CN109636800A - A method of measurement interior of articles flaw size - Google Patents
A method of measurement interior of articles flaw size Download PDFInfo
- Publication number
- CN109636800A CN109636800A CN201910080527.2A CN201910080527A CN109636800A CN 109636800 A CN109636800 A CN 109636800A CN 201910080527 A CN201910080527 A CN 201910080527A CN 109636800 A CN109636800 A CN 109636800A
- Authority
- CN
- China
- Prior art keywords
- gray value
- sample
- size
- flaw
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10072—Tomographic images
- G06T2207/10081—Computed x-ray tomography [CT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30152—Solder
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Geometry (AREA)
- Quality & Reliability (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The present invention provides a kind of method for measuring interior of articles flaw size, comprising: rebuilds after detecting to sample and obtains the image of internal flaw；It is needed on the direction that measures size in internal flaw, so that one end of line segment is located at the outside of sample, the form in the internally positioned defect of the other end draws straight line, on middle conductor, one end in internally positioned defect is defect end, and the other end is sample end；The gray value curve on the extending direction of line segment is transferred, obtains gray value G2, G0 and G1 respectively；When G2 is peak value, G3=G2- is calculated | G2-G1 | × 10%, when G2 is valley, G3=G2+ is calculated | G2-G1 | × 10%；Near the wave crest or trough of gray value curve, the two o'clock that gray value is G3 is chosen, the size shown between two o'clock at this time is the actual size of internal flaw.According to the present invention, it is able to achieve the precise measurement to tiny defect size, with the features such as high sensitivity, data are reliable, error is typically not greater than the size of a pixel.
Description
Technical field
The invention belongs to material property detection technique fields, and in particular to a kind of side for measuring interior of articles flaw size
Method.
Background technique
Currently, the basic principle of industry CT detection is as follows: attenuation coefficient when passing through different material according to X-ray is different,
By radionetric survey and image processing techniques etc., the decaying letter of different material is obtained based on Equations of Mathematical Physics using computer
Number, to obtain the internal information of substance.Specifically, test sample is divided into multiple sufficiently small voxel cells, each voxel
The attenuation coefficient of unit is considered as constant.
Then, by carrying out CT image scanning from multiple angles, it can be obtained the corresponding attenuation coefficient of each voxel cell.
In practical applications, the introducing CT value on the basis of the attenuation coefficient of water, CT value=.And incite somebody to action
The CT value of voxel cell corresponds to the gray value on image, can be obtained so-called CT image.
In such as CT image of above-mentioned acquisition, different materials is reacted by different gray values, present in sample
Defect is reflected in the wave crest or trough shown as on smoothed curve in grey scale curve, utilizes wave crest in grey scale curve or the ash of trough
The dimensional measurement to defect may be implemented in angle value difference.
Based on this, the industrial CT system of each major company production be equipped with special dimensional measurement software to realize by hand/
Automatic measurement, the basic principle of automatic measurement are " halfwidth " methods based on CT image pixel 0, but when flaw size is close or
Less than ray useful beam width when, automatic measurement cannot achieve substantially.In contrast, manual analyzing is passed through by analysis personnel
The gray difference of reconstructed image determines the position of two endpoints of measured position.But this manual measurement mode completely with
Judge that less reproducible, reliability is low by means of the experience and naked eyes of analysis personnel, especially to the small defect of critical detectable limit, inspection
It is very big to survey error.In addition, disclosing the measurement method for identifying small defect based on image procossing in existing literature, but it is usually all
The characteristic boundary of image is extracted based on different algorithms, therefore all has respective limitation, it can not be in practical engineering applications
Obtain extensive, indifference application.
Summary of the invention
Problems to be solved by the invention:
In view of the above-mentioned problems, can be penetrated by X the purpose of the present invention is to provide a kind of method for measuring interior of articles flaw size
Thread industrial CT lossless detection method precise measurement interior of articles flaw size, with high sensitivity, data are reliable, are widely used
Feature.
