, then the testing result for characterizing real-time timepiece chip system exception is generated.
Embodiment three
Fig. 3 is the structural block diagram of the real-time timepiece chip system with self-checking function of the embodiment of the present invention three.
As shown in figure 3, with identical part in embodiment illustrated in fig. 1 one and embodiment illustrated in fig. 2 two using identical attached
Icon note is indicated.Only difference is illustrated below, in the present embodiment, this has the real-time clock core of self-checking function
Piece system, further, the real-time timepiece chip system further include: alarm module 5, if for generation central processing unit 4 and in fact
When 1 communication abnormality of clock chip, and/or 2 exception of battery circuit, and/or 3 exception of crystal oscillating circuit, and/or real-time timepiece chip 1
When exception, and/or the testing result of real-time timepiece chip system exception, then warning note is carried out.
Example IV
Fig. 4 is the step flow chart of the real-time timepiece chip system detecting method of the embodiment of the present invention four.The present embodiment
Method, can be executed by the equipment arbitrarily with corresponding processing function, include but is not limited to be set to central processing unit.
As shown in figure 4, the real-time timepiece chip system detecting method of the present embodiment, comprising:
Step 401: characteristic value is written to the data register of real-time timepiece chip by real-time timepiece chip system electrification
In；
Step 402: real-time timepiece chip system re-powers, and reads the feature in the data register of real-time timepiece chip
Value；
Step 403: judge whether normally read characteristic value, be, generate for characterize central processing unit and it is real-time when
The normal testing result of clock chip communication；Otherwise the inspection for characterizing central processing unit Yu real-time timepiece chip communication abnormality is generated
Survey result；
Step 404: judging whether the characteristic value read is correct, is, generation is normally detected for characterizing battery circuit
As a result；Otherwise the testing result for characterizing battery circuit exception is generated；
Step 405: acquiring the real-time timepiece chip time at interval of a unit time；
Step 406: judging whether real-time timepiece chip time collected is to be increased continuously in a period of time, is to generate
For characterizing crystal oscillating circuit and the normal testing result of real-time timepiece chip；Otherwise it generates for characterizing crystal oscillating circuit and/or reality
When clock chip exception testing result；
Step 407: terminating detection.
Further, the unit time described in step 405 is 0.000001~100 second；Preferably, the unit time
To be 1 second.
Further, described in step 406 for a period of time it is at least 1 second；Preferably, described a period of time is at least 5 seconds；
Optionally, described a period of time is 5 seconds.
Real-time timepiece chip system and its detection method provided in an embodiment of the present invention with self-checking function solves often
Rule detection detects incomplete problem to real-time timepiece chip and its circuit；Failure cannot be accurately positioned by solving conventional detection
Problem；Solves the problems, such as conventional detection low efficiency and at high cost；The present invention program can quick and precisely and comprehensively detect reality
When clock chip and its circuit failure, detection efficiency is high, and testing cost is low, and disposable detection can be rapidly and accurately to real-time
Clock chip communication, battery circuit, crystal oscillating circuit, real-time timepiece chip are detected with the presence or absence of abnormal, and can specifically be examined
Examining system each section improves the working efficiency of the comprehensive of real-time timepiece chip system detection and detection, further increases to electricity
The detection efficiency of sub- products-hardware circuit board.
It may be noted that all parts/step described in this application can be split as more multi-section according to the needs of implementation
The part operation of two or more components/steps or components/steps can also be combined into new components/steps by part/step,
To achieve the object of the present invention.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain
Lid is within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (10)
1. the real-time timepiece chip system with self-checking function, including real-time timepiece chip, battery circuit and crystal oscillating circuit, special
Sign is that the real-time timepiece chip system further includes central processing unit, and the central processing unit has detection module, the inspection
The state that module is used to detect real-time timepiece chip system is surveyed, the central processing unit and real-time timepiece chip pass through communication data
Bus communication connection, the real-time timepiece chip are electrically connected with battery circuit and crystal oscillating circuit respectively.
2. real-time timepiece chip system according to claim 1, which is characterized in that the shape of the real-time timepiece chip system
State include: central processing unit communicated with real-time timepiece chip whether normal, and/or battery circuit whether normal, and/or crystal oscillator electricity
Whether road normal, and/or the whether normal state of real-time timepiece chip system.
3. real-time timepiece chip system according to claim 1, which is characterized in that the detection module includes:
Characteristic value writing module, for characteristic value to be written to the number of real-time timepiece chip in real-time timepiece chip system electrification
According in register；
Characteristic value read module, for reading the characteristic value in real-time timepiece chip data register；
Time acquisition module, for acquiring the real-time timepiece chip time at interval of a unit time；
Testing result generation module, for generating according to read characteristic value and/or real-time timepiece chip time collected
For characterizing the testing result of real-time timepiece chip system mode.
4. real-time timepiece chip system according to claim 3, which is characterized in that the unit time be 0.000001~
100 seconds.
