CN109635324B - Fault isolation rate distribution method - Google Patents
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Abstract
The invention relates to a fault isolation rate distribution method, which mainly comprises the following steps: step one, constructing a diagnosis framework of a system to be distributed, and determining a unit to be distributed; step two, obtaining the failure rate, maintenance time, failure mode and influence analysis and failure type of any unit to be distributed; determining the weighting factors of each distribution unit according to the fault rate, the maintenance time, the severity level in the fault mode and the fault mode type, wherein the weighting factors comprise a fault rate factor k λi Fault influencing factor k Fi Maintenance time factor k Mi Coefficient k of influence coefficient of level of fault diagnosis in machine Di The method comprises the steps of carrying out a first treatment on the surface of the And fourthly, carrying out testability distribution according to the weighting factors and the fault isolation rate of the system to be distributed. The method pays attention to engineering practice, has strong operability and gives consideration to specific conditions of different systems; the accuracy and precision of the distribution result can be improved, and designers of the system and the equipment can be better guided and restrained to conduct corresponding testability design, so that the effective implementation of testability work is ensured.
Description
Belonging to the field of
The invention belongs to the field of testability design, and relates to a fault detection rate distribution method.
Background
The mathematical model of the testability assignment is a mathematical equation indicating testability parameters, and indicates the mathematical relationship between the part and the whole of the system, namely, the functional relationship between the testability index of the system and the index of the constituent units thereof. The basic requirements (objective functions) for testability allocation are: under the constraint conditions of using requirements, system characteristics and the like, the indexes of each component part are obtained by the system requirement indexes, the system indexes comprehensively obtained by the indexes distributed by each component unit are ensured to be equal to or larger than the indexes of the original requirements, and then a fault isolation rate distribution mathematical model is constructed, the characteristics of the traditional testing distribution method are not considered, and the calculation result is larger than 1 or smaller than 0 and needs to be adjusted by a large scale manually.
It can be seen that the prior art testability allocation method is relatively coarse in the testability design of modern aircraft, and is highly subjective and too dependent on the experience level of the designer. The understanding of the distribution and the knowledge of the design itself are different for different designers, so that the distribution results obtained by the designers are often quite different, and the mismatch between the test distribution results and the test design work is caused, so that the phenomenon of two-skin is formed, and the result of the test design is directly influenced.
Disclosure of Invention
Object of the Invention
In order to solve the above problems, the present invention provides a fault isolation rate allocation method, which at least solves one of the problems existing in the background art, and adopts a weighting factor allocation method to allocate the fault isolation rate, wherein the weighting factor allocation method is a simple and practical allocation method by converting factors considered during allocation into weighting factors, constructing a mathematical model of the weighting factors, and allocating according to the weighting factors.
Technical proposal
The invention relates to a fault isolation rate distribution method, which mainly comprises the following steps:
step one, constructing a diagnosis framework of a system to be distributed, and determining a unit to be distributed;
step two, obtaining the failure rate, maintenance time, failure mode and influence analysis and failure type of any unit to be distributed;
determining the weighting factors of each distribution unit according to the fault rate, the maintenance time, the severity level in the fault mode and the fault mode type, wherein the weighting factors comprise a fault rate factor k λi Fault influencing factor k Fi Maintenance time factor k Mi Coefficient k of influence coefficient of level of fault diagnosis in machine Di ；
And fourthly, carrying out testability allocation according to the weighting factors and the fault isolation rate of the system to be allocated, wherein the testability allocation formula is as follows:
wherein:
γ FIi a value of fault isolation rate assigned to the device; gamma ray FIS The system fault isolation rate index is required; lambda (lambda) DS The fault rate of the system detection; lambda (lambda) Di For a certain equipment to detect failure rate, K i A weighting factor for the i-th allocation unit;
the weighting factor K of each distribution unit i And failure rate factor k λi Fault influencing factor k Fi Maintenance time factor k Mi Coefficient k of influence coefficient of level of fault diagnosis in machine Di The relation of (2) is:
K i ＝Ak λi +Bk Fi +Ck Mi +Dk Di ，
wherein a+b+c+d=1.
Preferably, the value of A is 0.3, the value of B is 0.1, the value of C is 0.1, and the value of D is 0.5.
Preferably, the total failure rate λ of the distribution system Ds Failure rate lambda for each distribution unit Di And (3) summing.
Preferably, the calculation formula for obtaining the failure rate weighting coefficient of any unit to be allocated is:
λ i is the failure rate of the device; Σn i λ i The sum of the failure rates of all devices included in the system; n is n i For the number of devices included in the system.
Preferably, the calculation formula for obtaining the failure mode and the influence weighting coefficient of any unit to be allocated is:
f is the sum of fault modes of the level I, the level II and the level III of the severity of all equipment formed by the system; f (F) I The total number of fault modes with the severity level of a certain device being level I; f (F) II The total number of fault modes with the equipment severity level of II is calculated; f (F) III The total number of failure modes for a device severity level of class III.