Technical means to solve problem:
The present invention provides a kind of method for measuring interior of articles flaw size, comprising:
After detecting by industry CT lossless detection method to sample using panel detection device, by computer reconstruction and institute is obtained
State the image of the internal flaw of sample；
It determines the image measurement tool for passing through computer software behind the internal flaw position, is needed in the internal flaw
On the direction measured size, so that one end of line segment is located at the outside of the sample, the other end is located in the internal flaw
Form draws straight line, wherein one end in the internal flaw is defect end, and the other end is sample end on the line segment；
The gray value curve on the extending direction of the line segment is transferred, by the corresponding wave crest in the defect end or the gray value of trough
It is elected to be G2, the corresponding gray value of the sample end is G0 at this time；
The sample end is moved to inside from the outside of the sample by the extending direction along the line segment, and makes the sample
It holds corresponding gray value to be located at and closes on the wave crest or the trough in the stable region of wave amplitude, the sample end is corresponding at this time
Gray value be G1；
When G2 is peak value, G3=G2- is calculated | G2-G1 | × 10%, when G2 is valley, G3=G2+ is calculated | G2-G1
|×10%；
Near the wave crest or the trough of the gray value curve, choose gray value be G3 two o'clock, at this time two o'clock it
Between the size that shows be the internal flaw actual size.
According to the present invention, it discloses a kind of using X-ray industry CT lossless detection method precise measurement interior of articles defect
The method of size, the otherness of the object and defect grey scale curve and the two gray value that are obtained by industry CT non-destructive testing are real
Now to the precise measurement of tiny defect size, compared with the existing detection method, present invention is particularly suitable for the sizes of fine defects
The features such as measurement when proximity device detectable limit has high sensitivity, and data are reliable, error is typically not greater than a pixel
Size.
It is also possible in the present invention, the mobile sample end should be as close as possible to G2 when choosing G1.Measurement result is more as a result,
Accurately.
It is also possible in the present invention, when | G1-G2 | when > (G1-G0) × 10%, then it is assumed that the internal flaw can be differentiated,
Otherwise it can not differentiate.Thus, it is possible to judge in detection image with the presence or absence of internal flaw.
It is also possible in the present invention, the volume of the internal flaw is less than 1 × 1 × 1mm3.As a result, in different directions
Flaw size detection error be no more than a pixel size.
It is also possible in the present invention, test sample is detected by low-angle digital linear scanning detection method.By
This, can detecte the internal flaw size of large panels shape exemplar.
It is also possible in the present invention, it is also the back end value of air that G0, which is low value on the gray value curve,.
It is also possible in the present invention, when measuring the planar dimension of internal flaw, the panel detection device can be replaced line
Detector array.
Invention effect:
The present invention can provide a kind of method for measuring interior of articles flaw size, can pass through X-ray industry CT lossless detection method
Precise measurement interior of articles flaw size has the characteristics that high sensitivity, data are reliable, is widely used.
Detailed description of the invention
Fig. 1 is the gas hole defect CT images and its corresponding gray value curve inside the ceramics of embodiment 1: where (a),
It (b) is to obtain the valley g2 of back end value g0, the gray value g1 of ceramics and fault location；It (c) is two gray value g3 for confirming defect
Between distance；
The dissection SEM of the internal pre-buried defect of Fig. 2 ceramics observes figure；
Fig. 3 be the ceramic weld seam of embodiment 2 CT images and its corresponding gray value curve: where (a) and (b) are to obtain back end
The peak value g2 of value g0, the gray value g1 of ceramics and commissure；(c) be confirm weld seam two gray value g3 between distance；
Fig. 4 is the dissection SEM observation figure of weld seam；
Fig. 5 be the inclusion defect of the block sample interior of embodiment 3 CT images and its corresponding gray value curve: where
(a) and (b) are to obtain the peak value g2 at the gray value g1 and inclusion defect of back end value g0, ceramics；It (c) is confirmation inclusion defect
Distance between two gray value g3；
Fig. 6 is the dissection SEM observation figure of inclusion defect；
Fig. 7 is the CT images of solder joint and its corresponding gray value curve inside certain battery material of embodiment 4: where (a) and (b)
It is to obtain back end value g0, the gray value g1 of battery and the peak value g2 at solder joint；(c) be confirm solder joint two gray value g3 between
Distance；
Fig. 8 is the calliper to measure schematic diagram of solder joint.
Specific embodiment
The present invention is further illustrated below in conjunction with following embodiments, it should be appreciated that following embodiments are merely to illustrate this
Invention, is not intended to limit the present invention.Identical in the various figures or corresponding appended drawing reference indicates the same part, and omits repeated explanation.