5. real-time timepiece chip system according to claim 3, which is characterized in that the testing result generation module packet
It includes:
First testing result generation unit, for being according to the judgement that whether can normally read to characteristic value, generation is used for
Characterization central processing unit communicates normal testing result with real-time timepiece chip；Otherwise it generates for characterizing central processing unit and reality
The testing result of Shi Shizhong chip communication exception；
Whether the second testing result generation unit correctly judges the characteristic value read for basis, is to generate use
In the characterization normal testing result of battery circuit；Otherwise the testing result for characterizing battery circuit exception is generated；
Whether third testing result generation unit is company to the real-time timepiece chip time collected in a period of time for basis
Continue incremental judgement, be, generates for characterizing crystal oscillating circuit and the normal testing result of real-time timepiece chip；Otherwise it generates and uses
In characterization crystal oscillating circuit and/or the testing result of real-time timepiece chip exception.
6. real-time timepiece chip system according to claim 5, which is characterized in that the third testing result generation unit
In a period of time be at least 1 second.
7. the real-time timepiece chip system according to claim 3 or 5, which is characterized in that the testing result generation module
Further include:
4th testing result generation unit, if single for being generated according to the first testing result generation unit, the second testing result
When member and third testing result generation unit generate normal testing result, then generate for characterizing real-time timepiece chip system
Normal testing result；If the first testing result generation unit, the second testing result generation unit and third testing result are raw
When generating abnormal testing result at testing result generation unit any in unit, then generate for characterizing real-time timepiece chip system
The testing result for exception of uniting.
8. a kind of real-time timepiece chip system detecting method characterized by comprising
Real-time timepiece chip system electrification, characteristic value is written in the data register of real-time timepiece chip；
Real-time timepiece chip system re-powers, and reads the characteristic value in the data register of real-time timepiece chip；
Judge whether normally read characteristic value, be, generation communicates just for characterizing central processing unit with real-time timepiece chip
Normal testing result；Otherwise the testing result for characterizing central processing unit Yu real-time timepiece chip communication abnormality is generated；
Judge whether the characteristic value read is correct, is, generates for characterizing the normal testing result of battery circuit；Otherwise it gives birth to
At the testing result for characterizing battery circuit exception；
The real-time timepiece chip time is acquired at interval of a unit time；
Judge whether real-time timepiece chip time collected is to be increased continuously in a period of time, is, generates for characterizing crystal oscillator
Circuit and the normal testing result of real-time timepiece chip；Otherwise it generates different for characterizing crystal oscillating circuit and/or real-time timepiece chip
Normal testing result.
9. real-time timepiece chip system detecting method according to claim 8, which is characterized in that the unit time is
0.000001~100 second.
10. real-time timepiece chip system detecting method according to claim 8, which is characterized in that described a period of time is
At least 1 second.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711007385.4A CN109683659A (en) | 2017-10-18 | 2017-10-18 | Real-time clock chip system with self-checking function and checking method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711007385.4A CN109683659A (en) | 2017-10-18 | 2017-10-18 | Real-time clock chip system with self-checking function and checking method thereof |
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| CN109683659A true CN109683659A (en) | 2019-04-26 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201711007385.4A Pending CN109683659A (en) | 2017-10-18 | 2017-10-18 | Real-time clock chip system with self-checking function and checking method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115481005A (en) * | 2022-11-04 | 2022-12-16 | 北京紫光芯能科技有限公司 | Chip data stream tracking system and method |
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| US7308595B2 (en) * | 2003-09-23 | 2007-12-11 | Robert Bosch Gmbh | Method and device for generating an internal time base for a diagnostic function for an output module |
| CN103645977A (en) * | 2013-11-15 | 2014-03-19 | 天津天地伟业数码科技有限公司 | Automatic debugging system and method for electronic products |
| CN106774262A (en) * | 2016-12-28 | 2017-05-31 | 浙江威星智能仪表股份有限公司 | The device and its implementation of Aulomatizeted Detect intelligence instrument master control borad hardware performance |
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| CN1227938A (en) * | 1998-11-27 | 1999-09-08 | 中国科学院空间科学与应用研究中心 | General data acquisition unit and its operating method |
| US7308595B2 (en) * | 2003-09-23 | 2007-12-11 | Robert Bosch Gmbh | Method and device for generating an internal time base for a diagnostic function for an output module |
| CN103645977A (en) * | 2013-11-15 | 2014-03-19 | 天津天地伟业数码科技有限公司 | Automatic debugging system and method for electronic products |
| CN106774262A (en) * | 2016-12-28 | 2017-05-31 | 浙江威星智能仪表股份有限公司 | The device and its implementation of Aulomatizeted Detect intelligence instrument master control borad hardware performance |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115481005A (en) * | 2022-11-04 | 2022-12-16 | 北京紫光芯能科技有限公司 | Chip data stream tracking system and method |
| CN115481005B (en) * | 2022-11-04 | 2023-02-28 | 北京紫光芯能科技有限公司 | Chip data stream tracking system and method |
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Application publication date: 20190426 |
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