Preferably, the calculation formula for obtaining the maintenance time weighting coefficient of any unit to be allocated is:
M i MTTR value for a device; n is n i For the number of devices included in the system.
Preferably, the calculation formula for obtaining the fault type weighting coefficient of any unit to be allocated is:
F Ni the total number of fault modes which are difficult to diagnose the faults in the machine for a certain device; f (F) i Is the total number of failure modes of a certain device.
Preferably, the fault mode classification that is difficult or more difficult to diagnose in-flight faults is as follows:
6) Performance degradation type failure: the method comprises the steps of power supply output out-of-tolerance, acquisition precision out-of-tolerance, large power insertion loss, reduced sensitivity, signal stray, clock drift, gain out-of-tolerance, amplitude out-of-tolerance, ripple increase and unstable operation;
7) Mechanical failure: mechanical faults which have large noise, squeaking, shaking, cracks, deformation, abrasion, oil seepage, air leakage, insufficient output force and are difficult to monitor the state;
8) Man-machine interaction failure: the device comprises keys, a knob, a switch, a display screen, backlight, illumination, broadcast voice communication/warning and indicator lights;
9) Protection and debug function class failures: the anti-HIRF power source comprises lightning protection, electrification prevention, HIRF prevention, surge suppression, power supply filtering, auxiliary test circuits and debugging functions;
10 Special function class fault): radio frequency, key destroying, initiating explosive device.
Advantages of the invention
The method pays attention to engineering practice, has strong operability and gives consideration to specific conditions of different systems, so that the distribution result is more reasonable. The accuracy and precision of the distribution result can be improved, and designers of the system and the equipment can be better guided and restrained to conduct corresponding testability design, so that the effective implementation of testability work is ensured. The formula related in the invention is subjected to checking, meets all requirements of index distribution work, is easy to understand, and has simple algorithm without checking.
Detailed Description
Taking a certain system as an example, the system comprises 5 subsystems, the fault detection rate is 90%, and the fault isolation rate is 90%. And (5) calculating the distribution value of the fault isolation rate of each subsystem.
The average fault interval (MFHBF) of each system can be obtained according to the system reliability distribution result, and the inverse of MFHBF is the fault rate of each system, as shown in table 1.
TABLE 1 reliability assignment results
| Sequence number | Name of the name | Mean time between failures (hours) | λ i |
| 1 | Subsystem 1 | 160 | 0.00625 |
| 2 | Subsystem 2 | 80 | 0.0125 |
| 3 | Subsystem 3 | 700 | 0.001429 |
| 4 | Subsystem 4 | 300 | 0.003333 |
| 5 | Subsystem 5 | 280 | 0.003571 |
Based on the failure mode and the influence analysis result, the failure mode numbers shown in table 2 were obtained.
TABLE 2 failure mode count results
Based on the maintainability index assignment, the maintainability assignment results shown in table 3 were obtained.
Table 3 maintainability distribution results
| Sequence number | Name of the name | Average maintenance time (min) |
| 1 | Subsystem 1 | 75 |
| 2 | Subsystem 2 | 40 |
| 3 | Subsystem 3 | 40 |
| 4 | Subsystem 4 | 90 |
| 5 | Subsystem 5 | 85 |
The results shown in table 4 were obtained from the failure mode analysis results.
TABLE 4 analysis of the diagnostic difficulty level
And calculating various influence factors according to the formula in the step 2.
The influence factors of the components obtained by the above calculation are shown in Table 5.
TABLE 5 influencing factors
The weighting factors for the components are derived according to the following formula.
K i ＝Ak λi +Bk Fi +Ck Mi +Dk Di
In this embodiment, the value of a is 0.3, the value of B is 0.1, the value of C is 0.1, and the value of D is 0.5.
Namely:
K i ＝0.3k λi +0.1k Fi +0.1k Mi +0.5k Di
through the calculation, the weighting factor K of each distribution unit is obtained i As shown in table 6.
Table 6 weighting factor determination table
| Sequence number | Name of the name | k i |
| 1 | Subsystem 1 | 0.288442 |
| 2 | Subsystem 2 | 0.444378 |
| 3 | Subsystem 3 | 0.20841 |
| 4 | Subsystem 4 | 0.267512 |
| 5 | Subsystem 5 | 0.256191 |
Finally, carrying out testability allocation according to the weighting factors and the fault isolation rate of the system to be allocated, wherein the testability allocation formula is as follows:
the test index assignment results are shown in table 5.