It is disclosed a kind of method for measuring interior of articles flaw size.Specifically, work is first passed through using panel detection device
After industry CT lossless detection method detects test sample, by computer reconstruction and obtain test sample internal flaw shadow
Picture.The image measurement tool for passing through computer software behind defect position is determined, so that form of the line segment across internal flaw
Setting-out.Specifically, it draws lines on the direction that defect needs dimensional measurement, one end of line segment is made to be located at the outside of sample (i.e. quite
In being located in air section), in the region of the internally positioned defect of the other end, it is corresponding then to transfer each position on line segment extending direction
Gray value curve, the grey scale curve value transferred is at least more than the line segment length.
Then, on the gray value curve, the gray value of the corresponding wave crest in defect end or trough is elected to be G2, at this time sample
Holding corresponding gray value is G0.Sample end is moved to inside from the outside of sample by the extending direction along line segment, and makes sample
It holds corresponding gray value to be located at and closes on wave crest or trough in the stable region of wave amplitude, the corresponding gray value of sample end is at this time
G1.When corresponding gray value is wave crest (i.e., G2 is peak value) when defect end, G3=G2- is calculated | G2-G1 | × 10%, when scarce
When to fall into the corresponding gray value in end be trough (i.e., G2 is valley), G3=G2+ is calculated | G2-G1 | × 10%.In gray value curve
Wave crest or trough near, choose the two o'clock that gray value is respectively G3, the size that shows between two o'clock at this time is internal flaw
Actual size.
In addition, as absolute value (i.e. | G1-G2 |) > (G1-G0) × 10% of the difference between G1 and G2, then it is assumed that this is interior
Portion's defect can be differentiated, detectable by aforesaid operations.It is on the contrary, then it is assumed that internal flaw can not be differentiated, without detection.In addition, this
In invention, the volume of internal flaw is preferably smaller than 1 × 1 × 1mm3, low-angle digital linear scanning detection method pair can also be passed through
Test sample is detected.
In addition, since every layer of sweep spacing is larger (usually 1mm) in the detection process for linear array detector, so in the side z
To detection accuracy be 1mm, measurement error is larger.Therefore, according to linear array detector in the method that invention provides, then only
The size that can be suitably used for measurement x-y plane in other words, can panel detection device or line when need to only obtain the planar dimension of defect
It is any in detector array.
The otherness of object and defect grey scale curve and the two gray value that the present invention is obtained by industry CT non-destructive testing,
Realize that the precise measurement to tiny defect size, error are typically not greater than the size of a pixel.Compared with the existing detection method,
Present invention is particularly suitable for measurements when being closely sized to equipment detectable limit of fine defects, have high sensitivity, and data are reliable
The features such as.
Enumerate embodiment further below with the present invention will be described in detail.It will similarly be understood that following embodiment is served only for this
Invention is further described, and should not be understood as limiting the scope of the invention, those skilled in the art is according to this hair
Some nonessential modifications and adaptations that bright above content is made all belong to the scope of protection of the present invention.Following examples are specific
Technological parameter etc. is also only an example in OK range, i.e. those skilled in the art can be done properly by the explanation of this paper
In the range of select, and do not really want to be defined in hereafter exemplary specific value.
(embodiment 1)
The size of the present embodiment internal flaw pre-buried as the ceramics of test sample for precise measurement, and it is final for confirming
Size of the measurement error less than a pixel.Fig. 1 is the gas hole defect CT images and its corresponding ash inside the ceramics of embodiment 1
Angle value curve: where (a) and (b) are to obtain the valley g2 of back end value g0, the gray value g1 of ceramics and fault location；It (c) is confirmation
Distance between two gray value g3 of defect.The dissection SEM of the internal pre-buried defect of Fig. 2 ceramics observes figure.As shown in Figure 1, should
Place's defect shows as low ebb in grey scale curve.
Firstly, carrying out CT non-destructive testing to tested ceramics using conventional panels detector, and obtain the internal flaw of ceramics
Image.As previously mentioned, the image measurement tool using software needs to draw lines on the direction that measures in defect, line segment is across needs
The defect part of measurement, while transferring the corresponding gray value curve of each position on the straight line.As shown in (a) of Fig. 1, at the beginning of the line segment
Beginning length is 5.51mm, but is not limited to this, as long as meeting the line segment of above-mentioned requirements.
Then, on the corresponding gray value curve of the line segment, the gray value of the corresponding trough in defect end is elected to be valley g2,
The gray value for reading point A is 1574.At this time and valley g2 distance is the point as point corresponding with sample end of 5.51mm, is read
The gray value for taking point B is 126, i.e., the back end value g0, entirely detected.Then, along the extending direction of line segment by sample end from sample
The outside of product is moved to inside, and correspondingly, the corresponding point of sample end is also mobile to the direction of valley g2 therewith on gray value curve,
When the point is located in the stable region of wave amplitude for closing on valley g2, then the point is the corresponding gray value g1 of sample end, such as Fig. 1
(b) shown in, in the present embodiment 1, selected distance peak value g2 is the point of 1.82mm, and the gray value for reading point B ' is 1984.It closes
In the selection of gray value g1, as long as gray value corresponding to the point being located in the stable region of wave amplitude for closing on valley g2 is equal
Can, such as in the present embodiment 1, any point within the scope of small (gentle) approximate region is changed in the wave amplitude of 0.6mm to 3.0mm
Corresponding gray value may be selected as gray value g1.
Then, calculating ceramics and the gray scale difference of internal flaw is g1-g2, further calculates g1-g2=410 > (g1-
G0) × 10%=186, therefore, it is considered that this defect is obvious and can recognize.The 10% of both above-mentioned difference, i.e., | g1-g2 | × 10%=
41, gray value g3=g2+41=1615 are thus calculated.Then, ash is chosen near the valley g2 on gray value curve respectively
Angle value be 1615 two o'clock and be designated as gray value g3, at this time as Fig. 1 (c) shown in, the size shown between two gray value g3
0.21mm is measuring size for the internal flaw.
Finally, being observed after dissecting the internal flaw using SEM scanning electron microscope, which is about 1 μm.
As shown in Fig. 2, the internal flaw may be considered the practical ruler of the internal flaw having a size of 237 μm i.e. 0.237mm, size
It is very little.The above-mentioned industry CT measurement result of the present embodiment is 0.21mm, and error is about 0.027mm, and the Pixel Dimensions of this CT detection
Length × width be 0.08mm × 0.08mm, therefore error is less than the size of a pixel.It follows that according to the present embodiment 1,
Under the premise of not damaging tested ceramics, industry CT can accurately measure the size of the internal flaw, and final measurement error is small
In the size of a pixel.
(embodiment 2)
The present embodiment is used for size of the precise measurement as the ceramics sample weld seam of test sample, and misses for confirming finally to measure
Size of the difference less than a pixel.Fig. 3 be the ceramic weld seam of embodiment 2 CT images and its corresponding gray value curve: where
A), (b) is to obtain the peak value g2 of back end value g0, the gray value g1 of ceramics and commissure；It (c) is two gray values for confirming weld seam
Distance between g3.The dissection SEM of Fig. 4 weld seam observes figure.As shown in figure 3, weld seam shows as peak value in grey scale curve.
Firstly, carrying out CT non-destructive testing to tested ceramics using conventional panels detector, and obtain the internal flaw of ceramics
Image.As previously mentioned, the image measurement tool using software needs to draw lines on the direction that measures in defect, line segment is across needs
The defect part of measurement, while transferring the corresponding gray value curve of each position on the straight line.As shown in (a) of fig. 3, at the beginning of the line segment
Beginning length is 25.94mm, but is not limited to this, as long as meeting the line segment of above-mentioned requirements.
Then, on the corresponding gray value curve of the line segment, the gray value of the corresponding trough in defect end is elected to be peak value g2,
The gray value for reading point A is 3832.At this time and peak value g2 distance be 25.94mm point be point corresponding with sample end,
The gray value for reading point B is 54, i.e., the back end value g0, entirely detected.Then, along the extending direction of line segment by sample end from sample
The outside of product is moved to inside, and correspondingly, the corresponding point of sample end is also mobile to the direction of peak value g2 therewith on gray value curve,
When the point is located in the stable region of wave amplitude for closing on peak value g2, then the point is the corresponding gray value g1 of sample end, such as Fig. 3
(b) shown in, in the present embodiment 2, selected distance peak value g2 is the point of 1.70mm, and the gray value for reading point B ' is 1906.It closes
In the selection of gray value g1, as long as gray value corresponding to the point being located in the stable region of wave amplitude for closing on peak value g2 is equal
Can, such as in the present embodiment 2, changed in the wave amplitude of 0.5mm to 20.0mm any within the scope of small (gentle) approximate region
The corresponding gray value of point may be selected as gray value g1.