TABLE 7 System level testability index assignment results
| Sequence number | Name of the name | Failure detection rate | Correction |
| 1 | Subsystem 1 | 0.914679 | 91％ |
| 2 | Subsystem 2 | 0.934276 | 93％ |
| 3 | Subsystem 3 | 0.730372 | 73％ |
| 4 | Subsystem 4 | 0.851616 | 85％ |
| 5 | Subsystem 5 | 0.867367 | 87％ |
The method pays attention to engineering practice, has strong operability and gives consideration to specific conditions of different systems, so that the distribution result is more reasonable. The accuracy and precision of the distribution result can be improved, and designers of the system and the equipment can be better guided and restrained to conduct corresponding testability design, so that the effective implementation of testability work is ensured. The formula related in the invention is subjected to checking, meets all requirements of index distribution work, is easy to understand, and has simple algorithm without checking.
Finally, it should be pointed out that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting. Although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (4)
1. A fault isolation rate distribution method is characterized in that: mainly comprises the following steps:
step one, constructing a diagnosis framework of a system to be distributed, and determining a unit to be distributed;
step two, obtaining the failure rate, maintenance time, failure mode and influence analysis and failure type of any unit to be distributed;
step three, determining the weighting factors of each distribution unit according to the fault rate, the maintenance time and the severity level in the fault mode and the fault mode type; the weighting factors comprise fault rate factors, fault influence factors, maintenance time factors and in-machine fault diagnosis level influence coefficients;
and fourthly, carrying out testability allocation according to the weighting factors and the fault isolation rate of the system to be allocated, wherein the testability allocation formula is as follows:
wherein:
γ FIi a value of fault isolation rate assigned to the device; gamma ray FIS The system fault isolation rate index is required; lambda (lambda) DS The fault rate of the system detection; lambda (lambda) Di For a certain equipment to detect failure rate, K i A weighting factor for the i-th allocation unit;
the weighting factor K of each distribution unit i And failure rate factor k λi Fault influencing factor k Fi Maintenance time factor k Mi Level influence coefficient k of in-plane fault diagnosis Di The relation of (2) is:
K i ＝Ak λi +Bk Fi +Ck Mi +Dk Di ，
wherein a+b+c+d=1;
the calculation formula for obtaining the fault rate weighting coefficient of any unit to be distributed is as follows:
λ i is the failure rate of the device; Σn i λ i The sum of the failure rates of all devices included in the system; n is n i A number of devices included in the system;
the calculation formula for obtaining the fault mode and the influence weighting coefficient of any unit to be allocated is as follows:
f is the sum of fault modes of the level I, the level II and the level III of the severity of all equipment formed by the system; f (F) I The total number of fault modes with the severity level of a certain device being level I; f (F) Ц The total number of fault modes with the equipment severity level of II is calculated; f (F) III The total number of fault modes with the equipment severity level of III;
the calculation formula for obtaining the maintenance time weighting coefficient of any unit to be distributed is as follows:
M i MTTR value for a device; n is n i A number of devices included in the system;
M i the calculation formula for obtaining the fault type weighting coefficient of any unit to be allocated is as follows:
F Ni the total number of fault modes which are difficult to diagnose the faults in the machine for a certain device; f (F) i Is the total number of failure modes of a certain device.
2. The fault isolation rate allocation method according to claim 1, wherein: the A value is 0.3, the B value is 0.1, the C value is 0.1, and the D value is 0.5.
3. The fault isolation rate allocation method according to claim 1, wherein: total failure rate lambda of the distribution system Ds Failure rate lambda for each distribution unit Di And (3) summing.
4. The fault isolation rate allocation method according to claim 1, wherein: the fault mode classification and description of the difficult or more difficult-to-diagnose in-flight faults are as follows:
1) Performance degradation type failure: the method comprises the steps of power supply output out-of-tolerance, acquisition precision out-of-tolerance, large power insertion loss, reduced sensitivity, signal stray, clock drift, gain out-of-tolerance, amplitude out-of-tolerance, ripple increase and unstable operation;
2) Mechanical failure: mechanical faults which have large noise, squeaking, shaking, cracks, deformation, abrasion, oil seepage, air leakage, insufficient output force and are difficult to monitor the state;
3) Man-machine interaction failure: the device comprises keys, a knob, a switch, a display screen, backlight, illumination, broadcast voice communication/warning and indicator lights;
4) Protection and debug function class failures: the anti-HIRF power source comprises lightning protection, electrification prevention, HIRF prevention, surge suppression, power supply filtering, auxiliary test circuits and debugging functions;
5) Special function class failure: radio frequency, key destroying, initiating explosive device.
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| CN109886504A (en) * | 2019-03-08 | 2019-06-14 | 杭州杉石科技有限公司 | Physical structure choosing optimal plan method, apparatus and equipment |
| CN111311171A (en) * | 2019-12-06 | 2020-06-19 | 江西洪都航空工业集团有限责任公司 | Maintainability distribution method based on maintenance activities and correction weighting coefficients |
| CN112711807B (en) * | 2020-12-29 | 2024-04-09 | 中国航空工业集团公司西安飞机设计研究所 | Equipment reliability analysis method based on fault data |
| CN112699567A (en) * | 2021-01-11 | 2021-04-23 | 中国民航大学 | Exponential type testability distribution and feasibility analysis method |
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