Then, then, the gray value differences for calculating weld seam and ceramics sample are g2-g1, further calculate g2-g1=1922 >
(g1-g0) × 10%=185, therefore, it is considered that this defect is obvious and can recognize.The 10% of both above-mentioned difference, i.e., | g1-g2 | ×
10%=192, gray value g3=g2-192=3640 are thus calculated.Then, respectively near the peak value g2 on gray value curve
It chooses the two o'clock that gray value is 3640 and is designated as gray value g3, at this time as shown in (c) of fig. 3, shown between the gray value g3 of two o'clock
The size 0.13mm shown is measuring size for the weld seam.
Finally, being observed after dissecting the internal flaw using SEM scanning electron microscope, which is about 1 μm.
As shown in figure 4, bead width is that 117 μm i.e. 0.117mm, size may be considered the actual size of the weld seam.Industry CT is surveyed
Amount result is 0.13mm, and error is about 0.013mm, and length × width of the Pixel Dimensions of this CT detection is 0.08mm × 0.08mm,
Therefore size of the error less than a pixel.It follows that according to the present embodiment 1, under the premise of not damaging tested ceramics, work
Industry CT can accurately measure the size of the internal flaw, and final measurement error is less than the size of a pixel.
(embodiment 3)
The present embodiment is used for size of the precise measurement as inclusion defect in the block sample of test sample, and final for confirming
Size of the measurement error less than a pixel.Fig. 5 is the CT images of the inclusion defect of the block sample interior of embodiment 3 and its right
The gray value curve answered: where (a) and (b) are to obtain the peak value g2 at the gray value g1 and inclusion defect of back end value g0, ceramics；
(c) be confirm inclusion defect two gray value g3 between distance.The dissection SEM of Fig. 6 inclusion defect observes figure.Such as Fig. 5 institute
Show, which shows as peak value in grey scale curve, and sample complexity back end gray value is higher.
Firstly, carrying out CT non-destructive testing to tested ceramics using conventional panels detector, and obtain the internal flaw of ceramics
Image.As previously mentioned, the image measurement tool using software needs to draw lines on the direction that measures in defect, line segment is across needs
The defect part of measurement, while transferring the corresponding gray value curve of each position on the straight line.As shown in (a) of fig. 5, at the beginning of the line segment
Beginning length is 8.34mm, but is not limited to this, as long as meeting the line segment of above-mentioned requirements.
Then, on the corresponding gray value curve of the line segment, the gray value of the corresponding trough in defect end is elected to be peak value g2,
The gray value for reading point A is 55622.At this time and peak value g2 distance be 8.34mm point be point corresponding with sample end,
The gray value for reading point B is 52483, i.e., the back end value g0, entirely detected.Then, along the extending direction of line segment by sample end
It is moved to inside from the outside of sample, correspondingly, the corresponding point of sample end is also therewith to the direction of peak value g2 on gray value curve
Mobile, when the point is located in the stable region of wave amplitude for closing on peak value g2, then the point is the corresponding gray value g1 of sample end, is such as schemed
Shown in 5 (b), in the present embodiment 3, selected distance peak value g2 is the point of 1.37mm, and the gray value for reading point B ' is
53784.About the selection of gray value g1, as long as corresponding to the point being located in the stable region of wave amplitude for closing on peak value g2
Gray value, such as in the present embodiment 3, small (gentle) approximate region model is changed in the wave amplitude of about 0.8mm to 6.5mm
It encloses gray value corresponding to interior any point and may be selected as gray value g1.
Then, the gray value differences for calculating inclusion defect and block sample are g2-g1, further calculate g2-g1=1838 >
(g1-g0) × 10%=130, therefore, it is considered that this defect is obvious and can recognize.The 10% of both above-mentioned difference, i.e., | g1-g2 | ×
10%=184, gray value g3=g2-184=55438 are thus calculated.Then, respectively near the peak value g2 on gray value curve
It chooses the two o'clock that gray value is 55438 and is designated as gray value g3, at this time as shown in (c) of Fig. 5, shown between the gray value g3 of two o'clock
The size 0.11mm shown is measuring size for the inclusion defect.
Finally, being observed after dissecting the inclusion defect using SEM scanning electron microscope, which is about 1 μm.
As shown in fig. 6, the inclusion defect may be considered the practical ruler of the inclusion defect having a size of 109 μm i.e. 0.109mm, size
It is very little.Industry CT measurement result is 0.11mm, and error is about 0.001mm, and length × width of the Pixel Dimensions of this CT detection is
0.08mm × 0.08mm, therefore error is less than the size of a pixel.It follows that according to the present embodiment 1, it is tested not damaging
Under the premise of ceramics, industry CT can accurately measure the size of the internal flaw, and less than one pixel of final measurement error
Size.
(embodiment 4)
The present embodiment is used for size of the precise measurement as any solder joint in certain battery sample of test sample, and for confirming to survey
Measure size of the error less than a pixel.Fig. 7 is the CT images of solder joint and its corresponding ash inside certain battery material of embodiment 4
Angle value curve: where (a) and (b) are to obtain back end value g0, the gray value g1 of battery and the peak value g2 at solder joint；It (c) is confirmation
Distance between two gray value g3 of solder joint.Fig. 8 is the calliper to measure schematic diagram of solder joint.As shown in fig. 7, the solder joint is write music in ash
Peak value is shown as on line.
Firstly, carrying out CT non-destructive testing to tested ceramics using conventional panels detector, and obtain the internal flaw of ceramics
Image.As previously mentioned, the image measurement tool using software needs to draw lines on the direction that measures in defect, line segment is across needs
The defect part of measurement, while transferring the corresponding gray value curve of each position on the straight line.As shown in (a) of Fig. 7, at the beginning of the line segment
Beginning length is 16.15mm, but is not limited to this, as long as meeting the line segment of above-mentioned requirements.
Then, on the corresponding gray value curve of the line segment, the gray value of the corresponding trough in defect end is elected to be peak value g2,
The gray value for reading point A is 2782.At this time and peak value g2 distance be 16.15mm point be point corresponding with sample end,
The gray value for reading point B is 113, i.e., the back end value g0, entirely detected.Then, along the extending direction of line segment by sample end from
The outside of sample is moved to inside, and correspondingly, the corresponding point of sample end is also moved to the direction of peak value g2 therewith on gray value curve
Dynamic, when the point is located in the stable region of wave amplitude for closing on peak value g2, then the point is the corresponding gray value g1 of sample end, such as Fig. 7
(b) shown in, in the present embodiment 4, selected distance peak value g2 be 2.86mm point, read point B ' gray value be 1166.
About the selection of gray value g1, as long as gray value corresponding to the point being located in the stable region of wave amplitude for closing on peak value g2
, such as in the present embodiment 4, changed in the wave amplitude of 1.8mm to 5.0mm any within the scope of small (gentle) approximate region
The corresponding gray value of point may be selected as gray value g1.
Then, the gray value differences g2-g1 of solder joint and battery sample is calculated, and further calculates g2-g1=1616 > (g1-
G0) × 10%=105, therefore, it is considered that this solder joint is obvious and can recognize.The 10% of both above-mentioned difference, i.e., | g1-g2 | × 10%=
162, gray value g3=g2-162=2620 are thus calculated, then, are chosen near the peak value g2 on gray value curve respectively
Gray value be 2620 two o'clock and be designated as gray value g3, at this time as Fig. 7 (c) shown in, shown between the gray value g3 of two o'clock
Size 0.44mm is measuring size for the solder joint.
Finally, dissecting the battery sample, the size of the solder joint is measured by micrometer, can be accurate to
0.001mm.As shown in figure 8, the size for obtaining the solder joint after measurement is 0.476mm, which may be considered the reality of the solder joint
Border size.Industry CT measurement result is 0.44mm, and error is about 0.036mm, and length × width of the Pixel Dimensions of this CT detection is
0.08mm × 0.08mm, therefore error is less than the size of a pixel.It follows that according to the present embodiment 1, it is tested not damaging
Under the premise of ceramics, industry CT can accurately measure the size of the internal flaw, and less than one pixel of final measurement error
Size.
To sum up, according to the method for the present invention, repeated higher, high reliablity, especially lacks the inside of critical detectable limit
It falls into, detection error is very small, can obtain extensive, indifference application in practical engineering applications.
Above specific embodiment has carried out further specifically the purpose of the present invention, technical scheme and beneficial effects
It is bright, it should be appreciated that the above is only a kind of specific embodiments of the invention, however it is not limited to protection model of the invention
It encloses, under the objective for not departing from essential characteristic of the invention, the present invention can be presented as diversified forms, therefore the implementation in the present invention
Form is to be illustrative rather than definitive thereof, and is limited since the scope of the present invention is defined by the claims rather than by specification, Er Qieluo
All changes in the full scope of equivalents of the range that claim defines or the range that it is defined are understood to be included in right
In claim.All within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. made should all wrap
Containing within protection scope of the present invention.
Claims (8)
1. a kind of method for measuring interior of articles flaw size, comprising:
After detecting by industry CT lossless detection method to sample using panel detection device, by computer reconstruction and institute is obtained
State the image of the internal flaw of sample；
It determines the image measurement tool for passing through computer software behind the internal flaw position, is needed in the internal flaw
On the direction measured size, so that one end of line segment is located at the outside of the sample, the other end is located in the internal flaw
Form draws straight line, wherein one end in the internal flaw is defect end, and the other end is sample end on the line segment；
The gray value curve on the extending direction of the line segment is transferred, by the corresponding wave crest in the defect end or the gray value of trough
It is elected to be G2, the corresponding gray value of the sample end is G0 at this time；
The sample end is moved to inside from the outside of the sample by the extending direction along the line segment, and makes the sample
It holds corresponding gray value to be located at and closes on the wave crest or the trough in the stable region of wave amplitude, the sample end is corresponding at this time
Gray value be G1；
When G2 is peak value, G3=G2- is calculated | G2-G1 | × 10%, when G2 is valley, G3=G2+ is calculated | G2-G1
|×10%；
Near the wave crest or the trough of the gray value curve, choose gray value be G3 two o'clock, at this time two o'clock it
Between the size that shows be the internal flaw actual size.
2. a kind of method for measuring interior of articles flaw size according to claim 1, which is characterized in that the mobile sample
It product end should be as close as possible to G2 when choosing G1.
3. a kind of method for measuring interior of articles flaw size according to claim 1, which is characterized in that when | G1-G2 |
When > (G1-G0) × 10%, then it is assumed that the internal flaw can be differentiated, otherwise can not differentiate.
4. thus, it is possible to judge in detection image with the presence or absence of internal flaw.
5. a kind of method for measuring interior of articles flaw size according to claim 1, which is characterized in that the inside lacks
Sunken volume is less than 1 × 1 × 1mm3。
6. a kind of method for measuring interior of articles flaw size according to claim 1, which is characterized in that pass through low-angle
Digital linear scanning detection method detects test sample.
7. a kind of method for measuring interior of articles flaw size according to claim 1, which is characterized in that G0 is in the ash
It is low value on angle value curve, is also the back end value of air.
8. a kind of method for measuring interior of articles flaw size according to claim 1, which is characterized in that when measurement is internal
When the planar dimension of defect, the panel detection device can be replaced linear array detector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910080527.2A CN109636800B (en) | 2019-01-28 | 2019-01-28 | Method for measuring size of internal defect of object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910080527.2A CN109636800B (en) | 2019-01-28 | 2019-01-28 | Method for measuring size of internal defect of object |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109636800A true CN109636800A (en) | 2019-04-16 |
| CN109636800B CN109636800B (en) | 2022-10-14 |
Family
ID=66062273
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910080527.2A Active CN109636800B (en) | 2019-01-28 | 2019-01-28 | Method for measuring size of internal defect of object |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109636800B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110956618A (en) * | 2019-11-25 | 2020-04-03 | 中国兵器科学研究院宁波分院 | CT image small defect quantification method based on coefficient of variation method |
| WO2023196383A1 (en) * | 2022-04-05 | 2023-10-12 | L'garde, Inc. | System and methods for creating precision three dimensional surfaces from two dimensional material |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102023171A (en) * | 2010-11-12 | 2011-04-20 | 航天材料及工艺研究所 | Nondestructive testing method for characterizing inclusion defect types in composite material quantitatively by using CT value |
| CN104036484A (en) * | 2013-03-06 | 2014-09-10 | 株式会社东芝 | Image segmentation device, image segmentation method and medical image equipment |
| CN104766336A (en) * | 2015-04-16 | 2015-07-08 | 中北大学 | Three-dimensional CT defect extracting and marking method for solid engine |
| CN106932416A (en) * | 2017-02-16 | 2017-07-07 | 西安交通大学 | Gas turbine blades internal flaw three-dimensional parameter extracting method based on digital radial |
| CN109003275A (en) * | 2017-06-06 | 2018-12-14 | 中国商用飞机有限责任公司 | The dividing method of weld defect image |
-
2019
- 2019-01-28 CN CN201910080527.2A patent/CN109636800B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102023171A (en) * | 2010-11-12 | 2011-04-20 | 航天材料及工艺研究所 | Nondestructive testing method for characterizing inclusion defect types in composite material quantitatively by using CT value |
| CN104036484A (en) * | 2013-03-06 | 2014-09-10 | 株式会社东芝 | Image segmentation device, image segmentation method and medical image equipment |
| CN104766336A (en) * | 2015-04-16 | 2015-07-08 | 中北大学 | Three-dimensional CT defect extracting and marking method for solid engine |
| CN106932416A (en) * | 2017-02-16 | 2017-07-07 | 西安交通大学 | Gas turbine blades internal flaw three-dimensional parameter extracting method based on digital radial |
| CN109003275A (en) * | 2017-06-06 | 2018-12-14 | 中国商用飞机有限责任公司 | The dividing method of weld defect image |
Non-Patent Citations (2)
| Title |
|---|
| 李长有等: "小型平板玻璃表面缺陷检测系统", 《计算机应用》 * |
| 齐子诚等: "金属材料内部缺陷精确工业CT测量方法", 《强激光与粒子束》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110956618A (en) * | 2019-11-25 | 2020-04-03 | 中国兵器科学研究院宁波分院 | CT image small defect quantification method based on coefficient of variation method |
| CN110956618B (en) * | 2019-11-25 | 2022-06-21 | 中国兵器科学研究院宁波分院 | CT image small defect quantification method based on coefficient of variation method |
| WO2023196383A1 (en) * | 2022-04-05 | 2023-10-12 | L'garde, Inc. | System and methods for creating precision three dimensional surfaces from two dimensional material |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109636800B (en) | 2022-10-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101442055B1 (en) | Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample | |
| CN110702783A (en) | Array eddy current method for detecting thermal fatigue cracks of water-cooled wall tube | |
| CN109636800A (en) | A method of measurement interior of articles flaw size | |
| CN105092616A (en) | Method for measuring minor detail feature sizes in industrial CT (computerized tomography) detection | |
| CN101210904A (en) | Metal magnetic memory rapid previewing method | |
| CN117607248B (en) | Metal defect detection imaging method based on digital lock-in amplifier | |
| CN108335310B (en) | Portable grain shape and granularity detection method and system | |
| KR20190106305A (en) | Contrast test specimens for measuring defects in tube expansion using eddy current test and method for measuring defects using the same | |
| EP0536333A1 (en) | Eddy current imaging system | |
| Lampman et al. | Nondestructive testing in failure analysis | |
| Pavlyuchenko et al. | Testing for discontinuities in metals using film flux detectors | |
| CN116519786A (en) | Electromagnetic identification method for surface defect morphology of metal with protective layer | |
| KR100341867B1 (en) | Automatic Evaluation System of Fabric Wrinkles and Seam Puckers and Their Method | |
| Pavlyuchenko et al. | Detecting extended complex-shaped defects in electroconductive plates using a magnetic carrier | |
| Godfrey et al. | Processing and interpretation of EBSD data gathered from plastically deformed metals | |
| CN112051323A (en) | Weak magnetic detection method for bonding quality of ceramic matrix composite | |
| Sihvonen et al. | Image based evaluation of textured 3DSEM models | |
| KR20180125748A (en) | Method and apparatus for surface inspection surface of blade | |
| Copley | Eddy-current imaging for defect characterization | |
| CN108761137B (en) | Afm tip wear measuring method | |
| Ye et al. | Weld defect inspection based on machine vision and weak magnetic technology | |
| Frühauf et al. | Development of Si-chips with anisotropic rough surface | |
| Strauss | Quantitative methods in fractography | |
| KR102434224B1 (en) | Inspection apparatus and method by magnetic resonance inspection method including elliptical algorithm | |
| Spanner et al. | Sizing stress corrosion cracking in natural gas pipelines using phased array ultrasound |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |